CN103199160A - Forming method of light-emitting diode - Google Patents
Forming method of light-emitting diode Download PDFInfo
- Publication number
- CN103199160A CN103199160A CN2013100548929A CN201310054892A CN103199160A CN 103199160 A CN103199160 A CN 103199160A CN 2013100548929 A CN2013100548929 A CN 2013100548929A CN 201310054892 A CN201310054892 A CN 201310054892A CN 103199160 A CN103199160 A CN 103199160A
- Authority
- CN
- China
- Prior art keywords
- epitaxial loayer
- sacrifice layer
- substrate
- emitting diode
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Led Devices (AREA)
- Weting (AREA)
Abstract
Disclosed is a forming method of a light-emitting diode. The forming method comprises the steps of providing a growing substrate and forming a sacrificial layer and an epitaxial layer on the growing substrate in sequence; forming one or a plurality of epitaxial layer openings which penetrate through the epitaxial layer and expose from the sacrificial layer; forming a supporting layer on the epitaxial layer, wherein the supporting layer is provided with one or a plurality of supporting layer openings which penetrate through the supporting layer and are communicated with the epitaxial layer openings; and etching the sacrificial layer selectively so as to enable the growing substrate to be separated from the epitaxial layer.
Description
The application is the dividing an application for the Chinese patent application 201010002188.5 of " the formation method of light-emitting diode " that be on January 13rd, 2010 and denomination of invention the applying date.
Technical field
The present invention relates to manufacturing method for LED, particularly relate to the method for the substrate that utilizes the sacrifice layer conversion light emitting diode.
Background technology
The epitaxial film of light-emitting diode is normally grown up on the GaAs substrate.Because GaAs substrate meeting extinction, in order to improve luminous efficiency, the known practice can be fitted the another side of suitable substrate and epitaxial film behind the extension film growth.Afterwards, with etching mode the GaAs substrate is dissolved again.Yet the GaAs substrate that dissolving can be utilized again is the practice of quite wasting, and the residual As in dissolving back is easy to cause the pollution of environment.
Summary of the invention
The invention provides the growth substrate is kept and reusable LED production method.
In embodiment, the invention provides a kind of formation method of light-emitting diode, comprising provides the growth substrate, forms sacrifice layer and epitaxial loayer in regular turn on the growth substrate; Forming a plurality of epitaxial loayer openings penetrates epitaxial loayer and exposes sacrifice layer; Form supporting layer on epitaxial loayer, supporting layer have one or several supporting layer openings penetrate supporting layer and be communicated with one or several epitaxial loayer openings; Reach the selective etch sacrifice layer and make the growth substrate break away from epitaxial loayer.
In another embodiment, the invention provides a kind of formation method of light-emitting diode, comprising provides the growth substrate, have one or several base openings penetrate the growth substrate; Form sacrifice layer on the growth substrate; Form epitaxial loayer on sacrifice layer, epitaxial loayer have one or several epitaxial loayer openings penetrate epitaxial loayer; Provide and accept substrate and epitaxial loayer joins; And selective etch sacrifice layer and make the growth substrate break away from epitaxial loayer.
In another embodiment more, the invention provides a kind of formation method of light-emitting diode, comprising provides the growth substrate, grows up sacrifice layer and epitaxial loayer in regular turn on the growth substrate; Provide support substrate, supporting substrate has front and the back side, back side formation one or several grooves; The back side of supporting substrate is engaged in epitaxial loayer; A part that removes supporting substrate from the front to be exposing at least one groove, and form one or several supporting substrate openings penetrate this supporting substrate; Be mask with the supporting substrate, the etching epitaxial loayer with form one or several epitaxial loayer openings penetrate epitaxial loayer and expose sacrifice layer; Reach the selective etch sacrifice layer and make the growth substrate break away from epitaxial loayer.
In another embodiment again, the invention provides a kind of formation method of light-emitting diode, comprising provides the growth substrate, grows up sacrifice layer and epitaxial loayer in regular turn on the growth substrate; Provide support substrate and supporting substrate is engaged with temporary substrate; Formation one or several supporting substrate openings penetrate supporting substrate; Supporting substrate is engaged in epitaxial loayer; Remove temporary substrate; Be mask with the supporting substrate, the etching epitaxial loayer with form one or several epitaxial loayer openings penetrate epitaxial loayer and expose sacrifice layer; Reach the selective etch sacrifice layer and make the growth substrate break away from epitaxial loayer.
In another embodiment more again, the invention provides a kind of formation method of light-emitting diode, comprising provides the growth substrate, grows up sacrifice layer and epitaxial loayer in regular turn on the growth substrate; Provide support substrate; Formation one or several supporting substrate openings penetrate supporting substrate; Supporting substrate is engaged in epitaxial loayer; Be mask with the supporting substrate, this epitaxial loayer of etching with form one or several epitaxial loayer openings penetrate epitaxial loayer and expose sacrifice layer; Reach the selective etch sacrifice layer and make the growth substrate break away from epitaxial loayer.
The present invention still comprises other aspects and is disclosed in detail in the following execution mode to solve other problems and to merge above-mentioned each side.
Description of drawings
Figure 1A and 1A ' show profile and vertical view according to each step in light-emitting diode 190 manufacturing process of the embodiment of the invention to Fig. 1 E and 1E '.
Fig. 2 A and 2A ' show profile and vertical view according to each step in light-emitting diode 290 manufacturing process of the embodiment of the invention to Fig. 2 D and 2D '.
Fig. 3 A and 3A ' show profile and vertical view according to each step in embodiment of the invention light-emitting diode 390 manufacturing process to Fig. 3 F and 3F '.
Fig. 4 A and 4A ' show profile and vertical view according to each step in embodiment of the invention light-emitting diode 490 manufacturing process to Fig. 4 E and 4E '.
Fig. 5 A and 5A ' show profile and vertical view according to each step in embodiment of the invention light-emitting diode 590 manufacturing process to Fig. 5 E and 5E '.
Description of reference numerals
100,200,300,400,500 growth substrates
201 base openings
202 growth substrate portion
120,220,320,420,520 sacrifice layers
221 sacrifice layer openings
222 sacrifice layer parts
140,240,340,440,540 epitaxial loayers
190,290,390,490 light-emitting diodes
141,141a, 141b, 141c, 241,341,441,541 epitaxial loayer openings
142,142a, 142b, 142c, 242,342,442,542 epitaxial loayer parts
150 supporting layers
151 supporting layer openings
152 supporting layer parts
160,260 accept substrate
350,450,550 supporting substrates
352,452,552 supporting substrate parts
350a, the 450a front
350b, the 450b back side
351,451,551 grooves, the supporting substrate opening
470 temporary substrates
Embodiment
Below with reference to accompanying drawing demonstration the preferred embodiments of the present invention.Similar components adopts the components identical symbol in the accompanying drawing.Should note presenting the present invention for clear, each element in the accompanying drawing is not the scale according to material object, and for avoiding fuzzy content of the present invention, below known spare part, associated materials and correlation processing technique thereof are also omitted in explanation.
Figure 1A and 1A ' show profile and vertical view according to each step in light-emitting diode 190 manufacturing process of the embodiment of the invention to Fig. 1 E and 1E ', wherein Figure 1A ' is vertical view to Fig. 1 E ', and Figure 1A to Fig. 1 E is the profile of the line I-I ' along Figure 1A ' to Fig. 1 E '.
