CN103424367B - Color measuring instrument for correcting optical trap error based on D/8 condition and achieving method - Google Patents
Color measuring instrument for correcting optical trap error based on D/8 condition and achieving method Download PDFInfo
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- CN103424367B CN103424367B CN201310373360.1A CN201310373360A CN103424367B CN 103424367 B CN103424367 B CN 103424367B CN 201310373360 A CN201310373360 A CN 201310373360A CN 103424367 B CN103424367 B CN 103424367B
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Abstract
The invention discloses a color measuring instrument for correcting an optical trap error based on the D/8 condition and an achieving method. The novel color measuring instrument comprises a spectrograph, an optical trap, a stirring sheet, a light source, an integrating sphere, a processing device and a stirring sheet control device. The stirring sheet is arranged at the optical trap position, and is coated with a white diffuse reflection coating same as the coating of the inner wall of the integrating sphere. The spectrograph is arranged at a position perpendicular to a line deviating from the normal of a sample by 8 degrees on the left, and is connected with the processing device. The optical trap is arranged at the position perpendicular to a line deviating from the normal of the sample by 8 degrees on the right. An SCI geometrical measurement structure and an SCE geometrical measurement structure are compatible with the color measuring instrument through controlling of the stirring sheet, and the gloss data of the surface of the sample can be obtained by measuring the SCI data and SCE data of the surface of the sample at the same time. In addition, a correcting model for correcting the measured SCE data according to the gloss data of the surface of the sample is established, the consistency among measured results is greatly improved, and the correcting model has very good popularization and application prospects.
Description
Technical field
The present invention relates to color measurement technique field, more specifically, relate to a kind of based on D/8 condition the color measurement instrument to ligh trap error correction and implementation method.
Background technology
In order to make color data have unified evaluation criterion, need under certain illumination and observation condition, carry out color measuring, CIE(International Commission on Illumination in 1971) formal recommendation four kinds for the standard illuminants of reflecting sample measurement with observe geometric condition, vertically/45 ° (symbol is 0/45), 45 °/vertical (symbol is 45/0), vertical/diffusion (symbol 0/d) and diffusion/vertical (symbol d/0), it is respectively as shown in Fig. 1 (a), 1 (b), 1 (c) and 1 (d).
For the ease of discussing, various illumination and observation condition can be reduced to three kinds of prevailing geometric conditions: i.e. diffuse illumination, 8 ° of viewing angles, comprise mirror-reflection composition (d/8:i); Diffuse illumination, 8 ° of viewing angles, eliminate minute surface composition (d/8:e); 45 ° of ring illuminations, right-angle view (45/0:c).In the time material surface being carried out to product quality detection, for the testing result that obtains conforming to visual detection, conventionally select the measuring condition of d/8:e, generally eliminate the mirror-reflection in reflected light with the gloss trap of integrating sphere.
The d/8:e geometric condition that CIE recommends is that the gloss trap (being called for short: ligh trap) by arranging is as shown in Figure 2 eliminated specular light.In the situation that ligh trap not being set, ligh trap position should be complete integrating sphere inwall, as shown in Figure 3, the light that testing light source sends is through reflecting in the ligh trap position of integrating sphere inside (A point in figure), after being irradiated to sample surfaces, be divided into two parts: a part is for the specular light through sample surfaces is directly into being incident upon in sensor, as A->B->D light in Fig. 3; After another portion is sample surfaces generation diffuse reflection, after the even light of integrating sphere, be again incident to sample surfaces, as A->B->C->E-Gre atT.GreaT.GTD in figure.The reflected light of sample surfaces each time, had both comprised light source light spectrum, also comprised body surface spectrum.In the time there is mirror-reflection, in specular light, do not comprise testee surface light spectrum information, be light source light spectrum, and the in the situation that of non-mirror reflection, in reflected light, comprise testee surface light spectrum information.
In situation for complete integrating sphere inwall, the light that wavelength is λ is the light A->B->D to sensor via sample surfaces mirror-reflection, and sensor receives total spectral radiance and is;
I
0(λ)＝α
0·I
s(λ)+β
0·R(λ)·I
s(λ) o1)
Wherein, I
0(λ) spectral radiance receiving for sensor, I
s(λ) be the spectral radiance of light A->B, α
0and β
0be respectively light at material surface generation reflex time, included incident ray spectral information coefficient and material surface spectral information coefficient in light B->D; R (λ) is material surface spectral reflectivity.
