CN103364078A - Optical measurement system and optical measurement method - Google Patents
Optical measurement system and optical measurement method Download PDFInfo
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- CN103364078A CN103364078A CN201210194274XA CN201210194274A CN103364078A CN 103364078 A CN103364078 A CN 103364078A CN 201210194274X A CN201210194274X A CN 201210194274XA CN 201210194274 A CN201210194274 A CN 201210194274A CN 103364078 A CN103364078 A CN 103364078A
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Abstract
The invention provides an optical measurement system and an optical measurement method, which are used for measuring at least one light-emitting element. The optical measurement system comprises a bearing module, a first light detection unit and at least one second light detection unit. The bearing module bears and lights the light-emitting element. The first light detection unit is arranged right above the light-emitting element to detect forward light emitted by the light-emitting element. The second light detection unit is arranged at least one of the oblique upper side and the side of the light-emitting element so as to detect at least one of oblique light and side light emitted by the light-emitting element. An optical measurement method is also provided.
Description
Technical field
The invention relates to a kind of measuring system and measuring method, and particularly relevant for a kind of optical measuring system and measuring method.
Background technology
Light emitting diode (light-emitting diode, LED) is widely used in the instrument indication of backlight, signboard, hand-held lighting device, locomotive of display and signal lamp etc. gradually.In addition, the luminosity of light emitting diode promotes gradually in recent years, so the application of light emitting diode also extends to the general illumination light source.Because light emitting diode has the advantages such as the short and long service life of low power consumption, environmental protection, reaction time, more have an opportunity future to become main lighting source and replace daylight lamp and incandescent lamp bulb.
In order to ensure the luminescent quality of the light emitting diode that dispatches from the factory, the detection after light emitting diode completes is just quite important.Except the luminosity of basic electrical detection such as element out of the ordinary, comprise whether the luminous intensity of lighting angle and variant angle meets expection, also all become a ring of the examination and test of products.In addition, for adapting to the automated production demand, this detection is also good being automated as.Moreover after light emitting diode (LED) product range of application augmentation, with the difference of user demand, the lighting angle scope of light emitting diode need be narrower sometimes, sometimes then needs wider.Therefore, whether the lighting angle scope after completing meets the luminescent quality that expection also can affect light emitting diode.
Yet existing is to adopt photodetector to scan each rising angle to reach in order to the light intensity that goes out of measuring light-emitting component with respect to the technology of the distribution of rising angle, so can make Measuring Time become very long, detects and be suitable in a large number and fast.Whether in addition, existing Fast Detection Technique is then just measured the forward light of light-emitting component, therefore can't check the rising angle scope of light-emitting component normal.
Summary of the invention
The invention provides a kind of optical measuring system and measuring method, it can confirm fast whether normal the luminous intensity of light-emitting component and lighting angle distribute.
One embodiment of the invention proposes a kind of optical measuring system, in order to measure at least one light-emitting component.Optical measuring system comprises carrier module, the first optical detecting unit, at least one second optical detecting unit.Carrier module carrying and lighting elements.The first optical detecting unit be configured in light-emitting component directly over, to detect the forward light that light-emitting component was sent.The second optical detecting unit be configured in the oblique upper of light-emitting component and side at least one of them, with detect oblique light that light-emitting component was sent and lateral light at least wherein it
One embodiment of the invention proposes a kind of measuring method, and it comprises the following steps: to light at least one light-emitting component; Measure the forward light that light-emitting component sends, to obtain the first light intensity; Measure oblique light that light-emitting component sends and lateral light at least one of them, to obtain the second light intensity, wherein, the step of measuring forward light with measure oblique light and lateral light at least one of them step carry out simultaneously.
Based on above-mentioned, the optical measuring system of embodiments of the invention utilizes at least one second optical detecting unit and the first optical detecting unit to detect respectively the oblique light of light-emitting component and lateral light at least one of them and forward light.Thus, can record the forward light of light-emitting component and the light intensity on other directions, and then confirm fast whether the luminous intensity of light-emitting component is normal.In addition, in the measuring method of embodiments of the invention since the step of measuring forward light with measure oblique light and lateral light at least one of them step carry out simultaneously, can confirm fast therefore whether normal the lighting angle of light-emitting component distributes.
