WO2015180202A1 - Method for repairing array substrate line fault - Google Patents

Method for repairing array substrate line fault Download PDF

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Publication number
WO2015180202A1
WO2015180202A1 PCT/CN2014/079432 CN2014079432W WO2015180202A1 WO 2015180202 A1 WO2015180202 A1 WO 2015180202A1 CN 2014079432 W CN2014079432 W CN 2014079432W WO 2015180202 A1 WO2015180202 A1 WO 2015180202A1
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WO
WIPO (PCT)
Prior art keywords
line
repair
sub
lines
array substrate
Prior art date
Application number
PCT/CN2014/079432
Other languages
French (fr)
Chinese (zh)
Inventor
高鹏
高冬子
Original Assignee
深圳市华星光电技术有限公司
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Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Publication of WO2015180202A1 publication Critical patent/WO2015180202A1/en

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body

Definitions

  • the invention relates to a thin film field effect transistor liquid crystal display, in particular to a method for repairing an array substrate fault.
  • the scan line and the signal line may cause line failure (short circuit or open circuit) due to process defects.
  • the line fault is often repaired by laser chemical vapor deposition. Method (LCVD) for repair.
  • the laser chemical vapor deposition repair method is to introduce a reaction raw material gas under a vacuum condition, and chemically react with a gas on the surface of the substrate and the vicinity thereof under the action of a laser beam to deposit a film on the surface of the substrate.
  • the line fault near the functional area of the thin film transistor for example, when the line fault occurs in the overlapping area of the scanning line and the signal line or the overlapping area of the signal line and the common electrode line, the repair cannot be completed, only The ability to scrap the product wastes resources and increases production costs.
  • the invention provides an optimized traditional laser chemical vapor deposition repairing method, which provides more repair possibilities for repairing line faults and improves product yield.
  • the object of the present invention is to provide a method for repairing a line fault of an array substrate, which solves the technical problem that the line fault cannot be repaired when the line fault occurs in the overlapping area, and the yield of the product is low, thereby wasting resources and increasing production cost.
  • the present invention constructs a method for repairing an array substrate line fault, and the method includes:
  • each of the overlapping areas is simultaneously disconnected, so that each line after the disconnection includes Two sub-lines, the sub-line including a first end point and a second end point, the second end point of the sub-line being farther from the overlapping area than the first end point of the sub-line;
  • the overlap region includes a first overlap region formed by overlapping a signal line and a scan line, the repair line including a first repair line and a second repair line:
  • the overlap region includes a second overlap region formed by overlapping signal lines and a common electrode line, the repair line including a first repair line and a third repair line:
  • the line fault of the array substrate includes a line break in the overlap region.
  • the line fault of the array substrate includes a short circuit in the overlap region.
  • the present invention constructs a method for repairing an array substrate line fault, and the method includes:
  • each of the overlapping areas is simultaneously disconnected, so that each line after the disconnection includes Two sub-lines, the sub-line including a first end point and a second end point, the second end point of the sub-line being farther from the overlapping area than the first end point of the sub-line;
  • the overlap region includes a first overlap region, the first overlap region is formed by overlapping signal lines and scan lines, and the repair line includes a first repair Line and second repair line:
  • the overlap region includes a first overlap region, the first overlap region is formed by overlapping signal lines and scan lines, and the repair line includes a first repair Line and second repair line:
  • the overlap region includes a second overlap region, and the second overlap region is formed by overlapping signal lines with a common electrode line, the repair line including the first Repair line and third repair line:
  • the overlap region includes a second overlap region, and the second overlap region is formed by overlapping signal lines with a common electrode line, the repair line including the first Repair line and third repair line:
  • the line fault of the array substrate includes a line break or a short circuit in the overlap region.
  • the present invention also constructs another method for repairing an array substrate line fault, the method comprising:
  • the common electrode line includes a body portion and a light shielding portion disposed at an edge of the pixel unit on the array substrate
  • the light shielding portion includes a first light shielding portion and a second light shielding portion, and the first light shielding portion and the second light shielding portion are located on both sides of a signal line between two adjacent pixel units;
  • the body portion of the disconnected signal line and the common electrode line each include two sub-lines, the sub-line including An endpoint and a second endpoint; the second endpoint of the sub-line being further from the overlap region than the first endpoint of the sub-line;
  • Fixing points corresponding to the common electrode line body portion are disposed on the first light shielding portion and the second light shielding portion, and the repair points on the first light shielding portion and the second light shielding portion are both a first end of the sub-line of the body portion of the common electrode line is remote from the overlap region;
  • a repair point corresponding to the common electrode line body portion on the first light shielding portion and the second light shielding portion is connected using a fourth repair line.
  • the first repair line is used to connect the repair points on the two sub-lines of the signal line;
  • the repair point of the first light-shielding portion and the second light-shielding portion corresponding to the common electrode line body portion is first connected by using a fourth repair line;
  • the method for repairing a line fault of an array substrate of the present invention can repair an open circuit or an open circuit or a short circuit fault occurring in an overlapping area between a signal line and a scan line on an array substrate or an intersection of a signal line and a common electrode line.
  • the method solves the defects that the line fault repair method of the prior art cannot repair the faults occurring in the overlapping area of two or more lines, can improve the yield of the product, save resources, and reduce the production cost.
  • FIG. 1 is a schematic diagram of a method for repairing a line fault of an array substrate according to a first embodiment of the present invention
  • Figure 2 is a partial enlarged view of the repair line area of Figure 1;
  • FIG. 3 is a schematic diagram of a method for repairing a line fault of an array substrate according to a second embodiment of the present invention
  • Figure 4 is a partial enlarged view of the repair line area of Figure 3;
  • FIG. 5 is a schematic diagram of a method for repairing a line fault of an array substrate according to a third embodiment of the present invention.
  • Figure 6 is a partial enlarged view of the repair line area of Figure 5.
  • the thin film field effect transistor liquid crystal display of the prior art comprises an array substrate, wherein the array substrate comprises a data line, a scan line and a plurality of pixel units formed by the data line and the scan line interlaced; the scan line and the common electrode line are located at the first a metal layer, the data line is located on the second metal layer, the second metal layer is located above the first metal layer, the transparent conductive layer is located above the second metal layer, and the first metal layer and the second metal layer are separated by an insulating layer .
  • Two shading lines are disposed on two sides of the signal line between the two pixel units on the array substrate, and one shading line is disposed on the left side of the signal line, and another shading line is disposed on the right side of the signal line, and the common electrode line is respectively Connected to two of the shading lines.
  • the method for repairing an array substrate line fault in the present invention includes:
  • each of the overlapping areas is simultaneously disconnected, so that each line after the disconnection includes Two sub-lines, the sub-line including a first end point and a second end point; the second end point of the sub-line is farther from the overlapping area than the first end point of the sub-line;
  • the location of the line fault is an overlapping area formed by three or more lines, which are all within the protection scope of the present invention, and are not enumerated here.
  • the specific generation process of the repair line is: removing the pixel transparent electrode layer at a position corresponding to the repair line to be generated by laser; and repairing the repair point on the sub line
  • the insulating layer of the surface is removed by laser; the film is coated on the repair point of the sub-line by laser chemical vapor deposition; to form the repair line (of course, other existing repair line generation methods are also available in the present invention).
  • the line fault of the array substrate includes a line break or short circuit in the overlap region.
  • the method for repairing a line fault of an array substrate of the present invention can repair an open circuit or an open circuit or a short circuit fault occurring in an overlapping area between a signal line and a scan line on an array substrate or an intersection of a signal line and a common electrode line.
  • the method solves the defects that the line fault repair method of the prior art cannot repair the faults occurring in the overlapping area of two or more lines, can improve the yield of the product, save resources, and reduce the production cost.
  • FIG. 1 is a schematic diagram of a method for repairing a line fault of an array substrate according to a first embodiment of the present invention.
  • the first overlap region 20 is combined with FIG.
  • the signal line 11 and the scan line 12 are simultaneously disconnected, so that the signal line 11 forms two break points 111 and 113, and the disconnected signal line 11 includes a first sub-signal line and a second sub-signal.
  • the first sub-signal line being a line between a first end point of the first sub-signal line (same as the break point 111) and a second end point 112 of the first sub-signal line;
  • the two sub-signal lines are the line between the first end point of the second sub-signal line (same as the break point 113) and the second end point 114 of the second sub-signal line, ie, the first of the first sub-signal lines
  • the two endpoints 112 are farther from the overlap region 20 than the first endpoint 111 of the first sub-signal line; that is, the second endpoint 114 of the second sub-signal line is closer to the second sub-signal line
  • the first end point 113 is remote from the overlap region 20.
  • the scan line 12 forms two break points 121 and 123, the broken scan line 12 includes a first sub-scan line and a second sub-scan line, and the first sub-scan line is the first sub-scan a line between a first end of the line (same as the break point 121) and a second end point 122 of the first sub-scan line; the second sub-scan line being the first end of the second sub-scan line a line between the point (same as the break point 123) and the second end point 124 of the second sub-scan line, that is, the second end point 122 of the first sub-scan line is closer to the first sub-scan line
  • the first end point 121 is away from the overlapping area 20; that is, the second end point 124 of the second sub-scanning line is farther from the first end point 123 of the second sub-scanning line.
  • Overlapping area 20 is
  • a repair point 211 is disposed on the first sub-signal line, the repair point 211 is farther from the overlap region 20 than the first end point 111 of the first sub-signal line;
  • a repair point 212 is disposed on the second sub-signal line, the repair point 212 is farther from the overlap region 20 than the first end point 113 of the second sub-signal line;
  • the repair points 211 and 212 on the two sub-lines of the signal line 11 are connected using the first repair line 21.
  • a repair point 221 is disposed on the first sub-scan line, the repair point 221 is farther from the overlap region 20 than the first end point 121 of the first sub-scan line;
  • a repair point 222 is disposed on the second sub-scan line, the repair point 222 is farther from the overlap region 20 than the first end point 123 of the second sub-scan line;
  • the repair points 221 and 222 on the two sub-lines of the scan line 12 are connected using a second repair line 22.
  • the signal line 11 may be repaired first, that is, the repair points 211 and 212 on the two sub-lines of the signal line 11 are connected by using the first repair line 21;
  • the second repair line 22 is used to connect the repair points 221 and 222 on the two sub-lines of the scan line 12, wherein the position of the second repair line 22 should be set according to the position of the first repair line 21, So that the second repair line 22 and the first repair line 21 do not overlap each other, so that the repair effect is better.
  • Another embodiment of the present embodiment is: first repairing the scan line 12, that is, first using the second repair line 22 to connect the repair points 221 and 222 on the two sub-lines of the scan line 12;
  • the first repair line 21 is used to connect the repair points 211 and 212 on the two sub-lines of the signal line 11, wherein the position of the first repair line 21 should be set according to the position of the second repair line 22, So that the first repair line 21 and the second repair line 22 do not overlap each other, so that the repair effect is better.
  • the specific generation process of the repair line is: removing the pixel transparent electrode layer at a position corresponding to the repair line to be generated by laser; and repairing the repair point on the sub line
  • the insulating layer of the surface is removed by laser; the film is coated on the repair point of the sub-line by laser chemical vapor deposition; to form the repair line (of course, other existing repair line generation methods are also available in the present invention).
  • the line fault of the array substrate includes a line break or short circuit in the overlap region.
  • the location of the line fault may also be an overlapping area formed by three or more lines.
  • the repairing method is the same as the above method, and is within the protection scope of the present invention, and is not enumerated here.
  • the method for repairing a line fault of an array substrate of the present invention can repair an open circuit or an open circuit or a short circuit fault occurring in an overlapping area between a signal line and a scan line on an array substrate or an intersection of a signal line and a common electrode line.
  • the method solves the defects that the line fault repair method of the prior art cannot repair the faults occurring in the overlapping area of two or more lines, can improve the yield of the product, save resources, and reduce the production cost.
  • FIG. 3 is a schematic diagram of a method for repairing a line fault of an array substrate according to a second embodiment of the present invention.
  • a line fault of the array substrate includes a line break or short circuit in the overlap region.
  • the second overlap region is combined with FIG.
  • the signal line 11 and the common electrode line 13 in 30 are simultaneously disconnected, the signal line 11 forms two break points 111 and 113, and the broken signal line 11 includes a first sub-signal line and a second sub- a signal line, the first sub-signal line being a line between a first end point of the first sub-signal line (same as the break point 111) and a second end point 112 of the first sub-signal line;
  • the second sub-signal line is formed by a line between the first end point of the second sub-signal line (same as the break point 113) and the second end point 114 of the second sub-signal line, that is, the first sub-
  • the second end point 112 of the signal line is closer to the overlap region 30 than the first end point 111 of the first sub-signal line; the second end point 114 of the
  • the common electrode line 13 forms two break points 131 and 133, and the disconnected common electrode line 13 includes a first sub-common electrode line and a second sub-common electrode line, and the first sub-common electrode line is a first end of the first sub-common electrode line (the same as the break point 131) and a line between the second end point 132 of the first sub-common electrode line; the second sub-common electrode line is the second sub- a line between a first end point of the common electrode line (identical to the break point 133) and a second end point 134 of the second sub-common electrode line, that is, the second end point of the first sub-common electrode line 132 is closer to the overlap region 30 than the first end point 131 of the first sub-common electrode line; that is, the second end point 134 of the second sub-common electrode line is closer to the second sub-common electrode
  • the first end point 133 of the line is away from the overlap region 30;
  • a repair point 311 is disposed on the first sub-signal line, the repair point 311 is farther from the overlap region 30 than the first end point 111 of the first sub-signal line;
  • a repair point 312 is disposed on the second sub-signal line, the repair point 312 is farther from the overlap region 30 than the first end point 113 of the second sub-signal line;
  • the repair points 311 and 312 on the two sub-lines of the signal line 11 are connected using the first repair line 31.
  • a repair point 321 is disposed on the first sub-common electrode line, the repair point 321 is away from the overlap region 30 than the first end point 131 of the first sub-common electrode line;
  • a repair point 322 is disposed on the second sub-common electrode line, the repair point 322 is away from the overlap region 30 than the first end point 133 of the second sub-common electrode line;
  • the repair points 321 and 322 on the two sub-lines of the common electrode line 13 are connected using a third repair line 32.
  • the signal line 11 can be repaired first, that is, the repair points 311 and 312 on the two sub-lines of the signal line are connected by using the first repair line 31;
  • the third repair line 32 is used to connect the repair points 321 and 322 on the two sub-lines of the common electrode line 13, wherein the position of the third repair line 32 should be set according to the position of the first repair line 31.
  • the third repair line 32 and the first repair line 31 are not overlapped with each other to make the repair effect better.
  • Another embodiment of the present invention is that the common electrode line 13 can be repaired first, that is, the repair points 321 and 322 on the two sub-lines of the common electrode line 13 are connected first by using the third repair line 32;
  • the first repair line 31 is used to connect the repair points 311 and 312 on the two sub-lines of the signal line 11, wherein the position of the first repair line 31 should be set according to the position of the third repair line 32. So that the first repair line 31 and the third repair line 32 do not overlap each other, so that the repair effect is better.
  • the specific generation process of the repair line is: removing the pixel transparent electrode layer at a position corresponding to the repair line to be generated by laser; and repairing the repair point on the sub line
  • the insulating layer of the surface is removed by laser; the film is coated on the repair point of the sub-line by laser chemical vapor deposition; to form the repair line (of course, other existing repair line generation methods are also available in the present invention).
  • the line fault of the array substrate includes a line break or short circuit in the overlap region.
  • the location of the line fault may also be an overlapping area formed by three or more lines.
  • the repairing method is the same as the above method, and is within the protection scope of the present invention, and is not enumerated here.
  • the method for repairing a line fault of an array substrate of the present invention provides a method for repairing an open or short circuit fault occurring in an overlap region between a signal line and a scan line on an array substrate or an overlap region between a signal line and a common electrode line.
  • FIG. 5 is a schematic diagram of a method for repairing a line fault of an array substrate according to a third embodiment of the present invention.
  • the common electrode line in the prior art is improved, and the improved common electrode line includes the body portion 13 (the common electrode line in the prior art) and the light shielding portions 14, 15 That is, the two light-shielding lines on both sides of the signal line 11 between the two pixel units in the prior art are replaced by the light-shielding portion, and have the same function as the light-shielding line in the prior art.
  • the light shielding portion includes a first light shielding portion 14 located on a left side of a signal line between two pixel units, and a second light blocking portion 15 located at two pixel units Between the right side of the signal line.
  • a line fault of the array substrate includes a line break or short circuit in the overlap region.
  • the common electrode line 13 includes a light shielding portion disposed at an edge of the pixel unit on the array substrate 14 and 15 and the body portion 13
  • the light shielding portion includes a first light shielding portion 14 and a second light shielding portion 15, the first light shielding portion 14 and the second light shielding portion 15 are located between signal lines between two adjacent pixel units Both sides;
  • the signal line 11 in the overlap region and the body portion 13 of the common electrode line are simultaneously disconnected, and the broken region is between the first light blocking portion 14 and the second light blocking portion 15,
  • the body portion 13 of the disconnected signal line 11 and the common electrode line each includes two sub-lines, the signal line 11 forms two break points 111 and 113, and the broken signal line 11 includes a sub-signal line and a second sub-signal line, the first sub-signal line being a first end point of the first sub-signal line (same as the break point 111) and a second end point of the first sub-signal line a line between 112;
  • the second sub-signal line is a line between a first end point of the second sub-signal line (same as breakpoint 113) and a second end point 114 of the second sub-signal line That is, the second end point 112 of the first sub-signal line is farther from the overlap region 40 than the first end point 111 of the first sub-signal line; the The second endpointpoint 11
  • the body portion 13 of the common electrode line forms two break points 131 and 133, and the first light blocking portion 14 is offset from the break point 131 by the overlap region 40 and the second light blocking portion 15 from the break point 133 Deviating from the overlapping region 40;
  • the disconnected common electrode line body portion 13 includes a first sub-body portion and a second sub-body portion, the first sub-body portion being the first sub-body portion a line between an end point (same as breakpoint 131) and a second end point 132 of the first sub-body portion, and a second sub-body portion being the first end point of the second sub-body portion (same as breakpoint 133) And a line between the second end point 134 of the second sub-body portion, that is, the second end point 132 of the first sub-body portion is further away from the first end point 131 of the first sub-body portion
  • the overlap region 40; that is, the second end point 134 of the second sub-body portion is farther from the overlap region 40 than the first end point 133 of the second
  • a repair point 411 is disposed on the first sub-signal line, the repair point 411 is farther from the overlap region 40 than the first end point 111 of the first sub-signal line;
  • a repair point 412 is disposed on the second sub-signal line, the repair point 412 is farther from the overlap region 40 than the first end point 113 of the second sub-signal line;
  • the repair points 411 and 412 on the two sub-lines of the signal line 11 are connected using the first repair line 41.
  • a repair point 421 is disposed on the first light shielding portion 14 , and a repair point 422 is disposed on the second light shielding portion 15 .
  • the repair point 421 is away from the first end point 131 of the first sub body portion.
  • the overlap region 40; the repair point 422 is farther from the overlap region 40 than the first end point 133 of the second sub-body portion;
  • the voltage on the first light shielding portion 14 is the same as the voltage on the body portion 13 of the common electrode line
  • the voltage on the second light shielding portion 15 is also the same as the voltage on the body portion 13 of the common electrode line.
  • a repair point corresponding to the common electrode line main body portion 13 is provided in each of the first light blocking portion 14 and the second light blocking portion 15, and the repair point 421 on the first light blocking portion 14 corresponds to the first A repair point on a sub-body portion, the repair point 422 on the second light-shielding portion 15 corresponds to a repair point on the second sub-body portion.
  • the repair points 421 and 422 on the first light blocking portion 14 and the second light blocking portion 15 are connected using a fourth repair line 42.
  • the position of the fourth repairing line 42 is set according to the position of the first repairing line 41, and the fourth repairing line 42 does not overlap with the first repairing line 41, so that the repairing effect is better.
  • the position of the first repairing line 41 is set according to the position of the fourth repairing line 42.
  • the first repairing line 41 and the fourth repairing line 42 do not overlap, so that the repairing effect is better.
  • the location of the line fault may also be an overlapping area formed by three or more lines, which are all within the scope of the present invention, and are not enumerated here.
  • the repair point of the common electrode line is disposed on the light shielding portion, the position of the repair line is more convenient, and the problem of overlapping between the repair lines can be better avoided, and the repair work is reduced. Quantity, improve repair efficiency and reduce production costs.

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Abstract

A method for repairing an array substrate line fault, the method comprising: when the position of a line fault is located in an overlapping area formed by at least two lines on an array substrate, simultaneously disconnecting each line in the overlapping area to enable each line to include two sub-lines, and to utilize repairing lines to connect repairing points on the two sub-lines of the same line. The method solves the technical problems of low finished product rates and high production costs of an existing repairing method.

Description

一种阵列基板线路故障的修复方法 Method for repairing line fault of array substrate 技术领域Technical field
本发明涉及一种薄膜场效应晶体管液晶显示器，特别是涉及一种阵列基板线路故障的修复方法。The invention relates to a thin film field effect transistor liquid crystal display, in particular to a method for repairing an array substrate fault.
背景技术Background technique
薄膜场效应晶体管液晶显示器在实际生产过程中，扫描线和信号线会由于制程缺陷而产生线路故障（短路或者断路），为提升实际生产产品的成品率，线路故障往往会采用激光化学气相沉积修复方法（LCVD）进行修复。激光化学气相沉积修复方法是在真空条件下，通入反应原料气体，在激光束作用下与基体表面及其附近的气体发生化学反应，在基体表面沉积薄膜。In the actual production process of the thin film FET liquid crystal display, the scan line and the signal line may cause line failure (short circuit or open circuit) due to process defects. In order to improve the yield of the actual production product, the line fault is often repaired by laser chemical vapor deposition. Method (LCVD) for repair. The laser chemical vapor deposition repair method is to introduce a reaction raw material gas under a vacuum condition, and chemically react with a gas on the surface of the substrate and the vicinity thereof under the action of a laser beam to deposit a film on the surface of the substrate.
但是受常规长线修复手法限制，靠近薄膜晶体管功能区域的线路故障，譬如当线路故障出现在扫描线和信号线的交叠区或者信号线和公共电极线的交叠区，往往无法完成修复，只能将产品报废掉，既浪费资源，同时也增加了生产成本。However, due to the conventional long-line repair method, the line fault near the functional area of the thin film transistor, for example, when the line fault occurs in the overlapping area of the scanning line and the signal line or the overlapping area of the signal line and the common electrode line, the repair cannot be completed, only The ability to scrap the product wastes resources and increases production costs.
本发明提供优化传统激光化学气相沉积修复方法，为线路故障的修复提供更多修复可能性，同时提高产品的成品率。The invention provides an optimized traditional laser chemical vapor deposition repairing method, which provides more repair possibilities for repairing line faults and improves product yield.
技术问题technical problem
本发明的目的在于提供一种阵列基板线路故障的修复方法，以解决线路故障出现在交叠区时无法修复，产品的成品率低下，从而浪费资源、增加生产成本的技术问题。The object of the present invention is to provide a method for repairing a line fault of an array substrate, which solves the technical problem that the line fault cannot be repaired when the line fault occurs in the overlapping area, and the yield of the product is low, thereby wasting resources and increasing production cost.
技术解决方案Technical solution
为解决上述技术问题，本发明构造了一种阵列基板线路故障的修复方法，所述方法包括： In order to solve the above technical problem, the present invention constructs a method for repairing an array substrate line fault, and the method includes:
检测所述阵列基板上线路故障的位置；Detecting a location of a line fault on the array substrate;
当所述线路故障的位置位于阵列基板上的至少两条线路形成的交叠区时，将所述交叠区中的每条线路同时断开，以使得所述断开后的每条线路包括两条子线路，所述子线路包括第一端点以及第二端点，所述子线路的所述第二端点较所述子线路的所述第一端点远离所述交叠区；When the location of the line fault is located in an overlapping area formed by at least two lines on the array substrate, each of the overlapping areas is simultaneously disconnected, so that each line after the disconnection includes Two sub-lines, the sub-line including a first end point and a second end point, the second end point of the sub-line being farther from the overlapping area than the first end point of the sub-line;
在所述子线路上设置修复点，所述修复点较所述子线路的第一端点远离所述交叠区； Providing a repair point on the sub-line, the repair point being farther from the overlap area than a first end point of the sub-line;
所述交叠区包括第一交叠区，所述第一交叠区由信号线与扫描线交叠形成，所述修复线包括第一修复线和第二修复线：The overlap region includes a first overlap region formed by overlapping a signal line and a scan line, the repair line including a first repair line and a second repair line:
先使用所述第一修复线连接所述信号线的两条子线路上的修复点；First using the first repair line to connect the repair points on the two sub-lines of the signal line;
再使用所述第二修复线连接所述扫描线的两条子线路上的修复点，其中所述第二修复线的位置根据所述第一修复线的位置设置，且所述第二修复线与所述第一修复线不重叠；And using the second repair line to connect the repair points on the two sub-lines of the scan line, wherein a position of the second repair line is set according to a position of the first repair line, and the second repair line is The first repair lines do not overlap;
所述交叠区包括第二交叠区，所述第二交叠区由信号线与公共电极线交叠形成，所述修复线包括第一修复线和第三修复线：The overlap region includes a second overlap region formed by overlapping signal lines and a common electrode line, the repair line including a first repair line and a third repair line:
先使用所述第一修复线连接所述信号线的两条子线路上的修复点；以及First using the first repair line to connect the repair points on the two sub-lines of the signal line;
再使用所述第三修复线连接所述公共电极线的两条子线路上的修复点，其中所述第三修复线的位置根据所述第一修复线的位置设置，所述第三修复线与所述第一修复线不重叠。 And using the third repair line to connect the repair points on the two sub-lines of the common electrode line, wherein a position of the third repair line is set according to a position of the first repair line, and the third repair line is The first repair lines do not overlap.
在本发明的阵列基板线路故障的修复方法中，所述阵列基板的线路故障包括所述交叠区中的线路断路。In the method for repairing an array substrate line fault of the present invention, the line fault of the array substrate includes a line break in the overlap region.
在本发明的阵列基板线路故障的修复方法中，所述阵列基板的线路故障包括所述交叠区中的线路短路。In the method for repairing an array substrate line failure of the present invention, the line fault of the array substrate includes a short circuit in the overlap region.
为解决上述技术问题，本发明构造了一种阵列基板线路故障的修复方法，所述方法包括：In order to solve the above technical problem, the present invention constructs a method for repairing an array substrate line fault, and the method includes:
检测所述阵列基板上线路故障的位置；Detecting a location of a line fault on the array substrate;
当所述线路故障的位置位于阵列基板上的至少两条线路形成的交叠区时，将所述交叠区中的每条线路同时断开，以使得所述断开后的每条线路包括两条子线路，所述子线路包括第一端点以及第二端点，所述子线路的所述第二端点较所述子线路的所述第一端点远离所述交叠区；When the location of the line fault is located in an overlapping area formed by at least two lines on the array substrate, each of the overlapping areas is simultaneously disconnected, so that each line after the disconnection includes Two sub-lines, the sub-line including a first end point and a second end point, the second end point of the sub-line being farther from the overlapping area than the first end point of the sub-line;
在所述子线路上设置修复点，所述修复点较所述子线路的第一端点远离所述交叠区；以及Providing a repair point on the sub-line, the repair point being farther from the overlap area than the first end of the sub-line;
使用修复线连接属于同一线路的两条子线路上的修复点。Use repair wires to connect repair points on two sub-lines that belong to the same line.
在本发明的阵列基板线路故障的修复方法中，所述交叠区包括第一交叠区，所述第一交叠区由信号线与扫描线交叠形成，所述修复线包括第一修复线和第二修复线：In the method for repairing an array substrate fault of the present invention, the overlap region includes a first overlap region, the first overlap region is formed by overlapping signal lines and scan lines, and the repair line includes a first repair Line and second repair line:
先使用所述第一修复线连接所述信号线的两条子线路上的修复点；First using the first repair line to connect the repair points on the two sub-lines of the signal line;
再使用所述第二修复线连接所述扫描线的两条子线路上的修复点，其中所述第二修复线的位置根据所述第一修复线的位置设置，且所述第二修复线与所述第一修复线不重叠。And using the second repair line to connect the repair points on the two sub-lines of the scan line, wherein a position of the second repair line is set according to a position of the first repair line, and the second repair line is The first repair lines do not overlap.
在本发明的阵列基板线路故障的修复方法中，所述交叠区包括第一交叠区，所述第一交叠区由信号线与扫描线交叠形成，所述修复线包括第一修复线和第二修复线:In the method for repairing an array substrate fault of the present invention, the overlap region includes a first overlap region, the first overlap region is formed by overlapping signal lines and scan lines, and the repair line includes a first repair Line and second repair line:
先使用所述第二修复线连接所述扫描线的两条子线路上的修复点；First using the second repair line to connect the repair points on the two sub-lines of the scan line;
再使用所述第一修复线连接所述信号线的两条子线路上的修复点，其中所述第一修复线的位置根据所述第二修复线的位置设置，所述第一修复线与所述第二修复线不重叠。 And using the first repair line to connect the repair points on the two sub-lines of the signal line, wherein the position of the first repair line is set according to the position of the second repair line, the first repair line and the The second repair lines do not overlap.
在本发明的阵列基板线路故障的修复方法中，所述交叠区包括第二交叠区，所述第二交叠区由信号线与公共电极线交叠形成，所述修复线包括第一修复线和第三修复线：In the method for repairing an array substrate fault of the present invention, the overlap region includes a second overlap region, and the second overlap region is formed by overlapping signal lines with a common electrode line, the repair line including the first Repair line and third repair line:
先使用所述第一修复线连接所述信号线的两条子线路上的修复点；First using the first repair line to connect the repair points on the two sub-lines of the signal line;
再使用所述第三修复线连接所述公共电极线的两条子线路上的修复点，其中所述第三修复线的位置根据所述第一修复线的位置设置，所述第三修复线与所述第一修复线不重叠。 And using the third repair line to connect the repair points on the two sub-lines of the common electrode line, wherein a position of the third repair line is set according to a position of the first repair line, and the third repair line is The first repair lines do not overlap.
在本发明的阵列基板线路故障的修复方法中，所述交叠区包括第二交叠区，所述第二交叠区由信号线与公共电极线交叠形成，所述修复线包括第一修复线和第三修复线：In the method for repairing an array substrate fault of the present invention, the overlap region includes a second overlap region, and the second overlap region is formed by overlapping signal lines with a common electrode line, the repair line including the first Repair line and third repair line:
先使用所述第三修复线连接所述公共电极线的两条子线路上的修复点；First using the third repair line to connect the repair points on the two sub-lines of the common electrode line;
再使用所述第一修复线连接所述信号的两条子线路上的修复点；其中所述第一修复线的位置根据所述第三修复线的位置设置，所述第一修复线与所述第三修复线不重叠。 And using the first repair line to connect repair points on the two sub-lines of the signal; wherein a position of the first repair line is set according to a position of the third repair line, the first repair line and the The third repair lines do not overlap.
在本发明的阵列基板线路故障的修复方法中，所述阵列基板的线路故障包括所述交叠区中的线路断路或者短路。In the method for repairing an array substrate line fault of the present invention, the line fault of the array substrate includes a line break or a short circuit in the overlap region.
本发明还构造了另一种阵列基板线路故障的修复方法，所述方法包括：The present invention also constructs another method for repairing an array substrate line fault, the method comprising:
检测所述阵列基板上线路故障的位置；Detecting a location of a line fault on the array substrate;
当所述线路故障的位置位于阵列基板上的信号线和公共电极线形成的交叠区时，其中所述公共电极线包括本体部和在所述阵列基板上的像素单元边缘设置的遮光部，所述遮光部包括第一遮光部和第二遮光部，所述第一遮光部和第二遮光部位于相邻两个像素单元之间的信号线的两侧；When the location of the line fault is located in an overlapping region formed by the signal line and the common electrode line on the array substrate, wherein the common electrode line includes a body portion and a light shielding portion disposed at an edge of the pixel unit on the array substrate, The light shielding portion includes a first light shielding portion and a second light shielding portion, and the first light shielding portion and the second light shielding portion are located on both sides of a signal line between two adjacent pixel units;
将所述交叠区中的信号线和公共电极线的本体部同时断开，以使得所述断开后的信号线和公共电极线的本体部均包括两条子线路，所述子线路包括第一端点以及第二端点；所述子线路的所述第二端点较所述子线路的所述第一端点远离所述交叠区；Separating the signal line in the overlap region and the body portion of the common electrode line simultaneously, so that the body portion of the disconnected signal line and the common electrode line each include two sub-lines, the sub-line including An endpoint and a second endpoint; the second endpoint of the sub-line being further from the overlap region than the first endpoint of the sub-line;
在所述信号线的子线路上设置修复点，所述信号线的子线路上的修复点较所述信号线的子线路的第一端点远离所述交叠区；Providing a repair point on a sub-line of the signal line, the repair point on the sub-line of the signal line being farther from the overlap area than the first end point of the sub-line of the signal line;
使用第一修复线连接所述信号线的两条子线路上的修复点； Using a first repair line to connect repair points on the two sub-lines of the signal line;
在所述第一遮光部和所述第二遮光部上均设置对应所述公共电极线本体部的修复点，所述第一遮光部和所述第二遮光部上的修复点均较所述公共电极线的本体部的子线路的第一端点远离所述交叠区；以及Fixing points corresponding to the common electrode line body portion are disposed on the first light shielding portion and the second light shielding portion, and the repair points on the first light shielding portion and the second light shielding portion are both a first end of the sub-line of the body portion of the common electrode line is remote from the overlap region;
使用第四修复线连接所述第一遮光部和所述第二遮光部上对应所述公共电极线本体部的修复点。A repair point corresponding to the common electrode line body portion on the first light shielding portion and the second light shielding portion is connected using a fourth repair line.
在本发明的阵列基板线路故障的修复方法中，先使用第一修复线连接所述信号线的两条子线路上的修复点；In the method for repairing an array substrate fault of the present invention, the first repair line is used to connect the repair points on the two sub-lines of the signal line;
再使用第四修复线连接所述第一遮光部和所述第二遮光部上对应所述公共电极线本体部的修复点；其中所述第四修复线的位置根据所述第一修复线的位置设置，所述第四修复线与所述第一修复线不重叠。 And using a fourth repair line to connect the repair points of the first light shielding portion and the second light shielding portion corresponding to the common electrode line body portion; wherein the position of the fourth repair line is according to the first repair line Position setting, the fourth repair line does not overlap with the first repair line.
在本发明的阵列基板线路故障的修复方法中，先使用第四修复线连接所述第一遮光部和所述第二遮光部上对应所述公共电极线本体部的修复点；In the method for repairing the line fault of the array substrate of the present invention, the repair point of the first light-shielding portion and the second light-shielding portion corresponding to the common electrode line body portion is first connected by using a fourth repair line;
再使用第一修复线连接所述信号线的两条子线路上的修复点；其中所述第一修复线的位置根据所述第四修复线的位置设置，所述第一修复线与所述第四修复线不重叠。 And using a first repair line to connect the repair points on the two sub-lines of the signal line; wherein a position of the first repair line is set according to a position of the fourth repair line, the first repair line and the first The four repair lines do not overlap.
有益效果 Beneficial effect
本发明的阵列基板线路故障的修复方法，能够对阵列基板上的信号线和扫描线之间的交叠区或者信号线和公共电极线的交叠区出现的断路或短路故障进行修复，通过上述方式，解决了现有技术的线路故障修复方法不能对两条或者两条以上线路的交叠区出现的故障进行修复的缺陷，能够提高产品的成品率，节约资源，降低生产成本。The method for repairing a line fault of an array substrate of the present invention can repair an open circuit or an open circuit or a short circuit fault occurring in an overlapping area between a signal line and a scan line on an array substrate or an intersection of a signal line and a common electrode line. The method solves the defects that the line fault repair method of the prior art cannot repair the faults occurring in the overlapping area of two or more lines, can improve the yield of the product, save resources, and reduce the production cost.
附图说明DRAWINGS
图1为本发明实施例中第一实施例的阵列基板线路故障的修复方法示意图；1 is a schematic diagram of a method for repairing a line fault of an array substrate according to a first embodiment of the present invention;
图2为图1中修复线区域的局部放大图；Figure 2 is a partial enlarged view of the repair line area of Figure 1;
图3为本发明实施例中第二实施例的阵列基板线路故障的修复方法示意图；3 is a schematic diagram of a method for repairing a line fault of an array substrate according to a second embodiment of the present invention;
图4为图3中修复线区域的局部放大图；Figure 4 is a partial enlarged view of the repair line area of Figure 3;
图5为本发明实施例中第三实施例的阵列基板线路故障的修复方法示意图；FIG. 5 is a schematic diagram of a method for repairing a line fault of an array substrate according to a third embodiment of the present invention; FIG.
图6为图5中修复线区域的局部放大图。Figure 6 is a partial enlarged view of the repair line area of Figure 5.
本发明的最佳实施方式BEST MODE FOR CARRYING OUT THE INVENTION
以下各实施例的说明是参考附加的图式，用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语，例如「上」、「下」、「前」、「后」、「左」、「右」、「内」、「外」、「侧面」等，仅是参考附加图式的方向。因此，使用的方向用语是用以说明及理解本发明，而非用以限制本发明。在图中，结构相似的单元是以相同标号表示。The following description of the various embodiments is provided to illustrate the specific embodiments of the invention. The directional terms mentioned in the present invention, such as "upper", "lower", "before", "after", "left", "right", "inside", "outside", "side", etc., are merely references. Attach the direction of the drawing. Therefore, the directional terminology used is for the purpose of illustration and understanding of the invention. In the figures, structurally similar elements are denoted by the same reference numerals.
现有技术中薄膜场效应晶体管液晶显示器包括阵列基板，阵列基板包括数据线、扫描线以及由所述数据线和所述扫描线交错形成的多个像素单元；扫描线和公共电极线位于第一金属层，数据线位于第二金属层，第二金属层位于第一金属层之上，透明导电层位于第二金属层之上，第一金属层和第二金属层之间通过绝缘层隔开。在阵列基板上两个像素单元之间的信号线的两侧设置有两条遮光线，信号线的左侧设置有一条遮光线，信号线的右侧设置有另外一条遮光线，公共电极线分别与两条所述遮光线连接。The thin film field effect transistor liquid crystal display of the prior art comprises an array substrate, wherein the array substrate comprises a data line, a scan line and a plurality of pixel units formed by the data line and the scan line interlaced; the scan line and the common electrode line are located at the first a metal layer, the data line is located on the second metal layer, the second metal layer is located above the first metal layer, the transparent conductive layer is located above the second metal layer, and the first metal layer and the second metal layer are separated by an insulating layer . Two shading lines are disposed on two sides of the signal line between the two pixel units on the array substrate, and one shading line is disposed on the left side of the signal line, and another shading line is disposed on the right side of the signal line, and the common electrode line is respectively Connected to two of the shading lines.
本发明中的阵列基板线路故障的修复方法，包括：The method for repairing an array substrate line fault in the present invention includes:
检测所述阵列基板上线路故障的位置；Detecting a location of a line fault on the array substrate;
当所述线路故障的位置位于阵列基板上的至少两条线路形成的交叠区时，将所述交叠区中的每条线路同时断开，以使得所述断开后的每条线路包括两条子线路，所述子线路包括第一端点以及第二端点；所述子线路的所述第二端点较所述子线路的所述第一端点远离所述交叠区；When the location of the line fault is located in an overlapping area formed by at least two lines on the array substrate, each of the overlapping areas is simultaneously disconnected, so that each line after the disconnection includes Two sub-lines, the sub-line including a first end point and a second end point; the second end point of the sub-line is farther from the overlapping area than the first end point of the sub-line;
譬如所述线路故障的位置是由三条或三条以上的线路形成的交叠区，均在本发明的保护范围之内，在此不一一列举。For example, the location of the line fault is an overlapping area formed by three or more lines, which are all within the protection scope of the present invention, and are not enumerated here.
在所述子线路上设置修复点，所述修复点较所述子线路的第一端点远离所述交叠区；以及Providing a repair point on the sub-line, the repair point being farther from the overlap area than the first end of the sub-line;
使用修复线连接属于同一线路的两条子线路上的修复点。Use repair wires to connect repair points on two sub-lines that belong to the same line.
所述修复线的具体生成过程为：在将要生成修复线对应的位置上的像素透明电极层用激光去除；同时将所述子线路上修复点 表面的绝缘层用激光去除；利用激光化学气相沉积方法在所述子线路的修复点上镀膜；以形成所述修复线（当然也可以是其他现有的修复线生成方法，均在本发明的保护范围内）。所述阵列基板的线路故障包括所述交叠区中的线路断路或者短路。The specific generation process of the repair line is: removing the pixel transparent electrode layer at a position corresponding to the repair line to be generated by laser; and repairing the repair point on the sub line The insulating layer of the surface is removed by laser; the film is coated on the repair point of the sub-line by laser chemical vapor deposition; to form the repair line (of course, other existing repair line generation methods are also available in the present invention). Within the scope of protection). The line fault of the array substrate includes a line break or short circuit in the overlap region.
本发明的阵列基板线路故障的修复方法，能够对阵列基板上的信号线和扫描线之间的交叠区或者信号线和公共电极线的交叠区出现的断路或短路故障进行修复，通过上述方式，解决了现有技术的线路故障修复方法不能对两条或者两条以上线路的交叠区出现的故障进行修复的缺陷，能够提高产品的成品率，节约资源，降低生产成本。The method for repairing a line fault of an array substrate of the present invention can repair an open circuit or an open circuit or a short circuit fault occurring in an overlapping area between a signal line and a scan line on an array substrate or an intersection of a signal line and a common electrode line. The method solves the defects that the line fault repair method of the prior art cannot repair the faults occurring in the overlapping area of two or more lines, can improve the yield of the product, save resources, and reduce the production cost.
请参照图1，图1为本发明实施例中第一实施例的阵列基板线路故障的修复方法示意图。Please refer to FIG. 1. FIG. 1 is a schematic diagram of a method for repairing a line fault of an array substrate according to a first embodiment of the present invention.
检测所述阵列基板上线路故障的位置； Detecting a location of a line fault on the array substrate;
如图1所示，当所述线路故障的位置位于阵列基板上的信号线11与扫描线12交叠形成的第一交叠区20时，结合图2，将所述第一交叠区20中的所述信号线11和扫描线12同时断开，使得所述信号线11形成两个断点111和113，所述断开后的信号线11包括第一子信号线和第二子信号线，所述第一子信号线为所述第一子信号线的第一端点（与断点111相同）和所述第一子信号线的第二端点112之间的线路；所述第二子信号线为第二子信号线的第一端点（与断点113相同）和第二子信号线的第二端点114之间的线路，即所述第一子信号线的所述第二端点112较所述第一子信号线的所述第一端点111远离所述交叠区20；即所述第二子信号线的所述第二端点114较所述第二子信号线的所述第一端点113远离所述交叠区20。As shown in FIG. 1, when the location of the line fault is located in the first overlap region 20 formed by the signal line 11 on the array substrate overlapping the scan line 12, the first overlap region 20 is combined with FIG. The signal line 11 and the scan line 12 are simultaneously disconnected, so that the signal line 11 forms two break points 111 and 113, and the disconnected signal line 11 includes a first sub-signal line and a second sub-signal. a line, the first sub-signal line being a line between a first end point of the first sub-signal line (same as the break point 111) and a second end point 112 of the first sub-signal line; The two sub-signal lines are the line between the first end point of the second sub-signal line (same as the break point 113) and the second end point 114 of the second sub-signal line, ie, the first of the first sub-signal lines The two endpoints 112 are farther from the overlap region 20 than the first endpoint 111 of the first sub-signal line; that is, the second endpoint 114 of the second sub-signal line is closer to the second sub-signal line The first end point 113 is remote from the overlap region 20.
所述扫描线12形成两个断点121和123，所述断开后的扫描线12包括第一子扫描线和第二子扫描线，所述第一子扫描线为所述第一子扫描线的第一端点（与断点121相同）和所述第一子扫描线的第二端点122之间的线路；所述第二子扫描线为所述第二子扫描线的第一端点（与断点123相同）和所述第二子扫描线的第二端点124之间的线路形成，即所述第一子扫描线的所述第二端点122较所述第一子扫描线的所述第一端点121远离所述交叠区20；即所述第二子扫描线的所述第二端点124较所述第二子扫描线的所述第一端点123远离所述交叠区20；The scan line 12 forms two break points 121 and 123, the broken scan line 12 includes a first sub-scan line and a second sub-scan line, and the first sub-scan line is the first sub-scan a line between a first end of the line (same as the break point 121) and a second end point 122 of the first sub-scan line; the second sub-scan line being the first end of the second sub-scan line a line between the point (same as the break point 123) and the second end point 124 of the second sub-scan line, that is, the second end point 122 of the first sub-scan line is closer to the first sub-scan line The first end point 121 is away from the overlapping area 20; that is, the second end point 124 of the second sub-scanning line is farther from the first end point 123 of the second sub-scanning line. Overlapping area 20;
在所述第一子信号线上设置有修复点211，所述修复点211较所述第一子信号线的第一端点111远离所述交叠区20；a repair point 211 is disposed on the first sub-signal line, the repair point 211 is farther from the overlap region 20 than the first end point 111 of the first sub-signal line;
在所述第二子信号线上设置有修复点212，所述修复点212较所述第二子信号线的第一端点113远离所述交叠区20；a repair point 212 is disposed on the second sub-signal line, the repair point 212 is farther from the overlap region 20 than the first end point 113 of the second sub-signal line;
使用第一修复线21连接所述信号线11的两条子线路上的修复点211和212。The repair points 211 and 212 on the two sub-lines of the signal line 11 are connected using the first repair line 21.
在所述第一子扫描线上设置有修复点221，所述修复点221较所述第一子扫描线的第一端点121远离所述交叠区20；a repair point 221 is disposed on the first sub-scan line, the repair point 221 is farther from the overlap region 20 than the first end point 121 of the first sub-scan line;
在所述第二子扫描线上设置有修复点222，所述修复点222较所述第二子扫描线的第一端点123远离所述交叠区20；a repair point 222 is disposed on the second sub-scan line, the repair point 222 is farther from the overlap region 20 than the first end point 123 of the second sub-scan line;
使用第二修复线22连接所述扫描线12的两条子线路上的修复点221和222。The repair points 221 and 222 on the two sub-lines of the scan line 12 are connected using a second repair line 22.
本实施例中可以先对所述信号线11修复，即使用所述第一修复线21连接所述信号线11的两条子线路上的修复点211和212；In this embodiment, the signal line 11 may be repaired first, that is, the repair points 211 and 212 on the two sub-lines of the signal line 11 are connected by using the first repair line 21;
再使用所述第二修复线22连接所述扫描线12的两条子线路上的修复点221和222，其中所述第二修复线22的位置应根据所述第一修复线21的位置设置，以使所述第二修复线22与所述第一修复线21相互之间不重叠，以使修复效果更佳。The second repair line 22 is used to connect the repair points 221 and 222 on the two sub-lines of the scan line 12, wherein the position of the second repair line 22 should be set according to the position of the first repair line 21, So that the second repair line 22 and the first repair line 21 do not overlap each other, so that the repair effect is better.
本实施例另外一种情况是：先对所述扫描线12修复，即先使用所述第二修复线22连接所述扫描线12的两条子线路上的修复点221和222； Another embodiment of the present embodiment is: first repairing the scan line 12, that is, first using the second repair line 22 to connect the repair points 221 and 222 on the two sub-lines of the scan line 12;
再使用所述第一修复线21连接所述信号线11的两条子线路上的修复点211和212，其中所述第一修复线21的位置应根据所述第二修复线22的位置设置，以使所述第一修复线21与所述第二修复线22相互之间不重叠，以使修复效果更佳。The first repair line 21 is used to connect the repair points 211 and 212 on the two sub-lines of the signal line 11, wherein the position of the first repair line 21 should be set according to the position of the second repair line 22, So that the first repair line 21 and the second repair line 22 do not overlap each other, so that the repair effect is better.
所述修复线的具体生成过程为：在将要生成修复线对应的位置上的像素透明电极层用激光去除；同时将所述子线路上修复点 表面的绝缘层用激光去除；利用激光化学气相沉积方法在所述子线路的修复点上镀膜；以形成所述修复线（当然也可以是其他现有的修复线生成方法，均在本发明的保护范围内）。所述阵列基板的线路故障包括所述交叠区中的线路断路或者短路。The specific generation process of the repair line is: removing the pixel transparent electrode layer at a position corresponding to the repair line to be generated by laser; and repairing the repair point on the sub line The insulating layer of the surface is removed by laser; the film is coated on the repair point of the sub-line by laser chemical vapor deposition; to form the repair line (of course, other existing repair line generation methods are also available in the present invention). Within the scope of protection). The line fault of the array substrate includes a line break or short circuit in the overlap region.
譬如所述线路故障的位置也可以是由三条或三条以上的线路形成的交叠区，修复方法与上述方法相同，均在本发明的保护范围之内，在此不一一列举。For example, the location of the line fault may also be an overlapping area formed by three or more lines. The repairing method is the same as the above method, and is within the protection scope of the present invention, and is not enumerated here.
本发明的阵列基板线路故障的修复方法，能够对阵列基板上的信号线和扫描线之间的交叠区或者信号线和公共电极线的交叠区出现的断路或短路故障进行修复，通过上述方式，解决了现有技术的线路故障修复方法不能对两条或者两条以上线路的交叠区出现的故障进行修复的缺陷，能够提高产品的成品率，节约资源，降低生产成本。The method for repairing a line fault of an array substrate of the present invention can repair an open circuit or an open circuit or a short circuit fault occurring in an overlapping area between a signal line and a scan line on an array substrate or an intersection of a signal line and a common electrode line. The method solves the defects that the line fault repair method of the prior art cannot repair the faults occurring in the overlapping area of two or more lines, can improve the yield of the product, save resources, and reduce the production cost.
请参照图3，图3为本发明实施例中第二实施例的阵列基板线路故障的修复方法示意图。Please refer to FIG. 3. FIG. 3 is a schematic diagram of a method for repairing a line fault of an array substrate according to a second embodiment of the present invention.
检测所述阵列基板上线路故障的位置；所述阵列基板的线路故障包括所述交叠区中的线路断路或者短路。Detecting a location of a line fault on the array substrate; a line fault of the array substrate includes a line break or short circuit in the overlap region.
如图3所示，当所述线路故障的位置位于阵列基板上的信号线11与公共电极线13交叠形成的第二交叠区30时，结合图4，将所述第二交叠区30中的所述信号线11和公共电极线13同时断开，所述信号线11形成两个断点111和113，所述断开后的信号线11包括第一子信号线和第二子信号线，所述第一子信号线为所述第一子信号线的第一端点（与断点111相同）和所述第一子信号线的第二端点112之间的线路；所述第二子信号线为所述第二子信号线的第一端点（与断点113相同）和所述第二子信号线的第二端点114之间的线路形成，即所述第一子信号线的所述第二端点112较所述第一子信号线的所述第一端点111远离所述交叠区30；所述第二子信号线的所述第二端点114较所述第二子信号线的所述第一端点113远离所述交叠区30。As shown in FIG. 3, when the location of the line fault is located in the second overlap region 30 formed by the signal line 11 on the array substrate overlapping the common electrode line 13, the second overlap region is combined with FIG. The signal line 11 and the common electrode line 13 in 30 are simultaneously disconnected, the signal line 11 forms two break points 111 and 113, and the broken signal line 11 includes a first sub-signal line and a second sub- a signal line, the first sub-signal line being a line between a first end point of the first sub-signal line (same as the break point 111) and a second end point 112 of the first sub-signal line; The second sub-signal line is formed by a line between the first end point of the second sub-signal line (same as the break point 113) and the second end point 114 of the second sub-signal line, that is, the first sub- The second end point 112 of the signal line is closer to the overlap region 30 than the first end point 111 of the first sub-signal line; the second end point 114 of the second sub-signal line is closer to the The first end point 113 of the second sub-signal line is remote from the overlap region 30.
所述公共电极线13形成两个断点131和133，所述断开后的公共电极线13包括第一子公共电极线和第二子公共电极线，所述第一子公共电极线为所述第一子公共电极线的第一端点（与断点131相同）和第一子公共电极线的第二端点132之间的线路；所述第二子公共电极线为所述第二子公共电极线的第一端点（与断点133相同）和所述第二子公共电极线的第二端点134之间的线路形成，即所述第一子公共电极线的所述第二端点132较所述第一子公共电极线的所述第一端点131远离所述交叠区30；即所述第二子公共电极线的所述第二端点134较所述第二子公共电极线的所述第一端点133远离所述交叠区30；The common electrode line 13 forms two break points 131 and 133, and the disconnected common electrode line 13 includes a first sub-common electrode line and a second sub-common electrode line, and the first sub-common electrode line is a first end of the first sub-common electrode line (the same as the break point 131) and a line between the second end point 132 of the first sub-common electrode line; the second sub-common electrode line is the second sub- a line between a first end point of the common electrode line (identical to the break point 133) and a second end point 134 of the second sub-common electrode line, that is, the second end point of the first sub-common electrode line 132 is closer to the overlap region 30 than the first end point 131 of the first sub-common electrode line; that is, the second end point 134 of the second sub-common electrode line is closer to the second sub-common electrode The first end point 133 of the line is away from the overlap region 30;
在所述第一子信号线上设置有修复点311，所述修复点311较所述第一子信号线的第一端点111远离所述交叠区30；a repair point 311 is disposed on the first sub-signal line, the repair point 311 is farther from the overlap region 30 than the first end point 111 of the first sub-signal line;
在所述第二子信号线上设置有修复点312，所述修复点312较所述第二子信号线的第一端点113远离所述交叠区30；a repair point 312 is disposed on the second sub-signal line, the repair point 312 is farther from the overlap region 30 than the first end point 113 of the second sub-signal line;
使用第一修复线31连接所述信号线11的两条子线路上的修复点311和312。The repair points 311 and 312 on the two sub-lines of the signal line 11 are connected using the first repair line 31.
在所述第一子公共电极线上设置有修复点321，所述修复点321较所述第一子公共电极线的第一端点131远离所述交叠区30；a repair point 321 is disposed on the first sub-common electrode line, the repair point 321 is away from the overlap region 30 than the first end point 131 of the first sub-common electrode line;
在所述第二子公共电极线上设置有修复点322，所述修复点322较所述第二子公共电极线的第一端点133远离所述交叠区30；a repair point 322 is disposed on the second sub-common electrode line, the repair point 322 is away from the overlap region 30 than the first end point 133 of the second sub-common electrode line;
使用第三修复线32连接所述公共电极线13的两条子线路上的修复点321和322。The repair points 321 and 322 on the two sub-lines of the common electrode line 13 are connected using a third repair line 32.
本实施例中一种情况是：可以先对所述信号线11修复，即使用所述第一修复线31连接所述信号线的两条子线路上的修复点311和312；In this embodiment, the signal line 11 can be repaired first, that is, the repair points 311 and 312 on the two sub-lines of the signal line are connected by using the first repair line 31;
再使用所述第三修复线32连接所述公共电极线13的两条子线路上的修复点321和322，其中所述第三修复线32的位置应根据所述第一修复线31的位置设置，使所述第三修复线32与所述第一修复线31相互之间不重叠，以使修复效果更佳。The third repair line 32 is used to connect the repair points 321 and 322 on the two sub-lines of the common electrode line 13, wherein the position of the third repair line 32 should be set according to the position of the first repair line 31. The third repair line 32 and the first repair line 31 are not overlapped with each other to make the repair effect better.
本实施例另外一种情况是：可以先对所述公共电极线13修复，即先使用所述第三修复线32连接所述公共电极线13的两条子线路上的修复点321和322； Another embodiment of the present invention is that the common electrode line 13 can be repaired first, that is, the repair points 321 and 322 on the two sub-lines of the common electrode line 13 are connected first by using the third repair line 32;
再使用所述第一修复线31连接所述信号线11的两条子线路上的修复点311和312，其中所述第一修复线31的位置应根据所述第三修复线32的位置设置，以使所述第一修复线31与所述第三修复线32相互之间不重叠，以使修复效果更佳。The first repair line 31 is used to connect the repair points 311 and 312 on the two sub-lines of the signal line 11, wherein the position of the first repair line 31 should be set according to the position of the third repair line 32. So that the first repair line 31 and the third repair line 32 do not overlap each other, so that the repair effect is better.
所述修复线的具体生成过程为：在将要生成修复线对应的位置上的像素透明电极层用激光去除；同时将所述子线路上修复点 表面的绝缘层用激光去除；利用激光化学气相沉积方法在所述子线路的修复点上镀膜；以形成所述修复线（当然也可以是其他现有的修复线生成方法，均在本发明的保护范围内）。所述阵列基板的线路故障包括所述交叠区中的线路断路或短路。The specific generation process of the repair line is: removing the pixel transparent electrode layer at a position corresponding to the repair line to be generated by laser; and repairing the repair point on the sub line The insulating layer of the surface is removed by laser; the film is coated on the repair point of the sub-line by laser chemical vapor deposition; to form the repair line (of course, other existing repair line generation methods are also available in the present invention). Within the scope of protection). The line fault of the array substrate includes a line break or short circuit in the overlap region.
譬如所述线路故障的位置也可以是由三条或三条以上的线路形成的交叠区，修复方法与上述方法相同，均在本发明的保护范围之内，在此不一一列举。For example, the location of the line fault may also be an overlapping area formed by three or more lines. The repairing method is the same as the above method, and is within the protection scope of the present invention, and is not enumerated here.
本发明的阵列基板线路故障的修复方法，提供一种能够对阵列基板上的信号线和扫描线之间的交叠区或者信号线和公共电极线的交叠区出现的断路或短路故障进行修复，通过上述方式，解决了现有技术的线路故障修复方法不能对两条或者两条以上线路的交叠区出现的故障进行修复的缺陷，能够提高产品的成品率，节约资源，降低生产成本。The method for repairing a line fault of an array substrate of the present invention provides a method for repairing an open or short circuit fault occurring in an overlap region between a signal line and a scan line on an array substrate or an overlap region between a signal line and a common electrode line In the above manner, the defect that the prior art line fault repair method cannot repair the fault in the overlapping area of two or more lines is solved, which can improve the product yield, save resources, and reduce production cost.
请参照图5，图5为本发明实施例中第三实施例的阵列基板线路故障的修复方法示意图。Please refer to FIG. 5. FIG. 5 is a schematic diagram of a method for repairing a line fault of an array substrate according to a third embodiment of the present invention.
如图5所示，本实施例中，对现有技术中的公共电极线进行改进，改进后的公共电极线包括了本体部13（现有技术中的公共电极线）和遮光部14、15，即用所述遮光部替换现有技术中两个像素单元之间的信号线11的两侧的两条遮光线，起到与现有技术中所述遮光线相同的作用。所述遮光部包括第一遮光部14和第二遮光部15，所述第一遮光部14位于两个像素单元之间的信号线的左侧，所述第二遮光部15位于两个像素单元之间的信号线的右侧。 As shown in FIG. 5, in the present embodiment, the common electrode line in the prior art is improved, and the improved common electrode line includes the body portion 13 (the common electrode line in the prior art) and the light shielding portions 14, 15 That is, the two light-shielding lines on both sides of the signal line 11 between the two pixel units in the prior art are replaced by the light-shielding portion, and have the same function as the light-shielding line in the prior art. The light shielding portion includes a first light shielding portion 14 located on a left side of a signal line between two pixel units, and a second light blocking portion 15 located at two pixel units Between the right side of the signal line.
检测所述阵列基板上线路故障的位置；所述阵列基板的线路故障包括所述交叠区中的线路断路或者短路。Detecting a location of a line fault on the array substrate; a line fault of the array substrate includes a line break or short circuit in the overlap region.
当所述线路故障的位置位于阵列基板上的信号线11和公共电极线13形成的交叠区40时，其中所述公共电极线13包括在所述阵列基板上的像素单元边缘设置的遮光部14、15和本体部13，所述遮光部包括第一遮光部14和第二遮光部15，所述第一遮光部14和第二遮光部15位于相邻两个像素单元之间的信号线的两侧；When the location of the line fault is located in the overlap region 40 formed by the signal line 11 on the array substrate and the common electrode line 13, wherein the common electrode line 13 includes a light shielding portion disposed at an edge of the pixel unit on the array substrate 14 and 15 and the body portion 13, the light shielding portion includes a first light shielding portion 14 and a second light shielding portion 15, the first light shielding portion 14 and the second light shielding portion 15 are located between signal lines between two adjacent pixel units Both sides;
结合图6，将所述交叠区中的信号线11和公共电极线的本体部13同时断开，断开的区域在所述第一遮光部14和所述第二遮光部15之间，以使得所述断开后的信号线11和公共电极线的本体部13均包括两条子线路，所述信号线11形成两个断点111和113，所述断开后的信号线11包括第一子信号线和第二子信号线，所述第一子信号线为所述第一子信号线的第一端点（与断点111相同）和所述第一子信号线的第二端点112之间的线路；所述第二子信号线为所述第二子信号线的第一端点（与断点113相同）和所述第二子信号线的第二端点114之间的线路，即所述第一子信号线的所述第二端点112较所述第一子信号线的所述第一端点111远离所述交叠区40；所述第二子信号线的所述第二端点114较所述第二子信号线的所述第一端点113远离所述交叠区40。Referring to FIG. 6, the signal line 11 in the overlap region and the body portion 13 of the common electrode line are simultaneously disconnected, and the broken region is between the first light blocking portion 14 and the second light blocking portion 15, The body portion 13 of the disconnected signal line 11 and the common electrode line each includes two sub-lines, the signal line 11 forms two break points 111 and 113, and the broken signal line 11 includes a sub-signal line and a second sub-signal line, the first sub-signal line being a first end point of the first sub-signal line (same as the break point 111) and a second end point of the first sub-signal line a line between 112; the second sub-signal line is a line between a first end point of the second sub-signal line (same as breakpoint 113) and a second end point 114 of the second sub-signal line That is, the second end point 112 of the first sub-signal line is farther from the overlap region 40 than the first end point 111 of the first sub-signal line; the The second endpoint 114 is further from the overlap region 40 than the first endpoint 113 of the second sub-signal line.
所述公共电极线的本体部13形成两个断点131和133，所述第一遮光部14较所述断点131偏离所述交叠区40和第二遮光部15较所述断点133偏离所述交叠区40；所述断开后的公共电极线本体部13包括第一子本体部和第二子本体部，所述第一子本体部为所述第一子本体部的第一端点（与断点131相同）和第一子本体部的第二端点132之间的线路，以及第二子本体部为第二子本体部的第一端点（与断点133相同）和第二子本体部的第二端点134之间的线路，即所述第一子本体部的所述第二端点132较所述第一子本体部的所述第一端点131远离所述交叠区40；即所述第二子本体部的所述第二端点134较所述第二子本体部的所述第一端点133远离所述交叠区40；The body portion 13 of the common electrode line forms two break points 131 and 133, and the first light blocking portion 14 is offset from the break point 131 by the overlap region 40 and the second light blocking portion 15 from the break point 133 Deviating from the overlapping region 40; the disconnected common electrode line body portion 13 includes a first sub-body portion and a second sub-body portion, the first sub-body portion being the first sub-body portion a line between an end point (same as breakpoint 131) and a second end point 132 of the first sub-body portion, and a second sub-body portion being the first end point of the second sub-body portion (same as breakpoint 133) And a line between the second end point 134 of the second sub-body portion, that is, the second end point 132 of the first sub-body portion is further away from the first end point 131 of the first sub-body portion The overlap region 40; that is, the second end point 134 of the second sub-body portion is farther from the overlap region 40 than the first end point 133 of the second sub-body portion;
在所述第一子信号线上设置一个修复点411，所述修复点411较所述第一子信号线的第一端点111远离所述交叠区40；a repair point 411 is disposed on the first sub-signal line, the repair point 411 is farther from the overlap region 40 than the first end point 111 of the first sub-signal line;
在所述第二子信号线上设置一个修复点412，所述修复点412较所述第二子信号线的第一端点113远离所述交叠区40；a repair point 412 is disposed on the second sub-signal line, the repair point 412 is farther from the overlap region 40 than the first end point 113 of the second sub-signal line;
使用第一修复线41连接所述信号线11的两条子线路上的修复点411和412。The repair points 411 and 412 on the two sub-lines of the signal line 11 are connected using the first repair line 41.
在所述第一遮光部14设置有修复点421，在所述第二遮光部15上设置有修复点422，所述修复点421较所述第一子本体部的第一端点131远离所述交叠区40；所述修复点422较所述第二子本体部的第一端点133远离所述交叠区40；A repair point 421 is disposed on the first light shielding portion 14 , and a repair point 422 is disposed on the second light shielding portion 15 . The repair point 421 is away from the first end point 131 of the first sub body portion. The overlap region 40; the repair point 422 is farther from the overlap region 40 than the first end point 133 of the second sub-body portion;
所述第一遮光部14上的电压与所述公共电极线的本体部13上的电压相同，所述第二遮光部15上的电压也与所述公共电极线的本体部13上的电压相同，在所述第一遮光部14和所述第二遮光部15的均设置有对应所述公共电极线本体部13的修复点，所述第一遮光部14上的修复点421对应所述第一子本体部上的修复点，所述第二遮光部15上的修复点422对应所述第二子本体部上的修复点。The voltage on the first light shielding portion 14 is the same as the voltage on the body portion 13 of the common electrode line, and the voltage on the second light shielding portion 15 is also the same as the voltage on the body portion 13 of the common electrode line. a repair point corresponding to the common electrode line main body portion 13 is provided in each of the first light blocking portion 14 and the second light blocking portion 15, and the repair point 421 on the first light blocking portion 14 corresponds to the first A repair point on a sub-body portion, the repair point 422 on the second light-shielding portion 15 corresponds to a repair point on the second sub-body portion.
使用第四修复线42连接所述第一遮光部14和所述第二遮光部15上的修复点421和422。The repair points 421 and 422 on the first light blocking portion 14 and the second light blocking portion 15 are connected using a fourth repair line 42.
本实施例中一种情况是：A situation in this embodiment is:
先使用第一修复线41连接所述信号线的两条子线路的修复点411和412；First using the first repair line 41 to connect the repair points 411 and 412 of the two sub-lines of the signal line;
再使用第四修复线42连接所述第一遮光部14和所述第二遮光部15上对应所述公共电极线本体部13的修复点421和422；Further using the fourth repair line 42 to connect the first light shielding portion 14 and the second light shielding portion 15 corresponding to the repair point 421 and 422 of the common electrode line body portion 13;
其中所述第四修复线42的位置根据所述第一修复线41的位置设置，所述第四修复线42与所述第一修复线41不重叠，以使修复效果更佳。 The position of the fourth repairing line 42 is set according to the position of the first repairing line 41, and the fourth repairing line 42 does not overlap with the first repairing line 41, so that the repairing effect is better.
本实施例中另外一种情况是：Another situation in this embodiment is:
先使用第四修复线42连接所述第一遮光部14和所述第二遮光部15上对应所述公共电极线本体部13的修复点421和422；First, using the fourth repair line 42 to connect the first light shielding portion 14 and the second light shielding portion 15 corresponding to the repair point 421 and 422 of the common electrode line body portion 13;
再使用第一修复线41连接所述信号线的两条子线路的修复点411和412；Then using the first repair line 41 to connect the repair points 411 and 412 of the two sub-lines of the signal line;
其中所述第一修复线41的位置根据所述第四修复线42的位置设置，所述第一修复线41与所述第四修复线42不重叠，以使修复效果更佳。The position of the first repairing line 41 is set according to the position of the fourth repairing line 42. The first repairing line 41 and the fourth repairing line 42 do not overlap, so that the repairing effect is better.
譬如所述线路故障的位置也可以是由三条或三条以上的线路形成的交叠区，均在本发明的保护范围之内，在此不一一列举。For example, the location of the line fault may also be an overlapping area formed by three or more lines, which are all within the scope of the present invention, and are not enumerated here.
本实施例与第二实施例相比，由于将公共电极线的修复点设置在遮光部上，使得修复线位置的设置更加简便，能较好地避免修复线之间重叠的问题，降低修复工作量，提高修复效率，降低生产成本。Compared with the second embodiment, since the repair point of the common electrode line is disposed on the light shielding portion, the position of the repair line is more convenient, and the problem of overlapping between the repair lines can be better avoided, and the repair work is reduced. Quantity, improve repair efficiency and reduce production costs.
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。In the above, the present invention has been disclosed in the above preferred embodiments, but the preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various modifications without departing from the spirit and scope of the invention. The invention is modified and retouched, and the scope of the invention is defined by the scope defined by the claims.

Claims (18)

  1. 一种阵列基板线路故障的修复方法，其中所述方法包括：A method for repairing an array substrate line fault, wherein the method comprises:
    检测所述阵列基板上线路故障的位置；Detecting a location of a line fault on the array substrate;
    当所述线路故障的位置位于阵列基板上的至少两条线路形成的交叠区时，将所述交叠区中的每条线路同时断开，以使得所述断开后的每条线路包括两条子线路，所述子线路包括第一端点以及第二端点，所述子线路的所述第二端点较所述子线路的所述第一端点远离所述交叠区；When the location of the line fault is located in an overlapping area formed by at least two lines on the array substrate, each of the overlapping areas is simultaneously disconnected, so that each line after the disconnection includes Two sub-lines, the sub-line including a first end point and a second end point, the second end point of the sub-line being farther from the overlapping area than the first end point of the sub-line;
    在所述子线路上设置修复点，所述修复点较所述子线路的第一端点远离所述交叠区；Providing a repair point on the sub-line, the repair point being farther from the overlap area than a first end point of the sub-line;
    所述交叠区包括第一交叠区，所述第一交叠区由信号线与扫描线交叠形成，所述修复线包括第一修复线和第二修复线：The overlap region includes a first overlap region formed by overlapping a signal line and a scan line, the repair line including a first repair line and a second repair line:
    先使用所述第一修复线连接所述信号线的两条子线路上的修复点；First using the first repair line to connect the repair points on the two sub-lines of the signal line;
    再使用所述第二修复线连接所述扫描线的两条子线路上的修复点，其中所述第二修复线的位置根据所述第一修复线的位置设置，且所述第二修复线与所述第一修复线不重叠；And using the second repair line to connect the repair points on the two sub-lines of the scan line, wherein a position of the second repair line is set according to a position of the first repair line, and the second repair line is The first repair lines do not overlap;
    所述交叠区包括第二交叠区，所述第二交叠区由信号线与公共电极线交叠形成，所述修复线包括第一修复线和第三修复线：The overlap region includes a second overlap region formed by overlapping signal lines and a common electrode line, the repair line including a first repair line and a third repair line:
    先使用所述第一修复线连接所述信号线的两条子线路上的修复点；以及First using the first repair line to connect the repair points on the two sub-lines of the signal line;
    再使用所述第三修复线连接所述公共电极线的两条子线路上的修复点，其中所述第三修复线的位置根据所述第一修复线的位置设置，所述第三修复线与所述第一修复线不重叠。 And using the third repair line to connect the repair points on the two sub-lines of the common electrode line, wherein a position of the third repair line is set according to a position of the first repair line, and the third repair line is The first repair lines do not overlap.
  2. 根据权利要求1所述的阵列基板线路故障的修复方法，其中所述阵列基板的线路故障包括所述交叠区中的线路断路。The method of repairing an array substrate line fault according to claim 1, wherein the line fault of the array substrate comprises a line break in the overlap region.
  3. 根据权利要求1所述的阵列基板线路故障的修复方法，其中所述阵列基板的线路故障包括所述交叠区中的线路短路。The method of repairing an array substrate line fault according to claim 1, wherein the line fault of the array substrate comprises a short circuit in the overlap region.
  4. 一种阵列基板线路故障的修复方法，其中所述方法包括：A method for repairing an array substrate line fault, wherein the method comprises:
    检测所述阵列基板上线路故障的位置；Detecting a location of a line fault on the array substrate;
    当所述线路故障的位置位于阵列基板上的至少两条线路形成的交叠区时，将所述交叠区中的每条线路同时断开，以使得所述断开后的每条线路包括两条子线路，所述子线路包括第一端点以及第二端点，所述子线路的所述第二端点较所述子线路的所述第一端点远离所述交叠区；When the location of the line fault is located in an overlapping area formed by at least two lines on the array substrate, each of the overlapping areas is simultaneously disconnected, so that each line after the disconnection includes Two sub-lines, the sub-line including a first end point and a second end point, the second end point of the sub-line being farther from the overlapping area than the first end point of the sub-line;
    在所述子线路上设置修复点，所述修复点较所述子线路的第一端点远离所述交叠区；以及Providing a repair point on the sub-line, the repair point being farther from the overlap area than the first end of the sub-line;
    使用修复线连接属于同一线路的两条子线路上的修复点。Use repair wires to connect repair points on two sub-lines that belong to the same line.
  5. 根据权利要求4所述的阵列基板线路故障的修复方法，其中所述交叠区包括第一交叠区，所述第一交叠区由信号线与扫描线交叠形成，所述修复线包括第一修复线和第二修复线：The method of repairing an array substrate line fault according to claim 4, wherein said overlap region comprises a first overlap region, said first overlap region being formed by overlapping signal lines and scan lines, said repair line comprising First repair line and second repair line:
    先使用所述第一修复线连接所述信号线的两条子线路上的修复点；以及First using the first repair line to connect the repair points on the two sub-lines of the signal line;
    再使用所述第二修复线连接所述扫描线的两条子线路上的修复点，其中所述第二修复线的位置根据所述第一修复线的位置设置，且所述第二修复线与所述第一修复线不重叠。And using the second repair line to connect the repair points on the two sub-lines of the scan line, wherein a position of the second repair line is set according to a position of the first repair line, and the second repair line is The first repair lines do not overlap.
