CN104121259B - The trough locating stud using method of dry process apparatus - Google Patents

The trough locating stud using method of dry process apparatus Download PDF

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Publication number
CN104121259B
CN104121259B CN201310150860.9A CN201310150860A CN104121259B CN 104121259 B CN104121259 B CN 104121259B CN 201310150860 A CN201310150860 A CN 201310150860A CN 104121259 B CN104121259 B CN 104121259B
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CN
China
Prior art keywords
trough
base
locating
locating stud
dry process
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201310150860.9A
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Chinese (zh)
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CN104121259A (en
Inventor
刘峻承
林志明
曾瑞轩
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EverDisplay Optronics Shanghai Co Ltd
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EverDisplay Optronics Shanghai Co Ltd
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Filing date
Publication date
Application filed by EverDisplay Optronics Shanghai Co Ltd filed Critical EverDisplay Optronics Shanghai Co Ltd
Priority to CN201310150860.9A priority Critical patent/CN104121259B/en
Publication of CN104121259A publication Critical patent/CN104121259A/en
Application granted granted Critical
Publication of CN104121259B publication Critical patent/CN104121259B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention discloses a kind of trough locating stud using method of dry process apparatus, in each trough, there is some locating studs respectively, locating stud comprises interconnective positioning head and locating column, the bottom of locating column is provided with base, base is located in trough, the outer ring of locating column is surrounded by a circle contact component, contact component surface contacts with by positioning element, the bottom of base and locating column is separable structure, after contact component surface abrasion consumes, surperficial and by the contact position between positioning element to change contact component by the base of changing all locating studs in trough.The present invention reduces the replacing number of times that glass substrate directly contacts component, decreases the expenditure of cost, and without overall pulling down locating stud, the base of other gauge thickness is changed rapidly after only its base need being removed, just quick mounting can realize again utilizing, save time, shorten board service time.

