CN103675638B - A kind of universal dynamic total dose test device and its implementation - Google Patents
A kind of universal dynamic total dose test device and its implementation Download PDFInfo
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Abstract
The present invention relates to a kind of novel universal dynamic total dose test device, comprise and be positioned at host computer outside radiation chamber and signal transduction system, be positioned at the test vector generation system of radiation chamber, host computer sends the pattern of random vector to signal transduction system, the power supply of Control experiment circuit board, the dynamic bias of monitoring circuit under test, monitors the operation conditions of whole device; Signal transduction system receives the Stochastic choice code that host computer sends, Stochastic choice code is converted to level signal simultaneously and passes to test vector generation system, also receive the feedback signal that test vector generation system is beamed back, for the operation conditions of monitoring and test vector generation system; Test vector generation system acceptance from signal transduction system signal and generate test vector and send to breadboard; This device can realize circuit to be irradiated and be in dynamic bias in irradiation process, thus realizes dynamic total dose test, comprehensively the resistant to total dose performance of examination device.
Description
Technical field
The invention belongs to microelectronic component resistant to total dose ability test verification technique field, relate to a kind of novel universal dynamic total dose test device and its implementation.
Technical background
Along with the fast development of semiconductor technology, characteristic dimension and the operating voltage of device are more and more less, and the effect of total dose effect is also more and more obvious.Found that the serviceability impact of total dose effect on device was more remarkable in the last few years, its damage mode also increasingly complex, if do not know the principle of microelectronic component total dose effect, just correctly cannot assess the capability of resistance to radiation of microelectronic component, when later stage development microelectronic component, the radiation resistance of microelectronic component just effectively cannot be promoted.
The verification experimental verification work of the total dose effect of most radioresistance microelectronic component carries out under quiescent biasing, and the foundation of the anti-Performance Evaluation of the microelectronic component especially needed for Spacecraft guidance and control is ground simulation test result.Ground simulation test can not be completely true to nature, and simulated conditions should reflect the essence of objective phenomenon as much as possible.Therefore, when assessing microelectronic component radiation resistance, just more needing the method taking rigorous and scientific, finding out the impact of total dose effect on device, avoid the impact because other factors cause and misleading results analysis, just need the total dose effect of examination device under dynamic bias.
Summary of the invention
The object of the invention is to the above-mentioned deficiency overcoming prior art, a kind of novel universal dynamic total dose test device is provided, this test unit can be used for realizing dynamic total dose test, the resistant to total dose performance of comprehensive examination device, breaks the situation can only carrying out static total dose response test at present.
Another object of the present invention is the implementation method providing a kind of novel universal dynamic total dose test device.
Above-mentioned purpose of the present invention is mainly achieved by following technical solution:
A kind of novel universal dynamic total dose test device, comprise host computer, signal transduction system and test vector generation system, wherein host computer and signal transduction system are positioned at outside radiation chamber, and test vector generation system is positioned at radiation chamber, circuit to be irradiated is also positioned at radiation chamber, wherein:
Host computer: the control signal of the outside input of reception, generates Stochastic choice code simultaneously, described control signal and Stochastic choice code are exported to signal transduction system, the feedback signal of Received signal strength transmission system output simultaneously;
Signal transduction system: receive described control signal and Stochastic choice code from host computer, described control signal and Stochastic choice code are converted to voltage signal by logic level signal, and described voltage signal is exported to test vector generation system, simultaneously from test vector generation system acceptance feedback signal, and described feedback signal is sent to host computer;
Test vector generation system: the feedback indicator code whether mark test vector generation system is normally run is sent signal transduction system as feedback signal, the Stochastic choice code of Received signal strength transmission system transmission simultaneously and control signal, the random test vector that described Stochastic choice code and test vector generation system generate is carried out with, or, XOR, with or four kinds of computings in any one computing, and operation result is converted to voltage signal by logic level signal, send to circuit to be irradiated, the control simultaneously according to described control signal, test vector generation system started or stoped.
