CN103499596A - Method and device for rapidly distinguishing variety of metal material - Google Patents
Method and device for rapidly distinguishing variety of metal material Download PDFInfo
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- CN103499596A CN103499596A CN201310469360.1A CN201310469360A CN103499596A CN 103499596 A CN103499596 A CN 103499596A CN 201310469360 A CN201310469360 A CN 201310469360A CN 103499596 A CN103499596 A CN 103499596A
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- 239000007769 metal material Substances 0.000 title claims abstract description 33
- 238000000034 method Methods 0.000 title claims abstract description 16
- 239000000523 sample Substances 0.000 claims abstract description 53
- 238000001514 detection method Methods 0.000 claims abstract description 26
- 239000000463 material Substances 0.000 claims abstract description 17
- 239000002184 metal Substances 0.000 claims abstract description 11
- 229910052751 metal Inorganic materials 0.000 claims abstract description 11
- 238000010438 heat treatment Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 claims description 3
- 238000004458 analytical method Methods 0.000 abstract description 6
- 239000000203 mixture Substances 0.000 abstract description 5
- 230000005678 Seebeck effect Effects 0.000 abstract description 3
- 239000000126 substance Substances 0.000 abstract description 3
- 238000005516 engineering process Methods 0.000 description 3
- 229910001069 Ti alloy Inorganic materials 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 230000005619 thermoelectricity Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
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Abstract
本发明公开了一种快速分辨金属材料品种的方法及装置，采用已知成分的标准金属试样制作探头，使加热的探头与待检测的金属材料的表面接触，使待检测的金属材料通过探头及相应的导线组成回路，当回路中的电势差为0时，则确定待检测的金属成品制件与探头为相同材料。本发明利用金属材料的塞贝克效应，只需要通过加热探头并使之与待检测的金属材料组成回路，检测回路中的电势差即可判断待检测的金属材料是否与探头材料相同，完全改变测定金属材料的传统分析方法如化学成分分析法、金相法等，无需将检测的试样搬运至实验室，也不会对检测的试样造成损伤，在极大的提高了检测效率的同时，保证了检测的安全性。
The invention discloses a method and device for quickly distinguishing the types of metal materials. A standard metal sample with known composition is used to make a probe, and the heated probe is brought into contact with the surface of the metal material to be detected, so that the metal material to be detected passes through the probe. And the corresponding wires form a loop. When the potential difference in the loop is 0, it is determined that the metal product to be detected is the same material as the probe. The invention utilizes the Seebeck effect of metal materials, only needs to heat the probe and make it form a circuit with the metal material to be detected, and detect the potential difference in the circuit to determine whether the metal material to be detected is the same as the probe material, completely changing the detection of metal Traditional analysis methods of materials, such as chemical composition analysis, metallographic method, etc., do not need to transport the tested sample to the laboratory, and will not cause damage to the tested sample, which greatly improves the detection efficiency and ensures the detection efficiency. security.
Description
Technical field
The present invention relates to metal material field, especially a kind of method and device of quick resolution metal material kind.
Background technology
It is given full play to the usability of material to correct use metal material and the life-span of raising product is self-evident.Therefore just must analyze mensuration to the kind of metal material.Modal analyzing detecting method has that chemical composition analysis is sent out, spark polishing identification method and metallographic observation method.
Along with developing rapidly of China's science and technology, the technology such as space flight, aviation have had marked improvement, in these technical fields, the material of product component are had to strict requirement.Yet product may have material in process of production when makeing mistakes, and just finds after having produced a large amount of finished products that sometimes product has the phenomenon of batch mixing, now, if all products are all scrapped and certainly will be caused serious waste.And adopt existing detection method to be detected the composition of product, not only efficiency is low, and can damage product.Therefore, existing detection method can't effectively detect Prefabricated parts.
Summary of the invention
The objective of the invention is: a kind of method and device of quick resolution metal material kind are provided, and it can be fast, efficient and harmless metal finished product product is carried out to the constituent analysis detection, to overcome the deficiencies in the prior art.
The present invention is achieved in that the method for quick resolution metal material kind, adopt the standard metal sample production probe of principal component, make probe be heated to 100-400 ℃, make the probe of heating and the Surface Contact of metal material to be detected, make metal material to be detected form loop by probe and corresponding wire, when the electric potential difference in loop is 0, determine that metal finished product product to be detected and probe are same material.
