CN103344841B - Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material - Google Patents
Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material Download PDFInfo
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Abstract
The invention, which relates to the technical field of dielectric property testing of a dielectric material, provides a free space terminal short-circuit system for temperature changing measurement of a dielectric property of a dielectric material. The system comprises a material heating system, a millimeter-wave broadband horn antenna, a signal energy transmission receiving system, a vector network analyzer, a water cooling system, and a vacuum-pumping system. The millimeter-wave broadband horn antenna is fixed right above the material heating system; and the vacuum-pumping system is connected with the signal energy transmission receiving system by a cable. A testing signal passes through a conversion adapter, an isolator, and a coupler and reaches the antenna; the signal is reflected by a tested sample and the reflected signal passes through the antenna; and the coupler carries out coupling and the processed signal is coupled into the vector network. According to the invention, the isolator and the coupler are used to simplify a calibration process and shorten calibration and testing time; the whole system can use a mobile platform to complete testing under the heating device idling and no-idling circumstances at the same temperature, thereby substantially improving the testing efficiency.
Description
Technical field
The invention belongs to dielectric substance dielectric properties technical field of measurement and test, be specifically related to microwave, millimeter wave dielectric material Performance Testing Technology, particularly relate to a kind of dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system.
Background technology
Along with the fast development of Aeronautics and Astronautics and relevant military field technology, the speed goes of aircraft of all kinds is fast, also more and more higher to the manufacture claim of high-temperature material.When the operating ambient temperature of material changes, also can there is corresponding change in its dielectric properties.Therefore, realize the temperature variation testing of material, grasp the dielectric properties information of dielectric substance at different operating temperature, to the design and development being applicable to material under high temperature varying temperature environment, there is earth shaking meaning.
Test for the dielectric properties of dielectric material in microwave, millimere-wave band, network parameter method can realize continuous sweep check with it, the data of each frequency within the scope of test frequency can be obtained in theory, the good features such as the complex permittivity test of high consumable material can be realized and be widely used.Make a general survey of the document using network parameter method to carry out temperature variation testing to dielectric material both at home and abroad relatively less, therefore the Dielectric measurement of dielectric material under varying temperature environment, not only need to improve measured material environment, and for ensureing that test piece can be carried out in the entire system normally and efficiently, improving method of testing further and improving test effect.
Conventional terminal short-circuit method test macro adopts single port reflection SOL(short-open-load) calibrate, i.e. short circuit calibration, open circuit calibration and matched load calibration, and calibrating device used in a calibration process is not ideal calibration part, so certainly exist certain error in a calibration process.Following item is issuable error during calibration:
(1) short circuit used during short circuit calibration is dull and stereotyped, cause it to be oxidized in atmosphere owing to placing for a long time by thermal deformation and calibrating device when the error of calibrating device in process, alternating temperature short circuit calibration, these reasons all can make short circuit calibrating device can not reflect incoming wave signal completely when calibrating;
(2) when opening a way calibration, flat heater platform 15 is needed to move down λ/8, then appropriate network analyzer 4 is used to carry out open circuit calibration, be difficult to ensure that flat heater platform 15 moves down λ/8 exactly in the operating process of reality, thus can not ensure that the phase place of reflection coefficient is in a calibration process 0, reflection coefficient then has an additional phasing degree, just makes open circuit calibration inaccurate, can produce certain error;
(3) when carrying out matched load calibration, what the calibrating device adopted generally adopted is sharp cone distal absorbing material, and this absorbing material can only absorb part energy, can not ensure good coupling, thus makes the calibration of coupling also there is certain error.
The error that these three aspects cause all can affect the measuring accuracy of testing medium material, causes between test result and actual value and has certain error.In addition, the process also more complicated of calibration, if misoperation, it is very large that error will become, and this just needs professional test personnel to carry out calibration and the use of terminal short circuit test macro.Therefore, if can save above-mentioned three calibration processes, then its error produced will greatly reduce, and whole system measuring accuracy also can be greatly improved.
Summary of the invention
The object of this invention is to provide a kind of free space terminal short circuit test macro for dielectric substance dielectric properties temperature variation testing, to realize the temperature variation testing of dielectric substance dielectric properties, to solve the technical matters that calibration is loaded down with trivial details, difficulty is large, testing efficiency is low and error is larger existing for conventional dielectric material dielectric properties terminal short circuit test macro.
Technical scheme of the present invention is as follows:
Dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system, as shown in Figure 1, heating materials system 1, millimeter wave broadband conical-horn antenna 2, signal energy transmission receiving system 3, vector network analyzer 4, water-cooling system 5, pumped vacuum systems 6 is comprised.
