CN103955080A - Multi-camera liquid crystal screen defect detection and image collection device - Google Patents
Multi-camera liquid crystal screen defect detection and image collection device Download PDFInfo
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- CN103955080A CN103955080A CN201410176077.4A CN201410176077A CN103955080A CN 103955080 A CN103955080 A CN 103955080A CN 201410176077 A CN201410176077 A CN 201410176077A CN 103955080 A CN103955080 A CN 103955080A
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Abstract
The invention discloses a multi-camera liquid crystal screen defect detection and image collection device, and belongs to the field of liquid crystal defect detection, in particular to detection of a high-resolution liquid crystal screen. According to the device, a plurality of low-pixel cameras are arranged on the same base in an array mode; a conventional method for detecting the defects of a liquid crystal screen by using a single high-pixel camera is replaced; in a detection process, each camera of the device only needs to shoot and detect a small part of the liquid crystal screen, then images shot by all the cameras are spliced to form an image of the whole liquid crystal screen, and the defects of the liquid crystal screen are detected, so that the device has the effects of low cost, high expansibility and application to the detection of the high-resolution liquid crystal screen, and the image can be collected clearly and quickly.
Description
Technical field
The invention belongs to Defects of Liquid detection field, particularly for the detection of high-resolution liquid crystal display defect.
Background technology
Along with the raising of social life level, people grow with each passing day to the demand of electronic product, and this has driven the development of liquid crystal industry greatly.The automated production degree of liquid crystal display, directly restricting the height of its output and production cost, and current liquid crystal display defect inspection method is mainly to rely on manual detection, means are more single, liquid crystal display is observed in display frame by electroprobe by production firm, relies on naked eyes to judge there is zero defect.This mode is effort again consuming time, and because human eye fatigue is once in a while with uncertain, often causes part faulty goods to be missed, and in the time that the loss of a collection of product is too high, client will require to return goods, thereby causes economical and temporal loss to manufacturer.If can realize the robotization of liquid crystal display defects detection, replace traditional manual detection, will greatly enhance productivity, reduce production costs.
Realizing liquid crystal panel defect robotization detection is first the display frame that gathers liquid crystal display, then the image collecting is analyzed, and finds the defective position of picture, and correspondence is found out the defective locations of liquid crystal display.Adopt single image to gather camera to the defects detection of large-sized liquid crystal display at present, camera is had to more than one hundred million pixel requests, have the price of more than one hundred million pixel camera very expensive, this obviously increases liquid crystal display defects detection cost.The image acquisition speed of high pixel camera is slow, delays liquid crystal panel manufacturing schedule, has increased cost.
Summary of the invention
The object of the invention is to improve and designed a kind of liquid crystal display defects detection that adopts multi-cam and adopt map device for the weak point of background technology, thus reach gather clear picture, cost is low, extendability is high, image acquisition is fast, be applicable to the object of high-resolution liquid crystal screen detection.
The solution that the present invention is a kind of adopts the liquid crystal display defects detection of multi-cam to adopt map device is that the low pixel camera head of arranging by multiple employing array way is replaced single high-pixel camera head in background technology, thereby realizes goal of the invention.Thereby the present invention includes: pedestal, be arranged at camera on pedestal, corresponding data line and power lead, it is characterized in that: well-regulatedly on pedestal be provided with multiple cameras.
Described multiple cameras adopt the mode of array to be arranged on pedestal; The all parameters of described each camera are in full accord; Described camera is connected with computer by data line, realizes the automatic focusing of each camera.
The present invention is a kind of to be adopted the liquid crystal display defects detection of multi-cam to adopt map device, by the mode according to array on pedestal, the camera of multiple low pixels is set, thereby image collecting device is had gathers clear picture, cost is low, extendability is high, image acquisition is fast, be applicable to the effect of high-resolution liquid crystal screen detection.
Brief description of the drawings
Fig. 1 is a kind of structural representation that adopts the liquid crystal display defects detection of multi-cam to adopt map device of the present invention.
In figure: 1. detected liquid crystal display, 2. camera, 3. pedestal.
Specific embodiments
Disclosed arbitrary feature in this instructions (comprising any accessory claim, summary and accompanying drawing), unless narration especially, each feature is an example in a series of equivalences or similar characteristics, and this specific embodiments is for the map device of adopting that detects 4 cun of LCDs faultiness designs.
With reference to Fig. 1, a kind of liquid crystal display defects detection that adopts multi-cam of the present invention is adopted map device, and its pedestal 3 is square, is of a size of 9mm*9mm*6mm, according to 4 × 4 array way, 16 cameras 2 is set, and the distance between adjacent two cameras is 0.Each camera parameter is in full accord, and parameter is: camera lens pixel is 5,000,000, resolution 292*1944, and focal length 3.8mm, each camera is all connected with computer, realizes the automatic focusing of each camera.
Detected liquid crystal display shows that 1 background frame is black, white, red, green, blue.Detected liquid crystal display is vertical with camera printing opacity camera lens.
The present invention adopts the liquid crystal display defects detection of array camera to adopt map device, need to meet certain condition to choosing of camera, and the physics field range 44 that camera is taken, need to be greater than the size 22 of camera own.
