CN109709053B - Method for measuring grating constant of prime surface laser master plate by using spectrophotometer - Google Patents

Method for measuring grating constant of prime surface laser master plate by using spectrophotometer Download PDF

Info

Publication number
CN109709053B
CN109709053B CN201910041825.0A CN201910041825A CN109709053B CN 109709053 B CN109709053 B CN 109709053B CN 201910041825 A CN201910041825 A CN 201910041825A CN 109709053 B CN109709053 B CN 109709053B
Authority
CN
China
Prior art keywords
measuring
prime
spectrophotometer
spectral energy
grating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201910041825.0A
Other languages
Chinese (zh)
Other versions
CN109709053A (en
Inventor
黄敏
习永惠
李修
刘瑜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Institute of Graphic Communication
Original Assignee
Beijing Institute of Graphic Communication
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Institute of Graphic Communication filed Critical Beijing Institute of Graphic Communication
Priority to CN201910041825.0A priority Critical patent/CN109709053B/en
Publication of CN109709053A publication Critical patent/CN109709053A/en
Application granted granted Critical
Publication of CN109709053B publication Critical patent/CN109709053B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention relates to a method for measuring grating constant of a prime surface laser mother plate by using a spectrophotometer. Selecting a color measuring instrument with 45/0 geometric measuring condition and annular light source illumination; selecting any position on the laser master plate of the prime surface to be tested, and taking the position as a measurement area; keeping the relative position of the measuring aperture of the color measuring instrument and the measuring point unchanged, and measuring the spectral energy information of the prime laser master plate; drawing a spectral energy distribution curve chart of the acquired spectral energy information in a visible light range, and analyzing the shape of the drawn spectral energy distribution curve and the position of the peak wavelength; and calculating to obtain the grating constant of the prime surface laser master plate to be tested by combining a grating equation. The method can quickly and accurately calculate the grating constant of the prime surface laser master plate through measuring the spectral energy information of any position and angle under the condition of no high power magnifying glass and multi-angle spectrophotometer, and has important significance in actual production.

