CN105424615A - Measurement device for material optical properties - Google Patents
Measurement device for material optical properties Download PDFInfo
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- CN105424615A CN105424615A CN201510996810.1A CN201510996810A CN105424615A CN 105424615 A CN105424615 A CN 105424615A CN 201510996810 A CN201510996810 A CN 201510996810A CN 105424615 A CN105424615 A CN 105424615A
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- optical properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4735—Solid samples, e.g. paper, glass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0631—Homogeneising elements
- G01N2201/0632—Homogeneising elements homogeneising by integrating sphere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0634—Diffuse illumination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/064—Stray light conditioning
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- Life Sciences & Earth Sciences (AREA)
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- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention provides a measurement device for material optical properties. The measurement device consists of an integrating sphere, a lighting source, an optical receiving apparatus and an extinction part. The integrating sphere wall is provided with a measurement window, the emergent light path of the measurement window is equipped with the optical receiving apparatus, and the integrating sphere is also provided with a sampling window for collecting the measured sample's signal. The extinction part is located at the periphery of the measured sample's test area. Compared with traditional technologies, the design of the extinction part at the periphery of the measured sample's test area can greatly reduce the optical receiving apparatus' stray light component from the place outside the test area. With the advantages of high measurement precision and simple operation, etc., the measurement device for material optical properties provided by the invention can be widely applied to the field of measurement for optical properties of various materials.
Description
[technical field]
The present invention relates to a kind of optical properties of material measurement mechanism, belong to optical characteristic measurement field category, particularly a kind of surveying instrument of optical properties of material.
[background technology]
Along with the develop rapidly of modern industry, color, spectral reflectivity etc. become weighs the important indicator of material surface characteristic, therefore carries out Measurement accuracy to the optical characteristics of various material very important.Wherein for light tight or semi transparent material, its optical characteristic measurement key is the measurement to material surface reflected light; The color that current industry member is conventional or spectrum reflectivity measurer adopt integrating sphere to provide diffuse lighting conditions for measuring usually, and then the reflected light to measured material surface is measured by optical imaging system and optical detector, as shown in Figure 1.
As can be seen from Figure 1, because the systematic error of equipment and operate miss in practical application, the light entering optical detector is often made not only to come from the reflected light on sample surface, also comprise a lot of unexpected light, the reflected light of the integrating sphere inwall mainly near sample window, especially when sample window is less, the stray light of this part is more obvious, and the ratio regular meeting of this part parasitic light that receives of detector is because different measuring object and different is placed at sample window place.But in traditional instrument calibration and measuring process, generally regard this part parasitic light signal as equal process roughly, this have impact on the accuracy of measurement of optical parametric greatly, can not the optical characteristics on reaction material surface really.
Such as, before the reflectivity of sample is measured, first need to calibrate surveying instrument with tracing to the source to the zero adjustment box of relevant authentication mechanism and standard white plate, namely carry out calibration of reflectivity, and then carry out the measurement of sample reflection rate, carry out mainly through following steps:
1) zero adjustment box is positioned over sample window position, according to the signal value AD that detector accepts
0carry out zero correction; AD
0can be expressed as
AD
0=k ρ
black+ Z
0=Z
0(1)
2) take off zero adjustment box, standard white plate is positioned over sample window position and corrects; The signal value AD accepted
1can be expressed as:
AD
1=k ρ
in vain+ Z
1(2)
3) testing sample is positioned over sample window place, the signal value AD accepted
2can be expressed as:
AD
2=k ρ
sample+ Z
2(3)
In formula (1), (2), (3), ρ
blackfor the reflectivity (being generally 0) of zero adjustment box, ρ
in vainfor the reflectivity of standard white plate; ρ
samplefor the real reflectivity of sample; K ρ
black, k ρ
in vain, k ρ
samplebe respectively the signal value coming from sample window region when sample window place placement zero adjustment box, standard white plate and sample; Z
0, Z
1, Z
2be respectively the parasitic light signal that when placing zero adjustment box, standard white plate and testing sample, detector receives.
Analyze known, Z in formula (1), (2), (3)
0, Z
1, Z
2by two parts composition, be the noise S of system and the parasitic light signal M from sample window limit upper integral ball inwall itself
0, M
1or M
2, that is:
Z
0＝S+M
0(4)
Z
1＝S+M
1(5)
Z
2＝S+M
2(6)
Therefore, after calibration, the reflectivity ρ of the testing sample of instrument actual measurement meets formula below:
On the integrating sphere inwall that a part of reflected light on sample surface can be irradiated on integrating sphere sample window limit in the measurement of reality (see Fig. 1), therefore for different samples (as standard white plate and red board under test), only different on integrating sphere inwall near sample window, and then the parasitic light signal magnitude from integrating sphere inwall received in detector is also different, i.e. M
0≠ M
1≠ M
2, the therefore actual ρ ≠ ρ recorded
sample.
