CN103513210A - Inductance, capacitance and resistance standard device - Google Patents
Inductance, capacitance and resistance standard device Download PDFInfo
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- CN103513210A CN103513210A CN201310491674.1A CN201310491674A CN103513210A CN 103513210 A CN103513210 A CN 103513210A CN 201310491674 A CN201310491674 A CN 201310491674A CN 103513210 A CN103513210 A CN 103513210A
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Abstract
The invention discloses an inductance, capacitance and resistance standard device for performing quantity transmission in the process of detecting reactance instruments by a metering department. The inductance, capacitance and resistance standard device comprises a box body, as well as wiring terminals, a selecting disc, a function identifier and connecting wires which are arranged on the box body. In work, the inductance, capacitance and resistance standard device can be flexibly connected with a variety of standard instruments for parameter combination; wiring is simple and high in accuracy; the inductance, capacitance and resistance standard device can measure and output LCR (inductance, capacitance and resistance) parameters, and can measure all parameters by once wiring; data can be directly traced back to a standard inductance (H Henry standard), a standard resistance (omega ohm standard) and a standard capacitor (F farad standard); therefore, the inductance, capacitance and resistance standard device is a standard device suitable for measurement of electromagnetic basic quantity values (inductance H, capacitance C and resistance omega) by metering institutions in all levels.
Description
Technical field
The present invention relates to a kind of measurement mechanism, refer in particular to in metering detection/calibrated resistance, electric capacity, inductor instrument process, by senior to rudimentary a kind of inductance, electric capacity, the resistance standard device that carries out transmission of quantity value.
Background technology
At present during the alternating-current parameter type instrument such as metrological service's Detection capacitance case, inductance box, reactance case, LCR measuring instrument, need to use the multiple standards instruments such as measuring resistance, standard capacitance, standard inductance and carry out parameter combinations and just can complete measurement.But this metering system wiring is complicated, accuracy of measurement is low, and primary connection can not complete the measurement of all parameters.Developing a kind of inductance, electric capacity, resistance standard device is that the sector is needed for alternating-current parameter type instrument such as metrological service's Detection capacitance case, inductance box, reactance case, LCR measuring instruments.
Summary of the invention
The technical matters that the present invention solves is to provide a kind of inductance, electric capacity, resistance standard device, this standard set-up is partly comprised of casing and connection terminal, selective pan, Function Identification and the connecting line etc. that are placed on casing, during the work of this standard set-up, can connect various reference instruments and carry out parameter combinations, both can measure LCR parameter, can export LCR parameter again, primary connection can complete the surveying work of all parameters.
The technical problem to be solved in the present invention is realized by following scheme: for detection of the inductance, electric capacity, the resistance standard device that carry out transmission of quantity value in reactance quasi-instrument process, the casing that is rectangle, comprises the connecting line below panel, connection terminal, shield terminal, selective pan and panel.The described panel left side is provided with from top to bottom takes over the two-wire system H-L connection terminal crossing with inductance box L, resistance box R, capacitive C tri-casees; Middle part is provided with from left to right and connects tested instrument four-wire system connection terminal below; Top is provided with the four-wire system connection terminal that connects calibration resistor, standard capacitor, standard inductor from left to right; The right is provided with the four-wire system connection terminal that connects standard meter from top to bottom, the left installation LCR combination order in panel middle part, the right side, middle part installs and measures instrument selective pan, installation code device Zn selective pan on middle part, middle subordinate installs and measures output selective pan, every group of connection terminal side is all provided with shield terminal being connected with panel, and inductance box 5H connection terminal connects the 1st, 4,5,6, C1 layer, connects the 4th, C3 layer, connects the 4th, C6 layer; Inductance box 5L connection terminal connects the 1st, 4, C2 layer, connects the 5th, 6, C3 layer, connects the 4th, C4 layer, connects the 4th, C5 layer; Resistance box 4H connection terminal connects the 2nd, C1 layer, connects the rotation cutter spacing of C3 layer, and resistance box 4L connection terminal connects the 2nd, C2 layer, connects the rotation cutter spacing of C4 layer, connects the 6th, C6 layer; Capacitive 3H connection terminal connects the 3rd, C1 layer, connects the rotation cutter spacing of C5 layer, and capacitive 3L connection terminal connects the 3rd, C2 layer, connects the rotation cutter spacing of C6 layer; The 6th, C1 layer connects with C5 layer the 6th, the 5th, C4 layer joins with the 5th, C5 layer, described measurement output selective pan is by 4 layers, every layer of two groups of left and right cutter and 4 rotation wave band switches set of every group of cutter become, its each layer fixedly mode of connection of each layer of rotation cutter spacing of cutter spacing and described LCR combination order is: left group of C1, C2 layer fixedly the 2nd of cutter spacing connect LCR combination order C1 layer rotation cutter spacing, and left group of C3, C4 layer fixedly the 2nd of cutter spacing connect LCR combination order C2 layer and rotate cutter spacing; Left group of cutter C1 layer, C2 layer, C3 layer, C4 layer the 2nd fixedly cutter spacing connect respectively fixedly cutter spacing of right group of cutter C1 layer, C2 layer, C3 layer, C4 layer the 3rd.
Advantage of the present invention is: during the work of this standard set-up, can connect flexibly various reference instruments and carry out parameter combinations, not only LCR parameter can be measured but also LCR parameter can be exported, primary connection can complete all parameter measurements, is applicable to measurement technology at different levels mechanism and sets up the basic value of electromagnetism (inductance H, capacitor C, resistance Ω) metrological standard unit.
Accompanying drawing explanation
Fig. 1 is inductance, electric capacity, resistance standard device appearance stereographic map.
Fig. 2 is LCR combination order and the wiring diagram of measuring each layer of rotation cutter spacing of output selective pan.
Embodiment
Below in conjunction with accompanying drawing, describe one embodiment of the present of invention in detail.
As shown in Figure 1, the standard set-up casing (320mm * 450mm * 100mm) that is rectangle, shell 1 and panel 2 are made by the thick iron plate of 0.5mm.Panel 2 left sides, middle part are provided with LCR combination order 6, and upper right, middle part is provided with standard Zn selective pan 8, and middle subordinate is provided with and measures output selective pan 16, and the right side, middle part is provided with measuring instrument selective pan 14.Panel 2 left sides are provided with from top to bottom takes over 3 groups of two-wire system H-L connection terminals that cross with inductance box 5, resistance box 4, capacitive 3; Below, part is provided with from left to right and connects the standard output 17 of tested instrument, 2 groups of four-wire system connection terminals of measurement Zx15; Top is provided with 3 groups of four-wire system connection terminals that connect calibration resistor 7, standard capacitor 9, standard inductor 10 from left to right; The right is provided with the 3 groups of four-wire system connection terminals 11,12,13 that meet standard meter B1, B2, B3 from top to bottom, and every group of connection terminal adjacency is all provided with shield terminal 18 being connected with panel 2.
As shown in Figure 2,3 groups of two-wire system H-L connection terminals of inductance box 5, resistance box 4, capacitive 3 with by 6 layers every layer 1 group of cutter, the concrete mode of connection of fixed bit of organizing that 6 rotation waveres of every group of cutter are made LCR combination order 6 is: inductance box 5H connection terminal connects the 1st, 4,5,6, C1 layer, connects the 4th, C3 layer, connects the 4th, C6 layer; Inductance box 5L connection terminal connects the 1st, 4, C2 layer, connects the 5th, 6, C3 layer, connects the 4th, C4 layer, connects the 4th, C5 layer; Resistance box 4H connection terminal connects the 2nd, C1 layer, connects the rotation cutter spacing of C3 layer, and resistance box 4L connection terminal connects the 2nd, C2 layer, connects the rotation cutter spacing of C4 layer, connects the 6th, C6 layer; Capacitive 3H connection terminal connects the 3rd, C1 layer, connects the rotation cutter spacing of C5 layer, and capacitive 3L connection terminal connects the 3rd, C2 layer, connects the rotation cutter spacing of C6 layer; The 6th, C1 layer joins with the 6th, C5 layer, and the 5th, C2 layer joins with the 5th, C6 layer, and the 6th, C2 layer joins with the 6th, C4 layer, and the 5th, C4 layer joins with the 5th, C5 layer.
As shown in Figure 2, in panel 2, subordinate is provided with by 4 layers, the measurement output selective pan 16 that the rotation waver that every layer of 2 groups of cutter and every group of cutter are 4 is made, described measurement output selective pan 16 each layers fixedly mode of connection of each layer of rotation cutter spacing of cutter spacing and LCR combination order are: left group of C1, C2 layer fixedly the 2nd of cutter spacing connect LCR combination order C1 layer and rotate cutter spacing, and left group of C3, C4 layer fixedly the 2nd of cutter spacing connect LCR combination order C2 layer and rotate cutter spacing; Left group of cutter C1 layer, C2 layer, C3 layer, C4 layer the 2nd fixedly cutter spacing connect respectively fixedly cutter spacing of right group of cutter C1 layer, C2 layer, C3 layer, C4 layer the 3rd.
When this standard set-up is used, inductance box 5, resistance box 4, capacitive 3 are connected on 3 groups of inductance boxs 5, resistance box 4, capacitive 3 connection terminals on cabinet panel 2 left sides, can be combined into by LCR combination order 66 kinds of basic electricity parameter modes such as reactance pattern of single inductance value L, single resistance value R, single capacitor value C, LCR paralleling model, LCR series model, L string R C.Calibration resistor, capacitor, inductor are connected on 3 groups of Rn7, Cn9 above of panel 2, Ln10 connection terminal, can export selective pan 8 by canonical measure and use selection; Standard meter is connected on B1, B2, B3 3 group 11,12 of the panel right side, 13 connection terminals, can be selected by measuring instrument selective pan 14.
By test examination instrument, if measuring instrument is connected on cabinet panel 2 below on standard output connection terminal 17, first made canonical measure output selective pan 16 put output valve Zx position, adjust LCR combination order 6 and put and need pattern; Adjusting inductance box 5 for transition, resistance box 4, capacitive 3 etc., to make tested instrument display one determined value be displayed value again; Then adjust canonical measure output selective pan 16 and put standardized value Zx position, by measuring instrument selective pan 14, select, by being connected to B1, the B2 on the described device box body panel right side, on 3 groups of connection terminals 11,12,13 of B3 standard meter go to measure LCR combination order 6 patterns of putting and obtain standard value, then calculate by relative method formula the measuring process that tested instrument display value error completes a displayed value; Also can make canonical measure output selective pan 16 put output valve Z n position, by be connected on 3 groups of connection terminals of Ln, Cn above described device box body panel, Rn calibration resistor 7, standard capacitor 9, standard inductor 10 directly calibration by test examination instrument.
If be that material measure (inductance box, resistance box, capacitive etc.) is connected on below described device cabinet panel on measured value Zx connection terminal 15 by test examination instrument, adjust canonical measure output selective pan 16 and put measurement Zx position, by measuring instrument selective pan 14, select, by being connected to B1, the B2 on described device box body panel 2 right sides, the standard meter on 3 groups of connection terminals of B3, measure its indicating value, complete the measuring process of an indicated value.
From above embodiment, during the work of this device, can connect flexibly various reference instruments and carry out parameter combinations, wiring is simple, accuracy is high, not only LCR parameter can be measured but also LCR parameter can be exported, primary connection can complete all parameter measurements, data can directly be traced to the source to standard inductance (H Henry standard), measuring resistance (Ω ohm standard), standard capacitance (F farad standard), are applicable to metering mechanisms at different levels and set up the basic value of electromagnetism (inductance H, capacitor C, resistance Ω) metrological standard unit.
