CN103984132B - A kind of restorative procedure of array base palte line fault - Google Patents
A kind of restorative procedure of array base palte line fault Download PDFInfo
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- CN103984132B CN103984132B CN201410242159.4A CN201410242159A CN103984132B CN 103984132 B CN103984132 B CN 103984132B CN 201410242159 A CN201410242159 A CN 201410242159A CN 103984132 B CN103984132 B CN 103984132B
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- 238000000034 method Methods 0.000 title claims abstract description 56
- 230000008439 repair process Effects 0.000 claims abstract description 159
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 10
- 230000005540 biological transmission Effects 0.000 abstract description 4
- 230000000694 effects Effects 0.000 description 8
- 239000000047 product Substances 0.000 description 8
- 239000002184 metal Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000000608 laser ablation Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 5
- 238000001182 laser chemical vapour deposition Methods 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 230000004888 barrier function Effects 0.000 description 4
- 239000010408 film Substances 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 239000006227 byproduct Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000007792 gaseous phase Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000005067 remediation Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
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- Microelectronics & Electronic Packaging (AREA)
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Abstract
The present invention provides the restorative procedure of a kind of array base palte line fault, and described method includes: detect circuit location of fault on described array base palte；During the crossover region that at least two lines road being positioned on array base palte when the position of described line fault is formed, every circuit in described crossover region is simultaneously switched off, so that every circuit after described disconnection includes two strip circuits, described sub-line road includes the first end points and the second end points, and described first end points on the described second end points more described sub-line road on described sub-line road is away from described crossover region；Arranging reparation point on described sub-line road, first end points on described reparation point more described sub-line road is away from described crossover region；And use repair line connection to belong to the reparation point on two strip circuits of same circuit.The fault that the crossover region of two Above Transmission Lines occurs can be repaired by the present invention, solves the technical problem that yield rate is low, production cost is high of existing reparation maneuver product.
Description
[technical field]
The present invention relates to a kind of TFT liquid crystal display, particularly relate to
A kind of restorative procedure of array base palte line fault.
[background technology]
TFT liquid crystal display in actual production process, scan line and
Holding wire can produce line fault (short circuit or open circuit) due to processing procedure defect, for carrying
Rising the yield rate of actual production product, line fault often uses laser chemistry gas phase to sink
Long-pending restorative procedure (LCVD) is repaired.Laser chemical vapor deposition restorative procedure is
Under vacuum, it is passed through reaction raw materials gas, with matrix surface under laser beam effect
And neighbouring gas generation chemical reaction, deposit thin film at matrix surface.
But repaired maneuver by conventional long line to be limited, near thin film transistor (TFT) functional area
Line fault, such as when line fault occur in scan line and the crossover region of holding wire or
Holding wire and the crossover region of public electrode wire, often cannot complete to repair, can only be by product
Scrap, both wasted resource, too increased production cost simultaneously.
The present invention provides optimization conventional laser chemical gaseous phase deposition restorative procedure, for circuit event
The reparation of barrier provides more reparation probabilities, improves the yield rate of product simultaneously.
[summary of the invention]
It is an object of the invention to provide the restorative procedure of a kind of array base palte line fault,
To solve cannot repair when line fault occurs in crossover region, the yield rate of product is low,
Thus waste resource, the technical problem of increase production cost.
For solving above-mentioned technical problem, the present invention constructs a kind of array base palte line fault
Restorative procedure, described method includes:
Detect circuit location of fault on described array base palte；
When at least two lines road shape that the position of described line fault is positioned on array base palte
During the crossover region become, every circuit in described crossover region is simultaneously switched off, so that institute
State every circuit after disconnection and include that two strip circuits, described sub-line road include the first end points
And second end points, the described second end points more described sub-line road on described sub-line road described
First end points is away from described crossover region；
Described sub-line road arranges reparation point, the of described reparation point more described sub-line road
End point is away from described crossover region；And
Use repair line to connect and belong to the reparation point on two strip circuits of same circuit.
In the restorative procedure of the array base palte line fault of the present invention, described crossover region bag
Including the first crossover region, described first crossover region is formed by holding wire and scan line are overlapping, institute
State repair line and include the first repair line and the second repair line:
Described first repair line is first used to connect on two strip circuits of described holding wire
Repair point；
Re-use described second repair line to connect on two strip circuits of described scan line
Repairing point, the position of wherein said second repair line is according to the position of described first repair line
Arrange, and described second repair line is the most overlapping with described first repair line.
