CN104330240B - A kind of method of spectrophotometer measurement light beam laser paper grating parameter - Google Patents

A kind of method of spectrophotometer measurement light beam laser paper grating parameter Download PDF

Info

Publication number
CN104330240B
CN104330240B CN201310685058.XA CN201310685058A CN104330240B CN 104330240 B CN104330240 B CN 104330240B CN 201310685058 A CN201310685058 A CN 201310685058A CN 104330240 B CN104330240 B CN 104330240B
Authority
CN
China
Prior art keywords
light beam
grating
angle
laser paper
beam laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201310685058.XA
Other languages
Chinese (zh)
Other versions
CN104330240A (en
Inventor
黄敏
王灵芳
刘瑜
李双劲
魏先福
刘浩学
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Institute of Graphic Communication
Original Assignee
Beijing Institute of Graphic Communication
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Institute of Graphic Communication filed Critical Beijing Institute of Graphic Communication
Priority to CN201310685058.XA priority Critical patent/CN104330240B/en
Publication of CN104330240A publication Critical patent/CN104330240A/en
Application granted granted Critical
Publication of CN104330240B publication Critical patent/CN104330240B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

A kind of method that the present invention relates to spectrophotometer measurement light beam laser paper grating parameter.First according to grating equation, the grating constant under different diffraction angle and diffraction progression and Wavelength distribution graph of a relation are drawn;Multi-angle formula spectrophotometer is used to gather light beam laser paper at the spectral energy curve distribution figure along light beam direction and the spectroscopic data being perpendicular to different measuring region, light beam direction, under the different detection angle of drafting;In conjunction with the grating constant under different diffraction angle and diffraction progression and Wavelength distribution relation, analyze the Changing Pattern of the spectroscopic data recorded, calculate the grating constant of grating fringe;Fixing multi-angle spectrophotometer unthreaded hole and the relative position of laser paper, by light beam laser paper Plane Rotation 90 °, measure the spectral information of same position, the delineation direction of derivation light beam laser paper grating fringe.The present invention to some extent solves puzzlement scientific circles and industrial quarters is difficult to accurately measure the difficult problem of laser paper, has feature efficiently convenient and simple for operation.