Description

Method for measuring grating constant of prime surface laser master plate by using spectrophotometer
Technical Field
The invention relates to a method for measuring grating constant of a prime surface laser mother plate by using a spectrophotometer. Spectral energy distribution curves were plotted from the spectral data by measuring the spectral energy information at the fixing position of the prime laser master using a spectrophotometer under 45/0 illumination conditions (ring light). And (4) comparing the shape of the spectral energy curve with the peak wavelength position by combining a grating equation, thereby calculating the grating constant of the prime surface laser master plate.
Background
The laser mother set can form laser paper after transfer printing and processing, and the laser paper has a brilliant rainbow effect under illumination and is widely applied to the field of packaging and printing. Different types of laser paper can generate different color effects, mainly caused by different microstructures, but human eyes cannot distinguish the microstructures of the laser paper.
When the microstructure (grating constant) of the laser master plate is measured, a laser confocal morphology measuring microscope and a super-depth-of-field three-dimensional video microscope can be selected for direct observation, but the equipment cost is high, and the method cannot be widely applied to packaging and printing enterprises. Patent CN 104330240B proposes a method for using multi-angle light splittingA method for measuring grating constant of laser paper with light beam by a photometer. However, the microstructure of the beam laser master is one-dimensional, and the grating structure of the plain laser master is two-dimensional in the x and y directions, so that the method for measuring the grating constants of the two laser masters cannot be used universally. Patent CN106950182A proposes a method for discriminating microstructures of different prime laser masters, but during measurement, it is necessary to collect colorimetric values L of masters first*Through L*The initial position of the laser mother plate with different prime surfaces is adjusted, a multi-angle spectrophotometer is required for measurement, the price is high, the laser mother plate needs to be rotated during measurement, and the use is inconvenient. Therefore, how to measure the grating constant of the laser paper more quickly and accurately is a key problem to be solved at present.
Disclosure of Invention
The invention aims to provide a method for measuring the grating constant of a prime surface laser mother plate by using a spectrophotometer, which can be used for quickly and conveniently obtaining the grating constant of the prime surface laser mother plate. The invention uses a spectrophotometer with 45/0 measuring conditions (annular light illumination) to calculate the grating constant of the prime surface laser mother plate, obtains the spectral information received by the measuring instrument at any position on the prime surface laser mother plate by measurement, can be used for drawing a spectral energy diagram, and combines a grating equation to calculate the grating constant of the prime surface laser mother plate. The method avoids the use of a high-power magnifier to detect the grating constant of the prime surface laser mother plate and the use of a multi-angle spectrophotometer to calculate the grating constant.
In order to achieve the purpose, the invention adopts the following technical scheme:
a method for measuring grating constant of a prime surface laser mother plate by a spectrophotometer uses the spectrophotometer with 45/0 geometric measurement conditions (annular light illumination) to measure spectral energy information at any position without obvious smearing and scratch on the prime surface laser mother plate, and the grating constant of the prime surface laser mother plate can be obtained, the method comprises the following steps:
(1) selecting a color measuring instrument with 45/0 geometric measuring condition and annular light source illumination;
(2) selecting any position on the laser master plate of the prime surface to be tested, and taking the position as a measurement area;
(3) keeping the relative position of the measuring aperture of the color measuring instrument and the measuring point unchanged, and measuring the spectral energy information of the prime laser master plate;
(4) drawing a spectral energy distribution curve graph in a visible light range according to the spectral energy information acquired in the step (3), and analyzing the shape of the drawn spectral energy distribution curve and the position of the peak wavelength;
(5) and calculating to obtain the grating constant of the prime surface laser master plate to be tested by combining a grating equation.
In the step (1), the color measuring instrument is a spectrophotometer, the geometric measuring condition of the selected instrument is 45/0, annular light with an angle of 45 degrees is illuminated, and the photoelectric detector receives spectral energy information in the direction of 0 degree. The color measuring instrument is used for illuminating by an annular light source, so that the spectral energy information collected in all directions is relatively consistent. The spectrophotometer has the measurement condition of 45/0, namely the incident angle of the light source is 45 degrees, and the receiving angle of the photoelectric detection device is 0 degree. The measuring spectrum range of the instrument is not less than 400nm-700nm, and the measuring bandwidth is not less than 10 nm.
In the step (2), the measurement position on the plain laser master plate is a flat area without obvious scratch and smearing, so as to avoid influencing the acquired spectral information and further influencing the calculated microstructure.
In the step (3), during measurement, the position of the color measuring instrument needs to be fixed, the spectrophotometer (measuring aperture) is in direct contact with the plain surface laser master plate, and spectral energy information in a visible light range measured by the color measuring instrument is recorded. The initial measurement position and angle are not required to be specified during measurement, the relative included angle between the plain surface laser paper and the color measurement instrument is not required to be changed, the included angle can be random, and the calculation of the grating constant of the plain surface laser paper can be completed through one-time measurement.
In the step (4), the spectral energy information obtained by measurement is analyzed and compared, and the spectral curve can be found to have obvious peak energy distribution at different wavelength positions. And obtaining the maximum wavelength of the first-order diffraction according to the peak energy distribution at different wavelength positions on the spectral energy distribution curve graph.
And (5) determining the incident light angle and the diffraction light angle of the used color measuring instrument, and calculating the grating constant of the prime surface laser master plate according to the shape of the drawn spectral energy distribution curve and the position of the peak wavelength by combining a grating equation.
