CN103728120A - Detection device for light emitting diode wafers - Google Patents
Detection device for light emitting diode wafers Download PDFInfo
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- CN103728120A CN103728120A CN201210381322.6A CN201210381322A CN103728120A CN 103728120 A CN103728120 A CN 103728120A CN 201210381322 A CN201210381322 A CN 201210381322A CN 103728120 A CN103728120 A CN 103728120A
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- light
- microscope carrier
- transparent microscope
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Abstract
A detection device for light emitting diode wafers comprises a transparent microscope stage with the light condensation function, a point detecting device and a light sensing device. The transparent microscope stage comprises an incident face and a light-emitting face, wherein the incident face is used for bearing a plurality of light emitting diode wafers to be detected. The point detecting device comprises two probes and a power supply unit, and the two ends of each probe are electrically connected with one of the light emitting diode wafers and the power supply unit respectively to enable the light emitting diode wafers to emit a plurality of light rays which irradiates the incident face of the transparent microscope stage. The light sensing device is arranged on one side of the light-emitting face of the transparent microscope stage and used for receiving the light rays passing through the transparent microscope stage.
Description
[technical field]
The invention relates to a kind of pick-up unit, particularly relevant for a kind of pick-up unit of LED wafer.
[background technology]
Along with the lifting of scientific-technical progress and quality of the life, modern more becomes to paying attention to for illumination.From from ancient times by substance combustion to carry out torch, animals and plants oil lamp, candle, the kerosene lamp of luminous lighting, use the luminous incandescent lamp of electric power, fluorescent light, or be light emitting diode (the light-emitting diode commonly using now, LED), all epochmaking role is played the part of in display lighting in mankind's daily life.
Light emitting diode is to send monochromatic light, to reach the effect of illumination or warning by the hole combination of electronics electricity.Light emitting diode is compared to conventional light source, has that luminescence efficiency is high, a long service life, the advantage such as cracky, reaction velocity be not fast.Due under the acceleration of promotion energetically of government in recent years and each city LED street lamp scale expands, use LED to be seen everywhere as lighting use.
General conventional point measurement machine is to detect the luminescence efficiency of LED wafer.Point measurement machine is to provide LED wafer luminous voltage source by probe, the light that LED wafer sends is by the microscope carrier of carrying LED wafer, via the light sensing apparatus of point measurement machine, collect light again, and then the luminescence efficiency of judgement LED wafer.Yet the light that LED wafer sends is the possible restriction because of light sensing apparatus reconnaissance range, and impact detects the accuracy of LED wafer luminescence efficiency.
[summary of the invention]
Because the problem of above-mentioned existing skill, a wherein object of the present invention is exactly that a kind of pick-up unit of LED wafer is being provided, and to solve light sensing apparatus, receives the not good problem of optical efficiency.
According to another object of the present invention, a kind of pick-up unit of LED wafer is proposed, the light sending to assemble LED wafer.
According to a further object of the present invention, a kind of pick-up unit of LED wafer is proposed, accurately to detect the luminescence efficiency of LED wafer.
For reaching aforementioned object, the present invention proposes a kind of pick-up unit of LED wafer, transparent microscope carrier, spot measurement device and light sensing apparatus that this pick-up unit comprises tool light-focusing function.Wherein, transparent microscope carrier comprises incidence surface and exiting surface, and incidence surface is in order to carry a plurality of LED wafers to be measured.Spot measurement device comprises two probes and a power supply unit, two ends of probe are electrically connected respectively one and the power supply unit of a plurality of LED wafers, to make this LED wafer send complex trace light, the incidence surface of the transparent microscope carrier of this complex trace light incident.Light sensing apparatus is located at a side of the exiting surface of transparent microscope carrier, in order to receive by the complex trace light of transparent microscope carrier.Wherein, light sensing apparatus can be for example integrating sphere, solar panels, photoelectric crystal or light resistance.
According to the first aspect of the present invention, the area of the exiting surface of transparent microscope carrier of the present invention is less than the area of incidence surface.
According to the second aspect of the present invention, the exiting surface of transparent microscope carrier of the present invention has a plurality of microstructures, and this microstructure is prism columns, and this prism columns has the first inclined-plane and the second inclined-plane, and the first inclined-plane and the second inclined-plane form a drift angle.
According to elicit illness state sample of the present invention, the exiting surface of transparent microscope carrier of the present invention has a plurality of microstructures, and this microstructure has a curved surfaces.
According to the 4th aspect of the present invention, the section of the exiting surface of transparent microscope carrier of the present invention is a convex arc-shape kenel person outwardly.
According to the 5th aspect of the present invention, the inside of transparent microscope carrier of the present invention has an accommodation space, and accommodation space is provided with a convergent lens, to make transparent microscope carrier tool light-focusing function.
According to the 6th aspect of the present invention, the inside of transparent microscope carrier of the present invention has an accommodation space, and accommodation space is provided with at least one light-guide device, in order to guide the complex trace light of the transparent microscope carrier of incident.Wherein, light-guide device is light-guiding pillar or light guide plate.
According to the 7th aspect of the present invention, the inside of transparent microscope carrier of the present invention has an accommodation space, and accommodation space is provided with at least one light-guide device, in order to guide the complex trace light of the transparent microscope carrier of incident.Wherein, light-guide device is optical fiber.
From the above, the pick-up unit of LED wafer of the present invention, it can have one or more following advantage:
(1) pick-up unit of LED wafer of the present invention, assembles by the transparent microscope carrier of tool light-focusing function the light that LED wafer sends, and to solve light sensing apparatus, receives the not good problem of optical efficiency.
(2) pick-up unit of LED wafer of the present invention, assembles by the transparent microscope carrier of tool light-focusing function the light that LED wafer sends, and can reach the object of accurate detection LED wafer luminescence efficiency.
[accompanying drawing explanation]
Fig. 1 is the diagrammatic cross-section of embodiment of the pick-up unit of LED wafer of the present invention.
Fig. 2 is the first aspect diagrammatic cross-section of the transparent microscope carrier of the embodiment of the present invention.
Fig. 3 is the second aspect diagrammatic cross-section of the transparent microscope carrier of the embodiment of the present invention.
Fig. 4 is the elicit illness state sample diagrammatic cross-section of the transparent microscope carrier of the embodiment of the present invention.
Fig. 5 A is the 4th aspect diagrammatic cross-section of the transparent microscope carrier of the embodiment of the present invention.
Fig. 5 B is the 4th aspect diagrammatic cross-section of the transparent microscope carrier of the embodiment of the present invention.
Fig. 6 is the 5th aspect diagrammatic cross-section of the transparent microscope carrier of the embodiment of the present invention.
Fig. 7 is the 6th aspect diagrammatic cross-section of the transparent microscope carrier of the embodiment of the present invention.
10, A: LED wafer
100: spot measurement device
12: probe
13: power supply unit
15: light sensing apparatus
L1: light
18: transparent microscope carrier
14: incidence surface
16: exiting surface
17: electronic installation
30: prism columns
P1: the first inclined-plane
P2: the second inclined-plane
V1: drift angle
40: curved surfaces
50: convex arc-shape kenel person
62,72: accommodation space
60: convergent lens
70: light-guiding pillar
[embodiment]
Refer to Fig. 1, the diagrammatic cross-section of the embodiment of its pick-up unit that is LED wafer of the present invention.As shown in Figure 1, the pick-up unit of LED wafer of the present invention comprises tool light-focusing function transparent microscope carrier 18, spot measurement device 100 and light sensing apparatus 15.Transparent microscope carrier 18 comprises incidence surface 14 and exiting surface 16, and incidence surface 14 is in order to carry a plurality of LED wafers 10 to be measured.Spot measurement device 100 comprises two probes 12 and a power supply unit 13, two ends of probe 12 are electrically connected respectively one A and the power supply unit 13 of a plurality of LED wafers, power supply unit 13 via probe 12 so that the voltage source of this LED wafer A to be provided, to make this LED wafer A send complex trace light L1, the incidence surface 14 of the transparent microscope carrier 18 of this complex trace light L1 incident.Light sensing apparatus 15 is located at a side of the exiting surface 16 of transparent microscope carrier 18, in order to receive by the complex trace light L1 of transparent microscope carrier 18.Wherein, light sensing apparatus 15 can be for example integrating sphere, solar panels, photoelectric crystal or light resistance.
As shown in Figure 1, the pick-up unit of LED wafer of the present invention is applicable to detect the luminescence efficiency of LED wafer 10, its testing process is as follows: the power supply unit 13 of spot measurement device 100 provides the voltage source of the one A of LED wafer via probe 12, to make this LED wafer A send complex trace light L1; The incidence surface 14 of the transparent microscope carrier 18 of complex trace light L1 incident that LED wafer sends; Transparent microscope carrier 18 is assembled the complex trace light L1 of the transparent microscope carrier 18 of incident; And the light sensing apparatus 15 of being located at exiting surface 16 1 sides of transparent microscope carrier 18 receives by the complex trace light L1 of transparent microscope carrier 18, and by the electronic installation 17 being electrically connected with light sensing apparatus 15, presented the luminescence efficiency of LED wafer A.
Because the present invention is to reach the object of assembling the complex trace light that LED wafer sends by transparent microscope carrier, several aspects that only list transparent microscope carrier at this are to further illustrate the form of transparent microscope carrier of the present invention, yet these aspects are not in order to limit the present invention.Refer to Fig. 2 to Fig. 7, the diagrammatic cross-section of its first aspect to the six aspects that are the transparent microscope carrier of the present invention.Yet the embodiment of modifying under any spirit that does not depart from the claims in the present invention and category, all belongs to the scope that the present invention applies for protection.
Refer to Fig. 2, the first aspect diagrammatic cross-section of its transparent microscope carrier that is the embodiment of the present invention.As shown in Figure 2, transparent microscope carrier 18 of the present invention comprises incidence surface 14 and exiting surface 16, and the area of exiting surface 16 is less than the area of incidence surface 14, uses to reach and assembles the object that is carried on the complex trace light that the LED wafer of incidence surface 14 sends.
Refer to Fig. 3, the second aspect diagrammatic cross-section of its transparent microscope carrier that is the embodiment of the present invention.As shown in Figure 3, the exiting surface 16 of the transparent microscope carrier 18 of the second aspect has a plurality of microstructures, and this microstructure is for example prism columns 30, and prism columns 30 has the first inclined-plane P1 and the second inclined-plane P2, and wherein the first inclined-plane P1 and the second inclined-plane P2 form a drift angle V1.Because the object of prism columns 30 is to assemble the light of the transparent microscope carrier 18 of incident, therefore any angle that makes prism columns 30 possess the drift angle V1 of collected light function all belongs to the present invention and applies for the scope of protecting.
Refer to Fig. 4, the elicit illness state sample diagrammatic cross-section of its transparent microscope carrier that is the embodiment of the present invention.As shown in Figure 4, the exiting surface 16 of the transparent microscope carrier 18 of elicit illness state sample has a plurality of microstructures, and this microstructure has a curved surfaces 40.Wherein, the microstructure of the tool curved surfaces 40 of elicit illness state sample is to assemble the light of the transparent microscope carrier 18 of incident; and the curved surfaces 40 of microstructure of the present invention is not limited to specific radian, any curved surfaces 40 with collected light function all belongs to the scope that the present invention applies for protection.
In addition, in second aspect and elicit illness state sample of the transparent microscope carrier of the embodiment of the present invention, microstructure and transparent microscope carrier can the persons of being formed in one, also can be in the surface working of transparent microscope carrier and form microstructure, the method for making of surface working can be for example for the exiting surface in transparent microscope carrier be coated with (coating process), net-point printing (dot printing), etching (etching process), laser, chemical vapour deposition technique (chemical vapor deposition, the process such as CVD), with the exiting surface formation rule in transparent microscope carrier or irregular coarse surface.And the material of microstructure can be for example polystyrene (polys tyrene), silicon dioxide (silicon dioxide), poly-acryl (poly acrylic), monox (silicon oxide), silicon nitride (silicon nitride), silicon oxynitride (silicon oxynitride) or fluorocarbons (fluorinated carbon).
Refer to Fig. 5 A and Fig. 5 B, the 4th aspect diagrammatic cross-section of its transparent microscope carrier that is the embodiment of the present invention.As shown in Fig. 5 A and Fig. 5 B, the section of the exiting surface 16 of the transparent microscope carrier 18 of the 4th aspect is a convex arc-shape kenel person 50 outwardly.In other words, the incidence surface 14 of transparent microscope carrier 18 can interconnect (as shown in Figure 5 B) or not be connected (as shown in Figure 5A) with exiting surface 16, as long as can make transparent microscope carrier 18 possess collected light function, all should fall into the claimed scope of the present invention.
Refer to Fig. 6, the 5th aspect diagrammatic cross-section of its transparent microscope carrier that is the embodiment of the present invention.As shown in Figure 6, the inside of the transparent microscope carrier 18 of the 5th aspect has an accommodation space 62, and accommodation space 62 is provided with convergent lens 60, to make transparent microscope carrier 18 tool light-focusing functions, and then reaches the object of the light of assembling the transparent microscope carrier 18 of incident.
Refer to Fig. 7, the 6th aspect diagrammatic cross-section of its transparent microscope carrier that is the embodiment of the present invention.As shown in Figure 7, the inside of the transparent microscope carrier 18 of the 6th aspect has an accommodation space 72, and accommodation space 72 is provided with at least one light-guide device, in order to guide the complex trace light of the transparent microscope carrier 18 of incident.Wherein, the light-guide device of the 6th aspect can be for example light-guiding pillar or light guide plate, and the light-guide device in Fig. 7 is to take light-guiding pillar 70 as example.Yet light-guide device of the present invention is not limited to the light-guiding pillar 70 of Fig. 7, in other words, any light-guide device with directing light function all belongs to the scope that the present invention applies for protection.For example, the light-guide device of the present invention's the 6th aspect can be also for example optical fiber.Moreover, via announcement of the present invention, have the knack of kind and pattern size that this skill person should understand the light-guide device with directing light function, therefore repeat no more.
In sum, the light that the pick-up unit of LED wafer of the present invention sends to assemble LED wafer by transparent microscope carrier, improve light sensing apparatus and collect the efficiency of light, use and increase the accuracy that pick-up unit measures the luminescence efficiency of LED wafer.
The foregoing is only illustrative, but not be restricted person.Anyly do not depart from spirit of the present invention and category, and the equivalent modifications that it is carried out or change all should be contained in claim protection domain.
Claims (11)
1. a pick-up unit for LED wafer, is characterized in that, this pick-up unit at least comprises:
The transparent microscope carrier of one tool light-focusing function, this transparent microscope carrier comprises an incidence surface and an exiting surface, and this incidence surface is in order to carry a plurality of LED wafers to be measured;
One spot measurement device, this spot measurement device comprises two probes and a power supply unit, two ends of these probes are electrically connected respectively one and this power supply unit of these LED wafers, to make this LED wafer send complex trace light, these light are these incidence surfaces of this transparent microscope carrier of incident; And
One light sensing apparatus, this light sensing apparatus is located at a side of this exiting surface of this transparent microscope carrier, in order to receive by these light of this transparent microscope carrier.
2. the pick-up unit of LED wafer as claimed in claim 1, wherein the area of this exiting surface of this transparent microscope carrier is less than the area of this incidence surface.
