CN104143961A - Frequency calibration method, device and system for oven controlled crystal oscillator - Google Patents
Frequency calibration method, device and system for oven controlled crystal oscillator Download PDFInfo
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Abstract
The invention relates to a frequency calibration method, device and system for an oven controlled crystal oscillator. The method comprises the steps that preset test conditions are read and written in the crystal oscillator; output frequencies of the crystal oscillator under the different test conditions are read; least squares curve fitting is performed on relation arrays of the test conditions and the output frequencies to obtain polynomial functions about the test conditions and the output frequencies; the test condition corresponding to the calibration frequency of the crystal oscillator is calculated through the polynomial functions and is written in the crystal oscillator; the output calibration frequency of the crystal oscillator under the test condition corresponding to the calibration frequency is read and verified; if the output calibration frequency meets the range of frequency accuracy, calibration is over; or else, the calibration continues to be performed after coefficients of the polynomial functions are adjusted. According to the frequency calibration method, device and system, the frequency calibration of the oven controlled crystal oscillator can be automatically completed, measuring errors are reduced, and the purposes of performing frequency calibration automatically and accurately and enhancing production efficiency are achieved.
Description
Technical field
The present invention relates to crystal oscillator technical field, relate in particular to a kind of constant-temperature crystal oscillator transmitting frequency calibration method, Apparatus and system.
Background technology
At present, the frequency accuracy of constant-temperature crystal oscillator calibration is to adopt manual control testing equipment to carry out, and the temperature value that changes crystal oscillator by craft changes its frequency to be exported, and then people determines whether to reach within the scope of the frequency accuracy of crystal.This inadequate science of mode, accurate not that changes crystal oscillator frequency parameter by manual debugging, be easy to cause the inaccurate or artificial Select Error of frequency accuracy, cause constant-temperature crystal oscillator not reach the output accuracy of its requirement, even cannot continue to guarantee stable output; In addition, production efficiency is low, is also the very big drawback of manual debugging, can not meet the high performance index of constant-temperature crystal oscillator far away.
Summary of the invention
The object of the invention is to propose a kind of constant-temperature crystal oscillator transmitting frequency calibration method, Apparatus and system, can automatically complete constant-temperature crystal oscillator frequency calibration, reduce measure error, realize automatically, accurate calibration frequency, the object of enhancing productivity.
For reaching this object, the present invention by the following technical solutions:
A constant-temperature crystal oscillator transmitting frequency calibration method, comprising:
S1, read pre-configured test condition, write crystal oscillator;
S2, read the output frequency of crystal oscillator under different test conditions;
S3, the pass coefficient sets of test condition and output frequency is carried out to least square curve fit obtain the polynomial function about test condition and output frequency;
S4, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator;
S5, test condition corresponding to described calibration frequency write to crystal oscillator, output calibration frequency, realizes calibration;
Wherein, described test condition comprises the temperature value of the crystal oscillator work of simulation.
Wherein, described step S1, read pre-configured test condition, write crystal oscillator; With step S2, read the output frequency of crystal oscillator under different test conditions; Comprise:
Read pre-configured temperature initial value, write crystal oscillator, obtain the first output frequency of crystal oscillator, be specially: read pre-configured temperature initial value, to burn clock stable after, temperature initial value is write to crystal oscillator; The output frequency of multi collect crystal oscillator under temperature initial value condition; Utilize the way of median average filter to process output frequency, obtain the first output frequency of crystal oscillator;
After temperature initial value is progressively increased according to temperature step-length, write crystal oscillator, obtain successively the output frequency of crystal oscillator under different temperatures.
Wherein, at described step S3, to the pass coefficient sets of test condition and output frequency, carry out before least square curve fit obtains the polynomial function about test condition and output frequency, also comprising: the pass coefficient sets to test condition and output frequency is carried out filtering screening.
