CN104284625B - 用于对目标对象的表面的深度进行仿形的装置和方法 - Google Patents

用于对目标对象的表面的深度进行仿形的装置和方法 Download PDF

Info

Publication number
CN104284625B
CN104284625B CN201380023599.4A CN201380023599A CN104284625B CN 104284625 B CN104284625 B CN 104284625B CN 201380023599 A CN201380023599 A CN 201380023599A CN 104284625 B CN104284625 B CN 104284625B
Authority
CN
China
Prior art keywords
target object
laser array
illumination pattern
image
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201380023599.4A
Other languages
English (en)
Chinese (zh)
Other versions
CN104284625A (zh
Inventor
A·弗里登博格
M·卡佩吉
S·格罗南博恩
P·佩卡斯基
A·里茨
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of CN104284625A publication Critical patent/CN104284625A/zh
Application granted granted Critical
Publication of CN104284625B publication Critical patent/CN104284625B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/103—Measuring devices for testing the shape, pattern, colour, size or movement of the body or parts thereof, for diagnostic purposes
    • A61B5/107—Measuring physical dimensions, e.g. size of the entire body or parts thereof
    • A61B5/1077—Measuring of profiles
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/103—Measuring devices for testing the shape, pattern, colour, size or movement of the body or parts thereof, for diagnostic purposes
    • A61B5/107—Measuring physical dimensions, e.g. size of the entire body or parts thereof
    • A61B5/1079—Measuring physical dimensions, e.g. size of the entire body or parts thereof using optical or photographic means
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/44—Detecting, measuring or recording for evaluating the integumentary system, e.g. skin, hair or nails
    • A61B5/441—Skin evaluation, e.g. for skin disorder diagnosis
    • A61B5/444—Evaluating skin marks, e.g. mole, nevi, tumour, scar
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Veterinary Medicine (AREA)
  • Biophysics (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Dentistry (AREA)
  • Oral & Maxillofacial Surgery (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Dermatology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Semiconductor Lasers (AREA)
  • Character Input (AREA)
CN201380023599.4A 2012-05-14 2013-05-03 用于对目标对象的表面的深度进行仿形的装置和方法 Expired - Fee Related CN104284625B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP12167885 2012-05-14
EP12167885.8 2012-05-14
PCT/IB2013/053534 WO2013171613A1 (en) 2012-05-14 2013-05-03 Apparatus and method for profiling a depth of a surface of a target object

Publications (2)

Publication Number Publication Date
CN104284625A CN104284625A (zh) 2015-01-14
CN104284625B true CN104284625B (zh) 2017-10-27

Family

ID=48628752

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380023599.4A Expired - Fee Related CN104284625B (zh) 2012-05-14 2013-05-03 用于对目标对象的表面的深度进行仿形的装置和方法

Country Status (7)

