CN103512653B - A kind of device of the light logic gates measuring reflection light - Google Patents
A kind of device of the light logic gates measuring reflection light Download PDFInfo
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- CN103512653B CN103512653B CN201210227366.3A CN201210227366A CN103512653B CN 103512653 B CN103512653 B CN 103512653B CN 201210227366 A CN201210227366 A CN 201210227366A CN 103512653 B CN103512653 B CN 103512653B
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- light
- logic gates
- glass rod
- wave plate
- reflection light
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Abstract
The present invention discloses the device of a kind of light logic gates measuring reflection light, and described device includes setting gradually and form the laser instrument of composite construction, Glan-Foucault laser polarizer, tunable liquid crystal wave plate, corner cube prism, band reeded cylindrical glass rod, fine adjustment stage, quarter wave plate, imaging len, imageing sensor.The present invention utilizes fine adjustment stage repeatedly to finely tune the position with reeded cylindrical glass rod, it is possible to the light logic gates measuring reflection light of degree of precision.And utilize the rotation of fine adjustment stage, in that context it may be convenient to multiple tiny samplers are carried out research and analysis.
Description
Technical field
The present invention relates to a kind of optical measuring device testing field of measuring technique, specifically one and can measure reflection
The device of the light logic gates of light.
Background technology
In recent years, along with to the constantly research of classical Hall effect deeply, it has been found that a kind of novel Hall effect--
The light logic gates of logic gates, particularly uncharged particle photon (Spin Hall Effect ofLight,
SHEL).But the dependence test measurement equipment of light logic gates but can not meet current research needs at present.
Through finding the retrieval of prior art, Bliokh KY, Niv A, Kleiner V, Hasman E et al. is at Nature
Photonics2 (12), pp748-753,2008 write articles " Geometrodynamics of spinning light ", and (light spins
Geometrodynamics), this technology propose when a measuring beam transmits in cylindrical glass rod SHEL experiment dress
Put, but this device can only test thicker Glass rod, can run into the when of for the alignment of required precision higher optical fiber
Bigger difficulty.So, in actual use, this device motility is not enough, should use by more restriction.
China application number CN201010199392.0, application publication number CN102194487A, this patent discloses one
Photon-echo devices and methods therefor, its object is to solve limited echo efficiency problem, can overcome and be limited to the phase that spins
The restriction of existing storage time of shift time.But do not take measures on customs clearance and strengthen the essence measuring light logic gates
Degree.
U.S. Patent number: US8,088,615, " Optical component for observing a nanometric
Sample, system comprising same, analysis method using same, and uses thereof " (point
Optical element and the use thereof of nanoscale sample is observed in analysis), this technology discloses one and relates to observe nanoscale sample
The optical module of product, including a substrate and the index plate of predetermined thickness, it is possible to obtain relatively higher image contrast with
Precision.But do not have the application in terms of measuring light logic gates is described.
To sum up, although the device of light logic gates has obtained certain research, but has no in document that report can
The device of high precision measurement light logic gates.
Summary of the invention
The present invention is directed to deficiencies of the prior art, it is provided that a kind of light logic gates measuring reflection light
Device, use this device can obtain higher precision, and object of study can be made to obtain certain extension.
The present invention is achieved by the following technical solutions, and the present invention includes: sets gradually and forms swashing of composite construction
Light device, Glan-Foucault laser polarizer, tunable liquid crystal wave plate, corner cube prism, band reeded cylindrical glass rod, fine adjustment stage,
Quarter wave plate, imaging len, imageing sensor.
Described laser instrument be wavelength be the ultraviolet laser (Nd:YVO of 355nm4Crystal is as gain media).
Described marks diameter difference semicircle groove with reeded cylindrical glass rod on cylindrical glass rod
Glass rod.
The described a diameter of 100-1000 μm with reeded cylindrical glass rod fovea superior grain.
Described fine adjustment stage can make band reeded cylindrical glass rod rotate around its axis of symmetry.
Described fine adjustment stage is 0.01-0.2rad/ around the axis of symmetry rotary speed with reeded cylindrical glass rod
s。
Described fine adjustment stage can use the speed of 30 μm/s to be finely adjusted in the horizontal direction.
The present invention utilizes band reeded cylindrical glass rod and fine adjustment stage, in the survey meeting traditional cylindrical Glass rod
On the basis of examination, it is also possible to the optical fiber placing different-diameter in a groove is studied, add the adjustment of fine adjustment stage, it is possible to obtain
Higher precision, tests more material and sample.
To sum up, present configuration is simple, easy to use, has only to the cylindric material of different thicknesses to be studied during use
Material is placed in a groove, it is possible to carry out test and the research of the light logic gates of degree of precision.
Accompanying drawing explanation
Fig. 1 is present configuration schematic diagram.
Detailed description of the invention
Elaborating embodiments of the invention below, the present embodiment is carried out under premised on technical solution of the present invention
Implement, give detailed embodiment and concrete operating process, but protection scope of the present invention is not limited to following enforcement
Example.
