CN103970121A - Distributed automatic test framework system for satellites - Google Patents

Distributed automatic test framework system for satellites Download PDF

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CN103970121A
CN103970121A CN201410131862.8A CN201410131862A CN103970121A CN 103970121 A CN103970121 A CN 103970121A CN 201410131862 A CN201410131862 A CN 201410131862A CN 103970121 A CN103970121 A CN 103970121A
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test
module
instruction
test instruction
dispatching management
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CN103970121B (en
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吴婧
陆文高
阎诚
李丽琼
关彬
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Aerospace Dongfanghong Satellite Co Ltd
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Aerospace Dongfanghong Satellite Co Ltd
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Abstract

The invention discloses a distributed automatic test framework system for satellites. The distributed automatic test framework system comprises a test program definition module, a test execution control module, a test data analysis module, a test database and a monitoring terminal. A distributed system architecture is adopted for the characteristics that small satellite control subsystem test states are complicated and test processes and test methods for small satellite control subsystems are different from test processes and test methods for other satellite subsystems, test programs which conform to control subsystem test requirements are created, test procedures can be automatically executed, information can be automatically judged to determine whether test instructions are correctly executed or not, whether test data are out of tolerance or not and the like, and test reports can be automatically generated from test results and can be stored in the test database. The distributed automatic test framework system has the advantages of reusability and customization. Besides, automatic test systems applicable to different small satellite control subsystems can be developed on the basis of the framework system, accordingly, the software development efficiency can be improved, risks due to manual instruction transmission and manual test equipment setup can be reduced, and the test quality and the test efficiency can be enhanced.

Description

A kind of distributed satellites automated test frame system
Technical field
The present invention relates to a kind of distributed satellites automated test frame system, belong to satellite test technical field.
Background technology
Integrated level, automaticity and the testing efficiency of satellite comprehensive testing system reflected the technical level of satellite test.At present, China's satellite comprehensive testing system is used distributing testing apparatus substantially, and test data and result are also mainly by artificial judgment.The shortcoming of this test pattern is: the tester and the operating post that need are more; Artificial monitoring data may leak transient state catastrophic failure, and had erroneous judgement and do not sentence in time phenomenon; Be difficult to realize the time synchronized of each test data, this is particularly outstanding in the time of localization of fault and analysis; Testing efficiency is lower; Tester's working strength is larger.Along with the continuous growth of satellite application demand, satellite automatic test technology is more aobvious important.The intellectuality and the automatic test level that improve satellite test system, can not only meet the needs of quick test, and can improve resource utilization.
The test mode of satellite control subsystem is comparatively complicated, and testing process and method of testing also exist larger difference with other subsystem of satellite.Current test macro exists the problems such as automatic test function is strong, data intelligence interpretation function is weak, test data can not realize that network is shared, and test operation substantially relies on manually and completes with test interpretation.The aspect problem demanding prompt solutions such as the depth analysis of the overall architecture of test macro, the acquiring way of test data, test data become restriction moonlet control subsystem integration test technology and continue the deeply Main Bottleneck of development.
Summary of the invention
Technology of the present invention is dealt with problems and is: overcome the deficiencies in the prior art, for the testing feature of moonlet control subsystem, a kind of distributed satellites automated test frame system is provided, foundation meets the test procedure of controlling subsystem test demand, realize automatically performing of test process, the information such as whether automatic decision test instruction is correctly carried out, whether test data is overproof, and test result is generated to test report be automatically stored in test database.The frame system of the present invention's design has reusable, customizable feature, can on the basis of frame system, develop and be applicable to the automatization test system of different moonlet control subsystems, make whole moonlet control subsystem test environment software platform possess one general, can expansion, portable, architectural framework flexibly.
