CN103792264A - Conductor purity detection device - Google Patents

Conductor purity detection device Download PDF

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Publication number
CN103792264A
CN103792264A CN201410043999.8A CN201410043999A CN103792264A CN 103792264 A CN103792264 A CN 103792264A CN 201410043999 A CN201410043999 A CN 201410043999A CN 103792264 A CN103792264 A CN 103792264A
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CN
China
Prior art keywords
single chip
chip computer
chip microcomputer
lcd
wire
Prior art date
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Pending
Application number
CN201410043999.8A
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Chinese (zh)
Inventor
齐凤河
崔峰
林芳
熊春宇
孙影
李永亮
张爽
于亚忠
裴博宇
刘禄明
许全友
陈佐锋
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Individual
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Individual
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Priority to CN201410043999.8A priority Critical patent/CN103792264A/en
Publication of CN103792264A publication Critical patent/CN103792264A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a conductor purity detection device, which comprises a power supply, an LCD (Liquid Crystal Display), a single chip computer, a detection electrode, a sampling resistor and a PTC (Positive Temperature Coefficient) heating end, wherein the power supply is sequentially connected with the LCD, the single chip computer and the PTC heating end, the LCD is connected with the single chip computer, the detection electrode is connected with the sampling resistor which is connected with the A/D end of the single chip computer, the single chip computer is also connected with the PTC heating end. The conductor purity detection device is fast in detecting, accurate in results, and reliable in data, as well as suitable for different metal materials, small in volume, simple in structure, low in cost and wide in application range.

Description

Wire purity detecting device
Technical field
The present invention relates to a kind of pick-up unit, be specifically related to a kind of wire purity detecting device.
Background technology
The method that detects at present wire purity mainly contains two kinds, one is comparatively accurately chemical composition quantitative analysis method, need to coordinate specialized equipment and personnel to complete in specific laboratory, accuracy of detection be high, sense cycle is long, testing cost is high, is applicable to scientific research institution or wire manufacturer; Another kind is pairing comparision, contrast by the gauge wire of tested wire and same specification, observe the difference of physical parameter, as weight, color, gloss, soft durometer etc., although succinctly convenient, but the experience and the resolution characteristic that need observer, accuracy, consistance are all very poor, and its result can only make reference.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of wire purity detecting device, utilizes Seebeck principle, coordinates corresponding Check processing circuit just can demonstrate the purity difference of tested wire and gauge wire.
For solving the problems of the technologies described above, embodiments of the invention provide a kind of wire purity detecting device, comprise power supply, LCD liquid crystal display, single-chip microcomputer, detecting electrode, sample resistance and PTC fire end, described power supply is connected with LCD liquid crystal display, single-chip microcomputer and PTC fire end in turn, described LCD display is connected with single-chip microcomputer, described detecting electrode connects sample resistance, and sample resistance is connected with the A/D end of single-chip microcomputer, is also connected with PTC fire end on described single-chip microcomputer.
Wherein, the method that the present invention detects wire purity is to adopt Seebeck principle, allows tested wire and gauge wire form thermopair, has under the condition of the temperature difference and detects the size of thermoelectrical potential, thereby judge the size of tested wire and gauge wire difference at two end points
The invention has the beneficial effects as follows: detection is quick, result is accurate, data are reliable; Be applicable to different metal materials; Volume is small and exquisite, simple in structure, with low cost, be widely used.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Embodiment
For making the technical problem to be solved in the present invention, technical scheme and advantage clearer, be described in detail below in conjunction with the accompanying drawings and the specific embodiments.
The present invention is directed to existing deficiency wire purity detecting device is provided, comprise power supply (1), LCD liquid crystal display 2, single-chip microcomputer 3, detecting electrode 4, sample resistance 5 and PTC fire end 6, described power supply 1 is connected with LCD liquid crystal display 2, single-chip microcomputer 3 and PTC fire end 6 in turn, described LCD display 2 is connected with single-chip microcomputer 3, described detecting electrode 4 connects sample resistance 5, sample resistance 5 is connected with the A/D end of single-chip microcomputer 3, on described single-chip microcomputer 3, is also connected with PTC fire end 6.
Principle of work of the present invention is: material conductor (being called thermocouple wire material or thermode) the composition closed-loop path based on Seebeck effect when two kinds of different components, and the temperature difference at two ends, two abutments, while there is thermograde, in loop, just having electric current passes through, now between sample resistance two ends, just there is electromotive force, the difference existence function relation of this electric potential difference and two kinds of wire compositions.Utilize corresponding Check processing circuit just can demonstrate the purity difference of tested wire and gauge wire, become the best instrument of selecting qualified wire.Check processing circuit is controlled PTC fire end, at 100 degrees Celsius, makes two wire end points formation temperatures poor heating and temperature control, if tested wire meets standard, it is qualified to show, shows that Reinheitszahl, purity are less than 70% demonstration purity too low if variant.70%-100% purity shows continuously
The above is the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, do not departing under the prerequisite of principle of the present invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.