Embodiment 1
As it is shown in figure 1, the device of the light logic gates of measured reflection light described in the present embodiment includes: laser instrument
1, Glan-Foucault laser polarizer 2, tunable liquid crystal wave plate 3, corner cube prism 4, carry on reeded cylindrical glass rod 5, Glass rod
Groove 6, fine adjustment stage 7, quarter wave plate 8, imaging len 9, imageing sensor 10.
In the present embodiment, described laser instrument 1 be wavelength be the ultraviolet laser (Nd:YVO of 355nm4Crystal is as gain
Medium).
In the present embodiment, described Glan-Foucault laser polarizer 2 is 2-5 group.
In the present embodiment, described tunable liquid crystal wave plate 3 is 2-5 group.
In the present embodiment, described band reeded cylindrical glass rod 5 is to mark diameter not on cylindrical glass rod
Glass rod with semicircle groove.
In the present embodiment, described band reeded cylindrical glass rod 5 can rotate around its axis of symmetry.
In the present embodiment, described band reeded cylindrical glass rod 5 rotary speeies are 0.01-0.2rad/s.
In the present embodiment, a diameter of 100-1000 μm of the groove 6 on described Glass rod.
In the present embodiment, the quantity of the groove 6 on described Glass rod is 1-100.
In the present embodiment, described fine adjustment stage 7 can use the speed of 30-500 μm/s to be finely adjusted in the horizontal direction.
The operation principle of the present embodiment is: for the light logic gates measuring reflection light of degree of precision, use micro-
Leveling platform finely tunes the position with reeded cylindrical glass rod repeatedly, until imageing sensor obtains good output.In order to
The most tiny sample of similar optical fiber is carried out high precision measurement, devises the groove that can fix its position, then coordinate micro-
The adjustment of leveling platform, conveniently can carry out research and analysis to tiny sampler.
As shown in table 1, it is as shown in the table for the application request of the present embodiment.
Table 1 can measure one group of typical design parameters of device of the light logic gates of reflection light
| Laser wavelength (nm) | 355 |
| Glan-Foucault laser polarizer quantity (group) | 2 |
| Tunable liquid crystal wave plate quantity (group) | 2 |
| Carry reeded cylindrical glass rod 5 rotary speeies (rad/s) | 0.01 |
| The diameter (μm) of the groove on Glass rod | 100 |
| The quantity (individual) of the groove on Glass rod | 20 |
| Fine adjustment stage speed (μm/s) in the horizontal direction | 30 |
To sum up, comprehensive utilization fine adjustment stage and band reeded cylindrical glass rod, it is possible to the measurement reflection of degree of precision
The light logic gates of light, and utilize the rotation of fine adjustment stage, in that context it may be convenient to multiple tiny samplers are carried out research with
Analyze.
Although present disclosure has been made to be discussed in detail by above preferred embodiment, but it should be appreciated that above-mentioned
Description is not considered as limitation of the present invention.After those skilled in the art have read foregoing, for the present invention's
Multiple amendment and replacement all will be apparent from.Therefore, protection scope of the present invention should be limited to the appended claims.
Claims (8)
1. can measure the device of light logic gates for reflection light, set gradually and form composite construction laser instrument,
Glan-Foucault laser polarizer, tunable liquid crystal wave plate, corner cube prism, band reeded cylindrical glass rod, groove on Glass rod,
Fine adjustment stage, quarter wave plate, imaging len, imageing sensor；
Glan-Foucault laser polarizer is arranged alternately with tunable liquid crystal wave plate, and two corner cube prisms are arranged on the reeded cylinder of band
Glass rod both sides；
Two groups of Glan-Foucault laser polarizeies being arranged alternately are had respectively with adjustable with after quarter wave plate after the laser along light path
Humorous liquid crystal wave plate.
The device of the light logic gates measuring reflection light the most according to claim 1, is characterized in that, described swashs
Light device be wavelength be the ultraviolet laser of 355nm.
3., according to the device of the light logic gates of the measured reflection light described in claim 1,2, it is characterized in that, described
The polariscopic quantity of Glan-Foucault laser is 2-5 group.
4., according to the device of the light logic gates of the measured reflection light described in claim 1,2, it is characterized in that, described
The quantity of tunable liquid crystal wave plate is 2-5 group.
The device of the light logic gates measuring reflection light the most according to claim 1, is characterized in that, described band
Reeded cylindrical glass rod rotary speed is 0.01-0.2rad/s.
The device of the light logic gates measuring reflection light the most according to claim 1, is characterized in that, described glass
A diameter of 100-1000 μm of the groove on glass rod.
The device of the light logic gates measuring reflection light the most according to claim 1, is characterized in that, described glass
The quantity of the groove on glass rod is 1-100.
The device of the light logic gates measuring reflection light the most according to claim 1, is characterized in that, described is micro-
Leveling platform uses the speed of 30-500 μm/s to be finely adjusted in the horizontal direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210227366.3A CN103512653B (en) | 2012-06-29 | 2012-06-29 | A kind of device of the light logic gates measuring reflection light |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210227366.3A CN103512653B (en) | 2012-06-29 | 2012-06-29 | A kind of device of the light logic gates measuring reflection light |
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| Publication Number | Publication Date |
|---|---|
| CN103512653A CN103512653A (en) | 2014-01-15 |
| CN103512653B true CN103512653B (en) | 2016-12-21 |
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Families Citing this family (7)
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| CN104569622B (en) * | 2014-12-24 | 2017-07-07 | 复旦大学 | Polarized microwave detection means based on spin of photon Hall effect |
| CN107807320B (en) * | 2017-09-27 | 2019-12-31 | 福州大学 | Method for distinguishing intrinsic and extrinsic mechanisms of semiconductor photoinduced inverse spin Hall effect |
| CN107843198A (en) * | 2017-10-18 | 2018-03-27 | 天津大学 | A kind of device for being used to measure the division displacement of light logic gates |
| CN109443554B (en) * | 2018-12-11 | 2020-08-11 | 深圳大学 | Wavelength measuring device and method based on graphene optical spin Hall effect |
| CN110412490B (en) * | 2019-08-15 | 2020-11-24 | 四川大学 | Magnetic measurement method based on optical spin Hall effect |
| CN111929627A (en) * | 2020-06-28 | 2020-11-13 | 成都信息工程大学 | Thermo-optic spinning Hall effect regulation and control device and response sensitivity measuring and calculating method |
| CN113030016B (en) * | 2021-03-04 | 2022-08-30 | 湖南理工学院 | Weak measurement-based method for identifying type of Wilson semimetal and measuring inclination of Wilson cone |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3329375A1 (en) * | 1982-11-18 | 1984-05-24 | General Electric Co., Schenectady, N.Y. | OPTICAL PROBE |
| US5760586A (en) * | 1994-12-01 | 1998-06-02 | Bruker Analytische Messtechnik | Nuclear magnetic resonance spectrometer |
| CN1270674A (en) * | 1997-09-17 | 2000-10-18 | 单一检索有限公司 | Electron devices for single electron and nuclear spin measurement |
| US7016523B1 (en) * | 1999-04-21 | 2006-03-21 | Hiroyuki Ogawa | Method for observing object by projection, method for detecting microorganisms and projection detecting system |
| GB2442752A (en) * | 2006-10-10 | 2008-04-16 | Univ Plymouth | Analysis of carrier spin polarisation using the Spin Hall Effect |
| CN101738374A (en) * | 2008-11-20 | 2010-06-16 | 株式会社日立制作所 | Spin-polarized charge carrier device |
| CN101832786A (en) * | 2010-04-12 | 2010-09-15 | 杭州鑫芯电子有限公司 | Integrated Hall-effect sensor |
| CN101832785A (en) * | 2010-04-12 | 2010-09-15 | 杭州鑫芯电子有限公司 | Regulatable Hall effect sensor |
| CN102194487A (en) * | 2010-03-12 | 2011-09-21 | 仁荷大学校产业协力团 | Optically locked photon echo apparatus and method |
-
2012
- 2012-06-29 CN CN201210227366.3A patent/CN103512653B/en not_active Expired - Fee Related
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3329375A1 (en) * | 1982-11-18 | 1984-05-24 | General Electric Co., Schenectady, N.Y. | OPTICAL PROBE |
| US5760586A (en) * | 1994-12-01 | 1998-06-02 | Bruker Analytische Messtechnik | Nuclear magnetic resonance spectrometer |
| CN1270674A (en) * | 1997-09-17 | 2000-10-18 | 单一检索有限公司 | Electron devices for single electron and nuclear spin measurement |
| US7016523B1 (en) * | 1999-04-21 | 2006-03-21 | Hiroyuki Ogawa | Method for observing object by projection, method for detecting microorganisms and projection detecting system |
| GB2442752A (en) * | 2006-10-10 | 2008-04-16 | Univ Plymouth | Analysis of carrier spin polarisation using the Spin Hall Effect |
| CN101738374A (en) * | 2008-11-20 | 2010-06-16 | 株式会社日立制作所 | Spin-polarized charge carrier device |
| CN102194487A (en) * | 2010-03-12 | 2011-09-21 | 仁荷大学校产业协力团 | Optically locked photon echo apparatus and method |
| CN101832786A (en) * | 2010-04-12 | 2010-09-15 | 杭州鑫芯电子有限公司 | Integrated Hall-effect sensor |
| CN101832785A (en) * | 2010-04-12 | 2010-09-15 | 杭州鑫芯电子有限公司 | Regulatable Hall effect sensor |
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Inventor after: Shu Yuhang Inventor before: Kang Xiaoyang |
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Effective date of registration: 20170811 Address after: No. 1 double park 224000 Dagang Dagang Town in Jiangsu province Yancheng City Chengxiang District Road No. 2 (F) Patentee after: Yancheng promise Machinery Co., Ltd. Address before: 312500 Xinchang City, Shaoxing Province, Qixing street, Zhejiang, the Yangtze River Road, No. 1 Jiangnan tea market B3 building, 2011 Co-patentee before: Kang Xiaoyang Patentee before: Xinchang County Guanyang Technology Development Co., Ltd. |
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