Technical solution of the present invention is: a kind of distributed satellites automated test frame system comprises test procedure definition module, test execution control module, test data analysis module, test database, monitor terminal;
Test procedure definition module comprises the first dispatching management module, cycle tests definition module, test criteria definition module, cycle tests definition module is selected test instruction, selective test instruction comprises telecommand and device directive, again test instruction attribute is edited, comprise the equipment under test instruction for editor's test instruction attribute, the operation that test instruction relates to, the test instruction execution time, test instruction logical order, the test instruction defining and test instruction attribute composition cycle tests are sent to the first dispatching management module by internal bus, test criteria definition module is selected test parameter, and selective test parameter comprises telemetry parameter and device parameter, then carries out test criteria definition according to the test parameter of selecting, and the test criteria defining is sent to the first dispatching management module by internal bus, the first dispatching management module is kept at the cycle tests defining and test criteria in test database by TCP/IP network,
Test execution control module comprises the second dispatching management module, command analysis module, instruction administration module, device driver module, the second dispatching management module is transferred the cycle tests in test database by TCP/IP network, then cycle tests is sent to command analysis module by internal bus, test instruction in command analysis module identification cycle tests, converts test instruction to test instruction code name that instruction administration module can be identified, then test instruction code name and test instruction attribute is sent to instruction administration module by internal bus, instruction administration module is according to the equipment under the test instruction of test instruction attribute definition, the operation that test instruction relates to, convert test instruction code name to device driver module and can control the test instruction code that testing apparatus is carried out, according to the test instruction logical order of test instruction attribute definition, test instruction code is sent to device driver module by internal bus, and start the actual execution time of timing as test instruction from the moment of transmitting test instruction code, when receiving the complete information of test instruction of device driver module loopback, continue to transmit test instruction code to device driver module according to the test instruction logical order of test instruction attribute definition, repeat said process, until cycle tests is finished, when the actual execution time of test instruction exceedes test instruction execution time of test instruction attribute definition, instruction administration module generates test instruction execute exception information and is sent to the second dispatching management module by internal bus, the second dispatching management module is crossed TCP/IP network by test instruction execute exception information exchange and is kept in test database, device driver module control testing apparatus is carried out test instruction code, and transmit the complete information of test instruction to instruction administration module by internal bus, the feedback information of device driver module collecting test equipment simultaneously, the testing apparatus feedback information collecting comprises telemetry and device data, then the testing apparatus feedback information collecting is sent to the second dispatching management module by internal bus, the second dispatching management module is kept at testing apparatus feedback information in test database by TCP/IP network,
Test data analysis module comprises the 3rd dispatching management module, data acquisition module, data interpretation module, result output module, the 3rd dispatching management module is transferred test criteria, the testing apparatus feedback information in test database by TCP/IP network, then is sent to data acquisition module by internal bus, data acquisition module is removed discontinuous, these two kinds of Non-stationary Datas of frame hopping of in telemetry, existing, whether the generation time of analyzing telemetry and device data is reasonable, finally telemetry, device data, test criteria are sent to data interpretation module by internal bus, when the generation time of telemetry and device data exists abnormal, the data acquisition module rise time is analyzed abnormal information and is sent to the 3rd dispatching management module by internal bus, and the 3rd dispatching management module is kept at time series analysis abnormal information in test database by TCP/IP network, data interpretation module judges according to test criteria whether testing apparatus feedback information needs to derive calculating, when judgement need to derive calculating, data interpretation module derives after calculating and again test criteria and derivative result of calculation is compared and drawn sentence read result, when judgement does not need to derive calculating, data interpretation module is compared test criteria and testing apparatus feedback information to draw sentence read result, when sentence read result normal, data interpretation module is sent to result output module by sentence read result by internal bus, when sentence read result exists abnormal, data interpretation module generated data interpretation abnormal information is sent to the 3rd dispatching management module by internal bus, the 3rd dispatching management module is kept at data interpretation abnormal information in test database by TCP/IP network, telemetry, device data, sentence read result are generated test report by result output module, by internal bus, test report is sent to the 3rd dispatching management module, the 3rd dispatching management module is kept at test report in test database by TCP/IP network,
Monitor terminal from test database, takes out cycle tests and test criteria, testing apparatus feedback information, test report, instruction execute exception information, time series analysis abnormal information, data interpretation abnormal information show and monitor.
The present invention's advantage is compared with prior art:
(1) frame system of the present invention's design differs from the feature of other subsystem of satellite for satellite control subsystem test state complex, testing process and method of testing, adopt Distributed architecture, possess stronger automatic test function, stronger data intelligence interpretation function, reduce artificial transmission instruction and the risk of testing apparatus has been set, improved test mass.
(2) frame system of the present invention's design has adopted the principle of design such as software modularity, system integration, information networking and test automation, there is the test procedure of automatically performing, automatic decision test result, automatically generate the functions such as test report, correctness and the security of automatic monitoring satellite control subsystem test, reduce greatly human cost, the promptness and the possibility that have improved test Satellite fault discovery, improved testing efficiency.
(3) frame system of the present invention's design has reusable, customizable feature, can on the basis of frame system, develop the automatization test system that is applicable to different moonlet control subsystems, make whole moonlet control subsystem test environment software platform possess one general, can expansion, portable, architectural framework flexibly, improve software development efficiency and work efficiency, reduced development and maintenance cost.
Brief description of the drawings
Fig. 1 is system construction drawing of the present invention;
Fig. 2 is the workflow diagram of test procedure definition module of the present invention;
Fig. 3 is the workflow diagram of test execution control module of the present invention;
Fig. 4 is the workflow diagram of test data analysis module of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail:
As shown in Figure 1, a kind of distributed satellites automated test frame system of the present invention is divided and can be divided into test procedure definition module, test execution control module, test data analysis module, test database, monitor terminal according to functional module;
Test procedure definition module comprises the first dispatching management module, cycle tests definition module, test criteria definition module.First cycle tests definition module selects test instruction, alternative test instruction comprises telecommand and device directive, again the attribute of test instruction is edited, can comprise the equipment under test instruction, operation, test instruction execution time, the test instruction logical order that test instruction relates to for editor's test instruction attribute, finally the test instruction defining and test instruction attribute composition cycle tests are sent to the first dispatching management module; First test criteria definition module selects test parameter, and alternative test parameter comprises telemetry parameter and device parameter, then carries out test criteria definition according to the test parameter of selecting, and finally the test criteria defining is sent to the first dispatching management module; The first dispatching management module is kept at the cycle tests defining and test criteria in test database;
Test execution control module comprises the second dispatching management module, command analysis module, instruction administration module, device driver module, and the second dispatching management module is transferred the cycle tests in test database, then cycle tests is sent to command analysis module, test instruction in command analysis module identification cycle tests, converts test instruction to test instruction code name that instruction administration module can be identified, then test instruction code name and test instruction attribute is sent to instruction administration module, instruction administration module is according to the equipment under the test instruction of test instruction attribute definition, the operation that test instruction relates to, convert test instruction code name to device driver module and can control the test instruction code that testing apparatus is carried out, according to the test instruction logical order of test instruction attribute definition, test instruction code is sent to device driver module, and start the actual execution time of timing as test instruction from the moment of transmitting test instruction code, when receiving the complete information of test instruction of device driver module loopback, continue to transmit test instruction code to device driver module according to the test instruction logical order of test instruction attribute definition, repeat said process, until cycle tests is finished, when the actual execution time of test instruction exceedes test instruction execution time of test instruction attribute definition, instruction administration module generates test instruction execute exception information and is sent to the second dispatching management module, the second dispatching management module is kept at test instruction execute exception information in test database, device driver module control testing apparatus is carried out test instruction code, and transmit the complete information of test instruction to instruction administration module, the feedback information of device driver module collecting test equipment simultaneously, the testing apparatus feedback information collecting comprises telemetry and device data, then the testing apparatus feedback information collecting is sent to the second dispatching management module, the second dispatching management module is kept at testing apparatus feedback information in test database,
Test data analysis module comprises the 3rd dispatching management module, data acquisition module, data interpretation module, result output module, the 3rd dispatching management module is transferred test criteria, the testing apparatus feedback information in test database, is resent to data acquisition module, data acquisition module is removed discontinuous, these two kinds of Non-stationary Datas of frame hopping of in telemetry, existing, whether the generation time of analyzing telemetry and device data is reasonable, finally telemetry, device data, test criteria are sent to data interpretation module, when the generation time of telemetry and device data exists abnormal, the data acquisition module rise time is analyzed abnormal information and is sent to the 3rd dispatching management module, and the 3rd dispatching management module is kept at time series analysis abnormal information in test database, data interpretation module judges according to test criteria whether testing apparatus feedback information needs to derive calculating, when judgement need to derive calculating, data interpretation module derives after calculating and again test criteria and derivative result of calculation is compared and drawn sentence read result, when judgement does not need to derive calculating, data interpretation module is compared test criteria and testing apparatus feedback information to draw sentence read result, when sentence read result normal, data interpretation module is sent to result output module by sentence read result by internal bus, when sentence read result exists abnormal, data interpretation module generated data interpretation abnormal information is sent to the 3rd dispatching management module by internal bus, the 3rd dispatching management module is kept at data interpretation abnormal information in test database by TCP/IP network, telemetry, device data, sentence read result are generated test report by result output module, and test report is sent to the 3rd dispatching management module, and the 3rd dispatching management module is kept at test report in test database,
Monitor terminal from test database, takes out cycle tests and test criteria, testing apparatus feedback information, test report, instruction execute exception information, time series analysis abnormal information, data interpretation abnormal information show and monitor.
As shown in Figure 2, test procedure definition module is the self-defined unit of automated test frame system, can control the needed cycle tests of subsystem automatic test and test criteria according to specific testing requirement definition, and the cycle tests defining and test criteria are kept in test database, to realize certain concrete test function.Test procedure definition is divided into cycle tests definition, test criteria definition by test procedure definition module, and cycle tests defines according to test instruction, and test criteria defines according to test parameter.The test instruction of definition comprises telecommand and device directive, and wherein device directive refers to and sends to the instruction of controlling subsystem test equipment, telecommand to refer to the instruction of being uploaded, satellite is controlled by star ground observing and controlling link; The test parameter of definition comprises telemetry parameter and device parameter, and wherein device parameter refers to and controls subsystem test equipment by the parameter of star ground wireline interface input and output, and telemetry parameter refers to the satellite real-time telemetry data that pass down by star ground observing and controlling link.Cycle tests refers in measuring executing process by the testing process of the tactic test instruction composition of certain test logic; Test criteria refers to the foundation of carrying out instruction execution correction judgement in measuring executing process before and after test instruction sends according to device data, telemetry.In the time using this frame system, first in cycle tests definition module, select test instruction, then test instruction attribute is edited, test instruction and test instruction attribute composition cycle tests; Select test parameter at test criteria definition module, then carry out test criteria definition according to the test parameter of selecting, cycle tests and test criteria are kept in test database.
As shown in Figure 3, test execution control module is that the test procedure of automated test frame system is carried out control module, and test execution control module comprises the second dispatching management module, command analysis module, instruction administration module, device driver module.The second dispatching management module is transferred the cycle tests in test database, then cycle tests is sent to command analysis module.Test instruction in command analysis module identification cycle tests, converts test instruction to test instruction code name that instruction administration module can be identified, then test instruction code name and test instruction attribute is sent to instruction administration module.Instruction administration module is according to the equipment under the test instruction of test instruction attribute definition, the operation that test instruction relates to, convert test instruction code name to device driver module and can control the test instruction code that testing apparatus is carried out, instruction administration module transmits test instruction code to device driver module according to the test instruction logical order of test instruction attribute definition, and start the actual execution time of timing as test instruction from the moment of transmitting test instruction code, when receiving the complete information of test instruction of device driver module loopback, be judged as the execution of a test instruction, continue to transmit test instruction code to device driver module according to the test instruction logical order of test instruction attribute definition again, repeat said process, until cycle tests is finished.When the actual execution time of test instruction exceedes test instruction execution time of test instruction attribute definition, instruction administration module generates test instruction execute exception information and is sent to the second dispatching management module, and the second dispatching management module is kept at test instruction execute exception information in test database.Device driver module control testing apparatus is carried out test instruction code, and transmit the complete information of test instruction to instruction administration module, the feedback information of device driver module collecting test equipment simultaneously, the testing apparatus feedback information collecting comprises telemetry and device data, again the testing apparatus feedback information collecting is sent to the second dispatching management module, the second dispatching management module is kept at testing apparatus feedback information in test database.