In above-mentioned novel universal dynamic total dose test device, host computer comprises random vector and selects module, slave computer control module, the first High-speed Interface Card and Power Monitoring Unit, wherein:
Random vector selects module: generate Stochastic choice code, and Stochastic choice code is sent to the first High-speed Interface Card;
Slave computer control module: the control signal that outside inputs is sent to the first High-speed Interface Card, receives the feedback signal from the first High-speed Interface Card simultaneously, judge whether test vector generation system is normally run;
First High-speed Interface Card: send to the second High-speed Interface Card by the Stochastic choice code selecting module to receive from random vector with from the control signal that slave computer control module receives; Simultaneously from the second High-speed Interface Card receiving feedback signals;
Power Monitoring Unit: the supply voltage of control signal transmission system, test vector generation system and circuit to be irradiated, and monitor the working current of circuit to be irradiated.
In above-mentioned novel universal dynamic total dose test device, signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller, wherein:
Second High-speed Interface Card: the described Stochastic choice code received from the first High-speed Interface Card and described control signal are sent to CPU, the feedback signal received is exported to the first High-speed Interface Card simultaneously from CPU;
CPU: receive the Stochastic choice code and control signal that export from the second High-speed Interface Card, receive the feedback signal that the first feedback module exports simultaneously, carry out signal and export judgement, described Stochastic choice code and control signal are exported to random code output module, described feedback signal is exported to the second High-speed Interface Card;
Random code output module: the Stochastic choice code received from CPU and control signal are transmitted to the first level conversion Multi Channel Controller;
First feedback module: receive the feedback signal of test vector generation system output and send to CPU;
First level conversion Multi Channel Controller: the Stochastic choice code received from random code output module and control signal are converted to voltage signal by logic level signal, and described voltage signal is exported to test vector generation system.
In above-mentioned novel universal dynamic total dose test device, test vector generation system comprises second electrical level conversion Multi Channel Controller, a n three level conversion Multi Channel Controller, generating random vector module, starts stopping modular, random code reception judge module, the second feedback module and test vector output module, wherein:
Second electrical level conversion Multi Channel Controller: receive the feedback indicator code that the second feedback module exports, feedback indicator code represents with logic level signal form, and described logic level signal is converted to voltage signal exports to signal transduction system;
Second feedback module: whether normal according to test vector generation system cloud gray model, generates corresponding feedback indicator code, and is sent to by described feedback indicator code second electrical level to change Multi Channel Controller;
Generating random vector module: generate random test vector and send to test vector output module;
Random code receives judge module: receive the Stochastic choice code being converted to voltage signal coming from signal transduction system and export, and send to test vector output module;
Start stopping modular: the control signal being converted to voltage signal that Received signal strength transmission system exports, to the control that test vector generation system starts or stops;
Test vector output module: receive random code and receive the Stochastic choice code of judge module output and the random test vector of generating random vector module output, described Stochastic choice code and described random test vector are carried out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to simultaneously n three level conversion Multi Channel Controller;
Three level conversion Multi Channel Controller: receive the operation result that test vector output module exports, and the logic level signal of operation result is converted to voltage signal, send to circuit to be irradiated;
Wherein n is positive integer, and n >=3.
In above-mentioned novel universal dynamic total dose test device, first, second, third level conversion Multi Channel Controller structure is identical, the multiple two-way selector switch comprising level transferring chip and be connected with level transferring chip, wherein each two-way selector switch is composed in series by relay, VCC, pull-up resistor R1 and pull down resistor R2, is realized the selection of low and high level by the folding of pilot relay; Level transferring chip is for the protection of FPGA and the relay driving different operating voltage.
In above-mentioned novel universal dynamic total dose test device, test vector generation system is positioned in radiation shield protection box, avoids integral dose radiation to the destruction of test vector generation system.
