CN103344841A - Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material - Google Patents
Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material Download PDFInfo
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Abstract
The invention, which relates to the technical field of dielectric property testing of a dielectric material, provides a free space terminal short-circuit system for temperature changing measurement of a dielectric property of a dielectric material. The system comprises a material heating system, a millimeter-wave broadband horn antenna, a signal energy transmission receiving system, a vector network analyzer, a water cooling system, and a vacuum-pumping system. The millimeter-wave broadband horn antenna is fixed right above the material heating system; and the vacuum-pumping system is connected with the signal energy transmission receiving system by a cable. A testing signal passes through a conversion adapter, an isolator, and a coupler and reaches the antenna; the signal is reflected by a tested sample and the reflected signal passes through the antenna; and the coupler carries out coupling and the processed signal is coupled into the vector network. According to the invention, the isolator and the coupler are used to simplify a calibration process and shorten calibration and testing time; the whole system can use a mobile platform to complete testing under the heating device idling and no-idling circumstances at the same temperature, thereby substantially improving the testing efficiency.
Description
Technical field
The invention belongs to dielectric substance dielectric properties technical field of measurement and test, be specifically related to microwave, millimeter wave dielectric material performance test technology, relate in particular to a kind of dielectric substance dielectric properties temperature variation testing free space terminal short circuit system.
Background technology
Along with the fast development of Aeronautics and Astronautics and relevant military field technology, the speed of aircraft of all kinds is more and more faster, and is also more and more higher to the development requirement of high-temperature material.When the operating ambient temperature of material changes, corresponding variation also can take place in its dielectric properties.Therefore, realize the temperature variation testing of material, grasp the dielectric properties information of dielectric substance under the different operating temperature, design and the development that is applicable to material under the high temperature varying temperature environment had earth shaking meaning.
At the dielectric properties test of dielectric material in microwave, millimere-wave band, the network parameter method can realize continuous sweep check with it, can obtain the data of each frequency in the test frequency scope in theory, can realize the good characteristics such as complex permittivity test of high consumable material and extensively used.It is less relatively to the document that dielectric material carries out temperature variation testing to make a general survey of domestic and international utilization network parameter method, therefore the dielectric properties of dielectric material are measured under the varying temperature environment, not only need the measured material environment is improved, and be that the assurance test piece can be carried out in total system normally and efficiently, further improve method of testing and improve the test effect.
Conventional terminal short-circuit method test macro adopts single port reflection SOL(short-open-load) calibrate, be short circuit calibration, open circuit calibration and matched load calibration, and in calibration process employed calibrating device and imperfect calibrating device, so in calibration process, certainly exist certain error.Issuable error when following item is calibration:
Employed short circuit flat board when (1) short circuit is calibrated, because being placed on by thermal deformation and calibrating device for a long time when calibrating, error, the alternating temperature short circuit of calibrating device in process cause its oxidation, these reasons all can make the short circuit calibrating device when calibration, can not reflect the incoming wave signal completely in the air;
(2) when the open circuit calibration, dull and stereotyped heating platform 15 need be moved down λ/8, use the calibration of opening a way of an amount of network analyzer 4 then, in the operating process of reality, be difficult to guarantee that dull and stereotyped heating platform 15 moves down λ/8 exactly, thereby the phase place that can not guarantee reflection coefficient in calibration process is 0, reflection coefficient then has an additional phasing degree, makes that just the open circuit calibration is inaccurate, can produce certain error;
(3) when carrying out the matched load calibration, what the calibrating device that adopts generally adopted is the sharp cone distal absorbing material, and this absorbing material can only absorb part energy, can not guarantee good coupling, thereby makes the calibration of coupling also have certain error.
The error that these three aspects cause all can influence the measuring accuracy of testing medium material, and causing has certain error between test result and the actual value.In addition, the process of calibration is more complicated also, if misoperation, it is very big that error will become, and this just needs the professional test personnel to carry out calibration and the use of terminal short circuit test macro.Therefore, if can save above-mentioned three calibration processes, then the error of its generation will significantly reduce, and the total system measuring accuracy also can be greatly improved.
