CN108922576A - The voltage control system for drawing test is pressed for enterprise-level solid state hard disk - Google Patents

The voltage control system for drawing test is pressed for enterprise-level solid state hard disk Download PDF

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Publication number
CN108922576A
CN108922576A CN201810688008.XA CN201810688008A CN108922576A CN 108922576 A CN108922576 A CN 108922576A CN 201810688008 A CN201810688008 A CN 201810688008A CN 108922576 A CN108922576 A CN 108922576A
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CN
China
Prior art keywords
hard disk
control module
solid state
enterprise
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201810688008.XA
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Chinese (zh)
Inventor
江强
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Bront Semiconductor Storage Technology Co Ltd
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Suzhou Bront Semiconductor Storage Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Bront Semiconductor Storage Technology Co Ltd filed Critical Suzhou Bront Semiconductor Storage Technology Co Ltd
Priority to CN201810688008.XA priority Critical patent/CN108922576A/en
Publication of CN108922576A publication Critical patent/CN108922576A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016Apparatus features

Abstract

The invention discloses the voltage control systems that test is drawn for enterprise-level solid state hard disk pressure, including main control module, input control module, output control module, power management module, the present invention uses the dynamic quick response voltage compensating method for enterprise-level solid state hard disk working characteristics, precisely dynamic compensation is carried out to enterprise-level solid state hard disk supply voltage to realize, to reach the demand that enterprise-level solid state hard disk pressure draws testing standard.Avoid enterprise-level solid state hard disk, especially enterprise-level is M.2 in solid state hard disk test process, because of its high power consumption feature, cause the loss of its 3.3V input voltage especially high, even up to 5% voltage loss, further because this loss leads to Devices to test powered-off fault, the test crash eventually led to when doing low pressure pressure drawing test.

Description

The voltage control system for drawing test is pressed for enterprise-level solid state hard disk
Technical field
The present invention relates to field of data storage, specially draw the voltage of test to control system for enterprise-level solid state hard disk pressure System.
Background technique
Solid state hard disk(Solid State Drives), referred to as consolidate disk, solid state hard disk(Solid State Drive)With admittedly State electronic store chip array and manufactured hard disk, by control unit and storage unit(FLASH chip, dram chip)Composition. Solid state hard disk is identical with common hard disc in the specification and definition, function and application method of interface, in product shape and It is also completely consistent with common hard disc in size.It is widely used in military, vehicle-mounted, industry control, video monitoring, network monitoring, network The fields such as terminal, electric power, medical treatment, aviation, navigation equipment.With the update of storage product, solid state hard disk is unique by it Advantage increasingly by the favor of all trades and professions, the problem of market is increasing, production capacity, cost and reliability, is increasingly prominent. When the demand in market is growing, production capacity how is improved, save the cost guarantees that quality has become solid state hard disk Industry Quick Development Bottleneck.
The large capacity and interface diversity requirement developed increasingly for hard disk industry, currently without the solution party of complete set Case, it is only some single, simply, coarse power-on and power-off and simulated experiment.
Summary of the invention
The object of the invention is that solve the above-mentioned problems and provide one kind be related to SAS hard disk communication, voltage control, What data transmission etc. combined, mainly for the reliability test difficult problem in the mass production of enterprise-level SAS hard disk, pass through The quick response for design of making rational planning for, accurate dynamic electric voltage loss balancing, for the newest enterprise-level solid state hard disk standard of industry into The optimization of row specific aim is able to carry out the voltage control system that test is drawn for enterprise-level solid state hard disk pressure that accurate pressure draws test.
The present invention is achieved through the following technical solutions above-mentioned purpose,
The voltage control system for drawing test, including main control module, input control module, output control are pressed for enterprise-level solid state hard disk Molding block, power management module, it is characterised in that main control module controls at all data inputs, output and various signals Reason, input control module manage high-speed data and power good, safe transmission, routing addressing, output control module management high speed Data and power good, safe transmission, data Route Selection, power management module are the chip of hard disk to be tested, main control module And the chip and component of component, input control module, the chip of output control module and component provide power supply, master control mould Block monitors the state of unit real-time monitoring hard disk to be tested in real time by built-in, and is led to by USB and hard disk to be tested SAS/SATA signal is transferred to hard disk to be tested from host computer, is reached by news control, main control module by mini SAS connector The purpose of data exchange is connected between output control module and hard disk to be tested using rs 232 serial interface signal, the power management module Voltage channel is opened/closed by controlling chip switch transistor, to realize the power-on and power-off of hard disk to be tested, while each test Channel all devises voltage and current sampling A/D chip, and to read real-time voltage current status, each test is by being provided with Channel detects automatically, hard disk test status display device, temperature sensor, temperature control device.The main control module control Various signal processings include but is not limited to voltage, electric current, temperature, fan.String between output control module and hard disk to be tested Message number connection is realized by 4 copper needles.The channel detects whether activate by LED sense channel automatically, and passes through hard disk Test mode display device is shown.The temperature sensor mainly monitors hard disk temperature to be tested, and feeds back to the temperature Control device is spent, temperature control device passes through control rotation speed of the fan again and realizes the temperature control for treating testing hard disk.
The present invention uses the dynamic quick response voltage compensating method for enterprise-level solid state hard disk working characteristics, to realize It carries out precisely dynamic to enterprise-level solid state hard disk supply voltage to compensate, so that reaching enterprise-level solid state hard disk pressure draws testing standard Demand.Enterprise-level solid state hard disk, especially enterprise-level are avoided M.2 in solid state hard disk test process, because of its high power consumption feature, Cause its 3.3V input voltage loss it is especially high, even up to 5% voltage loss, further because it is this loss do it is low When pressure pressure draws test, lead to Devices to test powered-off fault, the test crash eventually led to.
Specific embodiment
The technical solution in the present invention is clearly and completely described combined with specific embodiments below, it is clear that described Embodiment be only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, ability Domain those of ordinary skill every other embodiment obtained without making creative work, belongs to guarantor of the present invention The range of shield.
Press the voltage control system for drawing test for enterprise-level solid state hard disk, including main control module, input control module, defeated Control module, power management module out, the main control module control all data inputs, output and voltage, electric current, temperature Degree, fan signal processing, input control module manage high-speed data and power good, safe transmission, routing addressing, output control Module management high-speed data and power good, safe transmission, data Route Selection, power management module are hard disk to be tested, master The chip and component, the chip of input control module and component, the chip of output control module and component for controlling module mention Power supply source, main control module by the state of built-in real time monitoring unit real-time monitoring hard disk to be tested, and by USB with it is to be measured Try hard disk and carry out Communication Control, main control module by mini SAS connector, by SAS/SATA signal from host computer be transferred to Testing hard disk achievees the purpose that data exchange, is connected between output control module and hard disk to be tested using rs 232 serial interface signal, described Power management module opens/closes voltage channel by controlling chip switch transistor, to realize the power-on and power-off of hard disk to be tested, Each TCH test channel devises voltage and current sampling A/D chip simultaneously, to read real-time voltage current status, each test It is detected automatically by being provided with channel, hard disk test status display device, temperature sensor, temperature control device.
The present invention uses the dynamic quick response voltage compensating method for enterprise-level solid state hard disk working characteristics, to realize It carries out precisely dynamic to enterprise-level solid state hard disk supply voltage to compensate, so that reaching enterprise-level solid state hard disk pressure draws testing standard Demand.Enterprise-level solid state hard disk, especially enterprise-level are avoided M.2 in solid state hard disk test process, because of its high power consumption feature, Cause its 3.3V input voltage loss it is especially high, even up to 5% voltage loss, further because it is this loss do it is low When pressure pressure draws test, lead to Devices to test powered-off fault, the test crash eventually led to.
It is obvious to a person skilled in the art that invention is not limited to the details of the above exemplary embodiments, Er Qie In the case where without departing substantially from spirit or essential attributes of the invention, the present invention can be realized in other specific forms.Therefore, no matter From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the present invention is by appended power Benefit requires rather than above description limits, it is intended that all by what is fallen within the meaning and scope of the equivalent elements of the claims Variation is included within the present invention.
In addition, it should be understood that although this specification is described in terms of embodiments, but not each embodiment is only wrapped Containing an independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should It considers the specification as a whole, the technical solutions in the various embodiments may also be suitably combined, forms those skilled in the art The other embodiments being understood that.

Claims (5)

1. drawing the voltage control system of test, including main control module, input control module, output for enterprise-level solid state hard disk pressure Control module, power management module, it is characterised in that main control module controls all data input, output and various signals Processing, input control module manage high-speed data and power good, safe transmission, routing addressing, and output control module management is high Fast data and power good, safe transmission, data Route Selection, power management module are the core of hard disk to be tested, main control module Piece and component, the chip of input control module and component, the chip of output control module and component provide power supply, master control Module is carried out by the built-in state for monitoring unit real-time monitoring hard disk to be tested in real time, and by USB and hard disk to be tested SAS/SATA signal is transferred to hard disk to be tested from host computer, is reached by Communication Control, main control module by mini SAS connector To the purpose of data exchange, connected between output control module and hard disk to be tested using rs 232 serial interface signal, the power management mould Block opens/closes voltage channel by controlling chip switch transistor, to realize the power-on and power-off of hard disk to be tested, while each survey It pings and all devises voltage and current sampling A/D chip, to read real-time voltage current status, each test is by being respectively provided with There is channel to detect automatically, hard disk test status display device, temperature sensor, temperature control device.
2. the voltage control system according to claim 1 for drawing test for enterprise-level solid state hard disk pressure, it is characterised in that The various signal processings of the main control module control include but is not limited to voltage, electric current, temperature, fan.
3. the voltage control system according to claim 1 for drawing test for enterprise-level solid state hard disk pressure, it is characterised in that Rs 232 serial interface signal connection between output control module and hard disk to be tested is realized by 4 copper needles.
4. the voltage control system according to claim 1 for drawing test for enterprise-level solid state hard disk pressure, it is characterised in that The channel detects whether activate by LED sense channel automatically, and is shown by hard disk test status display device.
5. the voltage control system according to claim 1 for drawing test for enterprise-level solid state hard disk pressure, it is characterised in that The temperature sensor mainly monitors hard disk temperature to be tested, and feeds back to the temperature control device, and temperature control device is again The temperature control for treating testing hard disk is realized by control rotation speed of the fan.
CN201810688008.XA 2018-06-28 2018-06-28 The voltage control system for drawing test is pressed for enterprise-level solid state hard disk Pending CN108922576A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810688008.XA CN108922576A (en) 2018-06-28 2018-06-28 The voltage control system for drawing test is pressed for enterprise-level solid state hard disk

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810688008.XA CN108922576A (en) 2018-06-28 2018-06-28 The voltage control system for drawing test is pressed for enterprise-level solid state hard disk

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111983301A (en) * 2020-08-07 2020-11-24 苏州浪潮智能科技有限公司 Solid state disk testing arrangement
CN117234313A (en) * 2023-09-14 2023-12-15 苏州德伽存储科技有限公司 Power supply control device, method and storage medium for solid state disk power supply test

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101017472A (en) * 2007-03-01 2007-08-15 华为技术有限公司 Hard disk hot swap system in multiple hard disks system and method
CN101169682A (en) * 2006-10-27 2008-04-30 环达电脑(上海)有限公司 Hard disk hot-plug support system
CN101639510A (en) * 2009-08-17 2010-02-03 中兴通讯股份有限公司 Hardware quadrangular test method and system
CN106227309A (en) * 2016-07-26 2016-12-14 深圳市金泰克半导体有限公司 A kind of PCIE interface solid hard disk with heat sinking function and its implementation
CN107658982A (en) * 2017-10-09 2018-02-02 松日电气有限公司 A kind of electrical power distribution integrated management system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101169682A (en) * 2006-10-27 2008-04-30 环达电脑(上海)有限公司 Hard disk hot-plug support system
CN101017472A (en) * 2007-03-01 2007-08-15 华为技术有限公司 Hard disk hot swap system in multiple hard disks system and method
CN101639510A (en) * 2009-08-17 2010-02-03 中兴通讯股份有限公司 Hardware quadrangular test method and system
CN106227309A (en) * 2016-07-26 2016-12-14 深圳市金泰克半导体有限公司 A kind of PCIE interface solid hard disk with heat sinking function and its implementation
CN107658982A (en) * 2017-10-09 2018-02-02 松日电气有限公司 A kind of electrical power distribution integrated management system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111983301A (en) * 2020-08-07 2020-11-24 苏州浪潮智能科技有限公司 Solid state disk testing arrangement
CN111983301B (en) * 2020-08-07 2022-06-03 苏州浪潮智能科技有限公司 Solid state disk testing arrangement
CN117234313A (en) * 2023-09-14 2023-12-15 苏州德伽存储科技有限公司 Power supply control device, method and storage medium for solid state disk power supply test

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Application publication date: 20181130