CN103698682B - A kind of cmos image sensor based on FPGA technology test device - Google Patents
A kind of cmos image sensor based on FPGA technology test device Download PDFInfo
- Publication number
- CN103698682B CN103698682B CN201310714296.9A CN201310714296A CN103698682B CN 103698682 B CN103698682 B CN 103698682B CN 201310714296 A CN201310714296 A CN 201310714296A CN 103698682 B CN103698682 B CN 103698682B
- Authority
- CN
- China
- Prior art keywords
- image sensor
- cmos image
- fpga
- tested
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
The present invention relates to a kind of cmos image sensor based on FPGA technology test device, a kind of Testing Platform based on EMVA1288 testing standard, belong to imageing sensor technical field of measurement and test.The test device of the present invention designs based on EMVA1288 standard, and definition and the method for testing of performance parameter are the most rigorous, susceptible to user acceptance and accreditation；The test apparatus structure of the present invention is simple, and testing process is convenient and swift；Assembly of the invention adds temperature control box, it is not necessary to move integrally test device and can change the temperature of cmos image sensor chip to be tested so that the high-temperature behavior test of cmos image sensor to be tested is more convenient.
Description
Technical field
The present invention relates to a kind of cmos image sensor based on FPGA technology test device, particularly one
Plant Testing Platform based on EMVA1288 testing standard, belong to imageing sensor technical field of measurement and test.
Background technology
The performance parameter of cmos image sensor is estimated measuring when typically being produced by manufacturer's design,
Provide representative value, but owing to production technology and semi-conducting material change, user uses imageing sensor
Time actual performance parameter may have certain discrepancy with the representative value provided；It addition, the test of different manufacturers
Method and evaluation criterion are the most not quite identical, when testing standard is different with parameter dimension, it is impossible to different factories
The imageing sensor of family carries out performance comparative evaluation, so before COMS image sensor chip is applied, entering
When contrast between row different model preferentially works with the screening these two of same model, need a unified property
Parameter test system can be tested by chip.
EMVA1288 be EMVA formulate for imageing sensor and the performance test of camera
Standard, has all done clear and definite regulation to test equipment, method of testing, parameter definition etc., has been currently the only
One machine vision class sensor and the generally acknowledged testing standard of camera.Based on this standard, the image of design passes
Sensor Testing Platform, definition and method of testing to the performance parameter of sensor all can be more rigorous, use
Family also can more recognition and acceptance.
Summary of the invention
The invention aims to propose a kind of cmos image sensor based on FPGA technology test dress
Putting, this device is a kind of cmos image sensor test platform based on EMVA1288 standard, can be to general
Time cmos image sensor carry out unified performance test, utilize this device to carry out testing the result obtained
Relatively accurate, this apparatus structure is simple, and test process is convenient and swift.
It is an object of the invention to be achieved through the following technical solutions.
A kind of based on FPGA technology the cmos image sensor test device of the present invention, this device includes
Darkroom, integrating sphere light source, temperature control box, FPGA image acquisition circuit, guide rail, scars cable, PCI gather
Card and host computer；
Described integrating sphere light source has light source light-emitting window；Light inlet is had on temperature control box；
Described temperature control box is placed on the bottom in darkroom, FPGA image acquisition circuit and CMOS to be tested
Imageing sensor is placed in temperature control box, and FPGA image acquisition circuit and cmos image to be tested pass
Sensor is fixed by fixture and is connected and all parallel with the bottom in darkroom；Guide rail is fixed on the top in darkroom；Integration
Ball light source is fixed on guide rail and can be at slide on rails, and the light source light-emitting window of integrating sphere light source passes through temperature control box
On light inlet the most right with cmos image sensor to be tested；The plane of light source light-emitting window is with to be tested
The plane of cmos image sensor is parallel；FPGA image acquisition circuit is by scars cable with host computer even
Connect；PCI capture card it is configured with in host computer；
Darkroom is used for providing bright, the half-light field environment of cmos image sensor performance test to be tested；
Integrating sphere light source is used for providing the uniform light during environment of field, Mingguang City；
Temperature control box is used for controlling the temperature of cmos image sensor to be tested, it is provided that room temperature, high temperature test
Environment；
Under two kinds of light field environment bright, dark, host computer is sent out to FPGA image acquisition circuit according to testing process
Losing one's life order, FPGA image acquisition circuit drives and controls cmos image sensor to be tested according to test
The various light exposures needed in flow process are exposed；FPGA image acquisition circuit combines PCI capture card to be measured
The view data of the cmos image sensor output of examination is acquired, and data are uploaded to host computer, on
Position machine is calculated the test result of performance parameter to the data received；
Described various light exposures are by fixing distribution of light intensity and change time of exposure realization；
The uniform light of the light source light-emitting window output of integrating sphere light source, inhomogeneities is better than 2%, power adjustable, logical
Cross the distance between guide rail regulation integrating sphere light source and cmos image sensor to be tested；
Temperature control box controls the temperature inside the box reach a high temperature environment, when temperature control box does not works by being filled with high-temperature gas
It is normal temperature environment, thus carries out the performance test under room temperature or hot environment, reach without moving integrally
This test device can change the effect of the chip temperature of cmos image sensor to be tested to be measured
The high-temperature behavior test of the cmos image sensor of examination is more convenient；
Described test device is based on EMVA1288 standard.
