CN103792264A - Conductor purity detection device - Google Patents
Conductor purity detection device Download PDFInfo
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- CN103792264A CN103792264A CN201410043999.8A CN201410043999A CN103792264A CN 103792264 A CN103792264 A CN 103792264A CN 201410043999 A CN201410043999 A CN 201410043999A CN 103792264 A CN103792264 A CN 103792264A
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- single chip
- chip computer
- chip microcomputer
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Abstract
The invention discloses a conductor purity detection device, which comprises a power supply, an LCD (Liquid Crystal Display), a single chip computer, a detection electrode, a sampling resistor and a PTC (Positive Temperature Coefficient) heating end, wherein the power supply is sequentially connected with the LCD, the single chip computer and the PTC heating end, the LCD is connected with the single chip computer, the detection electrode is connected with the sampling resistor which is connected with the A/D end of the single chip computer, the single chip computer is also connected with the PTC heating end. The conductor purity detection device is fast in detecting, accurate in results, and reliable in data, as well as suitable for different metal materials, small in volume, simple in structure, low in cost and wide in application range.
Description
Technical field
The present invention relates to a kind of pick-up unit, be specifically related to a kind of wire purity detecting device.
Background technology
The method that detects at present wire purity mainly contains two kinds, one is comparatively accurately chemical composition quantitative analysis method, need to coordinate specialized equipment and personnel to complete in specific laboratory, accuracy of detection be high, sense cycle is long, testing cost is high, is applicable to scientific research institution or wire manufacturer; Another kind is pairing comparision, contrast by the gauge wire of tested wire and same specification, observe the difference of physical parameter, as weight, color, gloss, soft durometer etc., although succinctly convenient, but the experience and the resolution characteristic that need observer, accuracy, consistance are all very poor, and its result can only make reference.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of wire purity detecting device, utilizes Seebeck principle, coordinates corresponding Check processing circuit just can demonstrate the purity difference of tested wire and gauge wire.
For solving the problems of the technologies described above, embodiments of the invention provide a kind of wire purity detecting device, comprise power supply, LCD liquid crystal display, single-chip microcomputer, detecting electrode, sample resistance and PTC fire end, described power supply is connected with LCD liquid crystal display, single-chip microcomputer and PTC fire end in turn, described LCD display is connected with single-chip microcomputer, described detecting electrode connects sample resistance, and sample resistance is connected with the A/D end of single-chip microcomputer, is also connected with PTC fire end on described single-chip microcomputer.
Wherein, the method that the present invention detects wire purity is to adopt Seebeck principle, allows tested wire and gauge wire form thermopair, has under the condition of the temperature difference and detects the size of thermoelectrical potential, thereby judge the size of tested wire and gauge wire difference at two end points
The invention has the beneficial effects as follows: detection is quick, result is accurate, data are reliable; Be applicable to different metal materials; Volume is small and exquisite, simple in structure, with low cost, be widely used.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Embodiment
For making the technical problem to be solved in the present invention, technical scheme and advantage clearer, be described in detail below in conjunction with the accompanying drawings and the specific embodiments.
The present invention is directed to existing deficiency wire purity detecting device is provided, comprise power supply (1), LCD liquid crystal display 2, single-chip microcomputer 3, detecting electrode 4, sample resistance 5 and PTC fire end 6, described power supply 1 is connected with LCD liquid crystal display 2, single-chip microcomputer 3 and PTC fire end 6 in turn, described LCD display 2 is connected with single-chip microcomputer 3, described detecting electrode 4 connects sample resistance 5, sample resistance 5 is connected with the A/D end of single-chip microcomputer 3, on described single-chip microcomputer 3, is also connected with PTC fire end 6.
Principle of work of the present invention is: material conductor (being called thermocouple wire material or thermode) the composition closed-loop path based on Seebeck effect when two kinds of different components, and the temperature difference at two ends, two abutments, while there is thermograde, in loop, just having electric current passes through, now between sample resistance two ends, just there is electromotive force, the difference existence function relation of this electric potential difference and two kinds of wire compositions.Utilize corresponding Check processing circuit just can demonstrate the purity difference of tested wire and gauge wire, become the best instrument of selecting qualified wire.Check processing circuit is controlled PTC fire end, at 100 degrees Celsius, makes two wire end points formation temperatures poor heating and temperature control, if tested wire meets standard, it is qualified to show, shows that Reinheitszahl, purity are less than 70% demonstration purity too low if variant.70%-100% purity shows continuously
The above is the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, do not departing under the prerequisite of principle of the present invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.
Claims (1)
1. wire purity detecting device, it is characterized in that, comprise power supply (1), LCD liquid crystal display (2), single-chip microcomputer (3), detecting electrode (4), sample resistance (5) and PTC fire end (6), described power supply (1) is connected with LCD liquid crystal display (2) in turn, single-chip microcomputer (3) and PTC fire end (6), described LCD display (2) is connected with single-chip microcomputer (3), described detecting electrode (4) connects sample resistance (5), sample resistance (5) is connected with the A/D end of single-chip microcomputer (3), on described single-chip microcomputer (3), be also connected with PTC fire end (6).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410043999.8A CN103792264A (en) | 2014-01-26 | 2014-01-26 | Conductor purity detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410043999.8A CN103792264A (en) | 2014-01-26 | 2014-01-26 | Conductor purity detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103792264A true CN103792264A (en) | 2014-05-14 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN201410043999.8A Pending CN103792264A (en) | 2014-01-26 | 2014-01-26 | Conductor purity detection device |
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| CN (1) | CN103792264A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105223329A (en) * | 2015-09-18 | 2016-01-06 | 重庆大学 | Based on the Transformer Winding material discrimination method of thermoelectric effect |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6186642A (en) * | 1984-10-04 | 1986-05-02 | Sumitomo Metal Ind Ltd | Metal analyzing apparatus |
| CN2253831Y (en) * | 1995-12-11 | 1997-05-07 | 上海申佳铁合金有限公司 | On-site quick silicon content analyzer for trace carbon chrome iron furnace |
| RU2119661C1 (en) * | 1996-06-14 | 1998-09-27 | Акционерное общество "Кузнецкий металлургический комбинат" | Thermoelectric device to test content of impurities in metals and alloys |
| CN103499596A (en) * | 2013-10-10 | 2014-01-08 | 贵州大学 | Method and device for rapidly distinguishing variety of metal material |
-
2014
- 2014-01-26 CN CN201410043999.8A patent/CN103792264A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6186642A (en) * | 1984-10-04 | 1986-05-02 | Sumitomo Metal Ind Ltd | Metal analyzing apparatus |
| CN2253831Y (en) * | 1995-12-11 | 1997-05-07 | 上海申佳铁合金有限公司 | On-site quick silicon content analyzer for trace carbon chrome iron furnace |
| RU2119661C1 (en) * | 1996-06-14 | 1998-09-27 | Акционерное общество "Кузнецкий металлургический комбинат" | Thermoelectric device to test content of impurities in metals and alloys |
| CN103499596A (en) * | 2013-10-10 | 2014-01-08 | 贵州大学 | Method and device for rapidly distinguishing variety of metal material |
Non-Patent Citations (1)
| Title |
|---|
| 赵立军 等: "《电动汽车测试与评价》", 31 July 2012, 北京大学出版社 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105223329A (en) * | 2015-09-18 | 2016-01-06 | 重庆大学 | Based on the Transformer Winding material discrimination method of thermoelectric effect |
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Inventor after: Qi Fenghe Inventor after: Liu Luming Inventor after: Xu Quanyou Inventor after: Chen Zuofeng Inventor after: Cui Feng Inventor after: Lin Fang Inventor after: Xiong Chunyu Inventor after: Sun Ying Inventor after: Li Yongliang Inventor after: Zhang Shuang Inventor after: Yu Yazhong Inventor after: Pei Boyu Inventor before: Qi Fenghe Inventor before: Liu Luming Inventor before: Xu Quanyou Inventor before: Chen Zuofeng Inventor before: Cui Feng Inventor before: Lin Fang Inventor before: Xiong Chunyu Inventor before: Sun Ying Inventor before: Li Yongliang Inventor before: Zhang Shuang Inventor before: Yu Yazhong Inventor before: Pei Boyu |
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| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20140514 |