  6. 根据权利要求5所述的阵列基板线路故障的修复方法，其中所述交叠区包括第二交叠区，所述第二交叠区由信号线与公共电极线交叠形成，所述修复线包括第一修复线和第三修复线：The method of repairing an array substrate line fault according to claim 5, wherein said overlap region comprises a second overlap region, said second overlap region being formed by overlapping signal lines and common electrode lines, said repair line Including the first repair line and the third repair line:
    先使用所述第三修复线连接所述公共电极线的两条子线路上的修复点；以及First using the third repair line to connect the repair points on the two sub-lines of the common electrode line;
    再使用所述第一修复线连接所述信号的两条子线路上的修复点；其中所述第一修复线的位置根据所述第三修复线的位置设置，所述第一修复线与所述第三修复线不重叠。 And using the first repair line to connect repair points on the two sub-lines of the signal; wherein a position of the first repair line is set according to a position of the third repair line, the first repair line and the The third repair lines do not overlap.
  7. 根据权利要求4所述的阵列基板线路故障的修复方法，其中所述交叠区包括第一交叠区，所述第一交叠区由信号线与扫描线交叠形成，所述修复线包括第一修复线和第二修复线：The method of repairing an array substrate line fault according to claim 4, wherein said overlap region comprises a first overlap region, said first overlap region being formed by overlapping signal lines and scan lines, said repair line comprising First repair line and second repair line:
    先使用所述第二修复线连接所述扫描线的两条子线路上的修复点；以及First using the second repair line to connect the repair points on the two sub-lines of the scan line;
    再使用所述第一修复线连接所述信号线的两条子线路上的修复点，其中所述第一修复线的位置根据所述第二修复线的位置设置，所述第一修复线与所述第二修复线不重叠。And using the first repair line to connect the repair points on the two sub-lines of the signal line, wherein the position of the first repair line is set according to the position of the second repair line, the first repair line and the The second repair lines do not overlap.
  8. 根据权利要求7所述的阵列基板线路故障的修复方法，其中所述交叠区包括第二交叠区，所述第二交叠区由信号线与公共电极线交叠形成，所述修复线包括第一修复线和第三修复线：The method of repairing an array substrate line fault according to claim 7, wherein the overlap region comprises a second overlap region, and the second overlap region is formed by overlapping signal lines with a common electrode line, the repair line Including the first repair line and the third repair line:
    先使用所述第一修复线连接所述信号线的两条子线路上的修复点；以及First using the first repair line to connect the repair points on the two sub-lines of the signal line;
    再使用所述第三修复线连接所述公共电极线的两条子线路上的修复点，其中所述第三修复线的位置根据所述第一修复线的位置设置，所述第三修复线与所述第一修复线不重叠。 And using the third repair line to connect the repair points on the two sub-lines of the common electrode line, wherein a position of the third repair line is set according to a position of the first repair line, and the third repair line is The first repair lines do not overlap.
  9. 根据权利要求7所述的阵列基板线路故障的修复方法，其中所述交叠区包括第二交叠区，所述第二交叠区由信号线与公共电极线交叠形成，所述修复线包括第一修复线和第三修复线：The method of repairing an array substrate line fault according to claim 7, wherein the overlap region comprises a second overlap region, and the second overlap region is formed by overlapping signal lines with a common electrode line, the repair line Including the first repair line and the third repair line:
    先使用所述第三修复线连接所述公共电极线的两条子线路上的修复点；以及First using the third repair line to connect the repair points on the two sub-lines of the common electrode line;
    再使用所述第一修复线连接所述信号的两条子线路上的修复点；其中所述第一修复线的位置根据所述第三修复线的位置设置，所述第一修复线与所述第三修复线不重叠。And using the first repair line to connect repair points on the two sub-lines of the signal; wherein a position of the first repair line is set according to a position of the third repair line, the first repair line and the The third repair lines do not overlap.
  10. 根据权利要求4所述的阵列基板线路故障的修复方法，其中所述交叠区包括第二交叠区，所述第二交叠区由信号线与公共电极线交叠形成，所述修复线包括第一修复线和第三修复线：The method of repairing an array substrate line fault according to claim 4, wherein said overlap region comprises a second overlap region, said second overlap region being formed by overlapping signal lines and common electrode lines, said repair line Including the first repair line and the third repair line:
    先使用所述第一修复线连接所述信号线的两条子线路上的修复点；以及First using the first repair line to connect the repair points on the two sub-lines of the signal line;
    再使用所述第三修复线连接所述公共电极线的两条子线路上的修复点，其中所述第三修复线的位置根据所述第一修复线的位置设置，所述第三修复线与所述第一修复线不重叠。 And using the third repair line to connect the repair points on the two sub-lines of the common electrode line, wherein a position of the third repair line is set according to a position of the first repair line, and the third repair line is The first repair lines do not overlap.
  11. 根据权利要求4所述的阵列基板线路故障的修复方法，其中所述交叠区包括第二交叠区，所述第二交叠区由信号线与公共电极线交叠形成，所述修复线包括第一修复线和第三修复线：The method of repairing an array substrate line fault according to claim 4, wherein said overlap region comprises a second overlap region, said second overlap region being formed by overlapping signal lines and common electrode lines, said repair line Including the first repair line and the third repair line:
    先使用所述第三修复线连接所述公共电极线的两条子线路上的修复点；以及First using the third repair line to connect the repair points on the two sub-lines of the common electrode line;
    再使用所述第一修复线连接所述信号的两条子线路上的修复点；其中所述第一修复线的位置根据所述第三修复线的位置设置，所述第一修复线与所述第三修复线不重叠。 And using the first repair line to connect repair points on the two sub-lines of the signal; wherein a position of the first repair line is set according to a position of the third repair line, the first repair line and the The third repair lines do not overlap.
  12. 根据权利要求4所述的阵列基板线路故障的修复方法，其中所述阵列基板的线路故障包括所述交叠区中的线路断路。The method of repairing an array substrate line fault according to claim 4, wherein the line fault of the array substrate comprises a line break in the overlap region.
  13. 根据权利要求4所述的阵列基板线路故障的修复方法，其中所述阵列基板的线路故障包括所述交叠区中的线路短路。 The method of repairing an array substrate line fault according to claim 4, wherein the line fault of the array substrate comprises a short circuit in the overlap region.
  14. 一种阵列基板线路故障的修复方法，其中所述方法包括：A method for repairing an array substrate line fault, wherein the method comprises:
    检测所述阵列基板上线路故障的位置；Detecting a location of a line fault on the array substrate;
    当所述线路故障的位置位于阵列基板上的信号线和公共电极线形成的交叠区时，其中所述公共电极线包括本体部和在所述阵列基板上的像素单元边缘设置的遮光部，所述遮光部包括第一遮光部和第二遮光部，所述第一遮光部和第二遮光部位于相邻两个像素单元之间的信号线的两侧；When the location of the line fault is located in an overlapping region formed by the signal line and the common electrode line on the array substrate, wherein the common electrode line includes a body portion and a light shielding portion disposed at an edge of the pixel unit on the array substrate, The light shielding portion includes a first light shielding portion and a second light shielding portion, and the first light shielding portion and the second light shielding portion are located on both sides of a signal line between two adjacent pixel units;
    将所述交叠区中的信号线和公共电极线的本体部同时断开，以使得所述断开后的信号线和公共电极线的本体部均包括两条子线路，所述子线路包括第一端点以及第二端点；所述子线路的所述第二端点较所述子线路的所述第一端点远离所述交叠区；Separating the signal line in the overlap region and the body portion of the common electrode line simultaneously, so that the body portion of the disconnected signal line and the common electrode line each include two sub-lines, the sub-line including An endpoint and a second endpoint; the second endpoint of the sub-line being further from the overlap region than the first endpoint of the sub-line;
    在所述信号线的子线路上设置修复点，所述信号线的子线路上的修复点较所述信号线的子线路的第一端点远离所述交叠区；Providing a repair point on a sub-line of the signal line, the repair point on the sub-line of the signal line being farther from the overlap area than the first end point of the sub-line of the signal line;
    使用第一修复线连接所述信号线的两条子线路上的修复点； Using a first repair line to connect repair points on the two sub-lines of the signal line;
    在所述第一遮光部和所述第二遮光部上均设置对应所述公共电极线本体部的修复点，所述第一遮光部和所述第二遮光部上的修复点均较所述公共电极线的本体部的子线路的第一端点远离所述交叠区；以及Fixing points corresponding to the common electrode line body portion are disposed on the first light shielding portion and the second light shielding portion, and the repair points on the first light shielding portion and the second light shielding portion are both a first end of the sub-line of the body portion of the common electrode line is remote from the overlap region;
    使用第四修复线连接所述第一遮光部和所述第二遮光部上对应所述公共电极线本体部的修复点。A repair point corresponding to the common electrode line body portion on the first light shielding portion and the second light shielding portion is connected using a fourth repair line.
  15. 根据权利要求14所述的阵列基板线路故障的修复方法，其中先使用第一修复线连接所述信号线的两条子线路上的修复点；以及The method of repairing an array substrate line fault according to claim 14, wherein the repair point on the two sub-lines of the signal line is first connected using a first repair line;
    再使用第四修复线连接所述第一遮光部和所述第二遮光部上对应所述公共电极线本体部的修复点；其中所述第四修复线的位置根据所述第一修复线的位置设置，所述第四修复线与所述第一修复线不重叠。 And using a fourth repair line to connect the repair points of the first light shielding portion and the second light shielding portion corresponding to the common electrode line body portion; wherein the position of the fourth repair line is according to the first repair line Position setting, the fourth repair line does not overlap with the first repair line.
  16. 根据权利要求14所述的阵列基板线路故障的修复方法，其中先使用第四修复线连接所述第一遮光部和所述第二遮光部上对应所述公共电极线本体部的修复点；以及The method for repairing an array substrate line fault according to claim 14, wherein a repair point corresponding to the common electrode line body portion on the first light shielding portion and the second light shielding portion is first connected using a fourth repair line;
    再使用第一修复线连接所述信号线的两条子线路上的修复点；其中所述第一修复线的位置根据所述第四修复线的位置设置，所述第一修复线与所述第四修复线不重叠。 And using a first repair line to connect the repair points on the two sub-lines of the signal line; wherein a position of the first repair line is set according to a position of the fourth repair line, the first repair line and the first The four repair lines do not overlap.
  17. 根据权利要求14所述的阵列基板线路故障的修复方法，其中所述阵列基板的线路故障包括所述交叠区中的线路断路。The method of repairing an array substrate line fault according to claim 14, wherein the line fault of the array substrate comprises a line break in the overlap region.
  18. 根据权利要求14所述的阵列基板线路故障的修复方法，其中所述阵列基板的线路故障包括所述交叠区中的线路短路。 The method of repairing an array substrate line fault according to claim 14, wherein the line fault of the array substrate comprises a short circuit in the overlap region.
PCT/CN2014/079432 2014-05-31 2014-06-07 Method for repairing array substrate line fault WO2015180202A1 (en)

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