CN103487700A - Impact current testing device - Google Patents
Impact current testing device Download PDFInfo
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- CN103487700A CN103487700A CN201310460860.9A CN201310460860A CN103487700A CN 103487700 A CN103487700 A CN 103487700A CN 201310460860 A CN201310460860 A CN 201310460860A CN 103487700 A CN103487700 A CN 103487700A
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Abstract
The invention provides an impact current testing device and relates to the field of impact current testing. The impact current testing device aims at solving the problems that in impact current testing, remote control cannot be achieved and power consumption is large. The R-L-C circuit charge-discharge principle is adopted for an impact current technology main circuit, the impact current technology main circuit generates required impact current, and leading thought design is performed according to the GB/T17215 requirements; a pulse width modulation technology is adopted, pulse width modulation closed-loop feedback output is performed, a high-power IGBT device is applied, phase ambiguity control is performed, and measures such as special shielding, ground connection and isolation are adopted according to the electromagnetic compatibility theory; applied waveform and time are controlled through embedded programs, ADC collecting feedback calculation processing and an IGBT module; sampling is performed in a current loop, and an impact current value generated instantly is directly read through a peak holding circuit. The impact current testing device is suitable for the field of impact current testing.
Description
Technical field
The present invention relates to the impulse current test field.
Background technology
Along with updating of structural design thought and method, and the application of new and high technology, the problem run in impulse current test extensively receives publicity.
At present, the domestic technological difficulties for impulse current test are pulse-width modulation closed loop feedback output, data analysis processing and high-power IGBT control output waveform and time, and the problem of existence is a little less than carrying load ability, the problem that power consumption is large.
Summary of the invention
The present invention is in order to solve in impulse current test, a little less than carrying load ability, and the problem that power consumption is large, and then the impulse current test device is provided.
The impulse current test device, it comprises that control/display circuit 1, communicating circuit 2, CPU3, charging A/D Acquisition Circuit 4, silicon controlled control circuit 5, energy storage/filtering circuit 6, IGBT output circuit 7, electric discharge A/D Acquisition Circuit 9, output waveform gather feedback circuit 10 and IGBT control circuit 11;
The control signal input end of the control signal output terminal connecting communication circuit 2 of control/display circuit 1, the display output terminal of the display input end connecting communication circuit 2 of control/display circuit 1, the signal of communication of described communicating circuit 2 inputs or outputs signal of communication output or the input end that the end end connects CPU3;
Two electrical signals of charging A/D Acquisition Circuit 4 connect respectively electric signal input end of CPU3 and the electric signal input end of silicon controlled control circuit 5, the control signal output terminal of CPU3 connects the control signal input end of silicon controlled control circuit 5, and the control signal output terminal of described silicon controlled control circuit 5 connects the control signal input end of energy storage/filtering circuit 6;
Two electrical signals of energy storage/filtering circuit 6 connect respectively the electric signal input end of IGBT output circuit 7 and the electric signal input end of charging A/D Acquisition Circuit 4, the electrical signal of described IGBT output circuit 7 connects the electric signal input end of load, an electrical signal of described load connects the electric signal input end of electric discharge A/D Acquisition Circuit 9, the electrical signal of described electric discharge A/D Acquisition Circuit 9 connects No. two electric signal input ends of CPU3, and the IGBT control signal output terminal of described CPU3 connects the signal input part of IGBT control circuit 11; No. two electrical signals of load connect the electric signal input end that output waveform gathers feedback circuit 10, described output waveform gathers the feedback signal input end of the feedback signal output terminal connection IGBT control circuit 11 of feedback circuit 10, and the control signal output terminal of described IGBT control circuit 11 connects the control signal input end of IGBT output circuit 7.
The present invention has realized that high voltage, high electric current, high precision show, peak value keeps design, carrying load ability is strong, and output stability has improved 5% on year-on-year basis, power-dissipation-reduced 10%, reliability has improved 10% on year-on-year basis.
The accompanying drawing explanation
Fig. 1 is one-piece construction schematic diagram of the present invention.
Embodiment
Embodiment one: present embodiment is described below in conjunction with Fig. 1, the described impulse current test device of present embodiment, it comprises that control/display circuit 1, communicating circuit 2, CPU3, charging A/D Acquisition Circuit 4, silicon controlled control circuit 5, energy storage/filtering circuit 6, IGBT output circuit 7, electric discharge A/D Acquisition Circuit 9, output waveform gather feedback circuit 10 and IGBT control circuit 11;
The control signal input end of the control signal output terminal connecting communication circuit 2 of control/display circuit 1, the display output terminal of the display input end connecting communication circuit 2 of control/display circuit 1, the signal of communication of described communicating circuit 2 inputs or outputs signal of communication output or the input end that the end end connects CPU3;
Two electrical signals of charging A/D Acquisition Circuit 4 connect respectively electric signal input end of CPU3 and the electric signal input end of silicon controlled control circuit 5, the control signal output terminal of CPU3 connects the control signal input end of silicon controlled control circuit 5, and the control signal output terminal of described silicon controlled control circuit 5 connects the control signal input end of energy storage/filtering circuit 6;
Two electrical signals of energy storage/filtering circuit 6 connect respectively the electric signal input end of IGBT output circuit 7 and the electric signal input end of charging A/D Acquisition Circuit 4, the electrical signal of described IGBT output circuit 7 connects the electric signal input end of load, an electrical signal of described load connects the electric signal input end of electric discharge A/D Acquisition Circuit 9, the electrical signal of described electric discharge A/D Acquisition Circuit 9 connects No. two electric signal input ends of CPU3, and the IGBT control signal output terminal of described CPU3 connects the signal input part of IGBT control circuit 11; No. two electrical signals of load connect the electric signal input end that output waveform gathers feedback circuit 10, described output waveform gathers the feedback signal input end of the feedback signal output terminal connection IGBT control circuit 11 of feedback circuit 10, and the control signal output terminal of described IGBT control circuit 11 connects the control signal input end of IGBT output circuit 7.
In above-mentioned embodiment, dash current technology main circuit adopts R-L-C circuit charge-discharge principle, produces the dash current required, and according to GB/T17215, requires to take as the leading factor the thought design; Adopt pulse modulation technology, pulse-width modulation closed loop feedback output, use high-power 1GBT device, and, according to the Electro Magnetic Compatibility theory, adopt the measures such as special shielding, ground connection and isolation; Apply waveform and time by embedded program, the computing of ADC collection feedback, a road IGBT module controls; In current return, sample, by the dash current value of peak holding circuit direct-reading moment generation;
Hardware aspect is used Single Chip Microcomputer (SCM) system, super high power IGBT module, likes general Coase discharge capacity, the high and low power consumption design of reliability; The software aspect utilizes the C language to increase the dirigibility of program design, has adopted multiple correction processing method in program, has improved the operational efficiency of program.Adopt reliable programmed algorithm, make program there is higher reliability.The display independent design reduces program and supports for a long time, reduce the involatile memory that overall power adopts current state-of-the-art special IC, microprocessor, persistence information, the numerous functions of this technology collection and one, realize that high voltage, high electric current high precision show, peak value keeps the functions such as design, Long-distance Control.Take PC and realize the safe information transmission of operator and testing equipment as medium.This equipment also has the RS232 interface, facilitates power department to realize computer network management.And adopt various software, hardware of anti-interference measures, guarantee this testing equipment reliability service.
Embodiment two: the further restriction of present embodiment to the described impulse current test device of embodiment one, in present embodiment, dash current is greater than 1000A and is less than 6000A.
Embodiment three: the further restriction of present embodiment to the described impulse current test device of embodiment one, in present embodiment, control/display circuit 1 is for the parameter of voltage and dash current is set, and for showing the numerical value of dash current.
Embodiment four: the further restriction of present embodiment to the described impulse current test device of embodiment one, in present embodiment, silicon controlled control circuit 5 is for controlling the size of charging current by controlling thyristor operating angle.
Embodiment five: the further restriction of present embodiment to the described impulse current test device of embodiment one, in present embodiment, output waveform gathers feedback circuit 10 for changing the edge, front and back of waveform, and exports corresponding standard discharge waveform.