Beneficial effect
The test device of the present invention designs based on EMVA1288 standard, the definition of performance parameter and test
Method is the most rigorous, susceptible to user acceptance and accreditation；
The test apparatus structure of the present invention is simple, and testing process is convenient and swift；
Assembly of the invention adds temperature control box, it is not necessary to move integrally test device and can change to be tested
The temperature of cmos image sensor chip so that the high-temperature behavior of cmos image sensor to be tested is surveyed
Try more convenient.
Accompanying drawing explanation
Fig. 1 is the structural representation of assembly of the invention.
Detailed description of the invention
The present invention will be further described with embodiment below in conjunction with the accompanying drawings.
Embodiment
A kind of cmos image sensor based on FPGA technology test device, as it is shown in figure 1, this device
Including darkroom 1, integrating sphere light source 2, temperature control box 4, FPGA image acquisition circuit 5, guide rail 6, scars
Cable 7, PCI capture card 9 and host computer 10；
Described integrating sphere light source 2 has light source light-emitting window 3；Light inlet is had on temperature control box 4；
Described temperature control box 4 is placed on the bottom in darkroom 1, FPGA image acquisition circuit 5 and to be tested
Cmos image sensor 8 is placed in temperature control box 4, and FPGA image acquisition circuit 5 and to be tested
Cmos image sensor 8 is fixed by fixture and is connected and all parallel with the bottom in darkroom 1；Guide rail 6 is fixed
Top in darkroom 1；Integrating sphere light source 2 is fixed on guide rail 6 and can slide on guide rail 6, integrating sphere
The light source light-emitting window 3 of light source 2 is by the light inlet on temperature control box 4 and cmos image sensor to be tested
8 is the most right；The plane of light source light-emitting window 3 is parallel with the plane of cmos image sensor 8 to be tested；FPGA
Image acquisition circuit 5 is connected with host computer 10 by scars cable 7；It is configured with PCI in host computer 10 to adopt
Truck 9；
Darkroom 1 is used for providing bright, the half-light field environment of cmos image sensor 8 performance test to be tested；
Integrating sphere light source 2 is used for providing the uniform light during environment of field, Mingguang City；
Temperature control box 4 is used for controlling the temperature of cmos image sensor 8 to be tested, it is provided that room temperature, high temperature
Test environment；
Under two kinds of light field environment bright, dark, host computer according to testing process to FPGA image acquisition circuit 5
Sending order, FPGA image acquisition circuit 5 drives and controls cmos image sensor to be tested 8
It is exposed according to the various light exposures needed in testing process；FPGA image acquisition circuit 5 combines PCI and gathers
The view data of cmos image sensor 8 output to be tested is acquired by card 9, and data is uploaded
To host computer, host computer is calculated the test result of performance parameter to the data received；
Described various light exposures are by fixing distribution of light intensity and change time of exposure realization；
The uniform light of light source light-emitting window 3 output of integrating sphere light source 2, inhomogeneities is better than 2%, power adjustable,
The distance between integrating sphere light source 2 and cmos image sensor 8 to be tested is regulated by guide rail 6；
Temperature control box 4 controls the temperature inside the box reach a high temperature environment by being filled with high-temperature gas, temperature control box 4 not work
As time be normal temperature environment, thus carry out the performance test under room temperature or hot environment, reach without entirety
This test device mobile can change the effect of the chip temperature of cmos image sensor 8 to be tested, makes
The high-temperature behavior test obtaining cmos image sensor 8 to be tested is more convenient；
Described test device is based on EMVA1288 standard.
Described FPGA is the EP3C40Q240C8N model of altera corp Cyclone III series；FPGA
The design of image acquisition circuit 5 includes: the design of the power supply circuits of FPGA, the clock design of FPGA, to be measured
The driving design of cmos image sensor 8 of examination, pci bus interface design.
Claims (9)
1. cmos image sensor based on a FPGA technology test device, it is characterised in that: this dress
Put and include darkroom (1), integrating sphere light source (2), temperature control box (4), FPGA image acquisition circuit (5), lead
Rail (6), scars cable (7) and host computer (10)；Host computer (10) is built-in with PCI capture card (9)；
Described integrating sphere light source (2) has light source light-emitting window 3；Temperature control box has light inlet on (4)；
Described temperature control box (4) is placed on the bottom of darkroom (1), FPGA image acquisition circuit (5) and
Cmos image sensor (8) to be tested is placed in temperature control box (4), and FPGA image acquisition electricity
Road (5) and cmos image sensor (8) to be tested by fixture fixing connect and all with darkroom (1)
Bottom parallel；Guide rail (6) is fixed on the top of darkroom (1)；Integrating sphere light source (2) is fixed on guide rail
(6) going up and above can slide at guide rail (6), the light source light-emitting window 3 of integrating sphere light source (2) passes through temperature control box
(4) light inlet on is the most right with cmos image sensor (8) to be tested；Putting down of light source light-emitting window 3
Face is parallel with the plane of cmos image sensor (8) to be tested；FPGA image acquisition circuit (5)
It is connected with host computer (10) by scars cable (7).
A kind of cmos image sensor based on FPGA technology the most according to claim 1 test dress
Put, it is characterised in that: darkroom (1) is used for providing cmos image sensor (8) performance to be tested to survey
Bright, the half-light field environment of examination.
A kind of cmos image sensor based on FPGA technology the most according to claim 1 test dress
Put, it is characterised in that: integrating sphere light source (2) is used for providing the uniform light during environment of field, Mingguang City.
A kind of cmos image sensor based on FPGA technology the most according to claim 1 test dress
Put, it is characterised in that: temperature control box (4) is used for controlling the temperature of cmos image sensor (8) to be tested
Degree, it is provided that room temperature, high temperature test environment.
A kind of cmos image sensor based on FPGA technology the most according to claim 1 test dress
Put, it is characterised in that: under two kinds of light field environment bright, dark, host computer is schemed to FPGA according to testing process
As Acquisition Circuit (5) sends order, FPGA image acquisition circuit (5) drives and controls CMOS to be tested
Imageing sensor (8) is exposed according to the various light exposures needed in testing process；FPGA image acquisition
Circuit (5) combines the image that cmos image sensor (8) to be tested is exported by PCI capture card (9)
Data are acquired, and data are uploaded to host computer, and the data received are calculated by host computer
The test result of performance parameter.
A kind of cmos image sensor based on FPGA technology the most according to claim 5 test dress
Put, it is characterised in that: various light exposures are by fixing distribution of light intensity and change time of exposure realization.
A kind of cmos image sensor based on FPGA technology the most according to claim 1 test dress
Put, it is characterised in that: the uniform light of light source light-emitting window 3 output of integrating sphere light source (2), inhomogeneities is excellent
In 2%, power adjustable, by guide rail (6) regulation integrating sphere light source (2) and cmos image to be tested
Distance between sensor (8).
A kind of cmos image sensor based on FPGA technology the most according to claim 1 test dress
Put, it is characterised in that: temperature control box (4) controls the temperature inside the box reach a high temperature environment by being filled with high-temperature gas,
Temperature control box (4) is normal temperature environment when not working, thus carries out the performance test under room temperature or hot environment.