In the restorative procedure of the array base palte line fault of the present invention, described crossover region bag
Including the first crossover region, described first crossover region is formed by holding wire and scan line are overlapping, institute
State repair line and include the first repair line and the second repair line:
Described second repair line is first used to connect on two strip circuits of described scan line
Repair point；
Re-use described first repair line to connect on two strip circuits of described holding wire
Repairing point, the position of wherein said first repair line is according to the position of described second repair line
Arranging, described first repair line is the most overlapping with described second repair line.
In the restorative procedure of the array base palte line fault of the present invention, described crossover region bag
Including the second crossover region, described second crossover region is overlapped shape by holding wire and public electrode wire
Becoming, described repair line includes the first repair line and the 3rd repair line:
Described first repair line is first used to connect on two strip circuits of described holding wire
Repair point；
Re-use described 3rd repair line and connect two strip circuits of described public electrode wire
On reparation point, the position of wherein said 3rd repair line is according to described first repair line
Position is arranged, and described 3rd repair line is the most overlapping with described first repair line.
In the restorative procedure of the array base palte line fault of the present invention, described crossover region bag
Including the second crossover region, described second crossover region is overlapped shape by holding wire and public electrode wire
Becoming, described repair line includes the first repair line and the 3rd repair line:
Described 3rd repair line is first used to connect two strip circuits of described public electrode wire
On reparation point；
Re-use described first repair line and connect repairing on two strip circuits of described signal
Complex point；The position of wherein said first repair line sets according to the position of described 3rd repair line
Putting, described first repair line is the most overlapping with described 3rd repair line.
In the restorative procedure of the array base palte line fault of the present invention, described array base palte
Line fault include the line broken circuit in described crossover region or short circuit.
The present invention have also been constructed the restorative procedure of another kind of array base palte line fault, described
Method includes:
Detect circuit location of fault on described array base palte；
The holding wire being positioned on array base palte when the position of described line fault and common electrical
During the crossover region that polar curve is formed, wherein said public electrode wire includes body and described
The light shielding part that pixel cell edge on array base palte is arranged, described light shielding part includes first
Light shielding part and the second light shielding part, described first light shielding part and the second light shielding part are positioned at adjacent two
The both sides of the holding wire between individual pixel cell；
The body of the holding wire in described crossover region and public electrode wire is simultaneously switched off,
So that the body of holding wire after described disconnection and public electrode wire all includes two
Sub-line road, described sub-line road includes the first end points and the second end points；Described sub-line road
Described first end points on described second end points more described sub-line road is away from described crossover region；
The sub-line road of described holding wire arranges reparation point, the sub-line road of described holding wire
On first end points on sub-line road repairing the more described holding wire of point away from described crossover region；
The first repair line is used to connect the reparation point on two strip circuits of described holding wire；
Described first light shielding part and described second light shielding part are respectively provided with corresponding described public affairs
On the reparation point of common-battery polar curve body, described first light shielding part and described second light shielding part
First end points on sub-line road of the body repairing the most described public electrode wire of point remote
From described crossover region；And
The 4th repair line is used to connect on described first light shielding part and described second light shielding part
The reparation point of corresponding described public electrode wire body.
In the restorative procedure of the array base palte line fault of the present invention, first is first used to repair
Multiple line connects the reparation point on two strip circuits of described holding wire；
Re-use the 4th repair line and connect described first light shielding part and described second light shielding part
The reparation point of upper correspondence described public electrode wire body；Wherein said 4th repair line
Position is arranged according to the position of described first repair line, described 4th repair line and described the
One repair line is the most overlapping.
In the restorative procedure of the array base palte line fault of the present invention, the 4th is first used to repair
Multiple line connects corresponding described common electrical on described first light shielding part and described second light shielding part
The reparation point of polar curve body；
Re-use the first repair line and connect the reparation on two strip circuits of described holding wire
Point；The position of wherein said first repair line sets according to the position of described 4th repair line
Putting, described first repair line is the most overlapping with described 4th repair line.
The restorative procedure of the array base palte line fault of the present invention, it is possible in array substrate
Holding wire and scan line between crossover region or holding wire and the friendship of public electrode wire
Open circuit or short trouble that folded district occurs are repaired, and by the way, solve existing
The line fault restorative procedure having technology can not be to the friendship of two or two Above Transmission Lines
The fault that folded district occurs carries out the defect repaired, it is possible to increase the yield rate of product, saves
Resource, reduces production cost.
For the foregoing of the present invention can be become apparent, cited below particularly it is preferable to carry out
Example, and coordinate institute's accompanying drawings, it is described in detail below:
[accompanying drawing explanation]
Fig. 1 is the array base palte line fault of first embodiment in the embodiment of the present invention
Restorative procedure schematic diagram；
Fig. 2 is the partial enlarged drawing in repair line region in Fig. 1；
Fig. 3 is the array base palte line fault of the second embodiment in the embodiment of the present invention
Restorative procedure schematic diagram；
Fig. 4 is the partial enlarged drawing in repair line region in Fig. 3；
Fig. 5 is the array base palte line fault of the 3rd embodiment in the embodiment of the present invention
Restorative procedure schematic diagram；
Fig. 6 is the partial enlarged drawing in repair line region in Fig. 5.
[detailed description of the invention]
The explanation of following embodiment is graphic with reference to add, can in order to illustrate the present invention
In order to the specific embodiment implemented.The direction term that the present invention is previously mentioned, such as " on ",
D score, "front", "rear", "left", "right", " interior ", " outward ", " side " etc., only
It it is the direction with reference to annexed drawings.Therefore, the direction term of use is to illustrate and manage
Solve the present invention, and be not used to limit the present invention.In the drawings, the unit that structure is similar be with
Identical label represents.
In prior art, TFT liquid crystal display includes array base palte, battle array
Row substrate includes data wire, scan line and is interlocked by described data wire and described scan line
The multiple pixel cells formed；Scan line and public electrode wire are positioned at the first metal layer, number
Being positioned at the second metal level according to line, the second metal level is positioned on the first metal layer, transparent leads
Electric layer is positioned on the second metal level, by absolutely between the first metal layer and the second metal level
Edge layer separates.On array base palte, the both sides of holding wire between two pixel cells are arranged
Having two shading lines, the left side of holding wire is provided with a shading line, the right side of holding wire
Being provided with an other shading line, public electrode wire is respectively with two described shading lines even
Connect.
The restorative procedure of the array base palte line fault in the present invention, including:
Detect circuit location of fault on described array base palte；
When at least two lines road shape that the position of described line fault is positioned on array base palte
During the crossover region become, every circuit in described crossover region is simultaneously switched off, so that institute
State every circuit after disconnection and include that two strip circuits, described sub-line road include the first end points
And second end points；The described second end points more described sub-line road on described sub-line road described
First end points is away from described crossover region；
The position of the most described line fault is to be formed by the circuit of three or more than three
Crossover region, all within protection scope of the present invention, numerous to list herein.
Described sub-line road arranges reparation point, the of described reparation point more described sub-line road
End point is away from described crossover region；And
Use repair line to connect and belong to the reparation point on two strip circuits of same circuit.
The concrete generation process of described repair line is: will generate the position that repair line is corresponding
The transparent pixel electrode layer laser ablation put；Point will be repaired on described sub-line road simultaneously
The insulating barrier laser ablation on surface；Utilize laser chemical vapor deposition method at described son
Plated film on the reparation point of circuit；(can certainly be that other are existing to form described repair line
Some repair lines generate method, the most within the scope of the present invention).Described array base
The line fault of plate includes the line broken circuit in described crossover region or short circuit.
The restorative procedure of the array base palte line fault of the present invention, it is possible in array substrate
Holding wire and scan line between crossover region or holding wire and the friendship of public electrode wire
Open circuit or short trouble that folded district occurs are repaired, and by the way, solve existing
The line fault restorative procedure having technology can not be to the friendship of two or two Above Transmission Lines
The fault that folded district occurs carries out the defect repaired, it is possible to increase the yield rate of product, saves
Resource, reduces production cost.
Refer to Fig. 1, Fig. 1 is the array base palte of first embodiment in the embodiment of the present invention
The restorative procedure schematic diagram of line fault.
Detect circuit location of fault on described array base palte；
As it is shown in figure 1, the signal being positioned on array base palte when the position of described line fault
When line 11 overlaps, with scan line 12, the first crossover region 20 formed, in conjunction with Fig. 2, will
Described holding wire 11 and scan line 12 in described first crossover region 20 simultaneously switch off,
Described holding wire 11 is made to form two breakpoints 111 and 113, the signal after described disconnection
Line 11 includes that the first subsignal line and the second subsignal line, described first subsignal line are
First end points (identical with breakpoint 111) of described first subsignal line and described first son
Circuit between second end points 112 of holding wire；Described second subsignal line is the second son
First end points (identical with breakpoint 113) of holding wire and the second end of the second subsignal line
Circuit between point 114, described second end points 112 of the most described first subsignal line is relatively
Described first end points 111 of described first subsignal line is away from described crossover region 20；I.e.
The more described second subsignal line of described second end points 114 of described second subsignal line
Described first end points 113 is away from described crossover region 20.
Described scan line 12 forms two breakpoints 121 and 123, sweeping after described disconnection
Retouch line 12 and include the first sub-scan line and the second sub-scan line, described first sub-scan line
The first end points (identical with breakpoint 121) and described first for described first sub-scan line
Circuit between second end points 122 of sub-scan line；Described second sub-scan line is described
First end points (identical with breakpoint 123) of the second sub-scan line and described second son scanning
Circuit between second end points 124 of line is formed, the most described first sub-scan line described
Described first end points 121 of the more described first sub-scan line of the second end points 122 is away from described
Crossover region 20；Described second end points 124 more described of the most described second sub-scan line
Described first end points 123 of two sub-scan lines is away from described crossover region 20；
Described first subsignal line is provided with reparation point 211, described reparation point 211
First end points 111 of more described first subsignal line is away from described crossover region 20；
Described second subsignal line is provided with reparation point 212, described reparation point 212
First end points 113 of more described second subsignal line is away from described crossover region 20；
The first repair line 21 is used to connect repairing on two strip circuits of described holding wire 11
Complex point 211 and 212.
Described first sub-scan line is provided with reparation point 221, described reparation point 221
First end points 121 of more described first sub-scan line is away from described crossover region 20；
Described second sub-scan line is provided with reparation point 222, described reparation point 222
First end points 123 of more described second sub-scan line is away from described crossover region 20；
The second repair line 22 is used to connect repairing on two strip circuits of described scan line 12
Complex point 221 and 222.
Described holding wire 11 first can be repaired by the present embodiment, i.e. use described first
Repair line 21 connects reparation point 211 He on two strip circuits of described holding wire 11
212；
Re-use described second repair line 22 and connect two strip circuits of described scan line 12
On reparation point 221 and 222, the position of wherein said second repair line 22 should basis
The position of described first repair line 21 is arranged, so that described second repair line 22 is with described
First repair line 21 is the most overlapping, so that repairing effect is more preferably.
Another situation of the present embodiment is: first repair described scan line 12, the most first
Described second repair line 22 is used to connect repairing on two strip circuits of described scan line 12
Complex point 221 and 222；
Re-use described first repair line 21 and connect two strip circuits of described holding wire 11
On reparation point 211 and 212, the position of wherein said first repair line 21 should basis
The position of described second repair line 22 is arranged, so that described first repair line 21 is with described
Second repair line 22 is the most overlapping, so that repairing effect is more preferably.
The concrete generation process of described repair line is: will generate the position that repair line is corresponding
The transparent pixel electrode layer laser ablation put；Point will be repaired on described sub-line road simultaneously
The insulating barrier laser ablation on surface；Utilize laser chemical vapor deposition method at described son
Plated film on the reparation point of circuit；(can certainly be that other are existing to form described repair line
Some repair lines generate method, the most within the scope of the present invention).Described array base
The line fault of plate includes the line broken circuit in described crossover region or short circuit.
The position of the most described line fault can also be by three or the line of more than three
The crossover region that road is formed, restorative procedure is same as mentioned above, all in the protection of the present invention
Within the scope of, numerous to list herein.
The restorative procedure of the array base palte line fault of the present invention, it is possible in array substrate
Holding wire and scan line between crossover region or holding wire and the friendship of public electrode wire
Open circuit or short trouble that folded district occurs are repaired, and by the way, solve existing
The line fault restorative procedure having technology can not be to the friendship of two or two Above Transmission Lines
The fault that folded district occurs carries out the defect repaired, it is possible to increase the yield rate of product, saves
Resource, reduces production cost.
Refer to Fig. 3, Fig. 3 is the array base palte of the second embodiment in the embodiment of the present invention
The restorative procedure schematic diagram of line fault.
Detect circuit location of fault on described array base palte；The circuit of described array base palte
Fault includes the line broken circuit in described crossover region or short circuit.
As it is shown on figure 3, the signal being positioned on array base palte when the position of described line fault
When line 11 overlaps, with public electrode wire 13, the second crossover region 30 formed, in conjunction with Fig. 4,
The while of by the described holding wire 11 in described second crossover region 30 and public electrode wire 13
Disconnecting, described holding wire 11 forms two breakpoints 111 and 113, the letter after described disconnection
Number line 11 includes the first subsignal line and the second subsignal line, described first subsignal line
The first end points (identical with breakpoint 111) and described first for described first subsignal line
Circuit between second end points 112 of subsignal line；Described second subsignal line is described
First end points (identical with breakpoint 113) of the second subsignal line and described second subsignal
Circuit between second end points 114 of line is formed, the most described first subsignal line described
Described first end points 111 of the more described first subsignal line of the second end points 112 is away from described
Crossover region 30；Described second end points 114 more described second of described second subsignal line
Described first end points 113 of subsignal line is away from described crossover region 30.
Described public electrode wire 13 forms two breakpoints 131 and 133, after described disconnection
Public electrode wire 13 include the first sub-public electrode wire and the second sub-public electrode wire,
Described first sub-public electrode wire be described first sub-public electrode wire the first end points (with
Breakpoint 131 is identical) and the second end points 132 of the first sub-public electrode wire between circuit；
Described second sub-public electrode wire be described second sub-public electrode wire the first end points (with
Breakpoint 133 is identical) and the second end points 134 of described second sub-public electrode wire between
Circuit is formed, and described second end points 132 of the most described first sub-public electrode wire is relatively described
Described first end points 131 of the first sub-public electrode wire is away from described crossover region 30；I.e.
More described second son of described second end points 134 of described second sub-public electrode wire is public
Described first end points 133 of electrode wires is away from described crossover region 30；
Described first subsignal line is provided with reparation point 311, described reparation point 311
First end points 111 of more described first subsignal line is away from described crossover region 30；
Described second subsignal line is provided with reparation point 312, described reparation point 312
First end points 113 of more described second subsignal line is away from described crossover region 30；
The first repair line 31 is used to connect repairing on two strip circuits of described holding wire 11
Complex point 311 and 312.
Described first sub-public electrode wire is provided with reparation point 321, described reparation point
First end points 131 of 321 more described first sub-public electrode wires is away from described crossover region
30；
Described second sub-public electrode wire is provided with reparation point 322, described reparation point
First end points 133 of 322 more described second sub-public electrode wires is away from described crossover region
30；
The 3rd repair line 32 is used to connect on two strip circuits of described public electrode wire 13
Reparation point 321 and 322.
In the present embodiment, a kind of situation is: first can repair described holding wire 11, i.e.
Described first repair line 31 is used to connect the reparation on two strip circuits of described holding wire
Point 311 and 312；
Re-use described 3rd repair line 32 and connect two strips of described public electrode wire 13
Reparation point 321 and 322 on circuit, the position of wherein said 3rd repair line 32 should
Position according to described first repair line 31 is arranged, and makes described 3rd repair line 32 and institute
State the first repair line 31 the most overlapping, so that repairing effect is more preferably.
Another situation of the present embodiment is: first can repair described public electrode wire 13
Multiple, the most first use described 3rd repair line 32 to connect two articles of described public electrode wire 13
Reparation point 321 and 322 on sub-line road；
Re-use described first repair line 31 and connect two strip circuits of described holding wire 11
On reparation point 311 and 312, the position of wherein said first repair line 31 should basis
The position of described 3rd repair line 32 is arranged, so that described first repair line 31 is with described
3rd repair line 32 is the most overlapping, so that repairing effect is more preferably.
The concrete generation process of described repair line is: will generate the position that repair line is corresponding
The transparent pixel electrode layer laser ablation put；Point will be repaired on described sub-line road simultaneously
The insulating barrier laser ablation on surface；Utilize laser chemical vapor deposition method at described son
Plated film on the reparation point of circuit；(can certainly be that other are existing to form described repair line
Some repair lines generate method, the most within the scope of the present invention).Described array base
The line fault of plate includes the line broken circuit in described crossover region or short circuit.
The position of the most described line fault can also be by three or the line of more than three
The crossover region that road is formed, restorative procedure is same as mentioned above, all in the protection of the present invention
Within the scope of, numerous to list herein.
The restorative procedure of the array base palte line fault of the present invention, it is provided that one can be poised for battle
The crossover region between holding wire and scan line on row substrate or holding wire and common electrical
Open circuit or short trouble that the crossover region of polar curve occurs are repaired, by the way,
The line fault restorative procedure solving prior art can not be to two or more than two
The fault that the crossover region of circuit occurs carries out the defect repaired, it is possible to increase the finished product of product
Rate, economizes on resources, and reduces production cost.
Refer to Fig. 5, Fig. 5 is the array base palte of the 3rd embodiment in the embodiment of the present invention
The restorative procedure schematic diagram of line fault.
As it is shown in figure 5, in the present embodiment, public electrode wire of the prior art is carried out
Improving, it is (of the prior art public that the public electrode wire after improvement includes body 13
Electrode wires) and light shielding part 14,15, i.e. with in described light shielding part replacement prior art two
Two shading lines of the both sides of the holding wire 11 between pixel cell, play and prior art
Described in the identical effect of shading line.Described light shielding part includes the first light shielding part 14 and second
Light shielding part 15, described first light shielding part 14 holding wire between two pixel cells
Left side, the right side of described second light shielding part 15 holding wire between two pixel cells
Side.
Detect circuit location of fault on described array base palte；The circuit of described array base palte
Fault includes the line broken circuit in described crossover region or short circuit.
The holding wire 11 that is positioned on array base palte when the position of described line fault and public
During the crossover region 40 that electrode wires 13 is formed, wherein said public electrode wire 13 is included in
The light shielding part 14,15 of the pixel cell edge setting on described array base palte and body
13, described light shielding part includes the first light shielding part 14 and the second light shielding part 15, described first
Light shielding part 14 and second light shielding part 15 holding wire between adjacent two pixel cells
Both sides；
In conjunction with Fig. 6, by the holding wire 11 in described crossover region and the basis of public electrode wire
Body 13 simultaneously switches off, and the region of disconnection is at described first light shielding part 14 and described second
Between light shielding part 15, so that holding wire 11 after described disconnection and public electrode wire
Body 13 all includes that two strip circuits, described holding wire 11 form two breakpoints 111
With 113, the holding wire 11 after described disconnection includes the first subsignal line and the second son letter
Number line, described first subsignal line is that the first end points of described first subsignal line is (with disconnected
Point is 111 identical) and the second end points 112 of described first subsignal line between circuit；
Described second subsignal line is that the first end points of described second subsignal line is (with breakpoint 113
Identical) and the second end points 114 of described second subsignal line between circuit, i.e. described
The more described first subsignal line of described second end points 112 of the first subsignal line described
First end points 111 is away from described crossover region 40；Described the of described second subsignal line
Described first end points 113 of the more described second subsignal line of two end points 114 is away from described friendship
Folded district 40.
The body 13 of described public electrode wire forms two breakpoints 131 and 133, institute
State the first more described breakpoint of light shielding part 14 131 and deviate described crossover region 40 and the second shading
The more described breakpoint in portion 15 133 deviates described crossover region 40；Common electrical after described disconnection
Polar curve body 13 includes the first sub-body and the second sub-body, described first son
Body is first end points (identical with breakpoint 131) and of described first sub-body
Circuit between second end points 132 of one sub-body, and the second sub-body is
First end points (identical with breakpoint 133) of two sub-bodies and the of the second sub-body
Circuit between two end points 134 is formed, described second end of the most described first sub-body
Described first end points 131 of point 132 more described first sub-bodies is away from described crossover region
40；The more described second sub-body of described second end points 134 of the most described second sub-body
Described first end points 133 in portion is away from described crossover region 40；
Described first subsignal line arranges one and repairs point 411, described reparation point
First end points 111 of 411 more described first subsignal lines is away from described crossover region 40；
Described second subsignal line arranges one and repairs point 412, described reparation point
First end points 113 of 412 more described second subsignal lines is away from described crossover region 40；
The first repair line 41 is used to connect repairing on two strip circuits of described holding wire 11
Complex point 411 and 412.
Described first light shielding part 14 is provided with reparation point 421, in described second shading
Reparation point 422, described reparation point 421 more described first sub-bodies it are provided with in portion 15
First end points 131 in portion is away from described crossover region 40；Described reparation point 422 is relatively described
First end points 133 of the second sub-body is away from described crossover region 40；
Voltage on described first light shielding part 14 and the body 13 of described public electrode wire
On voltage identical, voltage on described second light shielding part 15 also with described public electrode
Voltage on the body 13 of line is identical, at described first light shielding part 14 and described second
The reparation point being provided with corresponding described public electrode wire body 13 of light shielding part 15,
Repairing on the corresponding described first sub-body of point 421 on described first light shielding part 14
Repairing point, corresponding described second son of the reparation point 422 on described second light shielding part 15 is originally
Reparation point on body.
The 4th repair line 42 is used to connect described first light shielding part 14 and described second shading
Reparation point 421 and 422 in portion 15.
