CN104048812B - A kind of effect experiment device of Continuous high-energy laser illuminated optical element - Google Patents

A kind of effect experiment device of Continuous high-energy laser illuminated optical element Download PDF

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CN104048812B
CN104048812B CN201410216001.XA CN201410216001A CN104048812B CN 104048812 B CN104048812 B CN 104048812B CN 201410216001 A CN201410216001 A CN 201410216001A CN 104048812 B CN104048812 B CN 104048812B
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optical element
energy laser
continuous high
experiment device
program control
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CN104048812A (en
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林新伟
周孟莲
程德艳
王立君
冯国斌
冯刚
韦成华
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Northwest Institute of Nuclear Technology
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Northwest Institute of Nuclear Technology
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Abstract

The invention discloses a kind of Continuous high-energy laser illuminated optical element effect experiment device, comprise rotating mirror, program control turntable, diffuse reflection screen, signal record and lock unit, some optical slots and some completely reflecting mirrors; Rotating mirror is fixed on program control turntable, realizes the automatic control of the catoptron anglec of rotation and speed; Some optical slots are arranged on the circular arc centered by program control turntable rotating shaft, and every slit is wherein just to the rotating shaft of program control turntable, and optical element one_to_one corresponding is arranged on the exit of optical slot; Present invention achieves high-energy laser multiple sample of bright dipping timesharing irradiation, substantially increase the service efficiency of high-energy laser, control the time of light beam irradiation to optical element by the rotational speed of rotating mirror simultaneously, achieve the accurate control of effect exposure time, thus in selecting high-energy laser to export, experiment is carried out in the interval of power stability, ensure that the validity of experiment.