The pixel of the picture length and width direction that general camera is taken is than being 4:3.If the number of pixels of the picture length direction that therefore camera is taken is 4a, the number of pixels of cross direction is 3a, thus the pixel size of known camera:
Q＝4a×3a＝12a
2
The enlargement factor of the liquid crystal display pixel that hypothesis is taken is again n*n, and on each liquid crystal display, pixel size is d, and itself is of a size of L camera;
If the camera of array is wanted to photograph all pixels in liquid crystal display, need to meet following relational expression:
Should meet following relation for the pixel size of the camera of array:
In sum, liquid crystal display defects detection based on array camera is adopted map device, by more than one hundred million pixels of needs are distributed to multiple cameras, thereby reduce the required pixel request of the single figure of adopting equipment, greatly reduce costs, and for the LCD screen that detects various different sizes, only need the required camera number of corresponding increase and decrease, application flexibility is high, applied widely.
Claims (4)
1. adopting the liquid crystal display defects detection of multi-cam to adopt map device comprises: pedestal, be arranged at the camera on pedestal, corresponding data line and a power lead, it is characterized in that well-regulatedly on pedestal being provided with multiple cameras.
2. a kind of liquid crystal display defects detection that adopts multi-cam as claimed in claim 1 is adopted map device, it is characterized in that: multiple cameras adopt the mode of array to be arranged on pedestal.
3. a kind of liquid crystal display defects detection that adopts multi-cam as claimed in claim 1 is adopted map device, it is characterized in that: all parameters of each camera are in full accord.
4. a kind of liquid crystal display defects detection that adopts multi-cam as claimed in claim 1 is adopted map device, it is characterized in that: each camera is connected with computer by data line, realizes the automatic focusing of each camera.
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| CN201410176077.4A CN103955080A (en) | 2014-04-29 | 2014-04-29 | Multi-camera liquid crystal screen defect detection and image collection device |
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| CN201410176077.4A CN103955080A (en) | 2014-04-29 | 2014-04-29 | Multi-camera liquid crystal screen defect detection and image collection device |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105511122A (en) * | 2015-11-25 | 2016-04-20 | 武汉精测电子技术股份有限公司 | Automatic positioning focusing detection apparatus based on online machine visual inspection |
| CN105828036A (en) * | 2016-03-28 | 2016-08-03 | 电子科技大学 | One-way street arrangement multi-camera liquid crystal screen graph-capture device for flow line |
| CN107290909A (en) * | 2017-06-30 | 2017-10-24 | 深圳市华星光电技术有限公司 | Array base palte and liquid crystal display panel |
| CN107318013A (en) * | 2016-04-27 | 2017-11-03 | e解决方案有限公司 | Technology for checking display unit |
| CN107765463A (en) * | 2017-10-13 | 2018-03-06 | 上海友衷科技有限公司 | A kind of detection method of instrument board liquid crystal display |
| CN109459872A (en) * | 2018-10-19 | 2019-03-12 | 武汉精测电子集团股份有限公司 | A kind of mould group detection method and device using FPGA and multiple PCIe video cards |
| CN111553897A (en) * | 2020-04-27 | 2020-08-18 | 上海果纳半导体技术有限公司 | Wafer defect detection equipment |
| CN111554591A (en) * | 2020-04-27 | 2020-08-18 | 上海果纳半导体技术有限公司 | Semiconductor chip processing apparatus |
| CN111641812A (en) * | 2020-05-29 | 2020-09-08 | 西安应用光学研究所 | Multi-camera array arrangement method suitable for airborne wide-area reconnaissance and monitoring |
| CN111916366A (en) * | 2020-07-29 | 2020-11-10 | 上海果纳半导体技术有限公司 | Wafer detection equipment |
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| WO2006093381A1 (en) * | 2005-03-02 | 2006-09-08 | Semi Sysco Co., Ltd. | Apparatus and method for inspecting edge defect and discoloration of glass substrate |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105511122A (en) * | 2015-11-25 | 2016-04-20 | 武汉精测电子技术股份有限公司 | Automatic positioning focusing detection apparatus based on online machine visual inspection |
| CN105511122B (en) * | 2015-11-25 | 2019-06-07 | 武汉精测电子集团股份有限公司 | A kind of automatic positioning focusing detection device based on online Machine Vision Detection |
| CN105828036A (en) * | 2016-03-28 | 2016-08-03 | 电子科技大学 | One-way street arrangement multi-camera liquid crystal screen graph-capture device for flow line |
| CN107318013A (en) * | 2016-04-27 | 2017-11-03 | e解决方案有限公司 | Technology for checking display unit |
| CN107290909A (en) * | 2017-06-30 | 2017-10-24 | 深圳市华星光电技术有限公司 | Array base palte and liquid crystal display panel |
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| CN111553897A (en) * | 2020-04-27 | 2020-08-18 | 上海果纳半导体技术有限公司 | Wafer defect detection equipment |
| CN111554591A (en) * | 2020-04-27 | 2020-08-18 | 上海果纳半导体技术有限公司 | Semiconductor chip processing apparatus |
| CN111554591B (en) * | 2020-04-27 | 2024-03-12 | 上海果纳半导体技术有限公司 | Semiconductor chip processing apparatus |
| CN111553897B (en) * | 2020-04-27 | 2024-03-12 | 上海果纳半导体技术有限公司 | Wafer defect detection equipment |
| CN111641812A (en) * | 2020-05-29 | 2020-09-08 | 西安应用光学研究所 | Multi-camera array arrangement method suitable for airborne wide-area reconnaissance and monitoring |
| CN111641812B (en) * | 2020-05-29 | 2021-09-10 | 西安应用光学研究所 | Multi-camera array arrangement method suitable for airborne wide-area reconnaissance and monitoring |
| CN111916366A (en) * | 2020-07-29 | 2020-11-10 | 上海果纳半导体技术有限公司 | Wafer detection equipment |
| CN111916366B (en) * | 2020-07-29 | 2024-04-12 | 上海果纳半导体技术有限公司 | Wafer inspection apparatus |
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