CN103389429A - Method for judging structural design of electrical appliance of photovoltaic junction box - Google Patents
Method for judging structural design of electrical appliance of photovoltaic junction box Download PDFInfo
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- CN103389429A CN103389429A CN2013103360451A CN201310336045A CN103389429A CN 103389429 A CN103389429 A CN 103389429A CN 2013103360451 A CN2013103360451 A CN 2013103360451A CN 201310336045 A CN201310336045 A CN 201310336045A CN 103389429 A CN103389429 A CN 103389429A
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- 238000000034 method Methods 0.000 title claims abstract description 45
- 238000013461 design Methods 0.000 title claims abstract description 16
- 230000032683 aging Effects 0.000 claims abstract description 29
- 230000008014 freezing Effects 0.000 claims abstract description 6
- 238000007710 freezing Methods 0.000 claims abstract description 6
- 239000011521 glass Substances 0.000 claims abstract description 6
- 238000003331 infrared imaging Methods 0.000 claims description 5
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 claims description 4
- GNFTZDOKVXKIBK-UHFFFAOYSA-N 3-(2-methoxyethoxy)benzohydrazide Chemical compound COCCOC1=CC=CC(C(=O)NN)=C1 GNFTZDOKVXKIBK-UHFFFAOYSA-N 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 9
- 238000012360 testing method Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000001931 thermography Methods 0.000 description 3
- 239000008358 core component Substances 0.000 description 2
- 230000029087 digestion Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012113 quantitative test Methods 0.000 description 2
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 235000009508 confectionery Nutrition 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
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Abstract
The invention discloses a method for judging the structural design of an electric appliance of a photovoltaic junction box, which comprises the steps of firstly adhering a plurality of photovoltaic junction boxes to be tested on glass and connecting the photovoltaic junction boxes in series; introducing a first current to the series circuit, and then respectively measuring and recording the temperature of each device in the series circuit and/or the forward voltage drop of a diode in the photovoltaic junction box to be detected in the series circuit on the front side and the back side of the photovoltaic junction box to be detected; putting the series circuit into a wet freezing and aging box, carrying out aging process for at least one period, then introducing a first current into the series circuit, and measuring/recording the temperature of each device in the series circuit and/or the forward voltage drop of a diode in a photovoltaic junction box to be detected in the series circuit; and comparing the corresponding data of each device in the series circuit obtained before and after aging, and judging the performance of each device in the series circuit according to the difference. The method can quickly and accurately detect the photovoltaic junction box.
Description
Technical field
The present invention relates to area of solar cell, relate in particular to the method for a kind of photovoltaic junction box electrical structure design decision.
Background technology
Photovoltaic junction box is current collection gas, material, machinery product.Its structural design directly affects whole photovoltaic module electric energy output, compatible performance, security performance index of correlation.Requirement according to relevant criterion such as existing industry IEC61215, UL1703, UL61730, BS EN50548:2011, consider the actual motion environment of photovoltaic product, photovoltaic junction box is under the prerequisite that meets the conventional criteria test request, and the method for its combination property of Fast Evaluation is deviser and user's concern extremely.
In the prior art, each photovoltaic junction box for different electrical structure designs detects, can only be undertaken by every independent test, lower each product otherness each other of the different electrical structure designs of evaluation that can not be comprehensive, and have many unfavorable factors, for example: judge that accuracy is poor, disturbing factor too much, judge that index is single, detect long, experimental result consuming time and be difficult to quantitative and different sample gap indistinguishables etc.
Therefore at present be badly in need of a kind of than classic method more comprehensively, more accurate, save time and the effective method of testing for photovoltaic junction box.
Summary of the invention
The problem that is difficult to detect for the traditional detection method that solves for the various photovoltaic junction box performance differences that bring due to different electrical structures designs, the present invention is from the electrical structure of photovoltaic junction box, after designing a kind of series connection of photovoltaic junction box with different electrical structure designs; Again the photovoltaic junction box end is passed into identical electric current I (I≤i(diode rated current)); And adopt the thermal imaging means to be monitored the method that technology that each tie point temperature rise Δ of each photovoltaic junction box T changes is judged the performance of each device in series circuit.
