CN104301640A - High-efficiency time sequence driving method of NMOS linear array image sensor - Google Patents

High-efficiency time sequence driving method of NMOS linear array image sensor Download PDF

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CN104301640A
CN104301640A CN201410440598.6A CN201410440598A CN104301640A CN 104301640 A CN104301640 A CN 104301640A CN 201410440598 A CN201410440598 A CN 201410440598A CN 104301640 A CN104301640 A CN 104301640A
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pixel
signal
read
integration
time
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CN104301640B (en
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张佩杰
宋克非
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Changchun Institute of Optics Fine Mechanics and Physics of CAS
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Changchun Institute of Optics Fine Mechanics and Physics of CAS
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Abstract

The invention relates to a high-efficiency time sequence driving method of an NMOS linear array image sensor. The high-efficiency time sequence driving method of the NMOS linear array image sensor comprises the following steps that first, when t equals to zero, a first driving pulse sequence is applied to make the image sensor reset, and frame readout cycle count k is initialized to be zero, wherein k is a positive integer and used for counting the cycles which are read out; second, when the frame readout cycle count k is increased by one, k and one equal to k; third, for all f[i]s, i is larger than or equal to one and smaller than or equal to m, and whether k can be divided exactly by f[i]s or not is checked; fourth, t equals to kT[C], a second driving pulse sequence is applied, and the second step is executed again. The high-efficiency time sequence driving method of the NMOS linear array image sensor is flexible, simple and easy to implement, the integral time of different pixels in one data frame of the image sensor can be set at will, and the length of the integral time of different pixels is irrelevant to the position of the pixels on the image sensor.

Description

A kind of efficient Timing driver method of NMOS line scan image sensor
Technical field
The present invention relates to a kind of NMOS line scan image sensor, particularly a kind of efficient Timing driver method of NMOS line scan image sensor.
Background technology
Figure 1 shows that the read-out principle figure of signal charge in NMOS line scan image sensor pixel, to the output signal of circuit, the output signal electric current of charge amplifier to pixel is adopted to carry out integration, current signal is converted to voltage signal, after filtering, amplifying, the DC level of the signal obtained is directly proportional to the quantity of electric charge of signal charge in pixel.The reading circuit of this structure is called current-output type reading circuit.
Figure 2 shows that NMOS linear array detector has the reading circuit principle schematic of subsection integral function.Bias voltage is connected with output signal end by series resistance.During sense switch conducting corresponding to certain pixel of NMOS line scan image sensor, if the gating switch that this pixel is corresponding turns off, circuit is in open-circuit condition, and pixel signal can not export output signal end to, and bias voltage can not carry out charging to imageing sensor internal circuit and reset; If the gating switch conducting that this pixel is corresponding, pixel signal exports output signal end to, and bias voltage can carry out charging reset to imageing sensor by circuit as shown in Figure 1 like that.Strobe pulse Φ select is for controlling conducting and the off state of gating switch.
Driving pulse sequence as shown in Figure 3.For the universal product of NMOS line scan image sensor, by the particular design of driver' s timing, the function of subsection integral can be realized.Except the reset that the driver' s timing shown in Fig. 3 is used for imageing sensor, drive sequences shown in design drawing 4, drive sequences shown in Fig. 3, Fig. 4 is alternately input on imageing sensor, can realize the function of subsection integral, realizes subsection integral function by the method changing driver' s timing.
For the reading circuit with subsection integral function shown in Fig. 2, sense switch conducting successively under the effect of outside driving pulse sequential of all pixels, but whether the signal in pixel reads and also will be subject to gating switch Φ select and control.Therefore, in a frame readout interval, some pixel can be selected to read, the signal in pixel resets, and other pixel does not read, and can proceed integration.Conventional drive sequences shown in Fig. 5 and Fig. 6 is used alternatingly, and coordinates hardware circuit to realize the function of subsection integral.The sequence of driving pulse shown in Fig. 5 is used for the initial reset of imageing sensor, and the picture signal now exported is invalid signals.When the sequence of driving pulse shown in Fig. 6 acts on transducer, the picture signal of output is useful signal, for realizing the function of subsection integral.Also the sequence of driving pulse shown in Fig. 6 can be used for the initial reset of imageing sensor, Fig. 5 is used for effective pixel signal of output image transducer.