In the present embodiment, a kind of situation is:
The first repair line 41 is first used to connect the reparation of two strip circuits of described holding wire
Point 411 and 412；
Re-use the 4th repair line 42 and connect described first light shielding part 14 and described second screening
The reparation point 421 and 422 of corresponding described public electrode wire body 13 in light portion 15；
The position of wherein said 4th repair line 42 is according to the position of described first repair line 41
Installing, described 4th repair line 42 is the most overlapping with described first repair line 41, so that
Repairing effect is more preferably.
In the present embodiment, another situation is:
First use the 4th repair line 42 to connect described first light shielding part 14 and described second to hide
The reparation point 421 and 422 of corresponding described public electrode wire body 13 in light portion 15；
Re-use the reparation that the first repair line 41 connects two strip circuits of described holding wire
Point 411 and 412；
The position of wherein said first repair line 41 is according to the position of described 4th repair line 42
Installing, described first repair line 41 is the most overlapping with described 4th repair line 42, so that
Repairing effect is more preferably.
The position of the most described line fault can also be by three or the line of more than three
The crossover region that road is formed, all within protection scope of the present invention, numerous to list herein.
The present embodiment and the second embodiment are compared, owing to being set by the reparation of public electrode wire point
Put on light shielding part so that the setting of repair line position is easier, can preferably avoid
Problem overlapping between repair line, reduces repair amount, improves remediation efficiency, reduces
Production cost.
In sum, although the present invention is disclosed above with preferred embodiment, but above-mentioned excellent
Select embodiment and be not used to limit the present invention, those of ordinary skill in the art, not taking off
In the spirit and scope of the present invention, all can make various change and retouching, the therefore present invention
Protection domain define in the range of standard with claim.
Claims (5)
1. the restorative procedure of an array base palte line fault, it is characterised in that: described method includes:
Detect circuit location of fault on described array base palte；
It is overlapping that at least two lines road being positioned on array base palte when the position of described line fault is formed
Qu Shi, simultaneously switches off every circuit in described crossover region, so that after described disconnection
Every circuit includes that two strip circuits, described sub-line road include the first end points and the second end points,
Described first end points on the described second end points more described sub-line road on described sub-line road is away from described
Crossover region；
Described sub-line road arranges reparation point, first end points on described reparation point more described sub-line road
Away from described crossover region；And
Use repair line to connect and belong to the reparation point on two strip circuits of same circuit；
Wherein, described crossover region includes the first crossover region, described first crossover region by holding wire with sweep
Retouching the overlapping formation of line, described repair line includes the first repair line and the second repair line, described side
Method separately includes:
Described first repair line is first used to connect the reparation point on two strip circuits of described holding wire；
Re-use described second repair line and connect the reparation point on two strip circuits of described scan line,
The position of wherein said second repair line is arranged according to the position of described first repair line, and institute
State the second repair line the most overlapping with described first repair line.
The restorative procedure of array base palte line fault the most according to claim 1, its feature exists
In: described crossover region includes the second crossover region, described second crossover region by holding wire with public
Electrode wires is overlapping to be formed, and described repair line includes the first repair line and the 3rd repair line:
Described first repair line is first used to connect the reparation point on two strip circuits of described holding wire；
Re-use described 3rd repair line and connect the reparation on two strip circuits of described public electrode wire
Point, the position of wherein said 3rd repair line is arranged according to the position of described first repair line,
Described 3rd repair line is the most overlapping with described first repair line.
The restorative procedure of array base palte line fault the most according to claim 1, its feature exists
In: described crossover region includes the second crossover region, described second crossover region by holding wire with public
Electrode wires is overlapping to be formed, and described repair line includes the first repair line and the 3rd repair line:
Described 3rd repair line is first used to connect the reparation on two strip circuits of described public electrode wire
Point；
Re-use described first repair line and connect the reparation point on two strip circuits of described signal；Its
Described in the position of the first repair line arrange according to the position of described 3rd repair line, described the
One repair line is the most overlapping with described 3rd repair line.
4. the restorative procedure of an array base palte line fault, it is characterised in that: described method includes:
Detect circuit location of fault on described array base palte；
The holding wire being positioned on array base palte when the position of described line fault and public electrode wire are formed
Crossover region time, wherein said public electrode wire includes body and on described array base palte
Pixel cell edge arrange light shielding part, described light shielding part includes the first light shielding part and second
Light shielding part, described first light shielding part and the second light shielding part are between adjacent two pixel cells
The both sides of holding wire；
The body of the holding wire in described crossover region and public electrode wire is simultaneously switched off, so that
Holding wire and the body of public electrode wire after described disconnection all include two strip circuits, institute
State sub-line road and include the first end points and the second end points；Described second end points on described sub-line road
Described first end points on more described sub-line road is away from described crossover region；
The sub-line road of described holding wire arranges reparation point, repairing on the sub-line road of described holding wire
First end points on the sub-line road of the more described holding wire of complex point is away from described crossover region；
The first repair line is used to connect the reparation point on two strip circuits of described holding wire；
Described first light shielding part and described second light shielding part are respectively provided with corresponding described public electrode wire
Reparation point on the reparation point of body, described first light shielding part and described second light shielding part is equal
First end points on the sub-line road of the body of more described public electrode wire is away from described crossover region；
And
The 4th repair line is used to connect on described first light shielding part and described second light shielding part corresponding described
The reparation point of public electrode wire body；
Described method separately includes:
The first repair line is first used to connect the reparation point on two strip circuits of described holding wire；
Re-use the 4th repair line and connect corresponding institute on described first light shielding part and described second light shielding part
State the reparation point of public electrode wire body；The position of wherein said 4th repair line is according to institute
The position stating the first repair line is arranged, and described 4th repair line does not weighs with described first repair line
Folded.
The restorative procedure of array base palte line fault the most according to claim 4, its feature exists
The line broken circuit in described crossover region or short is included in: the line fault of described array base palte
Road.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410242159.4A CN103984132B (en) | 2014-05-31 | 2014-05-31 | A kind of restorative procedure of array base palte line fault |
| PCT/CN2014/079432 WO2015180202A1 (en) | 2014-05-31 | 2014-06-07 | Method for repairing array substrate line fault |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410242159.4A CN103984132B (en) | 2014-05-31 | 2014-05-31 | A kind of restorative procedure of array base palte line fault |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103984132A CN103984132A (en) | 2014-08-13 |
| CN103984132B true CN103984132B (en) | 2016-08-17 |
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| CN201410242159.4A Expired - Fee Related CN103984132B (en) | 2014-05-31 | 2014-05-31 | A kind of restorative procedure of array base palte line fault |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN103984132B (en) |
| WO (1) | WO2015180202A1 (en) |
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| CN107909954B (en) * | 2017-12-27 | 2021-03-05 | Tcl华星光电技术有限公司 | Display panel repairing method and device |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200918985A (en) * | 2007-10-18 | 2009-05-01 | Hannstar Display Corp | Display apparatus and repairing method thereof |
| CN101452164A (en) * | 2007-12-07 | 2009-06-10 | 北京京东方光电科技有限公司 | TFT-LCD array substrate |
| CN102981291A (en) * | 2012-12-04 | 2013-03-20 | 深圳市华星光电技术有限公司 | Broken line repair method and broken line repair structure |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100623989B1 (en) * | 2000-05-23 | 2006-09-13 | 삼성전자주식회사 | Thin film transistor panels for liquid crystal display and methods for repairing the same |
| CN100590503C (en) * | 2007-02-05 | 2010-02-17 | 中华映管股份有限公司 | Liquid crystal display panel |
| TWI354172B (en) * | 2007-03-21 | 2011-12-11 | Au Optronics Corp | Pixel array substrate |
| CN100428481C (en) * | 2007-04-28 | 2008-10-22 | 上海广电光电子有限公司 | Thin film transistor array base board and its repairing method |
| CN101399272B (en) * | 2007-09-27 | 2011-10-12 | 北京京东方光电科技有限公司 | Thin-film transistor array substrate |
| JP2013068645A (en) * | 2010-01-28 | 2013-04-18 | Sharp Corp | Method for correcting defect in display device, display device, and method for manufacturing the same |
| CN102759829A (en) * | 2012-07-03 | 2012-10-31 | 深圳市华星光电技术有限公司 | Broken line repairing device and method of array substrate |
-
2014
- 2014-05-31 CN CN201410242159.4A patent/CN103984132B/en not_active Expired - Fee Related
- 2014-06-07 WO PCT/CN2014/079432 patent/WO2015180202A1/en active Application Filing
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200918985A (en) * | 2007-10-18 | 2009-05-01 | Hannstar Display Corp | Display apparatus and repairing method thereof |
| CN101452164A (en) * | 2007-12-07 | 2009-06-10 | 北京京东方光电科技有限公司 | TFT-LCD array substrate |
| CN102981291A (en) * | 2012-12-04 | 2013-03-20 | 深圳市华星光电技术有限公司 | Broken line repair method and broken line repair structure |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103984132A (en) | 2014-08-13 |
| WO2015180202A1 (en) | 2015-12-03 |
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