Description

A kind of effect experiment device of Continuous high-energy laser illuminated optical element
Technical field
The present invention relates to a kind of Continuous high-energy laser illuminated optical element effect experiment device, especially a kind of experimental provision obtaining optical element damage probability and damage threshold under Continuous high-energy laser short time irradiation.
Background technology
When Optical element laser irradiating effects, need goal in research object in the superlaser short time (10 -5s ~ 10 -1s) damage probability under irradiation and threshold value.But because high energy laser system is complicated, being difficult to realize the accurate short time goes out photocontrol, have that single bright dipping cost is high simultaneously, the problem such as power stability difference in bright dipping, the conventional experiment of bright dipping one to one also exists that efficiency is low, high in cost of production problem, limits carrying out of optical element effect experiment in enormous quantities.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of effect experiment device of Continuous high-energy laser illuminated optical element, can be used for obtaining the damage threshold of optical element under short time superlaser irradiation to measure, this device once can test the multiple sample of irradiation, simultaneously by the adjustment to trigger delay time, select higher, the more stable interval of high-energy laser light power to carry out experiment, substantially increase the service efficiency of high-energy laser.
For solving the problems of the technologies described above, the technical scheme of the present invention's design is as follows:
An effect experiment device for Continuous high-energy laser illuminated optical element, comprises laser parameter monitoring means, rotating mirror, program control turntable, diffuse reflection screen, signal record and synchronous trigger element, some graphite slits and some completely reflecting mirrors;
Described rotating mirror is fixed on program control turntable;
Some described optical slots are arranged on the circular arc centered by program control turntable rotating shaft, every optical slot is wherein just to the rotating shaft of program control turntable, the exit one_to_one corresponding of each optical slot is provided with optical element sample, some described completely reflecting mirror one_to_one corresponding are arranged on superlaser through in the light path of optical element sample, and are reflexed to by transmitted light on diffuse reflection screen;
Described parameter monitoring unit comprises laser energy meter, P-t(power changes in time) curve survey meter;
Described signal record and trigger element comprise trigger, photodetector and oscillograph; Described P-t curve survey meter has two output terminals, and an output terminal connects trigger, and an output terminal connects oscillograph; Described photodetector is just arranged diffuse reflection screen, and its output terminal connects another passage oscillographic; Described flipflop input terminal connects an output terminal of P-t curve survey meter, and the output terminal of trigger connects program control turntable controller, and trigger has the function regulating trigger delay time.
In the effect experiment device of above-mentioned Continuous high-energy laser illuminated optical element, parameter monitoring unit also comprises one-level beam splitter and secondary beam splitter, superlaser is divided into strong beam and low light level bundle by described one-level beam splitter, wherein strong beam is incident to rotating mirror, low light level bundle is incident to secondary beam splitter, and being divided into two-way again through secondary beam splitter, a road enters energy meter, and another road enters P-t curve survey meter.
In the effect experiment device of above-mentioned Continuous high-energy laser illuminated optical element, the light path between rotating mirror and one-level beam splitter is provided with focal length convergent lens.
In the effect experiment device of above-mentioned Continuous high-energy laser illuminated optical element, the light path between rotating mirror and optical slot is provided with attenuator.
In the effect experiment device of above-mentioned Continuous high-energy laser illuminated optical element, optical slot is made up of graphite, and its width can regulate.
In the effect experiment device of above-mentioned Continuous high-energy laser illuminated optical element, absorb block in the starting point of superlaser rotation sweep and the equal placing graphite of terminating point.
In the effect experiment device of above-mentioned Continuous high-energy laser illuminated optical element, optical element is dielectric thin-film material.
The present invention has following beneficial effect:
1, present invention achieves high-energy laser multiple sample of bright dipping timesharing irradiation, substantially increase the service efficiency of high-energy laser, save experimental expenses.
2, the present invention controls the time of light beam irradiation to optical element by the rotational speed of rotating mirror, achieve the accurate control of effect exposure time, utilize signal record and the rotational instant of trigger element to program control turntable to control simultaneously, thus experiment is carried out in the interval that in selecting high-energy laser to export, power is higher, more stable, ensure that the validity of experiment.
Accompanying drawing and explanation
Fig. 1 is Continuous high-energy laser illuminated optical element effect experiment device schematic diagram of the present invention;
Fig. 2 is that detector measurement laser instrument of the present invention exports P-t(power and changes in time) curve and the scanning of non-delayed trigger time irradiation each sample moment schematic diagram;
Fig. 3 is that detector measurement laser instrument of the present invention exports P-t(power and changes in time) curve and delayed trigger scanning time irradiation each sample moment schematic diagram.
Reference numeral is as follows: the incident superlaser of 1-; 2-one-level beam splitter; 3-secondary beam splitter; 4-energy meter; 5-P-t curve survey meter; 6-trigger; 7-oscillograph; 8-focal length convergent lens; The program control turntable of 9-; 10-rotating mirror; 11-attenuator; 12-optical slot; 13-optical element sample; 14-graphite absorbs block; 15-total reflective mirror; 16-diffuse reflection is shielded; 17-photodetector.