Country Link
US (1) US9797708B2 (https=)
EP (1) EP2849644A1 (https=)
JP (1) JP2015524050A (https=)
CN (1) CN104284625B (https=)
BR (1) BR112014028135A2 (https=)
RU (1) RU2633922C2 (https=)
WO (1) WO2013171613A1 (https=)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014083485A1 (en) 2012-11-29 2014-06-05 Koninklijke Philips N.V. Laser device for projecting a structured light pattern onto a scene
BR112017002679A2 (pt) 2014-08-10 2017-12-12 Facebook Inc luz estruturada para sensoriamento em 3d
US10274745B2 (en) 2014-08-14 2019-04-30 Bae Systems Information And Electronic Systems Integration Inc. System for uniformly illuminating target to reduce speckling
US9553423B2 (en) 2015-02-27 2017-01-24 Princeton Optronics Inc. Miniature structured light illuminator
KR102597579B1 (ko) 2015-10-21 2023-11-01 프린스톤 옵트로닉스, 인크. 코딩된 패턴 투영기
US9952036B2 (en) * 2015-11-06 2018-04-24 Intel Corporation Systems, methods, and apparatuses for implementing maximum likelihood image binarization in a coded light range camera
JP6782559B2 (ja) * 2016-05-13 2020-11-11 株式会社小糸製作所 車両用前照灯
US10241244B2 (en) 2016-07-29 2019-03-26 Lumentum Operations Llc Thin film total internal reflection diffraction grating for single polarization or dual polarization
EP3315901B1 (de) * 2016-10-27 2019-06-05 Pepperl & Fuchs GmbH Messvorrichtung und verfahren zur triangulationsmessung
US10419741B2 (en) * 2017-02-24 2019-09-17 Analog Devices Global Unlimited Company Systems and methods for compression of three dimensional depth sensing
US10627709B2 (en) * 2018-06-29 2020-04-21 Ricoh Company, Ltd. Light source, projection device, measurement device, robot, electronic device, mobile object, and shaping apparatus
JP7379859B2 (ja) * 2018-06-29 2023-11-15 株式会社リコー 光源、投影装置、計測装置、ロボット、電子機器、移動体、および造形装置
JP7222200B2 (ja) 2018-08-27 2023-02-15 株式会社リコー 光学装置、計測装置、ロボット、電子機器、移動体、および造形装置
CN109584150B (zh) * 2018-11-28 2023-03-14 维沃移动通信（杭州）有限公司 一种图像处理方法及终端设备
JP2020153798A (ja) * 2019-03-19 2020-09-24 株式会社リコー 光学装置、測距光学系ユニット、測距装置及び測距システム
US12400322B2 (en) * 2021-02-22 2025-08-26 Fresenius Medical Care Holdings, Inc. System and method for measuring edema at home and measurement pattern for use therewith
JP2022131710A (ja) * 2021-02-26 2022-09-07 国立大学法人福井大学 集光する特性を持つ光学素子を複数個配置した集光手段を備えた格子投影装置及び前記格子投影装置を用いた計測装置
CN113654487B (zh) * 2021-08-17 2023-07-18 西安交通大学 一种单幅彩色条纹图动态三维测量方法及系统
TW202315250A (zh) * 2021-09-13 2023-04-01 美商元平台技術有限公司 用於產生線性結構光圖案及泛光照明的垂直腔面射型雷射晶片
US20230085063A1 (en) * 2021-09-13 2023-03-16 Facebook Technologies, Llc Vcsel chip for generation of linear structured light patterns and flood illumination
CN115077402B (zh) * 2022-06-22 2024-07-12 广州市城市规划勘测设计研究院 一种管线埋深及管径的测量装置及方法
EP4616143A1 (en) * 2022-11-09 2025-09-17 MTR Corporation Limited Method and device for inspecting a moving apparatus
CN117058004B (zh) * 2023-10-13 2024-03-08 埃克斯工业有限公司 晶圆的晶粒图像重构方法、电子设备及存储介质

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5933240A (en) * 1997-02-12 1999-08-03 Jurca; Marius Christian Method and apparatus for determining the distance between a base and a specular surface by means of radiation reflected at the surface
CN1728970A (zh) * 2002-10-22 2006-02-01 雷利恩特技术公司 利用光能的图案治疗皮肤的方法和设备
US20090118720A1 (en) * 2001-12-12 2009-05-07 Reliant Technologies, Inc. Dermatological Apparatus and Method
US20110040192A1 (en) * 2009-05-21 2011-02-17 Sara Brenner Method and a system for imaging and analysis for mole evolution tracking

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2050543C1 (ru) 1993-03-12 1995-12-20 Черняков Геннадий Михайлович Устройство для регистрации изображения поверхности сложного профиля, расположенной на заданной глубине объекта
US6912076B2 (en) 2000-03-17 2005-06-28 Accu-Sort Systems, Inc. Coplanar camera scanning system
US6931149B2 (en) 2002-04-19 2005-08-16 Norsk Elektro Optikk A/S Pipeline internal inspection device and method
US20060082882A1 (en) 2004-10-14 2006-04-20 Wang Michael R Achromatic imaging lens with extended depth of focus
JP2006267031A (ja) * 2005-03-25 2006-10-05 Brother Ind Ltd ３次元入力装置および３次元入力方法
US8475506B1 (en) * 2007-08-13 2013-07-02 Lockheed Martin Corporation VCSEL array stimulator apparatus and method for light stimulation of bodily tissues
DK1969307T3 (da) * 2005-11-28 2010-10-25 3Shape As Kodet struktureret lys
JP4751443B2 (ja) 2006-03-07 2011-08-17 富士通株式会社 撮影装置、及び撮影方法
US20080238338A1 (en) 2007-03-30 2008-10-02 Stephen Andrew Latham Method and system for providing scalable and configurable illumination
US8384997B2 (en) 2008-01-21 2013-02-26 Primesense Ltd Optical pattern projection
EP2252208B1 (en) 2008-03-18 2014-05-14 Koninklijke Philips N.V. Apparatus for skin imaging, system for skin analysis
JP4235684B1 (ja) * 2008-06-17 2009-03-11 株式会社創喜 表面検査装置
DE102008057542A1 (de) 2008-11-08 2009-07-02 Daimler Ag Erfassungseinrichtung zur Erkennung eines Zustands eines Reifens
JP5257053B2 (ja) 2008-12-24 2013-08-07 株式会社豊田中央研究所 光走査装置及びレーザレーダ装置
GB0907277D0 (en) 2009-04-29 2009-06-10 Univ Kent Kanterbury Method for depth resolved wavefront sensing, depth resolved wavefront sensors and method and apparatus for optical imaging
CN102549858B (zh) 2009-08-20 2015-06-17 皇家飞利浦电子股份有限公司 具有角度选择性反馈的垂直腔表面发射激光器件
JP2011064482A (ja) * 2009-09-15 2011-03-31 Kurabo Ind Ltd 高速三次元計測装置及び高速三次元計測方法
US8830227B2 (en) * 2009-12-06 2014-09-09 Primesense Ltd. Depth-based gain control
GB0921461D0 (en) * 2009-12-08 2010-01-20 Qinetiq Ltd Range based sensing
US8210716B2 (en) * 2010-08-27 2012-07-03 Quarkstar Llc Solid state bidirectional light sheet for general illumination