Heating materials system 1 adopts Mobile vacuum platform structure, and this system comprises two quartz lenss 111 and 112, vacuum (-tight) housing 13, electromagnetic induction heater 14 and mobile platform 15.Two identical quartz lenss 111 and 112 are inlayed symmetrically and to be placed on the broadside center line of vacuum (-tight) housing 13 top (namely the geometric center of quartz lens 111 and 112 is positioned on the broadside center line of vacuum (-tight) housing 13 top, and about point symmetry in the broadside center line of vacuum (-tight) housing 13 top); Electromagnetic induction heater 14 is fixed on above mobile platform 15, and the sample be opposite to above electromagnetic induction heater 14 heats; Electromagnetic induction heater 14 is covered on inside by vacuum (-tight) housing 13; Mobile platform can move horizontally along broadside center line direction, vacuum (-tight) housing 13 top.
Millimeter wave broadband electromagnetic horn 2 adopts point focusing lens conical horn structure, as shown in Figure 3.This antenna is made up of the moment round transition structure 21 be linked in sequence, antenna horn 22 and horn-lens 23.Described horn-lens 23 forms double lens by two one side lens 231 and 232, and whole lens interior space is filled by teflon.
Signal energy transmission receiving system 3 comprises two sections of concentric cable 31 and 33, two coaxial-rectangle adapters 32 and 34, an isolator 35 and a coupling mechanism 36; Vector network analyzer test signal output terminal sequentially passes through the first concentric cable 33, first coaxial-rectangle adapter 34, isolator 35 are connected with the straight-through end of coupling mechanism 36, and the straight-through port of coupling mechanism 36 is connected with the moment round transition structure 21 of millimeter wave broadband electromagnetic horn 2; The coupled end of coupling mechanism 36 is connected with vector network analyzer test signal input end by second coaxial-rectangle adapter 32, second concentric cable 33.
Millimeter wave broadband electromagnetic horn 2 is positioned at directly over heating materials system 1, to ensure that test signal can enter vacuum (-tight) housing 13 inner space by millimeter wave broadband electromagnetic horn 2, quartz lens 111 or 112.
Water-cooling system 5 is connected with the electromagnetic induction heater 14 in heating materials system 1, to realize the refrigerating function to electromagnetic induction heater 14; Pumped vacuum systems 6 is connected with heating materials system 1, to realize the function of the vacuum (-tight) housing 13 inner space extracting vacuum to heating materials system 1.
Further, described heating materials system 1 also comprises a metal net shaped division board 12, described metal net shaped division board 12 is fixed on vacuum (-tight) housing 13 top, and perpendicular to vacuum (-tight) housing 13 top broadside center line, vacuum (-tight) housing 13 inner space is divided into two relatively independent spaces.
Further, described vacuum (-tight) housing 13 side has vacuum measurement hole, so that the measurement to vacuum tightness during pumped vacuum systems 6 pairs of vacuum (-tight) housing 13 inner space extracting vacuum; Vacuum (-tight) housing 13 side has air-filled pore simultaneously, pours inert gas, to prevent the high-temperature oxydation of sample by inflating sky.
Further, described vacuum (-tight) housing 13 side has viewport, so that observe sample when testing sample.
Dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system provided by the invention; its course of work can be described as: first utilize pumped vacuum systems 6 pairs of inner extracting vacuum of vacuum (-tight) housing 13; be filled with protection nitrogen again; then heating arrangement 14 is opened; open water cooling system 5, carries out water-cooled simultaneously.When reaching requirement temperature, namely stop heating.Vector network analyzer 4 passes through the straight-through end of the first concentric cable 33, coaxial-rectangle adapter 34, isolator 35 and coupling mechanism 36 to millimeter wave broadband electromagnetic horn 2 input test frequency signal, test frequency signal irradiates sample through millimeter wave broadband electromagnetic horn 2 and quartz lens 112 and is reflected, reflected signal after millimeter wave broadband electromagnetic horn 2 receives by the coupling port of coupling mechanism 36, second coaxial-rectangle adapter 32, second concentric cable 21 input vector network analyzer 4.Vector network analyzer 4 and relevant software is utilized to carry out test analysis to material, record test result, then mobile heating platform really, quartz lens 111 is positioned over immediately below antenna lens 23, again to not having the situation of test material to test, analyze the test result in this situation by vector network analyzer 4.Repeatedly after test, heating platform zero load and non-unloaded two kinds of test case are analyzed.
The present invention is directed to the technical matters that calibration is loaded down with trivial details, difficulty is large, testing efficiency is low and error is larger existing for conventional dielectric material dielectric properties terminal short circuit test macro, following improvement carried out to traditional terminal short circuit test macro:
1) before millimeter wave broadband conical-horn antenna 2, an isolator 35 is added.Due to the distinctive unidirectional transmission property of isolator 35, test signal can only be transferred to measured medium material from the test signal output terminal of vector network analyzer 4, and the electromagnetic wave that measured medium material reflects is returned can only enter the defeated test signal output terminal that can not enter vector network analyzer 4 as end of test signal of vector network analyzer 4.After adding isolator 35, the roundtrip between signal source and measured medium material will reduce greatly, if the isolation of isolator 35 is fine, then can be similar to and thinks source mismatch error E
s=0, this just can save the calibration to source mismatch error, reduces the error produced in calibration process.
2) between millimeter wave broadband conical-horn antenna 2 and isolator 35, add the coupling mechanism 36 of a high directivity.Due to the high directivity of coupling mechanism 36, cause the nearly all input signal energy of vector network analyzer 4 test signal output terminal to be coupled into the test signal input end of vector network analyzer 4 by coupling mechanism through the reflection rear of measured medium material, namely can think directional error E
d≈ 0, this just eliminates the calibration to this error term; Meanwhile, also ensure that the signal entering vector network analyzer 4 test signal input port is also difficult to be reflected back the straight-through port of coupling mechanism 36.
After the improvement of above-mentioned two aspects, the error term of this system only has frequency response error E
rT, so the response that only need carry with vector network analyzer 4 when system calibration is calibrated, calibration process is simple and convenient, and the error of calibration is also very little.
Relative to the complicated loaded down with trivial details dielectric material test mode of tradition, the heating materials system in dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system provided by the invention with Mobile vacuum platform structure has following several advantage to whole test process and test result:
(1) non-zero load will be tested and unloaded two kinds of situations merge one, complete in a space, then the rapid translating of two kinds of situations when using mobile platform 15 to realize test, can obviously reduce by hyperphoric material is taken time in test, while greatly improve testing efficiency.
(2) in vacuum (-tight) housing 13, add netted division board 12, the better test space is provided to two kinds of test case, ensures the accuracy of test result when conversion testing further.
In sum, dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system provided by the invention has following good result:
One, isolator and directional coupler is added in system, adopt short circuit respective alignment can reach the alignment requirements of accurately test, reduce calibration error, decrease pendulous frequency, shorten Measuring Time, improve measuring accuracy, test process and the test result of whole system all reach good result.
Two, the heating materials system 1 in system has Mobile vacuum platform structure, can carry out load and no load test, greatly improving testing efficiency when not changing temperature and vacuum condition.
Three, System Operation adopts free space transmission mode, and in system, main energetic transmission apparatus is comparatively far away apart from heating materials system 1, effectively can avoid the too high impact on microwave device of temperature.Add water-cooling system 5, the good operation of different temperatures environment of operation in guarantee system better simultaneously.
Four, adopt pumped vacuum systems 6 to manufacture vacuum environment in vacuum (-tight) housing, effectively can slow down the oxidation of measured material and heated parts.In vacuum drying oven 13, be filled with inert gas, the effect of anti-oxidation can be better.
Accompanying drawing explanation
Fig. 1 is the structural representation of dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system provided by the invention.Wherein, 1 be heating materials system, 2 are millimeter wave broadband conical-horn antennas, 3 are signal energy transmission receiving systems, 4 are vector network analyzers, 5 are water-cooling systems, 6 is pumped vacuum systems.
Fig. 2 is heating materials system 1 detailed structure view.Wherein 11 is quartz lens (comprising the first quartz lens 111 and the second quartz lens 112), and 12 is metal net shaped division boards, and 13 is vacuum (-tight) housings, and 14 is electromagnetic induction heaters, and 15 is mobile platforms.
Fig. 3 is millimeter wave broadband conical-horn antenna 2 diagrammatic cross-section.Wherein, 21 is moment round transition structures, and 22 is cone antenna loudspeaker, and 231,232 is antenna one side lens.
Embodiment
Dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system, as shown in Figure 1, heating materials system 1, millimeter wave broadband conical-horn antenna 2, signal energy transmission receiving system 3, vector network analyzer 4, water-cooling system 5, pumped vacuum systems 6 is comprised.
Heating materials system 1 adopts Mobile vacuum platform structure, and this system comprises two quartz lenss 111 and 112, vacuum (-tight) housing 13, electromagnetic induction heater 14 and mobile platform 15.Two identical quartz lenss 111 and 112 are inlayed symmetrically and to be placed on the broadside center line of vacuum (-tight) housing 13 top (namely the geometric center of quartz lens 111 and 112 is positioned on the broadside center line of vacuum (-tight) housing 13 top, and about point symmetry in the broadside center line of vacuum (-tight) housing 13 top); Electromagnetic induction heater 14 is fixed on above mobile platform 15, and the sample be opposite to above electromagnetic induction heater 14 heats; Electromagnetic induction heater 14 is covered on inside by vacuum (-tight) housing 13; Mobile platform can move horizontally along broadside center line direction, vacuum (-tight) housing 13 top.
Millimeter wave broadband electromagnetic horn 2 adopts point focusing lens conical horn structure, as shown in Figure 3.This antenna is made up of the moment round transition structure 21 be linked in sequence, antenna horn 22 and horn-lens 23.Described horn-lens 23 forms double lens by two one side lens 231 and 232, and whole lens interior space is filled by teflon.
Signal energy transmission receiving system 3 comprises two sections of concentric cable 31 and 33, two coaxial-rectangle adapters 32 and 34, an isolator 35 and a coupling mechanism 36; Vector network analyzer test signal output terminal sequentially passes through the first concentric cable 33, first coaxial-rectangle adapter 34, isolator 35 are connected with the straight-through end of coupling mechanism 36, and the straight-through port of coupling mechanism 36 is connected with the moment round transition structure 21 of millimeter wave broadband electromagnetic horn 2; The coupled end of coupling mechanism 36 is connected with vector network analyzer test signal input end by second coaxial-rectangle adapter 32, second concentric cable 33.
Millimeter wave broadband electromagnetic horn 2 is positioned at directly over heating materials system 1, to ensure that test signal can enter vacuum (-tight) housing 13 inner space by millimeter wave broadband electromagnetic horn 2, quartz lens 111 or 112.
Water-cooling system 5 is connected with the electromagnetic induction heater 14 in heating materials system 1, to realize the refrigerating function to electromagnetic induction heater 14; Pumped vacuum systems 6 is connected with heating materials system 1, to realize the function of the vacuum (-tight) housing 13 inner space extracting vacuum to heating materials system 1.
Further, described heating materials system 1 also comprises a metal net shaped division board 12, described metal net shaped division board 12 is fixed on vacuum (-tight) housing 13 top, and perpendicular to vacuum (-tight) housing 13 top broadside center line, vacuum (-tight) housing 13 inner space is divided into two relatively independent spaces.
Further, described vacuum (-tight) housing 13 side has vacuum measurement hole, so that the measurement to vacuum tightness during pumped vacuum systems 6 pairs of vacuum (-tight) housing 13 inner space extracting vacuum; Vacuum (-tight) housing 13 side has air-filled pore simultaneously, pours inert gas, to prevent the high-temperature oxydation of sample by inflating sky.
Further, described vacuum (-tight) housing 13 side has viewport, so that observe sample when testing sample.
The concrete steps utilizing free space terminal short-circuit system provided by the invention to carry out temperature variation testing are:
Step 1: detected materials is put into vacuum (-tight) housing 13, is placed in immediately below the second quartz lens 112, fixing testing sample.
Step 2: utilize pumped vacuum systems 6 pairs of vacuum (-tight) housings 13 to vacuumize, be filled with nitrogen protection after complete.Open firing equipment 14, meanwhile, water-cooling system 5 opens running, for heating materials system 1 provides circulating cooling liquid.
Step 3: whole cavity is heated to temperature required.
Step 4: utilize vector network analyzer 4 to measure the insertion loss S of measured material under this temperature environment
21, and record in addition.
Step 5: move whole heating arrangement 14 and vacuum (-tight) housing 13 by mobile platform 15, making the first quartz lens 111 be placed in immediately below antenna lens 23, repeating step 4 when not having sample, insertion loss when record is unloaded.
Step 6: according to insertion loss when measured cavity load sample and zero load, relative dielectric constant and the loss tangent of measured medium material can be calculated.
Its computation process is as follows:
According to insertion loss formula:
In formula, S
21for insertion loss,
γ is ripple propagation constant in the material, ε
rdielectric material is dielectric parameter relatively again, θ
ifor incident angle, d is the thickness of tested planar materials.
Because electromagnetic wave vertical incidence, i.e. θ
i=0 °, cos θ
i=1, sin θ
i=0, formula (1) just becomes:
Once measured material is determined, the propagation constant of this measured material just can be obtained, then by the insertion loss S of precedence record
21(measurement obtains), gets final product according to formula (2) the relative complex permittivity ε that inverse goes out measured medium material
r.By ε
rshow with plural form, such as formula (3):
The relative dielectric constant ε ' of tested dielectric substance can be obtained according to formula (3)
rwith loss tangent ε ' '
r.