Description

A kind of method of spectrophotometer measurement light beam laser paper grating parameter
Technical field
A kind of method that the present invention relates to spectrophotometer measurement light beam laser paper grating parameter, by using The spectral information of diverse location on X-Rite MA68 II multi-angle spectrophotometer measurement light beam laser paper, in conjunction with not With the variation relation of diffraction dominant wavelength and angle of diffraction of the grating fringe correspondence different diffraction progression of grating constant, carry Go out a kind of method that can use X-Rite MA68 II multi-angle spectrophotometer measurement light beam laser paper grating parameter.
Background technology
Laser film and laser transfer paper have special bright rainbow effect, have certain anti-counterfeiting performance simultaneously, are deeply subject to Liking of Packaging and Printing Enterprises.But Packaging and Printing Enterprises is typically to the processing technique of laser film and laser transfer paper also Do not know about, radium-shine paper substrate carry out picture and text printing, often occur typography parameter consistent but outside product colour See inconsistent problem.This causes mainly due to the color distortion of the basic body of laser paper, when light is irradiated to radium-shine Time on paper substrate, in addition to producing the diffuse-reflectance of light, there is also the direct reflection of light, diffraction and interference.Affect radium-shine The main cause of paper difference colouring effect be the grating parameter of the internal grating fringe of laser film or laser transfer paper not With, the delineation direction of its grating constant specifically including that grating fringe and grating fringe and width of nick.Grating is normal The delineation direction of number and grating fringe mainly affects radium-shine paper substrate and presents the dominant wavelength of color in different viewing angles, and The width of nick of grating fringe mainly affects the light and shade of spectral energy, i.e. color.
Summary of the invention
A kind of method that it is an object of the invention to propose spectrophotometer measurement light base for post laser paper grating parameter, Gather the spectral information of diverse location on light base for post laser paper by spectrophotometer, reach to measure light base for post laser paper The purpose of grating parameter.Solve light base for post laser paper microtexture measurement and need asking by high multiple magnifier Topic, directly can complete the measurement of grating micro-parameter with spectrophotometer, and it is light beam that the method is suitable for all outward appearances The micro-parameter of laser paper is measured and quality of colour is evaluated and tested.
For achieving the above object, the present invention takes techniques below scheme:
A kind of method of spectrophotometer measurement light beam laser paper grating parameter, comprises the steps:
(1) according to grating equation, obtaining corresponding to different diffraction angle, when angle of incidence is fixed value, difference is spread out Penetrate the corresponding relation of the grating constant under progression and wavelength, and it is normal to draw the grating under different diffraction angle and diffraction progression Number and Wavelength distribution graph of a relation;
(2) on the basis of the adjacent two rainbow bands of light beam laser paper, by light beam laser paper along light beam direction and hang down Directly being divided into different measured zone in light beam direction, with x-y labelling, wherein x represents that, along light beam direction, y represents vertical Straight in light beam direction;
(3) multi-angle formula spectrophotometer is used to gather on light beam laser paper along rainbow band direction (x direction) and vertical Directly in the spectroscopic data of rainbow band direction (y direction) diverse location, draw different detection angle (receive direction with Specular light angle) under spectral energy curve distribution figure;
(4) analyze on light beam laser paper along light beam direction be perpendicular to the light beam direction different search angle of diverse location The spectroscopic data regularity of distribution collected under degree;
(5) grating constant and Wavelength distribution under integrating step (1) draws different diffraction angle and diffraction progression are closed System, the Changing Pattern of the spectroscopic data that analytical procedure (3) records, calculate the grating constant of grating fringe;
(6) fixing multi-angle spectrophotometer unthreaded hole and the relative position of laser paper, revolve light beam laser paper plane Turn 90 °, measure the spectral information of same position, repeat step (3)-(5), derivation light beam laser paper grating fringe Delineation direction.
Said method can further apply check individual light beam laser paper surface grating striped delineation uniformity and The concordance of light beam laser paper grating fringe delineation in batches.
In step (1), described grating equation is: d (sini+sinj)=k λ, and in formula, d is grating constant, i Being angle of incidence and the angle of diffraction respectively with j, k is diffraction progression, and λ is wavelength;Wavelength X is in visible-range (380~780nm) value, diffraction progression k is 1-4 level, and grating constant is value between 0.5~2, at angle of incidence (such as angle of incidence i=45 °) in the case of Yi Ding, obtain corresponding to different diffraction angle, when angle of incidence is i, no With the grating constant under diffraction progression k and the corresponding relation of wavelength X, and draw under different diffraction angle and diffraction progression Grating constant and Wavelength distribution graph of a relation.In the case of angle of incidence is certain, can detect according at different diffraction angle The spectral energy peak Distribution arrived, extrapolates the grating constant of grating fringe.
In step (3), use X-Rite MA68 II spectrophotometer, light base for post laser paper is carried out spectral information Gathering, on the premise of the plane included angle ensureing spectrophotometer and laser paper is constant, measure spectrum scope is 400~700nm, wavelength interval is that 10nm, the X-Rite spectrophotometric smooth source lighting of MA68 II multi-angle enters Firing angle is 45 °, detection angle (receive direction with specular light angle) be respectively 15 °, 25 °, 45 °, 75 ° and 110 °, draw the spectral power distribution figure of multi-angle.
In step (3), when gathering data, fix laser paper difference sampled point and spectrophotometric position successively (keeping ruled grating striped, lighting source and the determination of collection light hole site), keep spectrophotometric measurement simultaneously Amount unthreaded hole plane is constant with measurement paper substrate plane included angle.
In step (4), the spectral distribution of light base for post laser paper, along light beam direction and be perpendicular to light beam direction light There is bigger difference in Spectral structure rule, samples along light beam direction, and spectral distribution rule is roughly the same;And it is vertical In light beam direction along with the change of sampling location, spectral distribution rule shows bigger difference.
In step (5), according to spectrophotometer at the different diffraction progression that different photodetection angles record 400~700nm curve of spectrum peak energy distributions, are extrapolated grating constant by grating equation d (sini+sinj)=k λ d。
In step (7), according to spectrum peak energy variation before and after laser paper Plane Rotation, thus it is speculated that light beam laser paper The grating ruling striped relative direction of diverse location.Relatively along rainbow band direction not homology before and after laser paper half-twist The spectral power distribution rule of row (such as :-1 series: A-1, B-1, C-1, D-1, E-1), infers its grating The direction of striped.
In step (7), use the different sampling locations of individual light base for post laser paper of spectrophotometer measurement, fixing The paper substrate plane of laser paper is constant with the plane included angle of spectrophotometric unthreaded hole plane.Can be in terms of following two Judge uniformity and the concordance of batch laser paper primary surface grating ruling that individual laser paper surface grating delineates:
1) the spectral energy peak Distribution of different detection angle is collected according to X-Rite MA68 II spectrophotometer, Calculate the grating constant of laser paper primary surface grating fringe;
2) spectrum peak energy comparison before and after laser paper base plane rotates, thus it is speculated that light base for post laser paper diverse location Grating ruling striped relative direction.
The present invention uses the method for spectrophotometer measurement light base for post laser paper grating parameter, is drawn by grating equation Grating constant under different diffraction angle and diffraction progression and Wavelength distribution graph of a relation;Along light beam direction (x direction) Divide different measured zone with being perpendicular to light beam direction (y direction), measure with X-Rite MA68 II spectrophotometric The spectroscopic data of amount light base for post laser paper;The direction is at fixing light beam rainbow laser paper substrate sampling location and spectrophotometric In the case of counting relative position, can be used for measuring the grating parameter of radium-shine paper substrate, detect radium-shine paper substrate uniformity and The concordance of different batches laser paper grating ruling, solving measurement laser paper microstructure to a certain extent needs to borrow Help the difficulty of high power number microscopic magnifying apparatus, there is quick, feature that error is little convenient and simple for operation.
Below by the drawings and specific embodiments, the present invention will be further described, but is not meant to the present invention The restriction of protection domain.
Accompanying drawing explanation
Fig. 1 is the appearance figure of light beam laser paper.
Fig. 2 is the different measuring position view of light beam laser paper.
Fig. 3 is the microstructure schematic diagram (different measuring position) of light beam laser paper.
Fig. 4-1 to Fig. 4-4 is grating constant corresponding under different diffraction angle and diffraction progression and Wavelength distribution figure, wherein, Fig. 4-1: first-order diffraction;Fig. 4-2: second-order diffraction;Fig. 4-3: three order diffraction;Fig. 4-4: four order diffraction.
Fig. 5 is the light path schematic diagram of X-Rite MA68 II light angle and photodetection angle.
