CN103983247A - Method for measuring inclination angle based on secondary platform linear array CCD (Charge Coupled Device) - Google Patents
Method for measuring inclination angle based on secondary platform linear array CCD (Charge Coupled Device) Download PDFInfo
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- CN103983247A CN103983247A CN201410208601.1A CN201410208601A CN103983247A CN 103983247 A CN103983247 A CN 103983247A CN 201410208601 A CN201410208601 A CN 201410208601A CN 103983247 A CN103983247 A CN 103983247A
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- array ccd
- line array
- platform
- inclination angle
- plane
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D3/00—Control of position or direction
- G05D3/12—Control of position or direction using feedback
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses a method for measuring an inclination angle based on a secondary platform linear array CCD (Charge Coupled Device), and relates to a method for measuring an inclination angle based on a secondary platform, belongs to measuring methods of measuring systems of ultraprecise instruments. The method aims to solve the problems that a grating type encoder is not suitable for systems of the secondary platform and a six-degrees-of-freedom air bearing table and the precision is poor when an inclination sensor is dynamically operated on the secondary platform. The method comprises the following steps of rotatably scanning a nearby linear array CCD by rotating a semiconductor laser and leaving light spots with different heights on a screen of the linear array CCD, so as to obtain height data of the light spots on the screen of the linear array CCD. Signals of the height data of the adjacent light spots on the linear array CCD are sent to a digital signal processor, the inclination angle alpha of a plane formed by the light spots is solved according to height signals of the light spots, the inclination angle alpha is compensated according to errors, and the compensated inclination angle alpha0 is used as the inclination angle of the existing platform. The method is suitable for measuring the inclination angle of the secondary platform.
Description
Technical field
The present invention relates to the inclination angle measurement method based on secondary platform, belong to the measuring method of ultraprecise instrument and equipment measuring system.
Background technology
In modern society, often need the platform of high flatness, in the full physical simulation tests such as cross in space docking, ground survey, navigation, network service and formation control, need to support whole ground emulator, for ground simulation experiment provides basic platform, for providing platform, support the physical simulation tests such as the checking of Satellite Formation Flying ground experiment, control algolithm check analysis.Due to platform motion or all may be because the reasons such as the out-of-flatness of large area horizontal base are in heeling condition when static, be unfavorable for ensureing accurately docking for load provides the job platform of level as far as possible, therefore need the platform can both be by leveling fast, accurately, with the levelness that ensures that platform is enough in static and motion state.
Secondary platform and six degree of freedom air floating table orbiter, orbital vehicle and six degree of freedom air floating table lifting device form the core of intersection Docking simulation test jointly.Wherein, taking air-floating ball bearing and gravitational equilibrium servo motion mechanism as core, the six degree of freedom air floating table orbiter, orbital vehicle of composition is used for analog orbit device dynamics simulation state; Secondary platform is used for supporting six degree of freedom air floating table orbiter, orbital vehicle, realizes High Precision Automatic leveling; Coordinate with six degree of freedom lifting device, realize complete intersection docking dynamics and control full physical simulation test.Whole system operates on large I type granite platform, is core and the basic platform of ground full physical simulation test; Also for providing platform, supports following physical simulation test such as the checking of Satellite Formation Flying ground experiment, control algolithm check analysis.Measurement of dip angle is a part for whole automatic horizontal control system, mainly realizes laser scanning plane measurement of dip angle.
Existing method is generally to measure inclination angle according to obliquity sensor or raster pattern scrambler, but because the secondary platform moment exists the motion without evident regularity, and obliquity sensor is in fact a kind of acceleration transducer, can only in the time of quiescent operation, ensure higher precision (0.1 rad of left and right), and cannot in the time of dynamic duty, reach desirable precision, raster pattern scrambler needs a metastable rotating shaft to measure, but in system, the air supporting of secondary platform is on large platform, there is no dead axle, so raster pattern scrambler is not suitable for using in said system.
Summary of the invention
The object of this invention is to provide a kind ofly based on secondary platform line array CCD inclination angle measurement method, be not suitable for the problem of secondary platform and six degree of freedom air floating table system and adopt the problem of obliquity sensor low precision when the dynamic duty of secondary platform in order to solve raster pattern scrambler.
Inclination angle measurement method based on secondary platform line array CCD is that the inclination measuring system based on secondary platform line array CCD is realized, and system comprises: secondary platform, whole platform, rotation semiconductor laser, line array CCD, signal processor (DSP); Rotation semiconductor laser is arranged on to secondary platform surface, line array CCD is arranged on to whole platform surrounding, the intersection point of light-sensitive surface normal of line array CCD is set at whole platform center; Secondary platform can move on whole platform, and line array CCD connects signal processor.