A kind of implementation method of novel universal dynamic total dose test device, comprise test vector generation process and signal feedback process, wherein universal dynamic total dose test device comprises host computer, signal transduction system and test vector generation system, and wherein host computer comprises random vector selection module, slave computer control module and the first High-speed Interface Card; Signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller; Test vector generation system comprises second electrical level conversion Multi Channel Controller, a n three level conversion Multi Channel Controller, generating random vector module, starts stopping modular, random code reception judge module, the second feedback module and test vector output module;
Test vector generation process comprises the steps:
(1), external control signal sends to slave computer control module, start test vector generation process, random vector selects CMOS macro cell Stochastic choice code, and Stochastic choice code is sent to the first High-speed Interface Card, the control signal that outside inputs is sent to the first High-speed Interface Card by slave computer control module;
(2), the first High-speed Interface Card sends to the second High-speed Interface Card by the Stochastic choice code selecting module to receive from random vector with from the control signal that slave computer control module receives;
(3), the described Stochastic choice code received and described control signal are sent to CPU by the second High-speed Interface Card; CPU receives the Stochastic choice code and control signal that export from the second High-speed Interface Card, receives the feedback signal that the first feedback module exports simultaneously, carries out signal and exports judgement, described Stochastic choice code and control signal are exported to random code output module;
(4), the Stochastic choice code received from CPU and control signal are transmitted to the first level conversion Multi Channel Controller by random code output module;
(5), start the control signal being converted to voltage signal that stopping modular receives the first level conversion Multi Channel Controller output, test vector generation system is started;
(6), generating random vector CMOS macro cell random test vector send to test vector output module; Random code receives judge module and receives the Stochastic choice code being converted to voltage signal coming from the first level conversion Multi Channel Controller and export, and sends to test vector output module;
(7), test vector output module receives random code and receives the Stochastic choice code of judge module output and the random test vector of generating random vector module output, described Stochastic choice code and described random test vector are carried out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to simultaneously n three level conversion Multi Channel Controller;
(8), three level conversion Multi Channel Controller receives the operation result that test vector output module exports, and the logic level signal of operation result is converted to voltage signal, sends to circuit to be irradiated.
Signal feedback process comprises the steps:
(1), whether the second feedback module normal according to test vector generation system cloud gray model, generates corresponding feedback indicator code, and sent to by described feedback indicator code second electrical level to change Multi Channel Controller;
(2), the first feedback module receives the feedback indicator code of second electrical level conversion Multi Channel Controller output and sends to CPU;
(3) described feedback indicator code is sent to the first High-speed Interface Card through the second High-speed Interface Card by CPU;
(4) the feedback indicator code that slave computer control module receives from the first High-speed Interface Card carries out judging whether test vector generation system is normally run.
The present invention compared with prior art has following beneficial effect:
(1) the present invention adopts the universal dynamic total dose test device of innovative design, comprise host computer, signal transduction system and test vector generation system, host computer and signal transduction system are positioned at outside radiation chamber, test vector generation system is positioned at radiation chamber, circuit to be irradiated is also positioned at radiation chamber, this device can realize circuit to be irradiated and be in dynamic bias in irradiation process, thus realize dynamic total dose test, the resistant to total dose performance of comprehensive examination device, breaks the situation can only carrying out static total dose response test at present;
(2) logical signal is converted to level signal by level conversion Multi Channel Controller by universal dynamic total dose test device of the present invention, overcomes the problem of signal Long line transmission;
(3) universal dynamic total dose test device of the present invention has good versatility, if generate static test vector, can meet the test of static accumulated dose, is equivalent to the test of sound state accumulated dose to combine; Change the magnitude of voltage of VCC in two-way selector switch, the accumulated dose test of different operating potential circuit can be met; The work clock applied to circuit under test is variable, can meet the test of different operating clock circuit; Apply test vector can to the circuit of two different operating voltage and frequency of operation simultaneously, therefore, it is possible to effectively to detect and the total dose effect assessing device affects, meet many moneys circuit and carry out dynamic total dose test simultaneously, have higher test efficiency;
(4) implementation method of universal dynamic total dose test device of the present invention comprises test vector generation process and signal feedback process, the dynamic total dose test of test vector generation process implementation circuit to be irradiated, signal feedback process monitoring is positioned at radiation chamber build-in test vector generation system running status, if normal, continue to run, otherwise out of service, ensure that the normal operation of whole system.