As shown in Figure 4, test data analysis module is the test result analysis unit of automated test frame system, and test data analysis module comprises the 3rd dispatching management module, data acquisition module, data interpretation module, result output module.The 3rd dispatching management module is transferred test criteria, the testing apparatus feedback information in test database, is resent to data acquisition module.Data acquisition module is removed discontinuous, these two kinds of Non-stationary Datas of frame hopping of in telemetry, existing, therefrom selects active data, in addition, due to normally autonomous operation of on-board equipment, and telemetry produces has regular hour characteristic (as produced by the cycle), therefore need the generation time of telemetry and device data to analyze, whether the generation time that judges data is reasonable, finally by telemetry, device data, test criteria is sent to data interpretation module, when the generation time of telemetry and device data exists abnormal, the data acquisition module rise time is analyzed abnormal information and is sent to the 3rd dispatching management module, the 3rd dispatching management module is kept at time series analysis abnormal information in test database.Data interpretation module judges according to test criteria whether testing apparatus feedback information needs to derive calculating, when judgement need to derive calculating, data interpretation module derives after calculating and again test criteria and derivative result of calculation is compared and drawn sentence read result, when judgement does not need to derive calculating, data interpretation module is compared test criteria and testing apparatus feedback information to draw sentence read result, when sentence read result normal, sentence read result is sent to result output module by data interpretation module, when sentence read result exists abnormal, data interpretation module generated data interpretation abnormal information is sent to the 3rd dispatching management module, the 3rd dispatching management module is kept at data interpretation abnormal information in test database.Telemetry, device data, sentence read result are generated test report by result output module, and test report is sent to the 3rd dispatching management module, and the 3rd dispatching management module is kept at test report in test database.Differ from the feature of other subsystem of satellite for satellite control subsystem test state complex, testing process and method of testing, the data interpretation of partial test project need to comprise controls subsystem test equipment by the data of star ground wireline interface input and output and the comparison of satellite telemetering data.For example, when topworks open-loop test, control the output information that subsystem test equipment gathers topworks, be the data that testing apparatus is passed through the wireline interface input of star ground, these data are the actual act information of topworks, in telemetry, the actual act information of the related data of topworks needs and topworks is compared, and can confirm to test correctness.For example reaction wheel test, testing apparatus comprises by the data of star ground wireline interface input: (testing apparatus gathers voltage signal to reaction wheel direction, high level 4~5V represents forward, low level 0~0.8V represents reversion), control voltage, tacho-pulse, the above-mentioned data of each reaction wheel all need to compare with corresponding telemetry.Current test macro does not possess the function of automatic comparison star ground wireline interface inputoutput data and satellite telemetering data, generally in the time there is test problem or test failure, manually search and compare, may leak like this transient state catastrophic failure, have erroneous judgement and do not sentence in time phenomenon, and cost human cost is higher.
