CN104267223A - Low-voltage multi-frequency and amplitude mixed test source generating device - Google Patents

Low-voltage multi-frequency and amplitude mixed test source generating device Download PDF

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Publication number
CN104267223A
CN104267223A CN201410562387.XA CN201410562387A CN104267223A CN 104267223 A CN104267223 A CN 104267223A CN 201410562387 A CN201410562387 A CN 201410562387A CN 104267223 A CN104267223 A CN 104267223A
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winding
frequency
voltage
generating device
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CN104267223B (en
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史俊
桂丹
杨堂华
杨全仁
刘兴涛
李卫
李荣东
张冠一
吴国天
杨昌隆
谢照祥
李文亮
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Gauss Electronics Technology Co ltd
Puer Supply Power Bureau of Yunnan Power Grid Co Ltd
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Gauss Electronics Technology Co ltd
Puer Supply Power Bureau of Yunnan Power Grid Co Ltd
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Abstract

A low-voltage multi-frequency and amplitude mixed test source generating device is characterized by comprising a power frequency power source, a four-winding transformer, a sampling device, a random noise generator and a pulse generator. The low-voltage multi-frequency and amplitude mixed test source generating device has the advantages of being economical, feasible, high in flexibility, free of a complex signal generating device and capable of being widely applied to tests of transformers, mutual inductors and capacitors.

