CN103364081B - A kind of proving installation and method of testing improving photovoltaic pulse tester irradiance uniformity - Google Patents

A kind of proving installation and method of testing improving photovoltaic pulse tester irradiance uniformity Download PDF

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Publication number
CN103364081B
CN103364081B CN201310316202.2A CN201310316202A CN103364081B CN 103364081 B CN103364081 B CN 103364081B CN 201310316202 A CN201310316202 A CN 201310316202A CN 103364081 B CN103364081 B CN 103364081B
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light intensity
collector
circuit current
collected
uniformity
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CN103364081A (en
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付晓永
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Suzhou Talesun Solar Technologies Co Ltd
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Zhongli Talesun Solar Co Ltd
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Abstract

The object of the present invention is to provide a kind of proving installation and the method for testing of improving photovoltaic pulse tester irradiance uniformity, comprise, the fixing light intensity collector that at least one position is fixing, for gathering light intensity or the short-circuit current of fixed area; At least one moveable mobile intensity collection device, for each area light intensity of mobile collection product or short-circuit current; The data acquisition unit be connected with described fixing light intensity collector and mobile intensity collection device signal; Data processing equipment, the light intensity sent for the treatment of data acquisition unit or short-circuit current data, carry out analytical calculation by the homogeneity computing formula preset, draw irradiance uniformity parameter value.Adopt technique scheme, the beneficial effect of technical solution of the present invention is: after increasing the fixing fixing light intensity collector in a position, can adopt the mode of mathematical computations that the light intensity instability caused owing to repeatedly glistening is eliminated, the tester irradiance uniformity that can calculate more accurately.

Description

Testing device and testing method for improving irradiance uniformity of photovoltaic pulse tester
Technical Field
The invention relates to the field of photovoltaics, in particular to a testing device and a testing method for improving irradiance uniformity of a photovoltaic pulse tester.
Background
In the prior art, a general method for testing irradiance uniformity of a photovoltaic pulse tester is to test a single Light intensity detector, move and test more than 60 points, test Light intensity (Light intensity) of each point, or calculate illuminance uniformity by Short current (Short current) of a component.
The irradiance calculation formula is as follows:
or
In the formula:
1.Iscmaxfor the highest short-circuit current collected by the mobile light intensity collector,
Iscminfor the lowest short circuit current collected by the mobile light intensity collector,
2.Limaxfor the maximum irradiance value collected by the mobile light intensity collector,
Liminthe minimum irradiance value collected for the mobile light intensity collector.
The prior art has the defects that the conventional irradiance uniformity test is a test result under the condition of neglecting light intensity instability, and cannot accurately reflect the irradiance uniformity in an actual area. The instability of irradiance uniformity test light intensity causes calculation errors, so that uniformity data is not accurate enough.
Disclosure of Invention
In order to solve the above technical problems, an object of the present invention is to provide a device and a method for testing irradiance uniformity of a photovoltaic pulse tester, which can eliminate calculation errors caused by instability of light intensity, so that uniformity data is more accurate.
In order to achieve the purpose, the technical scheme of the invention is as follows:
a test device for improving irradiance uniformity of a photovoltaic pulse tester comprises,
the fixed light intensity collector is used for collecting light intensity or short-circuit current of a fixed area;
the movable light intensity collector is used for movably collecting light intensity or short-circuit current of each area of the product;
the data acquisition unit is in signal connection with the fixed light intensity acquisition unit and the movable light intensity acquisition unit;
and the data processing device is used for processing the light intensity or short-circuit current data transmitted by the data acquisition unit, and carrying out analysis and calculation according to a preset uniformity calculation formula to obtain an irradiance uniformity parameter value.
Wherein the data processing device calculates the irradiance uniformity of the test according to the following formula,
or,
in the formula:
IScmaxfor the highest short-circuit current collected by the mobile light intensity collector,
Iscminthe lowest short-circuit current collected by the light intensity collector is moved,
Limaxfor the maximum light intensity value collected by the moving light intensity collector,
Liminfor the minimum value of the light intensity collected by the moving light intensity collector,
lis is the instability of light intensity, and the calculation formula is as follows:
in the formula:
Lmaxfor the maximum light intensity value collected by the fixed light intensity collector,
Lminthe minimum light intensity value collected by the fixed light intensity collector.
The invention also provides a test method for improving the irradiance uniformity of the photovoltaic pulse tester,
obtaining light intensity data or short circuit current data of a fixed area at least one fixed position; calculating the light intensity or short circuit current uniformity parameter value Lis of the area;
the light intensity or short circuit current of each area of the product is collected in a mobile mode; and calculating the average uniformity parameter value of the light intensity or the short circuit current of each area;
carrying out analysis and calculation according to the following uniformity calculation formula to obtain an irradiance uniformity parameter value:
homogeneity parameter averaged over each region (1-Lis).
Wherein, the irradiance uniformity calculation formula of the test is as follows:
or
In the formula:
Iscmaxfor the highest short-circuit current collected by the mobile light intensity collector,
Iscminfor the lowest short circuit current collected by the mobile light intensity collector,
Limaxfor the maximum light intensity value collected by the moving light intensity collector,
Liminfor the minimum value of the light intensity collected by the moving light intensity collector,
lis is the instability of light intensity, and the calculation formula is as follows:
in the formula:
Lmaxfor the maximum light intensity value collected by the fixed light intensity collector,
Lminthe minimum light intensity value collected by the fixed light intensity collector.
By adopting the technical scheme, the technical scheme of the invention has the beneficial effects that: after a fixed light intensity collector with a fixed position is added, the instability of light intensity caused by multiple times of flashing can be eliminated in a mathematical calculation mode, and the irradiance uniformity of the tester can be calculated more accurately.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of embodiment 1 of the present invention.
Fig. 2 is a schematic structural diagram of embodiment 2 of the present invention.
Wherein, legend:
1. data processing device 2, data collector 3 and fixed light intensity collector
4. Mobile light intensity collector 5 and photovoltaic cell assembly
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the case of the example 1, the following examples are given,
as shown in fig. 1, a test apparatus for improving irradiance uniformity of a photovoltaic pulse tester includes,
a fixed light intensity collector 3 with fixed position for collecting light intensity or short circuit current in fixed area;
a movable light intensity collector 4 for movably collecting light intensity or short circuit current of each area of the product;
the data collector 2 is in signal connection with the fixed light intensity collector and the movable light intensity collector;
the data processing device 1 (which may be a mobile computer, a desktop computer or other intelligent equipment) is used for processing the light intensity or short circuit current data transmitted by the data collector, and performing analysis and calculation according to a preset uniformity calculation formula to obtain an irradiance uniformity parameter value.
Wherein the data processing device calculates the irradiance uniformity of the test according to the following formula,
or,
in the formula:
Iscmaxfor the highest short-circuit current collected by the mobile light intensity collector,
Iscminfor the lowest short circuit current collected by the mobile light intensity collector,
Limaxfor the maximum light intensity value collected by the moving light intensity collector,
Liminfor the minimum value of the light intensity collected by the moving light intensity collector,
lis is the instability of light intensity, and the calculation formula is as follows:
in the formula:
Lmaxfor the maximum light intensity value collected by the fixed light intensity collector,
Lminthe minimum light intensity value collected by the fixed light intensity collector.
The working principle and the using method of the device are as follows,
obtaining light intensity data or short circuit current data of a fixed area at a fixed position; calculating the light intensity or short circuit current uniformity parameter value Lis of the area;
the movable light intensity collector is moved to collect the light intensity or short circuit current of each area of the product; and calculating the average uniformity parameter value of the light intensity or the short circuit current of each area; in practical application, corresponding data of more than 10 points can be uniformly or non-uniformly distributed, the selection of the number of the points is determined according to actual needs, generally about 60 points in reality, and the collection points are preferably uniformly distributed.
Carrying out analysis and calculation according to the following uniformity calculation formula to obtain an irradiance uniformity parameter value:
homogeneity parameter averaged over each region (1-Lis).
Wherein, the irradiance uniformity calculation formula of the test is as follows:
or,
in the formula:
Iscmaxmaximum and minimum collected for mobile light intensity collectorThe current of the current path is measured,
Iscminfor the lowest short circuit current collected by the mobile light intensity collector,
Limaxfor the maximum light intensity value collected by the moving light intensity collector,
Liminfor the minimum value of the light intensity collected by the moving light intensity collector,
lis is the instability of light intensity, and the calculation formula is as follows:
in the formula:
Lmaxfor the maximum light intensity value collected by the fixed light intensity collector,
Lminthe minimum light intensity value collected by the fixed light intensity collector.
By adopting the technical scheme, the technical scheme of the invention has the beneficial effects that: after a fixed light intensity collector with a fixed position is added, the instability of light intensity caused by multiple times of flashing can be eliminated in a mathematical calculation mode, and the irradiance uniformity of the tester can be calculated more accurately.
Example 2
The rest is the same as the embodiment 1, except that two fixed light intensity collectors 3 and two mobile light intensity collectors 4 are used, the uniformity data acquired and calculated by the two fixed light intensity collectors 3 are re-averaged, and the accuracy is improved, the two mobile light intensity collectors 4 are used for improving the working efficiency, for example, each light intensity collector is responsible for data acquisition of one area, and the number of the mobile light intensity collectors 4 and the number of the fixed light intensity collectors 3 are determined and combined according to any requirement.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (4)

