CN203422440U - Probe-type electrical test fixture - Google Patents

Probe-type electrical test fixture Download PDF

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Publication number
CN203422440U
CN203422440U CN201320567391.6U CN201320567391U CN203422440U CN 203422440 U CN203422440 U CN 203422440U CN 201320567391 U CN201320567391 U CN 201320567391U CN 203422440 U CN203422440 U CN 203422440U
Authority
CN
China
Prior art keywords
probe
board
fixed
type electrical
material pressing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201320567391.6U
Other languages
Chinese (zh)
Inventor
屠厚春
王威
秦红莉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUZHOU JINGSHI ELECTRONICS TECHNOLOGY Co Ltd
Original Assignee
SUZHOU JINGSHI ELECTRONICS TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUZHOU JINGSHI ELECTRONICS TECHNOLOGY Co Ltd filed Critical SUZHOU JINGSHI ELECTRONICS TECHNOLOGY Co Ltd
Priority to CN201320567391.6U priority Critical patent/CN203422440U/en
Application granted granted Critical
Publication of CN203422440U publication Critical patent/CN203422440U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model relates to a probe-type electrical test fixture, which comprises a bottom board. A support board extending upwardly is arranged in the middle part of the bottom board; a guide board is fixed on the bottom board at the front side of the support board; two placing grooves are arranged at the top part, close to the front end, of the guide board; the placing grooves are internally provided with a plurality of uniformly-distributed probe holes; a plurality of probes matched with the probe holes are arranged on the bottom board right below the placing grooves; a material pressing board is arranged above the guide board; a cylinder fixed on the support board is arranged right above the material pressing board; a material pressing block is fixed at the bottom end of the cylinder piston rod; and the bottom part of the material pressing block is fixed on the material pressing board. According to the probe-type electrical test fixture, the structure is simple, downward pressing of the material pressing board is driven by the cylinder, and downward pressing of a soft cable inside the placing grooves is then driven, the telescopic probes extend out of the surface of the guide board along the probe holes, each conductor of the soft cable is in contact with a probe, test of conduction, open circuit and short circuit can be finished; the breakage rate of the soft cable is low, and the service life of the soft cable is prolonged.

Description

A kind of probe-type electrical measurement fixture
Technical field
The utility model relates to a kind of probe-type electrical measurement fixture.
Background technology
The electrical measurement of soft arranging wire at present still adopts traditional plate terminal adapter to test, plate terminal adapter is welded on pcb board, soft arranging wire carries out interoperability test by inserting plate terminal adapter, traditional electrical measurement mode mainly has the following disadvantages: 1, consume in a large number plate terminal adapter, pcb board, cause the waste of resource; 2, operating personnel plugs electrical measurement operation for a long time, can cause the pain of finger; While 3, not being with finger-stall operation, contact electrical measurement fixture can cause slight electrical shock hazard; The metal plating surface of the easy scratch soft arranging wire of friction that 4, the terminal of plate terminal adapter contacts with soft arranging wire, causes soft arranging wire conductor oxidation, reduces serviceable life and the stability of soft arranging wire.
Utility model content
For solving the problems of the technologies described above, the utility model provides a kind of probe-type electrical measurement fixture simple in structure, easy to use.
Probe-type electrical measurement fixture of the present utility model, comprise base plate, the middle part of described base plate is provided with the back up pad of extending upward, on the base plate of back up pad front side, be fixed with correcting plate, the top of correcting plate is provided with two putting grooves near front end place, in putting groove, be provided with the some equally distributed pin holes of a row, the base plate under putting groove is provided with some probes that cooperatively interact with pin hole; The top of described correcting plate is provided with holding pad, is provided with the cylinder being fixed in back up pad directly over holding pad, and the piston rod bottom of cylinder is fixed with binder block, and the bottom of binder block is fixed on holding pad.
Probe-type electrical measurement fixture of the present utility model, described correcting plate is fixed on base plate by some support columns, on the support column outer wall of correcting plate below, is equipped with spring.
Probe-type electrical measurement fixture of the present utility model, the rear side of described correcting plate is provided with two guide pillars, and the rear side of described holding pad is set on guide pillar.
Probe-type electrical measurement fixture of the present utility model, described probe is telescopic probe.
Compared with prior art the beneficial effects of the utility model are: probe-type electrical measurement fixture of the present utility model is simple in structure, by cylinder, drive holding pad to press down, thereby drive the soft arranging wire being placed in putting groove to press down, telescopic probe stretches out correcting plate surface along pin hole, probe of each conductor contact of soft arranging wire, completes conducting, opens the test of short circuit; Easy to use, production efficiency is high; Have good stability, soft arranging wire breakage rate is low, and the life-span of soft arranging wire can be extended.
Accompanying drawing explanation
Fig. 1 is the structural representation of a kind of probe-type electrical measurement fixture described in the utility model embodiment;
Fig. 2 is the structural representation that a kind of probe-type electrical measurement fixture described in the utility model embodiment is removed holding pad.
In figure:
1, base plate; 2, back up pad; 3, correcting plate; 4, putting groove; 5, probe; 6, holding pad; 7, cylinder; 8, binder block; 9, support column; 10, guide pillar; 11, soft arranging wire.
Embodiment
Below in conjunction with drawings and Examples, embodiment of the present utility model is described in further detail.Following examples are used for illustrating the utility model, but are not used for limiting scope of the present utility model.
As shown in Figure 1-2, a kind of probe-type electrical measurement fixture, comprise base plate 1, the middle part of described base plate 1 is provided with the back up pad 2 of extending upward, on the base plate 1 of back up pad 2 front sides, be fixed with correcting plate 3, the top of correcting plate 3 is provided with two putting grooves 4 near front end place, is provided with the some equally distributed pin holes of a row in putting groove 4, and the base plate 1 under putting groove 4 is provided with some probes 5 that cooperatively interact with pin hole; The top of described correcting plate 3 is provided with holding pad 6, is provided with the cylinder 7 being fixed in back up pad 2 directly over holding pad 6, and the piston rod bottom of cylinder 7 is fixed with binder block 8, and the bottom of binder block 8 is fixed on holding pad 6.
Probe-type electrical measurement fixture of the present utility model, described correcting plate 3 is fixed on base plate 1 by some support columns 9, on support column 9 outer walls of correcting plate 3 belows, is equipped with spring.
Probe-type electrical measurement fixture of the present utility model, the rear side of described correcting plate 3 is provided with two guide pillars 10, and the rear side of described holding pad 6 is set on guide pillar 10.
Probe-type electrical measurement fixture of the present utility model, described probe 5 is telescopic probe, the quantity of probe 5 can increase or reduce according to the conductor number of soft arranging wire.
Probe-type electrical measurement fixture of the present utility model is simple in structure, by cylinder, drive holding pad to press down, thereby drive the soft arranging wire 11 being placed in putting groove to press down, telescopic probe stretches out correcting plate surface along pin hole, probe of each conductor contact of soft arranging wire 11, completes conducting, opens the test of short circuit; Easy to use, production efficiency is high; Have good stability, soft arranging wire 11 breakage rates are low, and the life-span of soft arranging wire 11 can be extended.
The above is only preferred implementation of the present utility model; should be understood that; for those skilled in the art; do not departing under the prerequisite of the utility model know-why; can also make some improvement and modification, these improve and modification also should be considered as protection domain of the present utility model.