At first, with reference to Figure 1A and 1A ', provide growth substrate 100, grow up sacrifice layer 120 and epitaxial loayer 140 in regular turn on growth substrate 100.The component of growth substrate 100 can comprise in nitrogen, aluminium, gallium, arsenic, zinc, silicon, the oxygen one at least, for example: n-type GaAs.Epitaxial loayer 140 is sandwich construction, and its component can comprise in nitrogen, aluminium, gallium, indium, arsenic, phosphorus, silicon, the oxygen one at least, and the contained element of each layer be not to be all necessity mutually, for example: it can comprise contact layer under the n-type GaAs, n-type Al in regular turn
xGa
1-xCoating layer, Al under the As
yGa
1-yAs active layer, p-type Al
zGa
1-zThe last coating layer of As and p-type GaAs go up contact layer, and x, y and z are respectively between 0 and 1.The thickness of epitaxial loayer 140 can be between 1 to 100 μ m, but this is not limited.In present embodiment, sacrifice layer 120 all forms with extensional mode with epitaxial loayer 140.The component of sacrifice layer 120 can comprise in aluminium, the arsenic one at least, and for example: AlAs, this material can make etchant, with respect to growth substrate 100, epitaxial loayer 140 and follow-up with the supporting layer that forms, optionally with sacrifice layer 120 erosion persons.Sacrifice layer 120 thickness preferably exist
With
Between.In addition, the p-type that electrically also can be of growth substrate 100, the user is when needing the combination in any collocation according to it.
With reference to Figure 1B and 1B ', patterning epitaxial loayer 140 with form one or several epitaxial loayer openings 141 penetrate epitaxial loayer 140 and expose under sacrifice layer 120.Forming a plurality of epitaxial loayer openings 141 can have a plurality of purposes, for example can be used for carrying out the location of each light-emitting diode chip for backlight unit, maybe can allow etchant contact the hole of sacrifice layer 120.The present invention is not limited to epitaxial loayer in opening or the groove of other embodiment mades, also can be based on aforesaid purpose.Can use the gold-tinted etching technique to finish this step.The position of a plurality of epitaxial loayer openings 141 arranges or is distributed in randomly to array the surface of epitaxial loayer 140 as shown in Figure 1B.The shape of epitaxial loayer opening 141 can be circle, rectangle, polygon or other suitable shapes, and its size is then decided according to making demand in fact.In embodiment, behind the patterning, the epitaxial loayer 142 (being remaining epitaxial loayer 140 behind the patterning) around the epitaxial loayer opening 141 still interconnects.For example, Figure 1B ' shows the epitaxial loayer part 142a around opening 141a; Epitaxial loayer part 142b around opening 141b; Epitaxial loayer part 142c around opening 141c.As shown in the figure, epitaxial loayer part 142a, 142b and 142c interconnect integratedly.In other words, remaining epitaxial loayer 142 presents continuous structure behind the patterning, and namely it can not have discrete disjunct island part because of the formation of a plurality of epitaxial loayer openings 141.In addition, penetrate the epitaxial loayer opening 141 of epitaxial loayer 140 though should note illustration among the embodiment, so epitaxial loayer opening 141 also can partially or completely pass sacrifice layer 120 in other embodiment.In detail, at another embodiment, except forming epitaxial loayer opening 141, also on sacrifice layer 120, form sacrifice layer groove (not shown) with at least one epitaxial loayer opening 141 of correspondence; In an embodiment again, except forming epitaxial loayer opening 141, also form the sacrifice layer opening (not shown) that runs through sacrifice layer 120 and corresponding at least one epitaxial loayer opening 141 again.
With reference to figure 1C and 1C ', form supporting layer 150 on the epitaxial loayer 140 of a plurality of epitaxial loayer openings 141 of tool.Supporting layer 150 has a plurality of supporting layer openings 151 and penetrates supporting layer 150 and be communicated with corresponding epitaxial loayer opening 141.In other words, supporting layer 150 is formed on epitaxial loayer 140 upper surface epitaxial loayer openings 141 zones in addition.In embodiment, supporting layer 150 has the pattern identical with epitaxial loayer 140 behind the patterning, all interconnects so should understand all supporting layers 152 around a plurality of supporting layer openings 151 from the above.Yet, in another embodiment, supporting layer 150 have with patterning after epitaxial loayer 140 pattern inequality, in other words, one and inequality at least in arrangement mode, patterns of openings or the quantity of epitaxial loayer opening 141 and supporting layer opening 151.Supporting layer 150 is mainly used to replace growth substrate 100 to support epitaxial loayer 140, and the substrate 100 of so growing up could remove in subsequent step.There is not the epitaxial loayer 140 of supporting layer 150 will be difficult to operation because thickness is too thin.In this embodiment, supporting layer 150 can be photoresist, metal or plated metal, and its thickness is between 50 μ m to 300 μ m, so not as limit.