Claims (1)

1. wire purity detecting device, it is characterized in that, comprise power supply (1), LCD liquid crystal display (2), single-chip microcomputer (3), detecting electrode (4), sample resistance (5) and PTC fire end (6), described power supply (1) is connected with LCD liquid crystal display (2) in turn, single-chip microcomputer (3) and PTC fire end (6), described LCD display (2) is connected with single-chip microcomputer (3), described detecting electrode (4) connects sample resistance (5), sample resistance (5) is connected with the A/D end of single-chip microcomputer (3), on described single-chip microcomputer (3), be also connected with PTC fire end (6).
CN201410043999.8A 2014-01-26 2014-01-26 Conductor purity detection device Pending CN103792264A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410043999.8A CN103792264A (en) 2014-01-26 2014-01-26 Conductor purity detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410043999.8A CN103792264A (en) 2014-01-26 2014-01-26 Conductor purity detection device

Publications (1)

Publication Number Publication Date
CN103792264A true CN103792264A (en) 2014-05-14

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CN201410043999.8A Pending CN103792264A (en) 2014-01-26 2014-01-26 Conductor purity detection device

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CN (1) CN103792264A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105223329A (en) * 2015-09-18 2016-01-06 重庆大学 Based on the Transformer Winding material discrimination method of thermoelectric effect

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6186642A (en) * 1984-10-04 1986-05-02 Sumitomo Metal Ind Ltd Metal analyzing apparatus
CN2253831Y (en) * 1995-12-11 1997-05-07 上海申佳铁合金有限公司 On-site quick silicon content analyzer for trace carbon chrome iron furnace
RU2119661C1 (en) * 1996-06-14 1998-09-27 Акционерное общество "Кузнецкий металлургический комбинат" Thermoelectric device to test content of impurities in metals and alloys
CN103499596A (en) * 2013-10-10 2014-01-08 贵州大学 Method and device for rapidly distinguishing variety of metal material

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6186642A (en) * 1984-10-04 1986-05-02 Sumitomo Metal Ind Ltd Metal analyzing apparatus
CN2253831Y (en) * 1995-12-11 1997-05-07 上海申佳铁合金有限公司 On-site quick silicon content analyzer for trace carbon chrome iron furnace
RU2119661C1 (en) * 1996-06-14 1998-09-27 Акционерное общество "Кузнецкий металлургический комбинат" Thermoelectric device to test content of impurities in metals and alloys
CN103499596A (en) * 2013-10-10 2014-01-08 贵州大学 Method and device for rapidly distinguishing variety of metal material

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
赵立军 等: "《电动汽车测试与评价》", 31 July 2012, 北京大学出版社 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105223329A (en) * 2015-09-18 2016-01-06 重庆大学 Based on the Transformer Winding material discrimination method of thermoelectric effect

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CB03 Change of inventor or designer information

Inventor after: Qi Fenghe

Inventor after: Liu Luming

Inventor after: Xu Quanyou

Inventor after: Chen Zuofeng

Inventor after: Cui Feng

Inventor after: Lin Fang

Inventor after: Xiong Chunyu

Inventor after: Sun Ying

Inventor after: Li Yongliang

Inventor after: Zhang Shuang

Inventor after: Yu Yazhong

Inventor after: Pei Boyu

Inventor before: Qi Fenghe

Inventor before: Liu Luming

Inventor before: Xu Quanyou

Inventor before: Chen Zuofeng

Inventor before: Cui Feng

Inventor before: Lin Fang

Inventor before: Xiong Chunyu

Inventor before: Sun Ying

Inventor before: Li Yongliang

Inventor before: Zhang Shuang

Inventor before: Yu Yazhong

Inventor before: Pei Boyu

RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20140514