According to an aspect of the present invention, provide the method for a kind of photovoltaic junction box electrical structure design decision, comprise the steps:
A) a plurality of photovoltaic junction boxes to be measured are bonded on glass, and described photovoltaic junction box to be measured are connected into series circuit;
B) described series circuit is passed into the first electric current, and at least one particular point in time after energising from the positive planar survey of described photovoltaic junction box to be measured and record the temperature of each device described series circuit and/or described series circuit in the forward voltage drop of diode in photovoltaic junction box to be measured;
C) described series circuit is passed into the first electric current, and at least one particular point in time after energising is measured and records in the temperature of each device described series circuit and/or described series circuit the forward voltage drop of diode in photovoltaic junction box to be measured from the described photovoltaic junction box to be measured back side;
D) described series circuit is put into wet frozen ageing oven and carry out the ageing process of one-period at least;
E) the described series circuit after aging is taken out from described wet freezing ageing oven, and outage;
F) described series circuit is passed into the first electric current, and measure/record in the temperature of each device in described series circuit and/or described series circuit the forward voltage drop of diode in photovoltaic junction box to be measured;
G) corresponding data that obtains in described step b) and described step f) is compared, the corresponding data that obtains in described step c) and described step f) is compared, according to the performance of each device in the described series circuit of difference judgement.
, according to a specific embodiment of the present invention, comprise at least two photovoltaic junction boxes with producer's same model in described photovoltaic junction box to be measured.
, according to another embodiment of the present invention, adopt connector to connect between described photovoltaic junction box to be measured.
According to another embodiment of the present invention, when described photovoltaic junction box to be measured derives from different manufacturers, when connecting into series circuit, have and be connected between both positive and negative polarity with the photovoltaic junction box to be measured of producer and connector, also have and be connected between the photovoltaic junction box to be measured of different manufacturers and the both positive and negative polarity of connector.
According to another embodiment of the present invention, in described step g), temperature gap is less, and the performance of device is better; Forward voltage drop is less, and the performance of device is better.
Adopt method provided by the invention to judge the design of photovoltaic junction box electrical structure, can detect all devices in series circuit simultaneously, effectively improved detection efficiency; Can analyze intuitively the performance difference that exists between the photovoltaic junction box of different electrical structure designs; Can use as required multiple photovoltaic junction box and connector to form series circuit, extensibility is strong; In addition, adopt this method accuracy high, consuming time short, disturb less and can carry out quantitative test, the credible result degree is high.
Description of drawings
By reading the detailed description that non-limiting example is done of doing with reference to the following drawings, it is more obvious that other features, objects and advantages of the present invention will become:
Figure 1 shows that the schematic diagram according to a kind of concrete connected mode of photovoltaic junction box in the method for a kind of photovoltaic junction box electrical structure of the present invention design decision;
Figure 2 shows that the schematic diagram positive in kind according to a kind of concrete connected mode of photovoltaic junction box in the method for a kind of photovoltaic junction box electrical structure of the present invention design decision;
Figure 3 shows that the back side schematic diagram in kind according to a kind of concrete connected mode of photovoltaic junction box shown in Figure 2;
Fig. 4 (a) is depicted as the pictorial diagram of a kind of thermal imaging detector that uses in the present invention;
Fig. 4 (b) is depicted as the pictorial diagram of the another kind of thermal imaging detector that uses in the present invention;
Figure 5 shows that the pictorial diagram of a kind of constant current source that uses in the present invention;
Figure 6 shows that after the method according to this invention detects the front of photovoltaic junction box the histogram that experimental data is done that obtains;
Figure 7 shows that after the method according to this invention detects the back side of photovoltaic junction box the histogram that experimental data is done that obtains;
Figure 8 shows that the method according to this invention carries out after self detects the histogram that experimental data is done that obtains to connector;
Figure 9 shows that the method according to this invention carries out the histogram that experimental data is done that obtains after compatible the detection to connector;
The histogram that experimental data is done that obtains after Figure 10 shows that the method according to this invention pressure drop detecting to diode forward.
In accompanying drawing, same or analogous Reference numeral represents same or analogous parts.
Embodiment
Disclosing hereinafter provides many different embodiment or example to be used for realizing different structure of the present invention.Of the present invention open in order to simplify, hereinafter parts and the setting of specific examples are described.In addition, the present invention can be in different examples repeat reference numerals and/or letter.This repetition is in order to simplify and purpose clearly, itself do not indicate the relation between the various embodiment of discuss and/or setting.Should be noted that illustrated parts are not necessarily drawn in proportion in the accompanying drawings.The present invention has omitted description to known assemblies and treatment technology and technique to avoid unnecessarily limiting the present invention.
Step S101,, with reference to figure 1～Fig. 3,, according to the method for photovoltaic junction box electrical structure provided by the invention design decision, be bonded at a plurality of photovoltaic junction boxes to be measured on glass, and described photovoltaic junction box to be measured connected into series circuit.In series circuit shown in Figure 1, comprise 8 kinds of photovoltaic junction boxes, be respectively: A, B, C, D, E, F, G, H.Preferably, every kind of photovoltaic junction box has 2, and the photovoltaic junction box of two identical type is adjacent one another are.Generally, the identical type photovoltaic junction box refers to the photovoltaic junction box of same producer same model.