Accompanying drawing explanation
Fig. 1 is universal dynamic total dose test device structural representation of the present invention;
Fig. 2 is level conversion Multi Channel Controller structural representation of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail:
Be illustrated in figure 1 universal dynamic total dose test device structural representation of the present invention, universal dynamic total dose test device of the present invention comprises host computer, signal transduction system and test vector generation system as seen from the figure, wherein host computer and signal transduction system are positioned at outside radiation chamber, and test vector generation system and circuit to be irradiated are positioned at radiation chamber.
Host computer mainly sends the pattern of random vector to signal transduction system, the power supply of Control experiment circuit board, and the dynamic bias of monitoring circuit under test, monitors the operation conditions of whole device; The information that signal transduction system mainly receives host computer transmission produces one group of random vector, this group random vector is converted to voltage signal simultaneously and passes to test vector generation system, signal transduction system can also receive the information that test vector generation system is beamed back in addition, for the operation conditions of monitoring and test vector generation system; Test vector generation system is placed in radiation shield protection box, avoids it be subject to integral dose radiation and be destroyed, and its primary responsibility receives the signal from signal transduction system and generates test vector and sends to breadboard; The outer wall of radiation shield protection box is connected to ring flange, signal transduction system, test vector generation system, breadboard can be coupled together, realize the transmission of signal; Circuit to be irradiated is placed on breadboard, and breadboard is placed in radiation chamber and carries out irradiation test.
In process of the test, the power supply of signal transduction system, test vector generation system and breadboard provides by PC control Power Monitoring Unit.Power Monitoring Unit has measures the function of electric current, can monitor the working current of device to be irradiated in irradiation process and beam back host computer and carry out showing and preserving.Therefore, multimeter or reometer can be saved in the process of device enforcement.
As shown in Figure 1, host computer specifically comprises random vector selection module, slave computer control module, the first High-speed Interface Card and Power Monitoring Unit.Host computer finishing man-machine interaction function, is responsible for the control signal of the outside input of reception, generates Stochastic choice code simultaneously, described control signal and Stochastic choice code are exported to signal transduction system, the feedback signal of Received signal strength transmission system output simultaneously.The concrete function of each module is as follows:
Random vector selects CMOS macro cell Stochastic choice code, and Stochastic choice code is sent to the first High-speed Interface Card.
The control signal that outside inputs is sent to the first High-speed Interface Card by slave computer control module, receives the feedback signal from the first High-speed Interface Card simultaneously, judges whether test vector generation system is normally run.
First High-speed Interface Card sends to the second High-speed Interface Card by the Stochastic choice code selecting module to receive from random vector with from the control signal that slave computer control module receives; Simultaneously from the second High-speed Interface Card receiving feedback signals.
The supply voltage of Power Monitoring Unit control signal transmission system, test vector generation system and circuit to be irradiated, and monitor the working current of circuit to be irradiated.
As shown in Figure 1, signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller.Signal transduction system is primarily of FPGA and bypass circuit composition thereof, be responsible for from host computer reception control signal and Stochastic choice code, control signal and Stochastic choice code are converted to voltage signal by logic level signal, and voltage signal is passed to test vector generation system via the long lead of 30 meters, simultaneously from test vector generation system acceptance feedback signal, and feedback signal is sent to host computer, be convenient to testing crew in the state of radiation chamber external monitor whole system in total dose irradiation process of the test.The concrete function of each module is as follows:
The described Stochastic choice code received from the first High-speed Interface Card and described control signal are sent to CPU by the second High-speed Interface Card, the feedback signal received are exported to the first High-speed Interface Card from CPU simultaneously.
CPU receives the Stochastic choice code and control signal that export from the second High-speed Interface Card, receive the feedback signal that the first feedback module exports simultaneously, carry out signal and export judgement, described Stochastic choice code and control signal are exported to random code output module, described feedback signal is exported to the second High-speed Interface Card.
The Stochastic choice code received from CPU and control signal are transmitted to the first level conversion Multi Channel Controller by random code output module.
First feedback module receives the feedback signal of test vector generation system output and sends to CPU.
The Stochastic choice code received from random code output module and control signal are converted to voltage signal by logic level signal by the first level conversion Multi Channel Controller, and described voltage signal is exported to test vector generation system.
As shown in Figure 1, test vector generation system comprises second electrical level conversion Multi Channel Controller, a n three level conversion Multi Channel Controller, generating random vector module, starts stopping modular, random code reception judge module, the second feedback module and test vector output module.The feedback indicator code that test vector generation system is responsible for whether mark test vector generation system is normally run sends signal transduction system as feedback signal, the Stochastic choice code of Received signal strength transmission system transmission simultaneously and control signal, the random test vector that Stochastic choice code and test vector generation system generate is carried out with, or, XOR, with or four kinds of computings in any one computing, and operation result is converted to voltage signal by logic level signal, send to circuit to be irradiated, the control simultaneously according to control signal, test vector generation system started or stoped.The concrete function of each module is as follows:
Second electrical level conversion Multi Channel Controller receives the feedback indicator code that the second feedback module exports, and feedback indicator code represents with logic level signal form, and described logic level signal is converted to voltage signal exports to signal transduction system.
Whether the second feedback module is normal according to test vector generation system cloud gray model, generates corresponding feedback indicator code, and sent to by described feedback indicator code second electrical level to change Multi Channel Controller.
Generating random vector CMOS macro cell random test vector also sends to test vector output module.
Random code receives judge module and receives the Stochastic choice code being converted to voltage signal coming from signal transduction system and export, and sends to test vector output module.
Start the control signal being converted to voltage signal that stopping modular Received signal strength transmission system exports, to the control that test vector generation system starts or stops.
Test vector output module receives random code and receives the Stochastic choice code of judge module output and the random test vector of generating random vector module output, Stochastic choice code and random test vector are carried out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to simultaneously n three level conversion Multi Channel Controller.
Three level conversion Multi Channel Controller receives the operation result that test vector output module exports, and the logic level signal of operation result is converted to voltage signal, sends to circuit to be irradiated.
Wherein n is positive integer, and n >=2.
Breadboard, for carrying circuit to be irradiated, the signal pin of circuit to be irradiated is drawn by breadboard, to be connected and to receive random test vector, complete the dynamic bias of circuit to be irradiated by interface with test vector generation system.
Be illustrated in figure 2 level conversion Multi Channel Controller structural representation of the present invention, the present invention first, second, third level conversion Multi Channel Controller structure is identical, the multiple two-way selector switch comprising level transferring chip and be connected with level transferring chip, its implementation has the following aspects:
(1) two-way selector switch: be composed in series by relay, VCC, pull-up resistor R1 and pull down resistor R2.What level VCC shown in Fig. 2 can take over, and this just makes this system can meet the test of the circuit of different operating voltage.The selection of low and high level is realized by the folding of pilot relay.
(2) level transferring chip: for the protection of FPGA and the relay driving different operating voltage.
(3) the IO port of FPGA reaches 160, these IO ports can be divided into 4 groups, be also divided into four groups (as 3.3V, 1.8V, 5V, 2.5V etc.) by relay simultaneously according to different VCC power supplys.So just can meet the dynamic total dose test test of 4 sections of single supplies or 2 sections of dual power supplies simultaneously.
The implementation method of the universal dynamic total dose test device that the present invention is novel, comprises test vector generation process and signal feedback process, wherein:
Test vector generation process comprises the steps:
(1), external control signal sends to slave computer control module, start test vector generation process, random vector selects CMOS macro cell Stochastic choice code, and Stochastic choice code is sent to the first High-speed Interface Card, the control signal that outside inputs is sent to the first High-speed Interface Card by slave computer control module;
(2), the first High-speed Interface Card sends to the second High-speed Interface Card by the Stochastic choice code selecting module to receive from random vector with from the control signal that slave computer control module receives;
(3), the described Stochastic choice code received and described control signal are sent to CPU by the second High-speed Interface Card; CPU receives the Stochastic choice code and control signal that export from the second High-speed Interface Card, receives the feedback signal that the first feedback module exports simultaneously, carries out signal and exports judgement, described Stochastic choice code and control signal are exported to random code output module;
(4), the Stochastic choice code received from CPU and control signal are transmitted to the first level conversion Multi Channel Controller by random code output module;
(5), start the control signal being converted to voltage signal that stopping modular receives the first level conversion Multi Channel Controller output, test vector generation system is started;
(6), generating random vector CMOS macro cell random test vector send to test vector output module; Random code receives judge module and receives the Stochastic choice code being converted to voltage signal coming from the first level conversion Multi Channel Controller and export, and sends to test vector output module;
(7), test vector output module receives random code and receives the Stochastic choice code of judge module output and the random test vector of generating random vector module output, described Stochastic choice code and described random test vector are carried out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to simultaneously n three level conversion Multi Channel Controller.