Differentiate fast the device of metal material kind, comprise milivoltmeter, on two connecting lines of milivoltmeter, be connected with respectively hot junction detection probe and cold probe, be provided with the heated constant temperature cover outside the detection probe of hot junction.
Be provided with Quick connection sleeve in the connecting line termination be connected with the hot junction detection probe, the hot junction detection probe is connected with connecting line by Quick connection sleeve.Such structure is convenient for changing the hot junction detection probe of different materials, realizes that the hot junction detection probe is connected with the quick of connecting line.
Principle of the present invention is: according to the thermoelectricity capability of metal material, when existing temperature difference at two ends, metal material will produce thermoelectrical potential, the thermoelectrical potential that the metal material of heterogeneity produces under the identical temperature difference is also different, so the metallic conductor of two kinds of heterogeneities forms closed-loop path, when there is temperature difference in the contact two ends, just there is thermoelectrical potential in loop and have thermocurrent to pass through, so-called Seebeck effect that Here it is.
Therefore, as long as design temperature is poor and a kind of known metal material (standard sample), just can differentiate conversely another kind of unknown metal material.
The present invention utilizes above-mentioned principle exactly, under metastable temperature difference, fixes the material (standard sample) of a probe, and whether the electric potential difference of utilization probe material and detected materials is differentiated detected materials identical with the probe material.
Owing to having adopted technique scheme, compared with prior art, the present invention utilizes the Seebeck effect of metal material, only need to and make it by heated probe to form loop with metal material to be detected, the electric potential difference detected in loop can judge that whether metal material to be detected is identical with the probe material, change the traditional analysis of mensuration metal material fully as the chemical composition analysis method, metallographic method etc., without the Sample transportation by detecting to laboratory, can not cause damage to the sample detected yet, when having improved detection efficiency greatly, guaranteed the security detected.Thinking novelty of the present invention, simple structure, with low cost, easy to carry, swift to operate, result is accurate, remarkable benefit, result of use is good.
The accompanying drawing explanation
Accompanying drawing 1 is structural representation of the present invention.
Embodiment
Embodiments of the invention: the method for differentiating fast the metal material kind, adopt biphase titanium alloy TC11 to be made into hot junction detection probe 3, make hot junction detection probe 3 be heated to 250 ℃, the Surface Contact of the hot junction detection probe 3 that makes heating and metal finished product product 7 to be detected, metal finished product product 7 to be detected is connected and forms loop by hot junction detection probe 3 with milivoltmeter 1, when the voltage on milivoltmeter 1 is 0, determining that metal finished product product to be detected 7 and probe are same material, is two-way titanium alloy T C11.
The structure of the device of resolution metal material kind as shown in Figure 1, comprises milivoltmeter 1 fast, is connected with respectively hot junction detection probe 3 and cold probe 4 on two connecting lines 2 of milivoltmeter 1, is provided with heated constant temperature cover 5 outside hot junction detection probe 3; Be provided with Quick connection sleeve 6 in connecting line 2 terminations that are connected with hot junction detection probe 3, hot junction detection probe 3 is connected with connecting line 2 by Quick connection sleeve 6.Quick connection sleeve 6 materials are identical with connecting line 2, between Quick connection sleeve 6 and connecting line 2, be good fixedly contacting, between Quick connection sleeve 6 and hot junction detection probe 3, be threaded (also can select as required, other to be convenient to the connected mode of Fast Installation dismounting).
Claims (3)
1. a method of differentiating fast the metal material kind, it is characterized in that: adopt the standard metal sample production probe of principal component, probe is heated to 100-400 ℃, make the probe of heating and the Surface Contact of metal material to be detected, make metal material to be detected form loop by probe and corresponding wire, when the electric potential difference in loop is zero, determine that metal finished product product to be detected and probe are same material.
2. a device that adopts the method for quick resolution metal material kind claimed in claim 1, comprise milivoltmeter (1), it is characterized in that: be connected with respectively hot junction detection probe (3) and cold probe (4) on two connecting lines (2) of milivoltmeter (1), be provided with heated constant temperature cover (5) outside hot junction detection probe (3).