Fig. 6-1 to Fig. 6-5 is perpendicular to the spectral distribution graph of A-position, rainbow band direction difference detection angle, wherein, Fig. 6-1: detection angle is 15 °;Fig. 6-2: detection angle is 25 °;Fig. 6-3: detection angle is 45 °;Fig. 6-4: Detection angle is 75 °: Fig. 6-5: detection angle is 110 °.
Fig. 7-1 to Fig. 7-4 is along the four width spectral distribution graphs that rainbow band orientation detection angle is 110 °, wherein, Fig. 7-1:-3(A-3, B-3, C-3, D-3, E-3) position;Fig. 7-2:-4 position;Fig. 7-3:-7 position; Fig. 7-4:-8 position.
Fig. 8-1 to Fig. 8-4 is along the four width light that rainbow band orientation detection angle is 110 ° by radium-shine paper substrate half-twist Spectral structure figure, wherein, Fig. 8-1:-3(A-3, B-3, C-3, D-3, E-3) position;Fig. 8-2:-4 position; Fig. 8-3:-7 position;Fig. 8-4 is-8 positions.
Detailed description of the invention
The present invention utilizes spectrophotometer light base for post laser paper to be carried out the measurement of grating micro-parameter, at angle of incidence one In the case of Ding, draw the grating constant under different diffraction angle and diffraction progression according to grating equation and Wavelength distribution is closed System's figure;With X-Rite MA68 II spectrophotometer, the lighting condition of light source is 45 °, receive direction be respectively with Specular light angle is 15 °, 25 °, 45 °, 75 ° and 110 ° of five angles, is ensureing that spectrophotometer is with radium-shine On the premise of the plane included angle of paper is constant, measure along rainbow light beam direction and the spectrum being perpendicular to rainbow light beam direction Energy information.Identical along the spectral distribution rule in rainbow light beam direction, it is perpendicular to light beam direction along with sampling location Change, spectral distribution rule has bigger difference.
As it is shown in figure 1, be the outward appearance of light beam laser paper, x represents along light beam direction, and y represents and is perpendicular to light beam direction, L is the rainbow band cycle.The method using spectrophotometer measurement light base for post laser paper grating parameter, reaches radium-shine Paper substrate grating fringe delineation uniformity and conforming detection, specifically comprise the following steps that
(1) according to grating equation d (sini+sinj)=k λ, the d in formula is grating constant, i and j enters respectively Firing angle and the angle of diffraction (angle of incidence in X-Rite MA68 II i=45 °), k is diffraction progression, and λ is wavelength.Change Grating constant (value between 0.5~2), wavelength X is (380-780nm) value in visible-range, spreads out Penetrate stage number selection 1-4 level, according to grating equation corresponding to the different angles of diffraction and diffraction progression, grating is normal Number and the variation relations of wavelength, if Fig. 4-1 is to shown in Fig. 4-4, respectively diffraction progression be 1~4, different diffraction angle The grating constant of lower correspondence and Wavelength distribution figure.
(2) on the basis of two rainbow bands that laser paper is adjacent, by light beam laser paper along light beam direction and vertical Being divided into different measured zone in light beam direction, number with x-y, wherein x represents that, along light beam direction, y represents It is perpendicular to light beam direction, as shown in Figure 2.Wherein x direction is numbered with A-E respectively, and y direction is compiled with 1-11 respectively Number.
(3) use X-Rite MA68 II multi-angle formula spectrophotometer that light base for post laser paper is carried out color measuring, Spectral region 400-700nm, wavelength interval is 10nm.Ensureing the plane included angle of spectrophotometer and laser paper not On the premise of change, the lighting condition of light source is 45 °, and receiving direction and being respectively with specular light angle is 15 °, 25 °, 45 °, 75 ° and 110 ° of five angles, the index path of MA68 II is as shown in Figure 5.
The plane included angle keeping spectrophotometer measurement unthreaded hole plane and laser paper plane paper substrate is constant, i.e. ensure for The grating ruling striped of the different measuring position of light beam laser paper shown in Fig. 3, lighting source and collection light hole site Determine, gather on light beam laser paper along rainbow band direction and the spectroscopic data being perpendicular to rainbow band direction sampled point, paint The spectral power distribution figure that II 5 angle detections of X-Rite MA68 processed arrive.
(4) Fig. 6-1 to Fig. 6-5 visible vertical is in rainbow band direction A-series, Fig. 6-1(detection angle 15 °), Fig. 6-2(detection angle 25 °), Fig. 6-3(detection angle 45 °), Fig. 6-4(detection angle 75 °) and Fig. 6-5 The spectral distribution graph of (detection angle 110 °).15 ° of corresponding angle of diffraction of detection angle are-30 °, spread out in Fig. 6-1 Ejected wave length is less than 300nm;When detection angle is 25 °, corresponding angle of diffraction is-20 °, diffraction wavelength in Fig. 6-2 At about 420nm;The angle of diffraction that detection angle is corresponding when being 45 ° is 0 °, and in Fig. 6-3, diffraction wavelength is being less than 400nm wave band and two wave bands of 680nm;When detection angle is 75 °, corresponding angle of diffraction is 30 °, Fig. 6-4 Middle diffraction wavelength is at two wave bands of 410nm and 700nm;Detection angle be 110 ° of corresponding angle of diffraction be 65 °, Diffraction wavelength in Fig. 6-5 is 410nm and 550nm.