Such as: host computer stochastic generation option code, scope is between 0 ~ 3.The vector of 0 ~ 3 difference corresponding a group 32, its pattern is as follows respectively:
As host computer sends 1, the vector that test vector generation system stochastic generation is one group 32 and with the vector 01010101010101010101010101010101 received (namely 1 corresponding the vector of 32) carry out with or, XOR, with or four kinds of computings in any one computing, one group of random code can be generated.
(8), three level conversion Multi Channel Controller receives the operation result that test vector output module exports, and the logic level signal of operation result is converted to voltage signal, sent to the circuit to be irradiated on breadboard by ring flange.
Test vector generation system generates counting assembly in the course of the work in 1S, and the scope of counting is 0 ~ 3.After generating counting, this number is uploaded to host computer via signal transduction system, if be not 0 ~ 3 to replace from the change of this counting of host computer monitoring, then illustrate that the duty of test vector generation system occurs abnormal, needs are debugged.
Signal feedback process comprises the steps:
(1), whether the second feedback module normal according to test vector generation system cloud gray model, generates corresponding feedback indicator code, and sent to by described feedback indicator code second electrical level to change Multi Channel Controller;
(2), the first feedback module receives the feedback indicator code of second electrical level conversion Multi Channel Controller output and sends to CPU;
(3), described feedback indicator code is sent to the first High-speed Interface Card through the second High-speed Interface Card by CPU;
(4) the feedback indicator code that, slave computer control module receives from the first High-speed Interface Card carries out judging whether test vector generation system is normally run.
Produced the break-make of one group of random signal pilot relay in total dose test device general in the present invention by FPGA, thus the level signal constantly producing 0 or 1 is to I/O port corresponding to circuit under test, makes device be in dynamic bias condition; Host computer can control the duty of whole test unit, and the working current of device under test is preserved in monitoring, for analyzing the resistant to total dose performance of device under dynamic bias condition.
The above; be only the embodiment of the best of the present invention, but protection scope of the present invention is not limited thereto, is anyly familiar with those skilled in the art in the technical scope that the present invention discloses; the change that can expect easily or replacement, all should be encompassed within protection scope of the present invention.
The content be not described in detail in instructions of the present invention belongs to the known technology of professional and technical personnel in the field.
Claims (7)
1. a universal dynamic total dose test device, it is characterized in that: comprise host computer, signal transduction system and test vector generation system, wherein host computer and signal transduction system are positioned at outside radiation chamber, test vector generation system is positioned at radiation chamber, circuit to be irradiated is also positioned at radiation chamber, wherein:
Host computer: the control signal of the outside input of reception, generates Stochastic choice code simultaneously, described control signal and Stochastic choice code are exported to signal transduction system, the feedback signal of Received signal strength transmission system output simultaneously;
Signal transduction system: receive described control signal and Stochastic choice code from host computer, described control signal and Stochastic choice code are converted to voltage signal by logic level signal, and described voltage signal is exported to test vector generation system, simultaneously from test vector generation system acceptance feedback signal, and described feedback signal is sent to host computer;
Test vector generation system: the feedback indicator code whether mark test vector generation system is normally run is sent signal transduction system as feedback signal, the Stochastic choice code of Received signal strength transmission system transmission simultaneously and control signal, the random test vector that described Stochastic choice code and test vector generation system generate is carried out with, or, XOR, with or four kinds of computings in any one computing, and operation result is converted to voltage signal by logic level signal, send to circuit to be irradiated, the control simultaneously according to described control signal, test vector generation system started or stoped.