There is irreflexive light via sample surfaces, taking light B->C as example, in integrating sphere inwall reflection, be again incident to the light radiation that is incident to sensor after sample surfaces and be:
I
1(λ)＝α
1·Ｉ′
s(λ)+β
1·R(λ)·I′
s(λ) (2)
Wherein,
I′
s(z)＝α′
0·I
s(λ)+β′
0·R(λ)·I
s(λ) (3)
Under actual conditions, the light that light source sends may be incident upon sensor through reentering after several times reflections, and the light radiation that sensor is accepted can represent with following formula,
I(λ)＝I
0(λ)+I
1(λ)+I
2(λ)+…+I
n(λ) (4)
Can be obtained by formula (2) and formula (4),
I(λ)＝K
s·I
s(λ)(a
0+a
1·R(λ)+a
2·R
2(λ)+…+a
n·R
n(λ)) (5)
From above formula, in the situation that integrating sphere inside does not arrange ligh trap, the light that light source sends is through the integrating sphere ball wall diffuse reflection of correspondence position, again after the several times reflection on testee surface, the light radiation I (λ) of incident sensor and the light radiation intensity I of this integrating sphere ball wall position
s(λ) relevant with sample surfaces spectral reflectivity R (λ).
When after the inner installation of integrating sphere ligh trap, the size of gloss trap has impact to the light radiation intensity of sample surfaces.In the design of different instruments, due to the difference such as opening size, position of ligh trap, I in formula (5)
s(λ) and COEFFICIENT K
a, α
0, α
1α
nalso can be variant.Ligh trap size difference, the poor formula (6) of can using of light radiation that enters sensor represents:
ΔI(λ)＝K·I
s(λ)(k
0+k
1·R(λ)+k
2·R
2(λ)+…+k
n·R
n(λ)) (6)
But, due to the not size to ligh trap and position specified in more detail of CIE, cause current existing color measurement instrument can select the ligh trap of different size.In color measuring process, use the ligh trap of different size, conventionally can run into following problem:
Because CIE does not specify the size of integrating sphere and the size of ligh trap, the ligh trap size that different instruments adopt also has difference, as shown in Figure 4 and Figure 5.Two kinds of different measurement structures have been selected the ligh trap of different size, and size is respectively: Model A ligh trap diameter is 8mm, Model B ligh trap diameter 12mm.Two kinds of structures are measured the sample of various luster, obtain the spectral reflectance rate curve of sample, 600nm place spectral reflectivity measurement result corresponding relation as shown in Figure 6, Figure 7, in the time respectively the lower semi-glossy colour atla of gloss being measured and the higher full gloss colour atla of gloss is measured, all can obtain good linear relationship.But the slope of two kinds of linear relationships is inconsistent, as shown in Figure 8.It is poor when this phenomenon has caused different instruments to be measured same sample, to exist between larger device.Ideally, regardless of the gloss intensity of sample, the result linear relationship of two kinds of apparatus measures all should be consistent.This phenomenon causes because of ligh trap size is inconsistent.
In view of this,, for the instrument of different test structures, should revise the measuring error causing due to ligh trap size under its SCE test condition.
Summary of the invention
In view of the deficiencies in the prior art, the object of the invention be to provide a kind of based on D/8 condition the color measurement instrument to ligh trap error correction and implementation method.Be intended to surface gloss data per sample SCE measurement data is revised, reduce the measuring error causing due to ligh trap dimensional discrepancy between different apparatus structures.
Technical scheme of the present invention is as follows:
A color measurement instrument based on D/8 condition to ligh trap error correction, for carrying out color measuring to sample; Wherein, described color measurement instrument comprises:
Spectrometer, ligh trap, plectrum, light source, integrating sphere, treating apparatus and plectrum control device;
Wherein, described plectrum is arranged on ligh trap place, and applies the white diffuse reflection coating identical with integrating sphere inwall on plectrum; Sample is arranged on the bottom tapping of integrating sphere; Spectrometer is arranged on the position of-8 ° perpendicular to sample normal, and spectrometer connects described for carrying out the treating apparatus of data processing; Ligh trap be arranged on perpendicular to sample normal+position of 8 °;
The light that light source sends is diffused on described sample after integrating sphere, spectrometer receives the reflected light being reflected back by sample surfaces, and plectrum is opened or closed the perforate of integrating sphere top and obtains respectively without the SCI measuring condition of ligh trap and have the SCE measuring condition of ligh trap described in the control of plectrum control device; The signal that treating apparatus sends spectrometer carries out data processing and obtains measurement result.
