CN103547912B - 自动分析装置 - Google Patents

自动分析装置 Download PDF

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Publication number
CN103547912B
CN103547912B CN201280022967.9A CN201280022967A CN103547912B CN 103547912 B CN103547912 B CN 103547912B CN 201280022967 A CN201280022967 A CN 201280022967A CN 103547912 B CN103547912 B CN 103547912B
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CN
China
Prior art keywords
mentioned
light
course
receiving device
reaction data
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Active
Application number
CN201280022967.9A
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English (en)
Chinese (zh)
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CN103547912A (zh
Inventor
足立作一郎
三村智宪
山崎创
芝正树
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Hitachi Ltd
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Hitachi Ltd
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Publication of CN103547912A publication Critical patent/CN103547912A/zh
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Publication of CN103547912B publication Critical patent/CN103547912B/zh
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/82Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a precipitate or turbidity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4711Multiangle measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0439Rotary sample carriers, i.e. carousels
    • G01N2035/0453Multiple carousels working in parallel

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201280022967.9A 2011-05-13 2012-05-09 自动分析装置 Active CN103547912B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011107837A JP5822534B2 (ja) 2011-05-13 2011-05-13 自動分析装置
JP2011-107837 2011-05-13
PCT/JP2012/003018 WO2012157206A1 (ja) 2011-05-13 2012-05-09 自動分析装置

Publications (2)

Publication Number Publication Date
CN103547912A CN103547912A (zh) 2014-01-29
CN103547912B true CN103547912B (zh) 2015-11-25

Family

ID=47176558

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280022967.9A Active CN103547912B (zh) 2011-05-13 2012-05-09 自动分析装置

Country Status (5)

Country Link
US (1) US9645160B2 (https=)
EP (1) EP2708873B1 (https=)
JP (1) JP5822534B2 (https=)
CN (1) CN103547912B (https=)
WO (1) WO2012157206A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5948173B2 (ja) * 2012-07-20 2016-07-06 株式会社日立ハイテクノロジーズ 自動分析装置及び自動分析方法
JP6138564B2 (ja) * 2013-04-18 2017-05-31 株式会社日立ハイテクノロジーズ 自動分析装置
JPWO2014192963A1 (ja) 2013-05-31 2017-02-23 積水メディカル株式会社 免疫凝集測定法
JP6730196B2 (ja) * 2014-05-21 2020-07-29 ソシエテ・デ・プロデュイ・ネスレ・エス・アー 個人向けの栄養素含有量を有する栄養組成物を製造するためのシステム、方法、及び装置
US10976333B2 (en) * 2016-07-19 2021-04-13 Hitachi High-Tech Corporation Automatic analysis device and automatic analysis method
KR102924915B1 (ko) * 2020-03-30 2026-02-10 덴카 주식회사 라텍스 응집법에 의한 목적 물질의 측정 방법 및 그 시약

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4401387A (en) * 1978-05-19 1983-08-30 Hitachi, Ltd. Nephelometric immunoassay and nephelometer
US4766083A (en) * 1982-04-04 1988-08-23 Wako Pure Chemical Industries, Ltd. Method for the photometric determination of biological agglutination
JP2001141654A (ja) * 1999-10-08 2001-05-25 Dade Behring Marburg Gmbh 分光光度・比濁検出ユニット
WO2011004781A1 (ja) * 2009-07-10 2011-01-13 株式会社日立ハイテクノロジーズ 自動分析装置