Adopt connector to connect between every two photovoltaic junction boxes.In series circuit shown in Figure 1, used altogether 17 connectors, the connector that wherein connects two photovoltaic junction boxes to be measured all marks in Fig. 1.Preferably, when described photovoltaic junction box to be measured derives from different manufacturers, when connecting into series circuit, have and be connected between the both positive and negative polarity with the photovoltaic junction box to be measured of producer and connector, also have and be connected between the photovoltaic junction box to be measured of different manufacturers and the both positive and negative polarity of connector.For example, the connector (1) between two photovoltaic junction box C is same manufacturer production with photovoltaic junction box; Photovoltaic junction box C and connector (2) come from different manufacturers.In like manner, the connector (15) between two photovoltaic junction box F is same manufacturer production with photovoltaic junction box; And photovoltaic junction box F and connector (2) and connector (3) all come from different manufacturers.Relation between remaining photovoltaic junction box and connector can be by that analogy.
Preferably, photovoltaic junction box to be measured need to be bonded at rear curing on glass at least 36 hours, connect into again afterwards series circuit.
Step S102,, with after connector is connected, start photovoltaic junction box described series circuit is passed into the first electric current.With reference to figure 5, preferred, use the DC constant current source to switch on to described series circuit.Preferably, described the first electric current is not higher than the rated current of diode.Described diode is the core component in photovoltaic junction box.Generally, this rated current is 12A, and namely described the first electric current, not higher than 12A, can be: 10A, 11A, be preferably 12A.
At least one particular point in time after energising from the positive planar survey of described photovoltaic junction box to be measured and record the temperature of each device described series circuit and/or described series circuit in the forward voltage drop of diode in photovoltaic junction box to be measured.Preferably, adopt the thermal infrared imaging instrument to carry out to the measurement of device temperature.The thermal infrared imaging instrument that Fig. 4 (a) and Fig. 4 (b) illustrate is optional thermometric instruments in the present invention, is appreciated that shown in figure and only is example, and be not the restriction to thermometric instruments; All instruments that can be used for each device temperature of series circuit is measured all can use.
Described particular point in time is energising rear 10min, 30min, 60min, 90min and/or 120min.Measurement for described device can be chosen one wantonly, perhaps takes multiple measurements.Be measured as example with 120min, with reference to figure 6, photovoltaic junction box A～photovoltaic junction box G is respectively in aging front 120min/ average: 141.65,120.20,118.95,115.80,109.55,94.25,92.65.It should be noted that this measurement at the positive planar survey of photovoltaic junction box, i.e. the state opened of lid.
With reference to figure 8, when same producer photovoltaic junction box is connected with connector, measured the temperature of connector (1), (7), (12) and (10), be respectively: 33.5 ℃, 31.2 ℃, 29.2 ℃ and 28.3 ℃.
With reference to figure 9, when the different manufacturers photovoltaic junction box is connected (testing its compatibility) with connector, measured the temperature of connector (5), (4), (3), (6), (2), (11), (8), (13) and (9), be respectively: 33.2 ℃, 32.9 ℃, 32.7 ℃, 32.3 ℃, 30.7 ℃, 28.9 ℃, 28.8 ℃, 28.5 ℃ and 28.5 ℃.
, except temperature is measured, also need the forward voltage drop of diode in photovoltaic junction box is measured and record.
Continue execution step S103, described series circuit is passed into the first electric current, and at least one particular point in time after energising is measured and records in the temperature of each device described series circuit and/or described series circuit the forward voltage drop of diode in photovoltaic junction box to be measured from the described photovoltaic junction box to be measured back side.While measuring overleaf, photovoltaic junction box need to be covered tightly, make its sealing.
With reference to figure 5, preferred, use the DC constant current source to switch on to described series circuit.Preferably, described the first electric current is not higher than the rated current of diode.Described diode is the core component in photovoltaic junction box.Generally, this rated current is 12A, and namely described the first electric current, not higher than 12A, can be: 10A, 11A, be preferably 12A.In step S102 the size of the first electric current used need to step S103 in identical.Preferably, after passing into the first electric current, arrived the characteristics time point, respectively the front and back of photovoltaic junction box has been measured; Namely carry out once electrification, obtain two kinds of results.
Preferably, adopt the thermal infrared imaging instrument to carry out to the measurement of device temperature.The thermal infrared imaging instrument that Fig. 4 (a) and Fig. 4 (b) illustrate is optional thermometric instruments in the present invention, is appreciated that shown in figure and only is example, and be not the restriction to thermometric instruments; All instruments that can be used for each device temperature of series circuit is measured all can use.
Described particular point in time is energising rear 10min, 30min, 60min, 90min and/or 120min.Measurement for described device can be chosen one wantonly, perhaps takes multiple measurements.Be measured as example with 120min, with reference to figure 7, photovoltaic junction box E, B, A, D, F, C and G are respectively in aging front 120min/ average: 86.4,81.7,72.8,71.7,70.75,70.6,63.45.It should be noted that this measurement measures at the photovoltaic junction box back side, i.e. the lid state of closing., except temperature is measured, also need the forward voltage drop of diode in photovoltaic junction box is measured and record.
Aging front desired data is measured after, carry out aging step, i.e. step S104, put into described series circuit wetly to freeze ageing oven and carry out the ageing process of one-period at least.In described ageing process, pass into the second electric current to described series circuit, described the second electric current is not more than the rated current of described diode and is not less than the short-circuit current of described photovoltaic junction box.Described the second electric current is preferably 9A.
Be generally 24 hours a digestion period.Preferably, described series circuit is put into wet frozen ageing oven and carry out 1,7,20 or 30 digestion periods.In the present invention, the diode model of using in photovoltaic junction box to be measured is 12SQ045, and its rated current minimum is 12A, and the short-circuit current of photovoltaic module generally is not more than 9A.Therefore in the described ageing process of the present embodiment, the electric current that passes into series circuit is 9A.According to different photovoltaic junction boxes and/or the difference of diode-built-in model wherein, the size of the second electric current is not limited to 9A, and the size of described the second electric current is preferably the maximal value of the short-circuit current of photovoltaic module.
In addition, ageing process is to carry out wet freezing under (HF) environment, and this environment temperature is generally-40 ℃～85 ℃.Under this environment, material that can comprehensive test extreme environment photovoltaic junction box, the comprehensive weather resistance of electrical structure.Such as, (the shell temperature of itself and the superposition value of environment temperature (as 85 ℃) when this high temperature mainly comes from the diode energising), if the photovoltaic junction box body material is not up to standard, may chap at high temperature; In addition,, due to the difference of photovoltaic junction box inner space, also can produce impression to the performance of diode, for example, when temperature raises, as less in space in compartmentalized box for holding assorted fruits and candies, may cause the heat radiation of photovoltaic junction box bad, cause device temperature too high, hydraulic performance decline.Therefore, the result that the one or more ageing processes of increase obtain in test process is more comprehensive than the result that conventional test methodologies obtains, more accurate; And can find out more quickly the difference between different photovoltaic junction boxes and connector, define its quality, to reach the purpose that reduces the application risk.
After aging, execution step S105, take out the described series circuit after aging from described wet freezing ageing oven, and outage.
And then execution step S106, pass into the first electric current to described series circuit, and measure/record in the temperature of each device in described series circuit and/or described series circuit the forward voltage drop of diode in photovoltaic junction box to be measured.Namely to from wetting, freezing ageing oven the series circuit that takes out and cut off the power supply, pass into the electric current of 12A, and at special time, the temperature of device and the forward voltage drop of diode are measured.
The selection of described special time needs identical with selected special time in step S102 and step S103; The size of described the first electric current also should with step S102 and step S103 in the first size of current choose identical., with reference to figure 6 and Fig. 7, can obtain respectively in the 120min time point temperature of aging rear (HF) photovoltaic junction box front and back; , with reference to figure 8 and Fig. 9, can obtain aging rear (HF) temperature with producer's connector and different manufacturers (compatibility) connector in the 120min time point.Simultaneously, need the forward voltage drop of diode is carried out record.
Book can be found out according to the above description, although the device that may comprise in series circuit is a lot, the device that the present invention mainly measures comprises: photovoltaic junction box to be measured and connector.Certainly, can also carry out various parameter measurements to other device as required, at this, not do restriction.
Step S107, compare the corresponding data that obtains in described step S102 and described step S106, the corresponding data that obtains in described step S103 and described step S106 compared, according to the performance of each device in the described series circuit of difference judgement., with reference to figure 6～Fig. 9, in field last column of every accompanying drawing, be comparing result.Generally, temperature gap is less, and the performance of device is better; Forward voltage drop is less, and the performance of device is better.Therefore, according to Fig. 6, can find out that the performance of photovoltaic junction box F is best; According to Fig. 7, the performance of photovoltaic junction box G is best; According to Fig. 8, the performance of connector (10) is best; According to Fig. 9, the performance of connector (3) and (13) is best.With reference to Figure 10, the forward voltage drop of photovoltaic junction box A is 306.55mv, with other photovoltaic junction boxes, compares, and forward voltage drop is minimum, so its performance is best.