Wherein, described step S4, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator, be specially: the calibration frequency according to crystal oscillator, utilize polynomial function, calculate the temperature that calibration frequency is corresponding;
Described step S5, test condition corresponding to described calibration frequency write to crystal oscillator, output calibration frequency, realizes calibration, comprising:
The temperature that described calibration frequency is corresponding writes crystal oscillator, reads the output calibration frequency of crystal oscillator at this temperature;
If described output calibration frequency meets frequency accuracy scope, calibration finishes, and temperature parameter corresponding to described calibration frequency write to crystal oscillator; Otherwise, after the coefficient of the polynomial function in set-up procedure S3, subsequent step is carried out successively, if the coefficient of the polynomial function in 5 set-up procedure S3 of continuous circulation makes to export calibration frequency yet, does not meet frequency accuracy scope, return to step 2, subsequent step is carried out successively;
If return to step 2 continuous circulation, do not make yet to export calibration frequency for 3 times and meet frequency accuracy scope, calibrate unsuccessfully, finish calibration.
A constant-temperature crystal oscillator frequency calibration device, comprising:
System configuration and writing unit, for reading pre-configured test condition, write crystal oscillator;
Data acquisition unit, for reading the output frequency of crystal oscillator under different test conditions;
Data processing unit, carries out least square curve fit for the pass coefficient sets to test condition and output frequency and obtains the polynomial function about test condition and output frequency;
Calibration parameter unit, for utilizing polynomial function, calculates the test condition corresponding to calibration frequency of crystal oscillator;
Calibration and authentication unit, for test condition corresponding to described calibration frequency write to crystal oscillator, output calibration frequency, realizes calibration;
Wherein, described test condition comprises the temperature value of the crystal oscillator work of simulation.
Wherein, described system configuration and writing unit and data acquisition unit, specifically for: read pre-configured temperature initial value, write crystal oscillator, obtain the first output frequency of crystal oscillator, be specially: read pre-configured temperature initial value, to burn clock stable after, temperature initial value is write to crystal oscillator; The output frequency of multi collect crystal oscillator under temperature initial value condition; Utilize the way of median average filter to process output frequency, obtain the first output frequency of crystal oscillator;
After temperature initial value is progressively increased according to temperature step-length, write crystal oscillator, obtain successively the output frequency of crystal oscillator under different temperatures.
Wherein, also comprise data screening unit, for the pass coefficient sets to test condition and output frequency, carry out filtering screening.
Wherein, described calibration parameter unit, specifically for: the calibration frequency according to crystal oscillator, utilize polynomial function, calculate the temperature that calibration frequency is corresponding;
Described calibration and authentication unit, specifically for:
The temperature that described calibration frequency is corresponding writes crystal oscillator, reads the output calibration frequency of crystal oscillator at this temperature;
If described output calibration frequency meets frequency accuracy scope, calibration finishes, and temperature parameter corresponding to described calibration frequency write to crystal oscillator; Otherwise, adjust after the coefficient of the polynomial function in data processing unit, follow-up unit is carried out successively, if the coefficient of the polynomial function in 5 adjustment data processing units of continuous circulation does not make yet to export calibration frequency and meets frequency accuracy scope, return data collecting unit, follow-up unit is carried out successively;
If return data collecting unit continuous circulation makes to export calibration frequency for 3 times yet, do not meet frequency accuracy scope, calibrate unsuccessfully, finish calibration.
A constant-temperature crystal oscillator frequency calibration system, comprising: testing hardware equipment and by the PC of communication interface and testing hardware equipment connection;
Described PC, for reading the test condition setting in advance, control testing hardware equipment test condition is write to crystal oscillator, the output frequency of the crystal oscillator that read test hardware device returns under different test conditions, the pass coefficient sets of test condition and output frequency is carried out to least square curve fit and obtain the polynomial function about test condition and output frequency, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator, the test condition that described calibration frequency is corresponding writes crystal oscillator by controlling testing hardware equipment, the output calibration frequency of the crystal oscillator that read test hardware device returns under test condition corresponding to calibration frequency, checking realizes calibration,
Described testing hardware equipment, for receiving the pre-configured test condition that PC reads, and write crystal oscillator, gather the output frequency of crystal oscillator under different test conditions and feed back to PC, and test condition corresponding to calibration frequency sending for receiving PC, and write crystal oscillator, gather the output calibration frequency of crystal oscillator under test condition corresponding to calibration frequency and feed back to PC;
Wherein, described test condition comprises the temperature value of the crystal oscillator work of simulation.
