CN103499596A - Method and device for rapidly distinguishing variety of metal material - Google Patents

Method and device for rapidly distinguishing variety of metal material Download PDF

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Publication number
CN103499596A
CN103499596A CN201310469360.1A CN201310469360A CN103499596A CN 103499596 A CN103499596 A CN 103499596A CN 201310469360 A CN201310469360 A CN 201310469360A CN 103499596 A CN103499596 A CN 103499596A
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China
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probe
metal material
detected
metal
hot junction
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CN201310469360.1A
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CN103499596B (en
Inventor
孙捷
万明攀
先桁
朱绍严
庞驰
王天鹏
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Guizhou Zhihui Craftsman Technology Co., Ltd.
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Guizhou University
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Abstract

The invention discloses a method and a device for rapidly distinguishing variety of a metal material. The method comprises the following steps: manufacturing a probe by adopting a standard metal sample with known components, so that the heated probe is contacted with the surface of a metal material to be detected, and the detected metal material and a corresponding wire form a circuit through the probe; and determining that the metal finished part to be detected and the probe are made of the same material when potential difference in the circuit is 0. According to a Seebeck effect of the metal material, only the probe needs to be heated and forms a circuit with the metal material to be detected, and the potential difference in the circuit is detected, so that whether the metal material to be detected is the same as the probe material can be judged. Traditional analysis methods, such as a chemical component analysis method and a metallographic method, for measuring the metal material are completely changed, the detected sample does not need to be transported to a lab, the detected sample is not damaged, the detection efficiency is greatly improved, and the detection safety is guaranteed.

Description

Differentiate fast method and the device of metal material kind
Technical field
The present invention relates to metal material field, especially a kind of method and device of quick resolution metal material kind.
Background technology
It is given full play to the usability of material to correct use metal material and the life-span of raising product is self-evident.Therefore just must analyze mensuration to the kind of metal material.Modal analyzing detecting method has that chemical composition analysis is sent out, spark polishing identification method and metallographic observation method.
Along with developing rapidly of China's science and technology, the technology such as space flight, aviation have had marked improvement, in these technical fields, the material of product component are had to strict requirement.Yet product may have material in process of production when makeing mistakes, and just finds after having produced a large amount of finished products that sometimes product has the phenomenon of batch mixing, now, if all products are all scrapped and certainly will be caused serious waste.And adopt existing detection method to be detected the composition of product, not only efficiency is low, and can damage product.Therefore, existing detection method can't effectively detect Prefabricated parts.
Summary of the invention
The objective of the invention is: a kind of method and device of quick resolution metal material kind are provided, and it can be fast, efficient and harmless metal finished product product is carried out to the constituent analysis detection, to overcome the deficiencies in the prior art.
The present invention is achieved in that the method for quick resolution metal material kind, adopt the standard metal sample production probe of principal component, make probe be heated to 100-400 ℃, make the probe of heating and the Surface Contact of metal material to be detected, make metal material to be detected form loop by probe and corresponding wire, when the electric potential difference in loop is 0, determine that metal finished product product to be detected and probe are same material.
Differentiate fast the device of metal material kind, comprise milivoltmeter, on two connecting lines of milivoltmeter, be connected with respectively hot junction detection probe and cold probe, be provided with the heated constant temperature cover outside the detection probe of hot junction.
Be provided with Quick connection sleeve in the connecting line termination be connected with the hot junction detection probe, the hot junction detection probe is connected with connecting line by Quick connection sleeve.Such structure is convenient for changing the hot junction detection probe of different materials, realizes that the hot junction detection probe is connected with the quick of connecting line.
Principle of the present invention is: according to the thermoelectricity capability of metal material, when existing temperature difference at two ends, metal material will produce thermoelectrical potential, the thermoelectrical potential that the metal material of heterogeneity produces under the identical temperature difference is also different, so the metallic conductor of two kinds of heterogeneities forms closed-loop path, when there is temperature difference in the contact two ends, just there is thermoelectrical potential in loop and have thermocurrent to pass through, so-called Seebeck effect that Here it is.
Therefore, as long as design temperature is poor and a kind of known metal material (standard sample), just can differentiate conversely another kind of unknown metal material.
The present invention utilizes above-mentioned principle exactly, under metastable temperature difference, fixes the material (standard sample) of a probe, and whether the electric potential difference of utilization probe material and detected materials is differentiated detected materials identical with the probe material.
Owing to having adopted technique scheme, compared with prior art, the present invention utilizes the Seebeck effect of metal material, only need to and make it by heated probe to form loop with metal material to be detected, the electric potential difference detected in loop can judge that whether metal material to be detected is identical with the probe material, change the traditional analysis of mensuration metal material fully as the chemical composition analysis method, metallographic method etc., without the Sample transportation by detecting to laboratory, can not cause damage to the sample detected yet, when having improved detection efficiency greatly, guaranteed the security detected.Thinking novelty of the present invention, simple structure, with low cost, easy to carry, swift to operate, result is accurate, remarkable benefit, result of use is good.
The accompanying drawing explanation
Accompanying drawing 1 is structural representation of the present invention.
Embodiment
Embodiments of the invention: the method for differentiating fast the metal material kind, adopt biphase titanium alloy TC11 to be made into hot junction detection probe 3, make hot junction detection probe 3 be heated to 250 ℃, the Surface Contact of the hot junction detection probe 3 that makes heating and metal finished product product 7 to be detected, metal finished product product 7 to be detected is connected and forms loop by hot junction detection probe 3 with milivoltmeter 1, when the voltage on milivoltmeter 1 is 0, determining that metal finished product product to be detected 7 and probe are same material, is two-way titanium alloy T C11.
The structure of the device of resolution metal material kind as shown in Figure 1, comprises milivoltmeter 1 fast, is connected with respectively hot junction detection probe 3 and cold probe 4 on two connecting lines 2 of milivoltmeter 1, is provided with heated constant temperature cover 5 outside hot junction detection probe 3; Be provided with Quick connection sleeve 6 in connecting line 2 terminations that are connected with hot junction detection probe 3, hot junction detection probe 3 is connected with connecting line 2 by Quick connection sleeve 6.Quick connection sleeve 6 materials are identical with connecting line 2, between Quick connection sleeve 6 and connecting line 2, be good fixedly contacting, between Quick connection sleeve 6 and hot junction detection probe 3, be threaded (also can select as required, other to be convenient to the connected mode of Fast Installation dismounting).