With reference to figure 1C and 1C ', after supporting layer 150 forms, selective etch sacrifice layer 120 and make growth substrate 100 break away from epitaxial loayers 140.In detail, can use with respect to growth substrate 100, epitaxial loayer 140 and supporting layer 150, selectivity corrodes the etchant of sacrifice layer 120, make it flow through epitaxial loayer opening 140 with supporting layer opening 150 and then remove sacrifice layer 120 gradually, and then make growth substrate 100 break away from epitaxial loayer 140, yet sacrifice layer 120 is not necessity to be removed fully, needs only itself and the contacted volume of levels or area and cuts down to being enough to make growth substrate 100 break away from epitaxial loayers 140.Use citric acid to carry out selective wet etching as etchant in this embodiment.Right the present invention does not get rid of other suitable wet etching or dry ecthings.
Fig. 1 D and 1D ' remove for sacrifice layer 120 and the structural representation of the substrate 100 of growing up after breaking away from.Should notice in this structure that epitaxial loayer 140 engages up and down with supporting layer 150; Epitaxial loayer 142 around the epitaxial loayer opening 141 interconnects; And the supporting layer 152 around the supporting layer opening 151 interconnects.Because this structure contains discrete disjunct island part fully or hardly, therefore, as long as the thickness of supporting layer 150 is enough, namely can carry out follow-up each processing step by this operation epitaxial film.
Fig. 1 E and 1E ' show selectivity (optional) step of this embodiment, namely provide to accept substrate 160 and it is engaged with the supporting layer 150 of Fig. 1 D and 1D '.This step can have a plurality of purposes, for example can strengthen the function of supporting layer 150.The material of accepting substrate 160 can be glass, metal, semi-conducting material, plastic cement, pottery or other suitable materials, and its thickness can depend on the needs.
Fig. 2 A and 2A ' show profile and vertical view according to each step in light-emitting diode 290 manufacturing process of the embodiment of the invention to Fig. 2 D and 2D ', wherein Fig. 2 A ' is vertical view to Fig. 2 D ', and Fig. 2 A to Fig. 2 D is the profile of the line I-I ' along Fig. 2 A ' to Fig. 2 D '.Compared to previous embodiment, the main feature of the present embodiment substrate that is to grow up has opening, and uses and accept substrate and without supporting layer.With previous embodiment title similar elements, its use material also can be similar; As for its thickness, unless stated otherwise otherwise also similar with previous embodiment, repeat no more in the literary composition.
Shown in Fig. 2 A and 2A ', growth substrate 200 is provided, and make growth substrate 200 have one or several base openings 201 penetrate growth substrate 200, wherein the growth substrate 202 around the base openings 201 interconnects.In other words, as above-mentioned, base openings 201 forms back residue growth substrate portion 202 and presents overall structure, and it can not have discrete disjunct island part because of the formation of a plurality of base openings 201.Available machining, laser, dry ecthing, wet etching form a plurality of base openings 201.
Then, shown in Fig. 2 B and 2B ', growth sacrifice layer 220 is on growth substrate 200, and wherein sacrifice layer 220 has that a plurality of sacrifice layer openings 221 penetrate sacrifice layer 220 and is communicated with base openings 201, and the sacrifice layer part 222 around the sacrifice layer opening 221 interconnects.Sacrifice layer 220 can extension form.
