CN103443731B - 用于检测到手持式装置的接近的测量装置及方法 - Google Patents
用于检测到手持式装置的接近的测量装置及方法 Download PDFInfo
- Publication number
- CN103443731B CN103443731B CN201280014714.7A CN201280014714A CN103443731B CN 103443731 B CN103443731 B CN 103443731B CN 201280014714 A CN201280014714 A CN 201280014714A CN 103443731 B CN103443731 B CN 103443731B
- Authority
- CN
- China
- Prior art keywords
- electrode
- ground electrode
- measurement device
- capacitive measurement
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
- G06F1/1613—Constructional details or arrangements for portable computers
- G06F1/1626—Constructional details or arrangements for portable computers with a single-body enclosure integrating a flat display, e.g. Personal Digital Assistants [PDAs]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/96—Touch switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/945—Proximity switches
- H03K17/955—Proximity switches using a capacitive detector
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/96—Touch switches
- H03K17/962—Capacitive touch switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
- H03K2217/96—Touch switches
- H03K2217/9607—Capacitive touch switches
- H03K2217/96071—Capacitive touch switches characterised by the detection principle
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
- H03K2217/96—Touch switches
- H03K2217/9607—Capacitive touch switches
- H03K2217/960755—Constructional details of capacitive touch and proximity switches
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Human Computer Interaction (AREA)
- General Engineering & Computer Science (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Electronic Switches (AREA)
- Switches That Are Operated By Magnetic Or Electric Fields (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Position Input By Displaying (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE1020110060790 | 2011-03-24 | ||
| DE102011006079A DE102011006079B4 (de) | 2011-03-24 | 2011-03-24 | Messeinrichtung und Verfahren zur Annäherungsdetektion |
| PCT/EP2012/055095 WO2012126992A2 (en) | 2011-03-24 | 2012-03-22 | Measuring device and method for the detection of an approach |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103443731A CN103443731A (zh) | 2013-12-11 |
| CN103443731B true CN103443731B (zh) | 2017-02-15 |
Family
ID=45954621
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280014714.7A Expired - Fee Related CN103443731B (zh) | 2011-03-24 | 2012-03-22 | 用于检测到手持式装置的接近的测量装置及方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9354263B2 (enExample) |
| EP (1) | EP2689313B1 (enExample) |
| JP (1) | JP6121397B2 (enExample) |
| KR (1) | KR101868924B1 (enExample) |
| CN (1) | CN103443731B (enExample) |
| DE (1) | DE102011006079B4 (enExample) |
| TW (1) | TWI570610B (enExample) |
| WO (1) | WO2012126992A2 (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102011006079B4 (de) | 2011-03-24 | 2012-12-06 | Ident Technology Ag | Messeinrichtung und Verfahren zur Annäherungsdetektion |
| DE102011075276B4 (de) | 2011-05-04 | 2015-10-08 | Ident Technology Ag | Kapazitive Sensoreinrichtung sowie Verfahren zum Betrieb einer Eingabeeinrichtung |
| CN105431798B (zh) * | 2013-09-12 | 2019-01-22 | 英特尔公司 | 检测在计算设备的侧面上的手势 |
| JP2015141556A (ja) * | 2014-01-29 | 2015-08-03 | シナプティクス・ディスプレイ・デバイス合同会社 | タッチ検出回路及びそれを備える半導体集積回路 |
| EP3257470B1 (de) * | 2016-06-17 | 2019-07-24 | Ivoclar Vivadent AG | Lichthärtgerät mit steuerschaltung |
| USD821389S1 (en) | 2016-06-21 | 2018-06-26 | Samsung Electronics Co., Ltd. | Electronic device |
| USD862458S1 (en) | 2016-06-21 | 2019-10-08 | Samsung Electronics Co., Ltd. | Electronic device |
| USD864954S1 (en) | 2016-06-21 | 2019-10-29 | Samsung Electronics Co., Ltd. | Electronic device |
| USD862457S1 (en) | 2016-06-21 | 2019-10-08 | Samsung Electronics Co., Ltd. | Electronic device |
| FR3081224B1 (fr) * | 2018-05-15 | 2020-06-12 | Fogale Nanotech | Dispositif de detection capacitive redondante serie |
| JP7155920B2 (ja) * | 2018-11-16 | 2022-10-19 | 株式会社アイシン | ステアリング装置 |
| US10775946B2 (en) * | 2018-12-21 | 2020-09-15 | Finch Technologies Ltd. | Universal handheld controller of a computer system |