The process of the inclination angle measurement method based on secondary platform line array CCD is:
Step 1, rotation semiconductor laser rotation sweep line array CCD around leave the luminous point highly not waiting on line array CCD screen, obtain the altitude information of luminous point on line array CCD screen; The altitude information signal of luminous point on adjacent line array CCD is sent to digital signal processor.
Step 2, solve luminous point according to the altitude signal of luminous point in DSP and form the inclination alpha of plane.
Step 3, get to after line array CCD and DSP receive signal and through the response time error of going through, inclination alpha is compensated according to rotation semiconductor laser, by the inclination alpha after compensation
0as the inclination angle of current platform.
This method can be applied to the adjustment to platform in secondary plateform system, and ensure that air floating table also can reach the precision of micron level during in dynamic duty at large platform, the acceleration transducer of 0.1 rad of accuracy rating while being far superior to quiescent operation, make six degree of freedom air floating table orbiter, orbital vehicle realize High Precision Automatic leveling, realize complete intersection docking dynamics and control full physical simulation test.
Brief description of the drawings
The inclination measuring system schematic diagram (there is no marking signal processor in figure) of Fig. 1 secondary platform line array CCD;
Fig. 2 measures secondary platform inclination angle principle schematic;
Fig. 3 solves the inclination angle schematic diagram of luminous point formation plane.
Embodiment
Embodiment one: present embodiment is described in conjunction with Fig. 1, the inclination angle measurement method based on secondary platform line array CCD of present embodiment is that the inclination measuring system based on secondary platform line array CCD is realized, system comprises: secondary platform (1), whole platform (2), rotation semiconductor laser (3), line array CCD (4), signal processor (DSP); To rotate semiconductor laser (3) and be arranged on secondary platform (1) surface, line array CCD (4) is arranged on to whole platform (2) surrounding, the intersection point of light-sensitive surface normal of line array CCD (4) is set at whole platform (2) center; Secondary platform (1) can be in the upper motion of whole platform (2), and line array CCD (4) connects signal processor.
The process of the inclination angle measurement method based on secondary platform line array CCD is:
Step 1, rotation semiconductor laser (3) rotation sweep line array CCD (4) around, on line array CCD (4) screen, leave the luminous point highly not waiting, obtain the altitude information of luminous point on line array CCD (4) screen; The altitude information signal of the upper luminous point of adjacent line array CCD (4) is sent to digital signal processor.
Step 2, solve luminous point according to the altitude signal of luminous point in DSP and form the inclination alpha of plane.
Step 3, get to after line array CCD (4) and DSP receive signal and through the response time error of going through, inclination alpha is compensated according to rotation semiconductor laser (3), by the inclination alpha after compensation
0as the inclination angle of current platform.
Embodiment two: present embodiment is described in conjunction with Fig. 2, " rotation semiconductor laser (3) rotation sweep line array CCD (4) around in step 1 described in present embodiment, on line array CCD (4) screen, leave the luminous point highly not waiting, obtain the altitude information of luminous point on line array CCD (4) screen " concrete operation step be: taking the center of whole platform (2) as initial point, set up coordinate system using secondary platform (1) plane as X0Y plane, the vertical X0Y of Z axis, coordinate with the position mark line array CCD (4) of line array CCD (4) place plane in X0Y plane, be designated as (x, y), the coordinate of the luminous point in corresponding line array CCD (4) is designated as (x, y, z).
Other step is identical with embodiment one.
Embodiment three: in conjunction with Fig. 3, present embodiment is described, the concrete operation step of present embodiment step 2 " solving the inclination alpha of luminous point formation plane according to the altitude signal of luminous point in DSP " is:
Step 1: the volume coordinate A (x that chooses luminous point altitude information signal on adjacent 3 line array CCDs (4) and be designated as upper 3 points of line array CCD (4)
1, y
1, z
1), B (x
2, y
2, z
2), C (x
3, y
3, z
3).
Step 2: with A (x
1, y
1, z
1), B (x
2, y
2, z
2), C (x
3, y
3, z
3) 3 determine that a plane is designated as plane ABC, try to achieve the normal direction vector (a, b, c) of plane ABC according to formula (1),
(a,b,c)＝[(x
2-x
1),(y
2-y
1),(z
2-z
1)]×[(x
3-x
1),(y
3-y
1),(z
3-z
1)]
＝[(y
2-y
1)(z
3-z
1)-(z
2-z
1)(y
3-y
1)]i-[(x
2-x
1)(z
3-z
1)-(x
3-x
1)(z
2-z
1)]j (1)
+[(x
2-x
1)(y
3-y
1)-(x
3-x
1)(y
2-y
1)]k
I, j, k is X, Y, the vector of unit length of Z.
