CN103733609B - 用于数字硅光电倍增器阵列的位置敏感的读出模式 - Google Patents
用于数字硅光电倍增器阵列的位置敏感的读出模式 Download PDFInfo
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- CN103733609B CN103733609B CN201280038184.XA CN201280038184A CN103733609B CN 103733609 B CN103733609 B CN 103733609B CN 201280038184 A CN201280038184 A CN 201280038184A CN 103733609 B CN103733609 B CN 103733609B
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Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/248—Silicon photomultipliers [SiPM], e.g. an avalanche photodiode [APD] array on a common Si substrate
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/249—Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/703—SSIS architectures incorporating pixels for producing signals other than image signals
- H04N25/707—Pixels for event detection
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- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Measurement Of Radiation (AREA)
- Nuclear Medicine (AREA)
- Light Receiving Elements (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161514504P | 2011-08-03 | 2011-08-03 | |
| US61/514,504 | 2011-08-03 | ||
| PCT/IB2012/053837 WO2013018006A1 (en) | 2011-08-03 | 2012-07-27 | Position-sensitive readout modes for digital silicon photomultiplier arrays |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103733609A CN103733609A (zh) | 2014-04-16 |
| CN103733609B true CN103733609B (zh) | 2017-07-11 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280038184.XA Active CN103733609B (zh) | 2011-08-03 | 2012-07-27 | 用于数字硅光电倍增器阵列的位置敏感的读出模式 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9176241B2 (enExample) |
| EP (1) | EP2740262B1 (enExample) |
| JP (1) | JP6059722B2 (enExample) |
| CN (1) | CN103733609B (enExample) |
| MX (1) | MX2014001272A (enExample) |
| RU (1) | RU2014107914A (enExample) |
| WO (1) | WO2013018006A1 (enExample) |
Families Citing this family (84)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB201219781D0 (en) * | 2012-11-02 | 2012-12-19 | St Microelectronics Res & Dev | Improvements in time of flight pixel circuits |
| WO2014201286A1 (en) | 2013-06-12 | 2014-12-18 | Popovic Milos A | Optical modulator from standard fabrication processing |
| WO2015173530A2 (fr) * | 2014-05-16 | 2015-11-19 | Alain Iltis | Procédé pour améliorer la résolution en énergie de détecteurs de rayons gamma a scintillation; système, composant et application associes |
| US10204944B2 (en) * | 2014-06-09 | 2019-02-12 | Kiskeya Microsystems Llc | Readout architecture for event-driven pixels |
| US9568620B2 (en) | 2014-09-22 | 2017-02-14 | General Electric Company | Solid state photomultiplier |
| CN105816194B (zh) | 2015-01-07 | 2018-12-04 | 苏州瑞派宁科技有限公司 | 一种探测器信号读出的通道复用方法 |
| WO2016146644A1 (en) * | 2015-03-17 | 2016-09-22 | Koninklijke Philips N.V. | Scintillation event localization in a radiation particle detector |
| US9606245B1 (en) | 2015-03-24 | 2017-03-28 | The Research Foundation For The State University Of New York | Autonomous gamma, X-ray, and particle detector |
| JP6528042B2 (ja) * | 2015-06-19 | 2019-06-12 | 国立研究開発法人産業技術総合研究所 | 光子検出装置及び光子検出方法 |
| CN105182396B (zh) * | 2015-06-29 | 2018-04-24 | 苏州瑞派宁科技有限公司 | 一种探测器信号读出的通道复用方法 |
| US11105974B2 (en) | 2015-06-30 | 2021-08-31 | Massachusetts Institute Of Technology | Waveguide-coupled silicon-germanium photodetectors and fabrication methods for same |
| WO2017058319A2 (en) | 2015-06-30 | 2017-04-06 | Massachusetts Institute Of Technology | Waveguide-coupled silicon-germanium photodetectors and fabrication methods for same |
| JP6789251B2 (ja) * | 2015-07-08 | 2020-11-25 | ザ コモンウェルス オブ オーストラリアＴｈｅ Ｃｏｍｍｏｎｗｅａｌｔｈ Ｏｆ Ａｕｓｔｒａｌｉａ | Ｓｐａｄアレイ構造及び動作方法 |
| US11131756B2 (en) | 2015-09-29 | 2021-09-28 | Qualcomm Incorporated | LIDAR system with reflected signal strength measurement |
| US10371835B2 (en) | 2016-01-11 | 2019-08-06 | General Electric Company | Microcell interconnection in silicon photomultipliers |
| JP6818875B2 (ja) | 2016-09-23 | 2021-01-20 | アップル インコーポレイテッドＡｐｐｌｅ Ｉｎｃ． | 積層背面照射型ｓｐａｄアレイ |
| US10502830B2 (en) | 2016-10-13 | 2019-12-10 | Waymo Llc | Limitation of noise on light detectors using an aperture |
| CN106580359B (zh) * | 2016-12-02 | 2020-04-14 | 中国科学院深圳先进技术研究院 | 探测器信号处理方法及装置 |
| US10422862B2 (en) | 2016-12-13 | 2019-09-24 | Sensl Technologies Ltd. | LiDAR apparatus |
| US20180164414A1 (en) * | 2016-12-13 | 2018-06-14 | Sensl Technologies Ltd. | LiDAR Apparatus |
| US20180164412A1 (en) * | 2016-12-13 | 2018-06-14 | Sensl Technologies Ltd. | LiDAR Apparatus |
| US10656251B1 (en) | 2017-01-25 | 2020-05-19 | Apple Inc. | Signal acquisition in a SPAD detector |
| EP3574344B1 (en) * | 2017-01-25 | 2024-06-26 | Apple Inc. | Spad detector having modulated sensitivity |
| US10962628B1 (en) | 2017-01-26 | 2021-03-30 | Apple Inc. | Spatial temporal weighting in a SPAD detector |
| GB201704203D0 (en) * | 2017-03-16 | 2017-05-03 | Pixquanta Ltd | An electromagnetic radiation detection device |
| US20180329064A1 (en) * | 2017-05-09 | 2018-11-15 | Stmicroelectronics (Grenoble 2) Sas | Method and apparatus for mapping column illumination to column detection in a time of flight (tof) system |
| JP6881074B2 (ja) | 2017-06-22 | 2021-06-02 | 株式会社デンソー | 光検出器 |
| EP3428574A1 (en) * | 2017-07-11 | 2019-01-16 | Fondazione Bruno Kessler | Device for measuring a distance and method for measuring said distance |
| KR101938984B1 (ko) * | 2017-08-09 | 2019-04-10 | 연세대학교 산학협력단 | Spad 거리측정 센서 기반의 2단계 트래킹을 이용한 거리 측정 장치 및 방법 |
| AU2018341551B9 (en) * | 2017-09-27 | 2023-03-09 | The Commonwealth Of Australia | A neuromorphic single photon avalanche detector (SPAD) array microchip |
| JP7021501B2 (ja) * | 2017-10-26 | 2022-02-17 | オムロン株式会社 | データ取得方法およびデータ取得装置 |
| CN108051843B (zh) * | 2017-10-30 | 2020-11-24 | 深圳先进技术研究院 | 一种pet探测器的位置编码方法及装置 |
| US10340408B1 (en) | 2018-05-17 | 2019-07-02 | Hi Llc | Non-invasive wearable brain interface systems including a headgear and a plurality of self-contained photodetector units configured to removably attach to the headgear |
| US10158038B1 (en) | 2018-05-17 | 2018-12-18 | Hi Llc | Fast-gated photodetector architectures comprising dual voltage sources with a switch configuration |
| WO2019221799A1 (en) | 2018-05-17 | 2019-11-21 | Hi Llc | Stacked photodetector assemblies |
| US10420498B1 (en) | 2018-06-20 | 2019-09-24 | Hi Llc | Spatial and temporal-based diffusive correlation spectroscopy systems and methods |
| US11213206B2 (en) | 2018-07-17 | 2022-01-04 | Hi Llc | Non-invasive measurement systems with single-photon counting camera |
| DE102018213819B3 (de) * | 2018-08-16 | 2019-11-07 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung und Verfahren für TDC-Sharing bei laufzeitbasierter Distanzmessung |
| EP3627178B1 (en) * | 2018-09-19 | 2022-04-20 | ams AG | Sensor device, sensor module, imaging system and method to operate a sensor device |
| IT201800009064A1 (it) * | 2018-10-01 | 2020-04-01 | Massimo Luigi Maria Caccia | Dispositivo e metodo per generare sequenze random di bit |
| EP3864432A4 (en) * | 2018-11-20 | 2022-06-29 | Sense Photonics, Inc. | Methods and systems for spatially distributed strobing |
| US11233966B1 (en) | 2018-11-29 | 2022-01-25 | Apple Inc. | Breakdown voltage monitoring for avalanche diodes |
| WO2020131148A1 (en) | 2018-12-21 | 2020-06-25 | Hi Llc | Biofeedback for awareness and modulation of mental state using a non-invasive brain interface system and method |
| US11813041B2 (en) | 2019-05-06 | 2023-11-14 | Hi Llc | Photodetector architectures for time-correlated single photon counting |
| US11081611B2 (en) | 2019-05-21 | 2021-08-03 | Hi Llc | Photodetector architectures for efficient fast-gating comprising a control system controlling a current drawn by an array of photodetectors with a single photon avalanche diode |
| EP3980849A1 (en) | 2019-06-06 | 2022-04-13 | Hi LLC | Photodetector systems with low-power time-to-digital converter architectures |
| US11137607B2 (en) * | 2019-06-28 | 2021-10-05 | Canon Kabushiki Kaisha | Image capturing and display apparatus and wearable device |
| CN110389141B (zh) * | 2019-07-19 | 2022-04-05 | 东软医疗系统股份有限公司 | 位置读出设备、方法及装置 |
| EP4513153A3 (en) * | 2019-07-19 | 2025-05-28 | Avago Technologies International Sales Pte. Limited | Recharge circuit for digital silicon photomultipliers |
| CN110411577B (zh) * | 2019-07-23 | 2020-08-11 | 杭州电子科技大学 | Spad探测器阵列的异步读出电路及其异步读出方法 |
| US11378663B2 (en) | 2019-11-26 | 2022-07-05 | Waymo Llc | Systems and methods for biasing light detectors |
| EP3859400B1 (en) * | 2020-01-31 | 2025-11-05 | Canon Medical Systems Corporation | Radiation imaging device and radiation imaging method |
| ES2849224B2 (es) | 2020-02-14 | 2022-01-21 | Consejo Superior Investigacion | Fotomultiplicador digital de combinacion or de pulsos |
| US11883181B2 (en) | 2020-02-21 | 2024-01-30 | Hi Llc | Multimodal wearable measurement systems and methods |
| US12144653B2 (en) | 2020-02-21 | 2024-11-19 | Hi Llc | Systems, circuits, and methods for reducing common-mode noise in biopotential recordings |
| WO2021167890A1 (en) | 2020-02-21 | 2021-08-26 | Hi Llc | Wearable module assemblies for an optical measurement system |
| US11515014B2 (en) | 2020-02-21 | 2022-11-29 | Hi Llc | Methods and systems for initiating and conducting a customized computer-enabled brain research study |
| US11630310B2 (en) | 2020-02-21 | 2023-04-18 | Hi Llc | Wearable devices and wearable assemblies with adjustable positioning for use in an optical measurement system |
| US12029558B2 (en) | 2020-02-21 | 2024-07-09 | Hi Llc | Time domain-based optical measurement systems and methods configured to measure absolute properties of tissue |
| US11950879B2 (en) | 2020-02-21 | 2024-04-09 | Hi Llc | Estimation of source-detector separation in an optical measurement system |
| US11969259B2 (en) | 2020-02-21 | 2024-04-30 | Hi Llc | Detector assemblies for a wearable module of an optical measurement system and including spring-loaded light-receiving members |
| US11771362B2 (en) | 2020-02-21 | 2023-10-03 | Hi Llc | Integrated detector assemblies for a wearable module of an optical measurement system |
| US12059262B2 (en) | 2020-03-20 | 2024-08-13 | Hi Llc | Maintaining consistent photodetector sensitivity in an optical measurement system |
| US11187575B2 (en) | 2020-03-20 | 2021-11-30 | Hi Llc | High density optical measurement systems with minimal number of light sources |
| WO2021188487A1 (en) | 2020-03-20 | 2021-09-23 | Hi Llc | Temporal resolution control for temporal point spread function generation in an optical measurement system |
| US11645483B2 (en) | 2020-03-20 | 2023-05-09 | Hi Llc | Phase lock loop circuit based adjustment of a measurement time window in an optical measurement system |
| US12085789B2 (en) | 2020-03-20 | 2024-09-10 | Hi Llc | Bias voltage generation in an optical measurement system |
| US11245404B2 (en) | 2020-03-20 | 2022-02-08 | Hi Llc | Phase lock loop circuit based signal generation in an optical measurement system |
| WO2021188496A1 (en) | 2020-03-20 | 2021-09-23 | Hi Llc | Photodetector calibration of an optical measurement system |
| US11857348B2 (en) | 2020-03-20 | 2024-01-02 | Hi Llc | Techniques for determining a timing uncertainty of a component of an optical measurement system |
| US11819311B2 (en) | 2020-03-20 | 2023-11-21 | Hi Llc | Maintaining consistent photodetector sensitivity in an optical measurement system |
| US11864867B2 (en) | 2020-03-20 | 2024-01-09 | Hi Llc | Control circuit for a light source in an optical measurement system by applying voltage with a first polarity to start an emission of a light pulse and applying voltage with a second polarity to stop the emission of the light pulse |
| US11877825B2 (en) | 2020-03-20 | 2024-01-23 | Hi Llc | Device enumeration in an optical measurement system |
| US12138068B2 (en) | 2020-03-20 | 2024-11-12 | Hi Llc | Techniques for characterizing a nonlinearity of a time-to-digital converter in an optical measurement system |
| US12059270B2 (en) | 2020-04-24 | 2024-08-13 | Hi Llc | Systems and methods for noise removal in an optical measurement system |
| US11476372B1 (en) | 2020-05-13 | 2022-10-18 | Apple Inc. | SPAD-based photon detectors with multi-phase sampling TDCs |
| BE1028366B1 (nl) * | 2020-05-29 | 2022-01-11 | Voxelsensors Srl | Pixel sensor systeem |
| EP4158387B1 (en) * | 2020-05-29 | 2024-05-15 | VoxelSensors SRL | Pixel sensor system |
| US11555901B2 (en) * | 2020-07-27 | 2023-01-17 | Nxp B.V. | Photon-based detection using single-channel time-to-digital conversion |
| US12356740B2 (en) | 2020-09-25 | 2025-07-08 | Apple Inc. | Transistor integration with stacked single-photon avalanche diode (SPAD) pixel arrays |
| KR102886690B1 (ko) | 2020-12-23 | 2025-11-13 | 보셀센서스, 소시에떼 아 헤스퐁사빌리떼 리미떼 | 인접-게이트 스위칭 픽셀 센서 |
| EP4125269A1 (en) * | 2021-07-29 | 2023-02-01 | Leica Microsystems CMS GmbH | Detector array, imaging system and method to image a sample |
| EP4155781A1 (en) * | 2021-09-24 | 2023-03-29 | Koninklijke Philips N.V. | Photon detector, detector device and imaging apparatus |
| WO2025026636A1 (en) * | 2023-08-01 | 2025-02-06 | Ams-Osram Ag | 2d tdc arrangement |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101600972A (zh) * | 2006-07-28 | 2009-12-09 | 皇家飞利浦电子股份有限公司 | 正电子发射断层摄影中的飞行时间测量 |
| CN101836131A (zh) * | 2007-10-26 | 2010-09-15 | 株式会社岛津制作所 | 放射线检测器 |
| WO2010149593A1 (en) * | 2009-06-22 | 2010-12-29 | Toyota Motor Europe Nv/Sa | Pulsed light optical rangefinder |
| CN102036023A (zh) * | 2009-10-01 | 2011-04-27 | 索尼公司 | 图像传感器、电子系统和用于控制图像传感器的方法 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4672207A (en) * | 1985-08-21 | 1987-06-09 | The United States Of America As Represented By The United States Department Of Energy | Readout system for multi-crystal gamma cameras |
| US5099128A (en) | 1989-03-17 | 1992-03-24 | Roger Stettner | High resolution position sensitive detector |
| US5619040A (en) | 1994-03-29 | 1997-04-08 | Shapiro; Stephen L. | Data acquisition system |
| EP1521982A1 (en) | 2002-07-17 | 2005-04-13 | European Organization for Nuclear Research | Gamma ray detector for positron emission tomography (pet) and single photon emmission computed tomography (spect) |
| US7547872B2 (en) * | 2005-02-14 | 2009-06-16 | Ecole Polytechnique Federale De Lausanne | Integrated circuit comprising an array of single photon avalanche diodes |
| JP5623700B2 (ja) * | 2005-04-22 | 2014-11-12 | コーニンクレッカ フィリップス エヌ ヴェ | 飛行時間能力を有するｐｅｔ／ｍｒｉスキャナ |
| EP1922564B1 (en) | 2005-08-26 | 2011-12-14 | Koninklijke Philips Electronics N.V. | High resolution medical imaging detector |
| JP5437791B2 (ja) | 2006-04-25 | 2014-03-12 | コーニンクレッカ フィリップス エヌ ヴェ | （Ｂｉ）ＣＭＯＳプロセスによるアバランシェフォトダイオードの製造方法 |
| JP2008096278A (ja) | 2006-10-12 | 2008-04-24 | Fujifilm Corp | 放射線画像検出器 |
| WO2008113067A2 (en) | 2007-03-15 | 2008-09-18 | Johns Hopkins University | Deep submicron and nano cmos single photon photodetector pixel with event based circuits for readout data-rate reduction |
| US9087755B2 (en) | 2007-04-24 | 2015-07-21 | Koninklijke Philips N.V. | Photodiodes and fabrication thereof |
| EP2162762B1 (en) | 2007-05-16 | 2016-06-08 | Koninklijke Philips N.V. | Virtual pet detector and quasi-pixelated readout scheme for pet |
| CN101688894B (zh) | 2007-06-25 | 2014-01-29 | 皇家飞利浦电子股份有限公司 | 光电检测器、光电检测设备和光电检测方法 |
| EP2176685A2 (en) | 2007-08-08 | 2010-04-21 | Koninklijke Philips Electronics N.V. | Silicon photomultiplier readout circuitry |
| WO2009031074A2 (en) | 2007-09-04 | 2009-03-12 | Koninklijke Philips Electronics N.V. | Silicon photomultiplier energy resolution |
| JP5701743B2 (ja) | 2008-03-19 | 2015-04-15 | コーニンクレッカ フィリップス エヌ ヴェ | 放射線検出器、画像システム、光子を検出するための方法及びその方法を実行するコンピュータプログラム |
| CN102246058B (zh) | 2008-12-15 | 2014-06-11 | 皇家飞利浦电子股份有限公司 | 用于硅光电倍增管和其他单光子计数器的温度补偿电路 |
| EP2380040B1 (en) | 2008-12-22 | 2017-02-22 | Koninklijke Philips N.V. | High dynamic range light sensor |
| EP2380038B1 (en) | 2008-12-22 | 2019-01-09 | Koninklijke Philips N.V. | Cmos imager |
| KR101111011B1 (ko) | 2008-12-26 | 2012-02-15 | 연세대학교 산학협력단 | 감마선 영상측정을 위한 다층 평판형 검출기 및 3차원 위치검출방법 |
| JP2010249672A (ja) | 2009-04-16 | 2010-11-04 | Toshiba Corp | ポジトロンｃｔ装置 |
| RU2550581C2 (ru) | 2009-05-28 | 2015-05-10 | Конинклейке Филипс Электроникс Н.В. | Способ улучшения временного разрешения цифровых кремниевых фотоумножителей |
-
2012
- 2012-07-27 RU RU2014107914/28A patent/RU2014107914A/ru not_active Application Discontinuation
- 2012-07-27 JP JP2014523426A patent/JP6059722B2/ja active Active
- 2012-07-27 WO PCT/IB2012/053837 patent/WO2013018006A1/en not_active Ceased
- 2012-07-27 EP EP12772430.0A patent/EP2740262B1/en active Active
- 2012-07-27 US US14/234,650 patent/US9176241B2/en active Active
- 2012-07-27 CN CN201280038184.XA patent/CN103733609B/zh active Active
- 2012-07-27 MX MX2014001272A patent/MX2014001272A/es not_active Application Discontinuation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101600972A (zh) * | 2006-07-28 | 2009-12-09 | 皇家飞利浦电子股份有限公司 | 正电子发射断层摄影中的飞行时间测量 |
| JP2009544973A (ja) * | 2006-07-28 | 2009-12-17 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 陽電子放出型断層撮影における飛行時間測定法 |
| CN101836131A (zh) * | 2007-10-26 | 2010-09-15 | 株式会社岛津制作所 | 放射线检测器 |
| WO2010149593A1 (en) * | 2009-06-22 | 2010-12-29 | Toyota Motor Europe Nv/Sa | Pulsed light optical rangefinder |
| CN102036023A (zh) * | 2009-10-01 | 2011-04-27 | 索尼公司 | 图像传感器、电子系统和用于控制图像传感器的方法 |
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| WO2013018006A1 (en) | 2013-02-07 |
| EP2740262B1 (en) | 2020-09-09 |
| EP2740262A1 (en) | 2014-06-11 |
| US20140175294A1 (en) | 2014-06-26 |
| JP6059722B2 (ja) | 2017-01-11 |
| JP2014529923A (ja) | 2014-11-13 |
| CN103733609A (zh) | 2014-04-16 |
| RU2014107914A (ru) | 2015-09-10 |
| US9176241B2 (en) | 2015-11-03 |
| MX2014001272A (es) | 2014-05-19 |
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