CN103389392B - A kind of nano-probe preparation method measuring AFM mechanics parameter - Google Patents
A kind of nano-probe preparation method measuring AFM mechanics parameter Download PDFInfo
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- CN103389392B CN103389392B CN201310315177.6A CN201310315177A CN103389392B CN 103389392 B CN103389392 B CN 103389392B CN 201310315177 A CN201310315177 A CN 201310315177A CN 103389392 B CN103389392 B CN 103389392B
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Abstract
The present invention provides a kind of nano-probe preparation method measuring AFM mechanics parameter, prepares nano-probe required product and includes: without needle point micro-cantilever probe, diameter be the microsphere of 2-5um or 5um-10um, ethylene oxide resin glue, special tune mix cutter, with the standard glass slide of exact scale or SEM, biotype AFM with optical microscope and imaging system;The nano-probe of micro-cantilever and biotype AFM coupling.This nano-probe preparation method without each imaging complete after change needle point, calibration laser, then the pin of more tape swapping microsphere goes to measure the step of mechanics parameter, makes simple to operate, and the mechanics parameter making measurement is more accurate.
Description
Technical field
The present invention relates to a kind of nano-probe preparation method measuring AFM mechanics parameter, belong to field of mechanical technique.
Background technology
The application of nanotechnology brings huge development prospect to medical science, life sciences, pharmacy, chemistry and biological detection, manufacturing industry, optics and national defence etc. field.Nanometer technique means are used to solve the problem that a lot of classical theories cannot be considered.And AFM is as one of key instrument studying micro-nano-scale, in recent years, the recoverable amount of the large-scale research institution such as institute and colleges and universities is continuously increased at home, but meanwhile, match with it the easy consumption material of high cost---the consumption of nano-probe also rapidly increases.But AFM design principle traditionally, to pursue high-resolution imaging in using probe scanning, be difficult to obtain accurate mechanical property parameter measurement simultaneously.
Summary of the invention
The present invention provides a kind of nano-probe preparation method measuring AFM mechanics parameter, above told defect can be overcome, lead to and traditional cone or pyramid needle point are modified, use microsphere to modify not only to meet the parsing of high-resolution pattern but also mechanics parameter measurement accurately can be realized, avoid due to the needle point single-point huge pressure damage problem to cell membrane, meet common laboratory cost degradation principles and requirements, there is provided a kind of practical, low cost, function admirable, it is obtained in that accurate mechanics parameter measures ground, synchronicity concordance is nano-probe microsphere modification preparation method preferably, with satisfied society and the market demand.Thus for the mechanics parameter accurately measuring the nano-scale degree such as normal cell and cancerous cell, tissue, material and surface particles thing, providing a kind of means reliably for micro-nano research field.
For solving above technical problem, the present invention provides following technical scheme: a kind of nano-probe preparation method measuring AFM mechanics parameter, prepares nano-probe required product and includes: micro-cantilever probe, diameter be 2-5 μm microsphere, ethylene oxide resin glue, special tune mix cutter, with the standard glass slide of exact scale, with optical microscope and imaging system biotype AFM;Described micro-cantilever probe and biotype AFM coupling;The step of described probe preparation method is as follows:
A. micro-cantilever probe being inserted AFM, set up and focussed laser spot by normal operation step, it is aligned in the region by cementation microsphere.
B. after setting up laser and focusing on, it is thus achieved that suitable Sum, make laser facula focus to four-quadrant center, withdraw motor and syringe needle, place the microsphere on microscope slide and microscope slide.
C. being layered in advance in a side region of clean microscope slide by microsphere, and take off AFM scan head, placing is have the microscope slide of microsphere to put AFM sample stage to fix, and utilizes CCD to observe the form of institute's paving microsphere, size and the uniformity.
D., under AFM microscope, implement microoperation with AFM micro-cantilever and promote the little scope of microsphere to move the demarcation region to standard film, so that it is determined that the diameter of institute's micrometer ball, after completing operation, standby;
E. relay the microsphere microscope slide being covered with known dimensions specification before, microsphere microscope slide is placed in AFM sample stage and fixes, preparation operation.
F. advance AFM motor to close to the microsphere surface on slide, careful observation select the microsphere in wanted microoperation region again under the AFM CCD carried assists, and make micro-mark with micro-marker pen, certain region is elected to be operating space.
G. remove motor, lift pin, take off microscope slide, properly place standby;Separately take microscope slide one piece clean for being in harmonious proportion epoxide-resin glue, after the two of epoxy resin kinds of paste composition are pressed the mixing of 1:1 equal-volume, adjust rapidly and mix uniformly.
H. it is in harmonious proportion after uniformly, takes a little glue, be placed near the region of microsphere.
I. fix microscope slide, drive motor to advance motor, lower pin.
G. open and drive motor to advance motor, prepare to dip in glue in micro-cantilever.
K., after playing pin gently to contact glue to micro-cantilever, after slightly dipping in a little glue, do not lift pin and drag micro-cantilever round about and erase unnecessary glue.
L. then lifting pin, hand adjustment AFM sample stage moves to the microsphere region performing labelling, is just set up position in micro-cantilever tip location center, lower pin, until touching above microsphere, stagnates 30s-1min.
M. lift needle point and microsphere on, withdraw 50 μm to motor upward, braking, wait that epoxy resin is fully cured.
Further, described nano-probe micro-cantilever be shaped as rectangle, flechette-type, V-arrangement or triangle.
Further, described microsphere is monodisperse system polystyrene microsphere, glass microsphere or SiO2Microsphere.
This nano-probe preparation method measuring AFM mechanics parameter that the present invention relates to, has the advantages that
1. self assembling type micro-cantilever nano-probe and microsphere can reduce the cost of laboratory.
The microsphere of the monodisperse system of 2.2-5 μm and more than 5 μm can be taken into account high-resolution imaging and mechanics parameter and measure, it is not necessary to every time imaging complete after change needle point, calibration laser, then the pin of more tape swapping microsphere goes to measure the step of mechanics parameter.
3. ethylene oxide resin glue can provide sufficiently solid bonding force for probe cantilever with microsphere, and can ensure that the microoperation implemented under the microscope smoothly completes its hardening time.
4. being used for determining the diameter of monodisperse system microsphere with standard film and the SEM with exact scale, simple and easy to do, degree of accuracy is high.
5.AFM microscopic system can for implementing a kind of method that microoperation or micro-modification provide micro-nano-scale feasible in visible visual field.
6. declining the cantilever probe combination with minimicrosphere it can be avoided that the huge pressure of needle point single-point is to biomembranous damage and self intrinsic needle point upwards segregation problem without needle point, the mechanics parameter making measurement is more accurate.
Accompanying drawing explanation
Fig. 1 is nano-probe structural representation of the present invention;
Fig. 2 is that the present invention nanometer visits knot pin structure schematic diagram;
Fig. 3 is nano-probe structural representation of the present invention;
Fig. 4 monodisperse system polystyrene microsphere of the present invention, glass bead or SiO2Micro-sphere structure schematic diagram;
Fig. 5 present invention adjusts and mixes knife structure schematic diagram;
Fig. 6 and Fig. 7 is microscope slide of the present invention and preparation process schematic diagram;
Fig. 8 and Fig. 9 is nano-probe of the present invention and micro-sphere structure figure;
Figure 10 is the probe clamp structure chart of biotype AFM optical microphotograph imaging system;
Detailed description of the invention
As shown in Figure 1-Figure 3, micro-cantilever respectively rectangle, flechette-type and triangle.
This preparation method can be used for the mechanical property of the nano-scale degree such as various normal cell and cancerous cell, tissue, material and surface particles thing and the accurate measurement of parameter, and the object particularly with nano-scale measures and imaging.Equipment and instrument that preparation method includes are as follows: the nano-probe of micro-cantilever, micro-cantilever within 2 μm-5 μm and 5 μm more than, the polystyrene microsphere of monodisperse system, glass microsphere, or SiO2Cutter mixed in microsphere, ethylene oxide resin glue and special tune, and with standard glass slide (25*75* thickness 3mm, transparent) or the SEM of exact scale, biotype AFM is with optical microscope and imaging system.As shown in Figure 4 and Figure 5, knife structure figure is mixed for microsphere and tune.
As illustrated in figures 6-10, for preparation process schematic diagram.Nano-probe 1 described in this method and biotype AFM coupling, the described standard glass slide 5 with exact scale and SEM are the diameter determining monodisperse system microsphere 2, and ethylene oxide resin glue 3 and special tune mix cutter for cementation microsphere 2.Its concrete grammar is: be first arranged on AFM scan head by nano-probe 1, the micro-cantilever 11 of nano-probe 1, carry out AFM calibration, then microscope condenser lens is lifted, take off probe, monodisperse system microsphere 2 is fallen off some to microscope slide 5, then, the microscope slide 5 being loaded with microsphere is put back to AFM sample fixed station fix, again focus lamp is put back into, set pin under initial value, Step wise approximation under the driving of motor, after reaching microscope slide 5 surface, lift 200 μm of pin, probe 1 leaves microscope slide 5 surface, focus on microsphere 2, observe size and the uniformity of microsphere 2, choose the region of microsphere 2 to be bonded, and do micro-labelling with Marker pen, again probe 1 is thoroughly left surface of glass slide, take off the slide being loaded with microsphere 2 standby;Separately take a piece of clean microscope slide 5 for being in harmonious proportion epoxide-resin glue 3, respectively take powder and liquor 1:1(v/v), adjust with plastics and mix cutter mediation, the hardening time of general this kind of epoxide-resin glue 3 is 5-10min, wait being in harmonious proportion after uniformly, take a little glue, it is placed near the region of microsphere 2, fix this load glass 5, under adjustment condenser lens, pin is to the edge of resin glue, find position, play pin gently to contact glue, withdraw rapidly the surface of glue, pin under a white space is looked for extremely to contact bottom microscope slide 5, now unnecessary glue erased by careful motion scan pin, then the microsphere region that on adjustment sample stage, labelling is good in advance is placed in the lower section of pin, motor is advanced to make pin approach microsphere aspect, again determine the microsphere 2 to operate, lower pin is to microsphere 2, or the lower pin white space that extremely distance microsphere is nearer, after lifting pin 100, microsphere 2 is moved under pin, probe 1 is made to contact with microsphere 2, various AFM all has display (such as JPK is idle), this state is kept to stagnate several seconds, then 100 μm of pin is removed, any vibrations do not occur, wait that about 30min makes glue thoroughly solidify, so far all processes that probe microsphere is modified is completed.
This nano-probe preparation method measuring AFM mechanics parameter that this technology provides, the parsing of high-resolution pattern can be met for traditional cone or pyramid needle point and mechanics parameter accurately can not be realized and measure, the single-point huge pressure damage problem for cell membrane of needle point easily occurs, and the application specific probe cost of the load microsphere after improving is too high, the requirement of common laboratory cost degradation principle can not be met, therefore this method makes up above-mentioned main deficiency, propose one practicably, low cost, it is obtained in that accurate mechanics parameter measures ground, synchronicity concordance is nano-probe microsphere method of modifying preferably, for accurately measuring normal cell and cancerous cell, tissue, the mechanics parameter of the nano-scale degree such as material and surface particles thing, a kind of means reliably are provided for micro-nano research field.
Detailed description of the invention of the present invention is not intended that the restriction to the application scope; within every spirit at present inventive concept and principle, any amendment that one of skill in the art can make, equivalent replacement and improvement etc. should be included within protection scope of the present invention.
Claims (3)
1. the nano-probe preparation method that can measure AFM mechanics parameter, it is characterized in that, prepare nano-probe required product and include: micro-cantilever probe, diameter be 2-5 μm microsphere, ethylene oxide resin glue, special tune mix cutter, the standard glass slide with exact scale, the biotype AFM with optical microscope and imaging system;Described micro-cantilever probe and biotype AFM coupling;The step of described probe preparation method is as follows:
A, micro-cantilever probe being inserted AFM, set up and focussed laser spot by normal operation step, it is aligned in the region by cementation microsphere;
B, after setting up laser and focusing on, it is thus achieved that suitable Sum, make laser facula focus to four-quadrant center, withdraw motor and syringe needle, placement standard glass slide and microsphere;
C, microsphere is layered in a side region of clean standard glass slide in advance, and takes off AFM scan head, place and fix in there being the standard glass slide of microsphere to put AFM sample stage, and utilize CCD to observe the form of institute's paving microsphere, size and the uniformity;
D., under AFM microscope, implement microoperation with AFM micro-cantilever and promote the little scope of microsphere to move the demarcation region to standard glass slide, so that it is determined that the diameter of institute's micrometer ball, after completing operation, microsphere is standby;
E. relay the standard glass slide being covered with known dimensions specification microsphere before, this standard glass slide is placed in AFM sample stage and fixes, preparation operation;
F. AFM motor to probe is advanced to be near the mark the microsphere surface on microscope slide, careful observation select the microsphere in wanted microoperation region again under the AFM CCD carried assists, and make micro-mark with micro-marker pen, certain region is elected to be operating space;
G. remove motor, lift pin, take off standard glass slide, properly place standby;Separately take microscope slide one piece clean for being in harmonious proportion epoxide-resin glue, after the two of epoxy resin kinds of paste composition are pressed the mixing of 1:1 equal-volume, adjust rapidly and mix uniformly;
H. it is in harmonious proportion after uniformly, takes a little glue, be placed near the region of microsphere;
I. fixed standard microscope slide, drives motor to advance motor, lower pin;
G. open and drive motor to advance motor, prepare to dip in glue in micro-cantilever;
K., after playing pin gently to contact glue to micro-cantilever, after slightly dipping in a little glue, do not lift pin and drag micro-cantilever round about and erase unnecessary glue;
L. then lifting pin, hand adjustment AFM sample stage moves to the microsphere region performing labelling, is just set up position in micro-cantilever tip location center, lower pin, until touching above microsphere, stagnates 30s-1min;
M. lift needle point and microsphere on, withdraw 50 μm to motor upward, braking, wait that epoxy resin is fully cured.
2. a kind of nano-probe preparation method measuring AFM mechanics parameter according to claim 1, it is characterised in that described nano-probe micro-cantilever be shaped as rectangle, flechette-type, V-arrangement or triangle.
3. a kind of nano-probe preparation method measuring AFM mechanics parameter according to claim 1, it is characterised in that described microsphere is monodisperse system polystyrene microsphere, glass microsphere or SiO2Microsphere.
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WO2016107534A1 (en) * | 2014-12-29 | 2016-07-07 | 史拓莱姆有限公司 | Detection device having attached probe |
EP3159690A1 (en) | 2015-10-22 | 2017-04-26 | Universität Basel | Nanomechanical profiling of breast cancer molecular subtypes |
CN107796958B (en) * | 2017-09-18 | 2019-10-01 | 上海理工大学 | A kind of preparation method of atomic force microscope colloid probe |
CN110057751B (en) * | 2018-01-19 | 2021-06-29 | 清华大学 | Apparatus and method for fabricating optical particle probe |
CN109444476B (en) * | 2018-10-15 | 2021-04-20 | 上海交通大学 | Preparation method of submicron probe for atomic force microscope |
CN109521227A (en) * | 2018-10-21 | 2019-03-26 | 天津大学 | A kind of fast preparation method and application of colloid probe |
CN110155938B (en) * | 2019-06-11 | 2022-01-28 | 西南交通大学 | Method for preparing microsphere probe based on micro-cantilever transfer |
CN111505346A (en) * | 2020-05-15 | 2020-08-07 | 大连理工大学 | AFM probe for quantitative measurement, modification method and application thereof |
CN113267649B (en) * | 2021-04-29 | 2023-03-17 | 大连海事大学 | Preparation method of long-arm probe of atomic force microscope |
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