Claims (3)

1. a method of differentiating fast the metal material kind, it is characterized in that: adopt the standard metal sample production probe of principal component, probe is heated to 100-400 ℃, make the probe of heating and the Surface Contact of metal material to be detected, make metal material to be detected form loop by probe and corresponding wire, when the electric potential difference in loop is zero, determine that metal finished product product to be detected and probe are same material.
2. a device that adopts the method for quick resolution metal material kind claimed in claim 1, comprise milivoltmeter (1), it is characterized in that: be connected with respectively hot junction detection probe (3) and cold probe (4) on two connecting lines (2) of milivoltmeter (1), be provided with heated constant temperature cover (5) outside hot junction detection probe (3).
3. the device of quick resolution metal material kind according to claim 2, it is characterized in that: be provided with Quick connection sleeve (6) in connecting line (2) termination be connected with hot junction detection probe (3), hot junction detection probe (3) is connected with connecting line (2) by Quick connection sleeve (6).
CN201310469360.1A 2013-10-10 2013-10-10 The method of quick resolution variety of metal material Expired - Fee Related CN103499596B (en)

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CN103499596B CN103499596B (en) 2015-12-23

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103792264A (en) * 2014-01-26 2014-05-14 李永亮 Conductor purity detection device
CN106596638A (en) * 2016-11-18 2017-04-26 西安琦丰光电科技有限公司 Nondestructive testing apparatus and method for infiltrated layer on surface of dissimilar metal
CN107247069A (en) * 2017-06-19 2017-10-13 武汉嘉仪通科技有限公司 A kind of portable set of quick detection thermoelectric material Seebeck coefficient
CN108613996A (en) * 2018-05-03 2018-10-02 苏州萌炯贸易有限公司 The method of fast resolution variety of metal material
CN109406565A (en) * 2017-08-15 2019-03-01 中国科学院上海硅酸盐研究所 A kind of characterizing method of the chemical constituents analysis of blocks of large material

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2253831Y (en) * 1995-12-11 1997-05-07 上海申佳铁合金有限公司 On-site quick silicon content analyzer for trace carbon chrome iron furnace
JP2008170406A (en) * 2007-01-11 2008-07-24 Resuka:Kk Measuring method for solder component, analyzer used in measurement of solder component and solder sample manufacturing device
CN101354388A (en) * 2008-09-02 2009-01-28 北京大学 Method and system for measuring quasi one-dimensional nano-material Seebeck coefficient
JP2010151608A (en) * 2008-12-25 2010-07-08 Toshiba Corp Method and test sample for evaluating flame retardancy of sealing resin

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2253831Y (en) * 1995-12-11 1997-05-07 上海申佳铁合金有限公司 On-site quick silicon content analyzer for trace carbon chrome iron furnace
JP2008170406A (en) * 2007-01-11 2008-07-24 Resuka:Kk Measuring method for solder component, analyzer used in measurement of solder component and solder sample manufacturing device
CN101354388A (en) * 2008-09-02 2009-01-28 北京大学 Method and system for measuring quasi one-dimensional nano-material Seebeck coefficient
JP2010151608A (en) * 2008-12-25 2010-07-08 Toshiba Corp Method and test sample for evaluating flame retardancy of sealing resin

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103792264A (en) * 2014-01-26 2014-05-14 李永亮 Conductor purity detection device
CN106596638A (en) * 2016-11-18 2017-04-26 西安琦丰光电科技有限公司 Nondestructive testing apparatus and method for infiltrated layer on surface of dissimilar metal
CN106596638B (en) * 2016-11-18 2018-12-11 西安琦丰光电科技有限公司 A kind of dissimilar metal surface infiltration layer non-destructive testing device and detection method
CN107247069A (en) * 2017-06-19 2017-10-13 武汉嘉仪通科技有限公司 A kind of portable set of quick detection thermoelectric material Seebeck coefficient
CN109406565A (en) * 2017-08-15 2019-03-01 中国科学院上海硅酸盐研究所 A kind of characterizing method of the chemical constituents analysis of blocks of large material
CN108613996A (en) * 2018-05-03 2018-10-02 苏州萌炯贸易有限公司 The method of fast resolution variety of metal material

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Effective date of registration: 20190820

Address after: 550025 Mingzheng Building 220, West Campus of Guizhou University, Huaxi District, Guiyang City, Guizhou Province

Patentee after: Guizhou Zhihui Craftsman Technology Co., Ltd.

Address before: 550025 science and Technology Department, north campus, Guizhou University, Huaxi, Guizhou, China

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