CN111289930A - Calibration method of inductance tester - Google Patents
Calibration method of inductance tester Download PDFInfo
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- CN111289930A CN111289930A CN202010176445.0A CN202010176445A CN111289930A CN 111289930 A CN111289930 A CN 111289930A CN 202010176445 A CN202010176445 A CN 202010176445A CN 111289930 A CN111289930 A CN 111289930A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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Abstract
The invention discloses a calibration method of an inductance tester, which comprises the following steps: s1: performing appearance inspection; s2: conducting power-on inspection; s3: insulation testing; s4: inductance measurement and error calculation; s5: and (4) calculating the test frequency and the error.
Description
Technical Field
The invention relates to the technical field of electricity, in particular to a calibration method of an inductance tester.
Background
The inductance measuring instrument has a simple and practical sorting function, the parameter setting of the function is simple and easy to implement, the result display is visual, and the requirements of people on the feeding inspection of a using unit and the quick sorting and measuring of an inductance production line can be met. Generally, an inductance tester adopts a bridge circuit structure, and a standard inductor and a tested inductor are used as two arms of the bridge circuit. When measuring the inductance value of the inductor, a test voltage is simultaneously applied to the standard inductor and the tested inductor, and the processor acquires current signals flowing through the standard inductor and the tested inductor through the sensors and processes the current signals to obtain the inductance value of the tested inductor.
Because the synchronous sampling technology of the standard inductor and the tested inductor is adopted, the influence of power supply voltage fluctuation can be avoided; in addition, the measurement process is carried out automatically, so that errors caused by manual operation are avoided, and the method has the characteristics of good stability, good repeatability, accuracy and reliability
In the prior art, an inductance tester is a measuring instrument widely used in the microelectronics industry for measuring inductance parameters of a device under test. However, the impedance of the components greatly affects the product quality, so an effective calibration method for the inductance tester is required.
The calibration scheme is suitable for calibrating various handheld or desktop inductance testers and inductance balance bridges with inductance measurement ranges of 10 mu H-10H and test frequency ranges of 100 Hz-100 kHz.
Disclosure of Invention
In view of the above-mentioned deficiencies in the prior art, the present application aims to provide a calibration method for an inductance tester. The specific scheme is as follows:
a method of calibrating an inductance tester, the method comprising the steps of:
s1: performing appearance inspection;
s2: conducting power-on inspection;
s3: insulation testing;
s4: inductance measurement and error calculation;
s5: and (4) calculating the test frequency and the error.
The appearance inspection in step S1 specifically includes:
s1-1, checking whether the appearance structure is intact, and whether the panel indication, the reading instrument, the manufacturing plant, the instrument number and the model information are clearly marked;
s1-2, checking whether the exposed part of the detected instrument is loose and mechanically damaged; whether the instrument accessories, the input line and the grounding end are complete or not; whether the switch and the knob can normally rotate.
The power-on check of step S2 specifically includes:
s2-1, switching on the power supply of the instrument to be calibrated, observing whether the reading instrument has display and display defects, and whether each switch and knob can be normally used;
s2-2 checks whether the zero reset function of the instrument to be calibrated is working properly.
The insulation test in step S3 specifically includes:
s3-1, connecting the power supply of the insulation resistance tester, setting the test voltage to be 500V, selecting a proper measuring range, and resetting;
s3-2, connecting one test end of the insulation resistance tester to the tested device shell, and connecting one test end to the line end;
and S3-3, starting an output switch, reading and testing for not less than 10 seconds.
In the inductance measurement and error calculation in step S4, the calibration of the inductance measurement error adopts a direct comparison method, which specifically includes:
before S4-1 calibration, the instrument to be calibrated is electrified and preheated for more than 30 minutes;
s4-2, switching to an inductance measurement function, and selecting a measurement frequency and a measurement voltage;
s4-3, selecting a measuring range according to the standard inductance, connecting the calibrated instrument with a test cable, performing open-circuit calibration and short-circuit calibration, and resetting if the instrument has a zero resetting function; the test cable is preferably connected to a litz wire;
s4-4, connecting a two-terminal connecting circuit to connect the calibrated instrument and the standard inductor;
s4-5 measuring and reading, switching measuring range, and repeating the steps S4-1 to S4-4; the selection of the calibration point of the basic range is not less than 5 points, the selection of the calibration points of other ranges is not less than 1 point, and the calibration points are preferably selected uniformly in the corresponding ranges.
The step S5 of calculating the test frequency and the error, and calibrating the inductance loss measurement error by using a direct comparison method specifically include: the calibration of the testing frequency uses the frequency meter as the standard, the calibration procedure is the same as the steps S4-1 to S4-5, the reading of the frequency meter is used as the measured value, and the selection of the calibration point covers the working testing frequency.
Wherein the basic error is calculated as follows:
the indicating error of the inductance measurement is expressed by formula (1), and the relative indicating error is expressed by formula (2).