Can be released this radium-shine in conjunction with the grating constant under different diffraction angle and diffraction progression and Wavelength distribution graph of a relation Paper substrate grating constant is 1 μm.As, 65 shown in Fig. 6-5 ° angle of diffraction spectral power distribution figure measured can Knowing, peak wavelength 550nm therein is the dominant wavelength that in Fig. 4-3, three order diffractions are corresponding, and peak wavelength 410nm is The dominant wavelength that in Fig. 4-4, four order diffractions are corresponding, complex chart 4-3, Fig. 4-4 understands the grating constant of this light beam laser paper 1μm.In the spectral power distribution figure that in like manner can be collected by other detection angle (-20 °, 0 °, 30 °) corresponding Peak wavelength and the grating constant under different diffraction progression in Fig. 4-1 to Fig. 4-4 and Wavelength distribution relation, extrapolate The light beam laser paper grating constant of this measurement is 1 μm.
(6) Fig. 7-1 to Fig. 7-4 visible collect when detection angle is 110 ° along 4 of rainbow band direction Spectral distribution graph, is respectively-3 ,-4 ,-7 ,-8 series, such as :-3 series refer to A-3, B-3, C-3, D-3, E-3 Five positions.The edge that Fig. 8-1 to Fig. 8-4 is to be collected when being 110 ° by laser paper base plane half-twist detection angle 4 spectral distribution graphs in rainbow band direction, be respectively-3 ,-4 ,-7 ,-8 series.
(7) Fig. 7-1 to Fig. 8-4 and grating equation d (sini+sinj)=k λ and Fig. 4-1 to Fig. 4-4 institute are combined Show when angle of incidence is fixed value, the grating constant under different diffraction angle and diffraction progression and Wavelength distribution relation Figure, analyzes the spectroscopic data Changing Pattern that II 5 angle photodetection mouths of X-Rite MA68 record.
A)-7 shown in Fig. 7-3 and 7-4 are the lowest with the spectral energy that-8 series collect, and this is due to X-Rite The feature of MA68 II interior lights line structure, due to optical grating diffraction effect, enters detector almost without light energy. And in same position, by-7 spectrum collected with-8 series shown in radium-shine paper substrate half-twist Fig. 8-3 and 8-4 Energy can enter detector, and energy occurs that peak change meets spectral diffraction principle simultaneously.In like manner Fig. 7-1 and figure The spectrum peak energy that shown in 7-2-3 and-4 series collect is the highest, after radium-shine paper substrate half-twist, and Fig. 8-1 The lowest with the spectrum peak energy that-4 series collect with shown in 8-2-3, enter detector almost without light.
B) Fig. 7-1 to Fig. 7-4 and Fig. 8-1 to Fig. 8-4 carries out corresponding comparison, can speculate-3 with-4 serial positions Grating fringe delineation direction is vertical with-7 and-8 serial position grating fringe delineation directions.
(8) uniformity that individual laser paper surface grating is delineated, or the one of batch laser paper grating ruling are checked Cause property, according to step (7) detection method, detects the grating constant of individual radium-shine paper substrate grating ruling striped, light Grizzly bar stricture of vagina relatively delineate direction.
The method of the present invention can be used for detecting the uniformity on individual laser paper surface or batch laser paper grating ruling Concordance.Owing to individual laser paper is in the direction delineating width of fringe and grating fringe delineation of various location, make Laser paper surface occurs in that gorgeous bright rainbow effect;Simultaneously because light beam laser paper primary surface grating ruling has week Phase property, along rainbow band direction, the direction of grating fringe delineation is consistent, and is perpendicular to rainbow band direction diverse location Grating ruling direction (counterclockwise) clockwise rotates a certain angle, so when detecting it is noted that should be noted Standard specimen and the sampling location of test specimens and instrument and the putting position of paper substrate.
The present invention is by along light beam direction be perpendicular to light beam direction light beam rainbow laser paper is divided into different measuring district Territory, the spectral energy information of same position before and after fixing multi-angle spectrophotometer, relatively radium-shine paper substrate half-twist Change, draw the grating constant under different diffraction angle and diffraction progression and Wavelength distribution relation in conjunction with grating equation Figure, may infer that this radium-shine paper substrate grating constant and incline direction of grating fringe.By the present invention in that with polygonal Degree spectrophotometer gathers the spectral information of diverse location on laser paper, solves light base for post laser paper microstructure and surveys Amount needs the problem by high multiple magnifier, directly completes radium-shine paper substrate grating parameter with multi-angle spectrophotometer Measurement and reckoning;To some extent solve puzzlement scientific circles and industrial quarters is difficult to accurately measure the difficulty of laser paper Topic, has feature efficiently convenient and simple for operation.