1. A testing device for improving irradiance uniformity of a photovoltaic pulse tester is characterized by comprising,
the fixed light intensity collector is used for collecting light intensity or short-circuit current of a fixed area;
the movable light intensity collector is used for movably collecting light intensity or short-circuit current of each area of the product;
the data acquisition unit is in signal connection with the fixed light intensity acquisition unit and the movable light intensity acquisition unit;
and the data processing device is used for processing the light intensity or short-circuit current data transmitted by the data acquisition unit, and carrying out analysis and calculation according to a preset uniformity calculation formula to obtain an irradiance uniformity parameter value.
2. The apparatus for testing irradiance uniformity with improved photovoltaic pulse tester as recited in claim 1, wherein the data processing means calculates the irradiance uniformity tested according to the following formula,
Iscmaxfor the highest short-circuit current collected by the mobile light intensity collector,
Iscminfor the lowest short circuit current collected by the mobile light intensity collector,
Limaxfor the maximum light intensity value collected by the moving light intensity collector,
Liminfor the minimum value of the light intensity collected by the moving light intensity collector,
lis is the instability of light intensity, and the calculation formula is as follows:
in the formula:
Lmaxfor the maximum light intensity value collected by the fixed light intensity collector,
Lminthe minimum light intensity value collected by the fixed light intensity collector.
3. A test method for improving irradiance uniformity of a photovoltaic pulse tester is characterized in that,
obtaining light intensity data or short circuit current data of a fixed area at least one fixed position; calculating the light intensity or short circuit current uniformity parameter value Lis of the area;
the light intensity or short circuit current of each area of the product is collected in a mobile mode; and calculating the average uniformity parameter value of the light intensity or the short circuit current of each area;
carrying out analysis and calculation according to the following uniformity calculation formula to obtain an irradiance uniformity parameter value:
homogeneity parameter averaged over each region (1-Lis).
4. The method for testing irradiance uniformity of an improved photovoltaic pulse tester as recited in claim 3, wherein the irradiance uniformity under test is calculated by the following formula:
in the formula:
Iscmaxfor the highest short-circuit current collected by the mobile light intensity collector,
Iscminfor the lowest short circuit current collected by the mobile light intensity collector,
Limaxfor the maximum light intensity value collected by the moving light intensity collector,
Liminfor the minimum value of the light intensity collected by the moving light intensity collector,
lis is the instability of light intensity, and the calculation formula is as follows:
in the formula:
Lmaxfor the maximum light intensity value collected by the fixed light intensity collector,
Lminthe minimum light intensity value collected by the fixed light intensity collector.
CN201310316202.2A 2013-07-25 2013-07-25 A kind of proving installation and method of testing improving photovoltaic pulse tester irradiance uniformity Active CN103364081B (en)

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Address after: No. 1, Tenghui Road, Chang Kun Industrial Park, Suzhou, Changshou City, Jiangsu

Patentee after: Suzhou Tenghui Photovoltaic Technology Co., Ltd.

Address before: No. 1, Tenghui Road, Chang Kun Industrial Park, Suzhou, Changshou City, Jiangsu

Patentee before: Zhongli Talesun Solar Technology Co., Ltd.

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