3. the device of quick resolution metal material kind according to claim 2, it is characterized in that: be provided with Quick connection sleeve (6) in connecting line (2) termination be connected with hot junction detection probe (3), hot junction detection probe (3) is connected with connecting line (2) by Quick connection sleeve (6).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310469360.1A CN103499596B (en) | 2013-10-10 | 2013-10-10 | The method of quick resolution variety of metal material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310469360.1A CN103499596B (en) | 2013-10-10 | 2013-10-10 | The method of quick resolution variety of metal material |
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| Publication Number | Publication Date |
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| CN103499596A true CN103499596A (en) | 2014-01-08 |
| CN103499596B CN103499596B (en) | 2015-12-23 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201310469360.1A Expired - Fee Related CN103499596B (en) | 2013-10-10 | 2013-10-10 | The method of quick resolution variety of metal material |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792264A (en) * | 2014-01-26 | 2014-05-14 | 李永亮 | Conductor purity detection device |
| CN106596638A (en) * | 2016-11-18 | 2017-04-26 | 西安琦丰光电科技有限公司 | Nondestructive testing apparatus and method for infiltrated layer on surface of dissimilar metal |
| CN107247069A (en) * | 2017-06-19 | 2017-10-13 | 武汉嘉仪通科技有限公司 | A kind of portable set of quick detection thermoelectric material Seebeck coefficient |
| CN108613996A (en) * | 2018-05-03 | 2018-10-02 | 苏州萌炯贸易有限公司 | The method of fast resolution variety of metal material |
| CN109406565A (en) * | 2017-08-15 | 2019-03-01 | 中国科学院上海硅酸盐研究所 | A kind of characterizing method of the chemical constituents analysis of blocks of large material |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2253831Y (en) * | 1995-12-11 | 1997-05-07 | 上海申佳铁合金有限公司 | On-site quick silicon content analyzer for trace carbon chrome iron furnace |
| JP2008170406A (en) * | 2007-01-11 | 2008-07-24 | Resuka:Kk | Solder component measuring method, analyzer used for measuring solder component, and solder sample maker |
| CN101354388A (en) * | 2008-09-02 | 2009-01-28 | 北京大学 | A method and system for measuring the Seebeck coefficient of quasi-one-dimensional nanomaterials |
| JP2010151608A (en) * | 2008-12-25 | 2010-07-08 | Toshiba Corp | Method and test sample for evaluating flame retardancy of sealing resin |
-
2013
- 2013-10-10 CN CN201310469360.1A patent/CN103499596B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2253831Y (en) * | 1995-12-11 | 1997-05-07 | 上海申佳铁合金有限公司 | On-site quick silicon content analyzer for trace carbon chrome iron furnace |
| JP2008170406A (en) * | 2007-01-11 | 2008-07-24 | Resuka:Kk | Solder component measuring method, analyzer used for measuring solder component, and solder sample maker |
| CN101354388A (en) * | 2008-09-02 | 2009-01-28 | 北京大学 | A method and system for measuring the Seebeck coefficient of quasi-one-dimensional nanomaterials |
| JP2010151608A (en) * | 2008-12-25 | 2010-07-08 | Toshiba Corp | Method and test sample for evaluating flame retardancy of sealing resin |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792264A (en) * | 2014-01-26 | 2014-05-14 | 李永亮 | Conductor purity detection device |
| CN106596638A (en) * | 2016-11-18 | 2017-04-26 | 西安琦丰光电科技有限公司 | Nondestructive testing apparatus and method for infiltrated layer on surface of dissimilar metal |
| CN106596638B (en) * | 2016-11-18 | 2018-12-11 | 西安琦丰光电科技有限公司 | A kind of dissimilar metal surface infiltration layer non-destructive testing device and detection method |
| CN107247069A (en) * | 2017-06-19 | 2017-10-13 | 武汉嘉仪通科技有限公司 | A kind of portable set of quick detection thermoelectric material Seebeck coefficient |
| CN109406565A (en) * | 2017-08-15 | 2019-03-01 | 中国科学院上海硅酸盐研究所 | A kind of characterizing method of the chemical constituents analysis of blocks of large material |
| CN108613996A (en) * | 2018-05-03 | 2018-10-02 | 苏州萌炯贸易有限公司 | The method of fast resolution variety of metal material |
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| CN103499596B (en) | 2015-12-23 |
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Effective date of registration: 20190820 Address after: 550025 Mingzheng Building 220, West Campus of Guizhou University, Huaxi District, Guiyang City, Guizhou Province Patentee after: Guizhou Zhihui Craftsman Technology Co., Ltd. Address before: 550025 science and Technology Department, north campus, Guizhou University, Huaxi, Guizhou, China Patentee before: Guizhou University |
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Granted publication date: 20151223 Termination date: 20191010 |