Then, same with reference to figure 2B and 2B ', form epitaxial loayer 240 on sacrifice layer 220, wherein epitaxial loayer 240 has that a plurality of epitaxial loayer openings 241 penetrate epitaxial loayer 240 and is communicated with sacrifice layer opening 221, and the epitaxial loayer part 242 around the epitaxial loayer opening 241 interconnects all one-body moldedly.Sacrifice layer 220 can extension form.But epitaxial loayer 240 same extensions form.
Then, shown in Fig. 2 C and 2C ', provide the epitaxial loayer 240 of accepting substrate 260 and Fig. 2 B and the formed structure of 2B ' to join.The material of accepting substrate 260 can be glass, metal, semi-conducting material, plastic cement, pottery or other suitable materials.This embodiment desires to accept substrate 260 and replaces growth substrate 200.Then, with reference to figure 2C and 2C ', accept after substrate 260 joins with epitaxial loayer 240 selective etch sacrifice layer 220 and make growth substrate 200 break away from epitaxial loayers 240.In detail, can use with respect to growth substrate 200, epitaxial loayer 240 and accept substrate 260, selectivity corrodes the etchant of sacrifice layer 220, make it via base openings 201 and sacrifice layer opening 221 contact sacrifice layers 220 and it is removed, and then make growth substrate 200 break away from epitaxial loayer 240, yet sacrifice layer 220 is not necessity to be removed fully, needs only itself and the contacted volume of levels or area and cuts down to being enough to make growth substrate 200 break away from epitaxial loayers 240.Use citric acid to carry out selective wet etching as etching solution in this embodiment.Right the present invention does not get rid of other suitable wet etching or dry ecthings.
Fig. 2 D and 2D ' remove for sacrifice layer 220 and the structural representation of the substrate 200 of growing up after breaking away from.Should note having only in this structure epitaxial loayer 240 and accept substrate 260 and engage up and down.Therefore, as long as it is enough to understand the thickness of accepting substrate 260, namely can carry out follow-up each processing step by this operation epitaxial film.
Fig. 3 A and 3A ' are profile and the vertical view that shows each step in light-emitting diode 390 manufacturing process according to third embodiment of the invention to Fig. 3 F and 3F ', wherein Fig. 3 A ' is vertical view to Fig. 3 F ', and Fig. 3 A to Fig. 3 F is the profile of the line I-I ' along Fig. 3 A ' to Fig. 3 F '.Compared to the explanation of Fig. 1, the main feature of present embodiment is to provide the patterning supporting substrate, and with it as mask, the patterning epitaxial loayer is so that sacrifice layer carries out etching after exposing again.Present embodiment and previous embodiment title similar elements, its use material also can be similar; As for its thickness, unless stated otherwise otherwise also similar with first embodiment, repeat no more in the literary composition.
Shown in Fig. 3 A and 3A ', growth substrate 300 is provided, grow up in regular turn sacrifice layer 320 and epitaxial loayer 340 are in growth substrate 300.On the other hand, with reference to figure 3B and 3B ', provide support substrate 350, have positive 350a and back side 350b.Supporting substrate 350 has the thickness of enough being operated, and its material can be Si, Al
2O
3, one at least in the metal, semi-conducting material, plastic cement, pottery.Form one or several grooves 351 on the 350b of the back side, for example laser, dry ecthing or wet etching.Note, point at this moment, groove 351 does not penetrate supporting substrate 350.
With reference to figure 3C and 3C ', the back side 350b of supporting substrate 350 is engaged in epitaxial loayer 340, so that groove 351 facing epitaxy layers 340.Then, remove the supporting substrate 350 (as the dotted line of Fig. 3 C with top) of a part from positive 350a, so that groove 351 exposes.In other words, remove rearward recess 351 and exposed supporting substrate 350, so also can be described as opening 351.Remove method useful etch, grinding or other suitable methods.