But often do not consider in tradition calibration can because place the different and unequal situation of sample, simply approximate ρ=ρ from ball wall parasitic light
samplecalculating actual be inaccurate, the accuracy that the impact of this approximate maximum is measured, is unfavorable for the true assurance of people to sample surfaces characteristic.
[summary of the invention]
In view of above-mentioned deficiency of the prior art, the object of the present invention is to provide a kind of high-precision optical properties of material measurement mechanism, by the design of advantages of simple, eliminate the reflected light coming from integrating sphere ball wall in optical receiver assembly received by detector, and then improve the accuracy and confidence level of measuring, to be convenient for people to the surface optical characteristics of accurate assurance material.
The present invention is achieved through the following technical solutions: a kind of optical properties of material measurement mechanism, comprise integrating sphere, lighting source, optical receiver assembly, it is characterized in that: also comprise delustring part, described integrating sphere ball wall is provided with measurement window, and optical receiver assembly is provided with on the emitting light path of measurement window, described integrating sphere is also provided with the sample window for gathering sample signal, described delustring part is positioned at the periphery of sample sample area.
The present invention is in the design of the introducing delustring part of the peripheral novelty of sample window and sample sample area, parasitic light beyond the sample area greatly reduced enters into the ratio of optical receiver assembly, and then improve the accuracy of measurement of material surface optical characteristics, the true optical characteristics for accurate understanding and assurance material surface is significant; In addition, the periphery of the sample sample area in the present invention comprises the positions such as integrating sphere inwall, integrating sphere inside cavity and sample surface.Compared to prior art, the present invention have easy and simple to handle, test advantage accurately.
The present invention can also limit and perfect by the following technical programs further:
As a kind of technical scheme, described delustring part is material or the parts with low reflection characteristic.Delustring part is as the term suggests have low reflection characteristic, and the delustring part in this programme can for having the coating of antiradar reflectivity, material or parts, as black coating, black flannelette and surface scribble the endless member etc. of black coating; And for ensureing enough extinction capabilities, the reflectivity of regulation delustring part must not higher than 8%.
As a kind of technical scheme, described delustring part is arranged on the integrating sphere inwall of sample window edge.When delustring part is the material such as coating or black flannelette, delustring part is arranged on the integrating sphere inwall of sample window edge, and then the reflected light of the integrating sphere inwall of elimination sample window edge; Simultaneously in order to ensure the realization of lighting condition, integrating sphere inwall is all coated with white diffuse reflective coating except the delustring partial design of sample window edge.
As a kind of technical scheme, described delustring part is black coating.Black coating can be black diffuse coatings coating, or black mirror face reflection coating etc.; And black coating is evenly coated on the integrating sphere inwall of sample window edge circlewise.
As a kind of technical scheme, in above-mentioned integrating sphere, also comprise support, and described delustring part is fixed by support.When delustring part be surface there are the delustring parts of low reflection characteristic time, delustring parts are fixed on by the support arranged in integrating sphere the periphery being positioned at sample sample area, prevent the reflected light beyond sample area from entering into optical receiver assembly, thus improve measuring accuracy.
As a kind of technical scheme, also comprise target cover, target cover is arranged on integrating sphere, and matches with integrating sphere spheroid, is detachable block; Target cover is provided with sample window, and is provided with delustring part on the target cover inwall of sample window edge.Described target cover is the detachable block of integrating sphere spheroid, can match when being arranged on integrating sphere with integrating sphere spheroid, and as the part of integrating sphere spheroid; Target cover is provided with the sample window corresponding to sample sample area, is used for gathering sample signal; The target cover inwall of sample window edge is provided with delustring part; Target cover inwall is all white coating except delustring part.
As a kind of technical scheme, described delustring part is arranged on sample, is positioned at the edge of sample area.In this programme, the inwall of integrating sphere is all white coating; Delustring part is arranged on the edge of the sample area on sample, when testing, the sample area of sample and the delustring part at edge are placed on the sample window place of integrating sphere simultaneously, and the parasitic light can eliminating tested area peripheral edge equally enters into optical receiver assembly.
As a kind of technical scheme, described sample window is but is not limited to rectangle, or circular, or square.In practical application, the design of sample window shape can need to design according to concrete application, can be rectangle, circular, or square or other polygons.
As a kind of technical scheme, described lighting source is positioned at the inner side of integrating sphere; Or described lighting source is positioned at the outside of integrating sphere, and arrange the lighting window in the light of lighting source introducing ball on integrating sphere.Lighting source can be arranged on the inside and outside of integrating sphere according to actual needs; When lighting source is positioned at integrating sphere outside, the lighting window light of lighting source being introduced integrating sphere inside will be set on integrating sphere ball wall.
As the preferred version of such scheme, also comprise baffle plate, described baffle plate is positioned at integrating sphere inside, is arranged between lighting source and sample; Or described baffle plate is positioned at integrating sphere inside, is arranged between lighting source and lighting window.When lighting source is positioned at integrating sphere inside, baffle plate is arranged between lighting source and sample; When lighting source is outside, baffle plate is arranged between lighting source and lighting window; The light direct irradiation that the arranging of baffle plate can prevent lighting source from sending on sample surface, thus ensure optical properties of material measure in required diffuse lighting conditions.
As a kind of technical scheme, described optical receiver assembly comprises optical imaging device and optical detector.Optical imaging device be used for limiting optical detector institute accept the position in the region of light and reception from the reflected light in this region, and further light transmission to be measured to optical detector; Optical detector in this programme is but is not limited to spectral measuring devices or integration type optoelectronic detector or is tristimulus values chromaticity detector.
As preferably, the optical detector described in technique scheme is spectral measuring devices.Spectral measuring devices can be used for measuring the Spectral power distribution data of sample reflected light, provides foundation for analyzing the spectral reflectivity of sample and color parameter etc., and zero mismatch, measuring accuracy is high.
In sum, the invention discloses a kind of optical properties of material measurement mechanism, by carrying out the design of delustring part in sample test zone periphery, the parasitic light effectively reducing test zone periphery enters into the ratio of optical receiver assembly, improves test accuracy; In addition, the present invention operates very easy, and measuring accuracy but can play the improvement of matter, has the effect of getting twice the result with half the effort, and can advance the progress of whole industry; This optical properties of material measurement mechanism can be widely used in the measurement of various material surface optical characteristics.
[accompanying drawing explanation]
Accompanying drawing 1 is traditional material optical measuring device schematic diagram;
Accompanying drawing 2 is apparatus of the present invention schematic diagram in embodiment 1
Accompanying drawing 3 is integrating sphere ball wall each several part horizontal projection schematic diagram in embodiment 1
Accompanying drawing 4 is apparatus of the present invention schematic diagram in embodiment 2
Accompanying drawing 5 is the integrating sphere ball wall each several part horizontal projection schematic diagram in embodiment 2
Accompanying drawing 6 is apparatus of the present invention schematic diagram in embodiment 3
Accompanying drawing 7 is the target cover schematic diagram in embodiment 3
Accompanying drawing 8 is apparatus of the present invention schematic diagram in embodiment 4
Accompanying drawing 9 is the sample schematic diagram in embodiment 4
1-integrating sphere; 2-lighting source; 3-optical receiver assembly; 3-1-optical imaging device; 3-2-optical detector; 4-delustring part; 5-measurement window; 6-sample; 7-sample window; 8-support; 9-target cover; 10-lighting window; 11-baffle plate;
[embodiment]
Embodiment 1
As shown in Figures 2 and 3, disclose a kind of optical properties of material measurement mechanism in the present embodiment, comprise integrating sphere 1, lighting source 2, optical receiver assembly 3, baffle plate 11, wherein, integrating sphere 1 inside left is provided with lighting source 2, the sample window 7 of integrating sphere 1 bottom rectangle; Integrating sphere 1 inwall of sample window 7 edge scribbles black coating, and the coating in endless belt, be delustring part 4; Integrating sphere 1 inwall is all white coating except delustring part 4; Sample 6 is positioned over sample window 7 place of integrating sphere 1; Baffle plate 11 is arranged between lighting source 2 and sample window 7, and the light preventing lighting source 2 from sending shines directly on the test zone corresponding to sample window 7; Integrating sphere 1 top right side is provided with measurement window 5, arranges optical receiver assembly 3 outside measurement window 5; Lighting source 2 in this example is xenon lamp, the light sent by xenon lamp in measurement being radiated at sample window 7 in integrating sphere 1 after repeatedly diffuse reflection, because delustring part 4 does not almost have reflected light, therefore only there is the reflected light of the sample 6 being placed on sample window 7 place can enter optical receiver assembly 3 by the measurement window 5 of integrating sphere 1; Optical receiver assembly 3 comprises optical imaging device 3-1 and optical detector 3-2, and optical detector 3-2 is herein spectral array detector, can measure characteristics such as the spectral distribution of the reflected light on sample 6 surface, color and reflectivity.