The grating equation is d (sini + sinj) ═ k λ; where d is the grating period (grating constant), i is the incident angle, j is the diffraction angle, λ is the incident light wavelength, k is the diffraction order, and k is ± 1,2,3 … …. And combining the obtained first-order diffraction maximum wavelength with a grating equation to calculate the grating constant.
The invention uses a spectrophotometer under 45/0 lighting conditions (annular light) to measure the spectral energy information at the fixed position of the prime laser master plate, and draws a spectral energy distribution curve through spectral data; and (4) comparing the shape of the spectral energy curve with the peak wavelength position by combining a grating equation, thereby calculating the grating constant of the prime surface laser master plate. The method can quickly and accurately calculate the grating constant of the prime surface laser master plate by measuring the spectral energy information of any position and angle under the condition of no high power magnifying glass and multi-angle spectrophotometer, and has important significance in actual production.
The invention is further illustrated by the following figures and detailed description of the invention, which are not meant to limit the scope of the invention.
Drawings
FIG. 1 is a schematic diagram of the optical path of a Spectro Eye spectrophotometer.
FIG. 2-1 is a spectrum Eye spectrophotometer for measuring spectral energy information of a plate A of a prime surface laser mother plate; FIG. 2-2 is a diagram of a Spectro Eye spectrophotometer for measuring spectral energy information of a B plate of a prime surface laser master plate.
3-1 to 3-4 are the distribution diagrams of the microstructure of different prime laser mother plates under a laser confocal microscope; wherein, fig. 3-1: version a microstructure plan view, fig. 3-2: a version of microstructure stereo image; FIGS. 3-3: plate B microstructure plan view, fig. 3-4: and B, a microstructure stereo image.
Detailed Description
The invention relates to a method for measuring grating constant of a prime surface laser mother plate by using a spectrophotometer. The spectral energy information on the prime laser master plate is measured by using a spectrophotometer under 45/0 measurement conditions (annular light illumination), and the grating constant of the prime laser master plate can be quickly calculated. And fixing the color measuring instrument, and measuring spectral energy information at any position on the master plate. And combining a grating equation, and analyzing the distribution shape and the peak wavelength occurrence position of the drawn spectral energy curve to provide a method for measuring the grating constant of the prime surface laser master plate by using a spectrophotometer.
Measuring spectral information of the prime surface laser mother plate by using a Spectro Eye spectrophotometer, and deducing a grating constant of the prime surface laser mother plate by combining a grating equation, wherein the method comprises the following specific steps of:
(1) the selected color measuring instrument is a Spectro Eye spectrophotometer, the measuring geometrical condition is 45/0, a D65 lighting source (annular light) is adopted, the field of view is 10 degrees, the measuring spectral range is 380nm-730nm, and the interval is 10 nm. As shown in fig. 1, the light source incident angle of the Spectro Eye spectrophotometer is 45 ° and the acceptance angle of the photodetector device is 0 °.
(2) By selecting the prime laser master A, B, a flat area without obvious scratch and smearing at any position can be selected as a measurement area on the prime laser master, so that the interference of dirt on the measurement result is avoided. The microstructure distribution of the prime laser master A, B is shown in fig. 3-1 to 3-4, fig. 3-1 is a plan view of a plate microstructure, and fig. 3-2 is a perspective view of the plate microstructure; fig. 3-3 are plan views of the B-plate microstructure, and fig. 3-4 are perspective views of the B-plate microstructure.
(3) The Spectro Eye spectrophotometer is fixed, the measurement mode of the spectrophotometer and the measurement point on the plain surface laser mother plate is direct contact measurement, the measurement is required to be carried out at any position of the plain surface laser mother plate, the spectral energy information of the plain surface laser mother plate can be obtained, and the spectral energy information of the laser mother plate A plate and the laser mother plate B plate under various angles received by the color measurement instrument is shown in the table 1.
Table 1 spectral information of different laser masters
Figure BDA0001947819870000041
(4) Respectively drawing the spectral energy distribution curve of the prime laser master A, B according to the spectral data acquired in the step (3), and observing the shape of the spectral energy curve and the position of the peak wavelength, as shown in fig. 2-1 and fig. 2-2.
(5) Grating constants of the prime surface laser master a and B were derived from the shapes of the spectral power distribution curves plotted in fig. 2-1 and 2-2 and the positions where the peak wavelengths appeared, in combination with a grating equation d (sini + sinj) ═ k λ, where d is the grating period, i is the incident angle (45 °), j is the diffraction angle (0 °), λ is the wavelength of incident light (380nm-750nm), k is the number of diffraction orders, and k is ± 1,2,3 … ….
As can be seen from fig. 2-1, the peak wavelengths of the plate a of the plain laser master plate are 700nm and 495nm, and as can be seen from fig. 2-2, the peak wavelengths of the plate B of the plain laser master plate are 594nm and 420 nm. The grating of the prime surface laser mother plate has a two-dimensional structure in the X and Y directions, and because the prime surface laser mother plate has light incidence in the X-Y direction and is also irradiated by light in the diagonal direction constructed by the X-Y direction when rotating (annular light illumination), the effective grating constant is
Figure BDA0001947819870000042
Thereby generating second order diffracted light. Therefore, the second-order diffraction maximum wavelengths of the A plate and the B plate are 495nm and 420nm respectively; the first order diffraction maximum wavelengths of the A and B plates were 700nm and 594 nm.
Since the illumination source is 45/0 annular light illumination, the incident and diffraction angles are 45 ° and 0 °, respectively. The obtained grating constants are 0.99 μm and 0.84 μm respectively when the maximum wavelengths of the first-order diffraction of the A version and the B version are 700nm and 594 nm.
The method used by the invention can complete the measurement of the grating constant of the laser material on the plain surface by one-time measurement without specifying the initial measurement position and angle and changing the relative included angle between the laser paper on the plain surface and the color measurement instrument, and has convenient and quick use and lower cost.

Claims (4)

1. A method for measuring grating constant of a prime surface laser mother plate by using a spectrophotometer comprises the following steps:
(1) selecting a color measuring instrument with 45/0 geometric measuring condition and annular light source illumination;
(2) selecting any position on the laser master plate of the prime surface to be tested, and taking the position as a measurement area;
(3) keeping the relative position of the measuring aperture of the color measuring instrument and the measuring point unchanged, and measuring the spectral energy information of the prime laser master plate;
(4) drawing a spectral energy distribution curve graph in a visible light range according to the spectral energy information acquired in the step (3), and analyzing the shape of the drawn spectral energy distribution curve and the position of the peak wavelength;
(5) calculating to obtain a grating constant of the prime surface laser master plate to be tested by combining a grating equation;
the color measuring instrument is a spectrophotometer, the incident angle of a light source is 45 degrees, and the receiving angle of the photoelectric detector is 0 degree; during measurement, a spectrophotometer is used for measuring the aperture and the plain surface laser master plate in direct contact measurement; obtaining the maximum wavelength of first-order diffraction according to the peak energy distribution at different wavelength positions on the spectral energy distribution curve graph; and combining the obtained first-order diffraction maximum wavelength with a grating equation to calculate the grating constant.
2. The method for measuring grating constants of a prime laser master with a spectrophotometer of claim 1, wherein: the measurement spectrum range of the color measurement instrument is not less than 400nm-700nm, and the measurement bandwidth is not less than 10 nm.
3. The method for measuring grating constants of a prime laser master with a spectrophotometer of claim 1, wherein: the measuring area on the plain laser master plate is a flat area without obvious scratch and smearing.
4. The method for measuring grating constants of a prime laser master with a spectrophotometer of claim 3, wherein: during measurement, the relative included angle between the plain surface laser paper and the color measuring instrument can be random, and the calculation of the grating constant of the plain surface laser paper can be completed by one-time measurement.
CN201910041825.0A 2019-01-16 2019-01-16 Method for measuring grating constant of prime surface laser master plate by using spectrophotometer Active CN109709053B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910041825.0A CN109709053B (en) 2019-01-16 2019-01-16 Method for measuring grating constant of prime surface laser master plate by using spectrophotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910041825.0A CN109709053B (en) 2019-01-16 2019-01-16 Method for measuring grating constant of prime surface laser master plate by using spectrophotometer

Publications (2)

Publication Number Publication Date
CN109709053A CN109709053A (en) 2019-05-03
CN109709053B true CN109709053B (en) 2021-09-14

Family

ID=66262202

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910041825.0A Active CN109709053B (en) 2019-01-16 2019-01-16 Method for measuring grating constant of prime surface laser master plate by using spectrophotometer

Country Status (1)

Country Link
CN (1) CN109709053B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111366096B (en) * 2020-03-09 2021-09-14 北京印刷学院 Method for measuring groove depth of holographic master plate
CN111721716B (en) * 2020-06-15 2023-03-17 深圳劲嘉集团股份有限公司 Method for measuring grating constant of matte cylindrical holographic printing material

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3715164A (en) * 1971-11-01 1973-02-06 Trw Inc Four beam holographic interferometry
CN103712919A (en) * 2013-11-02 2014-04-09 深圳扬丰印刷有限公司 Characterization and detection method of native-surface laser paper color characteristics
CN106950182A (en) * 2017-04-10 2017-07-14 北京印刷学院 A kind of method for differentiating different fresh laser mother matrix microstructures

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1123452A (en) * 1997-07-08 1999-01-29 Shimadzu Corp Diffraction interference measuring device
GB0711434D0 (en) * 2007-06-13 2007-07-25 Rue De Int Ltd Holographic security device
GB0722480D0 (en) * 2007-11-15 2007-12-27 Univ Aston Surface plasmons
CN103862908B (en) * 2014-03-13 2017-02-22 广东东南薄膜科技股份有限公司 Laser master mask and photoetching machine for manufacturing laser master mask
CN104296868B (en) * 2014-10-15 2016-03-02 清华大学深圳研究生院 A kind of method for designing of spectrometer and spectrometer
CN104501960B (en) * 2014-12-16 2016-07-06 杭州彩谱科技有限公司 A kind of spectrophotometric color measurement instrument based on LED light source and its implementation
CN108356444B (en) * 2017-12-29 2020-12-29 上海维凯光电新材料有限公司 UV (ultraviolet) die-pressing nickel plate seam welding strip and application and preparation method thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3715164A (en) * 1971-11-01 1973-02-06 Trw Inc Four beam holographic interferometry
CN103712919A (en) * 2013-11-02 2014-04-09 深圳扬丰印刷有限公司 Characterization and detection method of native-surface laser paper color characteristics
CN106950182A (en) * 2017-04-10 2017-07-14 北京印刷学院 A kind of method for differentiating different fresh laser mother matrix microstructures

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
光柱镭射纸的光谱和色度测量分析;黄敏 等;《光学学报》;20140630;第34卷(第6期);第0633002-2-6页 *

Also Published As

Publication number Publication date
CN109709053A (en) 2019-05-03

Similar Documents

Publication Publication Date Title
CN109916909B (en) Method and device for detecting surface morphology and subsurface defect information of optical element
CN109141224B (en) Interference reflection type optical thin film microscopic measurement method based on structured light
KR101486271B1 (en) Measuring Method For Three-dimensional Thickness Profile
CN109709053B (en) Method for measuring grating constant of prime surface laser master plate by using spectrophotometer
CN102519909B (en) Air-space low-interference phase microscope based on liquid crystal tunable filter
US11635289B2 (en) Surface shape measurement device and surface shape measurement method
JP2006250826A (en) Measuring element, processing device and measuring method, and measuring element of refractive index
CN103424190A (en) Dual-wedge-plate dispersion shearing interference hyperspectral imaging device and method
CN109827657B (en) Method and device for measuring grating constant of plain laser material
CN106950182B (en) A method of differentiating different fresh laser mother matrix microstructures
CN110736721A (en) Glass plate refractive index uniformity detection device and detection method based on diffraction grating
TWI458960B (en) White-light interference measuring device and interfere measuring method thereof
KR101794641B1 (en) A slope spectrum system for measuring height of object by using wavelength division
US11099068B2 (en) Optical instrumentation including a spatially variable filter
US20170314914A1 (en) Optical profilometer
CN115950890B (en) Spectral domain optical coherence tomography detection method and system for industrial detection
CN101532908A (en) Statistical modulation transfer function laser speckle measurement method for discrete imaging device and device
DE4105509C2 (en) Scattered light measuring arrangement for examining the surface roughness
Fujii et al. Surface roughness measurement using dichromatic speckle pattern: an experimental study
US20180252518A1 (en) Optical profilometer
CN210294038U (en) Line domain frequency domain optical coherence tomography detection and longitudinal coordinate calibration device
CN111366096B (en) Method for measuring groove depth of holographic master plate
RU2535519C2 (en) Method of remote measurement of surface roughness parameters
Csőke et al. Development and validation of a surface profiling system for end of line monitoring of microstructured elastomer seals based on chromatic confocal microscopy
Hamed et al. Computation of surface roughness using optical correlation

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant