CN103983381A - System and method for testing single particle adhesive force and electric quantity under vacuum condition - Google Patents
System and method for testing single particle adhesive force and electric quantity under vacuum condition Download PDFInfo
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- CN103983381A CN103983381A CN201410238965.4A CN201410238965A CN103983381A CN 103983381 A CN103983381 A CN 103983381A CN 201410238965 A CN201410238965 A CN 201410238965A CN 103983381 A CN103983381 A CN 103983381A
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Abstract
The invention discloses a system for testing adhesive force between a single particle and a flat plate material and particle electric quantity under a vacuum condition. The system comprises a vacuum container and a pair of parallel electrode plates in the vacuum container. Two electrodes are respectively electrically connected with a direct current power supply outside the vacuum container through wires and load voltages through the power supply, a uniform electric field is generated between the two electrodes, an ultraviolet source or an electronic gun are arranged in the vacuum container, the single particle is made to be loaded with electricity, and a particle motion video recording device is arranged outside the vacuum container. The invention further discloses a test method. Compared with the prior art, the test environment of the system for testing single particle adhesive force and electric quantity is similar to a true environment, conformity of the test result is good, a test device is simple and can be implemented in any vacuum container, an expensive atomic force microscope is not needed, and vacuum transformation does not need to be conducted on a probe region.
Description
Technical field
The invention belongs to physical parameter technical field of measurement and test, specifically, the system that the present invention relates to test under vacuum condition adhesion between finely ground particles and flat board and particle carried charge, has also provided and utilizes this system to carry out the method for testing of aerosol particles by micro and dull and stereotyped adhesion and particle carried charge simultaneously.
Background technology
Conventionally, small particle contacts with plate material, between particle and flat board, can produce adhesion effect, and in general, grain diameter is less, and adhesion effect is more obvious, is less than the situation of 1mm for grain diameter, obvious especially.In adhesion force measuring system, the adhesion it has been generally acknowledged that is making a concerted effort of Van der Waals force between particle and flat board and electrostatic force, and the gravity of particle is considered separately.
At present, conventionally adopt the size of adhesion between atomic force microscope particle tested and plate material, its ultimate principle is that single particle is fixed on the probe of atomic force microscope, accurately control the distance between particle and plate material, be subject to the effect of adhesion, can there is deformation in probe cantilever, utilize the side-play amount that the mode of laser testing can measuring probe cantilever, according to deformation quantity and stressed relation, can calculate the adhesion between individual particle and flat board, concrete a kind of measuring method can be referring to Liu Guanqing etc., the interactional AFM of micron particles and solid surface measures, Engineering Thermophysics journal.The 30th volume, the 5th phase, in May, 2009,803-806 page.But there is major defect in the adhesion that uses atomic force microscope to measure between individual particle and plate material, is mainly manifested in following three aspects:
1, finely ground particles must be securely fixed in probe tip, and probe tip radius is generally 10 to tens nanometers, firmly fixes particle difficulty very large in so small structure.
2, use adhesion between atomic force microscope test individual particle and flat board, relative distance between the two is the artificial setting of tester and controls, relative distance can not truly reflect the actual pitch under particle natural sediment condition, and distance between particle and plate material is one of most important factor affecting adhesion between the two, so atomic force microscope method of testing can not reflect truth.
3, under vacuum condition, the environment such as radiant light photograph may cause particle charged, and charged particles is difficult for neutralization, particle carried charge is one of most important factor affecting particle adhesion, atomic force microscope is finished product surveying instrument, its test environment cannot be simulated charging particle situation, and therefore the adhesion that test obtains can not reflect truth.As can be seen here, existing atomic force microscope is measured individual particle and dull and stereotyped adhesion can not reflect real situation, and the error of measurement is very large, meanwhile, also cannot accurately obtain the carried charge of individual particle.Based on this, provide can truly reflect the measuring system of the adhesion between individual particle carried charge and individual particle and plate material and method very necessary.
Summary of the invention
The object of the present invention is to provide a kind of test macro that can truly reflect adhesion between single electrically charged particle and plate material and particle carried charge, this test system and test error is little, and the adhesion situation of particle and plate material under can simulating nature state, and do not need individual particle to carry out accurately fixing under miniature scale.