Step 3: according to formula (2) Calculation Plane ABC and plane X 0Y folder cosine of an angle.
According to formula (3) plane ABC and plane X 0Y angle, i.e. inclination alpha.
α＝arccos(cosα) (3)
Other step is identical with embodiment two.
Embodiment four: the concrete operation step that step 3 described in present embodiment " is got to after line array CCD (4) and DSP receive signal and through the response time error of going through, inclination alpha compensated according to rotation semiconductor laser (3) " is:
According to formula (4), inclination alpha is carried out to error compensation, compensation back rake angle is α
0,
α
0＝α+T*W (4)
T gets to the response time that really sends to DSP to experience altitude information signal after line array CCD (4), the angular velocity that W is platform for rotating semiconductor laser (3).
Other step is identical with embodiment three.
Claims (4)
1. the inclination angle measurement method based on secondary platform line array CCD, described method is that the inclination measuring system based on secondary platform line array CCD is realized, described system comprises: secondary platform, whole platform, rotation semiconductor laser, line array CCD, signal processor (DSP); Rotation semiconductor laser is arranged on to secondary platform surface, line array CCD is arranged on to whole platform surrounding, the intersection point of light-sensitive surface normal of line array CCD is set at whole platform center; Secondary platform can move on whole platform, and line array CCD connects signal processor;
It is characterized in that described method realizes according to following steps:
Step 1, rotation semiconductor laser rotation sweep line array CCD around leave the luminous point highly not waiting on line array CCD screen, obtain the altitude information of luminous point on line array CCD screen; The altitude information signal of luminous point on adjacent line array CCD is sent to digital signal processor;
Step 2, solve luminous point according to the altitude signal of luminous point in DSP and form the inclination alpha of plane;
Step 3, get to after line array CCD and DSP receive signal and through the response time error of going through, inclination alpha is compensated according to rotation semiconductor laser, by the inclination alpha after compensation
0as the inclination angle of current platform.
2. the inclination angle measurement method based on secondary platform line array CCD according to claim 1, it is characterized in that: " the rotation semiconductor laser rotation sweep line array CCD around of step 1, on line array CCD screen, leave the luminous point highly not waiting, obtain the altitude information of luminous point on line array CCD screen " implementation procedure be: taking the center of whole platform as initial point, set up coordinate system using secondary platform plane as X0Y plane, the vertical X0Y of Z axis, coordinate with the position mark line array CCD of line array CCD place plane in X0Y plane, be designated as (x, y), the coordinate of the luminous point in corresponding line array CCD is designated as (x, y, z).
3. the inclination angle measurement method based on secondary platform line array CCD according to claim 2, is characterized in that: " solving the inclination alpha of luminous point formation plane according to the altitude signal of luminous point in DSP " implementation procedure of step 2 is:
Step 1: the volume coordinate A (x that chooses luminous point altitude information signal on 3 adjacent line array CCDs and be designated as 3 points on line array CCD
1, y
1, z
1), B (x
2, y
2, z
2), C (x
3, y
3, z
3);
Step 2: with A (x
1, y
1, z
1), B (x
2, y
2, z
2), C (x
3, y
3, z
3) 3 determine that a plane is designated as plane ABC, try to achieve the normal direction vector (a, b, c) of plane ABC according to formula (1);
(a,b,c)＝[(x
2-x
1),(y
2-y
1),(z
2-z
1)]×[(x
3-x
1),(y
3-y
1),(z
3-z
1)]
＝[(y
2-y
1)(z
3-z
1)-(z
2-z
1)(y
3-y
1)]i-[(x
2-x
1)(z
3-z
1)-(x
3-x
1)(z
2-z
1)]j (1)
+[(x
2-x
1)(y
3-y
1)-(x
3-x
1)(y
2-y
1)]k
I, j, k is X, Y, the vector of unit length of Z;
Step 3: according to formula (2) Calculation Plane ABC and plane X 0Y folder cosine of an angle;
According to formula (3) plane ABC and plane X 0Y angle, i.e. inclination alpha;
α＝arccos(cosα) (3)。
4. the inclination angle measurement method based on secondary platform line array CCD according to claim 3, is characterized in that: the implementation procedure that step 3 " is got to after line array CCD and DSP receive signal and through the response time error of going through, inclination alpha compensated according to rotation semiconductor laser " is:
According to formula (4), inclination alpha is carried out to error compensation, compensation back rake angle is α
0;
α
0＝α+T*W (4)
T is that rotation semiconductor laser is got to the response time that really sends to DSP to experience altitude information signal after line array CCD, the angular velocity that W is platform.
