CN103765244B - 光子计数探测器 - Google Patents

光子计数探测器 Download PDF

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Publication number
CN103765244B
CN103765244B CN201280042035.0A CN201280042035A CN103765244B CN 103765244 B CN103765244 B CN 103765244B CN 201280042035 A CN201280042035 A CN 201280042035A CN 103765244 B CN103765244 B CN 103765244B
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China
Prior art keywords
voltage
gate electrode
photon
cathode layer
pixel
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Expired - Fee Related
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CN201280042035.0A
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English (en)
Chinese (zh)
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CN103765244A (zh
Inventor
E·勒斯尔
R·普罗克绍
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CN201280042035.0A 2011-08-30 2012-08-16 光子计数探测器 Expired - Fee Related CN103765244B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161528785P 2011-08-30 2011-08-30
US61/528,785 2011-08-30
PCT/IB2012/054170 WO2013030708A2 (en) 2011-08-30 2012-08-16 Photon counting detector

Publications (2)

Publication Number Publication Date
CN103765244A CN103765244A (zh) 2014-04-30
CN103765244B true CN103765244B (zh) 2016-06-29

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Family Applications (1)

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CN201280042035.0A Expired - Fee Related CN103765244B (zh) 2011-08-30 2012-08-16 光子计数探测器

Country Status (8)

Country Link
US (1) US9423515B2 (enExample)
EP (1) EP2751596B1 (enExample)
JP (1) JP6335120B2 (enExample)
CN (1) CN103765244B (enExample)
BR (1) BR112014004344A2 (enExample)
IN (1) IN2014CN01055A (enExample)
RU (1) RU2594606C2 (enExample)
WO (1) WO2013030708A2 (enExample)

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WO2014196479A1 (ja) * 2013-06-06 2014-12-11 株式会社 東芝 フォトンカウンティング装置
WO2014203783A1 (ja) * 2013-06-20 2014-12-24 株式会社東芝 Ｘ線ｃｔ装置及び医用画像診断装置
EP2871496B1 (en) 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
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US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
EP3161522B1 (en) * 2014-12-05 2018-02-28 Koninklijke Philips N.V. X-ray detector device for inclined angle x-ray radiation
KR101725099B1 (ko) * 2014-12-05 2017-04-26 삼성전자주식회사 컴퓨터 단층 촬영장치 및 그 제어방법
WO2016091981A1 (en) * 2014-12-11 2016-06-16 Koninklijke Philips N.V. X-ray detector, imaging apparatus and calibration method
RU2705717C2 (ru) * 2014-12-17 2019-11-11 Конинклейке Филипс Н.В. Детектор и способ для обнаружения ионизирующего излучения
CN104568175B (zh) * 2014-12-29 2018-03-09 成都麟鑫泰来科技有限公司 单光子阵列探测成像装置
US20160206255A1 (en) * 2015-01-16 2016-07-21 Kabushiki Kaisha Toshiba Hybrid passive/active multi-layer energy discriminating photon-counting detector
CN107809953B (zh) * 2015-06-30 2021-04-27 皇家飞利浦有限公司 具有降低的积聚的x射线设备
CN107850682B (zh) * 2015-07-13 2021-07-27 皇家飞利浦有限公司 高能量分辨率/高x射线通量光子计数探测器
US10646176B2 (en) * 2015-09-30 2020-05-12 General Electric Company Layered radiation detector
US10396109B2 (en) * 2016-04-11 2019-08-27 Redlen Technologies, Inc. Local storage device in high flux semiconductor radiation detectors and methods of operating thereof
US10067240B1 (en) * 2017-03-06 2018-09-04 Prismatic Sensors Ab X-ray detector system based on photon counting
EP3444826A1 (en) * 2017-08-14 2019-02-20 Koninklijke Philips N.V. Low profile anti scatter and anti charge sharing grid for photon counting computed tomography
US20190154852A1 (en) * 2017-11-16 2019-05-23 NueVue Solutions, Inc. Analog Direct Digital X-Ray Photon Counting Detector For Resolving Photon Energy In Spectral X-Ray CT
US11169286B2 (en) 2018-06-18 2021-11-09 Redlen Technologies, Inc. Methods of calibrating semiconductor radiation detectors using K-edge filters
WO2020052987A1 (en) * 2018-09-10 2020-03-19 Koninklijke Philips N.V. Dual-sensor subpixel radiation detector
US10928527B2 (en) 2018-11-09 2021-02-23 Redlen Technologies, Inc. Charge sharing correction methods for pixelated radiation detector arrays
DE102020216576B3 (de) * 2020-12-28 2021-12-30 Siemens Healthcare Gmbh Röntgendetektoreinheit mit einer anpassbaren Spannungsversorgung und Verfahren zum Betrieb einer Röntgendetektoreinheit

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US20050184320A1 (en) * 2004-02-20 2005-08-25 Green Michael C. Photoconductor having an embedded contact electrode
CN1891158A (zh) * 2005-06-29 2007-01-10 通用电气公司 多层直接转换计算机断层摄影检测模块
US20070290142A1 (en) * 2006-06-16 2007-12-20 General Electeric Company X-ray detectors with adjustable active area electrode assembly
US20090184251A1 (en) * 2008-01-22 2009-07-23 Karim Karim S Method and apparatus for a radiation detector
US20090224167A1 (en) * 2005-07-06 2009-09-10 Ge Healthcare Israel Method and apparatus of detecting ionizing radiation
US20110155918A1 (en) * 2009-12-30 2011-06-30 Jean-Paul Bouhnik Systems and methods for providing a shared charge in pixelated image detectors

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US6344650B1 (en) * 1999-04-23 2002-02-05 Sandia Corporation Electron gas grid semiconductor radiation detectors
EP1351309A2 (en) * 2002-04-02 2003-10-08 Hitachi, Ltd. Radiation detector and radiation apparatus
CN1579328A (zh) * 2003-08-01 2005-02-16 Ge医药系统环球科技公司 用于直接光－电子转换探测器阵列的保护环
US20050184320A1 (en) * 2004-02-20 2005-08-25 Green Michael C. Photoconductor having an embedded contact electrode
CN1891158A (zh) * 2005-06-29 2007-01-10 通用电气公司 多层直接转换计算机断层摄影检测模块
US20090224167A1 (en) * 2005-07-06 2009-09-10 Ge Healthcare Israel Method and apparatus of detecting ionizing radiation
US20070290142A1 (en) * 2006-06-16 2007-12-20 General Electeric Company X-ray detectors with adjustable active area electrode assembly
US20090184251A1 (en) * 2008-01-22 2009-07-23 Karim Karim S Method and apparatus for a radiation detector
US20110155918A1 (en) * 2009-12-30 2011-06-30 Jean-Paul Bouhnik Systems and methods for providing a shared charge in pixelated image detectors

Also Published As

Publication number Publication date
EP2751596B1 (en) 2017-07-19
JP6335120B2 (ja) 2018-05-30
EP2751596A2 (en) 2014-07-09
BR112014004344A2 (pt) 2017-05-30
IN2014CN01055A (enExample) 2015-04-10
JP2014531574A (ja) 2014-11-27
RU2014112028A (ru) 2015-10-10
WO2013030708A3 (en) 2013-06-27
US9423515B2 (en) 2016-08-23
RU2594606C2 (ru) 2016-08-20
CN103765244A (zh) 2014-04-30
WO2013030708A2 (en) 2013-03-07
US20140183371A1 (en) 2014-07-03

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Granted publication date: 20160629