Summary of the invention
The purpose of this invention is to provide a kind of free space terminal short circuit test macro for dielectric substance dielectric properties temperature variation testing, to realize the temperature variation testing of dielectric substance dielectric properties, to solve the technical matters that the existing calibration of conventional dielectric dielectric material performance terminal short circuit test macro is loaded down with trivial details, difficulty is big, testing efficiency is low and error is bigger.
Technical scheme of the present invention is as follows:
Dielectric substance dielectric properties temperature variation testing free space terminal short circuit system, as shown in Figure 1, comprise material heating system 1, millimeter wave broadband conical-horn antenna 2, signal energy transmission receiving system 3, vector network analyzer 4, water-cooling system 5, pumped vacuum systems 6.
Millimeter wave broadband electromagnetic horn 2 adopts point focusing lens conical horn structure, as shown in Figure 3.This antenna is made up of the moment round transition structure 21 that is linked in sequence, antenna horn 22 and horn-lens 23.Described horn-lens 23 is formed double lens by two single face lens 231 and 232, and whole lens inner space is filled by teflon.
Signal energy transmission receiving system 3 comprises two sections concentric cable 31 and 33, two coaxial- rectangle adapters 32 and 34, one isolators 35 and a coupling mechanism 36; Vector network analyzer test signal output terminal order links to each other with the straight-through end of coupling mechanism 36 through first concentric cable 33, first coaxial-rectangle adapter 34, isolator 35, and the straight-through port of coupling mechanism 36 links to each other with the moment round transition structure 21 of millimeter wave broadband electromagnetic horn 2; The coupled end of coupling mechanism 36 links to each other with vector network analyzer test signal input end by second coaxial-rectangle adapter 32, second concentric cable 33.
Millimeter wave broadband electromagnetic horn 2 be positioned at material heating system 1 directly over, can enter vacuum (-tight) housing 13 inner spaces by millimeter wave broadband electromagnetic horn 2, quartz lens 111 or 112 to guarantee test signal.
Water-cooling system 5 links to each other with electromagnetic induction heater 14 in the material heating system 1, to realize the refrigerating function to electromagnetic induction heater 14; Pumped vacuum systems 6 is connected with material heating system 1, to realize the function to the vacuum (-tight) housing 13 inner space extracting vacuum of material heating system 1.
Further, described material heating system 1 also comprises a metal net shaped division board 12, described metal net shaped division board 12 is fixed in vacuum (-tight) housing 13 tops, and perpendicular to vacuum (-tight) housing 13 top broadside center lines, vacuum (-tight) housing 13 inner spaces is divided into two relatively independent spaces.
Further, described vacuum (-tight) housing 13 sides have the vacuum measurement hole so that during 6 pairs of vacuum (-tight) housings of pumped vacuum systems, 13 inner space extracting vacuum to the measurement of vacuum tightness; Vacuum (-tight) housing 13 sides have air-filled pore simultaneously, can pour inert gas by inflating sky, to prevent the high-temperature oxydation of sample.
Further, described vacuum (-tight) housing 13 sides have viewport, so that sample is observed when sample tested.
Dielectric substance dielectric properties temperature variation testing provided by the invention free space terminal short circuit system; its course of work can be described as: utilize 6 pairs of vacuum (-tight) housings of pumped vacuum systems, 13 inner extracting vacuum earlier; charge into protection nitrogen again; then open heating arrangement 14; open water-cooling system 5 simultaneously, carry out water-cooled.When reaching the requirement temperature, namely stop heating.The vector network analyzer 4 straight-through end by first concentric cable 33, coaxial-rectangle adapter 34, isolator 35 and coupling mechanism 36 is to millimeter wave broadband electromagnetic horn 2 input test frequency signals, the test frequency signal is through millimeter wave broadband electromagnetic horn 2 and quartz lens 112 irradiation samples and be reflected, and reflected signal receives coupling port, second coaxial-rectangle adapter 32, second concentric cable, the 21 input vector network analyzers 4 that coupling mechanism 36 is passed through in the back through millimeter wave broadband electromagnetic horn 2.Utilize vector network analyzer 4 and relevant software that material is carried out test analysis, note test result, move heating platform really then, quartz lens 111 is positioned under the antenna lens 23, again the situation that does not have test material is tested, by the test result under vector network analyzer 4 these situations of analysis.Repeatedly after the test, heating platform zero load and non-unloaded two kinds of test case are analyzed.