Embodiment
As shown in Figure 1, the effect experiment device of Continuous high-energy laser illuminated optical element of the present invention, comprises laser parameter monitoring means, rotating mirror 10, program control turntable 9, diffuse reflection screen 16, signal record and synchronous trigger element, optical slot 12 that some graphite is made and some completely reflecting mirrors 15;
Rotating mirror 10 is fixed on program control turntable 9, automatically controls by software.This program control turntable 9 can set start angle, termination point, the velocity of rotation of rotation, and has external trigger function, can be triggered rotate by outside Transistor-Transistor Logic level signal.
Some optical slots 12 are arranged on the circular arc centered by the rotating shaft of program control turntable 9, every slit is wherein just to the rotating shaft of program control turntable 9, measured optical element 13 one_to_one corresponding is arranged on the exit of optical slot 12, some completely reflecting mirror 15 one_to_one corresponding are arranged in the light path of superlaser through optical element 13, and are reflexed to by the transmitted light from measured optical element 13 on diffuse reflection screen 16; And just the photodetector 17 of diffuse reflection screen 16 is being received, for determining the moment of each sample Stimulated Light irradiation by one.
Parameter monitoring unit also comprises one-level beam splitter 2, secondary beam splitter 3, laser energy meter 4 and P-t curve survey meter 5, superlaser is divided into strong beam and low light level bundle by one-level beam splitter 2, wherein strong beam is incident to rotating mirror 10, for irradiation print, low light level bundle is incident to secondary beam splitter 3, and be divided into again more by force through secondary beam splitter 3, two more weak bundles.Wherein, stronger laser energy meter 4 is collected and is measured, and in conjunction with the measurement of beam splitter splitting ratio, can monitor the gross energy of irradiation laser; More weak light P-t curve survey meter 5 is collected and is measured.P-t curve survey meter 5 output signal is divided into two-way, and a route oscillograph 7 gathers, and another road is as trigger 6 input signal.Trigger 6 outputs signal as standard Transistor-Transistor Logic level signal, for triggering the rotation of program control turntable 9; This Transistor-Transistor Logic level can carry out delay adjustments, rotates for controlling program control turntable 9 time delay.
Signal record and trigger element comprise trigger 6, photodetector 17 and oscillograph 7; Wherein P-t curve survey meter 5 has two output terminals, and an output terminal connects trigger 6, output terminal and connects oscillograph 7; The output terminal of photodetector 17 connects another passage of oscillograph 7; Trigger 6 input end connects an output terminal of P-t curve survey meter 5, and the output terminal of trigger 6 connects the controller of program control turntable 9, and trigger 6 has the function regulating trigger delay time.
Fig. 2, when not having delayed trigger, measures the moment schematic diagram that the laser instrument obtained exports P-t curve and laser irradiation each sample; Fig. 3, for after having a mind to be provided with delayed trigger, measures the moment schematic diagram that the laser instrument obtained exports P-t curve and laser irradiation each sample.Therefrom can finding out, by selecting the rational delayed trigger time, laser irradiation can be controlled to the moment on measured sample, thus select the Laser output power more stable moment to carry out effect experiment, guarantee the reliability of testing.
In Fig. 1, example depicts 6 samples, and specific experiment needs according to actual needs and each equipment performance index designs.Sample arrangement with rotating mirror 10 reflection spot for the center of circle circumferentially, equidistantly distribute.At starting point and the terminating point of laser rotary scanning, equal placing graphite absorbs block 14, prevents the destruction that bright dipping causes.The width of optical slot 12 can regulate, and limits the scope of laser irradiation on sample.In each irradiation light path, place the attenuator 11 of different multiplying as required, in order to regulate the irradiation laser power of expection.By regulating the rotational speed of turntable, the exposure time of laser on laboratory sample can be regulated.Simultaneously according to the needs of optical power density parameter, in high light light path, place focal length lens 8, light beam is focused on, improve irradiation laser power density.
Before experiment, first need measure the saturating inverse ratio k of one-level beam splitter 2, secondary beam splitter 3 1, k 2, the transmitance T of focal length convergent lens, and the transmitance t of each attenuator i(i=1,2 ... 6).
If the monitoring power entering P-t curve (relatively) measuring instrument is P m, the record result of P-t curve (relatively) measuring instrument is V m, then have
P m=ηV m(1)
(1) in formula, η is scale-up factor.
If the laser energy that energy meter records is E, then have
E = 1 k 2 · ∫ P m dt = η k 2 ∫ V m dt - - - ( 2 )
Scale-up factor η can be calculated according to (2) formula, thus calculate monitoring power P according to (1) formula m.Afterwards, then according to the output signal of photodetector, the monitoring power P in irradiation each optical element sample moment can be obtained mi(i=1,2 ... 6).Then the power P of irradiation to each sample can be calculated according to the parameter of each optical element irai(i=1,2 ... 6).
P irai = P mi · ( 1 + 1 k 2 ) · 1 k 1 · T · t i - - - ( 3 )
Above-mentioned experimental technique to be succeeded application in the laser irradiating effects experiment of dielectric thin-film material.Utilize the method can obtain the experimental result of 6 different capacity points with time Laser Experiments, provide Data support for the damage from laser probability of certain membraneous material and damage threshold obtain, substantially increase the efficiency of effect experiment.

