CN104035848A - Automatic VPX testing system - Google Patents

Automatic VPX testing system Download PDF

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Publication number
CN104035848A
CN104035848A CN201410273957.3A CN201410273957A CN104035848A CN 104035848 A CN104035848 A CN 104035848A CN 201410273957 A CN201410273957 A CN 201410273957A CN 104035848 A CN104035848 A CN 104035848A
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CN
China
Prior art keywords
vpx
board
testing
low temperature
automatic
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201410273957.3A
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Chinese (zh)
Inventor
琚炎松
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Shanghai Wei Gu Information Technology Co Ltd
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Shanghai Wei Gu Information Technology Co Ltd
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Application filed by Shanghai Wei Gu Information Technology Co Ltd filed Critical Shanghai Wei Gu Information Technology Co Ltd
Priority to CN201410273957.3A priority Critical patent/CN104035848A/en
Publication of CN104035848A publication Critical patent/CN104035848A/en
Pending legal-status Critical Current

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Abstract

The invention relates to an automatic VPX testing system, in particular to performance testing and high temperature and low temperature testing of various types of VPX board cards. The automatic VPX testing system consists of a high temperature and low temperature box, a testing case, a VPX system board (exchange board) adapter board, a VPX power adapter board, an adapter back plate in the high temperature and low temperature box and an adapter back plate in the testing case. By using the automatic VPX testing system, the various types of VPX board cards can be subjected to independent performance testing and high temperature and low temperature testing, and accurate data parameters of the board cards which run at different environment temperatures can be measured. The existing VPX system platform only can be tested integrally, and a board card of the existing VPX system platform cannot be tested independently, so that performance parameters and high temperature and low temperature data of the board card cannot be acquired. By using the automatic VPX testing system, the requirements on performance testing and high temperature and low temperature testing of VPX board cards in the industry can be met.

Description

VPX automatization test system
Technical field
The present invention relates to VPX automatization test system, relate in particular to performance and the high low-temperature test of all types of boards of VPX, this VPX automatization test system provides the performance test of VPX board specialty, the VPX application industry of Aviation, carrier-borne, radar, sonar, video image processing, military solid-state storage, and VPX board manufacturer.
Background technology
VPX bus is that VITA (VME International Trade Association, VME international trade association) is organized in the high-speed serial bus standard of new generation proposing on its VME bus basis for 2007.The particular contents such as fundamental norms, physical construction and the bus signals of VPX bus all define in ANSI/VITA46 series technique specification.
VPX bus is the natural evolution of VME technology, and it is its main variation that VPX adopts high-speed serial bus to substitute parallel bus.The current up-to-date serial bus technology of VPX bus support, for example: the universal serial bus of the height such as Rapid IO, PCI-Express and 10G Ethernet.
These high speed serialization exchanges can provide the data transmission rate of each differential pair 250MBytes/sec.If 4 channels Theoretical Rate of the highest 1GBytes/sec.The core exchange of VPX provides 32 groups of differential pairs, forms 44 channeling ports, and each channel is two-way (a pair of transmission difference, a pair of reception difference).The theoretical aggregate bandwidth of VPX module is 8GB/sec.
In order to meet in national defence and aviation field the requirement of VPX system reliability, existing VPX system platform system test cannot ensure validity and the authority of its test result, because of cannot be to board in system, carries out independent performance and high low-temperature test.
I take charge of the VPX automatization test system of independent development, in such technical background and market demand environment, develop.
Summary of the invention
The technical problem to be solved in the present invention is to the various VPX boards based on VPX bus architecture, provides performance and high low-temperature test to it.
VPX automatization test system of the present invention, formed by parts such as high-low temperature chamber, test cabinet, system board (power board) card extender, VPX power supply backplane, high-low temperature chamber entodorsum, test cabinet entodorsums, this VPX automated test device can carry out performance and high low-temperature test to all types of VPX boards, be characterized in: this VPX automatization test system can be supported two kinds of physical constructions conduction cooling board structure and ventilation panel card structure.
This VPX automatization test system is also equipped with VPX power source special to system power supply.
This VPX automatization test system can meet 0.8 ", 0.85 ", 1 " the test board of three kinds of specification height dimensions.
Because VPX automatization test system can carry out independent performance and high low-temperature test to each board in VPX system, can measure board in the operating accurate data parameter of various environment temperatures.And existing VPX system can only be carried out system test and can not separately its board be tested, so cannot obtain performance parameter and the high low temperature data of board.VPX automatization test system has solved the testing requirement to VPX board performance and high low temperature in industry.
Brief description of the drawings
Fig. 1 is the system architecture block diagram of VPX automatization test system of the present invention.
Fig. 2 is the back board structure schematic diagram of VPX automatization test system of the present invention.
Fig. 3 is the system architecture schematic diagram of VPX automatization test system of the present invention.
Fig. 4 is the electric power-feeding structure schematic diagram of VPX automatization test system of the present invention.
Embodiment
Now in conjunction with the accompanying drawings and embodiments the present invention is described in further detail.
VPX automatization test system of the present invention, be made up of test cabinet 1, high-low temperature chamber 2, system (exchange) plate card extender 3, VPX power supply backplane 4, test incubator 1 comprises that test box entodorsum (band VPX power supply proceeds to terminal) 1.1, system (exchange) plate 1.2, VPX power supply input bus-bar 1.3, high-low temperature chamber 2 comprise high-low temperature chamber entodorsum 2.1, user test functional cards 2.2.
VPX automatization test system of the present invention, whole system operation framework all adopts Tyco Mult i Gig RT2 and Multi Beam XLE connector, realize communicating by letter and transmission between signal by the substitute mode of pcb board and pcb board, optimized so on the one hand internal system plate to aerial lug when signal transmission between plate, also reduced between plate between the distance of cabling.Shorten the distance of plate to signal transmission between plate by docking such connected mode between plate on the other hand, also firmer, stable above physical construction, greatly improve performance and the ambient adaptability of test macro.
The core exchange of VPX automatization test system provides 32 groups of differential pairs, can reach 8GB/sec channel bandwidth, follows VITA46.0 standard completely.
What VPX automatization test system adopted is the power supply of VPX power source special, and the power of the mono-groove 384W of 3U VPX and the power of the mono-groove 768W of 6U VPX can be provided.Meet the high-power power requirement of VPX board.
By above implementation process, absolutely prove that VPX automatization test system has adopted advanced technology and innovation.
The above is only preferred embodiment of the present invention, not the present invention is done to any pro forma restriction, although the present invention discloses as above with preferred embodiment, but not in order to limit the present invention, any those skilled in the art, not departing from the scope of technical solution of the present invention, when can utilizing the technology contents of above-mentioned announcement to make a little change or being modified to the equivalent embodiment of equivalent variations, in every case be the content that does not depart from technical solution of the present invention, the any simple amendment of above embodiment being done according to technical spirit of the present invention, equivalent variations and modification, all still belong in the scope of technical solution of the present invention.

Claims (3)

1.VPX automatization test system is made up of high-low temperature chamber, test cabinet, VPX system board (power board) card extender, incubator entodorsum, test cabinet entodorsum.
2. VPX automatization test system as claimed in claim 1, is characterized in that: VPX automatization test system can carry out independent performance and high low-temperature test to each board in VPX system.
3. VPX automatization test system as claimed in claim 1 or 2, is characterized in that: VPX automatization test system adopts special VPX Power supply.
CN201410273957.3A 2014-06-14 2014-06-14 Automatic VPX testing system Pending CN104035848A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410273957.3A CN104035848A (en) 2014-06-14 2014-06-14 Automatic VPX testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410273957.3A CN104035848A (en) 2014-06-14 2014-06-14 Automatic VPX testing system

Publications (1)

Publication Number Publication Date
CN104035848A true CN104035848A (en) 2014-09-10

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CN (1) CN104035848A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106507631A (en) * 2016-08-03 2017-03-15 北京电子工程总体研究所 A kind of interconnection integrating device for test system
CN109656770A (en) * 2018-12-27 2019-04-19 中国电子科技集团公司第三十研究所 A kind of passive series lane testing circuit board of VPX bus
CN112987701A (en) * 2021-04-27 2021-06-18 湖南博匠信息科技有限公司 VPX system-based IPMC remote control debugging method and system
CN115753176A (en) * 2023-01-09 2023-03-07 湖南博匠信息科技有限公司 VPX equipment liquid cooling parameter testing method and system

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106507631A (en) * 2016-08-03 2017-03-15 北京电子工程总体研究所 A kind of interconnection integrating device for test system
CN109656770A (en) * 2018-12-27 2019-04-19 中国电子科技集团公司第三十研究所 A kind of passive series lane testing circuit board of VPX bus
CN109656770B (en) * 2018-12-27 2022-03-18 中国电子科技集团公司第三十研究所 VPX bus passive serial channel test circuit board
CN112987701A (en) * 2021-04-27 2021-06-18 湖南博匠信息科技有限公司 VPX system-based IPMC remote control debugging method and system
CN112987701B (en) * 2021-04-27 2021-09-14 湖南博匠信息科技有限公司 VPX system-based IPMC remote control debugging method and system
CN115753176A (en) * 2023-01-09 2023-03-07 湖南博匠信息科技有限公司 VPX equipment liquid cooling parameter testing method and system

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Application publication date: 20140910