For above-mentioned feature and advantage of the present invention can be become apparent, embodiment cited below particularly, and cooperate accompanying drawing to be described in detail below.
Description of drawings
Fig. 1 is the optical measuring system synoptic diagram of one embodiment of the invention;
Fig. 2 is the relative position synoptic diagram of a plurality of light-emitting components on the carrying platform, probe groups and the first optical detecting unit;
Fig. 3 is the optical measuring system synoptic diagram of another embodiment of the present invention;
Fig. 4 A is the optical measuring system synoptic diagram of further embodiment of this invention;
Fig. 4 B is the vertical view of the first optical detecting unit among Fig. 4 A, the second optical detecting unit and light-emitting component;
Fig. 5 is the optical measuring system synoptic diagram of yet another embodiment of the invention;
Fig. 6 is the optical measuring system synoptic diagram of another embodiment of the present invention;
Fig. 7 is the measuring method process flow diagram of one embodiment of the invention.
Description of reference numerals:
100,100A, 100B, 100C, 100D: optical measuring system;
110: carrier module;
112: carrying platform;
114: probe groups;
120: the first optical detecting units;
130,130A, 130B, 130C: the second optical detecting unit;
140: light-emitting component;
L1: forward light;
L2: oblique light;
L3: lateral light;
P: center;
S: receive the light face;
Z: optical axis;
α, θ: angle;
β, θ 1, θ 2, θ 3: receive the optic angle degree;
S110, S120: step;
Λ: drift angle.
Embodiment
Fig. 1 is the optical measuring system synoptic diagram of one embodiment of the invention.Please refer to Fig. 1, the optical measuring system 100 of present embodiment is in order to measure at least one light-emitting component 140.Optical measuring system 100 comprises carrier module 110, the first optical detecting unit 120 and at least one the second optical detecting unit 130.Carrier module 110 can carry and lighting elements 140, to allow the first optical detecting unit 120 and the second optical detecting unit 130 receive the light that light-emitting component 140 is sent.In the present embodiment, light-emitting component 140 for example is light emitting diode.Yet in other embodiments, light-emitting component 140 can also be the light-emitting component of other kinds.The first optical detecting unit 120 be configured in light-emitting component 140 directly over, the forward light L1 that is sent to detect light-emitting component 140.The second optical detecting unit 130 is configured in the oblique upper of light-emitting component 140 and side at least one of them (be the oblique upper that is configured in light-emitting component 140 be example) in Fig. 1, to detect oblique smooth L2 that light-emitting component 140 sent and lateral light L3 at least one of them (being to detect oblique light as example) in Fig. 1.
In the present embodiment, carrier module 110 can further comprise carrying platform 112 and probe groups 114.But probe groups 114 touch luminous elements 140, and by apply electric current to light-emitting component 140 with lighting elements 140.Yet the invention is not restricted to this, in other embodiments, carrying platform 112 also can adopt other modes to apply energy to light-emitting component 140, so that light-emitting component 140 is luminous, and the configuration of saving probe groups 114.In the present embodiment, light-emitting component 140 has optical axis Z.In addition, in the present embodiment, except the first optical detecting unit 120, optical measuring system 100 comprises that also configuration is different from the second optical detecting unit 130 of the position of the first optical detecting unit 120, therefore compared to existing technology, optical measuring system 100 has larger receipts optic angle degree scope, can measure lighting angle wider of light-emitting component 140.
Please continue with reference to Fig. 1, the first optical detecting unit 120 receives the light-emitting component 140 optical axis Z folders 0 with light-emitting component 140 that send and spends to the light of θ degree, and wherein 2.5≤θ≤85 are preferably 30≤θ≤60.With another angle, the first optical detecting unit 120 has the light of receipts face S, this receives light face S and receives the light angle beta with respect to the subtended angle formation of the center P of light-emitting component 140, so that the first optical detecting unit 120 can be collected the light in the light angle beta scope, wherein receive the light angle beta and be 5 degree to 170 degree, be preferably 60 degree to 120 degree.In the present embodiment, optical measuring system 100 has two the second optical detecting units 130, and these two the second optical detecting units 130 lay respectively at the both sides of optical axis Z and are symmetrical in optical axis Z.In addition, the angle α of the line of each second optical detecting unit 130 and light-emitting component 140 and the optical axis Z of light-emitting component 140 drops on 2.5 degree to the scopes of 90 degree, preferably α drops on 30 degree to the scopes of 90 degree, and meaning i.e. the second optical detecting unit 130 can be collected along with the difference of the setting of position and folder 2.5 degree of the optical axis Z light to the scopes of 90 degree.Yet the invention is not restricted to this, can adjust to some extent according to deviser's demand with respect to the number of the second optical detecting unit 130 of optical axis Z both sides, for example at a plurality of the second optical detecting units 130 of different angle α configurations.
