CN104237695A - Probe service life testing mechanism - Google Patents
Probe service life testing mechanism Download PDFInfo
- Publication number
- CN104237695A CN104237695A CN201410495081.7A CN201410495081A CN104237695A CN 104237695 A CN104237695 A CN 104237695A CN 201410495081 A CN201410495081 A CN 201410495081A CN 104237695 A CN104237695 A CN 104237695A
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- probe
- pressure head
- probes
- base
- counter
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Abstract
The invention relates to a testing mechanism. A pressing module of the testing mechanism is mounted on the back side of the upper portion of a base; a probe die holder is mounted on the base; and probes are mounted on the probe die holder movably. A counter is mounted on the upper portion of a front side plate of the pressing module. A power switch, a start button and a buzzer are mounted on the base. After the power switch is turned on, a pressing cylinder of the pressing module is in a reset state, the counter is reset, the pressing module runs to press the probes until the probes retract to a corresponding position once the start button is pushed, and then the counter begins counting and the pressing module rises, and so on, the pressing module stops pressing until the buzzer sends an alarm, at this time, the probes are damaged, values displayed on the counter refer to the service lives of the probes. The testing mechanism can be used for sampling different types of probes and testing service life values of various probes. With the testing mechanism, production efficiency and product test accuracy are improved, judgment mistakes caused by application of counterfeit probes are reduced, and probes going to be scraped can be changed in time.
Description
Technical field:
The present invention relates to a kind of probe life test mechanism.
Background technology:
Now because market there being a lot of imitated probe, the serviceable life of a lot of probe is not identical, the life value of the various probes of purchase can not be detected in prior art, the erroneous judgement using imitative product probe to cause will affect the quality of product, the probe being about to scrap can not be changed in time, affect follow-up work, be therefore necessary to design a kind of probe life test mechanism, thus improve the accuracy rate of test products.
Summary of the invention:
The object of the invention is for the deficiencies in the prior art part, provide a kind of probe life test mechanism, be installed to by the probe of different model on probe die holder and carry out sampling observation test, its structure is simple, easy to use, can measure the life value of probe.
Technology solution of the present invention is as follows:
A kind of probe life test mechanism, it comprises base and presses down module, described in press down module and be arranged on rear side of base top, described base is provided with a probe die holder, probe die holder is movably installed with probe.
The described module that presses down comprises front side board, lower air cylinder, push pedal, longitudinal slide rail, longitudinal sliding block, contiguous block, pressure head contiguous block, pressure head mounting blocks, pressure head slide rail, pressure head slide block and pressure head, described front side board is fixedly mounted on base plate, described lower air cylinder and longitudinal slide rail are arranged on the back of a front side board, longitudinal slide rail coordinates and is provided with longitudinal sliding block; The piston-rod lower end of described lower air cylinder is connected to push pedal, and push pedal lower end is connected to pressure head contiguous block; Described longitudinal sliding block is provided with contiguous block, and contiguous block is fixedly mounted on the bottom of pressure head contiguous block; The front portion of described pressure head contiguous block is passed from front side board, and its front end is connected to pressure head mounting blocks, and described pressure head mounting blocks is provided with pressure head slide block, and the cooperation of pressure head slide rail is arranged on pressure head slide block, and pressure head slide rail and pressure head link together; Described pressure head is positioned at directly over probe; Described front side board top is provided with counter; Described base is provided with power switch, start button and hummer.
After described power switch is opened, lower air cylinder is in reset mode, counter O reset, then start button is pressed, press down module work, press down probe and retract to corresponding position to probe, counter starts counting, then press down module to rise, periodic duty like this is until buzzer warning, and press down module and stop pressing down, now probe damages, read counter values, this numerical value is exactly the life value of probe.
As preferably, described probe die holder is spirally connected and is fixed on base.
As preferably, described probe has two or more.
As preferably, the both sides, rear portion of described front side board are separately installed with left and right side plate, and left and right side plate is fixed on base.
Beneficial effect of the present invention is:
Volume of the present invention is moderate can work platform for placing be used, and mechanism stable is reliable, the probe that will carry out testing is mounted on probe die holder, turn on the power switch, cylinder playback Aligning control, counter O reset, both hands press start button, press down module work, press to probe advanced position place, counter starts counting, press down module to rise, periodic duty like this is until buzzer warning, press down module to stop pressing down, illustrate that probe damages, read counter values, this numerical value is exactly the life value of probe, after using this kind of probe test to know life value, the probe being about to scrap can be changed timely when test, in order to avoid affect follow-up test.The probe life-span of different model is equally by the operation of this step.
Mechanism can detect the life value of the various probes of purchase, thus substantially increases the accuracy rate of production efficiency and test products, reduces the erroneous judgement because using imitative product probe to cause, and can change the probe being about to scrap in time.
Accompanying drawing illustrates:
Below in conjunction with accompanying drawing, the present invention is described further:
Fig. 1 is structural representation of the present invention;
Fig. 2 is the vertical view of Fig. 1;
Fig. 3 is the structural representation pressing down module of the present invention, (not comprising front side board);
Fig. 4 is the structural representation of probe die holder of the present invention.
Embodiment:
Embodiment, is shown in accompanying drawing 1 ~ 4, a kind of probe life test mechanism, it comprises base 1 and presses down module I, described in press down module and be arranged on rear side of base top, described base is bolted and fixed with a probe die holder 2, probe die holder is movably installed with probe 3, probe has two.
The described module that presses down comprises front side board 4, lower air cylinder 5, push pedal 6, longitudinal slide rail 7, longitudinal sliding block 8, contiguous block 9, pressure head contiguous block 10, pressure head mounting blocks 11, pressure head slide rail 12, pressure head slide block 13 and pressure head 14, described front side board is fixedly mounted on base plate, the both sides, rear portion of front side board are separately installed with left and right side plate 15,16, and left and right side plate is fixed on base, be convenient to the whole stability pressing down module.
Described lower air cylinder and longitudinal slide rail are arranged on the back of a front side board, longitudinal slide rail coordinates and is provided with longitudinal sliding block; The piston-rod lower end of described lower air cylinder is connected to push pedal, and push pedal lower end is connected to pressure head contiguous block; Described longitudinal sliding block is provided with contiguous block, and contiguous block is fixedly mounted on the bottom of pressure head contiguous block; The front portion of described pressure head contiguous block is passed from front side board, and its front end is connected to pressure head mounting blocks, and described pressure head mounting blocks is provided with pressure head slide block, and the cooperation of pressure head slide rail is arranged on pressure head slide block, and pressure head slide rail and pressure head link together; Described pressure head is positioned at directly over probe; Described front side board top is provided with counter 17; Described base is provided with power switch 18, start button 19 and hummer 20.
Principle of work of the present invention: after turning on the power switch, lower air cylinder is in reset mode, counter O reset, then start button is pressed, press down module work, press down probe and retract to corresponding position to probe, counter starts counting, then press down module to rise, periodic duty like this is until buzzer warning, and press down module and stop pressing down, now probe damages, read counter values, this numerical value is exactly the life value of probe.
Above-described embodiment is the specific descriptions of carrying out the present invention; just the present invention is further described; can not be interpreted as limiting the scope of the present invention, those skilled in the art makes some nonessential improvement according to the content of foregoing invention and adjustment all falls within protection scope of the present invention.
Claims (4)
1. a probe life test mechanism, it comprises base and press down module, described in press down module and be arranged on rear side of base top, it is characterized in that: described base is provided with a probe die holder, probe die holder is movably installed with probe;
The described module that presses down comprises front side board, lower air cylinder, push pedal, longitudinal slide rail, longitudinal sliding block, contiguous block, pressure head contiguous block, pressure head mounting blocks, pressure head slide rail, pressure head slide block and pressure head, described front side board is fixedly mounted on base plate, described lower air cylinder and longitudinal slide rail are arranged on the back of a front side board, longitudinal slide rail coordinates and is provided with longitudinal sliding block; The piston-rod lower end of described lower air cylinder is connected to push pedal, and push pedal lower end is connected to pressure head contiguous block; Described longitudinal sliding block is provided with contiguous block, and contiguous block is fixedly mounted on the bottom of pressure head contiguous block; The front portion of described pressure head contiguous block is passed from front side board, and its front end is connected to pressure head mounting blocks, and described pressure head mounting blocks is provided with pressure head slide block, and the cooperation of pressure head slide rail is arranged on pressure head slide block, and pressure head slide rail and pressure head link together; Described pressure head is positioned at directly over probe; Described front side board top is provided with counter; Described base is provided with power switch, start button and hummer;
After described power switch is opened, lower air cylinder is in reset mode, counter O reset, then start button is pressed, press down module work, press down probe and retract to corresponding position to probe, counter starts counting, then press down module to rise, periodic duty like this is until buzzer warning, and press down module and stop pressing down, now probe damages, read counter values, this numerical value is exactly the life value of probe.
2. a kind of probe life test mechanism according to claim 1, is characterized in that: described probe die holder is spirally connected and is fixed on base.
3. a kind of probe life test mechanism according to claim 1, is characterized in that: described probe has two or more.
4. a kind of probe life test mechanism according to claim 1, is characterized in that: the both sides, rear portion of described front side board are separately installed with left and right side plate, and left and right side plate is fixed on base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410495081.7A CN104237695B (en) | 2014-09-24 | 2014-09-24 | Probe service life testing mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410495081.7A CN104237695B (en) | 2014-09-24 | 2014-09-24 | Probe service life testing mechanism |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104237695A true CN104237695A (en) | 2014-12-24 |
| CN104237695B CN104237695B (en) | 2017-01-25 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410495081.7A Active CN104237695B (en) | 2014-09-24 | 2014-09-24 | Probe service life testing mechanism |
Country Status (1)
| Country | Link |
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| CN (1) | CN104237695B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111308302A (en) * | 2018-12-12 | 2020-06-19 | 东京毅力科创株式会社 | Probe card management system and probe card management method |
| CN113483804A (en) * | 2021-06-04 | 2021-10-08 | 深圳市正源翔工业智能有限公司 | Probe life test machine |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04361543A (en) * | 1991-06-10 | 1992-12-15 | Mitsubishi Electric Corp | Prober |
| US6091253A (en) * | 1997-01-24 | 2000-07-18 | Acer Peripherals, Inc. | Jig for electrically bridging between a circuit board and a tester during testing of the circuit board |
| TW581257U (en) * | 2002-10-03 | 2004-03-21 | Shun-Shiu Su | Switch lifetime testing machine |
| CN101441625A (en) * | 2007-11-23 | 2009-05-27 | 上海华虹Nec电子有限公司 | Probe card tester in silicon wafer characteristic test and method for counting use amount of probe card |
| CN201681417U (en) * | 2010-03-22 | 2010-12-22 | 华润赛美科微电子(深圳)有限公司 | Needle inserting frequency counting device of probe card and probe card |
| CN102707221A (en) * | 2011-04-22 | 2012-10-03 | 苏州市科林源电子有限公司 | PCB (Printed Circuit Board) test fixture for fully utilizing service life of probe at one time |
| CN102768348A (en) * | 2012-07-10 | 2012-11-07 | 中南大学 | System for automatically testing service life of probe |
| CN203422440U (en) * | 2013-09-13 | 2014-02-05 | 苏州精实电子科技有限公司 | Probe-type electrical test fixture |
| CN203759196U (en) * | 2013-12-23 | 2014-08-06 | 苏州路之遥科技股份有限公司 | ICT test fixture with probe use number recording |
-
2014
- 2014-09-24 CN CN201410495081.7A patent/CN104237695B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04361543A (en) * | 1991-06-10 | 1992-12-15 | Mitsubishi Electric Corp | Prober |
| US6091253A (en) * | 1997-01-24 | 2000-07-18 | Acer Peripherals, Inc. | Jig for electrically bridging between a circuit board and a tester during testing of the circuit board |
| TW581257U (en) * | 2002-10-03 | 2004-03-21 | Shun-Shiu Su | Switch lifetime testing machine |
| CN101441625A (en) * | 2007-11-23 | 2009-05-27 | 上海华虹Nec电子有限公司 | Probe card tester in silicon wafer characteristic test and method for counting use amount of probe card |
| CN201681417U (en) * | 2010-03-22 | 2010-12-22 | 华润赛美科微电子(深圳)有限公司 | Needle inserting frequency counting device of probe card and probe card |
| CN102707221A (en) * | 2011-04-22 | 2012-10-03 | 苏州市科林源电子有限公司 | PCB (Printed Circuit Board) test fixture for fully utilizing service life of probe at one time |
| CN102768348A (en) * | 2012-07-10 | 2012-11-07 | 中南大学 | System for automatically testing service life of probe |
| CN203422440U (en) * | 2013-09-13 | 2014-02-05 | 苏州精实电子科技有限公司 | Probe-type electrical test fixture |
| CN203759196U (en) * | 2013-12-23 | 2014-08-06 | 苏州路之遥科技股份有限公司 | ICT test fixture with probe use number recording |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111308302A (en) * | 2018-12-12 | 2020-06-19 | 东京毅力科创株式会社 | Probe card management system and probe card management method |
| CN111308302B (en) * | 2018-12-12 | 2022-09-16 | 东京毅力科创株式会社 | Probe card management system and probe card management method |
| CN113483804A (en) * | 2021-06-04 | 2021-10-08 | 深圳市正源翔工业智能有限公司 | Probe life test machine |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104237695B (en) | 2017-01-25 |
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Address after: The Wujiang economic and Technological Development Zone West Road Wujiang District of Suzhou City, Jiangsu Province, No. 666 215200 Patentee after: Bo Seiko Polytron Technologies Inc Address before: The Wujiang economic and Technological Development Zone West Road Wujiang District of Suzhou City, Jiangsu Province, No. 666 215200 Patentee before: Suzhou Bozhong Precision Industry Technology Co., Ltd. |