The present invention is directed to the technical matters that the existing calibration of conventional dielectric dielectric material performance terminal short circuit test macro is loaded down with trivial details, difficulty is big, testing efficiency is low and error is bigger, traditional terminal short circuit test macro carried out following improvement:
1) adds an isolator 35 in the front of millimeter wave broadband conical-horn antenna 2.Because isolator 35 distinctive unidirectional transmission property, test signal can only be transferred to the measured medium material from the test signal output terminal of vector network analyzer 4, and the electromagnetic wave that the measured medium material reflects can only enter the defeated test signal output terminal that can not enter vector network analyzer 4 as end of the test signal of vector network analyzer 4.After adding isolator 35, the back reflective that comes between signal source and the measured medium material will reduce greatly, if the isolation of isolator 35 is fine, then can be similar to and think source mismatch error E
S=0, the calibration that this just can save the source mismatch error has reduced the error that produces in the calibration process.
2) between millimeter wave broadband conical-horn antenna 2 and isolator 35, add the coupling mechanism 36 of a high directivity.Because the high directivity of coupling mechanism 36, cause the nearly all input signal energy of vector network analyzer 4 test signal output terminals after the reflection of measured medium material, can be coupled into the test signal input end of vector network analyzer 4 by coupling mechanism, namely can think directional error E
D≈ 0, and this has just saved the calibration to this error term; Simultaneously, the signal that has also guaranteed to enter vector network analyzer 4 test signal input ports also is difficult to the straight-through port of reflected back coupling mechanism 36.
Through after the improvement of above-mentioned two aspects, the error term of this system has only frequency response error E
RTSo, when system calibration, only needing to calibrate with the response that vector network analyzer 4 carries, calibration process is simple and convenient, and the error of calibration is also very little.
With respect to the complicated loaded down with trivial details dielectric material test mode of tradition, dielectric substance dielectric properties temperature variation testing provided by the invention has following several advantage with the material heating system that has mobile vacuum platform structure in the free space terminal short circuit system to whole test process and test result:
(1) will test non-zero load and unloaded two kinds of situations fusion one, and finish in a space, the quick conversion of two kinds of situations can obviously reduce in the test and be taken time by hyperphoric material when using mobile platform 15 to realize test again, improves testing efficiency simultaneously greatly.
(2) in vacuum (-tight) housing 13, add netted division board 12, provide the better test space to two kinds of test case, in conversion testing, further guarantee the accuracy of test result.
In sum, dielectric substance dielectric properties temperature variation testing provided by the invention has following good result with free space terminal short circuit system:
One, isolator and directional coupler have been added in the system, adopt the short circuit respective alignment can reach the alignment requirements of accurate test, reduced calibration error, reduced the measurement number of times, shortened Measuring Time, improved measuring accuracy, the test process of total system and test result all reach good result.
Two, the material heating system 1 in the system has mobile vacuum platform structure, can carry out load and no load test under the situation that does not change temperature and vacuum condition, has greatly improved testing efficiency.
Three, the free space transmission mode is adopted in System Operation, and main energy transmitter part is far away apart from material heating system 1 in the system, can avoid the too high influence to microwave device of temperature effectively.Add water cooling system 5 simultaneously, the good operation of different temperatures environment of operation in the assurance system better.
Four, adopt pumped vacuum systems 6 in vacuum (-tight) housing, to make vacuum environment, can effectively slow down the oxidation of measured material and heated parts.Charge into inert gas in vacuum drying oven 13, the effect of anti-oxidation can be better.
Description of drawings
Fig. 1 is the structural representation that dielectric substance dielectric properties temperature variation testing provided by the invention is used free space terminal short circuit system.Wherein, the 1st, material heating system, the 2nd, millimeter wave broadband conical-horn antenna, the 3rd, signal energy transmission receiving system, the 4th, vector network analyzer, the 5th, water-cooling system, the 6th, pumped vacuum systems.
Fig. 2 is material heating system 1 detailed structure view.Wherein 11 is quartz lens (comprising first quartz lens 111 and second quartz lens 112), the 12nd, and metal net shaped division board, the 13rd, vacuum (-tight) housing, the 14th, electromagnetic induction heater, the 15th, mobile platform.