Based on the first above-mentioned optical detecting unit 120 and the configuration status of two the second optical detecting units 130, the optical measuring system 100 of present embodiment can be collected forward light L1 and the oblique smooth L2 of light-emitting component 140 simultaneously, then optical parameter (for example light intensity, optical wavelength) and mutual comparison the by measuring this two-part light, can learn that just the light shape of light-emitting component 140 distributes and other optical characteristics.If the light-emitting component 140 that quality is good, its light shape distributes should good symmetry, so two the second optical detecting units 130 of the symmetrical pattern distribution of present embodiment can further be checked the symmetrical degree of the light shape of light-emitting component 140.Relative, if the light shape of light-emitting component 140 is distributed in the part of oblique smooth L2 when asymmetric situation occurring, can suspect that also the level of carrying platform 112 goes wrong.Therefore the user can be distributed symmetrically horizontal adjustment to the light shape that makes measured oblique smooth L2 of carrying platform 112.Thus, optical measuring system 100 can be confirmed the stability of carrying platform 112, increases the correctness that detects light-emitting component 140.
In addition on the one hand, the light-emitting component 140 that illustrates among Fig. 1 be take one as representative, actual, carrying platform 112 can carry a plurality of light-emitting components 140, for example is the wafer of a plurality of luminescence chips of tool.Fig. 2 is the relative position synoptic diagram of a plurality of light-emitting components on the carrying platform, probe groups and the first optical detecting unit.Please be simultaneously with reference to Fig. 1 and Fig. 2, by the movement of carrying platform 112 two dimensions or the movement of probe groups 114, the first optical detecting unit 120 and the second optical detecting unit 130, probe groups 114 contact and light these light-emitting components 140, wherein when these light-emitting components 140 different time points respectively relative the first optical detecting unit 120 move to the first optical detecting unit 120 under the time, probe groups 114 is lighted respectively these light-emitting components 140, simultaneously, the first optical detecting unit 120 and the second optical detecting unit 130 detect respectively these light-emitting components 140.So so that can being checked its luminous intensity and light shape fast, a plurality of light-emitting components 140 distribute time and cost that the minimizing prior art spends when check.
In the present embodiment, the first optical detecting unit 120 and the second optical detecting unit 130 for example are integrating sphere, photodiode, photoresistance, optotransistor or its combination.For example, the first optical detecting unit 120 of present embodiment is integrating sphere, and the second optical detecting unit 130 is photodiode, photoresistance or optotransistor.
Fig. 3 is the optical measuring system synoptic diagram of another embodiment of the present invention.Particularly, the optical measuring system 100A of present embodiment comprises the first optical detecting unit 120 and two the second optical detecting unit 130A, and these three optical detecting units are all integrating sphere.For example, the receipts light face S of the first optical detecting unit 120 and two the second optical detecting unit 130A forms respectively with respect to the subtended angle of the center P of light-emitting component 140 and receives optic angle degree θ 1, θ 2 and θ 3 in the present embodiment, θ 1+ θ 2+ θ 3 for example equals 180 degree, and so the receipts optical range of optical measuring system 100A just can be contained all upper half side angles of light-emitting component 140.For example, receiving optic angle degree θ 1, θ 2 for example respectively is 60 degree with θ 3.Yet the present invention is not as limit, the total number of the first optical detecting unit 120 and the second optical detecting unit 130A can be adjusted according to the deviser, the receipts optic angle degree of the first optical detecting unit 120 and the second optical detecting unit 130A also can be adjusted arbitrarily, as long as can collect the forward light L1 and the lateral light L3 and the oblique smooth L2 that are symmetrical in optical axis Z of light-emitting component.In addition, can be with reference to the content of the embodiment of figure 1 about the detailed description of the first optical detecting unit 120 and the second optical detecting unit 130A.