Priority Applications (1)
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|---|---|---|---|
| CN201410208601.1A CN103983247B (en) | 2014-05-16 | 2014-05-16 | Inclination angle measurement method based on secondary platform line array CCD |
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|---|---|---|---|
| CN201410208601.1A CN103983247B (en) | 2014-05-16 | 2014-05-16 | Inclination angle measurement method based on secondary platform line array CCD |
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| CN103983247B CN103983247B (en) | 2016-06-29 |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104501776A (en) * | 2014-12-18 | 2015-04-08 | 哈尔滨工业大学 | Measurement system and measurement method of polar coordinate-type non-contact horizontal mirror-surface inclination angle |
| CN104848839A (en) * | 2015-05-07 | 2015-08-19 | 哈尔滨工业大学 | Multi-shaft support air-floating platform horizontal measurement device |
| CN105180966A (en) * | 2015-08-05 | 2015-12-23 | 哈尔滨工业大学 | Method for optimization of secondary platform linear array CCD measured inclination angle based on Kalman filtering |
| CN109945834A (en) * | 2019-03-26 | 2019-06-28 | 长沙闪控信息科技有限公司 | A kind of platform inclination angle and height real-time measurement system and method |
| CN111076748A (en) * | 2020-01-06 | 2020-04-28 | 重庆邮电大学 | Horizontal inclinometer error compensation method and system based on MEMS accelerometer |
| CN113358114A (en) * | 2021-07-01 | 2021-09-07 | 中国科学院光电技术研究所 | Disturbance decoupling and inhibiting method based on fusion of gyroscope and fine television signals |
| CN114234853A (en) * | 2021-11-19 | 2022-03-25 | 广东嘉腾机器人自动化有限公司 | Shelf inclination angle measuring method, system, equipment and medium based on laser scanning |
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| CN103335632A (en) * | 2013-06-14 | 2013-10-02 | 哈尔滨工业大学 | High-precision high-frequency response platform inclined angle measuring device and method for measuring platform inclined angle by adopting same |
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104501776A (en) * | 2014-12-18 | 2015-04-08 | 哈尔滨工业大学 | Measurement system and measurement method of polar coordinate-type non-contact horizontal mirror-surface inclination angle |
| CN104501776B (en) * | 2014-12-18 | 2017-02-22 | 哈尔滨工业大学 | Measurement system and measurement method of polar coordinate-type non-contact horizontal mirror-surface inclination angle |
| CN104848839A (en) * | 2015-05-07 | 2015-08-19 | 哈尔滨工业大学 | Multi-shaft support air-floating platform horizontal measurement device |
| CN105180966A (en) * | 2015-08-05 | 2015-12-23 | 哈尔滨工业大学 | Method for optimization of secondary platform linear array CCD measured inclination angle based on Kalman filtering |
| CN105180966B (en) * | 2015-08-05 | 2018-03-30 | 哈尔滨工业大学 | A kind of method optimized based on Kalman filtering to secondary platform line array CCD measurement inclination angle |
| CN109945834A (en) * | 2019-03-26 | 2019-06-28 | 长沙闪控信息科技有限公司 | A kind of platform inclination angle and height real-time measurement system and method |
| CN109945834B (en) * | 2019-03-26 | 2021-10-12 | 长沙闪控信息科技有限公司 | Real-time measurement system and method for inclination angle and height of platform |
| CN111076748A (en) * | 2020-01-06 | 2020-04-28 | 重庆邮电大学 | Horizontal inclinometer error compensation method and system based on MEMS accelerometer |
| CN113358114A (en) * | 2021-07-01 | 2021-09-07 | 中国科学院光电技术研究所 | Disturbance decoupling and inhibiting method based on fusion of gyroscope and fine television signals |
| CN113358114B (en) * | 2021-07-01 | 2022-07-29 | 中国科学院光电技术研究所 | Disturbance decoupling and suppression method based on gyroscope and smart television signal fusion |
| CN114234853A (en) * | 2021-11-19 | 2022-03-25 | 广东嘉腾机器人自动化有限公司 | Shelf inclination angle measuring method, system, equipment and medium based on laser scanning |
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| CN103983247B (en) | 2016-06-29 |
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Inventor after: Liu Yang Inventor after: Song Fazhi Inventor after: Fu Zhenxian Inventor after: Chen Xinglin Inventor before: Chen Xinglin Inventor before: Liu Shuai Inventor before: Liu Yuwei Inventor before: Du Jing |
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Effective date of registration: 20190614 Address after: 150000 Heilongjiang Harbin Dalian economic and Trade Zone, the North Road and Xingkai Road intersection Patentee after: Harbin University of Technology Robot Group Co., Ltd. Address before: 150001 No. 92 West straight street, Nangang District, Heilongjiang, Harbin Patentee before: Harbin Institute of Technology |
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