Claims (5)

1., by a method for spectrophotometer measurement light beam laser paper grating parameter, comprise the steps:
(1) according to grating equation, obtaining corresponding to different diffraction angle, when angle of incidence is fixed value, difference is spread out Penetrate the corresponding relation of the grating constant under progression and wavelength, and it is normal to draw the grating under different diffraction angle and diffraction progression Number and Wavelength distribution graph of a relation;
(2) on the basis of the adjacent two rainbow bands of light beam laser paper, by light beam laser paper along light beam direction and hang down Directly being divided into different measured zone in light beam direction, with x-y labelling, wherein x represents that, along light beam direction, y represents vertical Straight in light beam direction;
(3) multi-angle formula spectrophotometer is used to gather on light beam laser paper along rainbow band direction and be perpendicular to rainbow With the spectroscopic data of direction diverse location, draw the spectral power distribution figure under different detection angle;
(4) analyze on light beam laser paper along light beam direction be perpendicular to the light beam direction different search angle of diverse location The spectroscopic data regularity of distribution collected under degree;
(5) grating constant and Wavelength distribution under integrating step (1) draws different diffraction angle and diffraction progression are closed System's figure, the Changing Pattern of the spectroscopic data that analytical procedure (3) records, calculate the grating constant of grating fringe;
(6) fixing multi-angle spectrophotometer unthreaded hole and the relative position of laser paper, revolve light beam laser paper plane Turn 90 °, measure the spectral information of same position, repeat step (3)-(5), derivation light beam laser paper grating fringe Delineation direction.
2. as claimed in claim 1 with the method for spectrophotometer measurement light beam laser paper grating parameter, its spy Levy and be: described grating equation is d (sin i+sin j)=k λ, and in formula, d is grating constant, i and j is respectively Angle of incidence and the angle of diffraction, k is diffraction progression, and λ is wavelength;Wavelength X is value in visible-range, diffraction progression K is 1-4 level, and grating constant is value between 0.5~2, when angle of incidence is 45 °, obtains corresponding to different diffraction Angle, the grating constant under different diffraction progression k and the corresponding relation of wavelength X, and draw different diffraction angle and spread out Penetrate the grating constant under progression and Wavelength distribution graph of a relation.
3. as claimed in claim 1 with the method for spectrophotometer measurement light beam laser paper grating parameter, its spy Levy and be: use X-Rite MA68 II spectrophotometer, light base for post laser paper is carried out spectral information collection, survey Amount spectral region is 400~700nm, and wavelength interval is 10nm, X-Rite MA68 II multi-angle spectrophotometer Light source illumination incident angle be 45 °, detection angle is respectively 15 °, 25 °, 45 °, 75 ° and 110 °, draws multi-angle Spectral power distribution figure.
4. as claimed in claim 3 with the method for spectrophotometer measurement light beam laser paper grating parameter, its spy Levy and be: when gathering data, fix laser paper difference sampled point and spectrophotometric position successively, keep simultaneously Spectrophotometer measurement unthreaded hole plane is constant with measurement paper substrate plane included angle.
5. as according to any one of claims 1-4 with spectrophotometer measurement light beam laser paper grating parameter Method, is checking uniformity and the batch light beam laser paper gratings strips of the delineation of individual light beam laser paper surface grating striped Application in the concordance of stricture of vagina delineation.
CN201310685058.XA 2013-12-13 2013-12-13 A kind of method of spectrophotometer measurement light beam laser paper grating parameter Expired - Fee Related CN104330240B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310685058.XA CN104330240B (en) 2013-12-13 2013-12-13 A kind of method of spectrophotometer measurement light beam laser paper grating parameter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310685058.XA CN104330240B (en) 2013-12-13 2013-12-13 A kind of method of spectrophotometer measurement light beam laser paper grating parameter