Description

The trough locating stud using method of dry process apparatus
Technical field
The present invention relates to positioning element, particularly relate to a kind of trough locating stud using method of dry process apparatus.
Background technique
Locating stud can be applied to carry out test position fix in manufacture of semiconductor, in prior art, the trough inner position pin structure of dry process apparatus as shown in Figure 1, comprise interconnective positioning head 1 and locating column 2, the bottom of locating column 2 is provided with base 3 and base 3 and locating column 2 are formed in one, and base 3 is located in trough, the outer ring of locating column 3 is surrounded by a circle contact component 4, contact component 4 surface contacts with by positioning element, in drying journey process, is glass substrate by positioning element.After test position fix repeatedly, there is attrition in contact component 4 surface, once the degree of wear is relatively more serious, because base 3 and locating column 2 are formed in one, just need the monoblock parts of locating stud all to change during replacing, parts cannot be utilized effectively; In addition, in Renewal process, install again after needing monoblock parts all to disassemble, very expend man-hour.
Summary of the invention
For above-mentioned Problems existing, the object of this invention is to provide a kind of trough locating stud using method of dry process apparatus, entirety need not change during replacing, improve element usage and working efficiency.
The object of the invention is to be achieved through the following technical solutions:
A kind of trough locating stud using method of dry process apparatus, in each described trough, there is some described locating studs respectively, described locating stud comprises interconnective positioning head and locating column, the bottom of described locating column is provided with base, described base is located in described trough, the outer ring of described locating column is surrounded by a circle contact component, described contact component surface contacts with by positioning element, it is characterized in that, the bottom of described base and described locating column is separable structure, after described contact component surface abrasion consumes, surperficial and described by the contact position between positioning element to change described contact component by the described base changing all described locating stud in described trough.
The trough locating stud using method of above-mentioned dry process apparatus, wherein said base has plurality of specifications, and the described base of different size only thickness difference.
The trough locating stud using method of above-mentioned dry process apparatus, wherein the thickness of the described base of different size is multiple proportion each other.
The trough locating stud using method of above-mentioned dry process apparatus, wherein said base specification has three, be respectively the first specification, the second specification and the 3rd specification, described second gauge thickness and described 3rd gauge thickness are respectively the twice of described first gauge thickness and three times.
The trough locating stud using method of above-mentioned dry process apparatus, wherein said base is nut.
The trough locating stud using method of above-mentioned dry process apparatus, wherein said is glass substrate by positioning element.
The trough locating stud using method of above-mentioned dry process apparatus, wherein, is provided with four described locating studs in described trough, wherein two are positioned at cornerwise one end of described trough, and two other is positioned at described cornerwise the other end.
Compared with the prior art, beneficial effect of the present invention is:
-reduce the replacing number of times that glass substrate directly contacts component, decrease the expenditure of cost;
-without the overall locating stud of overall pulling down, change rapidly the base of other sizes after only base need being removed, just quick mounting again can utilize, save time, shorten board service time.
Accompanying drawing explanation
Fig. 1 shows the structural representation of the trough locating stud of dry process apparatus in prior art;
Fig. 2 a shows the structural representation in the trough locating stud using method embodiment of the dry process apparatus of the present invention with the locating stud of the first gauge thickness base;
Fig. 2 b shows the structural representation in the trough locating stud using method embodiment of the dry process apparatus of the present invention with the locating stud of the second gauge thickness;
Fig. 2 c shows the structural representation in the trough locating stud using method embodiment of the dry process apparatus of the present invention with the locating stud of the 3rd gauge thickness;
Fig. 3 shows the distribution schematic diagram of locating stud in trough in the trough locating stud using method embodiment of the dry process apparatus of the present invention.
Embodiment
Below in conjunction with schematic diagram and specific operation embodiment, the invention will be further described.
In the trough locating stud using method of the dry process apparatus of the present invention, in each trough, there is some locating studs respectively, shown in composition graphs 2a, locating stud comprises interconnective positioning head 1 and locating column 2, the bottom of locating column 2 is provided with base 3, and base 3 is located in trough, and the outer ring of locating column 2 is surrounded by a circle contact component 4, in test position fix process, contact component 4 surface contacts with by positioning element.Base 3 is separable structure with the bottom of locating column 2, and base 3 is preferably nut, is preferably glass substrate by positioning element.After contact component 4 surface abrasion consumes, surperficial and by the contact position between positioning element to change contact component 4 by the base 3 of changing all locating studs in trough.
As shown in the figure, between base 3 and locating column 2, and between positioning head 1 and locating column 2, be equipped with bearing 5, to play the annexation between fixed base 3 and locating column 2 in mechanical transmission course, reduce the effect of load friction factor.
Base 3 has plurality of specifications, and the base 3 of different size is only thickness difference, and preferably, the thickness value of the base 3 of different size is multiple proportion each other.In a preferred embodiment of the invention, the specification of base 3 has three, be respectively the first specification, the second specification and the 3rd specification, please respectively referring to shown in Fig. 2 a, Fig. 2 b and Fig. 2 c, the second gauge thickness and the 3rd gauge thickness are respectively the twice of the first gauge thickness and three times.Certainly be not limited to multiple proportion herein, allly the design of varied in thickness can be caused to include in embodiments of the present invention.Due to the change of base 3 thickness of locating stud, make the height of locating stud different, then contact component 4 surface and also be there occurs change by the contact position between positioning element.Such as, the locating stud of the locating stud adopting the base of the second gauge thickness and the base adopting the first gauge thickness, from the angle of contact component, the former contact component surface and be positioned at the below of the latter by the contact position between positioning element, adopted the above-mentioned position of the locating stud of the base of the 3rd gauge thickness then to drop on more below, clearly, this is because the padded effect of base causes.Ideally, the highest locating stud contact component utilization ratio be reached, calculate the thickness of base and be necessary by the quantity of the relation between positioning element thickness and base.
Once the degree of wear of the contact component 4 of locating stud is relatively more serious, because base 3 and locating column 2 are separate type, only base 3 are changed during replacing, parts are utilized effectively, save a large amount of man-hour.
It is to be noted, as shown in Figure 3, in embodiments of the present invention, four locating studs 00 are altogether provided with in trough 0, wherein two are positioned at cornerwise one end of trough 0, two other is positioned at cornerwise the other end, and glass substrate (not illustrating in the drawings) is fixed between four locating studs 00, obtains best orientation angle and location dynamics with such distribution mode.
The present invention reduces the replacing number of times that glass substrate directly contacts component, decreases the expenditure of cost, and without overall pulling down locating stud, the base of other gauge thickness is changed rapidly after only its base need being removed, just quick mounting can realize again utilizing, save time, shorten board service time.
Be described in detail specific embodiments of the invention above, but the present invention is not restricted to specific embodiment described above, it is just as example.To those skilled in the art, any equivalent modifications and substitute also all among category of the present invention.Therefore, equalization conversion done without departing from the spirit and scope of the invention and amendment, all should contain within the scope of the invention.