A kind of cmos image sensor based on FPGA technology the most according to claim 1 test dress
Put, it is characterised in that: test device is based on EMVA1288 standard.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310714296.9A CN103698682B (en) | 2013-12-20 | 2013-12-20 | A kind of cmos image sensor based on FPGA technology test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310714296.9A CN103698682B (en) | 2013-12-20 | 2013-12-20 | A kind of cmos image sensor based on FPGA technology test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103698682A CN103698682A (en) | 2014-04-02 |
| CN103698682B true CN103698682B (en) | 2016-08-17 |
Family
ID=50360277
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310714296.9A Active CN103698682B (en) | 2013-12-20 | 2013-12-20 | A kind of cmos image sensor based on FPGA technology test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103698682B (en) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105424324B (en) * | 2015-12-17 | 2018-01-30 | 哈尔滨工业大学 | A kind of device for being used to carry out cmos image sensor nonlinear parameter real-time testing |
| CN105865748B (en) * | 2016-05-06 | 2018-07-31 | 哈尔滨工程大学 | A kind of test method of the imaging sensor critical performance parameters based on particle cluster algorithm |
| CN106331697A (en) * | 2016-09-08 | 2017-01-11 | 哈尔滨工程大学 | Image sensor key parameter testing method based on dark field mean value signal |
| CN108366252B (en) * | 2017-01-10 | 2020-07-03 | 青年科技有限公司 | Detection equipment for testing definition of camera |
| CN107133389A (en) * | 2017-04-14 | 2017-09-05 | 中国空间技术研究院 | The Way of Sensor Deployment that structure-oriented health monitoring is optimized based on interval robust |
| CN109186652A (en) * | 2018-07-27 | 2019-01-11 | 上海与德通讯技术有限公司 | The automatic test cabinet and machine to be measured of photosensitive sensors |
| CN109406113A (en) * | 2018-12-23 | 2019-03-01 | 西安远望图像技术有限公司 | A kind of compact optical electrical measurement darkroom |
| CN112055199A (en) * | 2020-09-22 | 2020-12-08 | 中国科学技术大学 | Scientific grade CMOS camera performance test system and method |
| CN112763189A (en) * | 2020-12-24 | 2021-05-07 | 松山湖材料实验室 | Measuring device for EBCMOS resolution parameter |
| CN114040187B (en) * | 2021-09-23 | 2024-02-09 | 北京控制工程研究所 | Method and device suitable for screening and testing image sensor of deep space exploration color camera |
| CN117528066B (en) * | 2024-01-05 | 2024-03-22 | 浙江双元科技股份有限公司 | Linear array camera testing system and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101000881A (en) * | 2006-01-09 | 2007-07-18 | 三星电子株式会社 | Image sensor testing method and apparatus |
| CN102253594A (en) * | 2011-06-21 | 2011-11-23 | 北京凌云光视数字图像技术有限公司 | Platform for testing performance of camera based on EMVA1288 standard |
| CN202334710U (en) * | 2011-11-30 | 2012-07-11 | 北京普利永华科技发展有限公司 | High-speed image acquisition and compression storage system |
-
2013
- 2013-12-20 CN CN201310714296.9A patent/CN103698682B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101000881A (en) * | 2006-01-09 | 2007-07-18 | 三星电子株式会社 | Image sensor testing method and apparatus |
| CN102253594A (en) * | 2011-06-21 | 2011-11-23 | 北京凌云光视数字图像技术有限公司 | Platform for testing performance of camera based on EMVA1288 standard |
| CN202334710U (en) * | 2011-11-30 | 2012-07-11 | 北京普利永华科技发展有限公司 | High-speed image acquisition and compression storage system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103698682A (en) | 2014-04-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103698682B (en) | A kind of cmos image sensor based on FPGA technology test device | |
| CN104204777B (en) | For measuring technique and the device of the crystalline fraction of the single-crystal wafer of silicon metal casting | |
| CN105548775B (en) | A kind of outdoor machine of air-conditioner safety automatic checkout equipment and detection method | |
| CN105973571B (en) | A kind of measuring method of the LED chip macroscopic surface brightness based on CCD | |
| CN105627927B (en) | A kind of Three Dimensions Inspection System | |
| CN104301716A (en) | High definition camera overall characteristic detecting device and method | |
| CN105223520B (en) | A kind of road illuminating lamp on-site test system and method | |
| CN107015134B (en) | A kind of test macro and its application of LED light Electrothermal Properties | |
| CN107238796A (en) | A kind of maintainability test equipment for wiring board | |
| CN201653450U (en) | Digital display meter automatic calibration device based on machine vision | |
| CN205192729U (en) | Synthesize image check out test set suitable for LED car light | |
| CN103592590A (en) | System and method for testing light-electricity-heat integration of LED device | |
| TWI588499B (en) | Method and apparatus for testing light-emitting device | |
| CN103134810A (en) | Automated optical inspection instrument | |
| CN203572635U (en) | Automatic light-distribution detection device through car light image | |
| CN102435219A (en) | Aerospace camera focusing encoder debugging, measurement and control system | |
| CN106441104A (en) | Size measurement system | |
| CN105785302A (en) | State identification apparatus and identification method for board turning device and indication lamp of fault indicator | |
| CN103675680A (en) | Detector and detection method for locomotive motor optical-electricity encoder | |
| Ahmad et al. | Lux meter integrated with internet of things (IoT) and data storage (LMX20) | |
| Jolly et al. | A standalone data logger for fibre optic vibration measurement system using Beaglebone | |
| CN106153308B (en) | Welding mask detection device and detection method thereof | |
| CN103389453A (en) | Photovoltaic conversion chip testing device and method | |
| CN205061228U (en) | Integrated comprehensive tester of elevator inspection | |
| CN207395896U (en) | A kind of luminance sensor detector |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |