CN103808973A - Micro-spring - Google Patents
Micro-spring Download PDFInfo
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- CN103808973A CN103808973A CN201310743023.7A CN201310743023A CN103808973A CN 103808973 A CN103808973 A CN 103808973A CN 201310743023 A CN201310743023 A CN 201310743023A CN 103808973 A CN103808973 A CN 103808973A
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- spring
- dials
- microspring
- hole
- termination
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Abstract
The invention provides a micro-spring which comprises a needle dial, a wire coil, a spring disk, a plurality of conductor wires and a test interface. The wire coil is positioned below the needle dial, the spring disk is arranged between the needle dial and the wire coil, a plurality of latticed spaced test needles are inserted into the needle dial, the spring disk is provided with a plurality of through holes respectively corresponding to the test needles, one micro-spring is inserted into each through hole, each through hole comprises a main through hole with a large diameter and a lower end through hole with a small diameter, each lower end through hole serves as a lower length of the corresponding through hole, each micro-spring comprises a spring body and a spring thin portion, each spring body with a large diameter is matched with the corresponding main through hole, each spring thin portion with a small diameter is matched with the corresponding lower end through hole, exposed ends of the spring bodies are correspondingly connected with the other ends of the test needles, one end of each conductor wire is connected with the test interface, and the other end of each conductor wire penetrates the wire coil and is abutted to the end of the spring thin portion of the corresponding micro-spring. The micro-spring is simple and ingenious in structure and better in stability.
Description
Technical field
The present invention relates to a kind of Microspring for test fixture for printed circuit board.
Background technology
Electronic component on printed circuit board (PCB) should be with suitable circuit serial or parallel connection, to reach a certain specific effect.As be short-circuited or open circuit, circuit board cannot use.Therefore, must be through test before circuit board dispatches from the factory, circuit complexity and number of electronic components on circuit board are too many, need again to rely on measurement jig in the test process of electronic component, coordinate Test Host to complete the test job of electronic component.
At present, the method for the testing circuit board adopting in industry, is to connect circuit test machine by a kind of combined tester to realize.Described tool surface arranges some probes, described some probes coordinate each pin position of printed circuit board (PCB) to be measured bottom surface and arrange, each probe base provides the elasticity recovery pressing down after test power by spring, and each spring bottom connects conducting to the corresponding jack of winding displacement of circuit test machine by conductor wire.When wanting when testing circuit board, circuit board under test correspondence to be positioned on the probe of tool, after being contacted with the pin on circuit board under test ground by probe, circuit test machine can show that the circuit on circuit board under test has or not and open circuit.
Concrete, described some probes are interspersed on dials, and described dials forms by one or more insulcrete is stacked; Described spring is interspersed in drum, described drum is made up of one or more insulcrete, on drum, have and hole corresponding to described some probes, in hole, place spring, one end of spring contacts conducting with described probe, the other end welding of a conductor wire and this spring, in order to guarantee to make soft wire and spring contact good, in the general hole that the end of this conductor wire is stretched to spring, be welded and fixed, with all wires that all described springs are connected, its other end is connected to respectively the test interface of test machine.
The defect of above technical scheme is: along with printed circuit board test point is more and more closeer, solder joint is more and more less, existing tool is because spring corresponding to each testing needle must have certain diameter (more than 0.5mm), just can make the termination of conductor wire stretch into spring, and spring must have certain diameter, could in technique, realize the termination of conductor wire is welded and fixed with it, so, cannot meet the demand that high-density printed circuit board is tested.
Summary of the invention
In order to solve the problem of mentioning in background technology, the invention provides a kind of Microspring tool of high-density test of the novel printed circuit board (PCB) realized.
The object of the invention is to be achieved through the following technical solutions:
A kind of Microspring, it is for the measurement jig of printed circuit board (PCB), and described tool comprises:
Dials, drum below dials, be arranged at the spring holder between described dials and drum, and many conductor wires and test interface;
On described dials, be interspersed with many and be latticed spaced testing needle, one end of described many testing needles is used for the corresponding connection of each pin with printed circuit board (PCB) to be measured;
Described spring holder is provided with the multiple through holes corresponding with described many testing needles difference;
It is characterized in that:
An interspersed described Microspring in through hole described in each, each through hole includes main body through hole that diameter is larger and the less lower end through hole of diameter as bottom one segment length of described through hole, and each Microspring forms by the larger spring main body of the diameter mating with described main body through hole and the less thin portion of spring of diameter of mating with described lower end through hole; The connection corresponding to the other end of described many testing needles of the exposed termination of described spring main body;
One end of described many conductor wires connects described test interface, and the other end penetrates the termination butt of the thin portion of spring of described drum and described multiple Microsprings.