Embodiment 2
As shown in Figures 4 and 5, present embodiment discloses a kind of optical properties of material device, comprise integrating sphere 1, lighting source 2, optical receiver assembly 3, delustring part 4, support 8, baffle plate 11; The inwall of integrating sphere 1 is all white coating; Be provided with lighting window 10 on the left of integrating sphere 1 ball wall, lighting source 2 is set outside lighting window 10; Circular sample window 7 is provided with bottom integrating sphere 1; The support 8 for supporting delustring part 4 is also provided with bottom integrating sphere 1; Sample 6 is positioned over sample window 7 place of integrating sphere 1; Baffle plate 11 is arranged between lighting window 10 and sample window 7, and the light preventing lighting source 2 from sending shines directly on the test zone corresponding to sample window 7; Integrating sphere 1 top right side is provided with measurement window 5, and measurement window 5 place arranges optical receiver assembly 3; Delustring part 4 in this example is for scribbling the annular unit of black diffuse coatings; Lighting source 2 is by the combined light source of 1 white light LEDs, 1 red-light LED, 1 green light LED and 1 blue-ray LED, it is inner that the light that lighting source 2 sends enters integrating sphere 1 by the lighting window 10 of integrating sphere 1, be radiated on sample 6 after repeatedly diffuse reflection, due to the setting of delustring part 4, therefore only there is the reflected light of the sample 6 being placed on sample window 7 place can enter optical receiver assembly 3 by the measurement window 5 of integrating sphere 1; Optical receiver assembly 3 comprises optical receiver assembly 3-1 and optical detector 3-2, and optical detector 3-2 is herein spectral array detector, can measure characteristics such as the spectrum of sample reflection light, color and reflectivity.
Embodiment 3
As shown in Figures 6 and 7, present embodiment discloses a kind of optical properties of material measurement mechanism, comprise integrating sphere 1, lighting source 2, optical receiver assembly 3, delustring part 4, target cover 9, baffle plate 11; Lighting source 2 is provided with on the left of integrating sphere 1; Be provided with target cover 9 bottom integrating sphere 1, target cover 9 is provided with circular sample window 7, and target cover 9 inwall at sample window 7 edge scribbles black coating in the form of a ring, and black coating is delustring part 4; Baffle plate 11 is arranged between lighting source 2 and sample window 7, and the light preventing lighting source 2 from sending shines directly into sample window 7; Integrating sphere 1 top right side is provided with measurement window 5, and measurement window 5 place is provided with optical receiver assembly 3; Sample 6 is placed on sample window 7 place; Target cover 9 in the present embodiment is a part for integrating sphere 1 spheroid, and detachably, and during measurement, target cover 9 to be arranged on integrating sphere 1 and to match with integrating sphere 1 spheroid; Lighting source 2 is White LED, the light that White LED sends in integrating sphere 1 through repeatedly diffuse reflection sample window 7 place, because the black coating at sample window 7 edge has Extinction Characteristic, therefore only there is the reflected light of the sample 6 being placed on sample window 7 place can enter optical receiver assembly 3 by the measurement window 5 of integrating sphere 1; Optical receiver assembly 3 comprises optical imaging device 3-1 and optical detector 3-2, and optical detector 3-2 is tristimulus values chromaticity detector herein, can by measuring sample reflection light, and then the color parameter such as the tristimulus values obtaining sample.
Embodiment 4
As shown in FIG. 8 and 9, disclosed in the present embodiment, a kind of optical properties of material measurement mechanism comprises integrating sphere 1, lighting source 2, optical receiver assembly 3, delustring part 4, baffle plate 11; The inwall of integrating sphere 1 all applies white coating; On the left of integrating sphere 1, ball wall is provided with measurement window 10, is provided with lighting source 2 in measurement window 10 outside; Be provided with leg-of-mutton sample window 7 bottom integrating sphere 1, sample 6 is placed on sample window 7 place, and on sample 6, the circular test zone edge shape triangular in shape of regulation scribbles black diffuse coatings, is delustring part 4; Be provided with baffle plate 11 in integrating sphere 1, prevent the light direct irradiation of lighting source 2 on sample 6; Integrating sphere 1 top right side is provided with measurement window 5, arranges optical receiver assembly 3 outside measurement window 5; Lighting source 2 in the present embodiment is xenon lamp, the light sent by xenon lamp in measurement being radiated at sample window 7 in integrating sphere 1 after repeatedly diffuse reflection, because delustring part 4 does not almost have reflected light, therefore only there is the reflected light of the test zone placing sample 6 can enter optical receiver assembly 3 by the measurement window 5 of integrating sphere 1; Optical receiver assembly 3 comprises optical imaging device 3-1 and optical detector 3-2, and optical detector 3-2 is herein spectral array detector, can measure characteristics such as the spectral distribution of the reflected light on sample 6 surface, color and reflectivity.