Fig. 4 A is the optical measuring system synoptic diagram of further embodiment of this invention.Fig. 4 B is the vertical view of the first optical detecting unit among Fig. 4 A, the second optical detecting unit and light-emitting component.Please be simultaneously with reference to Fig. 4 A and Fig. 4 B, the optical measuring system 100B of present embodiment comprises the first optical detecting unit 120 and a plurality of the second optical detecting unit 130B, and these second optical detecting units 130B is around the optical axis Z configuration of light-emitting component.Among Fig. 4 with four the second optical detecting unit 130B as exemplary signal.Furthermore, in the present embodiment, a plurality of the second optical detecting unit 130B are at grade configurable, therefore each second optical detecting unit 130B receives the light that presss from both sides equal angular with optical axis Z, and so the optical measuring system 100B of present embodiment can further detect light-emitting component 140 in the light intensity distributions that is surrounded on the optical axis Z direction.Yet the invention is not restricted to this, in other embodiments, a plurality of the second optical detecting unit 130B are configurable on Different Plane.In addition, can be with reference to the content of the embodiment of figure 1 about the detailed description of the first optical detecting unit 120 and the second optical detecting unit 130B.
Fig. 5 is the optical measuring system synoptic diagram of yet another embodiment of the invention.The optical measuring system 100C of present embodiment comprises the first optical detecting unit 120 and the second optical detecting unit 130C, and wherein the second optical detecting unit 130C is the ring-shaped light detecting unit around the optical axis Z of light-emitting component 140.In the present embodiment, the line of the second optical detecting unit 130C of ring-type and the center P of light-emitting component 140 consists of a three-dimensional pyramid, and the drift angle Λ of three-dimensional pyramid drops on 5 degree to the scope of 180 degree.As the embodiment of Fig. 4, the optical measuring system 100C of present embodiment can further detect light-emitting component 140 in the light intensity distributions that is surrounded on the optical axis Z direction, and detects more completely.
Fig. 6 is the optical measuring system synoptic diagram of another embodiment of the present invention.The optical measuring system 100D of Fig. 6 and the optical measuring system of Fig. 1 100 are similar, and therefore identical element represents with identical label.The Main Differences of the optical measuring system 100 of the optical measuring system 100D of present embodiment and Fig. 1 embodiment is: in the present embodiment, two the second optical detecting units 130 are configured in the side of light-emitting component 140 and are symmetrical in optical axis Z.Below different place explains at this point, and the two something in common just no longer repeats.
Furthermore, the second optical detecting unit 130 of optical measuring system 100D can receive the light about folder 90 degree with optical axis Z.Therefore optical measuring system 100D is detected the lateral light L3 that light-emitting component 140 sends.
By above-mentioned content, can provide good measuring method.Fig. 7 is the measuring method process flow diagram of one embodiment of the invention.Please refer to Fig. 1 and Fig. 7, the measuring method of present embodiment comprises the following steps.At first, light at least one light-emitting component 140 (step S110).Then, measure the forward light L1 that light-emitting component 140 sends, obtaining the first light intensity, and measure simultaneously oblique smooth L2 that light-emitting component sends and lateral light L3 at least one of them (step S 120), to obtain the second light intensity.
Please refer to Fig. 1, for example, measured forward light L1 spends to the light of θ degree for the optical axis Z with light-emitting component 140 presss from both sides 0, wherein 2.5≤θ≤85.In addition, measured oblique smooth L2 and lateral light L3 are arbitrary drops on 2.5 degree to the scope of 90 degree with optical axis Z angle light-emitting component 140.Therefore, the first measured light intensity and the second light intensity be respectively with optical axis Z folder different angles on light irradiance.