The exposed termination of described spring main body is set to broadening formation, and one end of the testing needle of connecting with described termination stretches in described hydraucone and with this hydraucone and contacts.
The exposed termination of described spring main body is solid.
The described dials of described tool comprise interval arrange and by the fixing dials insulation course of bindiny mechanism and dials base plate.
The described conductor wire of described tool is enameled wire, and the conductive junction point of the termination butt of the thin portion of spring of itself and described multiple Microsprings is exposed, and this conductive junction point surface is coated with gold layer or nickel dam.
Described many testing needles of described tool are exposed and all do not scribble insulation course with the surface of the part of the corresponding contact of spring main body of described multiple Microsprings.
The described conductor wire of described tool inserts the part of drum and fixes by the conductor wire jack in glue and drum.
The described dials of described tool comprises dials insulation course and dials base plate, described dials insulation course forms by one or more insulcrete is stacked, between described dials insulation course and dials base plate, be provided with a guide layer, between this guide layer and this dials insulation course and this dials base plate, all have spacing, described many testing needles also penetrate this guide layer.
Compared with prior art, the present invention possesses following advantage:
To sum up, the present invention's Microspring tool, the hole that spring holder is opened has adopted that top is thick, the thinner structure in bottom, and Microspring takes that top is thick, the thinner structure in bottom equally, and so design, can make described Microspring can in described spring holder, not drop; Make the termination of conductor wire can directly contact the termination of Microspring, and do not need to be welded and fixed, thereby make Microspring can accomplish very carefully, can arrange very closely, thereby make Microspring tool can test more highdensity printed circuit board (PCB), solved the problem that perplexs for a long time the industry.
Accompanying drawing explanation
Below in conjunction with accompanying drawing and specific embodiment, the invention will be further described:
Fig. 1 is the one-piece construction cut-open view of the embodiment of the present invention;
Fig. 2 is the structure for amplifying schematic diagram of Microspring.
Embodiment
The present embodiment provides a kind of Microspring, and it is for test fixture for printed circuit board.
As shown in Figure 1, described Microspring tool comprises dials 1, drum 2 below dials, is arranged at the spring holder 3 between described dials and drum, and many conductor wires 4 and test interface.
Concrete, dials insulation course 11, guide layer 12 and dials base plate 13 that described dials 1 comprises sequence interval setting from top to bottom and is connected and fixed by being arranged at four joint pins 9 of surrounding.Described dials insulation course 11 comprises dials face 111 and the dials insulcrete 112 of stacked setting.
On described dials 1, be interspersed with many and be latticed spaced many testing needles 7 of interspersed this dials insulation course 11, guide layer 12 and dials base plate 13 successively.One end of described many testing needles 7 is used for the corresponding connection of each pin with printed circuit board (PCB) to be measured.
Height frame can be set, for coordinating the length of probe 7 between described dials insulation course 11, guide layer 12 and dials base plate 13.
Described spring holder 3 is provided with the multiple through holes 31 corresponding with the position difference of described many testing needles 7,31 interspersed Microsprings 32 in each through hole.As shown in Figure 2, each through hole 31 includes main body through hole 311 that diameter is larger and the less lower end through hole 312 of diameter as bottom one segment length of described through hole 31.In other words, described main body through hole 311 and lower end through hole 312 are cylindricality, and the radial dimension of main body through hole 311 is greater than the radial dimension of lower end through hole 312.Preferably, the length of main body through hole 311 is greater than the length of lower end through hole 312.
Accordingly, each Microspring 32 forms by the larger column spring main body 321 of the diameter mating with described main body through hole 311 and the less thin portion 322 of spring of diameter of mating with described lower end through hole 312; The exposed termination of described spring main body 321 and the corresponding connection one by one of the other end of described many testing needles 7.Concrete, the exposed termination of the spring main body 321 of described Microspring 32 is set to broadening formation, and one end of the testing needle 7 of connecting with described termination stretches in described hydraucone and with this hydraucone and contacts.