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5933240A (en) * 1997-02-12 1999-08-03 Jurca; Marius Christian Method and apparatus for determining the distance between a base and a specular surface by means of radiation reflected at the surface
US20090118720A1 (en) * 2001-12-12 2009-05-07 Reliant Technologies, Inc. Dermatological Apparatus and Method
CN1728970A (zh) * 2002-10-22 2006-02-01 雷利恩特技术公司 利用光能的图案治疗皮肤的方法和设备
US20110040192A1 (en) * 2009-05-21 2011-02-17 Sara Brenner Method and a system for imaging and analysis for mole evolution tracking

Also Published As

Publication number Publication date
RU2014150348A (ru) 2016-07-10
WO2013171613A1 (en) 2013-11-21
US20150130932A1 (en) 2015-05-14
BR112014028135A2 (pt) 2017-06-27
US9797708B2 (en) 2017-10-24
JP2015524050A (ja) 2015-08-20
CN104284625A (zh) 2015-01-14
RU2633922C2 (ru) 2017-10-19
EP2849644A1 (en) 2015-03-25

Similar Documents

Publication Publication Date Title
CN104284625B (zh) 用于对目标对象的表面的深度进行仿形的装置和方法
US12178685B2 (en) Dental scanning system with structured light projection
KR102231081B1 (ko) 구조형 광의 프로젝터
EP3171129B1 (en) High resolution dot pattern
KR102452393B1 (ko) 적어도 하나의 물체의 포지션을 광학적으로 결정하기 위한 방법 및 검출기 및 이를 이용한 휴먼 머신 인터페이스, 엔터테인먼트 장치, 추적 시스템, 스캐닝 시스템, 입체 시스템 및 카메라
US9826216B1 (en) Systems and methods for compact space-time stereo three-dimensional depth sensing
CN104583713B (zh) 使优选是结构化的物体表面成像的方法及用于成像的装置
WO2021072802A1 (zh) 一种距离测量系统及方法
JP2020531856A (ja) 低解像度ピクセル画像化による飛行時間深度カメラ
US11467261B2 (en) Distance measuring device and moving object
TW200847061A (en) Depth mapping using projected patterns
CN110634179A (zh) 使用口内三维扫描仪生成数字三维模型的方法
CN112469361A (zh) 用于在共焦相机中生成动态投影图案的设备、方法和系统
CN116601455A (zh) 具有具备重叠视野的传感器的三维扫描仪
JP2025514227A (ja) 画像再構成方法、装置及び機器
CN207457505U (zh) 一种光学测距装置
JP2025501873A (ja) 口腔内スキャナ、口腔内スキャニングシステム、口腔内スキャン方法及びコンピュータプログラム製品
Wang et al. Dual structured light 3d using a 1d sensor
JP6037254B2 (ja) 表面形状測定装置及び表面形状測定方法
Wei et al. Colorful 3-D imaging using an infrared Dammann grating
CN110836647B (zh) 三维扫描系统
CN110955056B (zh) 多影像投影机以及具有多影像投影机的电子装置
TWI301192B (en) Image scanners with multiple lens groups
JP2001235313A (ja) 三次元形状測定装置
KR102433837B1 (ko) 3차원 정보 생성 장치

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20171027

Termination date: 20190503