CN104020369A - Testing device and testing method for photon upconverter frequency response - Google Patents
Testing device and testing method for photon upconverter frequency response Download PDFInfo
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- CN104020369A CN104020369A CN201410200421.9A CN201410200421A CN104020369A CN 104020369 A CN104020369 A CN 104020369A CN 201410200421 A CN201410200421 A CN 201410200421A CN 104020369 A CN104020369 A CN 104020369A
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Abstract
A testing device for a photon upconverter frequency response comprises a computer control module, an optical pulse generating module, a voltage-stabilized source, a photon upconverter, a photoelectric detector and a sampling oscilloscope. The input end of the optical pulse generating module is connected with one output end of the computer control module. The input end of the voltage-stabilized source is connected with the other output end of the computer control module. One input end of the photon upconverter is connected with the output end of the voltage-stabilized source. An optical response area of the photoelectric detector receives the optical output signals of the photon upconverter. One input end of the sampling oscilloscope is connected with the output end of the photoelectric detector, the other input end of the sampling oscilloscope is connected with the other output end of the optical pulse generating module, and the output end of the sampling oscilloscope is connected with the input end of the computer control module. According to the device, the frequency response characteristics of photon upconverters of the series can be detected and analyzed, a detecting means and an analysis tool are provided for manufacturing of a photon upconverter with higher response speed, and a foundation is laid for the study of a high-speed infrared imaging device. The invention further provides a testing method for the photon upconverter frequency response.
Description
Technical field
The present invention relates to the fields of measurement of optoelectronic device, be specifically related to proving installation and the method for testing of a kind of photon upconverter frequency response.
Background technology
Traditional infrared thermoviewer or infrared focal plane device are the detector focal plane arrays (FPA)s by thousands of infrared eye cell formations, its principle is that infrared radiation signal is converted to electric signal, electric signal is read amplification by the sensing circuit unit of similar number again, is treated as the visual image of human eye finally by continuous electronics later.The whole preparation technology indium post flip-chip interconnection of need to growing, also needs the complicated imaging circuit of reading, and makes its complicated process of preparation, and reliability is low, high in cost of production shortcoming.
On photon, switch technology refers to certain means of utilizing, long wavelength's lower energy photon is converted to the technology of short wavelength's high-energy photon, value has a very wide range of applications in fields such as civilian night vision, atmosphere imaging, industrial flaw detection, medical science detection, military surveillance, solar cells.Wherein photon upconverter refers to the upper conversion that directly realizes this photon by the mode of device, normally a photodetector unit and an electroluminescent diode units in series coupling is obtained.The lower energy photon of photodetection unit induced absorption incident, the photo-generated carrier of generation is injected in the light emitting diode of series connection with it under the effect of reverse biased, sends high energy short wavelength's photon.According to the difference of two unit material therefor systems and structure, photon upconverter can be realized infrared to visible, can see ultraviolet, infraredly to the full spectral wavelength of ultraviolet, changes.Wherein will on infrared light, be converted to the upconverter of visible ray, relatively infrared focal plane device, simple in structure because of it, cost is low, responds the advantage such as quick and has potential application prospect and advantage in infrared imaging field.
But major part mainly concentrates on conversion range and the upper conversion efficiency of raising aspect on expansion wavelength for the research of photon upconverter at present, the research of the response speed equifrequent characteristic to photon upconverter is little.Because the response speed of photon upconverter has directly determined the reaction velocity of made infrared imaging device, so extremely urgent for the research of photon upconverter part frequency response characteristic.But there is no at present a kind of method and system of testing this type of photon upconverter part frequency response characteristic.
Summary of the invention
The object of the invention is to, proving installation and the method for testing of the frequency response of a kind of photon upconverter are provided, it can realize detection and analysis to this type of photon upconverter frequency response characteristic, for preparation response speed faster photon upconverter detection means and analysis tool are provided, for development high-speed infrared image device lay the foundation.
The proving installation that the invention provides the frequency response of a kind of photon upconverter, comprising:
One computer control module;
One optical pulse generation module, its input end is connected with an output terminal of computer control module;
One stabilized voltage supply, its input end is connected with another output terminal of computer control module;
One photon upconverter, one input end is connected with the output terminal of stabilized voltage supply, and its photoresponse district receives an optical output signal of optical pulse generation module;
One photodetector, its photoresponse district receives the optical output signal of photon upconverter;
One sampling oscilloscope, one input end is connected with the output terminal of photodetector, and another input end is connected with another output terminal of optical pulse generation module, and its output terminal is connected with the input end of computer control module.
The present invention also provides the method for testing of a kind of photon upconverter frequency response, and it is the proving installation that adopts the frequency response of foregoing photon upconverter, comprises the steps:
Step 1: the module of computerizeing control regulates the frequency, waveform, dutycycle, negative edge, intensity of optical pulse generation pulsed optical signals that module is sent etc., matches the response of itself and tested photon upconverter;
Step 2: the long wave pulsed light of optical pulse generation module output preset frequency, and signal is synchronously triggered to sampling oscilloscope, obtain the frequency response curve of pulsed optical signals, as calibration curve by computer control module record;
Step 3: computer control module regulates stabilized voltage supply to provide a predetermined reverse biased to photon upconverter;
Step 4: the long wave pulsed light that optical pulse generation module is sent is absorbed by the photoresponse unit in photon upconverter, produce photo-generated carrier, photo-generated carrier is injected into the light display unit in photon upconverter under the effect of reverse biased, sends shortwave pulsed light;
Step 5: the shortwave pulsed light irradiation that photon upconverter sends produces pulse electrical signal at the photosensitive region of photodetector unit;
Step 6: photodetector unit produce pulse electrical signal be sampled oscillograph collection, obtain the frequency response curve of this signal, as test curve by computer control module record;
Step 7: by comparing calibration curve and the test curve of institute's recording impulse in computer control module, obtain the frequency response characteristic of photon upconverter, complete test.
Can find out from such scheme, proving installation provided by the invention and method of testing have following good effect and advantage:
1) realize first the test to photon upconverter frequency characteristic, obtain the main information such as response time, frequency characteristic of photon upconverter part, fill up the blank of photon upconverter frequency characteristic test aspect, for development high-speed infrared image device lays the foundation.
2) test system structure that provides is simple, cost is low, can realize detecting in real time fast photon upconverter response characteristic.
3) signal modulation and the data recording process of the test macro that provides and method all completed by computing machine, be easier to operate.
Brief description of the drawings
For making the object, technical solutions and advantages of the present invention clearer, below in conjunction with specific embodiment, and with reference to accompanying drawing, the present invention is described in further detail, wherein:
Fig. 1 is the principle schematic of photon upconverter frequency response proving installation of the present invention;
Fig. 2 is the cross section structure schematic diagram of photon upconverter in Fig. 1;
Fig. 3 is the process flow diagram of method of testing of the present invention.
Embodiment
Refer to shown in Fig. 1, Fig. 2, the invention provides the proving installation of a kind of photon upconverter frequency response, comprising:
One computer control module 1;
One optical pulse generation module 2, its input end is connected with an output terminal of computer control module 1, described optical pulse generation module 2 be by an electric pulse generator and a laser instrument by the acquisition of connecting of radio frequency connecting line, or obtained by a pulsed laser; The frequency of the pulsed optical signals that this optical pulse generation module 2 is sent, pulsewidth, waveform, intensity are modulated by computer control module 1; The frequency of the pulsed optical signals that this optical pulse generation module 2 is sent is mated with the response frequency of tested photon upconverter 4, and the wavelength of the pulsed optical signals that this optical pulse generation module 2 is sent is within the scope of the response wave length of photon upconverter 4;
One stabilized voltage supply 3, its input end is connected with another output terminal of computer control module 1, and the size of its magnitude of voltage and loading direction are controlled by computer control module 1;
One photon upconverter 4, one input end is connected with the output terminal of stabilized voltage supply 3, under the reverse biased that this photon upconverter 4 provides in stabilized voltage supply 3, works; Described photon upconverter 4 is composed in series by photoresponse unit and Optical Transmit Unit, series system be wafer key and with direct growth in one; Photoresponse unit is any one in inorganic photodetector or organic photoelectric panel detector structure, and light display unit is any one in inorganic EL diode or organic electroluminescent LED structure; Regulate the response wave length of photon upconverter 4 by changing material therefor in this photoresponse unit or device architecture, responding range can cover the wavelength region may of near infrared 800 nanometers to 1000 micron; The output wavelength that regulates photon upconverter 4 by changing light display unit material therefor and device architecture, its output wavelength scope can cover the visible light region of 390 nanometer to 780 nanometers; The photoresponse unit of its photon upconverter 4 receives an optical output signal of optical pulse generation module 2; The angle of infrared light that is incident to photon upconverter 4 is according to the difference of photoresponse cellular construction used and difference is specially from substrate layer incident, from positive incident or from one of sidewall incident.
One photodetector 5, its photoresponse district receives the optical output signal of photon upconverter 4, the limit response frequency of described photodetector 5 is higher than the limit response frequency of the sub-upconverter 4 of institute's photometry, and the response speed of described photodetector 5 is faster than the response speed of the sub-upconverter 4 of institute's photometry; The short wavelength light signal that described photodetector 5 only sends photon upconverter 4 has response, the long wavelength light signal response cut-off that optical pulse generation module 2 is sent;
One sampling oscilloscope 6, one input end is connected with the output terminal of photodetector 5, and another input end is connected with another output terminal of optical pulse generation module 2, and its output terminal is connected with the input end of computer control module 1.
Refer to Fig. 3, and in conjunction with consulting shown in Fig. 1 and Fig. 2, the method for testing of a kind of photon upconverter of the present invention frequency response, comprises the steps:
Step 1: the module of computerizeing control 1 regulates frequency, waveform, dutycycle, negative edge, intensity of pulsed optical signals that optical pulse generation module 2 is sent etc., the response of itself and tested photon upconverter 4 is matched, described optical pulse generation module 2 be by an electric pulse generator and a laser instrument by the acquisition of connecting of radio frequency connecting line, or obtained by a pulsed laser;
Step 2: optical pulse generation module 2 is exported the long wave pulsed light of preset frequency, and signal is synchronously triggered to sampling oscilloscope 6, obtains the frequency response curve of pulsed optical signals, as calibration curve by computer control module 1 record;
Step 3: computer control module 1 regulates stabilized voltage supply 3 to provide a predetermined reverse biased to photon upconverter 4;
Step 4: the long wave pulsed light that optical pulse generation module 2 is sent is absorbed by the photoresponse unit in photon upconverter 4, produce photo-generated carrier, photo-generated carrier is injected into the light display unit in photon upconverter 4 under the effect of reverse biased, sends shortwave pulsed light;
Step 5: the shortwave pulsed light irradiation that photon upconverter 4 sends produces pulse electrical signal at the photosensitive region of photodetector unit 5;
Step 6: the pulse electrical signal that photodetector unit 5 produces is sampled oscillograph 6 and gathers, obtains the frequency response curve of this signal, as test curve by computer control module 1 record;
Step 7: by comparing calibration curve and the test curve of institute's recording impulse in computer control module 1, obtain the frequency response characteristic of photon upconverter, complete test.
Above-described specific embodiment; object of the present invention, technical scheme and beneficial effect are further described; institute is understood that; the foregoing is only specific embodiments of the invention; be not limited to the present invention; within the spirit and principles in the present invention all, any amendment of making, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.
Claims (8)
1. a proving installation for photon upconverter frequency response, comprising:
One computer control module;
One optical pulse generation module, its input end is connected with an output terminal of computer control module;
One stabilized voltage supply, its input end is connected with another output terminal of computer control module;
One photon upconverter, one input end is connected with the output terminal of stabilized voltage supply, and its photoresponse district receives an optical output signal of optical pulse generation module;
One photodetector, its photoresponse district receives the optical output signal of photon upconverter;
One sampling oscilloscope, one input end is connected with the output terminal of photodetector, and another input end is connected with another output terminal of optical pulse generation module, and its output terminal is connected with the input end of computer control module.
2. the proving installation of photon upconverter as claimed in claim 1 frequency response, wherein said optical pulse generation module be by an electric pulse generator and a laser instrument by the acquisition of connecting of radio frequency connecting line, or obtained by a pulsed laser; Frequency, pulsewidth, waveform, the intensity of the pulsed optical signals that this optical pulse generation module is sent are modulated by computer control module; The frequency of the pulsed optical signals that this optical pulse generation module is sent is mated with the response frequency of tested photon upconverter.
3. the proving installation of photon upconverter as claimed in claim 1 frequency response, works under the reverse biased that wherein said photon upconverter 4 provides in stabilized voltage supply; Described photon upconverter is composed in series by photoresponse unit and Optical Transmit Unit, series system be wafer key and with direct growth in one; Photoresponse unit is any one in inorganic photodetector or organic photoelectric panel detector structure, and light display unit is any one in inorganic EL diode or organic electroluminescent LED structure; The response wave length of photo detecting unit is greater than the emission wavelength of light display unit.
4. the proving installation of photon upconverter as claimed in claim 1 frequency response, the limit response frequency of wherein said photodetector is higher than the limit response frequency of the sub-upconverter of institute's photometry; The short wavelength light signal that described photodetector only sends photon upconverter has response, the long wavelength light signal response cut-off that optical pulse generation module is sent.
5. a method of testing for photon upconverter frequency response, it is the proving installation that adopts photon upconverter as claimed in claim 1 frequency response, comprises the steps:
Step 1: the module of computerizeing control regulates the frequency, waveform, dutycycle, negative edge, intensity of optical pulse generation pulsed optical signals that module is sent etc., matches the response of itself and tested photon upconverter;
Step 2: the long wave pulsed light of optical pulse generation module output preset frequency, and signal is synchronously triggered to sampling oscilloscope, obtain the frequency response curve of pulsed optical signals, as calibration curve by computer control module record;
Step 3: computer control module regulates stabilized voltage supply to provide a predetermined reverse biased to photon upconverter;
Step 4: the long wave pulsed light that optical pulse generation module is sent is absorbed by the photoresponse unit in photon upconverter, produce photo-generated carrier, photo-generated carrier is injected into the light display unit in photon upconverter under the effect of reverse biased, sends shortwave pulsed light;
Step 5: the shortwave pulsed light irradiation that photon upconverter sends produces pulse electrical signal at the photosensitive region of photodetector unit;
Step 6: photodetector unit produce pulse electrical signal be sampled oscillograph collection, obtain the frequency response curve of this signal, as test curve by computer control module record;
Step 7: by comparing calibration curve and the test curve of institute's recording impulse in computer control module, obtain the frequency response characteristic of photon upconverter, complete test.
6. the method for testing of photon upconverter according to claim 5 frequency response, wherein said optical pulse generation module be by an electric pulse generator and a laser instrument by the acquisition of connecting of radio frequency connecting line, or obtained by a pulsed laser; Frequency, pulsewidth, waveform, the intensity of the pulsed optical signals that this optical pulse generation module is sent are modulated by computer control module; The frequency of the pulsed optical signals that this optical pulse generation module is sent is mated with the response frequency of tested photon upconverter.
7. the method for testing of photon upconverter according to claim 5 frequency response, works under the reverse biased that wherein said photon upconverter 4 provides in stabilized voltage supply; Described photon upconverter is composed in series by photoresponse unit and Optical Transmit Unit, series system be wafer key and with direct growth in one; Photoresponse unit is any one in inorganic photodetector or organic photoelectric panel detector structure, and light display unit is any one in inorganic EL diode or organic electroluminescent LED structure; The response wave length of photo detecting unit is greater than the emission wavelength of light display unit.
8. the method for testing of photon upconverter according to claim 5 frequency response, the limit response frequency of wherein said photodetector is higher than the limit response frequency of the sub-upconverter of institute's photometry; The short wavelength light signal that described photodetector only sends photon upconverter has response, the long wavelength light signal response cut-off that optical pulse generation module is sent.
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| CN108226739A (en) * | 2018-01-19 | 2018-06-29 | 河北工业大学 | The test method of organic electroluminescence device alternating temperature dipulse transient state photoresponse |
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| CN102156221A (en) * | 2011-03-01 | 2011-08-17 | 南京航空航天大学 | Photon-integrated-circuit-based instantaneous microwave frequency measurement device and method |
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Application publication date: 20140903 |