Beneficial effect:
A kind of constant-temperature crystal oscillator transmitting frequency calibration method of the present invention, Apparatus and system.Its method comprises: first read the test condition setting in advance, and test condition is write to crystal oscillator, read the output frequency of crystal oscillator under different test conditions, the pass coefficient sets of test condition and output frequency is carried out to least square curve fit and obtain the polynomial function about test condition and output frequency, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator, the test condition that described calibration frequency is corresponding writes crystal oscillator, read the output calibration frequency of crystal oscillator under test condition corresponding to calibration frequency, output calibration frequency is verified, if output calibration frequency meets frequency accuracy scope, calibration finishes, and temperature parameter corresponding to described calibration frequency write to crystal oscillator, otherwise, adjust after the coefficient of polynomial function, continue to carry out.The present invention can complete constant-temperature crystal oscillator frequency calibration automatically, reduces measure error, realizes automatically, accurate calibration frequency, the object of enhancing productivity.
Accompanying drawing explanation
Fig. 1 is the flow chart of a kind of constant-temperature crystal oscillator transmitting frequency calibration method of providing of the embodiment of the present invention 1.
Fig. 2 is the structural representation of a kind of constant-temperature crystal oscillator frequency calibration device of providing of the embodiment of the present invention 2.
Fig. 3 is the structural representation of a kind of constant-temperature crystal oscillator frequency calibration system of providing of the embodiment of the present invention 3.
In figure:
1-PC machine; 2-testing hardware equipment.
Embodiment
Below in conjunction with accompanying drawing and by embodiment, further illustrate technical scheme of the present invention.
Embodiment 1:
Fig. 1 is the flow chart of a kind of constant-temperature crystal oscillator transmitting frequency calibration method of providing of the embodiment of the present invention 1.As shown in Figure 1, a kind of constant-temperature crystal oscillator transmitting frequency calibration method of the present invention, comprising:
S1, read pre-configured test condition, write crystal oscillator;
S2, read the output frequency of crystal oscillator under different test conditions;
S3, the pass coefficient sets of test condition and output frequency is carried out to least square curve fit obtain the polynomial function about test condition and output frequency;
S4, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator;
S5, test condition corresponding to described calibration frequency write to crystal oscillator, output calibration frequency, realizes calibration;
Wherein, described test condition comprises the temperature value of the crystal oscillator work of simulation.
First, read the test condition of the crystal oscillator setting in advance, then test condition is write to crystal oscillator, obtain the output frequency of crystal oscillator under different test conditions, the pass coefficient sets of test condition and output frequency is carried out to least square curve fit and obtain the polynomial function about test condition and output frequency.Utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator, the test condition that described calibration frequency is corresponding writes crystal oscillator, read the output calibration frequency of crystal oscillator under test condition corresponding to calibration frequency, output calibration frequency is verified, if output calibration frequency meets frequency accuracy scope, calibration finishes, and temperature parameter corresponding to described calibration frequency write to crystal oscillator; Otherwise, adjust after the coefficient of polynomial function, continue to carry out.The present invention can complete constant-temperature crystal oscillator frequency calibration automatically, reduces measure error, realizes automatically, accurate calibration frequency, the object of enhancing productivity.
Described step S1, read pre-configured test condition, write crystal oscillator; With step S2, read the output frequency of crystal oscillator under different test conditions; Comprise:
Read pre-configured temperature initial value, write crystal oscillator, obtain the first output frequency of crystal oscillator, be specially: read pre-configured temperature initial value, to burn clock stable after, temperature initial value is write to crystal oscillator; The output frequency of multi collect crystal oscillator under temperature initial value condition; Utilize the way of median average filter to process output frequency, obtain the first output frequency of crystal oscillator;
After temperature initial value is progressively increased according to temperature step-length, write crystal oscillator, obtain successively the output frequency of crystal oscillator under different temperatures.