2. a kind of universal dynamic total dose test device according to claim 1, is characterized in that: described host computer comprises random vector and selects module, slave computer control module, the first High-speed Interface Card and Power Monitoring Unit, wherein:
Random vector selects module: generate Stochastic choice code, and Stochastic choice code is sent to the first High-speed Interface Card;
Slave computer control module: the control signal that outside inputs is sent to the first High-speed Interface Card, receives the feedback signal from the first High-speed Interface Card simultaneously, judge whether test vector generation system is normally run;
First High-speed Interface Card: send to the second High-speed Interface Card by the Stochastic choice code selecting module to receive from random vector with from the control signal that slave computer control module receives; Simultaneously from the second High-speed Interface Card receiving feedback signals;
Power Monitoring Unit: the supply voltage of control signal transmission system, test vector generation system and circuit to be irradiated, and monitor the working current of circuit to be irradiated;
Described signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller, wherein:
Second High-speed Interface Card: the described Stochastic choice code received from the first High-speed Interface Card and described control signal are sent to CPU, the feedback signal received is exported to the first High-speed Interface Card simultaneously from CPU;
CPU: receive the Stochastic choice code and control signal that export from the second High-speed Interface Card, receive the feedback signal that the first feedback module exports simultaneously, carry out signal and export judgement, described Stochastic choice code and control signal are exported to random code output module, described feedback signal is exported to the second High-speed Interface Card;
Random code output module: the Stochastic choice code received from CPU and control signal are transmitted to the first level conversion Multi Channel Controller;
First feedback module: receive the feedback signal of test vector generation system output and send to CPU;
First level conversion Multi Channel Controller: the Stochastic choice code received from random code output module and control signal are converted to voltage signal by logic level signal, and described voltage signal is exported to test vector generation system.
3. a kind of universal dynamic total dose test device according to claim 1, it is characterized in that: described test vector generation system comprises second electrical level conversion Multi Channel Controller, a n three level conversion Multi Channel Controller, generating random vector module, starts stopping modular, random code reception judge module, the second feedback module and test vector output module, wherein:
Second electrical level conversion Multi Channel Controller: receive the feedback indicator code that the second feedback module exports, feedback indicator code represents with logic level signal form, and described logic level signal is converted to voltage signal exports to signal transduction system;
Second feedback module: whether normal according to test vector generation system cloud gray model, generates corresponding feedback indicator code, and is sent to by described feedback indicator code second electrical level to change Multi Channel Controller;
Generating random vector module: generate random test vector and send to test vector output module;
Random code receives judge module: receive the Stochastic choice code being converted to voltage signal coming from signal transduction system and export, and send to test vector output module;
Start stopping modular: the control signal being converted to voltage signal that Received signal strength transmission system exports, to the control that test vector generation system starts or stops;
Test vector output module: receive random code and receive the Stochastic choice code of judge module output and the random test vector of generating random vector module output, described Stochastic choice code and described random test vector are carried out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to simultaneously n three level conversion Multi Channel Controller;
Three level conversion Multi Channel Controller: receive the operation result that test vector output module exports, and the logic level signal of operation result is converted to voltage signal, send to circuit to be irradiated;
Wherein n is positive integer, and n >=3.
4. a kind of universal dynamic total dose test device according to claim 2, it is characterized in that: multiple two-way selector switch that described first level conversion Multi Channel Controller comprises level transferring chip and is connected with level transferring chip, wherein each two-way selector switch is composed in series by relay, VCC, pull-up resistor R1 and pull down resistor R2, is realized the selection of low and high level by the folding of pilot relay; Level transferring chip is for the protection of FPGA and the relay driving different operating voltage.
5. a kind of universal dynamic total dose test device according to claim 3, it is characterized in that: second, third level conversion Multi Channel Controller structure described is identical, the multiple two-way selector switch comprising level transferring chip and be connected with level transferring chip, wherein each two-way selector switch is composed in series by relay, VCC, pull-up resistor R1 and pull down resistor R2, is realized the selection of low and high level by the folding of pilot relay; Level transferring chip is for the protection of FPGA and the relay driving different operating voltage.