Δ＝Px-PN………………………………………(1)
Wherein:
Δ: indicating the value error;
γ: relative indication error;
Px: indicating the value of the tester to be calibrated;
PN: the settings of standard equipment.
Wherein, the error of the indication value of the test frequency is calculated as follows:
the indicating error of the test frequency is expressed by equation (3), and the relative indicating error is expressed by equation (4).
Δ＝Fx-FN………………………………………(3)
Wherein:
Δ: indicating the value error;
γ: relative indication error;
Fx: the nominal value of the tester under calibration;
FN: measured values of standard equipment.
Wherein, under the test voltage condition of 500V, the insulation resistance between the line end and the shell is not less than 100M omega.
After calibration is performed according to the calibration method, a calibration result expression is formed according to the test and calculation results, the expression mode is a calibration certificate or a calibration report, and the calibration expression comprises the following information:
a) titles, such as "calibration certificate";
b) laboratory name and address;
c) the location where the calibration is performed;
d) the unique identification of the certificate or the report adopts a form selected from two-dimensional codes, bar codes and the like, and the identification comprises information of each page and the total number of pages;
e) the name and address of the customer;
f) description and explicit identification of the subject being corrected;
g) the date the calibration was performed;
h) the identification of the technical specification according to which the calibration is based comprises a name and a code number;
i) the traceability and validity statement of the measurement standard used in the calibration;
j) a description of a calibration environment;
k) a description of the calibration results and their measurement uncertainty;
l) if it is relevant to the validity and application of the calibration result, the setting and operation of the object to be calibrated in the calibration process should be explained;
m) a specification of a deviation from the calibration specification;
n) the signature, job or equivalent identification of the certificate being verified and the calibration report issuer;
o) a statement that the calibration result is valid only for the object being calibrated;
p) no written laboratory approval, no partial duplication of the certificate or statement reported.
Drawings
Fig. 1 is a two-terminal connection.
Advantageous effects
The method is used for calibration, the calibration period is long compared with that of the conventional calibration method, the re-calibration time interval is about 1 year, the calibration cost is greatly saved, and the calibration accuracy is 100%.
Detailed Description
Example 1
The calibration environment conditions of this example are shown in Table 1
TABLE 1
| Serial number | Environmental conditions | Require that |
| 1 | Temperature of | (20±2)℃ |
| 2 | Relative humidity | (50±10)％ |
| 3 | Voltage of | (220±22)V |
| 4 | Frequency of voltage | (50±2)Hz |
| 5 | Ambient electromagnetic interference | Avoid |
The calibration standard equipment of this example is shown in Table 2
TABLE 2
A method of calibrating an inductance tester, the method comprising the steps of:
s1: performing appearance inspection;
s2: conducting power-on inspection;
s3: insulation testing;
s4: inductance measurement and error calculation;
s5: and (4) calculating the test frequency and the error.
The appearance inspection in step S1 specifically includes:
s1-1, checking whether the appearance structure is intact, and whether the panel indication, the reading instrument, the manufacturing plant, the instrument number and the model information are clearly marked;
s1-2, checking whether the exposed part of the detected instrument is loose and mechanically damaged; whether the instrument accessories, the input line and the grounding end are complete or not; whether the switch and the knob can normally rotate.
The power-on check of step S2 specifically includes:
s2-1, switching on the power supply of the instrument to be calibrated, observing whether the reading instrument has display and display defects, and whether each switch and knob can be normally used;
s2-2 checks whether the zero reset function of the instrument to be calibrated is working properly.
The insulation test in step S3 specifically includes:
s3-1, connecting the power supply of the insulation resistance tester, setting the test voltage to be 500V, selecting a proper measuring range, and resetting;
s3-2, connecting one test end of the insulation resistance tester to the tested device shell, and connecting one test end to the line end;
and S3-3, starting an output switch, reading and testing for not less than 10 seconds.
In the inductance measurement and error calculation in step S4, the calibration of the inductance measurement error adopts a direct comparison method, which specifically includes:
before S4-1 calibration, the instrument to be calibrated is electrified and preheated for more than 30 minutes;
s4-2, switching to an inductance measurement function, and selecting a measurement frequency and a measurement voltage;
s4-3, selecting a measuring range according to the standard inductance, connecting the calibrated instrument with a test cable, performing open-circuit calibration and short-circuit calibration, and resetting if the instrument has a zero resetting function; the test cable is preferably connected to a litz wire;
s4-4, connecting a two-terminal connecting circuit to connect the calibrated instrument and the standard inductor;
s4-5 measuring and reading, switching measuring range, and repeating the steps S4-1 to S4-4; the selection of the calibration point of the basic range is not less than 5 points, the selection of the calibration points of other ranges is not less than 1 point, and the calibration points are preferably selected uniformly in the corresponding ranges.
The step S5 of calculating the test frequency and the error, and calibrating the inductance loss measurement error by using a direct comparison method specifically include: the calibration of the testing frequency uses the frequency meter as the standard, the calibration procedure is the same as the steps S4-1 to S4-5, the reading of the frequency meter is used as the measured value, and the selection of the calibration point covers the working testing frequency.
Wherein the basic error is calculated as follows:
the indicating error of the inductance measurement is expressed by formula (1), and the relative indicating error is expressed by formula (2).
Δ＝Px-PN………………………………………(1)
Wherein:
Δ: indicating the value error;
γ: relative indication error;
Px: indicating the value of the tester to be calibrated;
PN: the settings of standard equipment.
Wherein, the error of the indication value of the test frequency is calculated as follows:
the indicating error of the test frequency is expressed by equation (3), and the relative indicating error is expressed by equation (4).
Δ＝Fx-FN………………………………………(3)
Wherein:
Δ: indicating the value error;
γ: relative indication error;
Fx: the nominal value of the tester under calibration;
FN: measured values of standard equipment.
Wherein, under the test voltage condition of 500V, the insulation resistance between the line end and the shell is not less than 100M omega.
Finally, it should be noted that: it should be understood that the above examples are only for clearly illustrating the present application and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications of this type are intended to be covered by the present invention.
Claims (6)
1. A method of calibrating an inductance tester, the method comprising the steps of:
s1: performing appearance inspection;
s2: conducting power-on inspection;
s3: insulation testing;
s4: inductance measurement and error calculation;
s5: and (4) calculating the test frequency and the error.
2. The calibration method according to claim 1, wherein the appearance check of step S1 specifically includes:
s1-1, checking whether the appearance structure is intact, and whether the panel indication, the reading instrument, the manufacturing plant, the instrument number and the model information are clearly marked;
s1-2, checking whether the exposed part of the detected instrument is loose and mechanically damaged; whether the instrument accessories, the input line and the grounding end are complete or not; whether the switch and the knob can normally rotate.
3. The calibration method according to claim 1, wherein the power-on check of step S2 specifically includes:
s2-1, switching on the power supply of the instrument to be calibrated, observing whether the reading instrument has display and display defects, and whether each switch and knob can be normally used;
s2-2 checks whether the zero reset function of the instrument to be calibrated is working properly.
4. The calibration method according to claim 1, wherein the insulation test of step S3 specifically includes:
s3-1, connecting the power supply of the insulation resistance tester, setting the test voltage to be 500V, selecting a proper measuring range, and resetting;
s3-2, connecting one test end of the insulation resistance tester to the tested device shell, and connecting one test end to the line end;
and S3-3, starting an output switch, reading and testing for not less than 10 seconds.
5. The calibration method according to claim 1, wherein the inductance measurement and the error calculation in step S4, and the calibration of the inductance measurement error adopts a direct comparison method, specifically comprising:
before S4-1 calibration, the instrument to be calibrated is electrified and preheated for more than 30 minutes;
s4-2, switching to an inductance measurement function, and selecting a measurement frequency and a measurement voltage;
s4-3, selecting a measuring range according to the standard inductance, connecting the calibrated instrument with a test cable, performing open-circuit calibration and short-circuit calibration, and resetting if the instrument has a zero resetting function; the test cable is preferably connected to a litz wire;
s4-4, connecting a two-terminal connecting circuit to connect the calibrated instrument and the standard inductor;
s4-5 measuring and reading, switching measuring range, and repeating the steps S4-1 to S4-4; the selection of the calibration point of the basic range is not less than 5 points, the selection of the calibration points of other ranges is not less than 1 point, and the calibration points are preferably selected uniformly in the corresponding ranges.
6. The calibration method according to claim 1, wherein the test frequency and the error calculation and the calibration of the inductance loss measurement error in step S5 adopt a direct comparison method, which specifically includes: the calibration of the testing frequency uses the frequency meter as the standard, the calibration procedure is the same as the steps S4-1 to S4-5, the reading of the frequency meter is used as the measured value, and the selection of the calibration point covers the working testing frequency.
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| CN107592087A (en) * | 2016-07-08 | 2018-01-16 | 弗兰克公司 | Combination inductance circuit |
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Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN2687684Y (en) * | 2003-11-24 | 2005-03-23 | 中国科学院物理研究所 | Digital capacitive-inductance measuring instrument |
| CN2743839Y (en) * | 2004-06-12 | 2005-11-30 | 横店集团东磁有限公司 | Vertical plug pin type electric parameter testing clamp |
| WO2008011035A2 (en) * | 2006-07-18 | 2008-01-24 | Cascade Microtech, Inc. | Line-reflect-reflect match calibration |
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| CN104267363A (en) * | 2014-09-26 | 2015-01-07 | 天津电气科学研究院有限公司 | High-current sensor calibration method based on standard low resistance method |
| CN104297710A (en) * | 2014-09-26 | 2015-01-21 | 天津电气科学研究院有限公司 | High-current sensor calibration method based on curve fitting method |
| US20160195598A1 (en) * | 2015-01-07 | 2016-07-07 | Texas Instruments Incorporated | Resonant inductive sensing with algorithmic control loop for tuning negative impedance to resonator impedance |
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