Claims (4)
1. dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system, comprises heating materials system (1), millimeter wave broadband conical-horn antenna (2), signal energy transmission receiving system (3), vector network analyzer (4), water-cooling system (5) and pumped vacuum systems (6);
Heating materials system (1) adopts Mobile vacuum platform structure, comprises two quartz lenss (111 and 112), vacuum (-tight) housing (13), electromagnetic induction heater (14) and mobile platform (15); Two identical quartz lenss (111 and 112) are inlayed symmetrically and are placed on the broadside center line of vacuum (-tight) housing (13) top, namely the geometric center of quartz lens 111 and 112 is positioned on the broadside center line of vacuum (-tight) housing 13 top, and about point symmetry in the broadside center line of vacuum (-tight) housing 13 top; Electromagnetic induction heater (14) is fixed on above mobile platform (15), and the sample be opposite to above electromagnetic induction heater (14) heats; Electromagnetic induction heater (14) is covered on inside by vacuum (-tight) housing (13); Mobile platform can move horizontally along broadside center line direction, vacuum (-tight) housing (13) top;
Millimeter wave broadband conical-horn antenna (2) adopts point focusing lens conical horn structure, is made up of the moment round transition structure (21) be linked in sequence, antenna horn (22) and horn-lens (23); Described horn-lens (23) forms double lens by two one side lens (231 and 232), and whole lens interior space is filled by teflon;
Signal energy transmission receiving system (3) comprises two sections of concentric cable (31 and 33), two coaxial-rectangle adapters (32 and 34), an isolator (35) and a coupling mechanism (36); Vector network analyzer test signal output terminal sequentially passes through the first concentric cable (33), first coaxial-rectangle adapter (34), isolator (35) are connected with the straight-through end of coupling mechanism (36), and the straight-through port of coupling mechanism (36) is connected with the moment round transition structure (21) of millimeter wave broadband electromagnetic horn (2); The coupled end of coupling mechanism (36) is connected with vector network analyzer test signal input end by second coaxial-rectangle adapter (32), the second concentric cable (33);
Millimeter wave broadband conical-horn antenna (2) is positioned at directly over heating materials system (1), to ensure that test signal can enter vacuum (-tight) housing (13) inner space by millimeter wave broadband conical-horn antenna (2), quartz lens (111 or 112);
Water-cooling system (5) is connected with the electromagnetic induction heater (14) in heating materials system (1), to realize the refrigerating function to electromagnetic induction heater (14); Pumped vacuum systems (6) is connected with heating materials system (1), to realize the function of vacuum (-tight) housing (13) the inner space extracting vacuum to heating materials system (1).
2. dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system according to claim 1, it is characterized in that, described heating materials system (1) also comprises a metal net shaped division board (12), described metal net shaped division board (12) is fixed on vacuum (-tight) housing (13) top, and perpendicular to vacuum (-tight) housing (13) top broadside center line, vacuum (-tight) housing (13) inner space is divided into two relatively independent spaces.
3. dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system according to claim 1, it is characterized in that, described vacuum (-tight) housing (13) side has vacuum measurement hole, so that pumped vacuum systems (6) is to the measurement to vacuum tightness during vacuum (-tight) housing (13) inner space extracting vacuum; Vacuum (-tight) housing 13 side has air-filled pore simultaneously, pours inert gas, to prevent the high-temperature oxydation of sample by air-filled pore.
4. dielectric substance dielectric properties temperature variation testing free space terminal short-circuit system according to claim 1, it is characterized in that, described vacuum (-tight) housing (13) side has viewport, so that observe sample when testing sample.
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| CN103969510B (en) * | 2014-05-15 | 2017-05-10 | 四川大学 | Dielectric constant measurement device |
| CN104090171B (en) * | 2014-07-23 | 2016-08-17 | 电子科技大学 | There is the material complex dielectric permittivity test system and method for perforate short board |
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| CN105974345B (en) * | 2016-04-27 | 2018-09-18 | 电子科技大学 | Free space terminal short circuit complex dielectric permittivity tests system high temperature calibration method |
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| CN107290595B (en) * | 2017-06-26 | 2019-12-10 | 电子科技大学 | high-temperature test method for relative complex dielectric constant of material based on ellipsoidal reflector |
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| CN109884140B (en) * | 2019-03-28 | 2021-11-02 | 中国科学院上海硅酸盐研究所 | System for testing high-temperature dielectric property of material |
| CN110780124B (en) * | 2019-11-11 | 2022-04-22 | 青岛兴仪电子设备有限责任公司 | High-temperature environment terahertz material dielectric property measuring device and method |
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