Claims (5)
1. impulse current test device, it is characterized in that: it comprises control/display circuit (1), communicating circuit (2), CPU(3), charging A/D Acquisition Circuit (4), silicon controlled control circuit (5), energy storage/filtering circuit (6), IGBT output circuit (7), electric discharge A/D Acquisition Circuit (9), output waveform gather feedback circuit (10) and IGBT control circuit (11);
The control signal input end of the control signal output terminal connecting communication circuit (2) of control/display circuit (1), the display output terminal of the display input end connecting communication circuit (2) of control/display circuit (1), the signal of communication of described communicating circuit (2) inputs or outputs end end and connects CPU(3) signal of communication output or input end;
Two electrical signals of charging A/D Acquisition Circuit (4) connect respectively CPU(3) electric signal input end and the electric signal input end of silicon controlled control circuit (5), CPU(3) control signal output terminal connects the control signal input end of silicon controlled control circuit (5), and the control signal output terminal of described silicon controlled control circuit (5) connects the control signal input end of energy storage/filtering circuit (6);
Two electrical signals of energy storage/filtering circuit (6) connect respectively the electric signal input end of IGBT output circuit (7) and the electric signal input end of charging A/D Acquisition Circuit (4), the electrical signal of described IGBT output circuit (7) connects the electric signal input end of load, an electrical signal of described load connects the electric signal input end of electric discharge A/D Acquisition Circuit (9), the electrical signal connection CPU(3 of described electric discharge A/D Acquisition Circuit (9)) No. two electric signal input ends, described CPU(3) IGBT control signal output terminal connects the signal input part of IGBT control circuit (11), No. two electrical signals of load connect the electric signal input end that output waveform gathers feedback circuit (10), described output waveform gathers the feedback signal input end of the feedback signal output terminal connection IGBT control circuit (11) of feedback circuit (10), and the control signal output terminal of described IGBT control circuit (11) connects the control signal input end of IGBT output circuit (7).
2. impulse current test device according to claim 1, it is characterized in that: the dash current in energy storage/filtering circuit (6) is greater than 1000A and is less than 6000A.
3. impulse current test device according to claim 1 is characterized in that: control/display circuit (1) is for the parameter of voltage and dash current is set, and for showing the numerical value of dash current.
4. impulse current test device according to claim 1 is characterized in that: silicon controlled control circuit (5) is for controlling the size of charging current by controlling thyristor operating angle.
5. impulse current test device according to claim 1 is characterized in that: output waveform gathers feedback circuit (10) for changing the edge, front and back of waveform, and exports corresponding standard discharge waveform.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201310460860.9A CN103487700B (en) | 2013-09-30 | 2013-09-30 | Impulse current test device |
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| CN201310460860.9A CN103487700B (en) | 2013-09-30 | 2013-09-30 | Impulse current test device |
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| CN103487700A true CN103487700A (en) | 2014-01-01 |
| CN103487700B CN103487700B (en) | 2015-11-18 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105044533A (en) * | 2015-09-11 | 2015-11-11 | 哈尔滨电工仪表研究所 | Over-current testing device |
| CN105911463A (en) * | 2016-01-13 | 2016-08-31 | 武汉水院电气有限责任公司 | DC current-limiting breaker high-voltage heavy-current pulse impact test platform |
| CN110441726A (en) * | 2019-07-03 | 2019-11-12 | 黑龙江省电工仪器仪表工程技术研究中心有限公司 | Impact overcurrent experimental device |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105044533A (en) * | 2015-09-11 | 2015-11-11 | 哈尔滨电工仪表研究所 | Over-current testing device |
| CN105911463A (en) * | 2016-01-13 | 2016-08-31 | 武汉水院电气有限责任公司 | DC current-limiting breaker high-voltage heavy-current pulse impact test platform |
| CN105911463B (en) * | 2016-01-13 | 2018-12-14 | 武汉水院电气有限责任公司 | A kind of direct current current-limiting circuit breaker high-voltage great-current pulse shock test platform |
| CN110441726A (en) * | 2019-07-03 | 2019-11-12 | 黑龙江省电工仪器仪表工程技术研究中心有限公司 | Impact overcurrent experimental device |
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