3. the pick-up unit of LED wafer as claimed in claim 1, wherein this exiting surface of this transparent microscope carrier has a plurality of microstructures.
4. the pick-up unit of LED wafer as claimed in claim 3, wherein this microstructure is prism columns, and this prism columns has one first inclined-plane and one second inclined-plane, and this first inclined-plane and this second inclined-plane form a drift angle.
5. the pick-up unit of LED wafer as claimed in claim 3, wherein this microstructure has a curved surfaces.
6. the pick-up unit of LED wafer as claimed in claim 1, wherein the section of this exiting surface of this transparent microscope carrier is a convex arc-shape kenel person outwardly.
7. the pick-up unit of LED wafer as claimed in claim 1, wherein the inside of this transparent microscope carrier has an accommodation space, and this accommodation space is provided with a convergent lens, to make this transparent microscope carrier have light-focusing function.
8. the pick-up unit of LED wafer as claimed in claim 1, wherein the inside of this transparent microscope carrier has an accommodation space, and this accommodation space is provided with at least one light-guide device, in order to guide these light of this transparent microscope carrier of incident.
9. the pick-up unit of LED wafer as claimed in claim 8, wherein this light-guide device is optical fiber.
10. the pick-up unit of LED wafer as claimed in claim 8, wherein this light-guide device is light-guiding pillar or light guide plate.
The pick-up unit of 11. LED wafers as claimed in claim 1, wherein this light sensing apparatus is integrating sphere, solar panels, photoelectric crystal or light resistance.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210381322.6A CN103728120A (en) | 2012-10-10 | 2012-10-10 | Detection device for light emitting diode wafers |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210381322.6A CN103728120A (en) | 2012-10-10 | 2012-10-10 | Detection device for light emitting diode wafers |
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| Publication Number | Publication Date |
|---|---|
| CN103728120A true CN103728120A (en) | 2014-04-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210381322.6A Pending CN103728120A (en) | 2012-10-10 | 2012-10-10 | Detection device for light emitting diode wafers |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104075879A (en) * | 2014-06-06 | 2014-10-01 | 致茂电子(苏州)有限公司 | Light emitting diode measurement device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101881655A (en) * | 2009-05-06 | 2010-11-10 | 晶元光电股份有限公司 | Light-emitting diode measuring device |
| CN102032984A (en) * | 2009-09-25 | 2011-04-27 | 惠特科技股份有限公司 | Method for measuring properties of light of LED |
| CN102213615A (en) * | 2011-04-01 | 2011-10-12 | 中国兵器工业第二〇五研究所 | LED optical parameter comprehensive testing device |
| KR101083346B1 (en) * | 2010-12-09 | 2011-11-15 | 주식회사 이노비즈 | Inspection device of led chip |
| KR20120045880A (en) * | 2010-11-01 | 2012-05-09 | 삼성엘이디 주식회사 | Appratus for measuring optical properties of led package |
-
2012
- 2012-10-10 CN CN201210381322.6A patent/CN103728120A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101881655A (en) * | 2009-05-06 | 2010-11-10 | 晶元光电股份有限公司 | Light-emitting diode measuring device |
| CN102032984A (en) * | 2009-09-25 | 2011-04-27 | 惠特科技股份有限公司 | Method for measuring properties of light of LED |
| KR20120045880A (en) * | 2010-11-01 | 2012-05-09 | 삼성엘이디 주식회사 | Appratus for measuring optical properties of led package |
| KR101083346B1 (en) * | 2010-12-09 | 2011-11-15 | 주식회사 이노비즈 | Inspection device of led chip |
| CN102213615A (en) * | 2011-04-01 | 2011-10-12 | 中国兵器工业第二〇五研究所 | LED optical parameter comprehensive testing device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104075879A (en) * | 2014-06-06 | 2014-10-01 | 致茂电子(苏州)有限公司 | Light emitting diode measurement device |
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Application publication date: 20140416 |