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JPS5782769A (en) 1980-11-10 1982-05-24 Hitachi Ltd Automatic analyzing device
JPS58172537A (ja) * 1982-04-04 1983-10-11 Wako Pure Chem Ind Ltd 光散乱測定装置
JPH0359123U (https=) * 1989-10-06 1991-06-11
JP3059123U (ja) * 1998-11-16 1999-07-02 日機装株式会社 粒度分布測定装置
US6798508B2 (en) * 2002-08-23 2004-09-28 Coulter International Corp. Fiber optic apparatus for detecting light scatter to differentiate blood cells and the like
GB0307756D0 (en) * 2003-04-03 2003-05-07 Suisse Electronique Microtech Measuring the concentration and motility of light scattering particles
US7239386B2 (en) * 2004-08-17 2007-07-03 The Regents Of The University Of California Compact imaging spectrometer utilizing immersed gratings
CN103941027B (zh) * 2005-03-29 2016-09-07 希森美康株式会社 标本分析方法及标本分析装置
WO2006103920A1 (ja) * 2005-03-29 2006-10-05 Sysmex Corporation 癌・異型細胞および凝集粒子を弁別する方法および細胞分析装置
US20120120385A1 (en) * 2006-06-27 2012-05-17 Jian-Ping Jiang Pathogen detection by simultaneous size/fluorescence measurement
JP2008064594A (ja) * 2006-09-07 2008-03-21 Yokogawa Electric Corp 濁度計
MX2009005630A (es) * 2006-11-29 2009-08-07 Celsius S A Lab Metodo para analizar datos de imagenes relacionados con ensayos de aglutinacion.
JP2008216054A (ja) * 2007-03-05 2008-09-18 Hitachi High-Technologies Corp 被検査物の検査装置及び被検査物の検査方法
US7808641B2 (en) * 2007-04-13 2010-10-05 C Technologies Inc. Interactive variable pathlength device
WO2009017721A2 (en) * 2007-07-28 2009-02-05 Buglab Llc Particle sensor with wide linear range
EP2522982B1 (en) * 2007-08-15 2015-09-16 Malvern Instruments Limited Broad-Range Spectrometer
DE102008018592A1 (de) * 2008-04-11 2009-10-15 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Verfahren und Vorrichtung zur Trübungsmessung
JP2009281930A (ja) * 2008-05-23 2009-12-03 Yokogawa Electric Corp 粒子濃度測定装置
CA2728833C (en) * 2008-07-04 2018-02-27 Canadian Blood Services Dynamic light scattering for in vitro testing of bodily fluids
JP5319696B2 (ja) * 2008-11-17 2013-10-16 株式会社日立ハイテクノロジーズ 自動分析装置
US8506799B2 (en) * 2009-09-09 2013-08-13 ClearCorp Suspended particle characterization system for a water processing facility
CN102640004B (zh) * 2009-12-04 2015-04-15 株式会社日立高新技术 血液凝固分析装置
DE102010002420A1 (de) * 2010-02-26 2011-09-01 Robert Bosch Gmbh Verfahren und Vorrichtung zur Bestimmung der Qualität der Messergebnisse eines Streulichtmessgerätes
CN103026232B (zh) * 2010-03-01 2015-02-04 匡特里克斯公司 扩大用于检测分子或颗粒的测定法中的动态范围的方法和系统
JP5296015B2 (ja) * 2010-06-22 2013-09-25 株式会社日立ハイテクノロジーズ 自動分析装置
US8681215B2 (en) * 2011-04-29 2014-03-25 ProteinSimple Method and particle analyzer for determining a broad particle size distribution
US20120287435A1 (en) * 2011-05-12 2012-11-15 Jmar Llc Automatic dilution for multiple angle light scattering (mals) instrument
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Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4401387A (en) * 1978-05-19 1983-08-30 Hitachi, Ltd. Nephelometric immunoassay and nephelometer
US4766083A (en) * 1982-04-04 1988-08-23 Wako Pure Chemical Industries, Ltd. Method for the photometric determination of biological agglutination
JP2001141654A (ja) * 1999-10-08 2001-05-25 Dade Behring Marburg Gmbh 分光光度・比濁検出ユニット
WO2011004781A1 (ja) * 2009-07-10 2011-01-13 株式会社日立ハイテクノロジーズ 自動分析装置

Also Published As

Publication number Publication date
EP2708873A1 (en) 2014-03-19
JP2012237691A (ja) 2012-12-06
US20140140890A1 (en) 2014-05-22
EP2708873B1 (en) 2019-06-19
EP2708873A4 (en) 2014-10-08
CN103547912A (zh) 2014-01-29
WO2012157206A1 (ja) 2012-11-22
JP5822534B2 (ja) 2015-11-24
US9645160B2 (en) 2017-05-09

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