Because crystal oscillator is under the working temperature of difference simulation, its output frequency is different.By write the working temperature of different simulations to crystal oscillator, obtain the output frequency under the working temperature of difference simulation.Detailed process is: first, to crystal oscillator, write temperature initial value, obtain the first output frequency under this temperature initial value condition, then on the basis of temperature initial value, add a step-length, by adding a temperature after step-length, write crystal oscillator, read output frequency; Then continue to add a step-length again, write crystal oscillator, read output frequency, circulation, more than at least ten times, obtains the two-dimentional relation array about temperature and output frequency successively.By least square method, the pass coefficient sets of temperature and output frequency is carried out curve fitting, obtain the polynomial function about the two.Then, utilize polynomial function, according to the calibration frequency of crystal oscillator, be back-calculated to obtain the temperature that described calibration frequency is corresponding, then this temperature is write to crystal oscillator, make crystal oscillator output calibration frequency.It should be noted that, temperature initial value is normal temperature, and described burning clock is stable, refer to that crystal oscillator is energized to the required time of steady operation, usually, the burning clock of different crystal oscillators is stablized required asynchronism(-nization), in the present invention, burning clock stabilization time is 40 minutes.
At described step S3, to the pass coefficient sets of test condition and output frequency, carry out before least square curve fit obtains the polynomial function about test condition and output frequency, also comprising: the pass coefficient sets to test condition and output frequency is carried out filtering screening.According to the frequency output characteristic of crystal oscillator own, when certain, close coefficient sets and occur when abnormal, rejecting away from frequency output characteristic, for example, when linear relationship that crystal oscillator output frequency becomes to increase progressively with temperature, when certain closes coefficient sets away from this linearity curve, reject.Its object be remain with use, approach the real coefficient sets of closing, be conducive to follow-uply to closing coefficient sets curve, search out the polynomial function approaching most.
Described step S4, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator, be specially: the calibration frequency according to crystal oscillator, utilize polynomial function, calculate the temperature that calibration frequency is corresponding; Utilize the above-mentioned polynomial function that writes temperature and output frequency about crystal oscillator simulating, the calibration frequency that need to adjust according to crystal oscillator, the anti-working temperature that show that calibration frequency is corresponding that pushes away.Then this working temperature is write to crystal oscillator, make crystal oscillator output calibration frequency.Desirable, whether this calibration frequency is the calibration frequency after adjusting, but considers the impact of various factors, need to export calibration frequency to this to verify, meet accurately to scope.
Described step S5, test condition corresponding to described calibration frequency write to crystal oscillator, output calibration frequency, realizes calibration, comprising:
The temperature that described calibration frequency is corresponding writes crystal oscillator, reads the output calibration frequency of crystal oscillator at this temperature;
If described output calibration frequency meets frequency accuracy scope, calibration finishes, and temperature parameter corresponding to described calibration frequency write to crystal oscillator; Otherwise, after the coefficient of the polynomial function in set-up procedure S3, subsequent step is carried out successively, if the coefficient of the polynomial function in 5 set-up procedure S3 of continuous circulation makes to export calibration frequency yet, does not meet frequency accuracy scope, return to step 2, subsequent step is carried out successively;
If return to step 2 continuous circulation, do not make yet to export calibration frequency for 3 times and meet frequency accuracy scope, calibrate unsuccessfully, finish calibration.It should be noted that, need to carry out verification by the output calibration frequency under temperature corresponding to calibration frequency to crystal oscillator, if the output calibration frequency of crystal oscillator meets frequency accuracy scope, calibration finishes, otherwise, need return after the coefficient of step S3 adjustment polynomial function, subsequent step is carried out successively, if adjust after the coefficient of polynomial function, the output calibration frequency of resulting crystal oscillator does not still meet frequency accuracy scope, continue to return the coefficient that step S3 adjusts polynomial function, if making to export calibration frequency yet, the coefficient of the polynomial function in 5 set-up procedure S3 of continuous circulation do not meet frequency accuracy scope, illustrate likely and go wrong when data acquisition, need to return step 2 Resurvey data, subsequent step is carried out successively, if return to step 2 continuous circulation, do not make yet to export calibration frequency for 3 times and meet frequency accuracy scope, calibrate unsuccessfully, finish calibration.
In sum, visible, a kind of constant-temperature crystal oscillator transmitting frequency calibration method of the present invention, can complete constant-temperature crystal oscillator frequency calibration automatically, reduces measure error, realizes automatically, accurate calibration frequency, the object of enhancing productivity.