6. a kind of universal dynamic total dose test device according to the arbitrary claim of claims 1 to 3, is characterized in that: described test vector generation system is positioned in radiation shield protection box, avoids integral dose radiation to the destruction of test vector generation system.
7. the implementation method of a universal dynamic total dose test device, it is characterized in that: comprise test vector generation process and signal feedback process, wherein universal dynamic total dose test device comprises host computer, signal transduction system and test vector generation system, and wherein host computer comprises random vector selection module, slave computer control module and the first High-speed Interface Card; Signal transduction system comprises the second High-speed Interface Card, CPU, random code output module, the first feedback module and level conversion Multi Channel Controller; Test vector generation system comprises second electrical level conversion Multi Channel Controller, a n three level conversion Multi Channel Controller, generating random vector module, starts stopping modular, random code reception judge module, the second feedback module and test vector output module; Wherein n is positive integer, and n >=3;
Test vector generation process comprises the steps:
(1), external control signal sends to slave computer control module, start test vector generation process, random vector selects CMOS macro cell Stochastic choice code, and Stochastic choice code is sent to the first High-speed Interface Card, the control signal that outside inputs is sent to the first High-speed Interface Card by slave computer control module;
(2), the first High-speed Interface Card sends to the second High-speed Interface Card by the Stochastic choice code selecting module to receive from random vector with from the control signal that slave computer control module receives;
(3), the described Stochastic choice code received and described control signal are sent to CPU by the second High-speed Interface Card; CPU receives the Stochastic choice code and control signal that export from the second High-speed Interface Card, receives the feedback signal that the first feedback module exports simultaneously, carries out signal and exports judgement, described Stochastic choice code and control signal are exported to random code output module;
(4), the Stochastic choice code received from CPU and control signal are transmitted to the first level conversion Multi Channel Controller by random code output module;
(5), start the control signal being converted to voltage signal that stopping modular receives the first level conversion Multi Channel Controller output, test vector generation system is started;
(6), generating random vector CMOS macro cell random test vector send to test vector output module; Random code receives judge module and receives the Stochastic choice code being converted to voltage signal coming from the first level conversion Multi Channel Controller and export, and sends to test vector output module;
(7), test vector output module receives random code and receives the Stochastic choice code of judge module output and the random test vector of generating random vector module output, described Stochastic choice code and described random test vector are carried out with or, XOR, with or four kinds of computings in any one computing, and operation result is sent to simultaneously n three level conversion Multi Channel Controller;
(8), three level conversion Multi Channel Controller receives the operation result that test vector output module exports, and the logic level signal of operation result is converted to voltage signal, sends to circuit to be irradiated;
Signal feedback process comprises the steps:
(1), whether the second feedback module normal according to test vector generation system cloud gray model, generates corresponding feedback indicator code, and sent to by described feedback indicator code second electrical level to change Multi Channel Controller;
(2), the first feedback module receives the feedback indicator code of second electrical level conversion Multi Channel Controller output and sends to CPU;
(3) described feedback indicator code is sent to the first High-speed Interface Card through the second High-speed Interface Card by CPU;
(4) the feedback indicator code that slave computer control module receives from the first High-speed Interface Card carries out judging whether test vector generation system is normally run.
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| CN107144776B (en) * | 2017-04-17 | 2019-10-08 | 深圳先进技术研究院 | A kind of detection method and device of total dose effect |
| CN108957283B (en) * | 2017-05-19 | 2021-08-03 | 龙芯中科技术股份有限公司 | Irradiation experiment board, monitoring terminal and ASIC chip irradiation experiment system |
| CN111739574B (en) * | 2020-06-05 | 2022-08-05 | 北京时代民芯科技有限公司 | Static Random Access Memory (SRAM) verification method based on random binary sequence |
| CN113376676B (en) * | 2021-06-07 | 2022-06-14 | 苏州大学 | Unmanned aerial vehicle nuclear radiation resistance performance evaluation method and system with customized positioning information |
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