The sequence of driving pulse shown in Fig. 6 is the read pulse of one group of pixel that in imageing sensor, the time of integration is identical, is the general designation of one group of driving pulse sequence.If in frame readout interval, need the view data reading kth group pixel, the corresponding time of integration is T k, the sequence number of this group pixel is (N altogether kindividual).In the reading driver' s timing of this two field picture, φ st, φ 1, φ 2do not change, with driving pulse sequence 1.1st ~ k-1 group pixel does not need to read, therefore, and (control signal-strobe pulse the φ of a) gating switch in Fig. 6 in these pixel readout intervals select1, keep low level, gating switch turns off always, and signal output part no signal exports (low level represents that gating switch turns off).Kth group pixel, pixel position sequence number need to read, therefore, the control signal φ of (b in Fig. 6) gating switch in these pixel readout intervals select1, become high level, gating switch conducting, signal output part has signal to export.Kth+1 ~ m group pixel does not need to read, therefore, and the control signal-strobe pulse φ of (c in Fig. 6) gating switch in these pixel readout intervals select1, be low level, gating switch turns off, and signal output part no signal exports.
When realizing subsection integral function, conventional drive sequences shown in Fig. 5 and Fig. 6 is used alternatingly to realize subsection integral.But the implementation efficiency of this subsection integral driving pulse sequence is low, when once reading, be merely able to the data (all pixels that the time of integration is identical) of reading one group of pixel; The effective image data reading frequency of all pixels depends on the maximum time of integration of all pixels, repeatedly can not read the view data of pixel short time of integration in an integration period of pixel long time of integration, and the time of integration, short pixel utilance was low.
Summary of the invention
The present invention will solve technical problem of the prior art, provides a kind of efficient Timing driver method of NMOS line scan image sensor.
In order to solve the problems of the technologies described above, technical scheme of the present invention is specific as follows:
An efficient Timing driver method for NMOS line scan image sensor, comprises the following steps:
A) during t=0, apply driving pulse sequence 1, imageing sensor is resetted, and frame readout interval counting k is initialized as 0, k is positive integer, for counting the cycle of reading;
B) frame readout interval counting k increases by 1, k=k+1;
C) for all f i, 1≤i≤m, checks f iwhether can divide exactly k, namely check that k is f iintegral multiple; If k is f iintegral multiple, then represent at t=kT cin time, needs to read f isignal in i-th group of corresponding pixel, is designated as 1 by the reading mark of this group pixel; If k is not f iintegral multiple, then represent at t=kT cin time, does not need to read f isignal in i-th group of corresponding pixel, is designated as 0 by the reading mark of this group pixel;
D) t=kT c, apply driving pulse sequence 2, the generation principle of driving pulse sequence 2 is: read all readings and be masked as signal in the pixel of 1, in the readout interval start time of this pixel, by strobe pulse φ select1become 1, pixel reads the mark signal be designated as in the pixel of 0 not to be needed to read, in the readout interval start time of this pixel, by strobe pulse φ select1become 0; Get back to step b.
In technique scheme, at the T different time of integration of subsection integral i, 1≤i≤m in the allowed band of the time of integration according to certain rule value: according to T different time of integration i, 1≤i≤m and minimum frame readout interval T minsize, make T i, the value of 1≤i≤m has minimum common factor T c, that is:
T i=f iT C,1≤i≤m
Wherein, f i, 1≤i≤m is positive integer, f i>=1, and the minimum common factor T of the time of integration c, and minimum common factor T cbe not less than minimum frame readout interval T min, T c>=T min.
In technique scheme, read the methods for designing of the driving pulse sequence of the data of the time of integration identical 2 groups or many group pixels in a frame readout interval simultaneously, in a readout interval, need the view data simultaneously reading jth, k group pixel, the corresponding time of integration is respectively T j, T k, the sequence number of two groups of pixels is divided into 1st ~ j-1 group pixel does not need to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, keep low level, gating switch turns off always, and signal output part no signal exports; Jth group pixel needs to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, become high level, gating switch conducting, signal output part has signal to export; Jth+1 ~ k-1 group pixel does not need to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, be low level, gating switch turns off, and signal output part no signal exports; Kth group pixel needs to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, become high level, gating switch conducting, signal output part has signal to export; Kth+1 ~ m group pixel needs to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, be low level, gating switch turns off, and signal output part no signal exports.
The present invention has following beneficial effect:
The efficient Timing driver method of NMOS line scan image sensor of the present invention:
1) method is flexible, and simply, be easy to realize, in imageing sensor one frame data, the time of integration of different pixel can arbitrarily be arranged, and the size of different pixel time of integration is irrelevant with pixel position on the image sensor;
2) efficiency is high, and pixel utilance is high, in an integration and readout interval of the pixel of the long time of integration, repeatedly can read the view data of short integration pixel;
3) function is strong, and the light integration of the difference pixel time of integration can not influence each other with reading, can read simultaneously;
4) applied widely, be not only applicable to NMOS line scan image sensor, be also applicable to the line scan image sensor that other use similar driving method.
Accompanying drawing explanation
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.
Fig. 1 is the read-out principle schematic diagram of signal charge in existing NMOS line scan image sensor pixel.
Fig. 2 is the reading circuit principle schematic that existing NMOS linear array detector has subsection integral function.
Fig. 3 is NMOS line scan image sensor driving pulse sequence diagram.
Fig. 4 is the design of driving timing sequence schematic diagram of NMOS line scan image sensor subsection integral.
Fig. 5 is the pulsed drive sequence diagram for resetting.
Fig. 6 is the read pulse schematic diagram of kth group pixel.
The grouping schematic diagram of pixel when Fig. 7 is the subsection integral in the efficient Timing driver method of NMOS line scan image sensor of the present invention.
The read pulse schematic diagram that Fig. 8 is jth in the efficient Timing driver method of NMOS line scan image sensor of the present invention, k two groups of pixels read simultaneously.
Fig. 9 is the driver' s timing schematic diagram of the efficient Timing driver method of NMOS line scan image sensor of the present invention.
Embodiment
Invention thought of the present invention is:
Key point of the present invention is the change of hardware driving circuit by changing NMOS line scan image sensor and the design of driving pulse sequence, realizes the subsection integral function of imageing sensor pixel.
The efficient Timing driver method of NMOS line scan image sensor of the present invention, can read several groups of pixels that the time of integration is different when a frame reads simultaneously.The time of integration of different pixel is optimized, makes be the integral multiple (requiring that the minimum integration time is not less than minimum frame readout interval) of its minimum integration time the time of integration of all pixels, though different time of integration T i, the value of 1≤i≤m has minimum common factor T c, minimum common factor T cbe not less than minimum frame readout interval T min.And the selection of several groups of pixels simultaneously read, need method according to the rules to calculate.
Below in conjunction with accompanying drawing, the present invention is described in detail.
In order to realize the realization of subsection integral function, when design driven pulse train, need first to divide into groups according to the pixel of difference to transducer of the time of integration:
As shown in Figure 7, if the quantity of sensor pixels is N, on imageing sensor the position number of pixel be designated as 1,2 ..., N.According to the difference of the time of integration, all for transducer pixels are divided into m group (have the time of integration that m is different in a two field picture, the time of integration, identical pixel was as a group), corresponding pixel number be respectively N1, N2 ..., Nm, the corresponding time of integration is respectively T 1, T 2..., T m.The time of integration is T iin one group of pixel of 1≤i≤m, pixel position number is in the image sensor designated as:
P i,1,P i,2,P i,j(1≤j≤N i),
Such as, the position number in image taking sensor is mark (Fig. 7), and it is P that the 1st group of pixel comprises sequence number 1,1~ P 1, N1the pixel of (altogether N1), the time of integration is designated as T 1; It is P that 2nd group of pixel comprises sequence number 2,1~ P 2, N2the pixel of (altogether N2), the time of integration is designated as T 2.Be T for being the time of integration time of integration kone group of pixel, position number in the image sensor can be continuous print, also can be discontinuous, and namely the non-conterminous several sections of pixels in position in imageing sensor, also can use the identical time of integration.Such as, in Fig. 7, the 1st group of pixel P 1,1~ P 1, N1position is in the image sensor continuous print, the 2nd group of pixel P 2,1~ P 2, N2(altogether N2) position is in the image sensor discontinuous, is divided into P 2,1~ P 2, j, two continuous print parts.