| US10809797B1 (en) | 2019-08-07 | 2020-10-20 | Finch Technologies Ltd. | Calibration of multiple sensor modules related to an orientation of a user of the sensor modules |
| TWI812126B (zh) * | 2022-03-29 | 2023-08-11 | 飛捷科技股份有限公司 | 可攜式電子裝置充斷電的方法及可攜式電子裝置 |
| DE102022131313A1 (de) | 2022-11-28 | 2024-05-29 | Valeo Schalter Und Sensoren Gmbh | Sensorvorrichtung und Verfahren zur kapazitiven Berührungsdetektion |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006132960A1 (en) * | 2005-06-03 | 2006-12-14 | Synaptics Incorporated | Methods and systems for detecting a capacitance using sigma-delta measurement techniques |
| WO2009090704A1 (ja) * | 2008-01-18 | 2009-07-23 | Panasonic Corporation | 携帯端末 |
| CN101739184A (zh) * | 2008-11-20 | 2010-06-16 | 中强光电股份有限公司 | 电容式触摸板及其接触点检测方法 |
| DE102009057933B3 (de) * | 2009-12-11 | 2011-02-24 | Ident Technology Ag | Sensoreinrichtung sowie Verfahren zur Annäherungs- und Berührungsdetektion |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19701899C2 (de) * | 1996-01-21 | 2001-01-25 | Ifm Electronic Gmbh | Schaltungsanordnung und Verfahren zur Erfassung der Kapazität bzw. einer Kapazitätsänderung eines kapazitiven Schaltungs- oder Bauelementes |
| DE10049411A1 (de) * | 2000-10-05 | 2002-04-18 | Siemens Ag | Handhabbare Vorrichtung |
| KR101340860B1 (ko) * | 2005-06-03 | 2013-12-13 | 시냅틱스, 인코포레이티드 | 시그마 델타 측정 기술들을 사용하여 캐패시턴스를검출하기 위한 방법들 및 시스템 |
| DE112008001245T5 (de) * | 2007-05-07 | 2010-03-04 | Atmel Corp., San Jose | Zweidimensionaler Positionssensor |
| KR101540779B1 (ko) * | 2008-07-01 | 2015-07-29 | 엘지전자 주식회사 | 휴대 단말기 및 그 제어방법 |
| TWI381302B (zh) * | 2008-11-12 | 2013-01-01 | Tpo Displays Corp | 影像顯示系統、電容觸控面板及其電容量測裝置與方法 |
| US8427450B2 (en) * | 2009-01-12 | 2013-04-23 | Microchip Technology Incorporated | Capacitive touch sensing and light emitting diode drive matrix |
| US8237456B2 (en) * | 2009-03-02 | 2012-08-07 | Atmel Corporation | Capacitive sensing |
| CN102193692B (zh) * | 2010-03-03 | 2014-09-10 | 群康科技(深圳)有限公司 | 表面电容式触控面板及其显示装置与电子装置及驱动方法 |
| DE102011006079B4 (de) | 2011-03-24 | 2012-12-06 | Ident Technology Ag | Messeinrichtung und Verfahren zur Annäherungsdetektion |
-
2011
- 2011-03-24 DE DE102011006079A patent/DE102011006079B4/de not_active Expired - Fee Related
-
2012
- 2012-03-22 CN CN201280014714.7A patent/CN103443731B/zh not_active Expired - Fee Related
- 2012-03-22 JP JP2014500391A patent/JP6121397B2/ja active Active
- 2012-03-22 EP EP12714254.5A patent/EP2689313B1/en not_active Not-in-force
- 2012-03-22 WO PCT/EP2012/055095 patent/WO2012126992A2/en not_active Ceased
- 2012-03-22 US US14/007,073 patent/US9354263B2/en not_active Expired - Fee Related
- 2012-03-22 KR KR1020137025810A patent/KR101868924B1/ko not_active Expired - Fee Related
- 2012-03-23 TW TW101110017A patent/TWI570610B/zh not_active IP Right Cessation
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006132960A1 (en) * | 2005-06-03 | 2006-12-14 | Synaptics Incorporated | Methods and systems for detecting a capacitance using sigma-delta measurement techniques |
| WO2009090704A1 (ja) * | 2008-01-18 | 2009-07-23 | Panasonic Corporation | 携帯端末 |
| CN101739184A (zh) * | 2008-11-20 | 2010-06-16 | 中强光电股份有限公司 | 电容式触摸板及其接触点检测方法 |
| DE102009057933B3 (de) * | 2009-12-11 | 2011-02-24 | Ident Technology Ag | Sensoreinrichtung sowie Verfahren zur Annäherungs- und Berührungsdetektion |
Also Published As
| Publication number | Publication date |
|---|---|
| US20140232418A1 (en) | 2014-08-21 |
| KR20140012701A (ko) | 2014-02-03 |
| KR101868924B1 (ko) | 2018-06-19 |
| US9354263B2 (en) | 2016-05-31 |
| TW201312431A (zh) | 2013-03-16 |
| DE102011006079B4 (de) | 2012-12-06 |
| DE102011006079A1 (de) | 2012-09-27 |
| EP2689313A2 (en) | 2014-01-29 |
| CN103443731A (zh) | 2013-12-11 |
| JP2014508948A (ja) | 2014-04-10 |
| JP6121397B2 (ja) | 2017-04-26 |
| WO2012126992A3 (en) | 2012-11-15 |
| EP2689313B1 (en) | 2016-07-13 |
| TWI570610B (zh) | 2017-02-11 |
| WO2012126992A2 (en) | 2012-09-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20190412 Address after: Dublin, Ireland Patentee after: Neo Ron Co.,Ltd. Address before: Arizona, USA Patentee before: MICROCHIP TECHNOLOGY Inc. |
|
| TR01 | Transfer of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170215 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |