A kind of devices and methods therefor of bridge measurement LED junction temperature
Technical field
The present invention relates to LED photovoltaic detection method, particularly relate to a kind of measurement mechanism and method thereof of LED junction temperature.
Background technology
LED (Light Emitting Diode) has been widely used in the fields such as signal designation, liquid crystal backlight, display, general illumination.But, the photoelectric color characteristic of LED self and life-span and junction temperature closely related.Junction temperature rising can cause that the luminescence efficiency of LED reduces, the lost of life.Therefore, how fast, science, easily measurement LED junction temperature just become the breach of problem.
At present, the LED junction temperature measurement method that national and foreign standards is recommended has: 1, forward voltage method, and involved prior art document has EIA/JEDEC standard JESD51-1, Chinese Industrial Standards (CIS) 200910198965.5, Chinese patent 200920212653.0, Chinese patent 200910198965.5; 2, heat resistance method, the method is the thermal power by measuring LED pipe pin temperature and chip cooling, and thermal resistivity determines junction temperature, need in conjunction with forward voltage method to determine thermal resistivity in measurement, involved prior art document has standard SJ/T11394-2009; 3, based on the peak wavelength method of spectral characteristic, involved prior art document has Third International Conference on Solid State Lighting, Proceedings of SPIE 2010.5187:93-99; 4, valley wavelength method, involved prior art document has spectroscopy and spectral analysis, 2013, and 33 (1): 36-39; 5, radiation intensity method, involved prior art document has optoelectronic laser 2009, and 20 (8): 1053-1057; 6, blue Bai Bifa, involved prior art document has Third international conference on solid state lighting, proceedings of SPIE 2010.5187:107-114; 7, Micro-Rpectra method, involved prior art document has Phys.Status.Solidi, A202 (2005) 824; 8, centre wavelength method, involved prior art document has Microelectronics Reliability, 2013, and 53 (5): 701-705; 9, based on the liquid crystal array thermal imaging method of infrared radiation, involved prior art document has Phys.Stat.Sol (c) 1 (2004) 2429.
It is current junction temperature measurement field " goldstandard " that voltage method measures junction temperature, is considered to measurement result the most reliable, its test philosophy and process as follows:
Forward voltage method is the temperature effect of the PN junction electronic transport utilizing LED, by measuring measuring current I
sunder forward voltage calculate junction temperature.Experiment and theory all show, under constant current driven, LED both end voltage with junction temperature linear change, that is:
U
F(T
2)=U
F(T
1)+K(T
2-T
1) (1)
In formula, U
f(T
2), U
f(T
1) be respectively junction temperature at T
2, T
1time LED forward voltage, K is voltage-temperature coefficient, and usually, for these two kinds of luminescent materials of AlInGaP and InGaN, its K value is about-2mV/ DEG C.Its testing procedure is as follows:
(1) measurement of K value.Concrete grammar is, at selected measuring current I
s, the PN junction of retainer member is in different steady temperature fields, measures device forward voltage under different junction temperature, calculates K.Formula is:
In formula: U '
2, U '
1for environment temperature is T '
2, T '
1time LED junction voltage.During measurement, General Requirements T '
2, T '
1differ more than 50 DEG C, usually, I
sbe not more than the rated current of 5%.
(2) measurement of LED junction temperature under working current.First, at measuring current I
sunder, measure the voltage U at LED two ends
f(T
1), due to I
svery little, also little to the heating of LED, can think T
1equal environment temperature.Then, at the working temperature, LED energising is kept duty, when reaching thermal equilibrium, power-off makes LED depart from duty, then 10
-5interior connection calibration electric current, and measure forward voltage U
f(T
2).
(3) according to formula (1), junction temperature T during LED work is calculated
2.
Clearly, there are technological difficulties in voltage method measurement junction temperature: 10
-5voltage in second under the driving of Measurement accuracy Calibrated current.This difficult point has solution at present, and also have shaping equipment, as the TRA-200LED thermal resistance structure analytic system (price 200,000 Renminbi) of a distant place, Hangzhou company, but price is higher.(reason to use data collector quickly and accurately, and this device price is higher).