The described color measurement instrument to ligh trap error correction based on D/8 condition, wherein, described plectrum control device is stepper motor, described treating apparatus is PC.
Described based on D/8 condition the implementation method of the color measurement instrument to ligh trap error correction, wherein, said method comprising the steps of:
The light that S1, light source send is diffused on described sample after integrating sphere, and spectrometer receives the reflected light being reflected back by sample surfaces;
Described in S2, the control of plectrum control device, plectrum is closed the perforate of integrating sphere top and is obtained respectively the SCI measuring condition without ligh trap, and the signal that treating apparatus sends spectrometer carries out data processing and obtains the first measurement result
Described in S3, the control of plectrum control device, plectrum unlatching integrating sphere top perforate obtains respectively the SCE measuring condition of ligh trap, and the signal that treating apparatus sends spectrometer carries out data processing and obtains the second measurement result
The gloss number of S4, calculation sample
build correction value Δ I by calculating, obtain Δ I and gloss number linear:
Δ I=k
2g
m+ b
2thereby, the sample of various luster is revised;
Wherein, k
2for the scale-up factor of single order matching, b
2for constant term.
Described based on D/8 condition the implementation method of the color measurement instrument to ligh trap error correction, wherein, also comprise step S4, set up the correction model that a kind of data of surface gloss are per sample revised the measurement data obtaining under SCE measuring condition:
by Model C measurement result through gloss G
mafter revising, calculate Model A measurement result:
Wherein, Model A ligh trap size other color measurement instrument different from Model C;
for being numbered sample measurement result under Model A structure of n,
for being numbered sample measurement result under Model C-structure of n, k, k
2for scale-up factor, b, b
2for constant term.
Beneficial effect:
Of the present invention based on D/8 condition the color measurement instrument to ligh trap error correction and implementation method, it has designed a kind of novel color measurement instrument, by controlling plectrum, can compatible SCI and two kinds of dimensional measurement structures of SCE, by sample surfaces SCI and SCE data are measured simultaneously, can obtain the gloss data of sample surfaces.In addition, also set up the correction model that a kind of data of surface gloss are per sample revised SCE measurement data, greatly improved the consistance between test result, there is good popularizing application prospect.
Brief description of the drawings
Fig. 1 (a) is for the first is for reflecting the standard illuminants and the schematic diagram of observing geometric condition of sample measurement.
Fig. 1 (b) is for the second is for reflecting the standard illuminants and the schematic diagram of observing geometric condition of sample measurement.
Fig. 1 (c) is for the third is for reflecting the standard illuminants and the schematic diagram of observing geometric condition of sample measurement.
Fig. 1 (d) be the 4th kind for the standard illuminants of reflecting sample measurement and the schematic diagram of observing geometric condition.
Fig. 2 is the schematic diagram that ligh trap elimination specular light is set under d/8:e geometric condition.
Fig. 3 is the schematic diagram of light at the multiple reflections of integrating sphere and sample room.
Fig. 4 is the schematic diagram of Model A test structure in prior art (ligh trap diameter 8mm).
Fig. 5 is the schematic diagram of Model B test structure in prior art (ligh trap diameter 12mm).、
Fig. 6 is the schematic diagram that the model A vs Model B of 600nm place measures semi-glossy lightness card data.
Fig. 7 is the schematic diagram that the Model A vs Model B of 600nm place measures full gloss lightness card data.
Fig. 8 is the schematic diagram that the Model A vs Model B of 600nm place measures all semi-glossy colour atlas and full gloss colour atla sample data.
Fig. 9 is that of the present invention based on D/8 condition, the Model C of the embodiment of the color measurement instrument to ligh trap error correction measures the schematic diagram of the SCI measurement pattern under structure.
Figure 10 is that of the present invention based on D/8 condition, the Model C of the embodiment of the color measurement instrument to ligh trap error correction measures the schematic diagram of the SCE measurement pattern under structure.
Figure 11 be of the present invention based on D/8 condition to being related to schematic diagram between gloss number and correction value in the color measurement instrument of ligh trap error correction.
Figure 12 is that of the present invention based on D/8 condition, the Model C of the embodiment of the color measurement instrument to ligh trap error correction measures the schematic diagram of the measurement result vs CM-700D correcting without gloss under structure at 600nm place.
Figure 13 is that of the present invention based on D/8 condition, the Model C of the embodiment of the color measurement instrument to ligh trap error correction measures the schematic diagram of the measurement result vs CM-700D correcting through gloss under structure at 600nm place.
The schematic diagram of Figure 14 (a) for the first high glaze sample application correction model is corrected at 400-700nm.
The schematic diagram of Figure 14 (b) for the second high glaze sample application correction model is corrected at 400-700nm.
Figure 15 be of the present invention based on D/8 condition the process flow diagram of the implementation method of the color measurement instrument to ligh trap error correction.
Embodiment
The invention provides a kind of based on D/8 condition the color measurement instrument to ligh trap error correction and implementation method, for making object of the present invention, technical scheme and effect clearer, clear and definite, below the present invention is described in more detail.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.
Disclosed by the invention based on D/8 condition the color measurement instrument to ligh trap error correction, for sample is carried out to color measuring; Described color measurement instrument comprises: spectrometer, ligh trap, plectrum, light source, integrating sphere, treating apparatus and plectrum control device; Wherein, described plectrum is arranged on ligh trap place, and applies the white diffuse reflection coating identical with integrating sphere inwall on plectrum; Sample is arranged on the bottom tapping of integrating sphere; Spectrometer is arranged on the position of-8 ° perpendicular to sample normal, and spectrometer connects described for carrying out the treating apparatus of data processing; Ligh trap be arranged on perpendicular to sample normal+position of 8 °.
Specifically, the light that light source sends is diffused on described sample after integrating sphere, spectrometer receives the reflected light being reflected back by sample surfaces, and plectrum is opened or closed the perforate of integrating sphere top and obtains respectively without the SCI measuring condition of ligh trap and have the SCE measuring condition of ligh trap described in the control of plectrum control device; The signal that treating apparatus sends spectrometer carries out data processing and obtains measurement result.
Key of the present invention is to be provided with a plectrum at ligh trap place, by step motor control.On plectrum, apply the white diffuse reflection coating identical with integrating sphere inwall.The perforate of integrating sphere bottom, measures sample surfaces.In the time that step motor control plectrum is blocked integrating sphere perforate, measuring condition is now the SCI measuring condition without ligh trap.In the time that stepper motor (being plectrum control device) control plectrum is opened, measuring condition is now the SCE measuring condition that has ligh trap.When each measurement, measure respectively the data of sample under SCI and SCE condition.This color measurement instrument enters the parts such as machine by light source, spectrometer, ligh trap He Walk and forms, sample is subject to the diffuse illumination of light source after monochromator splitting, and spectrometer transmits in-8 ° of positions receptions perpendicular to sample normal, ligh trap perpendicular to sample normal+8 ° of positions eliminate the mirror-reflection in reflected light, flashlight is sampled by spectrometer, is finally carried out data processing and is obtained measurement result by microsystem (being treating apparatus).
Illustrate below by Fig. 9 and Figure 10, plectrum is opened or is closed the perforate of integrating sphere top and obtains respectively without the SCI measuring condition of ligh trap and have the SCE measuring condition of ligh trap described in the control of plectrum control device.In the present embodiment, plectrum control device is a stepper motor (representing with stepper in figure).The present embodiment based on D/8 condition the color measurement instrument to ligh trap error correction structure called after ModelC measure structure.
Refer to Fig. 9, now, plectrum is closed the perforate of integrating sphere top and is obtained respectively the SCI measuring condition without ligh trap described in stepper control, and the light that light source sends is diffused on described sample after integrating sphere, and spectrometer receives the reflected light being reflected back by sample surfaces.
Please continue to refer to Figure 10, plectrum is opened the perforate of integrating sphere top and obtains respectively the SCE measuring condition of ligh trap described in stepper control, and the light that light source sends is diffused on described sample after integrating sphere, and spectrometer receives the reflected light being reflected back by sample surfaces.
In addition, for the measuring error that reduces to be caused by ligh trap between different apparatus structures, set up a kind of correction model by introducing gloss data.Now suppose that the data that Model A measures are Standard Colors data, the data that Model C is measured are revised, and make it to be consistent with Model A measurement data.
Taking 600nm place as example, under Model A and Model C, 31 semi-glossy lightness cards are measured, record respectively sample data under SCE test condition under two kinds of structures
with
as shown in Figure 6, two groups of data have good linear relationship, and two groups of data are carried out to first-order linear matching, obtain formula:
In formula,
the spectral intensity of opening semi-glossy lightness card for the n measuring under Model A,
for the spectral intensity that the n measuring under Model C opens semi-glossy lightness card, k is the scale-up factor of single order matching, and b is constant term.As shown in Figure 8, when measure different other sample of gloss with Model C, the measurement data of Model C and Model A does not meet (7) formula.We wish the sample to various luster, and gloss is revised per sample, build correction value Δ I, make the sample to any gloss, can meet formula (8):
Wherein,
for being numbered sample measurement result under Model A structure of n,
for being numbered sample measurement result under Model C-structure of n.K, b are respectively the calibration coefficient of semi-glossy sample.Δ I is the correction value calculating according to sample surface gloss.The sample of m kind various luster is measured with Model A the data that obtain
model C measures the sample of m kind various luster respectively under SCI and SCE condition, obtains measurement result
with
the gloss number of calculation sample is as the formula (9):
Calculate its correction value:
Gm and Δ I are carried out to matching, can obtain G
mand k
2relation as the formula (11):
ΔI＝k
2·G
m+b
2 (11)
Composite type and Shi Ke get calculate Model A measurement result by Model C measurement result after gloss correction:
Obtain measurement result according to new measurement structure Model C
with
the gloss number of calculation sample
Application formula (11) builds correction value Δ I by calculating, obtains it and gloss number is linear: Δ I=k2G
m+ b
2thereby, the sample of various luster is revised.Relation between gloss number and correction value as shown in figure 11.
Meanwhile, the present invention also set up the correction model that a kind of data of surface gloss per sample revise SCE measurement data-
taking the measurement data at 600nm place as example, in the time of the sample measurement to various luster, obtain result data and meet linear relationship.Contrived experiment: the sample of various luster is tested with the colour photometer CM-700D of Model C and Konica company.At 600nm place, correct the certain test inconsistency that exists between Model C and the measurement result of CM-700D without gloss, as shown in figure 12.Between the Model C correcting through gloss and the measurement result of CM-700D, test result consistance has been improved greatly, as shown in figure 13.
Please continue to refer to Figure 14 (a) and Figure 14 (b), in figure,---represent: ModelC does not have the measurement sample reflectance spectrum curve through overcorrection.
represent that CM-700D measures sample reflectance spectrum curve.
represent that ModelC measures sample reflectance spectrum curve after gloss is corrected.Specifically, experimental result shown in figure is that the data in whole visible-range are tested and obtained, Figure 14 (a) and Figure 14 (b) are respectively two results that high glaze sample is measured, CM-700D test data and do not have larger difference through overcorrection Model C test data, after gloss is corrected, the test result of two kinds of instruments embodies good consistance.
In short, provided by the invention a kind of described based on D/8 condition the implementation method of the color measurement instrument to ligh trap error correction, as shown in figure 15, said method comprising the steps of:
The light that S1, light source send is diffused on described sample after integrating sphere, and spectrometer receives the reflected light being reflected back by sample surfaces;
Described in S2, the control of plectrum control device, plectrum is closed the perforate of integrating sphere top and is obtained respectively the SCI measuring condition without ligh trap, and the signal that treating apparatus sends spectrometer carries out data processing and obtains the first measurement result
Described in S3, the control of plectrum control device, plectrum unlatching integrating sphere top perforate obtains respectively the SCE measuring condition of ligh trap, and the signal that treating apparatus sends spectrometer carries out data processing and obtains the second measurement result
The gloss number of S4, calculation sample
build correction value Δ I by calculating, obtain Δ I and gloss number linear:
Δ I=k
2g
m+ b
2thereby, the sample of various luster is revised;
Wherein, k
2for the scale-up factor of single order matching, b
2for constant term.