Embodiment 2: the device embodiment that is below the embodiment of the present invention, embodiment of the method for the present invention, device embodiment, system embodiment belong to same design, the detail content of detailed description not in device embodiment, system embodiment, can be with reference to said method embodiment.Fig. 2 is the structural representation of a kind of constant-temperature crystal oscillator frequency calibration device of providing of the embodiment of the present invention 2.As shown in Figure 2, a kind of constant-temperature crystal oscillator frequency calibration device of the present invention, comprising:
System configuration and writing unit, for reading pre-configured test condition, write crystal oscillator;
Data acquisition unit, for reading the output frequency of crystal oscillator under different test conditions;
Data processing unit, carries out least square curve fit for the pass coefficient sets to test condition and output frequency and obtains the polynomial function about test condition and output frequency;
Calibration parameter unit, for utilizing polynomial function, calculates the test condition corresponding to calibration frequency of crystal oscillator;
Calibration and authentication unit, for test condition corresponding to described calibration frequency write to crystal oscillator, output calibration frequency, realizes calibration;
Wherein, described test condition comprises the temperature value of the crystal oscillator work of simulation.
By system configuration and writing unit, read the test condition of the crystal oscillator setting in advance, and test condition is write to crystal oscillator, then by data acquisition unit, obtain the output frequency of crystal oscillator under different test conditions, by data processing unit, the pass coefficient sets of test condition and output frequency is carried out to least square curve fit and obtain the polynomial function about test condition and output frequency, by calibration parameter unit, calculate the test condition corresponding to calibration frequency of crystal oscillator, the test condition that described calibration frequency is corresponding writes crystal oscillator, read the output calibration frequency of crystal oscillator under test condition corresponding to calibration frequency, by calibration and authentication unit, output calibration frequency is verified, if output calibration frequency meets frequency accuracy scope, calibration finishes, and temperature parameter corresponding to described calibration frequency write to crystal oscillator, otherwise, adjust after the coefficient of polynomial function, continue to carry out.The present invention can complete constant-temperature crystal oscillator frequency calibration automatically, reduces measure error, realizes automatically, accurate calibration frequency, the object of enhancing productivity.
Described system configuration and writing unit and data acquisition unit, specifically for: read pre-configured temperature initial value, write crystal oscillator, obtain the first output frequency of crystal oscillator, be specially: read pre-configured temperature initial value, to burn clock stable after, temperature initial value is write to crystal oscillator; The output frequency of multi collect crystal oscillator under temperature initial value condition; Utilize the way of median average filter to process output frequency, obtain the first output frequency of crystal oscillator;
After temperature initial value is progressively increased according to temperature step-length, write crystal oscillator, obtain successively the output frequency of crystal oscillator under different temperatures.
Also comprise data screening unit, for the pass coefficient sets to test condition and output frequency, carry out filtering screening.
Described calibration parameter unit, specifically for: the calibration frequency according to crystal oscillator, utilize polynomial function, calculate the temperature that calibration frequency is corresponding;
Described calibration and authentication unit, specifically for:
The temperature that described calibration frequency is corresponding writes crystal oscillator, reads the output calibration frequency of crystal oscillator at this temperature;
If described output calibration frequency meets frequency accuracy scope, calibration finishes, and temperature parameter corresponding to described calibration frequency write to crystal oscillator; Otherwise, adjust after the coefficient of the polynomial function in data processing unit, follow-up unit is carried out successively, if the coefficient of the polynomial function in 5 adjustment data processing units of continuous circulation does not make yet to export calibration frequency and meets frequency accuracy scope, return data collecting unit, follow-up unit is carried out successively;
If return data collecting unit continuous circulation makes to export calibration frequency for 3 times yet, do not meet frequency accuracy scope, calibrate unsuccessfully, finish calibration.