Fig. 3 is millimeter wave broadband conical-horn antenna 2 diagrammatic cross-sections.Wherein, the 21st, moment round transition structure, the 22nd, cone antenna loudspeaker, the 231, the 232nd, antenna single face lens.
Embodiment
Dielectric substance dielectric properties temperature variation testing free space terminal short circuit system, as shown in Figure 1, comprise material heating system 1, millimeter wave broadband conical-horn antenna 2, signal energy transmission receiving system 3, vector network analyzer 4, water-cooling system 5, pumped vacuum systems 6.
Millimeter wave broadband electromagnetic horn 2 adopts point focusing lens conical horn structure, as shown in Figure 3.This antenna is made up of the moment round transition structure 21 that is linked in sequence, antenna horn 22 and horn-lens 23.Described horn-lens 23 is formed double lens by two single face lens 231 and 232, and whole lens inner space is filled by teflon.
Signal energy transmission receiving system 3 comprises two sections concentric cable 31 and 33, two coaxial- rectangle adapters 32 and 34, one isolators 35 and a coupling mechanism 36; Vector network analyzer test signal output terminal order links to each other with the straight-through end of coupling mechanism 36 through first concentric cable 33, first coaxial-rectangle adapter 34, isolator 35, and the straight-through port of coupling mechanism 36 links to each other with the moment round transition structure 21 of millimeter wave broadband electromagnetic horn 2; The coupled end of coupling mechanism 36 links to each other with vector network analyzer test signal input end by second coaxial-rectangle adapter 32, second concentric cable 33.
Millimeter wave broadband electromagnetic horn 2 be positioned at material heating system 1 directly over, can enter vacuum (-tight) housing 13 inner spaces by millimeter wave broadband electromagnetic horn 2, quartz lens 111 or 112 to guarantee test signal.
Water-cooling system 5 links to each other with electromagnetic induction heater 14 in the material heating system 1, to realize the refrigerating function to electromagnetic induction heater 14; Pumped vacuum systems 6 is connected with material heating system 1, to realize the function to the vacuum (-tight) housing 13 inner space extracting vacuum of material heating system 1.
Further, described material heating system 1 also comprises a metal net shaped division board 12, described metal net shaped division board 12 is fixed in vacuum (-tight) housing 13 tops, and perpendicular to vacuum (-tight) housing 13 top broadside center lines, vacuum (-tight) housing 13 inner spaces is divided into two relatively independent spaces.
Further, described vacuum (-tight) housing 13 sides have the vacuum measurement hole so that during 6 pairs of vacuum (-tight) housings of pumped vacuum systems, 13 inner space extracting vacuum to the measurement of vacuum tightness; Vacuum (-tight) housing 13 sides have air-filled pore simultaneously, can pour inert gas by inflating sky, to prevent the high-temperature oxydation of sample.
Further, described vacuum (-tight) housing 13 sides have viewport, so that sample is observed when sample tested.
The concrete steps of utilizing free space terminal short circuit provided by the invention system to carry out temperature variation testing are:
Step 1: detected materials is put into vacuum (-tight) housing 13, place second quartz lens 112 under, fixing testing sample.
Step 2: utilize 6 pairs of vacuum (-tight) housings 13 of pumped vacuum systems to vacuumize, charge into nitrogen protection after finishing.Open firing equipment 14, meanwhile, water-cooling system 5 is opened running, for material heating system 1 provides circulating cooling liquid.
Step 3: be heated to whole cavity temperature required.
Step 4: utilize vector network analyzer 4 to measure the insertion loss S of measured material under this temperature environment
21, and record in addition.
Step 5: move whole heating arrangement 14 and vacuum (-tight) housing 13 by mobile platform 15, make first quartz lens 111 place antenna lens 23 under, do not having repeating step 4 under the situation of sample, the insertion loss when record is unloaded.
Step 6: insert loss during according to measured cavity load sample and zero load, can calculate relative dielectric constant and the loss tangent of measured medium material.
Its computation process is as follows:
According to inserting the loss formula:
In the formula, S
21Be the insertion loss,
γ is the propagation constant of ripple in material, ε
rDielectric material is dielectric parameter relatively again, θ
iBe incident angle, d is the thickness of tested planar materials.
Because electromagnetic wave vertical incidence, i.e. θ
i=0 °, cos θ
i=1, sin θ
i=0, formula (1) just becomes:
In case measured material is determined, just can obtain the propagation constant of this measured material, again by the insertion loss S of precedence record
21(measuring) gets final product the relative complex permittivity ε that inverse goes out the measured medium material according to formula (2)
rWith ε
rShow with plural form, suc as formula (3):
Can obtain the relative dielectric constant ε ' of tested dielectric substance according to formula (3)
rWith loss tangent ε ' '
r
Claims (4)
1. dielectric substance dielectric properties temperature variation testing comprises material heating system (1), millimeter wave broadband conical-horn antenna (2), signal energy transmission receiving system (3), vector network analyzer (4), water-cooling system (5) and pumped vacuum systems (6) with free space terminal short circuit system;
Material heating system (1) adopts mobile vacuum platform structure, comprises two quartz lenss (111 and 112), vacuum (-tight) housing (13), electromagnetic induction heater (14) and mobile platform (15); Two identical quartz lenss (111 and 112) are inlayed symmetrically and are placed on the broadside center line of vacuum (-tight) housing (13) top, the geometric center that is quartz lens 111 and 112 is positioned on the vacuum (-tight) housing 13 top broadside center lines, and about the middle point symmetry of vacuum (-tight) housing 13 top broadside center lines; Electromagnetic induction heater (14) is fixed in above the mobile platform (15), and the sample that is opposite to above the electromagnetic induction heater (14) heats; Vacuum (-tight) housing (13) covers on inside with electromagnetic induction heater (14); Mobile platform can move horizontally along vacuum (-tight) housing (13) top broadside center line direction;
Millimeter wave broadband electromagnetic horn (2) adopts point focusing lens conical horn structure, is made up of the moment round transition structure (21) that is linked in sequence, antenna horn (22) and horn-lens (23); Described horn-lens (23) is formed double lens by two single face lens (231 and 232), and whole lens inner space is filled by teflon;
Signal energy transmission receiving system (3) comprises two sections concentric cable (31 and 33), two coaxial-rectangle adapters (32 and 34), an isolator (35) and a coupling mechanism (36); Vector network analyzer test signal output terminal order links to each other with the straight-through end of coupling mechanism (36) through first concentric cable (33), first coaxial-rectangle adapter (34), isolator (35), and the straight-through port of coupling mechanism (36) links to each other with the moment round transition structure (21) of millimeter wave broadband electromagnetic horn (2); The coupled end of coupling mechanism (36) links to each other with vector network analyzer test signal input end by second coaxial-rectangle adapter (32), second concentric cable (33);
Millimeter wave broadband electromagnetic horn (2) be positioned at material heating system (1) directly over, can enter vacuum (-tight) housing (13) inner space by millimeter wave broadband electromagnetic horn (2), quartz lens (111 or 112) to guarantee test signal;
Water-cooling system (5) links to each other with electromagnetic induction heater (14) in the material heating system (1), to realize the refrigerating function to electromagnetic induction heater (14); Pumped vacuum systems (6) is connected with material heating system (1), to realize the function to vacuum (-tight) housing (13) the inner space extracting vacuum of material heating system (1).
2. dielectric substance dielectric properties temperature variation testing according to claim 1 is with free space terminal short circuit system, it is characterized in that, described material heating system (1) also comprises a metal net shaped division board (12), described metal net shaped division board (12) is fixed in vacuum (-tight) housing (13) top, and perpendicular to vacuum (-tight) housing (13) top broadside center line, vacuum (-tight) housing (13) inner space is divided into two relatively independent spaces.
3. dielectric substance dielectric properties temperature variation testing according to claim 1 is with free space terminal short circuit system, it is characterized in that, described vacuum (-tight) housing (13) side has the vacuum measurement hole so that pumped vacuum systems (6) during to vacuum (-tight) housing (13) inner space extracting vacuum to the measurement of vacuum tightness; Vacuum (-tight) housing 13 sides have air-filled pore simultaneously, can pour inert gas by inflating sky, to prevent the high-temperature oxydation of sample.
4. dielectric substance dielectric properties temperature variation testing according to claim 1 is characterized in that with free space terminal short circuit system described vacuum (-tight) housing (13) side has viewport, so that sample is observed when sample tested.
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103969510A (en) * | 2014-05-15 | 2014-08-06 | 四川大学 | Dielectric constant measurement device |
| CN104090171A (en) * | 2014-07-23 | 2014-10-08 | 电子科技大学 | Material complex permittivity testing system and method with perforated short circuit plate |
| CN104967490A (en) * | 2015-04-30 | 2015-10-07 | 中国电子科技集团公司第四十一研究所 | Free space transmission reflection calibration method |
| CN105388442A (en) * | 2015-12-16 | 2016-03-09 | 中国电子科技集团公司第四十一研究所 | Free space method calibration method based on movable short circuit plate |
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| CN109709401A (en) * | 2018-12-21 | 2019-05-03 | 航天特种材料及工艺技术研究所 | The dielectric properties test method of material under a kind of high temperature, aerobic environment |
| CN109884140A (en) * | 2019-03-28 | 2019-06-14 | 中国科学院上海硅酸盐研究所 | A kind of material at high temperature dielectric properties test macro |
| CN110780124A (en) * | 2019-11-11 | 2020-02-11 | 青岛兴仪电子设备有限责任公司 | High-temperature environment terahertz material dielectric property measuring device and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1405569A (en) * | 2001-08-08 | 2003-03-26 | 电子科技大学 | Testing method for complex dielectric permittivity of multi-mould in one chamber, wide-frequency and multi-point microwave medium |
| CN101158702A (en) * | 2007-10-30 | 2008-04-09 | 电子科技大学 | Dielectric materials high-temperature complex dielectric constant measurement method based on terminal short circuit method |
| CN101545931A (en) * | 2009-05-08 | 2009-09-30 | 电子科技大学 | Method for measuring high-temperature complex dielectric constants based on terminal short-circuit method |
-
2013
- 2013-05-09 CN CN201310167791.2A patent/CN103344841B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1405569A (en) * | 2001-08-08 | 2003-03-26 | 电子科技大学 | Testing method for complex dielectric permittivity of multi-mould in one chamber, wide-frequency and multi-point microwave medium |
| CN101158702A (en) * | 2007-10-30 | 2008-04-09 | 电子科技大学 | Dielectric materials high-temperature complex dielectric constant measurement method based on terminal short circuit method |
| CN101545931A (en) * | 2009-05-08 | 2009-09-30 | 电子科技大学 | Method for measuring high-temperature complex dielectric constants based on terminal short-circuit method |
Non-Patent Citations (4)
| Title |
|---|
| 何小瓦 等: "介质材料复介电常熟变温测量技术综述", 《宇航材料工艺》, no. 1, 31 December 2005 (2005-12-31), pages 20 - 23 * |
| 周杨 等: "重入式谐振腔法低损耗材料复介电常数测试系统", 《宇航材料工艺》, no. 4, 31 December 2011 (2011-12-31), pages 60 - 62 * |
| 郭高凤 等: "低损耗介质材料复介电常数的变温测试", 《航空材料学报》, vol. 23, 30 October 2003 (2003-10-30) * |
| 郭高凤 等: "吸波材料反射率变温测试系统研制", 《仪器仪表学报》, vol. 32, no. 5, 31 May 2011 (2011-05-31) * |
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| CN109709401A (en) * | 2018-12-21 | 2019-05-03 | 航天特种材料及工艺技术研究所 | The dielectric properties test method of material under a kind of high temperature, aerobic environment |
| CN109709401B (en) * | 2018-12-21 | 2020-12-29 | 航天特种材料及工艺技术研究所 | Dielectric property testing method for material in high-temperature aerobic environment |
| CN109884140A (en) * | 2019-03-28 | 2019-06-14 | 中国科学院上海硅酸盐研究所 | A kind of material at high temperature dielectric properties test macro |
| CN109884140B (en) * | 2019-03-28 | 2021-11-02 | 中国科学院上海硅酸盐研究所 | System for testing high-temperature dielectric property of material |
| CN110780124A (en) * | 2019-11-11 | 2020-02-11 | 青岛兴仪电子设备有限责任公司 | High-temperature environment terahertz material dielectric property measuring device and method |
| CN110780124B (en) * | 2019-11-11 | 2022-04-22 | 青岛兴仪电子设备有限责任公司 | High-temperature environment terahertz material dielectric property measuring device and method |
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