For example, in control subsystem gyro constant current source exciting test, first in test procedure definition module, define Article 1 instruction for gyro signal source channels 1 Output speed-2.0 °/s is set, Article 2 instruction is for arranging gyro signal source channels 1 Output speed-1.5 °/s, subsequent instructions is respectively gyro signal source channels 1 Output speed is set is-1.0 °/s,-0.5 °/s,-0.1 °/s,-0.05 °/s,-0.01 °/s,-0.005 °/s, 0 °/s, 0.005 °/s, 0.01 °/s, 0.05 °/s, 0.1 °/s, 0.5 °/s, 1.0 °/s, 1.5 °/s, 2.0 °/s, an instruction sequence of these signalization sourse instruction compositions, test instruction is device directive.In cycle tests definition module, definition test instruction is exported above-mentioned magnitude of angular velocity for control subsystem test equipment (being specially gyro signal source plate card) is set, and each settings require the normal n of maintenance second (n is the sample number of gyro performance test requirement).In addition, the telemetry passing down in real time due to satellite may exist discontinuous, frame hopping, should consider regular hour surplus, is made as m second herein.Test instruction attribute definition is as follows: 1, test instruction corresponding device is for controlling subsystem test equipment (being specially gyro signal source plate card); 2, test instruction is operating as to arrange and controls subsystem test equipment and export above-mentioned magnitude of angular velocity, and each settings keep (n × remote measurement sampling period+m) second; 3, every test instruction execution time is (n × remote measurement sampling period+m) second; 4, test instruction logical order arranges: the command logic order of Output speed-2.0 °/s is 1, represent that first this instruction carry out, the command logic order of Output speed-1.5 °/s is 2, represent that it is to carry out after 1 instruction that this instruction is arranged in command logic order, the logical order of all the other instructions increases successively.In test criteria definition module, definition test parameter is telemetry parameter, telemetry parameter is specially gyro angle step parameter and the sign bit parameter of gyro passage 1, definition test criteria is that telemetry is taking n as sample number computation of mean values and mean square deviation, the mean value error calculating and mean square deviation all should meet the requirement of gyro performance testing index, for example, the two floating gyros that certain is developed, performance testing index requires: calculate average, the mean square deviation of 100 times, average is that variance is less than 0.005 °/s to fixed angular speed ± 0.05 °/s.In this example, n is 100, and mean value error is ± 0.05 °/s, and mean square deviation is for being less than 0.005 °/s.
Test instruction in command analysis module identification cycle tests, convert test instruction to test instruction code name that instruction administration module can be identified, for example, the coded instructions that gyro signal source channels 1 Output speed-2.0 °/s is set is Z001, the coded instructions that gyro signal source channels 1 Output speed-1.5 °/s is set is Z002, then test instruction code name and test instruction attribute are sent to instruction administration module.The operation that instruction administration module relates to according to the equipment under the test instruction of test instruction attribute definition, test instruction, convert test instruction code name to device driver module and can control the test instruction code that testing apparatus is carried out, test instruction code is herein binary code.According to the test instruction logical order of test instruction attribute definition, test instruction code is sent to device driver module, first transmit test instruction logical order and be 1 test instruction, and start the actual execution time of timing as test instruction from the moment of transmitting test instruction code, think that when receiving the complete information of test instruction of device driver module loopback, judging test instruction logical order is that 1 test instruction is finished.Transmit according to the test instruction logical order of test instruction attribute definition the test instruction that test instruction logical order is 2, repeat said process, until cycle tests is finished.In test instruction implementation, device driver module collecting test equipment feedback information.
Data acquisition module is removed discontinuous, these two kinds of Non-stationary Datas of frame hopping, obtains the data of regulation sample number, and test criteria, telemetry, device data are sent to data interpretation module.Data interpretation module is according to the requirement of test criteria, carries out mean value error and mean square deviation is calculated taking 100 as sample number, and this calculating is derivative calculating, draws sentence read result, and sentence read result is sent to result output module.Result output module generates test report, and test report is sent to dispatching management module, and dispatching management module is kept at test report in test database, and test finishes.
The content not being described in detail in instructions of the present invention belongs to those skilled in the art's known technology.

