Summary of the invention
The invention provides the method and system that a kind of Heat Tolerance of Wheat Cultivars detects, the cycle that Heat Tolerance of Wheat Cultivars detects can be reduced.
On the one hand, the invention provides a kind of method that Heat Tolerance of Wheat Cultivars detects, described method comprises:
Tested wheat is divided into the wheat of thermal treatment group and the wheat of non-heat treated group;
The wheat of thermal treatment group is heat-treated;
Utilize ion current detection system to carry out ion current to the detection with ion concentration to the ion of the same race of the wheat of the thermal treatment group after the wheat of the non-heat treated group of not heat-treating and thermal treatment respectively, obtain the first ion current respectively to, the first ion concentration and the second ion current to, the second ion concentration;
According to the first ion concentration detected, calculate the first ion flow velocity of the ion of the wheat of the non-heat treated group of not heat-treating;
According to the second ion concentration detected, calculate the second ion flow velocity of the ion of the wheat of the thermal treatment group after thermal treatment;
According to the first ion flow velocity and the first ion current to and the second ion flow velocity and the second ion current to, detect the thermotolerance of wheat.
Further, the ion of described tested wheat comprises: K
+and/or Ca
2+;
And/or,
Described tested wheat comprises: wheat seedling.
Further, the described wheat to thermal treatment group is heat-treated and is comprised:
To the wheat of thermal treatment group at the temperature of 35 DEG C to 45 DEG C, carry out high temperature stress 1 to 24 hour.
Further, utilize ion current detection system to carry out ion current to before the detection with ion concentration to the ion of the same race of the wheat of the thermal treatment group after the wheat of the non-heat treated group of not heat-treating and thermal treatment respectively, also comprise: the wheat of non-heat treated group is placed in test fluid 10 to 15 minutes;
And/or,
The wheat of thermal treatment group is placed in test fluid 10 to 15 minutes.
Further, it is characterized in that, described according to the first ion flow velocity and the first ion current to and the second ion flow velocity and the second ion current to, detect the thermotolerance of wheat, comprising:
Between Wheat Cultivars, by the second ion current to contrasting, the second ion current to the thermotolerance of the wheat for interior stream than the second ion current to the good heat resistance of wheat for outflow; Second ion current is to being outflow, then the Heat Tolerance of Wheat Cultivars that the second ion flow velocity is less is better; Second ion current is to being interior stream, then the Heat Tolerance of Wheat Cultivars that the second ion flow velocity is larger is better;
Between same wheat breed, second ion flow velocity and the first ion flow velocity are contrasted, second ion flow velocity is interior stream and the second ion flow velocity Heat Tolerance of Wheat Cultivars of increasing with heat treatment time and increasing is better, and the second ion current is to for outflow and the second ion flow velocity increases with heat treatment time and the Heat Tolerance of Wheat Cultivars that increases is poor.
On the other hand, the invention provides the system that a kind of Heat Tolerance of Wheat Cultivars detects, described system comprises:
Thermal treatment unit, for heat-treating the wheat of thermal treatment group;
Ion current detection system, ion of the same race for the wheat to the thermal treatment group after the wheat of the non-heat treated group of not heat-treating and thermal treatment carries out ion current to the detection with ion concentration, obtains the first ion current respectively to, the first ion concentration and the second ion current to, the second ion concentration;
Computing unit, for the first ion concentration detected according to ion current detection system, calculate the first ion flow velocity of the ion of the wheat of the non-heat treated group of not heat-treating, the second ion concentration also for detecting according to ion current detection system, calculates the second ion flow velocity of the ion of the wheat of the thermal treatment group after thermal treatment;
Judging unit, the first ion current detected for the first ion flow velocity of exporting according to computing unit and ion current detection system to and the second ion current of detecting of the second ion flow velocity of exporting of computing unit and ion current detection system to, detect the thermotolerance of wheat;
Wherein, tested wheat is divided into the wheat of thermal treatment group and the wheat of non-heat treated group in advance.
Further, the ion of described tested wheat comprises: K
+and/or Ca
2+;
And/or described tested wheat comprises: wheat seedling.