Summary of the invention
Voltage is obtained for adopting the method for high-speed sampling in prior art, high to sampling rate, accuracy requirement, require higher to the control errors of system, cause the problem that qualified voltage tester instrument is somewhat expensive, the invention provides a kind of based on Huygens's electric bridge, accurately and reliably, facilitate succinct LED junction temperature measurement device and method, this device use cost is lower, and the method compares calibration electric current I repeatedly by electric bridge
sthe voltage at lower LED two ends and the voltage at precision resistance two ends, obtain U more accurately
f(T
2), instead of directly high speed acquisition obtains U
f(T
2), reduce technical difficulty, reduce instrument cost, and easy to use, the junction temperature of LED can be measured simply efficiently.
Technical scheme of the present invention is:
With a device for Huygens's bridge measurement LED junction temperature, the Huygens's electric bridge comprising power supply E and be made up of variable resistor R1, variable resistor R2, variable resistor R3, LED, also comprises quick converting switch S1 and S '
1, whether electric bridge conducting controls by switch S 1, LED by switch S '
1be connected with working power, in the middle of electric bridge, be also connected with DC voltage amplifier, its output terminal connects pulse stretcher, and its output terminal connects the LED array of forward and Opposite direction connection.
Further, described LED is arranged on thermostat together with lamp socket, and both thermo-contacts are good.
Further, described LED outside is also provided with for preventing environment heat flow on the cloche of the impact of LED environment temperature.
Further, the enlargement factor of described DC voltage amplifier is not less than 10
3, maximum output is 4V, and input resistance is greater than 100K Ω.
Further, described pulse stretcher can by the pulse voltage of 900 microseconds to 1100 microseconds, and broadening is the DC pulse voltage of 1 second.The pulse voltage of other width, not broadening.
Further, described LED array is by positive and negative connection, and trigger voltage is greater than 2.2V, is less than 5V.
Further, described switch S and S
/for quick converting switch, switching time is less than 10
-5s. (note, general semiconductor switch can meet the demands)
A method for bridge measurement LED junction temperature, comprises the steps:
(1) demarcation of K:
Closed S1, regulates R
1and R
2, make the electric current flowing through LED be measuring current I
s, described measuring current I
srefer to the electric current being less than rated current 10%, the electric current now flowing through LED is smaller, can think that the electric current now flowing through LED is very little negligible for the impact of LED junction temperature, and now extraneous environment temperature is similar to the junction temperature thinking LED;
The temperature of setting thermostat is T1, and after thermal equilibrium, regulate R1, R3 two variable resistance boxs to make two LED in LED array all not luminous, show that electric bridge is in a basic balance, the voltage at R3 two ends is exactly the voltage U at LED two ends
f(T
1);
The temperature of setting thermostat is T2, and after thermal equilibrium, regulate R1, R3 two variable resistance boxs to make two LED in LED array all not luminous, i.e. bridge balance, the voltage at R3 two ends is exactly the voltage U at LED two ends
f(T
2),
According to formula
calculate K;
(2) junction temperature measurement of LED under working current:
Closed S1, then sets thermostat temperature T
3, regulate adjustable resistance R3, making by LED current is Is, and regulate R3 to make two LED in LED array not luminous, i.e. bridge balance, recording LED both end voltage is U
1, computing formula
Closed S '
1, disconnect S1, under the effect of working power U, LED works, if now junction temperature is junction temperature to be measured is T4 simultaneously; Junction temperature test starts: switch S 1 999ms turn-on time, then disconnects, 10
-5s ' in second
1turn-on time is 1ms, and (that is: switch change-over mode is that S1 connects 999ms, then connects S then so repeatedly
/11 milliseconds, then connect S1 999ms, then connect S
/11 milliseconds, so repeatedly), observe the luminous situation of LED in LED array, if forward install LED bright, and oppositely install dark, increase R3, otherwise, reduce R3. until two LED all do not work in LED array, if two LED are always bright, account for voltage error is larger, voltage error should be reduced, or adjustment DC voltage amplifier, two LED in LED array are not all worked, bridge balance; Now, the voltage computing formula at LED two ends is
Junction temperature calculates: junction temperature
The invention has the beneficial effects as follows:
1, the present invention does not require Measurement accuracy 10
-5lED both end voltage in second, only needs the luminous situation of observing LED in LED array, convenient and simple.Junction temperature levels of precision depends on the noise of circuit, as long as therefore choose reasonable circuit, allow noise can not LED in driving LED array, meanwhile, if voltage noise is excessive, LED two be only all bright, plays reminding effect.
2, owing to have employed pulse strenching technology, although survey frequency is 1Hz, if electric bridge is uneven, LED can light yellow always, can not glimmer, facilitate observation.
3, owing to only carrying out broadening to 900 microseconds to the pulse of 1100 microseconds, the pulse not reaching requirement is not amplified, and restrained effectively burr shape noise.
4, the present invention can measure the junction temperature of LED under any type of working current of interchange, pulse etc., strong adaptability.
Accompanying drawing explanation
Fig. 1 is the circuit connection diagram of the device of the present invention's bridge measurement LED junction temperature;
Fig. 2 is the schematic diagram of switch of the present invention;
Fig. 3 is LED is placed on thermostat structural representation together with lamp socket;
Fig. 4 is the electric current graph of a relation over time flowing through LED;
Fig. 5 is the measurement procedure figure of the method for the present invention's bridge measurement LED junction temperature;
Fig. 6 is the johning knot composition of DC voltage amplifier in the present invention;
Fig. 7 is the structural representation of LED array structure in the present invention.
In figure: 1, cloche; 2, LED.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in further detail.
The present invention with the circuit connection diagram of the device of bridge measurement LED junction temperature as shown in Figure 1, circuit comprises testing power supply E, variable resistor R1, R2, R3, LED seat (in figure, LED is placed on lamp socket), this forms Huygens's electric bridge, and whether electric bridge conducting controls by switch S 1.LED by switch S '
1be connected with working power (or claiming heating power supply), circuit breaker in middle S1 and S '
1be quick converting switch, as Fig. 2, general MOS or the field effect transistor of adopting realizes.In the middle of electric bridge, be also connected with DC voltage amplifier, its output terminal connects pulse stretcher, and its output terminal connects the LED array of forward and Opposite direction connection.Wherein, as shown in Figure 6, the structure of LED array as shown in Figure 7 for the syndeton of DC voltage amplifier.
LED2 is placed on thermostat together with lamp socket, and as Fig. 3, both thermo-contacts are good, and the temperature of thermostat can 0-100 DEG C of change, and error is less than 0.3 DEG C (in embodiment, the model of thermostat is TC-100).As a kind of preferred structure, LED outside is also provided with cloche 1, and cloche is for preventing environment heat flow on the impact of LED2 environment temperature, and the preferred size of cloche is diameter 10cm, and the preferred size of cloche can not be too little, otherwise affect LED2 thermal equilibrium.
The enlargement factor of DC voltage amplifier is not less than 10
3, maximum output is 4V, and input resistance is greater than 100K Ω; Pulse stretcher can by the pulse voltage of 900 microseconds to 1100 microseconds, and broadening is the pulse voltage of the DC pulse voltage of 1 second, other width, not broadening; LED array is by positive and negative connection, and trigger voltage is greater than 2.2V, is less than 5V; Switch S and S
/for quick converting switch, switching time is less than 10
-5s. (general semiconductor switch can meet the demands)
Measuring current described in the present invention refers to the electric current being less than rated current 10%.The present embodiment adopts 1mA.In addition, the circuit that the EPM7128SLC84-15 chip of MAX7000 series that what pulse strenching in the present embodiment adopted is is formed, time clock is 1.0 microseconds.The enlargement factor beta of pulse voltage amplifying circuit, with the cut-in voltage Von of LED, the pass between noise voltage Vnoise is: Von > beta × Vnoise, and embodiment selects Von=1.5 × beta × Vnoise.
The principle that the present invention measures LED junction temperature is the principle that voltage method measures junction temperature, is still measure junction temperature voltage coefficient K, then measuring voltage U
f(T
2).But implementation procedure is obviously different compared with the existing methods, the present invention's Huygens's bridge measurement LED junction temperature, and as shown in Figure 5, concrete steps are as follows for its step:
One, the demarcation of K
Closed S1, regulates R
1and R
2, make the electric current flowing through LED be measuring current I
s(occurrence does not require very accurate, as long as electric current is smaller, be generally less than 10% rated current), the electric current now flowing through LED is smaller, can think that the electric current now flowing through LED is very little negligible for the impact of LED junction temperature, now extraneous environment temperature (temperature of thermostat) just can be similar to the junction temperature thinking LED.
The temperature of setting thermostat is T1 (the present embodiment setting T1 is 10 DEG C), and after thermal equilibrium, regulate R1, R3 two variable resistance boxs that two LED in LED array are not all worked, i.e. bridge balance, the voltage at R3 two ends is exactly the voltage U at LED two ends
f(T
1) (being 2.615V in the present embodiment).
The temperature of setting thermostat is T2 (the present embodiment setting T2 is 60 DEG C), and after thermal equilibrium, regulate R1, R3 two variable resistance boxs that two LED in LED array are not all worked, i.e. bridge balance, the voltage at R3 two ends is exactly the voltage U at LED two ends
f(T
2),
(being 2.703V in the present embodiment).
According to formula (2), calculate K=1.76mV/ DEG C.
Two, the junction temperature measurement of LED under working current
Closed S1, then sets thermostat temperature T
3(in the present embodiment, set T
3it is 10 DEG C), regulate adjustable resistance R3, making by LED current is that (occurrence does not require very accurate Is, as long as electric current is smaller, be generally less than 10% rated current, can not be identical with the Is demarcated in K), regulate R3 that two LED in LED array are not all worked, i.e. bridge balance, recording LED both end voltage is U
1, computing formula
(being 2.615V in the present embodiment).(now, T3 is not specific, can equal T1 or T2, and namely the process of this section can not have yet, and directly adopts U
1=U
f(T
1) or U
1=U
f(T
2), directly adopt U in the present embodiment
1=U
f(T
1)).
Closed S '
1, disconnect S1, under the effect of working power U, LED works, if now junction temperature is junction temperature to be measured is T4 simultaneously; Junction temperature test starts: switch S 1 999ms turn-on time, then disconnects, 10
-5s ' in second
1turn-on time is 1ms, and (that is: switch change-over mode is that S1 connects 999ms, then connects S then so repeatedly
/11 milliseconds, then connect S1 999ms, then connect S
/11 milliseconds, so repeatedly), observe the luminous situation of LED in LED array, if the LED that forward is installed is bright, and oppositely install dark, increase R3, otherwise, reduce R3. until two LED all do not work in LED array, if (two LED are always bright, and account for voltage error is comparatively large, should reselect the electric bridge of good stability, in this patent, procurator determines the content whether write in bracket) two LED in LED array are not all worked; Now, the voltage computing formula at LED two ends is
(being 2.708 in the present embodiment).
Junction temperature calculates: junction temperature
(in the present embodiment, being 62.84 DEG C).
In this patent measuring process, LED current is relation over time, sees Fig. 4.In figure, Is is measuring current, the electric current that namely E is corresponding, and Io is working current, the electric current that namely U is corresponding.In the 0-t1 time period, s1 closes, and s1 ' disconnects, and LED, by measuring current Is, completes the mensuration of k-factor.That is, first set the temperature T1 of thermostat, regulate electric bridge, make it balance, obtain the voltage U at LED two ends
1'.Then thermostat temperature is set as T2, regulates electric bridge, make it balance, obtain the voltage U at LED two ends
2', substitute into (2) formula, obtain K.
T1 ~ t2 time is the heat time, and s1 ' closes, and s1 disconnects, and the electric current of LED is working current Io.
T2 ~ t3 time is Measuring Time, and s1 closes, and s1 ' disconnects, voltage amplifier, if pulse stretcher and LED array work. bridge balance, in LED array, two LED all do not work, and test terminates, if uneven, adjusting resistance R3, then Repeat-heating and measuring process, until bridge balance.Owing to have employed stretch circuit, if Voltage unbalance, always have a LED bright, one dark.
The ratio of the test duration selected in this patent process and heat time is 1:999, and such test process is very little on the impact of junction temperature.
In sum, by adopting above-mentioned technological means, device and method of the present invention has the following advantages: 1, and single is demarcated, repetitive measurement.Namely within the scope of wide junction temperature, only need to select several junction temperature nominal voltage-junction temperature COEFFICIENT K, during measurement, as long as the LED illumination System of same model, the result of demarcating all can be adopted to obtain junction temperature.2, simple to operate, only need to regulate R3.3, do not need voltage that is accurate, Quick Measurement LED two ends, only need the precision resistance case of low value, the equipment such as stretch circuit and pulse amplifying circuit.4, affect little by noise voltage, easy Measurement accuracy, the repeatability of measurement is high, little for characterizing junction temperature error.5, working current (Io) is the electric current of any form (square wave exchanges, pulse etc.).6, may be used for single LEDs junction temperature measurement, the average junction temperature that also may be used for the array of plurality of LEDs composition is measured, and usable range is wide.
The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention.All any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.