Embodiment 3: be the system embodiment of the embodiment of the present invention below, embodiment of the method for the present invention, device embodiment, system embodiment belong to same design, the detail content of detailed description not in device embodiment, system embodiment, can be with reference to said method embodiment.Fig. 3 is the structural representation of a kind of constant-temperature crystal oscillator frequency calibration system of providing of the embodiment of the present invention 3.As shown in Figure 3, a kind of constant-temperature crystal oscillator frequency calibration system of the present invention, comprising: testing hardware equipment 2 and the PC 1 being connected with testing hardware equipment 2 by communication interface;
Described PC 1, for reading the test condition setting in advance, control testing hardware equipment 2 test condition is write to crystal oscillator, the output frequency of the crystal oscillator that read test hardware device 2 returns under different test conditions, the pass coefficient sets of test condition and output frequency is carried out to least square curve fit and obtain the polynomial function about test condition and output frequency, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator, the test condition that described calibration frequency is corresponding writes crystal oscillator by controlling testing hardware equipment 2, the output calibration frequency of the crystal oscillator that read test hardware device 2 returns under test condition corresponding to calibration frequency, checking realizes calibration,
Described testing hardware equipment 2, for receiving the pre-configured test condition that PC 1 reads, and write crystal oscillator, gather the output frequency of crystal oscillator under different test conditions and feed back to PC 1, and test condition corresponding to calibration frequency sending for receiving PC 1, and write crystal oscillator, gather the output calibration frequency of crystal oscillator under test condition corresponding to calibration frequency and feed back to PC 1;
Wherein, described test condition comprises the temperature value of the crystal oscillator work of simulation.
Visible, a kind of constant-temperature crystal oscillator frequency calibration system of the present invention, comprise PC 1, and the testing hardware equipment 2 connecting by communication interface, this system is by the testing hardware equipment 2 and PC 1 of integrated constant-temperature crystal oscillator, can automatically complete the testing procedure of constant-temperature crystal oscillator frequency calibration, high efficiency smart ground calculates test data automatically, comprise the test condition of automatically accurately setting constant-temperature crystal oscillator, error freely read the test data that constant-temperature crystal oscillator returns under test condition, automaticdata filters and screening, intelligent decision recurrence completes frequency calibration process, and finally by controlling testing hardware equipment 2, to constant-temperature crystal oscillator, write the test condition that calibration frequency is corresponding.Realize automatic, accurate calibration frequency object, reduce artificially and participate in, greatly improve production test efficiency.
In sum, a kind of constant-temperature crystal oscillator transmitting frequency calibration method of the present invention, Apparatus and system, it is the frequency output characteristic according to constant-temperature crystal oscillator, adopt iterative algorithm, pass through communication interface, control the relevant control that testing hardware equipment 2 completes testing process automatically, and the passback data of Real-time Collection testing hardware equipment 2.By passback data, on PC 1, draw the frequency output characteristic curve of test constant-temperature crystal oscillator, while intelligently filters and deal with data, and according to the data that obtain, carry out the calculating of frequency adjusting range, complete frequency and adjust handling process.Whole constant-temperature crystal oscillator test process is that system completes automatically substantially, reaches minimizing measure error, the object of enhancing productivity.Calibration flow process is as follows, when constant-temperature crystal oscillator has normally been placed into after testing hardware equipment 2, start testing process: according to the constant-temperature crystal oscillator of current loading, PC 1 passes through communication mode with testing hardware equipment 2, automatically control testing hardware equipment 2 to crystal oscillator write frequency calibration parameter initial value, i.e. test condition; Follow the automatic log-on data drainage pattern of PC 1, the real-time output frequency data of the constant-temperature crystal oscillator that collection feeds back by testing hardware equipment 2 automatically under different test conditions, data acquisition completes; By curve, go out the frequency output characteristic curve about crystal oscillator, the frequency range of calibration, writes crystal oscillator by test parameter corresponding to calibration output frequency as required, completes frequency accuracy calibration; Meanwhile, system enters data screening and intelligent decision pattern, and the test parameter that finally meets frequency accuracy scope is write to crystal oscillator.
The above; it is only preferably embodiment of the present invention; but protection scope of the present invention is not limited to this; anyly be familiar with those skilled in the art in the technical scope that the present invention discloses; according to technical scheme of the present invention and inventive concept thereof, be equal to replacement or changed, within all should being encompassed in protection scope of the present invention.
Claims (9)
1. a constant-temperature crystal oscillator transmitting frequency calibration method, is characterized in that, comprising:
S1, read pre-configured test condition, write crystal oscillator;
S2, read the output frequency of crystal oscillator under different test conditions;
S3, the pass coefficient sets of test condition and output frequency is carried out to least square curve fit obtain the polynomial function about test condition and output frequency;
S4, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator;
S5, test condition corresponding to described calibration frequency write to crystal oscillator, output calibration frequency, realizes calibration;
Wherein, described test condition comprises the temperature value of the crystal oscillator work of simulation.