Claims (6)

1. the trough locating stud using method of a dry process apparatus, in each described trough, there is some described locating studs respectively, described locating stud comprises interconnective positioning head and locating column, the bottom of described locating column is provided with base, described base is located in described trough, the outer ring of described locating column is surrounded by a circle contact component, described contact component surface contacts with by positioning element, it is characterized in that, the bottom of described base and described locating column is separable structure, after described contact component surface abrasion consumes, surperficial and described by the contact position between positioning element to change described contact component by the described base changing all described locating stud in described trough, described is glass substrate by positioning element.
2. the trough locating stud using method of dry process apparatus as claimed in claim 1, it is characterized in that, described base has plurality of specifications, and the described base of different size only thickness is different.
3. the trough locating stud using method of dry process apparatus as claimed in claim 2, it is characterized in that, the thickness of the described base of different size is multiple proportion each other.
4. the trough locating stud using method of dry process apparatus as claimed in claim 3, it is characterized in that, described base specification has three, be respectively the first specification, the second specification and the 3rd specification, described second gauge thickness and described 3rd gauge thickness are respectively the twice of described first gauge thickness and three times.
5. as the trough locating stud using method of dry process apparatus as described in any one in Claims 1-4, it is characterized in that, described base is nut.
6. the trough locating stud using method of dry process apparatus as claimed in claim 5, it is characterized in that, be provided with four described locating studs in described trough, wherein two are positioned at cornerwise one end of described trough, and two other is positioned at described cornerwise the other end.
CN201310150860.9A 2013-04-26 2013-04-26 The trough locating stud using method of dry process apparatus Expired - Fee Related CN104121259B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310150860.9A CN104121259B (en) 2013-04-26 2013-04-26 The trough locating stud using method of dry process apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310150860.9A CN104121259B (en) 2013-04-26 2013-04-26 The trough locating stud using method of dry process apparatus

Publications (2)

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CN104121259A CN104121259A (en) 2014-10-29
CN104121259B true CN104121259B (en) 2016-04-20

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Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4293666B2 (en) * 1999-03-04 2009-07-08 株式会社ニフコ Parts mounting clip
GB0007489D0 (en) * 2000-03-29 2000-05-17 Mckechnie Specialist Products Improvements in clip assemblies
FR2904385B1 (en) * 2006-07-25 2008-09-05 Garonne Ets Auriol & Cie STRUCTURAL FIXING METHOD BY BLIND RIVET, BLIND RIVET FOR CARRYING OUT SAME, AND POSITIONING TOOL ADJUSTED TO SUCH A RIVET
CN200988088Y (en) * 2006-12-15 2007-12-12 中国南车集团武昌车辆厂 Guided positioning type sand box
CN201679816U (en) * 2010-02-05 2010-12-22 杨鲁川 Connecting pin

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Address after: 201506, building two, building 100, 1, Jinshan Industrial Road, 208, Shanghai, Jinshan District

Patentee after: Shanghai Hehui optoelectronic Co.,Ltd.

Address before: 201506, building two, building 100, 1, Jinshan Industrial Road, 208, Shanghai, Jinshan District

Patentee before: EverDisplay Optronics (Shanghai) Ltd.

CP01 Change in the name or title of a patent holder
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160420

CF01 Termination of patent right due to non-payment of annual fee