4 kinds of embodiments listed above all achieve the measurement of the multiple optical characteristics of material surface by the design of different delustring parts, compared with existing measuring method, have the features such as measuring accuracy is high, simple to operate.
Below by reference to the accompanying drawings the specific embodiment of the present invention is described; but these explanations can not be understood to limit scope of the present invention; protection scope of the present invention is also limited by the claims of enclosing, and any change on the claims in the present invention basis is all protection scope of the present invention.
Claims (11)
1. an optical properties of material measurement mechanism, comprise integrating sphere (1), lighting source (2), optical receiver assembly (3), it is characterized in that: also comprise delustring part (4), described integrating sphere (1) ball wall is provided with measurement window (5), and on the emitting light path of measurement window (5), be provided with optical receiver assembly (3), described integrating sphere (1) is also provided with the sample window (7) for gathering sample (6) signal, described delustring part (4) is positioned at the periphery of sample (6) sample area.
2. optical properties of material measurement mechanism as claimed in claim 1, it is characterized in that, described delustring part (4) is for having material or the parts of low reflection characteristic.
3. optical properties of material measurement mechanism as claimed in claim 1, it is characterized in that, described delustring part (4) is arranged on integrating sphere (1) inwall of sample window (7) edge.
4. optical properties of material measurement mechanism as claimed in claim 1, it is characterized in that, also comprise support (8), and described delustring part (4) is fixed by support (8).
5. optical properties of material measurement mechanism as claimed in claim 1, it is characterized in that, also comprise target cover (9), target cover (9) is arranged on integrating sphere (1), and match with integrating sphere (1) spheroid, be detachable block; Target cover (9) is provided with sample window (7), and is provided with delustring part (4) on target cover (9) inwall of sample window (7) edge.
6. optical properties of material measurement mechanism as claimed in claim 1, it is characterized in that, described delustring part (4) is arranged on sample (6), and is positioned at the edge of sample (6) test zone.
7. the optical properties of material measurement mechanism as described in claim 1 or 3 or 5, is characterized in that, described sample window (7) is but is not limited to rectangle, or square, or circular.
8. optical properties of material measurement mechanism as claimed in claim 1, it is characterized in that, described lighting source (2) is positioned at the inside of integrating sphere (1); Or described lighting source (2) is positioned at the outside of integrating sphere (1), and arrange the lighting window (10) in the light of lighting source (2) introducing ball on integrating sphere (1).
9. optical properties of material measurement mechanism as claimed in claim 7, it is characterized in that, comprise baffle plate (11), it is inner that described baffle plate (11) is positioned at integrating sphere (1), is arranged between lighting source (2) and sample (6); Or it is inner that described baffle plate (11) is positioned at integrating sphere (1), is arranged between lighting source (2) and lighting window (10).
10. optical properties of material measurement mechanism as claimed in claim 7, it is characterized in that, described optical receiver assembly (3) comprises optical imaging device (3-1) and optical detector (3-2).
11. optical properties of material measurement mechanisms as claimed in claim 9, it is characterized in that, described optical detector (3-2) is spectral measuring devices.
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| CN113711009A (en) * | 2019-02-04 | 2021-11-26 | 生命科技控股私人有限公司 | Optical reader and method of analyzing biological sample |
| CN114112026A (en) * | 2021-12-03 | 2022-03-01 | 北京星航机电装备有限公司 | Integrating sphere light path calibration device based on image recognition |
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| CN110146465A (en) * | 2019-04-30 | 2019-08-20 | 深圳市太赫兹科技创新研究院有限公司 | A kind of optical integrating-sphere and sample Terahertz reflectance spectrum acquisition device |
| CN114112026A (en) * | 2021-12-03 | 2022-03-01 | 北京星航机电装备有限公司 | Integrating sphere light path calibration device based on image recognition |
| CN114112026B (en) * | 2021-12-03 | 2023-11-10 | 北京星航机电装备有限公司 | Integrating sphere light path calibration device based on image recognition |
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