2. a kind of constant-temperature crystal oscillator transmitting frequency calibration method according to claim 1, is characterized in that,
Described step S1, read pre-configured test condition, write crystal oscillator; With step S2, read the output frequency of crystal oscillator under different test conditions; Comprise:
Read pre-configured temperature initial value, write crystal oscillator, obtain the first output frequency of crystal oscillator, be specially: read pre-configured temperature initial value, to burn clock stable after, temperature initial value is write to crystal oscillator; The output frequency of multi collect crystal oscillator under temperature initial value condition; Utilize the way of median average filter to process output frequency, obtain the first output frequency of crystal oscillator;
After temperature initial value is progressively increased according to temperature step-length, write crystal oscillator, obtain successively the output frequency of crystal oscillator under different temperatures.
3. a kind of constant-temperature crystal oscillator transmitting frequency calibration method according to claim 1, it is characterized in that, at described step S3, to the pass coefficient sets of test condition and output frequency, carry out before least square curve fit obtains the polynomial function about test condition and output frequency, also comprising: the pass coefficient sets to test condition and output frequency is carried out filtering screening.
4. a kind of constant-temperature crystal oscillator transmitting frequency calibration method according to claim 1, it is characterized in that, described step S4, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator, be specially: according to the calibration frequency of crystal oscillator, utilize polynomial function, calculate the temperature that calibration frequency is corresponding;
Described step S5, test condition corresponding to described calibration frequency write to crystal oscillator, output calibration frequency, realizes calibration, comprising:
The temperature that described calibration frequency is corresponding writes crystal oscillator, reads the output calibration frequency of crystal oscillator at this temperature;
If described output calibration frequency meets frequency accuracy scope, calibration finishes, and temperature parameter corresponding to described calibration frequency write to crystal oscillator; Otherwise, after the coefficient of the polynomial function in set-up procedure S3, subsequent step is carried out successively, if the coefficient of the polynomial function in 5 set-up procedure S3 of continuous circulation makes to export calibration frequency yet, does not meet frequency accuracy scope, return to step 2, subsequent step is carried out successively;
If return to step 2 continuous circulation, do not make yet to export calibration frequency for 3 times and meet frequency accuracy scope, calibrate unsuccessfully, finish calibration.
5. a constant-temperature crystal oscillator frequency calibration device, is characterized in that, comprising:
System configuration and writing unit, for reading pre-configured test condition, write crystal oscillator;
Data acquisition unit, for reading the output frequency of crystal oscillator under different test conditions;
Data processing unit, carries out least square curve fit for the pass coefficient sets to test condition and output frequency and obtains the polynomial function about test condition and output frequency;
Calibration parameter unit, for utilizing polynomial function, calculates the test condition corresponding to calibration frequency of crystal oscillator;
Calibration and authentication unit, for test condition corresponding to described calibration frequency write to crystal oscillator, output calibration frequency, realizes calibration;
Wherein, described test condition comprises the temperature value of the crystal oscillator work of simulation.
6. a kind of constant-temperature crystal oscillator frequency calibration device according to claim 5, it is characterized in that, described system configuration and writing unit and data acquisition unit, specifically for: read pre-configured temperature initial value, write crystal oscillator, obtain the first output frequency of crystal oscillator, be specially: read pre-configured temperature initial value, to burn clock stable after, temperature initial value is write to crystal oscillator; The output frequency of multi collect crystal oscillator under temperature initial value condition; Utilize the way of median average filter to process output frequency, obtain the first output frequency of crystal oscillator;
After temperature initial value is progressively increased according to temperature step-length, write crystal oscillator, obtain successively the output frequency of crystal oscillator under different temperatures.
7. a kind of constant-temperature crystal oscillator frequency calibration device according to claim 5, is characterized in that, also comprises data screening unit, for the pass coefficient sets to test condition and output frequency, carries out filtering screening.