Claims (4)

1. a probe-type electrical measurement fixture, comprise base plate (1), it is characterized in that: the middle part of described base plate (1) is provided with the back up pad (2) of extending upward, on the base plate (1) of back up pad (2) front side, be fixed with correcting plate (3), the top of correcting plate (3) is provided with two putting grooves (4) near front end place, in putting groove (4), be provided with the some equally distributed pin holes of a row, the base plate (1) under putting groove (4) is provided with some probes (5) that cooperatively interact with pin hole; The top of described correcting plate (3) is provided with holding pad (6), directly over holding pad (6), be provided with the cylinder (7) being fixed in back up pad (2), the piston rod bottom of cylinder (7) is fixed with binder block (8), and the bottom of binder block (8) is fixed on holding pad (6).
2. probe-type electrical measurement fixture according to claim 1, it is characterized in that: it is upper that described correcting plate (3) is fixed on base plate (1) by some support columns (9), on support column (9) outer wall of correcting plate (3) below, be equipped with spring.
3. probe-type electrical measurement fixture according to claim 1, is characterized in that: the rear side of described correcting plate (3) is provided with two guide pillars (10), and the rear side of described holding pad (6) is set on guide pillar (10).
4. probe-type electrical measurement fixture according to claim 1, is characterized in that: described probe (5) is telescopic probe.
CN201320567391.6U 2013-09-13 2013-09-13 Probe-type electrical test fixture Expired - Fee Related CN203422440U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201320567391.6U CN203422440U (en) 2013-09-13 2013-09-13 Probe-type electrical test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201320567391.6U CN203422440U (en) 2013-09-13 2013-09-13 Probe-type electrical test fixture

Publications (1)

Publication Number Publication Date
CN203422440U true CN203422440U (en) 2014-02-05

Family

ID=50021535

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201320567391.6U Expired - Fee Related CN203422440U (en) 2013-09-13 2013-09-13 Probe-type electrical test fixture

Country Status (1)

Country Link
CN (1) CN203422440U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237695A (en) * 2014-09-24 2014-12-24 苏州博众精工科技有限公司 Probe service life testing mechanism
CN118962404A (en) * 2024-08-22 2024-11-15 杭州高坤电子科技有限公司 A kind of detection device for aging board

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237695A (en) * 2014-09-24 2014-12-24 苏州博众精工科技有限公司 Probe service life testing mechanism
CN104237695B (en) * 2014-09-24 2017-01-25 苏州博众精工科技有限公司 Probe service life testing mechanism
CN118962404A (en) * 2024-08-22 2024-11-15 杭州高坤电子科技有限公司 A kind of detection device for aging board
CN118962404B (en) * 2024-08-22 2025-08-26 杭州高坤电子科技有限公司 A detection device for aging board
WO2026040399A1 (en) * 2024-08-22 2026-02-26 杭州高坤电子科技有限公司 Detection device for burn-in boards

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C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20140205

Termination date: 20180913

CF01 Termination of patent right due to non-payment of annual fee