Publications (2)

Publication Number Publication Date
CN104330240A CN104330240A (en) 2015-02-04
CN104330240B true CN104330240B (en) 2016-08-31

Family

ID=52405010

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310685058.XA Expired - Fee Related CN104330240B (en) 2013-12-13 2013-12-13 A kind of method of spectrophotometer measurement light beam laser paper grating parameter

Country Status (1)

Country Link
CN (1) CN104330240B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104568781A (en) * 2015-02-05 2015-04-29 北京印刷学院 Method for automatically detecting and evaluating color of laser beam emitting paper and quality of laser beams
CN105841818B (en) * 2016-06-07 2018-01-26 北京印刷学院 A kind of color measuring device and method of light beam laser paper and printed matter
CN106052876B (en) * 2016-07-19 2017-09-15 北京印刷学院 A kind of chromatism measurement method of light beam laser paper and its printed matter
CN107966213B (en) * 2016-10-20 2020-08-21 尚文涛 Measuring device, measuring method and calibration method for diffraction grating period
CN109827657B (en) * 2019-03-12 2024-03-01 深圳劲嘉集团股份有限公司 Method and device for measuring grating constant of plain laser material
CN110806389B (en) * 2019-11-20 2022-05-27 河南牧业经济学院 Device and method for detecting color quality of columnar laser paper
CN111721716B (en) * 2020-06-15 2023-03-17 深圳劲嘉集团股份有限公司 Method for measuring grating constant of matte cylindrical holographic printing material

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6323945B1 (en) * 1998-12-15 2001-11-27 Nec Corporation Coma aberration automatic measuring mark and measuring method
CN200989826Y (en) * 2006-12-13 2007-12-12 中国兵器工业第二○五研究所 Spectrum colour analyter
CN101479593A (en) * 2006-05-05 2009-07-08 旭硝子北美平板玻璃公司 Apparatus and method for angular colorimetry
CN102221560A (en) * 2011-03-28 2011-10-19 上海科拓机电科技发展有限公司 Automatic detection equipment of laser paper and laser membranes
CN102538970A (en) * 2010-12-08 2012-07-04 武汉红金龙印务股份有限公司 Spectrophotometer for chromaticity detection of laser paper
CN102782483A (en) * 2011-03-31 2012-11-14 深圳市科彩印务有限公司 Method for detecting laser paper
CN103226058A (en) * 2013-04-02 2013-07-31 中国科学院长春光学精密机械与物理研究所 Method for measuring grating diffraction efficiency based on compensation algorithm