Adopt the method for this method to detect photovoltaic junction box, the testing result accuracy is high, and testing process consuming time short, disturb less and can carry out quantitative test.
Although describe in detail about example embodiment and advantage thereof, be to be understood that and can carry out various variations, substitutions and modifications to these embodiment in the situation that do not break away from the protection domain that spirit of the present invention and claims limit.For other examples, when those of ordinary skill in the art should easily understand within keeping protection domain of the present invention, the order of processing step can change.
Claims (12)
1. the method for photovoltaic junction box electrical structure design decision, comprise the steps:
A) a plurality of photovoltaic junction boxes to be measured are bonded on glass, and described photovoltaic junction box to be measured are connected into series circuit;
B) described series circuit is passed into the first electric current, and at least one particular point in time after energising from the positive planar survey of described photovoltaic junction box to be measured and record the temperature of each device described series circuit and/or described series circuit in the forward voltage drop of diode in photovoltaic junction box to be measured;
C) described series circuit is passed into the first electric current, and at least one particular point in time after energising is measured and records in the temperature of each device described series circuit and/or described series circuit the forward voltage drop of diode in photovoltaic junction box to be measured from the described photovoltaic junction box to be measured back side;
D) described series circuit is put into wet frozen ageing oven and carry out the ageing process of one-period at least;
E) the described series circuit after aging is taken out from described wet freezing ageing oven, and outage;
F) described series circuit is passed into the first electric current, and measure/record in the temperature of each device in described series circuit and/or described series circuit the forward voltage drop of diode in photovoltaic junction box to be measured;
G) corresponding data that obtains in described step b) and described step f) is compared, the corresponding data that obtains in described step c) and described step f) is compared, according to the performance of each device in the described series circuit of difference judgement.
2. method according to claim 1, is characterized in that, described the first electric current is not higher than 12A.
3. method according to claim 1, is characterized in that, comprises at least two photovoltaic junction boxes with producer's same model in described photovoltaic junction box to be measured.
4. according to claim 1 or 3 described methods, is characterized in that, adopts connector to connect between described photovoltaic junction box to be measured.
5. method according to claim 4, it is characterized in that, when described photovoltaic junction box to be measured derives from different manufacturers, when connecting into series circuit, have and be connected between both positive and negative polarity with the photovoltaic junction box to be measured of producer and connector, also have and be connected between the photovoltaic junction box to be measured of different manufacturers and the both positive and negative polarity of connector.
6. method according to claim 1, is characterized in that, the device in described series circuit comprises: photovoltaic junction box to be measured and connector.
7. method according to claim 1, is characterized in that, described step a) is further photovoltaic junction box to be measured to be bonded at rear curing on glass at least 36 hours, and described photovoltaic junction box to be measured is connected into series circuit.
8. method according to claim 1, is characterized in that, the particular point in time in described step b) and/or described step c) is energising rear 10min, 30min, 60min, 90min and/or 120min.
9. method according to claim 1, is characterized in that, in described step d), in described ageing process, to described series circuit, passes into the second electric current; Described the second electric current is not more than the rated current of described diode and is not less than the short-circuit current of described photovoltaic junction box.
10. method according to claim 9, described the second electric current is 9A.
11. method according to claim 1, is characterized in that, in described step g), temperature gap is less, and the performance of device is better; Forward voltage drop is less, and the performance of device is better.
12. according to claim 1～10 described methods of any one, is characterized in that, adopts the thermal infrared imaging instrument to measure the temperature of device.
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| CN112924783A (en) * | 2021-01-27 | 2021-06-08 | 昆山丘钛光电科技有限公司 | Module testing method, device, equipment and medium |
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| 钦卫国: "不同类型旁路二极管光伏组件接线盒认证测试性能比较", 《认证技术》, no. 11, 10 November 2010 (2010-11-10), pages 54 - 55 * |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109579998A (en) * | 2017-09-28 | 2019-04-05 | 阿特斯阳光电力集团有限公司 | The detection method of photovoltaic connector contact resistance |
| CN112924783A (en) * | 2021-01-27 | 2021-06-08 | 昆山丘钛光电科技有限公司 | Module testing method, device, equipment and medium |
| CN112924783B (en) * | 2021-01-27 | 2023-10-20 | 昆山丘钛光电科技有限公司 | Module testing method, device, equipment and medium |
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