Claims (8)

1. an effect experiment device for Continuous high-energy laser illuminated optical element, is characterized in that: comprise laser parameter monitoring means, rotating mirror (10), program control turntable (9), diffuse reflection screen (16), signal record and lock unit, some optical slots (12) and some completely reflecting mirrors (15);
Described rotating mirror (10) is fixed on program control turntable (9);
Described some optical slots (12) are arranged on the circular arc centered by program control turntable (9) rotating shaft, every optical slot (12) is wherein just to the rotating shaft of program control turntable (9), the exit one_to_one corresponding of each optical slot (12) is provided with optical element sample (13), described some completely reflecting mirrors (15) one_to_one corresponding is arranged in the light path of superlaser (1) through optical element sample (13), and is reflexed to by transmitted light in diffuse reflection screen (16);
Described parameter monitoring unit comprises the energy meter (4) and P-t curve survey meter (5) of monitoring for laser parameter;
Described signal record and lock unit comprise oscillograph (7), photodetector (17) and trigger (6), described photodetector (17) is just arranged diffuse reflection screen (16), the output terminal of described photodetector (17) and the output terminal of P-t curve survey meter (5) connect the different passages of oscillograph (7) respectively, another output terminal of described trigger (6) input termination P-t curve survey meter (5), the controller of the program control turntable of output termination (9) of trigger (6); Wherein P is laser power, and t is the bright dipping time.
2. the effect experiment device of Continuous high-energy laser illuminated optical element according to claim 1, it is characterized in that: described parameter monitoring unit also comprises one-level beam splitter (2) and secondary beam splitter (3), superlaser (1) is divided into strong beam and low light level bundle by described one-level beam splitter (2), wherein strong beam is incident to rotating mirror (10), low light level bundle is incident to secondary beam splitter (3), and be divided into two-way again through secondary beam splitter (3), one tunnel enters energy meter (4), another road enters P-t curve survey meter (5).
3. the effect experiment device of Continuous high-energy laser illuminated optical element according to claim 2, is characterized in that: the light path between described rotating mirror (10) and one-level beam splitter (2) is provided with long-focus convergent lens (8).
4. the effect experiment device of Continuous high-energy laser illuminated optical element according to claim 1, is characterized in that: the light path between described rotating mirror (10) and optical slot (12) is provided with attenuator (11).
5. the effect experiment device of the Continuous high-energy laser illuminated optical element according to claim 1 or 4, is characterized in that: described optical slot (12) is made up of graphite.
6. the effect experiment device of Continuous high-energy laser illuminated optical element according to claim 5, is characterized in that: described optical slot (12) width-adjustable joint.
7. the effect experiment device of Continuous high-energy laser illuminated optical element according to claim 1, is characterized in that: absorb block (14) in the starting point of superlaser (1) rotation sweep and the equal placing graphite of terminating point.
8. the effect experiment device of Continuous high-energy laser illuminated optical element according to claim 1, is characterized in that: described optical element sample (13) is dielectric thin-film material.
CN201410216001.XA 2014-05-21 2014-05-21 A kind of effect experiment device of Continuous high-energy laser illuminated optical element Expired - Fee Related CN104048812B (en)

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CN107677366A (en) * 2017-09-27 2018-02-09 中国科学院合肥物质科学研究院 A kind of irradiance meter observation system of Larger Dynamic scope
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103226057A (en) * 2013-03-27 2013-07-31 同济大学 Multifunctional high-efficiency laser damage test device and method in vacuum environment
CN103542942A (en) * 2013-10-16 2014-01-29 西北核技术研究所 Time-sharing measuring method and device of multipath single-pulse laser parameters

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Publication number Priority date Publication date Assignee Title
JP3009070B2 (en) * 1991-04-26 2000-02-14 日本電産コパル電子株式会社 Optical scanning measurement device and measurement method
JP2003254862A (en) * 2002-03-04 2003-09-10 Canon Inc Optical-characteristic measuring apparatus and method therefor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103226057A (en) * 2013-03-27 2013-07-31 同济大学 Multifunctional high-efficiency laser damage test device and method in vacuum environment
CN103542942A (en) * 2013-10-16 2014-01-29 西北核技术研究所 Time-sharing measuring method and device of multipath single-pulse laser parameters

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
CCD中激光光斑的全饱和单侧拖尾现象;张震等;《强激光与粒子束》;20130630;第25卷(第6期);全文 *

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