Another object of the present invention is to provide a kind of method of testing of utilizing above-mentioned measuring system to carry out adhesion between individual particle and plate material.This method of testing adopts non-contacting electrostatically field method, and simultaneous electric pulse field parameter and movement of particles parameter also can obtain particle band power consumption when obtaining particle adhesion, and main technical schemes is as follows:
Adhesion and particle carried charge test macro between individual particle and plate material under vacuum condition, comprise vacuum tank, be arranged on the battery lead plate that the pair of parallel in vacuum tank arranges, upper electrode and lower electrode are electrically connected to direct supply outside vacuum tank by wire respectively and pass through direct supply on-load voltage, make to produce between parallel-plate uniform electric field, in vacuum tank, be also provided with ultraviolet source or electron gun the individual particle being arranged on lower electrode is implemented to charged operation, vacuum tank is also provided with movement of particles camera device outward, to shoot with video-corder by correspondence on vacuum tank the view window of offering position, the motion of individual particle is shot with video-corder in real time, wherein, spacing between upper electrode and lower electrode is 30mm-100mm, plate material is conductor material, make lower electrode.
Wherein, plate material is non-conductive material, and is placed on the upper surface of lower electrode.
Wherein, described movement of particles camera device is high-speed camera.
Wherein, plate material is copper, silver, aluminium, zinc, iron or its alloy.
Utilize above-mentioned test macro to measure adhesion between individual particle and plate material and the method for carried charge, comprise the steps:
Individual particle is placed on lower electrode, connects the inside and outside cable of vacuum tank and close vacuum tank afterwards, open vacuum acquisition device until specified vacuum degree;
Regulate ultraviolet source or electron gun irradiation individual particle to make it charged;
With not higher than the voltage of the speed rising direct supply of 1V/s, open movement of particles camera device simultaneously and take pictures continuously or make a video recording.
When particle moves, the voltage that tops out, records particle and moves voltage U constantly,, in the whole process of movement of particles, between flat board, electric field E is steady state value, E=U/d, d is the distance between upper electrode and lower electrode, according to the movement of particles imagery exploitation d=at capturing
2/ 2 count particles acceleration of motion a, wherein, t be particle from move time be carved into the time used in the moment that arrives upper electrode, recycling Fa=m * a obtains adhesion Fa, wherein m is granular mass, by FE=Fa+G and FE=Q * E, obtained the carried charge Q of particle, wherein FE is electric field force, the gravity that G is particle again.
Wherein, ultraviolet source radiant light wavelength is at 10nm-400nm, and light intensity regulates according to the actual suffered UV radiation degree of particle, and exposure time is no less than 10 minutes.
Wherein, the beam energy of electron gun is not higher than 20keV, and exposure time is no less than 10 minutes.
Wherein, when plate material is non-conducting material, the thickness of plate material is d1, according to movement of particles imagery exploitation 2 (the d-d1)=at2 count particles acceleration of motion a capturing.
Compared with prior art, the major advantage of non-contact test method of the present invention is:
1, the suffered electric field force of simultaneous particle and movement of particles parameter obtain particle adhesion and particle carried charge by the mode of equation with two unknowns simultaneously, have avoided solving separately the uncertain difficult problem that cannot obtain adhesion of adhesion charged particles.
2, test environment and true environment are more approaching, and test result degree of conformity is higher.
3, proving installation is simple, all can implement, without using expensive atomic force microscope, also without probe area being done to vacuum transformation in any vacuum tank.
Accompanying drawing explanation
Fig. 1 is adhesion and particle carried charge test macro schematic diagram between individual particle and plate material under vacuum condition of the present invention;
Wherein, 1 is upper electrode; 2 is lower electrode; 3 is individual particle; 4 is direct supply; 5 is vacuum tank; 6 is ultraviolet source; 7 is electron gun.
Fig. 2 is that individual particle is at t=t
0stress schematic diagram constantly, wherein; T=t
0constantly, F
e=F
a+ G;
Fig. 3 is that individual particle is at t=t
0+ Δ t stress schematic diagram constantly, wherein F
e>G, acceleration a=(F
e-G)/m, m is granular mass.
Fig. 4 is that individual particle is at t=t
0+ t
1stress schematic diagram constantly, now, particle contacts with upper electrode.
Embodiment
Referring to accompanying drawing under vacuum condition of the present invention between individual particle and plate material adhesion and particle carried charge test macro be elaborated, but this description is only exemplary, is not intended to protection scope of the present invention to carry out any restriction.
With reference to Fig. 1, adhesion and particle carried charge test macro between individual particle and plate material under vacuum condition of the present invention, comprise upper electrode (1), lower electrode (2), individual particle (3), direct supply (4), vacuum tank (5), ultraviolet source (6) or electron gun (7) and movement of particles camera device.Upper electrode (1) and lower electrode (2) are the electrodes of pair of parallel, be arranged in vacuum tank (5), upper electrode (1) and lower electrode (2) are electrically connected to direct supply (4) outside vacuum tank by wire respectively and pass through direct supply (4) on-load voltage, make to produce between parallel-plate uniform electric field E, in vacuum tank (5), be also provided with ultraviolet source (6) or electron gun (7) is implemented charged operation to the individual particle being arranged on lower electrode (2), the outer high-speed camera that is also provided with of vacuum tank (5), with the view window (not shown) of offering by the position of the upper corresponding high-speed camera of vacuum tank (5), the motion of individual particle is shot with video-corder in real time, high-speed camera should be able to catch the overall process of molecule motion, therefore shooting speed must carry out balance between readability and shooting speed.Wherein, the spacing between upper electrode (1) and lower electrode (2) is 30mm-100mm, and plate material is conductor material copper, makes lower electrode.
In another embodiment, plate material is silver, aluminium, zinc, iron or its alloy.
In another embodiment, lower electrode is copper, and plate material is idioelectric dielectric, and idioelectric slab-thickness is 1mm-3mm.
Embodiment 1
plate material is conductor, and the adhesion that test obtains is between lower electrode and individual particle adhesion and particle carried charge
When plate material is conductor, lower electrode is directly used plate material conductor material used and adopts identical technique to make.Individual particle is placed on to lower electrode (2) upper, connects the inside and outside cable of vacuum tank (5) and close vacuum tank (5) afterwards, open vacuum acquisition device until vacuum tank inside reaches predetermined vacuum tightness.Regulate ultraviolet source (6) to make individual particle charged, the actual emanations situation that the irradiation intensity of ultraviolet source may be subject to according to particle is determined, exposure time is no less than 10 minutes; To be no faster than the speed of 1V/s, promote gradually on-load voltage, certainly exist t sometime
0, electric field force F now
eequal adhesion F
awith particle gravity G sum (as shown in Figure 2); T0 is after the moment, and because electric field force is greater than adhesion, particle moves upward, and along with the disengaging of particle and plate material, adhesion sharply reduces, and now particle is only subject to the effect of gravity G and electric field force FE, does the motion that constant acceleration is a (as shown in Figure 3); Suppose at t0+t1 constantly, the supreme polar plate position of movement of particles, for example, due to the distance d homeostasis between two pole plates (5cm), according to constant acceleration kinematics law, can calculate the acceleration a of particle, according to accekeration, can calculate the suffered adhesion Fa of particle, add that particle gravity G can obtain particle electric field force numerical value FE, FE can obtain the electrically charged amount Q of particle divided by electric field E simultaneously.
Embodiment 1
plate material is nonconductor, and nonconductor is arranged on lower electrode, and it is sticky that test obtains attached power is adhesion and the particle carried charge between non-conductor plate material and individual particle
When plate material is nonconductor during as teflon, on lower electrode, place the plate material that thickness is d1.Individual particle is placed on idioelectric plate material, connects the inside and outside cable of vacuum tank (5) and close vacuum tank (5) afterwards, open vacuum acquisition device until vacuum tank inside reaches predetermined vacuum tightness.Regulate electron gun (7) to make individual particle charged, the beam energy of electron gun lower than 30keV, exposure time for being no less than 10 minutes; To be no faster than the speed of 1V/s, promote gradually on-load voltage, certainly exist t sometime
0, electric field force F now
eequal adhesion F
awith particle gravity G sum (as shown in Figure 2); t
0constantly, because electric field force is greater than adhesion, particle moves upward, and along with the disengaging of particle and plate material, adhesion sharply reduces, and now particle is only subject to the effect of gravity G and electric field force FE, does the motion that constant acceleration is a (as shown in Figure 3); Suppose at t0+t1 constantly, the supreme polar plate position of movement of particles, due to the distance d homeostasis between two pole plates, the thickness d 1 of plate material is constant, the move distance of particle is d-d1 (for example 5cm), can calculate the acceleration a of particle according to constant acceleration kinematics law, according to accekeration, can calculate the suffered adhesion Fa of particle, add that particle gravity G can obtain particle electric field force numerical value FE, FE can obtain the electrically charged amount Q of particle divided by electric field E simultaneously.