8. a kind of constant-temperature crystal oscillator frequency calibration device according to claim 5, is characterized in that, described calibration parameter unit, specifically for: the calibration frequency according to crystal oscillator, utilize polynomial function, calculate the temperature that calibration frequency is corresponding;
Described calibration and authentication unit, specifically for:
The temperature that described calibration frequency is corresponding writes crystal oscillator, reads the output calibration frequency of crystal oscillator at this temperature;
If described output calibration frequency meets frequency accuracy scope, calibration finishes, and temperature parameter corresponding to described calibration frequency write to crystal oscillator; Otherwise, adjust after the coefficient of the polynomial function in data processing unit, follow-up unit is carried out successively, if the coefficient of the polynomial function in 5 adjustment data processing units of continuous circulation does not make yet to export calibration frequency and meets frequency accuracy scope, return data collecting unit, follow-up unit is carried out successively;
If return data collecting unit continuous circulation makes to export calibration frequency for 3 times yet, do not meet frequency accuracy scope, calibrate unsuccessfully, finish calibration.
9. a constant-temperature crystal oscillator frequency calibration system, is characterized in that, comprising: testing hardware equipment and by the PC of communication interface and testing hardware equipment connection;
Described PC, for reading the test condition setting in advance, control testing hardware equipment test condition is write to crystal oscillator, the output frequency of the crystal oscillator that read test hardware device returns under different test conditions, the pass coefficient sets of test condition and output frequency is carried out to least square curve fit and obtain the polynomial function about test condition and output frequency, utilize polynomial function, calculate the test condition corresponding to calibration frequency of crystal oscillator, the test condition that described calibration frequency is corresponding writes crystal oscillator by controlling testing hardware equipment, the output calibration frequency of the crystal oscillator that read test hardware device returns under test condition corresponding to calibration frequency, checking realizes calibration,
Described testing hardware equipment, for receiving the pre-configured test condition that PC reads, and write crystal oscillator, gather the output frequency of crystal oscillator under different test conditions and feed back to PC, and test condition corresponding to calibration frequency sending for receiving PC, and write crystal oscillator, gather the output calibration frequency of crystal oscillator under test condition corresponding to calibration frequency and feed back to PC;
Wherein, described test condition comprises the temperature value of the crystal oscillator work of simulation.
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| CN104682953A (en) * | 2015-02-15 | 2015-06-03 | 大唐联仪科技有限公司 | Error calibration method and device of tuning circuit |
| CN105471522B (en) * | 2015-11-13 | 2018-01-23 | 太仓市同维电子有限公司 | A kind of frequency shifted calibration method based on statistics and indicatrix |
| CN105471522A (en) * | 2015-11-13 | 2016-04-06 | 太仓市同维电子有限公司 | Frequency shift calibration method based on statistic data and characteristic curve |
| CN105467242A (en) * | 2015-12-09 | 2016-04-06 | 张宇恒 | A production testing system of digital temperature compensated crystal oscillators and a debugging method thereof |
| CN107819712A (en) * | 2016-09-12 | 2018-03-20 | 中兴通讯股份有限公司 | Local-oscillator leakage automatic calibrating method and device |
| CN106598022A (en) * | 2016-12-01 | 2017-04-26 | 南京中电熊猫晶体科技有限公司 | Constant temperature crystal oscillator intelligent test vehicle control system |
| CN106598022B (en) * | 2016-12-01 | 2019-02-26 | 南京中电熊猫晶体科技有限公司 | Constant-temperature crystal oscillator intelligence test vehicle control |
| CN107329399A (en) * | 2017-07-14 | 2017-11-07 | 成都天奥电子股份有限公司 | A kind of satellite time transfer clock system Low-power-consumptiocontrol control method and clock system |
| CN107329399B (en) * | 2017-07-14 | 2020-08-25 | 成都天奥电子股份有限公司 | Low-power-consumption control method of satellite time service clock system and clock system |
| CN110740001A (en) * | 2018-07-18 | 2020-01-31 | 北京松果电子有限公司 | Crystal oscillator frequency calibration method and device and electronic equipment |
| CN110212863A (en) * | 2019-05-31 | 2019-09-06 | Oppo广东移动通信有限公司 | Calibrate method, apparatus, electronic equipment and the storage medium of crystal oscillator |
| CN110212863B (en) * | 2019-05-31 | 2024-02-13 | Oppo广东移动通信有限公司 | Method, apparatus, electronic device and storage medium for calibrating crystal oscillator |
| CN111628835A (en) * | 2020-04-22 | 2020-09-04 | 惠州高盛达科技有限公司 | Communication module correcting method |
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