Further, described thermal treatment unit is used for:
To the wheat of thermal treatment group at the temperature of 35 DEG C to 45 DEG C, carry out high temperature stress 1 to 24 hour.
Further, described system also comprises:
Test fluid unit, for carrying out ion current at the ion of the same race of described ion current detection system to the wheat of the thermal treatment group after the wheat of the non-heat treated group of not heat-treating and thermal treatment to before the detection with ion concentration, the wheat of non-heat treated group is placed in test fluid 10 to 15 minutes;
Test fluid unit, also for carrying out ion current at the ion of the same race of described ion current detection system to the wheat of the thermal treatment group after the wheat of the non-heat treated group of not heat-treating and thermal treatment to before the detection with ion concentration, the wheat of thermal treatment group is placed in test fluid 10 to 15 minutes.
Further, described the first ion flow velocity of exporting according to computing unit and the first ion current of detecting of non-damage micrometering system to and the second ion current of detecting of the second ion flow velocity of exporting of computing unit and non-damage micrometering system to, detect the thermotolerance of wheat, comprising:
Between Wheat Cultivars, by the second ion current to contrasting, the second ion current to the thermotolerance of the wheat for interior stream than the second ion current to the good heat resistance of wheat for outflow; Second ion current is to being outflow, then the Heat Tolerance of Wheat Cultivars that the second ion flow velocity is less is better; Second ion current is to being interior stream, then the Heat Tolerance of Wheat Cultivars that the second ion flow velocity is larger is better;
Between same wheat breed, second ion flow velocity and the first ion flow velocity are contrasted, second ion flow velocity is interior stream and the second ion flow velocity Heat Tolerance of Wheat Cultivars of increasing with heat treatment time and increasing is better, and the second ion current is to for outflow and the second ion flow velocity increases with heat treatment time and the Heat Tolerance of Wheat Cultivars that increases is poor.
By the method and system that a kind of Heat Tolerance of Wheat Cultivars provided by the invention detects, ion current detection system is utilized directly to detect the ion of wheat, judged the thermotolerance of wheat by ion flow velocity and the flow direction, detection time is short, can reduce the cycle that Heat Tolerance of Wheat Cultivars detects.
Embodiment
For making the object of the embodiment of the present invention, technical scheme and advantage clearly; below in conjunction with the accompanying drawing in the embodiment of the present invention; technical scheme in the embodiment of the present invention is clearly and completely described; obviously; described embodiment is the present invention's part embodiment, instead of whole embodiments, based on the embodiment in the present invention; the every other embodiment that those of ordinary skill in the art obtain under the prerequisite not making creative work, all belongs to the scope of protection of the invention.
For plant, high temperature stress causes cytoplasma membrane to destroy, and causes hydronium exudation, thus ionic equilibrium is broken.Therefore plant to the various ability of possessing with vital movement relevant ions may with the tolerance close relation of plant to high temperature.Dynamic ion flow detection technique is a kind of scan ion technology utilizing ion and molecular selectivity electrode to form in conjunction with computer-controlled automatic positioning measurment system, the information such as speed tested sample turnover ion motion being detected that can can't harm, direction and concentration, thus judge tested sample active state.Ion current detection system is a kind of for information such as harmless speed tested sample turnover ion motion being detected, direction and concentration based on dynamic ion flow detection technique, thus judges the system of tested sample active state.
In order to detect the thermotolerance of wheat, based on ion current detection system, embodiments provide a kind of method that Heat Tolerance of Wheat Cultivars detects, the method comprises:
Step 101: tested wheat is divided into the wheat of thermal treatment group and the wheat of non-heat treated group;
Step 102: the wheat of thermal treatment group is heat-treated;
Step 103: utilize ion current detection system to carry out ion current to the detection with ion concentration to the ion of the same race of the wheat of the thermal treatment group after the wheat of the non-heat treated group of not heat-treating and thermal treatment respectively, obtains the first ion current respectively to, the first ion concentration and the second ion current to, the second ion concentration;
Step 104: according to the first ion concentration detected, calculates the first ion flow velocity of the ion of the wheat of the non-heat treated group of not heat-treating;
Step 105: according to the second ion concentration detected, calculates the second ion flow velocity of the ion of the wheat of the thermal treatment group after thermal treatment;
Step 106: according to the first ion flow velocity and the first ion current to and the second ion flow velocity and the second ion current to, detect the thermotolerance of wheat.