Relation is met between the different time of integration:
|T i-T j|>T min1≤i≤m,1≤j≤m,i≠j
T min=min (T z), be the shortest frame readout interval of imageing sensor, read a two field picture can shortest time, the ability of this driving parameter and imageing sensor inherent parameters and outside reading circuit.
The optimization of the difference value time of integration in subsection integral
Therefore, at the T different time of integration of subsection integral i, 1≤i≤m in the allowed band of the time of integration according to certain rule value: according to T different time of integration i, 1≤i≤m and minimum frame readout interval T minsize, make T i, the value of 1≤i≤m has minimum common factor T c, that is:
T i=f iT C,1≤i≤m
Wherein, f i, 1≤i≤m is positive integer, f i>=1, and the minimum common factor T of the time of integration c, and minimum common factor T cbe not less than minimum frame readout interval T min,
T C≥T min
Be from the difference of the prior art shown in Fig. 6 or improvement: the time of integration of different pixel is optimized, make be the integral multiple (requiring that the minimum integration time is not less than minimum frame readout interval) of its minimum integration time the time of integration of all pixels, several groups of pixels of the different time of integration can be read simultaneously.
The driver' s timing that many groups pixel reads simultaneously
In the grouping of pixel shown in Fig. 7, be merely able to read one group of pixel with the identical time of integration, if need the data reading the time of integration identical 2 groups or many group pixels in a frame readout interval simultaneously, driving pulse sequence as shown in Figure 8.
Fig. 8, to read the view data of 2 groups of pixels in a frame readout interval simultaneously, illustrates in a frame readout interval methods for designing of the pulsed drive sequential simultaneously reading the time of integration identical 2 groups or many group pixels.Be located in this readout interval, need the view data simultaneously reading jth, k group pixel, the corresponding time of integration is respectively T j, T k, the sequence number of two groups of pixels is divided into in the reading driver' s timing of this two field picture, φ st, φ 1, φ 2with pulse 1.
1st ~ j-1 group pixel does not need to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, keep low level, gating switch turns off always, and signal output part no signal exports.Jth group pixel needs to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, become high level, gating switch conducting, signal output part has signal to export.Jth+1 ~ k-1 group pixel does not need to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, be low level, gating switch turns off, and signal output part no signal exports.Kth group pixel needs to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, become high level, gating switch conducting, signal output part has signal to export.Kth+1 ~ m group pixel needs to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, be low level, gating switch turns off, and signal output part no signal exports.
Be with the difference of the prior art shown in Fig. 6 or improvement: this driving pulse sequence can when a frame reads the view data of several groups of pixels simultaneously, and prior art is when a frame reads, be merely able to the view data of reading one group of pixel (there is the pixel of the identical time of integration).Because the data of imageing sensor pixel were divided into groups according to the time of integration, driving pulse sequence shown in Fig. 8 can read when once reading several groups of pixels that the time of integration is different simultaneously, and the selection of several groups of pixels simultaneously read, need to calculate according to hereinafter described method.
Driver' s timing is as shown in Figure 9:
A) during t=0, apply driving pulse sequence 1, imageing sensor is resetted, and frame readout interval counting k is initialized as 0 (k is positive integer, for counting the cycle read);
B) frame readout interval counting k increases by 1, k=k+1;
C) for all f i, 1≤i≤m, checks f iwhether can divide exactly k, namely check that k is f iintegral multiple.If k is f iintegral multiple, then represent at t=kT cin time, needs to read f isignal in i-th group of corresponding pixel, is designated as 1 by the reading mark of this group pixel; If k is not f iintegral multiple, then represent at t=kT cin time, does not need to read f isignal in i-th group of corresponding pixel, is designated as 0 by the reading mark of this group pixel;
D) t=kT c, apply driving pulse sequence 2, the generation principle of driving pulse sequence 2 is: read all readings and be masked as signal in the pixel of 1 (in the readout interval start time of this pixel, by strobe pulse φ select1become 1), pixel reads the mark signal be designated as in the pixel of 0 not to be needed to read (in the readout interval start time of this pixel, by strobe pulse φ select1become 0).Get back to step b.
Give a kind of high efficiency driving pulse time sequence design method of subsection integral reading circuit, in the method, in the process of the signal in the pixel reading the length time of integration, repeatedly can read the signal in the pixel of the end time of integration, improve the response speed of imageing sensor, enable imageing sensor react the change of incident optical signal more accurately.
Obviously, above-described embodiment is only for clearly example being described, and the restriction not to execution mode.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here exhaustive without the need to also giving all execution modes.And thus the apparent change of extending out or variation be still among the protection range of the invention.

Claims (3)

1. an efficient Timing driver method for NMOS line scan image sensor, is characterized in that, comprise the following steps:
A) during t=0, apply driving pulse sequence 1, imageing sensor is resetted, and frame readout interval counting k is initialized as 0, k is positive integer, for counting the cycle of reading;
B) frame readout interval counting k increases by 1, k=k+1;
C) for all f i, 1≤i≤m, checks f iwhether can divide exactly k, namely check that k is f iintegral multiple; If k is f iintegral multiple, then represent at t=kT cin time, needs to read f isignal in i-th group of corresponding pixel, is designated as 1 by the reading mark of this group pixel; If k is not f iintegral multiple, then represent at t=kT cin time, does not need to read f isignal in i-th group of corresponding pixel, is designated as 0 by the reading mark of this group pixel;
D) t=kT c, apply driving pulse sequence 2, the generation principle of driving pulse sequence 2 is: read all readings and be masked as signal in the pixel of 1, in the readout interval start time of this pixel, by strobe pulse φ select1become 1, pixel reads the mark signal be designated as in the pixel of 0 not to be needed to read, in the readout interval start time of this pixel, by strobe pulse φ select1become 0; Get back to step b.
2. the efficient Timing driver method of NMOS line scan image sensor according to claim 1, is characterized in that, at the T different time of integration of subsection integral i, 1≤i≤m in the allowed band of the time of integration according to certain rule value: according to T different time of integration i, 1≤i≤m and minimum frame readout interval T minsize, make T i, the value of 1≤i≤m has minimum common factor T c, that is:
T i=f iT C,1≤i≤m
Wherein, f i, 1≤i≤m is positive integer, f i>=1, and the minimum common factor T of the time of integration c, and minimum common factor T cbe not less than minimum frame readout interval T min, T c>=T min.
3. the efficient Timing driver method of NMOS line scan image sensor according to claim 1, is characterized in that,
In a frame readout interval, read the methods for designing of the driving pulse sequence of the data of the time of integration identical 2 groups or many group pixels, in a readout interval, need the view data simultaneously reading jth, k group pixel, the time of integration of correspondence is respectively T simultaneously j, T k, the sequence number of two groups of pixels is divided into 1st ~ j-1 group pixel does not need to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, keep low level, gating switch turns off always, and signal output part no signal exports; Jth group pixel needs to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, become high level, gating switch conducting, signal output part has signal to export; Jth+1 ~ k-1 group pixel does not need to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, be low level, gating switch turns off, and signal output part no signal exports; Kth group pixel needs to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, become high level, gating switch conducting, signal output part has signal to export; Kth+1 ~ m group pixel needs to read, therefore, and the control signal-strobe pulse φ of these pixel readout interval internal gating switches select1, be low level, gating switch turns off, and signal output part no signal exports.
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CN104864960A (en) * 2015-04-30 2015-08-26 中国科学院长春光学精密机械与物理研究所 Dynamic calibration and correction method for fixed errors of NMOS linear array image sensor system
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