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6323945B1 (en) * 1998-12-15 2001-11-27 Nec Corporation Coma aberration automatic measuring mark and measuring method
CN101479593A (en) * 2006-05-05 2009-07-08 旭硝子北美平板玻璃公司 Apparatus and method for angular colorimetry
CN200989826Y (en) * 2006-12-13 2007-12-12 中国兵器工业第二○五研究所 Spectrum colour analyter
CN102538970A (en) * 2010-12-08 2012-07-04 武汉红金龙印务股份有限公司 Spectrophotometer for chromaticity detection of laser paper
CN102221560A (en) * 2011-03-28 2011-10-19 上海科拓机电科技发展有限公司 Automatic detection equipment of laser paper and laser membranes
CN102782483A (en) * 2011-03-31 2012-11-14 深圳市科彩印务有限公司 Method for detecting laser paper
CN103226058A (en) * 2013-04-02 2013-07-31 中国科学院长春光学精密机械与物理研究所 Method for measuring grating diffraction efficiency based on compensation algorithm

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
全息光栅基彩色图像光谱反射率模型;万晓霞等;《中国印刷与包装研究》;20101130;第2卷;第41-44页 *
镭射复合材料表面呈色性能的检测与分析;曹从军等;《包装工程》;20041231;第25卷(第5期);第170-171页 *

Also Published As

Publication number Publication date
CN104330240A (en) 2015-02-04

Similar Documents

Publication Publication Date Title
CN104330240B (en) A kind of method of spectrophotometer measurement light beam laser paper grating parameter
CN103575701B (en) Based on the refractive index of transparent materials of frequency domain OCT and method for measuring thickness and device
CN102967604B (en) Reflectance spectrum measuring and sampling system and method used for jewel detection
CN100395538C (en) Novel quick-speed elliptical polarized light measurement system
CN104634280B (en) The measuring method of general level turntable absolute angle and the anglec of rotation
CN101184986A (en) Measuring an appearance property of a surface using a bidirectional reflectance distribution function
Jäger et al. Angular resolved scattering measurements of nano-textured substrates in a broad wavelength range
US20100296096A1 (en) Imaging optical inspection device with a pinhole camera
KR20130084863A (en) Apparatus for measuring the degree of transmission
CN103134588A (en) Spectrograph
CN102879091A (en) Echelle grating spectrometer, atomic emission spectrometer and spectrum testing method
CN106950182B (en) A method of differentiating different fresh laser mother matrix microstructures
CN109001182A (en) The Raman spectrum non-destructive determination method of alcohol content in closed container
CN106525239B (en) Raster pattern imaging spectrometer spatial spectral radiance responsiveness robot scaling equipment and method
CN203053569U (en) Spectrograph
CN109709053B (en) Method for measuring grating constant of prime surface laser master plate by using spectrophotometer
CN205120576U (en) Laser spectrophotometer
CN106969835B (en) A kind of removing method of two level and Advanced Diffraction spectrum applied to spectral instrument
CN103575223B (en) The method utilizing reflective spectral measure silica-based solar cell anti-reflection film
CN111366096B (en) Method for measuring groove depth of holographic master plate
JP4442781B2 (en) Array of condensing hologram and inspection method of hologram color filter
Castonguay New generation high-speed high-resolution hemispherical scatterometer
EP4016017A1 (en) Measuring a color of a target coating
US20230244058A1 (en) Spectrometers having a fringe tilted grating
CN111721716B (en) Method for measuring grating constant of matte cylindrical holographic printing material

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160831

Termination date: 20211213

CF01 Termination of patent right due to non-payment of annual fee