Claims (1)

1. a distributed satellites automated test frame system, is characterized in that: comprise test procedure definition module, test execution control module, test data analysis module, test database, monitor terminal;
Test procedure definition module comprises the first dispatching management module, cycle tests definition module, test criteria definition module, cycle tests definition module is selected test instruction, selective test instruction comprises telecommand and device directive, again test instruction attribute is edited, comprise the equipment under test instruction for editor's test instruction attribute, the operation that test instruction relates to, the test instruction execution time, test instruction logical order, the test instruction defining and test instruction attribute composition cycle tests are sent to the first dispatching management module by internal bus, test criteria definition module is selected test parameter, and selective test parameter comprises telemetry parameter and device parameter, then carries out test criteria definition according to the test parameter of selecting, and the test criteria defining is sent to the first dispatching management module by internal bus, the first dispatching management module is kept at the cycle tests defining and test criteria in test database by TCP/IP network,
Test execution control module comprises the second dispatching management module, command analysis module, instruction administration module, device driver module, the second dispatching management module is transferred the cycle tests in test database by TCP/IP network, then cycle tests is sent to command analysis module by internal bus, test instruction in command analysis module identification cycle tests, converts test instruction to test instruction code name that instruction administration module can be identified, then test instruction code name and test instruction attribute is sent to instruction administration module by internal bus, instruction administration module is according to the equipment under the test instruction of test instruction attribute definition, the operation that test instruction relates to, convert test instruction code name to device driver module and can control the test instruction code that testing apparatus is carried out, according to the test instruction logical order of test instruction attribute definition, test instruction code is sent to device driver module by internal bus, and start the actual execution time of timing as test instruction from the moment of transmitting test instruction code, when receiving the complete information of test instruction of device driver module loopback, continue to transmit test instruction code to device driver module according to the test instruction logical order of test instruction attribute definition, repeat said process, until cycle tests is finished, when the actual execution time of test instruction exceedes test instruction execution time of test instruction attribute definition, instruction administration module generates test instruction execute exception information and is sent to the second dispatching management module by internal bus, the second dispatching management module is crossed TCP/IP network by test instruction execute exception information exchange and is kept in test database, device driver module control testing apparatus is carried out test instruction code, and transmit the complete information of test instruction to instruction administration module by internal bus, the feedback information of device driver module collecting test equipment simultaneously, the testing apparatus feedback information collecting comprises telemetry and device data, then the testing apparatus feedback information collecting is sent to the second dispatching management module by internal bus, the second dispatching management module is kept at testing apparatus feedback information in test database by TCP/IP network,
Test data analysis module comprises the 3rd dispatching management module, data acquisition module, data interpretation module, result output module, the 3rd dispatching management module is transferred test criteria, the testing apparatus feedback information in test database by TCP/IP network, then is sent to data acquisition module by internal bus, data acquisition module is removed discontinuous, these two kinds of Non-stationary Datas of frame hopping of in telemetry, existing, whether the generation time of analyzing telemetry and device data is reasonable, finally telemetry, device data, test criteria are sent to data interpretation module by internal bus, when the generation time of telemetry and device data exists abnormal, the data acquisition module rise time is analyzed abnormal information and is sent to the 3rd dispatching management module by internal bus, and the 3rd dispatching management module is kept at time series analysis abnormal information in test database by TCP/IP network, data interpretation module judges according to test criteria whether testing apparatus feedback information needs to derive calculating, when judgement need to derive calculating, data interpretation module derives after calculating and again test criteria and derivative result of calculation is compared and drawn sentence read result, when judgement does not need to derive calculating, data interpretation module is compared test criteria and testing apparatus feedback information to draw sentence read result, when sentence read result normal, data interpretation module is sent to result output module by sentence read result by internal bus, when sentence read result exists abnormal, data interpretation module generated data interpretation abnormal information is sent to the 3rd dispatching management module by internal bus, the 3rd dispatching management module is kept at data interpretation abnormal information in test database by TCP/IP network, telemetry, device data, sentence read result are generated test report by result output module, by internal bus, test report is sent to the 3rd dispatching management module, the 3rd dispatching management module is kept at test report in test database by TCP/IP network,
Monitor terminal from test database, takes out cycle tests and test criteria, testing apparatus feedback information, test report, instruction execute exception information, time series analysis abnormal information, data interpretation abnormal information show and monitor.
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