Wherein, tested wheat is divided into two groups, one group is used for doing thermal treatment, and another group does not do thermal treatment, by the wheat after thermal treatment with do not have the ion flow velocity of the same race of heat treated wheat and flow to detect the thermotolerance of wheat.
Wherein, the wheat under high temperature stress is to K
+and Ca
2+absorption or the thermotolerance of possessing ability and wheat be proportionate, therefore, can by ion current detection system to the K of tested wheat
+or Ca
2+measure.
The thermotolerance in seedling stage of wheat as the foundation judging the ripe later stage thermotolerance of wheat, can be selected wheat seedling as measured material, detect the thermotolerance of wheat seedling.
The wheat of thermal treatment group is heat-treated and comprises: to the wheat of thermal treatment group at the temperature of 35 DEG C to 45 DEG C, carry out high temperature stress 1 to 24 hour.
Particularly, the wheat of thermal treatment group is put in illumination box, illumination cultivation 1 to 24 hour at the temperature of 35 DEG C to 45 DEG C.The high temperature stress be subject to due to plant is oversize, can cause serious destruction, even cause death, therefore the set of time of high temperature stress is within 24 hours, the reaction of different cultivars to heat stress can be gone out respectively, be unlikely to again to flood interracial difference because coercive intensity is too high.Wherein, after high temperature stress 4h, the thermotolerance difference between wheat breed is more obvious.
In addition, in order to make tested wheat seedling adaptive testing environment, reducing the test error caused due to environment conversion, before step 103, also comprising: the wheat of non-heat treated group is placed in test fluid 10 to 15 minutes; And/or, the wheat of thermal treatment group is placed in test fluid 10 to 15 minutes.
Because the effects of ion diffusive equilibrium time is about 1 to 2 minute, after step 103, before step 104 and step 105, also comprise:
Rejected ion stream detection system from measure data in 1 to 2 minute.
Obtain tested wheat flow velocity and after flowing to information, according to the first ion flow velocity and the first ion current to and the second ion flow velocity and the second ion current to, detect the thermotolerance of wheat, specifically comprise:
Between Wheat Cultivars, by the second ion current to contrasting, the second ion current to the thermotolerance of the wheat for interior stream than the second ion current to the good heat resistance of wheat for outflow; Second ion current is to being outflow, then the Heat Tolerance of Wheat Cultivars that the second ion flow velocity is less is better; Second ion current is to being interior stream, then the Heat Tolerance of Wheat Cultivars that the second ion flow velocity is larger is better;
Between same wheat breed, second ion flow velocity and the first ion flow velocity are contrasted, second ion flow velocity is interior stream and the second ion flow velocity Heat Tolerance of Wheat Cultivars of increasing with heat treatment time and increasing is better, and the second ion current is to for outflow and the second ion flow velocity increases with heat treatment time and the Heat Tolerance of Wheat Cultivars that increases is poor.
It should be noted that, for same wheat, when carrying out thermotolerance and detecting, wheat can be organized by detecting more, the multi-group data obtained being processed, makes testing result more accurate.Such as, the method for averaging is adopted to process.
The embodiment of the present invention additionally provides the system that a kind of Heat Tolerance of Wheat Cultivars detects, and see Fig. 2, this system comprises:
Thermal treatment unit 201, for heat-treating the wheat of thermal treatment group;
Ion current detection system 202, ion of the same race for the wheat to the thermal treatment group after the wheat of the non-heat treated group of not heat-treating and thermal treatment carries out ion current to the detection with ion concentration, obtains the first ion current respectively to, the first ion concentration and the second ion current to, the second ion concentration;
Computing unit 203, for the first ion concentration detected according to ion current detection system, calculate the first ion flow velocity of the ion of the wheat of the non-heat treated group of not heat-treating, the second ion concentration also for detecting according to ion current detection system, calculates the second ion flow velocity of the ion of the wheat of the thermal treatment group after thermal treatment;
Judging unit 204, the first ion current detected for the first ion flow velocity of exporting according to computing unit 203 and ion current detection system 202 to and the second ion current of detecting of the second ion flow velocity of exporting of computing unit 203 and ion current detection system 202 to, detect the thermotolerance of wheat.
Wherein, tested wheat is divided into the wheat of thermal treatment group and the wheat of non-heat treated group in advance.
Wherein, the wheat under high temperature stress is to K
+and Ca
2+absorption or the thermotolerance of possessing ability and wheat be proportionate, therefore, can by ion current detection system to the K of tested wheat
+or Ca
2+measure.
The thermotolerance in seedling stage of wheat as the foundation judging the ripe later stage thermotolerance of wheat, can be selected wheat seedling as measured material, detect the thermotolerance of wheat seedling.
Thermal treatment unit 201 for the wheat of thermal treatment group at the temperature of 35 DEG C to 45 DEG C, carry out high temperature stress 1 to 24 hour.
In order to make tested wheat seedling adaptive testing environment, reduce the test error caused due to environment conversion, add test fluid unit 205 within the system, for carrying out ion current at the ion of the same race of ion current detection system 202 to the wheat of the thermal treatment group after the wheat of the non-heat treated group of not heat-treating and thermal treatment to before the detection with ion concentration, the wheat of non-heat treated group is placed in test fluid 10 to 15 minutes;
Test cell also for, carry out ion current to before the detection with ion concentration at the ion of the same race of ion current detection system 202 to the wheat of the thermal treatment group after the wheat of the non-heat treated group of not heat-treating and thermal treatment, the wheat of thermal treatment group is placed in test fluid 10 to 15 minutes.
Judging unit 204, specifically for by the second ion current to contrasting, the second ion current to the thermotolerance of the wheat for interior stream than the second ion current to the good heat resistance of wheat for outflow;
Between Wheat Cultivars, by the second ion current to contrasting, the second ion current to the thermotolerance of the wheat for interior stream than the second ion current to the good heat resistance of wheat for outflow; Second ion current is to being outflow, then the Heat Tolerance of Wheat Cultivars that the second ion flow velocity is less is better; Second ion current is to being interior stream, then the Heat Tolerance of Wheat Cultivars that the second ion flow velocity is larger is better;
Between same wheat breed, second ion flow velocity and the first ion flow velocity are contrasted, second ion flow velocity is interior stream and the second ion flow velocity Heat Tolerance of Wheat Cultivars of increasing with heat treatment time and increasing is better, and the second ion current is to for outflow and the second ion flow velocity increases with heat treatment time and the Heat Tolerance of Wheat Cultivars that increases is poor.
Below by K in wheat seedling
+and Ca
2+detection judge that the thermotolerance of wheat is example, describe the implementation procedure of one embodiment of the invention in detail.
Heat-resisting genotype wheat TAM107 and thermo-responsive genotype wheat China spring is selected to be tested wheat.To the K of two grow wheats
+non-damage micrometering system is adopted to measure.By the non-damage scan ion choice electrode technology in non-damage micrometering system, with the detection of scan ion selectivity micro-electrode Technique dynamic, obtain the K of turnover sample
+ion concentration (mM level), the information flowed to.First, non-damage micrometering system is got out.At K
+selectivity micro-electrode front end filling 180 μm of K
+the liquid exchanger of ion, at the KCl of the 100mM of rear end filling about the 15-20mm of microelectrode as electrolytic solution, by the Ag/AgCl silk wheat contrast electrode on electrode anchors, inserts, makes itself and electrolyte contacts after microelectrode.
See Fig. 3, detect heat-resisting genotype wheat TAM107, concrete detecting step is as follows:
Step 301: the seedling cultivating tested wheat;
Particularly, by tested wheat seed with 3% hypochlorite disinfectant 5 minutes, presoaking and germinating is after 24 hours respectively, selects and sprouts consistent seed, evenly broadcast and be covered with individual layer filter paper, grow in the germination box that sterilized water soaks, and filter paper is changed every day.In illumination box 24 DEG C/20 DEG C illumination cultivation after 5 days, transfer in water planting environment, nutrient solution is 1/2Hogland nutrient solution, when seedling grows to about 10cm, carries out thermotolerance detection to wheat seedling.
Step 302: tested wheat seedling is divided into the wheat seedling of thermal treatment group and the wheat seedling of non-heat treated group;
Step 303: the wheat seedling of thermal treatment group is put into nutrient solution, carries out the high temperature stress of 40 DEG C to wheat seedling, stress time is 4 hours;
Step 304: the wheat seedling of the thermal treatment group after the wheat seedling of the non-heat treated group of not heat-treating and thermal treatment is placed in test fluid 15 minutes respectively;
Step 305: with non-damage micrometering system respectively to the K of the root system maturation zone of the wheat seedling of the thermal treatment group after the wheat seedling of the non-heat treated group of not heat-treating and thermal treatment
+detect;
Step 306: give up non-damage micrometering system when measuring the wheat seedling of non-heat treated group from measure data in 2 minutes, calculate the K of the wheat seedling of non-heat treated group
+flow velocity;
Step 307: give up non-damage micrometering system when measuring the wheat seedling of thermal treatment group from measure data in 2 minutes, calculate the wheat seedling of thermal treatment group K
+flow velocity;
Step 308: respectively according to the K of the wheat of the non-heat treated group of not heat-treating
+flow velocity and the flow direction and thermal treatment after the K of wheat of non-heat treated group
+flow velocity and flow to and detect the thermotolerance of tested wheat.
Wherein, particularly, transferred to by wheat seedling in testing cassete, the test fluid composition in testing cassete is 0.5mMKCl, 0.1mMCaCl
2.
Particularly, to the K of wheat seedling non-damage micrometering system to the root system maturation zone of wheat seedling
+when detecting, the root system maturation zone distance tip of a root about 10mm, in distance, microelectrode is vertically placed by 10 μm, root table face place, and measure two point voltages poor, the displacement that microelectrode is 2 is 30 μm.
Particularly, when carrying out high temperature stress to wheat, can carry out the high temperature stress of 40 DEG C to wheat seedling, stress time is respectively 1 hour, 4 hours, 24 hours, and measures the ion of wheat seedling after these three kinds of stress time respectively.
Particularly, because the effects of ion diffusive equilibrium time is about 1 to 2 minute, so the data recorded during this period of time will be given up.Utilize and correct the slope value that obtains, voltage difference between 2 o'clock is converted into ion concentration difference.In the computation process of clean ion current, substantially think that radical ion stream meets cylinder diffusion geometric model.The conversion of flow velocity uses Mageflux software to complete.
Adopt above-mentioned identical method to the K of the wheat seedling of thermo-responsive genotype wheat China spring
+measure.
In addition, adopt above-mentioned identical method to the Ca of two grow wheat seedling
2+measure, concrete steps and above-mentioned measurement K
+step identical, it should be noted that, at Ca
2+selectivity micro-electrode front end filling 25-40 μm of Ca
2+the liquid exchanger of ion, at the CaCl of the 100mM of rear end filling about the 15-20mm of microelectrode
2as electrolytic solution, by the AgCl silk wheat contrast electrode on electrode anchors, insert after microelectrode, make itself and electrolyte contacts.Test fluid composition in testing cassete is 0.5mMKCl, 0.1mMCaCl
2.