Although above the specific embodiment of the present invention has been given to describe in detail and explanation; but what should indicate is; we can carry out various equivalences to above-mentioned embodiment according to conception of the present invention and change and revise; when its function producing does not exceed spiritual that instructions and accompanying drawing contain yet, all should be within protection scope of the present invention.
Claims (8)
1. adhesion and particle carried charge test macro between individual particle and plate material under vacuum condition, comprise vacuum tank, be arranged on the battery lead plate that the pair of parallel in vacuum tank arranges, upper electrode and lower electrode are electrically connected to direct supply outside vacuum tank by wire respectively and pass through direct supply on-load voltage, make to produce between parallel-plate uniform electric field, in vacuum tank, be also provided with ultraviolet source or electron gun the individual particle being arranged on lower electrode is implemented to charged operation, vacuum tank is also provided with movement of particles camera device outward, to shoot with video-corder by correspondence on vacuum tank the view window of offering position, the motion of individual particle is shot with video-corder in real time, wherein, spacing between upper electrode and lower electrode is 30mm-100mm, plate material is conductor material, make lower electrode.
2. test macro as claimed in claim 1, wherein, plate material is non-conductive material, and is placed on the upper surface of lower electrode.
3. test macro as claimed in claim 1, wherein, described movement of particles camera device is high-speed camera.
4. the test macro as described in claim 1-3 any one, wherein, plate material is copper, silver, aluminium, zinc, iron or its alloy.
5. utilize test macro described in claim 1-4 any one to measure the method for adhesion and particle carried charge between individual particle and plate material, comprise the steps:
Individual particle is placed in lower flat plate, connects the inside and outside cable of vacuum tank and close vacuum tank afterwards, open vacuum acquisition device until specified vacuum degree;
Regulate ultraviolet source or electron gun irradiation individual particle to make it charged;
With not higher than the voltage of the speed rising direct supply of 1V/s, open movement of particles camera device simultaneously and take pictures continuously or make a video recording.
When particle moves, the voltage that tops out, records particle and moves voltage U constantly,, in the whole process of movement of particles, between flat board, electric field E is steady state value, E=U/d, d is the distance between upper electrode and lower electrode, according to the movement of particles imagery exploitation d=at capturing
2/ 2 count particles acceleration of motion a, wherein, t be particle from move time be carved into the time used in the moment that arrives upper electrode, recycling F
a=m * a obtains adhesion F
a, wherein m is granular mass, then by F
e=F
a+ G and F
e=Q * E obtains the carried charge Q of particle, wherein F
efor electric field force, the gravity that G is particle.
6. method of testing according to claim 5, wherein, ultraviolet source radiant light wavelength is at 10nm-400nm, and light intensity regulates according to the actual suffered UV radiation degree of particle, and exposure time is no less than 10 minutes.
7. method of testing according to claim 5, wherein, the beam energy of electron gun is not higher than 20keV, and exposure time is no less than 10 minutes.
8. according to the method for testing described in claim 5-7 any one, wherein, when plate material is non-conducting material, the thickness of plate material is d1, according to movement of particles imagery exploitation 2 (the d-d1)=at2 count particles acceleration of motion a capturing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410238965.4A CN103983381B (en) | 2014-05-30 | 2014-05-30 | System and method for testing single particle adhesive force and electric quantity under vacuum condition |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410238965.4A CN103983381B (en) | 2014-05-30 | 2014-05-30 | System and method for testing single particle adhesive force and electric quantity under vacuum condition |
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| CN103983381B CN103983381B (en) | 2017-01-25 |
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Cited By (10)
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| CN106841834A (en) * | 2015-12-07 | 2017-06-13 | 中国电力科学研究院 | The measuring method of carried charge in a kind of motion process to metal particle |
| CN106950438A (en) * | 2017-04-28 | 2017-07-14 | 中国科学院地球化学研究所 | Contactless Space Particle measuring device with electricity and method |
| CN109633293A (en) * | 2018-12-25 | 2019-04-16 | 东南大学 | A kind of device and method that particles collision electrification is measured according to particle motion trajectory |
| CN109813974A (en) * | 2018-12-18 | 2019-05-28 | 兰州空间技术物理研究所 | A kind of geostationary orbit material inequality charging test device |
| CN110554254A (en) * | 2019-09-23 | 2019-12-10 | 华北电力大学 | observing device for metal dust adsorption and accumulated charges of GIS or GIL equipment |
| CN110596430A (en) * | 2019-08-01 | 2019-12-20 | 中国科学院地球化学研究所 | Method for detecting adhesion of nanoparticles |
| CN110927472A (en) * | 2019-11-04 | 2020-03-27 | 华中科技大学 | Independent-measurement isolated conductor charge control method |
| CN113945496A (en) * | 2021-10-15 | 2022-01-18 | 兰州空间技术物理研究所 | Device and method for testing adhesion characteristics of dust on surface of star body to sensitive surface |
| CN114189172A (en) * | 2022-02-15 | 2022-03-15 | 之江实验室 | Method and device for accurately regulating and controlling net electric quantity of particles |
| CN117030553A (en) * | 2023-10-09 | 2023-11-10 | 乌镇实验室 | Particle size measurement and screening collection method for powder particles |
Family Cites Families (1)
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| DE102006031244B4 (en) * | 2006-07-06 | 2010-12-16 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Device for evaporating a material by means of an electron beam and for depositing the vapor on a substrate |
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- 2014-05-30 CN CN201410238965.4A patent/CN103983381B/en not_active Expired - Fee Related
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| CN106841834A (en) * | 2015-12-07 | 2017-06-13 | 中国电力科学研究院 | The measuring method of carried charge in a kind of motion process to metal particle |
| CN106841834B (en) * | 2015-12-07 | 2019-12-13 | 中国电力科学研究院 | Method for measuring charged quantity in metal particle movement process |
| CN106950438A (en) * | 2017-04-28 | 2017-07-14 | 中国科学院地球化学研究所 | Contactless Space Particle measuring device with electricity and method |
| CN106950438B (en) * | 2017-04-28 | 2023-06-02 | 中国科学院地球化学研究所 | Non-contact space particle charged detection device and method |
| CN109813974A (en) * | 2018-12-18 | 2019-05-28 | 兰州空间技术物理研究所 | A kind of geostationary orbit material inequality charging test device |
| CN109633293A (en) * | 2018-12-25 | 2019-04-16 | 东南大学 | A kind of device and method that particles collision electrification is measured according to particle motion trajectory |
| CN110596430A (en) * | 2019-08-01 | 2019-12-20 | 中国科学院地球化学研究所 | Method for detecting adhesion of nanoparticles |
| CN110596430B (en) * | 2019-08-01 | 2022-03-15 | 中国科学院地球化学研究所 | Method for detecting adhesion of nanoparticles |
| CN110554254B (en) * | 2019-09-23 | 2021-02-02 | 华北电力大学 | Observing device for metal dust adsorption and accumulated charges of GIS or GIL equipment |
| CN110554254A (en) * | 2019-09-23 | 2019-12-10 | 华北电力大学 | observing device for metal dust adsorption and accumulated charges of GIS or GIL equipment |
| CN110927472A (en) * | 2019-11-04 | 2020-03-27 | 华中科技大学 | Independent-measurement isolated conductor charge control method |
| CN113945496A (en) * | 2021-10-15 | 2022-01-18 | 兰州空间技术物理研究所 | Device and method for testing adhesion characteristics of dust on surface of star body to sensitive surface |
| CN114189172A (en) * | 2022-02-15 | 2022-03-15 | 之江实验室 | Method and device for accurately regulating and controlling net electric quantity of particles |
| CN114189172B (en) * | 2022-02-15 | 2022-05-24 | 之江实验室 | Method and device for accurately regulating and controlling net electric quantity of particles |
| CN117030553A (en) * | 2023-10-09 | 2023-11-10 | 乌镇实验室 | Particle size measurement and screening collection method for powder particles |
| CN117030553B (en) * | 2023-10-09 | 2024-03-08 | 乌镇实验室 | Particle size measurement and screening collection method for powder particles |
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| CN103983381B (en) | 2017-01-25 |
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