Further, describedly, in the implementation method of the color measurement instrument to ligh trap error correction, also comprise step S4, set up the correction model that a kind of data of surface gloss are per sample revised the measurement data obtaining under SCE measuring condition based on D/8 condition:
by Model C measurement result through gloss G
mafter revising, calculate Model A measurement result:
Wherein, Model A ligh trap size other color measurement instrument different from Model C;
for being numbered sample measurement result under Model A structure of n,
for being numbered sample measurement result under Model C-structure of n, k, k
2for scale-up factor, b, b
2for constant term.
In sum, of the present invention based on D/8 condition the color measurement instrument to ligh trap error correction and implementation method, it has designed a kind of novel color measurement instrument, and described color measurement instrument comprises: spectrometer, ligh trap, plectrum, light source, integrating sphere, treating apparatus and plectrum control device; Wherein, described plectrum is arranged on ligh trap place, and applies the white diffuse reflection coating identical with integrating sphere inwall on plectrum; Sample is arranged on the bottom tapping of integrating sphere; Spectrometer is arranged on the position of-8 ° perpendicular to sample normal, and spectrometer connects described for carrying out the treating apparatus of data processing; Ligh trap be arranged on perpendicular to sample normal+position of 8 °.They, can compatible SCI and two kinds of dimensional measurement structures of SCE by controlling plectrum, by sample surfaces SCI and SCE data are measured simultaneously, can obtain the gloss data of sample surfaces.In addition, also set up the correction model that a kind of data of surface gloss are per sample revised SCE measurement data, greatly improved the consistance between test result, there is good popularizing application prospect.
Should be understood that, application of the present invention is not limited to above-mentioned giving an example, and for those of ordinary skills, can be improved according to the above description or convert, and all these improvement and conversion all should belong to the protection domain of claims of the present invention.
Claims (1)
1. an implementation method for the color measurement instrument to ligh trap error correction based on D/8 condition, described color measurement instrument comprises:
Spectrometer, ligh trap, plectrum, light source, integrating sphere, treating apparatus and plectrum control device;
Wherein, described plectrum is arranged on ligh trap place, and applies the white diffuse reflection coating identical with integrating sphere inwall on plectrum; Sample is arranged on the bottom tapping of integrating sphere; Spectrometer is arranged on the position of-8 ° perpendicular to sample normal, and spectrometer connects described for carrying out the treating apparatus of data processing; Ligh trap be arranged on perpendicular to sample normal+position of 8 °;
The light that light source sends is diffused on described sample after integrating sphere, spectrometer receives the reflected light being reflected back by sample surfaces, and plectrum is opened or closed the perforate of integrating sphere top and obtains respectively the SCE measuring condition of ligh trap and the SCI measuring condition without ligh trap described in the control of plectrum control device; The signal that treating apparatus sends spectrometer carries out data processing and obtains measurement result, it is characterized in that, said method comprising the steps of:
The light that S1, light source send is diffused on described sample after integrating sphere, and spectrometer receives the reflected light being reflected back by sample surfaces;
Described in S2, the control of plectrum control device, plectrum is closed the perforate of integrating sphere top and is obtained the SCI measuring condition without ligh trap, and the signal that treating apparatus sends spectrometer carries out data processing and obtains the first measurement result
;
Described in S3, the control of plectrum control device, plectrum unlatching integrating sphere top perforate obtains the SCE measuring condition of ligh trap, and the signal that treating apparatus sends spectrometer carries out data processing and obtains the second measurement result
;
The gloss number of S4, calculation sample
; Build correction value by calculating
, obtain
linear with gloss number:
thereby, the sample of various luster is revised;
Wherein, k
2for the scale-up factor of single order matching, b
2for constant term;
Also comprise step S5, set up the correction model that a kind of data of surface gloss are per sample revised the measurement data obtaining under SCE measuring condition:
; By Model C measurement result through gloss G
mafter revising, calculate Model A measurement result:
Wherein, Model A is other color measurement instrument that ligh trap size is different from Model C;
for being numbered sample measurement result under Model A structure of n,
for being numbered sample measurement result under Model C structure of n, k, k
2for scale-up factor, b, b
2for constant term.
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