Participating in Fig. 4, figure is that two grow wheats are not having clean K in thermal treatment, thermal treatment 1 hour, thermal treatment 4 hours, thermal treatment 24 hours situations respectively
+flow velocity and the flow direction.By above-mentioned to K
+measurement can draw, under normal growing conditions, wheat lines TAM107, China spring root maturation zone K
+flow velocity be on the occasion of, show K near root system
+outflow, mean flow rate is respectively 49pmol.cm
-2.s
-1and 132pmol.cm
-2.s
-1.Along with the growth of seedling stress time under 40 DEG C of high temperature, heat-resisting its root of wheat lines TAM107 K
+become interior stream after outer row's speed reduces gradually, wherein high temperature stress is after 4 hours, and its internal flow velocity is-24pmol.cm to the maximum
-2.s
-1, and the outer row's speed of thermo-responsive wheat lines China spring presents the trend first rising and reduce afterwards, wherein high temperature stress 1 hour, its outer row's speed is 159pmol.cm to the maximum
-2.s
-1.Under showing high temperature stress, compared with China spring, heat-resisting wheat lines TAM107 root system is to K
+have and stronger possess ability.
Participating in Fig. 5, figure is that two grow wheats are not having clean Ca in thermal treatment, thermal treatment 1 hour, thermal treatment 4 hours, thermal treatment 24 hours situations respectively
2+flow velocity and the flow direction.By above-mentioned to Ca
2+measurement can draw, under normal growing conditions, wheat lines TAM107 and China spring root maturation zone Ca
2+flow velocity be on the occasion of, show Ca near root system
2+outflow, mean flow rate is respectively 60pmol.cm
-2.s
-1and 1pmol.cm
-2.s
-1.Along with the growth of seedling stress time under 40 DEG C of high temperature, heat-resisting wheat lines TAM107Ca
2+outer row's speed reduces gradually, and heat stress is after 24 hours, and mean flow rate reduces to 12pmol.cm
-2.s
-1, be 1/5 of calcium ion flow velocity under normal growing conditions.And thermo-responsive wheat lines China spring Ca
2+outer row's speed increases gradually, and after high temperature stress 24h, mean flow rate is 25pmol.cm
-2.s
-1, flow velocity is 25 times under normal growing conditions.Under showing high temperature stress, compared with China spring, heat-resisting wheat lines TAM107 root system is to Ca
2+have and very strong possess ability.
Visible by the description of above-described embodiment, the embodiment of the present invention has following beneficial effect:
1, the method and system that a kind of Heat Tolerance of Wheat Cultivars provided by the embodiment of the present invention is detected, ion current detection system is utilized directly to detect the ion of wheat, judged the thermotolerance of wheat by ion flow velocity and the flow direction, detection time is short, can reduce the cycle that Heat Tolerance of Wheat Cultivars detects.
2, the method and system that a kind of Heat Tolerance of Wheat Cultivars provided by the embodiment of the present invention is detected, utilizes ion current detection system directly to detect the ion of wheat, can not damage tested wheat.
3, the method and system that a kind of Heat Tolerance of Wheat Cultivars provided by the embodiment of the present invention is detected, can carry out thermotolerance detection to the seedling of wheat, greatly reduce the cultivation time of tested wheat, and then can reduce the cycle of Heat Tolerance of Wheat Cultivars detection.
It should be noted that, in this article, the relational terms of such as first and second and so on is only used for an entity or operation to separate with another entity or operational zone, and not necessarily requires or imply the relation that there is any this reality between these entities or operation or sequentially.And, term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability, thus make to comprise the process of a series of key element, method, article or equipment and not only comprise those key elements, but also comprise other key elements clearly do not listed, or also comprise by the intrinsic key element of this process, method, article or equipment.When not more restrictions, the key element limited by statement " comprising ... ", and be not precluded within process, method, article or the equipment comprising described key element and also there is other same factor.
One of ordinary skill in the art will appreciate that: all or part of step realizing said method embodiment can have been come by the hardware that programmed instruction is relevant, aforesaid program can be stored in the storage medium of embodied on computer readable, this program, when performing, performs the step comprising said method embodiment; And aforesaid storage medium comprises: ROM, RAM, magnetic disc or CD etc. various can be program code stored medium in.
Finally it should be noted that: the foregoing is only preferred embodiment of the present invention, only for illustration of technical scheme of the present invention, be not intended to limit protection scope of the present invention.All any amendments done within the spirit and principles in the present invention, equivalent replacement, improvement etc., be all included in protection scope of the present invention.