Furthermore, please refer to Fig. 1 and Fig. 7, the oblique smooth L2 of the measurement among the step S120 and lateral light L3 at least one of them can be measure in two positions of the relative both sides of the optical axis Z of light-emitting component 140 oblique smooth L2 and lateral light L3 at least one of them.Perhaps, please refer to Fig. 4 A and Fig. 4 B, around the oblique smooth L2 of a plurality of position measurements of the optical axis of light-emitting component 140 and lateral light L3 at least one of them, also or in the ring-type measurement zone around the optical axis Z of light-emitting component 140, measure oblique smooth L2 and lateral light L3 at least one of them.Thus, forward light L1 and be symmetrical in the oblique smooth L2 of optical axis Z or lateral light L3 can be by simultaneously and minute other collection and measure its intensity and wavelength, and then can detect the light shape of light-emitting component 140, to judge luminescence efficiency and the quality of light-emitting component 140, even differentiate the stability of carrier of carrying light-emitting component 140 by the symmetrical degree of light shape, for example be the general point measurement machine platform that point is surveyed luminescence chip that is used for.
In addition, the measuring method of present embodiment can be applicable to the situation of measuring a plurality of light-emitting components, in other words, lights respectively and measure these light-emitting components at a plurality of different time points, to obtain respectively a plurality of the first light intensities and a plurality of the second light intensity.So can shorten in the required time of luminescent quality of measuring a plurality of light-emitting components.
In sum, the optical measuring system of embodiments of the invention utilizes at least one second optical detecting unit and the first optical detecting unit to detect respectively the oblique light of light-emitting component and lateral light at least one of them and forward light.Thus, can record the forward light of light-emitting component and the light intensity on other directions, and then confirm fast whether normal the lighting angle of light-emitting component distributes.In addition, in the measuring method of embodiments of the invention since the step of measuring forward light with measure oblique light and lateral light at least one of them step carry out simultaneously, can confirm fast therefore whether normal the lighting angle of light-emitting component distributes.
It should be noted that at last: above each embodiment is not intended to limit only in order to technical scheme of the present invention to be described; Although with reference to aforementioned each embodiment the present invention is had been described in detail, those of ordinary skill in the art is to be understood that: it still can be made amendment to the technical scheme that aforementioned each embodiment puts down in writing, and perhaps some or all of technical characterictic wherein is equal to replacement; And these modifications or replacement do not make the essence of appropriate technical solution break away from the scope of various embodiments of the present invention technical scheme.
Claims (18)
1. an optical measuring system is characterized in that, in order to measure at least one light-emitting component, this optical measuring system comprises:
Carrier module carries and lights this light-emitting component;
The first optical detecting unit, be configured in this light-emitting component directly over, the forward light that is sent to detect this light-emitting component; And
At least one the second optical detecting unit, be configured in the oblique upper of this light-emitting component and side at least one of them, with detect oblique light that this light-emitting component sent and lateral light at least one of them.
2. optical measuring system according to claim 1 is characterized in that, this first optical detecting unit and this second optical detecting unit are integrating sphere, photodiode, photoresistance, optotransistor or its combination.
3. optical measuring system according to claim 1 is characterized in that, this first optical detecting unit receives this light-emitting component optical axis folder 0 that send and this light-emitting component and spends to the light of θ degree, wherein 2.5≤θ≤85.
4. optical measuring system according to claim 1 is characterized in that, this at least one second optical detecting unit is two the second optical detecting units, and these a plurality of the second optical detecting units are disposed at respectively the relative both sides of the optical axis of this light-emitting component.
5. optical measuring system according to claim 4 is characterized in that, this first optical detecting unit is all integrating sphere with these a plurality of second optical detecting units.
6. optical measuring system according to claim 4 is characterized in that, this first optical detecting unit is integrating sphere, and these a plurality of second optical detecting units are photodiode.
7. optical measuring system according to claim 1 is characterized in that, the angle of the line of this second optical detecting unit and this light-emitting component and the optical axis of this light-emitting component drops on 2.5 degree to the scope of 90 degree.
8. optical measuring system according to claim 1 is characterized in that, this at least one second optical detecting unit is a plurality of the second optical detecting units, and these a plurality of second optical detecting units are around the optical axis configuration of this light-emitting component.
9. optical measuring system according to claim 1 is characterized in that, this second optical detecting unit is the ring-shaped light detecting unit around the optical axis of this light-emitting component.