Claims (1)
1. inductance, electric capacity, resistance standard device, for detection of carrying out the standard set-up of transmission of quantity value in reactance quasi-instrument process, casing is rectangle, comprise the connecting line below panel, connection terminal, shield terminal, selective pan and panel, it is characterized in that: the described panel left side is provided with from top to bottom takes over the two-wire system H-L connection terminal crossing with inductance box L, resistance box R, capacitive C tri-casees; Middle part is provided with from left to right and connects tested instrument four-wire system connection terminal below; Top is provided with the four-wire system connection terminal that connects calibration resistor, standard capacitor, standard inductor from left to right; The right is provided with the four-wire system connection terminal that connects standard meter from top to bottom, the left installation LCR combination order in panel middle part, the right side, middle part installs and measures instrument selective pan, installation code device Zn selective pan on middle part, middle subordinate installs and measures output selective pan, every group of connection terminal side is all provided with shield terminal being connected with panel, and inductance box 5H connection terminal connects the 1st, 4,5,6, C1 layer, connects the 4th, C3 layer, connects the 4th, C6 layer; Inductance box 5L connection terminal connects the 1st, 4, C2 layer, connects the 5th, 6, C3 layer, connects the 4th, C4 layer, connects the 4th, C5 layer; Resistance box 4H connection terminal connects the 2nd, C1 layer, connects the rotation cutter spacing of C3 layer, and resistance box 4L connection terminal connects the 2nd, C2 layer, connects the rotation cutter spacing of C4 layer, connects the 6th, C6 layer; Capacitive 3H connection terminal connects the 3rd, C1 layer, connects the rotation cutter spacing of C5 layer, and capacitive 3L connection terminal connects the 3rd, C2 layer, connects the rotation cutter spacing of C6 layer; The 6th, C1 layer joins with the 6th, C5 layer, the 5th, C2 layer joins with the 5th, C6 layer, the 6th, C2 layer joins with the 6th, C4 layer, the 5th, C4 layer joins with the 5th, C5 layer, described measurement output selective pan is by 4 layers, every layer of two groups of left and right cutter and 4 rotation wave band switches set of every group of cutter become, its each layer fixedly mode of connection of each layer of rotation cutter spacing of cutter spacing and described LCR combination order is: left group of C1, C2 layer fixedly the 2nd of cutter spacing connect LCR combination order C1 layer rotation cutter spacing, and left group of C3, C4 layer fixedly the 2nd of cutter spacing connect LCR combination order C2 layer and rotate cutter spacing; Left group of cutter C1 layer, C2 layer, C3 layer, C4 layer the 2nd fixedly cutter spacing connect respectively fixedly cutter spacing of right group of cutter C1 layer, C2 layer, C3 layer, C4 layer the 3rd.
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| CN201310491674.1A CN103513210B (en) | 2013-10-11 | 2013-10-11 | Inductance, electric capacity, resistor standard device |
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| CN201310491674.1A CN103513210B (en) | 2013-10-11 | 2013-10-11 | Inductance, electric capacity, resistor standard device |
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| CN103513210A true CN103513210A (en) | 2014-01-15 |
| CN103513210B CN103513210B (en) | 2016-08-17 |
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Cited By (6)
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| CN105336459A (en) * | 2015-12-08 | 2016-02-17 | 杭州大华仪器制造有限公司 | AC resistance box of novel structure |
| CN105527599B (en) * | 2016-01-13 | 2018-08-17 | 内蒙古自治区计量测试研究院 | A kind of transition capacitance case and the method to capacitance measuring instrument progress error-detecting |
| CN111289930A (en) * | 2020-03-13 | 2020-06-16 | 深圳天溯计量检测股份有限公司 | Calibration method of inductance tester |
| CN111487448A (en) * | 2020-04-15 | 2020-08-04 | 深圳市明信测试设备有限公司 | Circuit module for testing L CR by using alternating current signal and testing method |
| CN111537937A (en) * | 2020-06-17 | 2020-08-14 | 内蒙古自治区计量测试研究院 | Material object type AC/DC loop resistance measurement standard device |
| CN112731241A (en) * | 2020-12-23 | 2021-04-30 | 华虹半导体(无锡)有限公司 | Calibration tool and calibration method for wafer test machine |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| CN111289930A (en) * | 2020-03-13 | 2020-06-16 | 深圳天溯计量检测股份有限公司 | Calibration method of inductance tester |
| CN111487448A (en) * | 2020-04-15 | 2020-08-04 | 深圳市明信测试设备有限公司 | Circuit module for testing L CR by using alternating current signal and testing method |
| CN111537937A (en) * | 2020-06-17 | 2020-08-14 | 内蒙古自治区计量测试研究院 | Material object type AC/DC loop resistance measurement standard device |
| CN112731241A (en) * | 2020-12-23 | 2021-04-30 | 华虹半导体(无锡)有限公司 | Calibration tool and calibration method for wafer test machine |
| CN112731241B (en) * | 2020-12-23 | 2024-01-19 | 华虹半导体(无锡)有限公司 | Calibration tool and calibration method for wafer test machine |
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| CN103513210B (en) | 2016-08-17 |
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