CN103983381B - System and method for testing single particle adhesive force and electric quantity under vacuum condition - Google Patents
System and method for testing single particle adhesive force and electric quantity under vacuum condition Download PDFInfo
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- CN103983381B CN103983381B CN201410238965.4A CN201410238965A CN103983381B CN 103983381 B CN103983381 B CN 103983381B CN 201410238965 A CN201410238965 A CN 201410238965A CN 103983381 B CN103983381 B CN 103983381B
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Abstract
The invention discloses a system for testing adhesive force between a single particle and a flat plate material and particle electric quantity under a vacuum condition. The system comprises a vacuum container and a pair of parallel electrode plates in the vacuum container. Two electrodes are respectively electrically connected with a direct current power supply outside the vacuum container through wires and load voltages through the power supply, a uniform electric field is generated between the two electrodes, an ultraviolet source or an electronic gun are arranged in the vacuum container, the single particle is made to be loaded with electricity, and a particle motion video recording device is arranged outside the vacuum container. The invention further discloses a test method. Compared with the prior art, the test environment of the system for testing single particle adhesive force and electric quantity is similar to a true environment, conformity of the test result is good, a test device is simple and can be implemented in any vacuum container, an expensive atomic force microscope is not needed, and vacuum transformation does not need to be conducted on a probe region.
Description
Technical field
The invention belongs to physical parameter technical field of measurement and test, in particular it relates to test small under vacuum condition
The system of adhesion and particulate matter carried charge between particulate matter and flat board, give also simultaneously and carries out individual particle using this system
Thing and the method for testing of flat board adhesion and particle charge amount.
Background technology
Generally, small particulate matter is contacted with plate material, can produce adhesion effect, typically between granule and flat board
For, grain diameter is less, and adhesion effect is more obvious, is less than the situation of 1mm for grain diameter, even more substantially.In adhesion
In measuring system it is generally recognized that adhesion be making a concerted effort of Van der Waals force between granule and flat board and electrostatic force, the weight of granule
Power then individually considers.
At present, atomic force microscope is generally adopted to test the size of adhesion between granule and plate material, it is substantially former
Reason is that single particle is fixed on the probe of atomic force microscope, the distance between precise control granule and plate material,
Acted on by adhesion, probe cantilever can deform upon, the side-play amount of probe cantilever can be measured using the mode of laser testing,
Relation according to deformation quantity and stress can be calculated the adhesion between individual particle and flat board, and specifically a kind of measuring method can be joined
See Liu Guan green grass or young crops etc., the afm measurement that micron particle is interacted with the surface of solids, Engineering Thermophysics journal.Volume 30, the 5th phase,
In May, 2009,803-806 page.But, the adhesion being measured using atomic force microscope between individual particle and plate material is existed
Major defect, is mainly manifested in three below aspect:
1st, finely ground particles it is necessary to tightly secure in probe tip, generally 10 to tens nanometers of probe tip radius,
Granule difficulty is firmly fixed on so small structure very big.
2nd, use adhesion between atomic force microscope test individual particle and flat board, relative distance therebetween is tester
Member is artificially set and controlled, and relative distance can not truly reflect the actual pitch under the conditions of granule natural sediment, and granule with
The distance between plate material is to affect one of most important factor of adhesion therebetween, therefore atomic force microscope test
Method can not reflect truth.
3rd, under vacuum, the environment such as radiant light photograph may lead to particulate matter powered, and charged particles are difficult to neutralize,
Grain carried charge is one of most important factor of impact particle adhesion power, and atomic force microscope is finished product measuring instrument, its test
Environment cannot simulate charging particle situation, test the adhesion obtaining therefore nor reflect truth.As can be seen here, existing
Atomic force microscope measure the adhesion of individual particle and flat board and can not reflect real situation, the error of measurement is very big, meanwhile,
Also the carried charge of individual particle cannot accurately be obtained.Based on this, provide and can truly reflect individual particle carried charge and individual particle
The measuring system of the adhesion and plate material between and method are very necessary.
Content of the invention
It is an object of the invention to provide one kind can truly reflect between single electrically charged particle and plate material adhesion with
And the test system of particle charge amount, this test system and test error is little, and can simulate granule and flat-sheet material under naturalness
The adhesion situation of material, and do not need individual particle is carried out with the accurate fixation under miniature scale.
Another object of the present invention is to providing one kind to carry out between individual particle and plate material using above-mentioned measuring system
The method of testing of adhesion.This method of testing adopts non-contacting electrostatically field method, simultaneous electric pulse field parameter and granule kinematic parameter,
Also particle charge electricity is can get, main technical schemes are as follows while to particle adhesion power:
Under vacuum condition, between individual particle and plate material, adhesion and particle charge measure test system, hold including vacuum
Device, is arranged on the battery lead plate of a pair of parallel setting in Dewar vessel, upper electrode and lower electrode pass through respectively wire with true
DC source outside empty electrically connects and passes through DC source on-load voltage, makes to produce uniform electric field between parallel-plate, very
It is additionally provided with ultraviolet source or electron gun in empty and charged operation is implemented to the individual particle being arranged on lower electrode, vacuum is held
It is additionally provided with granule motion camera device, so that the observation window that position opens up is shot with video-corder to individual particle by correspondence on Dewar vessel outside device
Motion shot with video-corder in real time, wherein, spacing between upper electrode and lower electrode is 30mm-100mm, and plate material is to lead
Body material, makes lower electrode.
Wherein, plate material is non-conductive material, and is placed on the upper surface of lower electrode.
Wherein, described granule motion camera device is high-speed camera.
Wherein, plate material is copper, silver, aluminum, zinc, ferrum or its alloy.
Using the method for the adhesion between above-mentioned test system measurement individual particle and plate material and carried charge, including such as
Lower step:
Individual particle is placed on lower electrode, after connecting cable inside and outside Dewar vessel, closes Dewar vessel, open true
Empty acquisition device is until specified vacuum degree；
Adjust ultraviolet source or electron gun irradiation individual particle makes it powered；
Raise the voltage of DC source with the speed being not higher than 1v/s, open granule motion camera device simultaneously and carry out continuously
Take pictures or image.
When granule moves, top out voltage, and record granule moves the voltage u in moment, then granule motion
Whole process in, between flat board electric field e be steady state value, e=u/d, d be the distance between upper electrode and lower electrode, according to
The granule moving image capturing utilizes d=at2/ 2 calculating granule acceleration of motion a, wherein, t is granule from moving
Time used by the moment of arrival upper electrode for the moment, fa=m × a is recycled to obtain adhesion fa, wherein m is granule matter
Amount, then the carried charge q of granule is obtained by fe=fa+g and fe=q × e, wherein fe is electric field force, and g is the gravity of granule.
Wherein, ultraviolet source radiant light wavelength is in 10nm-400nm, light intensity ultraviolet radioactive degree according to suffered by granule reality
It is adjusted, exposure time is no less than 10 minutes.
Wherein, the beam energy of electron gun is not higher than 20kev, and exposure time is no less than 10 minutes.
Wherein, when plate material is for non-conducting material, the thickness of plate material is d1, then according to the granule fortune capturing
Motion video utilizes 2 (d-d1)=at2 to calculate granule acceleration of motion a.
Compared with prior art, the major advantage of the non-contact test method of the present invention is:
1st, electric field force suffered by simultaneous granule and granule kinematic parameter, obtains particle adhesion power with the mode of equation with two unknowns simultaneously
With particle charge amount, it is to avoid the independent adhesion charged particles that solve do not know to obtain difficult problems for adhesion.
2nd, test environment and true environment are closer to, and test result goodness of fit is higher.
3rd, test device is simple, all can implement in any Dewar vessel, without using expensive atomic force microscope,
Probe area need not be done with vacuum transformation.
Brief description
Fig. 1 be the present invention vacuum condition under between individual particle and plate material adhesion and particle charge measure test system and show
It is intended to；
Wherein, 1 is upper electrode；2 is lower electrode；3 is individual particle；4 is DC source；5 is Dewar vessel；6 is purple
Outer light source；7 is electron gun.
Fig. 2 is individual particle in t=t0The stress schematic diagram in moment, wherein；T=t0Moment, fe=fa+g；
Fig. 3 is individual particle in t=t0The stress schematic diagram of+δ t, wherein fe> g, acceleration a=(fe- g)/m,
M is granular mass.
Fig. 4 is individual particle in t=t0+t1The stress schematic diagram in moment, now, granule is contacted with upper electrode.
Specific embodiment
Referring to the drawings to adhesion and particle charge between individual particle and plate material under the vacuum condition of the present invention
Measure test system to be described in detail, but this describes merely illustrative it is no intended to carry out to protection scope of the present invention appointing
What limits.
With reference to Fig. 1, under the vacuum condition of the present invention, between individual particle and plate material, adhesion and particle charge measure examination
System, including upper electrode (1), lower electrode (2), individual particle (3), DC source (4), Dewar vessel (5), ultraviolet source
Or electron gun (7) and granule motion camera device (6).Upper electrode (1) and lower electrode (2) are a pair of parallel electrodes,
It is arranged in Dewar vessel (5), upper electrode (1) and lower electrode (2) pass through the unidirectional current outside wire and Dewar vessel respectively
Source (4) electrically connects and passes through DC source (4) on-load voltage, makes to produce uniform electric field e between parallel-plate, Dewar vessel (5)
Inside it is additionally provided with ultraviolet source (6) or electron gun (7) and charged operation is implemented to the individual particle being arranged on lower electrode (2), very
It is additionally provided with high-speed camera, the sight opening up with the position by the upper corresponding high-speed camera of Dewar vessel (5) outside empty (5)
Examine window (not shown) the motion of individual particle is shot with video-corder in real time, high-speed camera should be able to catch the full mistake of molecule motion
Journey, therefore shooting speed must be balanced between readability and shooting speed.Wherein, upper electrode (1) and bottom electricity
Spacing between pole (2) is 30mm-100mm, and plate material is conductor material copper, makes lower electrode.
In another embodiment, plate material is silver, aluminum, zinc, ferrum or its alloy.
In another embodiment, lower electrode is copper, and plate material is idioelectric electrolyte, idioelectric flat board
Thickness is 1mm-3mm.
Embodiment 1Plate material is conductor, tests the adhesion that the adhesion obtaining is between lower electrode and individual particle Power and particle charge amount
When plate material is for conductor, then lower electrode is directly using the conductor material used by plate material and using identical
Technique make.Individual particle is placed on lower electrode (2), closes vacuum after connecting cable inside and outside Dewar vessel (5) and hold
Device (5), opens vacuum acquisition device and reaches predetermined vacuum inside Dewar vessel.Adjusting ultraviolet source (6) makes single
Grain is charged, and the irradiation intensity of ultraviolet source determines according to the actual emanations situation that granule may be subject to, exposure time is no less than 10
Minute；On-load voltage is gradually lifted with the speed being no faster than 1v/s, then certainly exists sometime t0, now electric field force feIt is equal to
Adhesion faWith granule gravity g sum (as shown in Figure 2)；After the t0 moment, because electric field force is more than adhesion, granule is upwards
Motion, with the disengaging of granule and plate material, adhesion strongly reduces, and now granule is only made by gravity g and electric field force fe
With doing the motion (as shown in Figure 3) that Constant Acceleration is a；Assume in the t0+t1 moment, granule moves to top crown position, due to two
The distance between individual pole plate d homeostasis (such as 5cm), can be calculated the acceleration of granule according to constant acceleration kinesiology law
A, can be calculated adhesion fa suffered by granule according to accekeration, add that granule gravity g can get granule electric field force numerical value
Fe, simultaneously fe can get electrically charged amount q of granule institute divided by electric field e.
Embodiment 1Plate material is non-conductor, and non-conductor is arranged on lower electrode, tests the adhesion obtaining and is Adhesion between non-conductor plate material and individual particle and particle charge amount
When plate material is for non-conductor such as politef, the plate material that thickness is d1 is placed on lower electrode.
Individual particle is placed on idioelectric plate material, after connecting cable inside and outside Dewar vessel (5), closes Dewar vessel (5),
Open vacuum acquisition device and reach predetermined vacuum inside Dewar vessel.Adjusting electron gun (7) makes individual particle charged, electricity
The beam energy of sub- rifle is less than 30kev, exposure time is no less than 10 minutes；Gradually lifted with the speed being no faster than 1v/s and add
Carry voltage, then certainly exist sometime t0, now electric field force feEqual to adhesion faWith granule gravity g sum (as accompanying drawing 2 institute
Show)；t0After moment, because electric field force is more than adhesion, granule moves upwards, with the disengaging of granule and plate material, glues
Attached power strongly reduces, and now granule is only acted on by gravity g and electric field force fe, does the motion for a for the Constant Acceleration (as Fig. 3 institute
Show)；Assume in the t0+t1 moment, granule moves to top crown position, due to the distance between two pole plates d homeostasis, plate material
Thickness d 1 constant, then the move distance of granule be d-d1 (such as 5cm), can be calculated according to constant acceleration kinesiology law
To the acceleration a of granule, adhesion fa suffered by granule can be calculated according to accekeration, add that granule gravity g can get
Granule electric field force numerical value fe, simultaneously fe can get electrically charged amount q of granule institute divided by electric field e.
Although above the specific embodiment of the present invention being given with detailed description and illustrating, it should be noted that
We can carry out various equivalent changes according to the conception of the present invention and change to above-mentioned embodiment, and function produced by it is made
With still without departing from description and accompanying drawing covered spiritual when, all should be within protection scope of the present invention.
Claims (8)
1. under vacuum condition, between individual particle and plate material, adhesion and particle charge measure test system, including Dewar vessel,
It is arranged on the battery lead plate of a pair of parallel setting in Dewar vessel, upper electrode and lower electrode are passed through wire respectively and held with vacuum
DC source outside device electrically connects and passes through DC source on-load voltage, makes to produce uniform electric field between parallel-plate, and vacuum is held
It is additionally provided with ultraviolet source or electron gun in device and charged operation is implemented to the individual particle being arranged on lower electrode, outside Dewar vessel
It is additionally provided with granule motion camera device, so that the fortune to individual particle for the observation window that position opens up is shot with video-corder by correspondence on Dewar vessel
Move and shot with video-corder in real time, wherein, the spacing between upper electrode and lower electrode is 30mm-100mm, and plate material is conductor material
Material, makes lower electrode.
2. test system as claimed in claim 1, wherein, plate material is non-conductive material, and is placed on lower electrode
Upper surface.
3. test system as claimed in claim 1, wherein, described granule motion camera device is high-speed camera.
4. test system as claimed in claim 1, wherein, plate material is copper, silver, aluminum, zinc, ferrum or its alloy.
5. as described in any one of claim 1-4, test system measures adhesion and particle charge between individual particle and plate material
The method of testing of amount, comprises the steps:
Individual particle is placed in lower flat plate, closes Dewar vessel after connecting cable inside and outside Dewar vessel, open vacuum and obtain
Take device until specified vacuum degree；
Adjust ultraviolet source or electron gun irradiation individual particle makes it powered；
Raise the voltage of DC source with the speed being not higher than 1v/s, open granule motion camera device simultaneously and continuously taken pictures
Or shooting；
When granule moves, top out voltage, and record granule moves the voltage u in moment, then granule motion is whole
During individual, between flat board, electric field e is steady state value, and e=u/d, d are the distance between upper electrode and lower electrode, according to seizure
To granule moving image utilize d=at2/ 2 calculating granule acceleration of motion a, wherein, t is granule from the moment moving
To the time used by moment reaching upper electrode, recycle fa=m × a obtains adhesion fa, wherein m is granular mass, then by
fe=fa+ g and fe=q × e obtains the carried charge q of granule, wherein feFor electric field force, g is the gravity of granule.
6. method of testing according to claim 5, wherein, ultraviolet source radiant light wavelength is in 10nm-400nm, light intensity root
It is adjusted according to ultraviolet radioactive degree suffered by granule reality, exposure time is no less than 10 minutes.
7. method of testing according to claim 5, wherein, the beam energy of electron gun is not higher than 20kev, exposure time
No less than 10 minutes.
8. the method for testing according to any one of claim 5-7, wherein, when plate material is for non-conducting material, flat board
The thickness of material is d1, then utilize 2 (d-d1)=at according to the granule moving image capturing2Calculate granule acceleration of motion a.
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| CN109633293A (en) * | 2018-12-25 | 2019-04-16 | 东南大学 | A kind of device and method that particles collision electrification is measured according to particle motion trajectory |
| CN110596430B (en) * | 2019-08-01 | 2022-03-15 | 中国科学院地球化学研究所 | Method for detecting adhesion of nanoparticles |
| CN110554254B (en) * | 2019-09-23 | 2021-02-02 | 华北电力大学 | Observing device for metal dust adsorption and accumulated charges of GIS or GIL equipment |
| CN110927472B (en) * | 2019-11-04 | 2021-08-03 | 华中科技大学 | Independent-measurement isolated conductor charge control method |
| CN113945496B (en) * | 2021-10-15 | 2023-06-23 | 兰州空间技术物理研究所 | Method for testing adhesion characteristics of star surface dust to sensitive surface by using device |
| CN114189172B (en) * | 2022-02-15 | 2022-05-24 | 之江实验室 | Method and device for accurately regulating and controlling net electric quantity of particles |
| CN117030553B (en) * | 2023-10-09 | 2024-03-08 | 乌镇实验室 | Particle size measurement and screening collection method for powder particles |
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| CN101484966A (en) * | 2006-07-06 | 2009-07-15 | 弗劳恩霍弗实用研究促进协会 | Apparatus for electron beam evaporation |
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