10. optical measuring system according to claim 1 is characterized in that, this at least one light-emitting component is a plurality of light-emitting components, and this carrier module comprises:
Carrying platform, carry this a plurality of light-emitting components, wherein these a plurality of light-emitting components a plurality of different time points respectively relatively this first optical detecting unit move to this first optical detecting unit under so that this first optical detecting unit detects respectively this a plurality of light-emitting components from this second optical detecting unit at these a plurality of different time points.
11. optical measuring system according to claim 9 is characterized in that, this carrier module also comprises:
Probe groups, contact and light this a plurality of light-emitting components, wherein when these a plurality of light-emitting components these a plurality of different time points respectively relatively this first optical detecting unit move to this first optical detecting unit under the time, this group probe is lighted respectively this a plurality of light-emitting components at these a plurality of different time points.
12. a measuring method is characterized in that, comprising:
Light at least one light-emitting component;
Measure the forward light that this light-emitting component sends, to obtain the first light intensity; And measure oblique light that this light-emitting component sends and lateral light at least one of them, obtaining the second light intensity,
Wherein, the step of measuring this forward light with measure this oblique light and this lateral light at least one of them step carry out simultaneously.
13. measuring method according to claim 12 is characterized in that, this measured forward light is spent to the light of θ degree for the optical axis with this light-emitting component presss from both sides 0, wherein 2.5≤θ≤85.
14. measuring method according to claim 12 is characterized in that, the optical axis included angle of arbitrary and this light-emitting component of the oblique light of measured this and this lateral light drops on 2.5 degree to the scope of 90 degree.
15. measuring method according to claim 12, it is characterized in that, measure this oblique light and this lateral light at least one of them step be included in measure on two positions of relative both sides of optical axis of this light-emitting component this oblique light and this lateral light at least one of them.
16. measuring method according to claim 12, it is characterized in that, measure this oblique light and this lateral light at least one of them step be included in measure in the ring-type measurement zone around the optical axis of this light-emitting component this oblique light and this lateral light at least one of them.
17. measuring method according to claim 12 is characterized in that, measure this oblique light and this lateral light at least one of them step be included in around this oblique light of a plurality of position measurements of the optical axis of this light-emitting component and this lateral light at least one of them.
18. measuring method according to claim 12, it is characterized in that, this at least one light-emitting component is a plurality of light-emitting components, and this measuring method is included in a plurality of different time points and lights respectively and measure these a plurality of light-emitting components, to obtain respectively a plurality of the first light intensities and a plurality of the second light intensity.
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| TW101111401 | 2012-03-30 | ||
| TW101111401A TW201339557A (en) | 2012-03-30 | 2012-03-30 | Optical measurement system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111323612A (en) * | 2020-04-30 | 2020-06-23 | 湖南国天电子科技有限公司 | Stable optical azimuth automatic measuring device and measuring method thereof |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101339092A (en) * | 2008-08-13 | 2009-01-07 | 重庆大学 | LED chip / wafer/ epitaxial slice non-contact type checking method and checking device |
| CN101464186A (en) * | 2007-12-21 | 2009-06-24 | 株式会社光学系统 | Photometry apparatus of luminophor |
| CN102213615A (en) * | 2011-04-01 | 2011-10-12 | 中国兵器工业第二〇五研究所 | LED optical parameter comprehensive testing device |
-
2012
- 2012-03-30 TW TW101111401A patent/TW201339557A/en unknown
- 2012-06-13 CN CN201210194274XA patent/CN103364078A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101464186A (en) * | 2007-12-21 | 2009-06-24 | 株式会社光学系统 | Photometry apparatus of luminophor |
| CN101339092A (en) * | 2008-08-13 | 2009-01-07 | 重庆大学 | LED chip / wafer/ epitaxial slice non-contact type checking method and checking device |
| CN102213615A (en) * | 2011-04-01 | 2011-10-12 | 中国兵器工业第二〇五研究所 | LED optical parameter comprehensive testing device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111323612A (en) * | 2020-04-30 | 2020-06-23 | 湖南国天电子科技有限公司 | Stable optical azimuth automatic measuring device and measuring method thereof |
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Application publication date: 20131023 |