Description

Low-voltage multi-frequency and amplitude hybrid test source generating device
Technical Field
The invention relates to the field of electrical equipment tests, in particular to a low-voltage multi-frequency and amplitude mixed test source generating device.
Background
The high-voltage insulation strength test is mostly adopted in the electrical equipment test, and typical tests comprise a power frequency withstand voltage test and a lightning impulse withstand voltage test, and both tests have destructiveness. The signal amplitude superposition test is reported in China, but the actual operation superposition device is not specified, and the types and the analysis methods of subsequent data acquisition of the superposition test are innovated.
The invention provides a set of test device, belonging to a series structure relationship between a tested device and a test system, so that the voltage applied to two ends of the tested device can be adjusted by adjusting the voltage amplitude, frequency or resonance state of the two ends.
Disclosure of Invention
The invention provides a double-superposition testing device capable of realizing amplitude superposition and frequency aliasing.
The technical scheme of the invention is as follows:
the invention discloses a low-voltage multi-frequency and amplitude mixed test source generating device which is characterized by comprising a power frequency power supply, a 4-winding transformer, a sampling device, a random noise generator and a pulse generator;
wherein,
the primary side of the 4-winding transformer is formed by connecting a winding 1 and a winding 3 in parallel, and the secondary side of the 4-winding transformer is formed by a winding 2 and a winding 4; the resistor R1 and the inductance coil L1 are connected in series and then are connected in parallel with the capacitor C1 to form a winding 1; the resistor R2 and the inductance coil L2 are connected in series and then are connected in parallel with the adjustable capacitor C2 to form a winding 2; the winding 3 consists of an inductance coil L3, and the winding 4 consists of an inductance coil L4;
one end of the power frequency power supply, the tested equipment and one end of the winding 1 are sequentially connected, and the other end of the winding 1 is grounded; a sampling device is connected between the power frequency power supply and the tested equipment, and the sampling device is connected with the winding 3 in parallel; the random noise generator is connected with the winding 2 in parallel; the pulse generator is connected in parallel with the winding 4.
The power frequency power supply has the output power of 10-5000W and the output voltage of 100-1000V.
The acquisition device is a three-way parallel acquisition structure, and the sampling frequency bandwidth is 100 MHz.
The pulse generator of the invention outputs pulse width of 0.1uS-500uS and voltage amplitude of 1-500V.
The output power of the random noise generator is 1-20W.
According to the 4-winding transformer, the windings share a high-frequency iron core structure, all the windings are wrapped by independent winding laminations, and air gap adjusting bolts are arranged among the windings, so that the coupling coefficient among the windings can be adjusted.
The iron core is made of soft magnetic ferrite, manganese zinc ferrite or nickel zinc ferrite.
The adjustable capacitor can adjust the output power of the random signal generator, and simultaneously, the capacitor and the transformer winding generate resonant voltage with frequency higher than that of a power frequency signal, the resonant voltage is used as a signal source of an aliasing test signal, and an amplitude difference value is generated between the resonant voltage and the power frequency voltage output by a power frequency power supply and is applied to a tested device.
The winding 2 is an input winding and an output winding, LC oscillation is formed under the excitation of external power frequency current, and the oscillation signal is reversely coupled to the winding 1. Likewise, winding 1 is both the input and output windings, and winding 1 and winding 3 are of the end-coupled design of the same name. In principle, only winding 3, which is the output winding, is used, and both winding 1 and windings 2,4 are bi-directionally coupled functions.
The tested equipment is connected in series between a power frequency power supply and the input port 1 of the 4-winding transformer, the withstand voltage end of the tested equipment is in a suspension grounding state, and the tested current generates a current vector I1 influenced by the impedance amplitude and the phase of the tested high-voltage equipment after being subjected to primary impedance modulation by the tested equipment. The pulse generator generates a pulse signal, which is coupled to the inside of the 4-winding transformer through the winding 4, and generates a current signal I2 at the input port 1 of the 4-winding transformer. The random noise generator generates a random noise signal, which is coupled to the input port 1 of the 4-winding transformer via winding 2 to generate a current signal I3. Three signals of I1, I2 and I3 with different amplitudes, frequencies and phases are mixed and overlapped and then coupled to the winding 3, and voltage or current waveform information is acquired by an acquisition device and is used for impedance characteristic analysis of the tested equipment.
The invention adjusts the voltage applied to the two ends of the tested equipment by adjusting the output voltage of the working frequency power supply, or adjusting the adjustable capacitor of the winding, or adjusting the frequency of the pulse generator, or controlling the output duration of the random noise generator.
The invention has the outstanding advantages that the tested equipment is used as a central equipment in the test loop, not only bears the test voltage directly, but also generates the modulation effect on the test end voltage through the self impedance, and the structure is convenient for collecting the phase information of the tested equipment.
Another advantage of the present invention is that the resonant frequency is adjusted by the adjustable capacitor at the secondary side of the transformer, thereby adjusting the frequency and amplitude of the signal applied to one end (end B) of the tested high voltage device, which generates an amplitude difference with the power frequency power supply at the other end (end a) to generate an amplitude superimposed signal. A random noise generator in parallel with the tunable capacitor may serve to adjust the power density of the resonant signal.
Because the test transformer adopts a multi-winding structure and the transformer is in a nonlinear state in a wide frequency range, the nonlinear characteristic of the transformer is just utilized to form series resonance with a tested product, and a rich resonance frequency spectrum is established. Comparatively steep impact test waveforms can be obtained by adjusting the adjustable capacitor and the pulse generator, and under the action of the impact voltage, even if the local short circuit of the tested equipment is in a low-resistance state or the breakdown short circuit directly occurs, the safety of the test device cannot be influenced.
The system structure provided by the invention has the typical beneficial effects that the system structure provided by the invention shows that a test system can be rapidly built, the advantages of economy, feasibility, high flexibility and no need of a complex signal generating device are achieved, and the system can be widely applied to tests of transformers, mutual inductors and capacitors.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is an impedance curve diagram established by the impedance spectrum of the tested object obtained by the acquisition device corresponding to the resonance frequency;
FIG. 3 is a voltage waveform of the terminal of the tested object corresponding to the resonant frequency of 10 MHz.
Detailed Description
Example 1:
the output voltage of a power frequency power supply is set to be 200V, the output voltage of a random noise generator is set to be 5V, an acquisition device channel 1 is directly connected with the output end of the power frequency voltage after being reduced in voltage, an acquisition device channel 2 is connected with a transformer winding 3 in parallel, a pulse generator is connected with a transformer winding 4, the output voltage is 20V, and the pulse width is 1 uS. The acquisition channel 3 is used as a standby channel, adopts a BNC interface, is used as an expansion end, and can be used for acquiring other external signals.
The tested equipment is a 10kV transformer, a power frequency power supply, the tested equipment and one end of a winding 1 are sequentially connected, the other end of the winding 1 is grounded, the winding 1 is formed by connecting a resistor R1 and an inductance coil L1 in series and then connecting the resistor R1 and the inductance coil L1 in parallel with a capacitor C1, and C1 is parasitic oscillation harmonic elimination capacitor, as shown in figure 1.
Because the tested equipment is connected in series in the test system, the voltage signals acquired by the two channels of the acquisition device directly contain the phase information of the tested equipment.
And setting the voltage at the output end of the power frequency test as V1, the voltage at the output end of the tested transformer as V2, the voltage collected by the second winding of the tested transformer as V3, and the transformation ratio of the second winding to the first winding as 1/20, wherein the voltage at the end of the tested transformer is V1-V2, and the phase difference between V1 and V2 is the impedance angle of the tested product. If V1 and V2 are opposite in direction and the maximum amplitude superposition is shown, the maximum amplitude is | V1| + | V2 |.
And the loop current I under the action of the voltage applied to the two ends of the tested transformer is V2-20 xV 3.
From this, the impedance of the tested transformer:
z = v 1 - v 2 v 2 - 20 v 3
assuming that the inductance of L2 of the test transformer winding 2 is 100mH and the capacitance of the adjustable capacitor is 1uF, the target resonant frequency is: 15.9 MHz.
Under the conditions of the random noise generator with or without output and the pulse generator with or without output, the obtained impedance values of the transformer are as follows:
according to the table, the obtained measured impedance values are different according to different resonance frequencies generated by different adjustable capacitance values, so that the test conditions of the characteristic impedance and the resonance frequency of the tested object are established. Because the high-voltage equipment bears complex field environment when having defects, is influenced by harmonic wave factors, noise, operation impact, resonance between the high-voltage equipment and a circuit and other factors, the impedance characteristic in the running environment is difficult to find by adopting the traditional test method, and therefore the invention provides a test means of composite waveforms.
In addition, before the high-voltage equipment is subjected to insulation breakdown, part of defects cannot be found through power frequency voltage, and the capacitance value represented by the defects is small.
Although a part of low-voltage test methods are used for testing a tested product as a part of a resonance unit, the method is obviously different from the method in that the trigger voltage for testing resonance is directly applied to two ends of the tested high-voltage equipment, the resonance trigger power can be adjusted by changing the power-frequency test voltage, the resonance frequency can be changed by adjusting the resonance capacitor, so that the destination of the voltage applied to the two ends of the tested equipment is finally changed, the two ends of the tested high-voltage equipment are in a suspension grounding state, and the test safety is not influenced even if the tested high-voltage equipment is in a low-resistance or short-circuit state.
Example 2:
the device can be used for defect diagnosis of aliasing test of high-voltage equipment based on spectral power density by external monitoring means.
As described in embodiment 1, the two paths of voltage information of the acquisition device directly include the impedance and the impedance angle of the device under test, but due to the influence of test adjustment, the surface defect capacitance value of the device under test generates the maximum power signal only when the characteristic resonance frequency matches with the characteristic impedance of the whole test loop, so that the value of the adjustable capacitor needs to be adjusted in a focused manner, and the pulse generator and the random noise generator serve as auxiliary means to provide a persistent high-frequency signal and a noise signal, and the defective high-voltage device under test can exhibit a relatively obvious heating effect in the persistent high-frequency signal and noise signal environment, which is helpful for increasing the temperature rise of the device under test and finding defects in advance.
Under the condition of continuously adjusting the value of the resonance adjustable capacitor, a resonance signal with a bandwidth of 100M is obtained, and an impedance spectrum (impedance curve established corresponding to the resonance frequency) of the test object obtained by the acquisition device is shown in fig. 2.
In fig. 2, the dashed line represents the measured value without the output of the hf pulse generator, and the solid line represents the impedance spectrum value with the pulse width of 5uS output continuously by the pulse generator. It can be seen that changing the pulse generator output does not substantially change the characteristics of the impedance spectrum, but there is a significant difference in the lowest impedance value across the impedance spectrum, and the frequency point at which the lowest impedance occurs also begins to shift low.
The frequency corresponding to the lowest impedance value of the dotted line impedance spectrum test is 12MHz, the frequency corresponding to the lowest impedance value of the impedance spectrum test is 10MHz, and the voltage spectrum applied to the two ends of the tested high-voltage device is analyzed by observing the test signal as shown in fig. 3.
As can be seen from fig. 3, the test signal of the power frequency power supply and the complex signal generated after the simple transformer secondary winding 2 resonates are shown by the dotted line. After the resonant frequency is applied to the line frequency voltage signal, a waveform resembling a rectangular state is produced, with a lower dip at the middle of the rectangular pulse, which coincides with the lowest point of impedance appearing on the impedance spectrum curve.
After the pulse coupling signal is applied, the voltage applied to the two ends of the tested object by the signal is in a peak state. However, it should be noted that the voltage signal only has a phenomenon that the resonance frequency is close to 10MHz and the pulse signal is applied, and if the pulse signal is not applied, the waveforms of the voltage signals obtained at 10MHz and 12MHz are almost close to each other, and both of them are in a rectangular state.
Therefore, the invention can provide a test mode based on a test waveform by adjusting the resonant adjustable capacitor and then tracking and acquiring the waveform characteristics of the terminal voltage of the tested object. And on the basis, spectral analysis can be carried out, and the power spectral characteristics of the tested equipment can be analyzed according to the higher power spectral density of the spike test waveform. The method of embodying the power spectral and temporal analysis is not within the claims of the present invention and is described here as an example only.
It should be added that the random noise generator can also continuously output a random noise signal, can generate an irregular frequency signal, and has an important role in applying electrical noise when the device of the present invention is applied to a high voltage equipment aging test. Meanwhile, the random voltage signal-based test method has been widely researched, and is only rarely applied in the field of high-voltage equipment fault and aging tests, and the invention does not limit the specific noise response analysis method.
In addition, because the system provides a test structure to connect the tested object in series inside the test system, and the power frequency power supply or the test transformer connected with the tested object can be used as the bidirectional load of the tested object, the short circuit influence of the sudden short circuit of the tested object on the load of the test power supply does not exist, so that the reliability of the test device of the system is obviously higher than that of the traditional test method, and meanwhile, the tested device is not required to be designed with complicated protection and switch control equipment because the tested device is subjected to breakdown short circuit or the impedance of the tested device is small and the normal operation of the test system is not influenced. The technical advantages are summarized, the test method can be used for capacitive high-voltage equipment, inductive high-voltage equipment such as a reactor and a winding of a transformer, and abundant resonance and impedance data can be obtained on the basis of the test device, so that abundant information is provided for deeply analyzing the performance of electrical equipment, and the test method has very wide practical value.