One end of described many conductor wires 4 connects described test interface, and the other end penetrates the termination butt of the thin portion 322 of spring of described drum 2 and described multiple Microsprings.Because the radial dimension of the thin portion 322 of described spring is very little, therefore, the termination of described conductor wire 4 can not stretch in the turn of the thin portion 322 of spring, nor need welding, just can with the end butt of the thin portion 322 of spring.
Described conductor wire 4 is enameled wire, and the conductive junction point of the termination butt of the thin portion 322 of spring of itself and described multiple Microspring 32 is exposed, and in order to strengthen electric conductivity, this conductive junction point surface is coated with gold layer or nickel dam.
For fear of electric leakage, described many testing needles 7 are exposed and all do not scribble insulation course with the surface of the part of the corresponding contact of spring main body 321 of described multiple Microsprings 32.
Described conductor wire 4 inserts the part of drum 2 and fixes by the conductor wire jack in glue and drum.
Solid construction can also be made in the exposed termination of the spring main body 321 of described Microspring 32, be filled to solid by the inside of an outermost coil spring, so that testing needle 7 is in contact with it, and be unlikely to make testing needle 7 to stretch in turn, cause connect unreliable.
Four jiaos of ends of described dials 1, drum 2, spring holder 3 all can arrange the guide hole that upper and lower correspondence communicates, and guide pillar is set in guide hole, thereby locate better this three.
The tool of the Microspring of employing the present embodiment in use, printed circuit board (PCB) to be tested 8 is positioned over to the corresponding position, top of dials 1, test machine by printed circuit board (PCB) 8 to pressing down, the upper end of testing needle 7 and the tested part of printed circuit board (PCB) 8 are contacted, corresponding two testing needles 7 of each electric contact of printed circuit board (PCB) 8, the corresponding contact in exposed termination of the lower end of testing needle 7 and the spring main body 321 of Microspring 32, and compress described Microspring 32 and make it slight curving to guarantee that testing needle 7 is good with lower end in contact of described testing needle 7, the termination and the corresponding contact of described conductor wire 4 conducting of the thin portion 322 of spring of described Microspring 32 simultaneously, now, passing the other end of the conductor wire 11 of drum 2 connects through special machine test interface and testing tool, can test printed circuit board (PCB) 8.
Described Microspring 32 can be considered as three sections.Epimere is the upper end of spring body 321, the termination contacting with described testing needle 7, it can be hydraucone as above, but bell-mouthed diameter minimum can be accomplished 0.3mm, in the time that the radial dimension of actual needs Microspring 32 is less than 0.3mm, in technique, just can not do hydraucone, so in the time that the diameter of spring main body 321 is less than 0.3mm, described termination is designed to straight mouthful, and no matter be hydraucone or straight mouth, all can also be designed to solid construction, tamp by described cross cut end (of a beam), centre does not have space, becomes a concave surface or plane.Stage casing is the lower middle portion of spring main body 321, is the elastic anchor of Microspring 32, and this part can make the pin of testing needle 7 good contact printed circuit board (PCB) to be measured in test process.Hypomere is the above-mentioned thin portion 322 of spring, and this section diameter dwindles, and can make described Microspring 32 can in described spring holder 3, not drop.
Claims (9)
1. a Microspring, it is for the measurement jig of printed circuit board (PCB), and described tool comprises:
Dials, drum below dials, be arranged at the spring holder between described dials and drum, and many conductor wires and test interface;
On described dials, be interspersed with many and be latticed spaced testing needle, one end of described many testing needles is used for the corresponding connection of each pin with printed circuit board (PCB) to be measured;
Described spring holder is provided with the multiple through holes corresponding with described many testing needles difference;
It is characterized in that:
An interspersed described Microspring in through hole described in each, each through hole is connected to form by the larger main body through hole of diameter and the less lower through-hole two parts of diameter, and each Microspring forms by the larger spring main body of the diameter mating with described main body through hole and the less thin portion of spring of the diameter that mates with described lower end through hole; The connection corresponding to the other end of described many testing needles of the exposed termination of described spring main body;
One end of described many conductor wires connects described test interface, and the other end penetrates the termination butt of the thin portion of spring of described drum and described multiple Microsprings.
2. Microspring according to claim 1, is characterized in that: the exposed termination of described spring main body is set to broadening formation, and one end of the testing needle of connecting with described termination stretches in described hydraucone and with this hydraucone and contacts.
3. Microspring according to claim 1, is characterized in that: the exposed termination of the spring main body of described Microspring is set to straight mouthful, and one end of the testing needle being communicated with described termination stretches in described straight mouthful and with this straight mouthful and contacts.
4. Microspring according to claim 1, is characterized in that: the exposed termination of the spring main body of described Microspring is solid, and one end of the testing needle being communicated with described termination directly contacts with described solid termination.
5. according to the arbitrary described Microspring of claim 1 to 4, it is characterized in that: the described dials of described tool comprises that interval arranges and by the fixing dials insulation course of bindiny mechanism and dials base plate.
6. according to the arbitrary described Microspring of claim 1 to 4, it is characterized in that: the described conductor wire of described tool is enameled wire, the conductive junction point of the termination butt of the thin portion of spring of itself and described multiple Microsprings is exposed, and this conductive junction point surface is coated with gold layer or nickel dam.
7. according to the arbitrary described Microspring of claim 1 to 4, it is characterized in that: described many testing needles of described tool are exposed and all do not scribble insulation course with the surface of the part of the corresponding contact of spring main body of described multiple Microsprings.
8. according to the arbitrary described Microspring of claim 1 to 4, it is characterized in that: the described conductor wire of described tool inserts the part of drum and fixes by the conductor wire jack in glue and drum.
9. according to the arbitrary described Microspring of claim 1 to 4, it is characterized in that: the described dials of described tool comprises dials insulation course and dials base plate, described dials insulation course forms by one or more insulcrete is stacked, between described dials insulation course and dials base plate, be provided with a guide layer, between this guide layer and this dials insulation course and this dials base plate, all have spacing, described many testing needles also penetrate this guide layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310743023.7A CN103808973A (en) | 2013-12-30 | 2013-12-30 | Micro-spring |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310743023.7A CN103808973A (en) | 2013-12-30 | 2013-12-30 | Micro-spring |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103808973A true CN103808973A (en) | 2014-05-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310743023.7A Pending CN103808973A (en) | 2013-12-30 | 2013-12-30 | Micro-spring |
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| CN (1) | CN103808973A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040147140A1 (en) * | 2003-01-24 | 2004-07-29 | Zhineng Fan | Low inductance electrical contacts and lga connector system |
| CN1529181A (en) * | 2003-09-30 | 2004-09-15 | 王云阶 | Composite tool for electronic and testing industry |
| CN101849188A (en) * | 2007-10-02 | 2010-09-29 | Dtg国际有限公司 | Be used to test the full network type card casket of the parallel tester of no job-work circuit board, be used for the spring contact pin of this full network type card casket, and the adapter that is used to test the parallel tester of no job-work circuit board |
| CN102224641A (en) * | 2008-12-26 | 2011-10-19 | 山一电机株式会社 | Electrically connecting device for semiconductor device and contact used in the electrically connecting device |
| CN203858259U (en) * | 2013-12-30 | 2014-10-01 | 珠海拓优电子有限公司 | Micro-spring fixture |
-
2013
- 2013-12-30 CN CN201310743023.7A patent/CN103808973A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040147140A1 (en) * | 2003-01-24 | 2004-07-29 | Zhineng Fan | Low inductance electrical contacts and lga connector system |
| CN1529181A (en) * | 2003-09-30 | 2004-09-15 | 王云阶 | Composite tool for electronic and testing industry |
| CN101849188A (en) * | 2007-10-02 | 2010-09-29 | Dtg国际有限公司 | Be used to test the full network type card casket of the parallel tester of no job-work circuit board, be used for the spring contact pin of this full network type card casket, and the adapter that is used to test the parallel tester of no job-work circuit board |
| CN102224641A (en) * | 2008-12-26 | 2011-10-19 | 山一电机株式会社 | Electrically connecting device for semiconductor device and contact used in the electrically connecting device |
| CN203858259U (en) * | 2013-12-30 | 2014-10-01 | 珠海拓优电子有限公司 | Micro-spring fixture |
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Application publication date: 20140521 |
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| WD01 | Invention patent application deemed withdrawn after publication |