Claims (7)

1. A low-voltage multi-frequency and amplitude hybrid test source generating device is characterized by comprising a power frequency power supply, a 4-winding transformer, a sampling device, a random noise generator and a pulse generator;
wherein,
the primary side of the 4-winding transformer is formed by connecting a winding 1 and a winding 3 in parallel, and the secondary side of the 4-winding transformer is formed by connecting a winding 2 and a winding 4 in parallel; the resistor R1 and the inductance coil L1 are connected in series and then are connected in parallel with the capacitor C1 to form a winding 1; the resistor R2 and the inductance coil L2 are connected in series and then are connected in parallel with the adjustable capacitor C2 to form a winding 2; the winding 3 consists of an inductance coil L3, and the winding 4 consists of an inductance coil L4;
one end of the power frequency power supply, the tested equipment and one end of the winding 1 are sequentially connected, and the other end of the winding 1 is grounded; a sampling device is connected between the power frequency power supply and the tested equipment, and the sampling device is connected with the winding 3 in parallel; the random noise generator is connected with the winding 2 in parallel; the pulse generator is connected in parallel with the winding 4.
2. The low-voltage multi-frequency and amplitude hybrid test source generating device of claim 1, wherein the power frequency power supply has an output power of 10-5000W and an output voltage of 100V-1000V.
3. The low pressure multiple frequency and amplitude hybrid test source generating device of claim 1, wherein the collecting device is a three-way parallel collecting structure with a sampling frequency bandwidth of 100 MHz.
4. The device of claim 1, wherein the pulse generator outputs a pulse width of 0.1uS-500uS and a voltage amplitude of 1-500V.
5. The low voltage multiple frequency and amplitude hybrid test source generating device of claim 1, wherein the random noise generator outputs 1-20W.
6. The low-voltage multi-frequency and amplitude hybrid test source generating device of claim 1, wherein the 4-winding transformer and the windings share a high-frequency iron core structure, each winding is wrapped by an independent winding lamination, and air gap adjusting bolts are arranged between the windings to adjust the coupling coefficient between the windings.
7. The low voltage multi-frequency and amplitude hybrid test source generating device of claim 1, wherein the core is made of soft magnetic ferrite or manganese zinc ferrite, or nickel zinc ferrite.
CN201410562387.XA 2014-10-21 2014-10-21 Low-voltage multi-frequency and amplitude mixed test source generating device Active CN104267223B (en)

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Cited By (1)

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Publication number Priority date Publication date Assignee Title
CN104820137A (en) * 2015-04-14 2015-08-05 中国科学院光电研究院 High-frequency high-voltage fast pulse sequence acquiring device and method thereof

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CN104820137B (en) * 2015-04-14 2017-10-31 中国科学院光电研究院 High-frequency and high-voltage fast pulse Timing acquisition apparatus and method

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