Fig. 3 D and 3D ' show that the supporting substrate 350 that removes a part is so that the structure that groove (opening) 351 exposes.In this structure, the supporting substrate part 352 around the groove 351 interconnects.Then, be mask with supporting substrate 350, etching epitaxial loayer 340 penetrates epitaxial loayer 340 and exposes sacrifice layer 320 to form epitaxial loayer opening 341.Fig. 3 E and 3E ' show the formed structure in etching epitaxial loayer 340 backs, and wherein the epitaxial loayer part 342 around the epitaxial loayer opening 341 interconnects all one-body moldedly.
With reference to figure 3E and 3E ', selective etch sacrifice layer 320 and make growth substrate 300 break away from epitaxial loayers 340.In detail, can use with respect to growth substrate 300, epitaxial loayer 340 and supporting substrate 350, selectivity corrodes the etchant of sacrifice layer 320, make it via supporting substrate groove (opening) 351 and epitaxial loayer opening 341 contact sacrifice layers 320 and it is removed, and then make growth substrate 300 break away from epitaxial loayer 340, yet sacrifice layer 320 is not necessity to be removed fully, needs only itself and the contacted volume of levels or area and cuts down to being enough to make growth substrate 300 break away from epitaxial loayers 340.Use citric acid to carry out selective wet etching as etching solution in this embodiment.Right the present invention does not get rid of other suitable wet etching or dry ecthings.
Fig. 3 F and 3F ' remove for sacrifice layer 320 and the structural representation of the substrate 300 of growing up after breaking away from.Should note having only in this structure epitaxial loayer 340 to engage up and down with supporting substrate 350.This structure contains discrete disjunct island part fully or hardly.Therefore, should understand as long as the thickness of supporting substrate 350 is enough, namely can carry out follow-up each processing step by this operation epitaxial film.
Fig. 4 A and 4A ' show profile and vertical view according to each step in embodiment of the invention light-emitting diode 490 manufacturing process to Fig. 4 E and 4E ', wherein Fig. 4 A ' is vertical view to Fig. 4 E ', and Fig. 4 A to Fig. 4 E is the profile of the line I-I ' along Fig. 4 A ' to Fig. 4 E '.Compared to the explanation of Fig. 3, the main feature of present embodiment is that supporting substrate is formed on the temporary substrate patterning more earlier; And the patterning supporting substrate has the opening that penetrates supporting substrate.Present embodiment and previous embodiment title similar elements, it uses material also similar; As for its thickness, unless stated otherwise otherwise also similar with previous embodiment, repeat no more in the literary composition.
Shown in Fig. 4 A and 4A ', growth substrate 400 is provided, epitaxial growth sacrifice layer 420 and epitaxial loayer 440 are on growth substrate 400 in regular turn.On the other hand, shown in Fig. 4 B and 4B ', temporary substrate 470 is provided and selects supporting substrate 450 that it is engaged with temporary substrate 470.The material of temporary substrate 470 can be in glass, metal, semi-conducting material, plastic cement, pottery or other suitable materials one at least.Then, patterning supporting substrate 450 makes it have one or more supporting substrate opening 451 and penetrates supporting substrate 450, and wherein the supporting substrate part 452 around the supporting substrate opening 451 interconnects.Patterning supporting substrate 450 can be used laser, dry ecthing, wet etching or cutting.The face that supporting substrate 450 engages with temporary substrate 470 is called positive 450a, and the face of positive relatively 450a is back side 450b.
Then, shown in Fig. 4 C and 4C ', the back side 450b of supporting substrate 450 is engaged with epitaxial loayer 440.Then, temporary substrate 470 is removed, make supporting substrate opening 451 be exposed to positive 450a.Then, be mask with supporting substrate 450, etching epitaxial loayer 440 with form one or several epitaxial loayer openings 441 penetrate epitaxial loayer 440 and expose sacrifice layer 420.Epitaxial loayer 440 after the etching has the pattern identical or different with the supporting substrate 450 of patterning also can be by selecting the etched zone of mask to form the etched pattern on the epitaxial loayer 440.Structure behind the etching epitaxial loayer 440 is shown in Fig. 4 D and 4D '.
With reference to figure 4D and 4D ', selective etch sacrifice layer 420 and make growth substrate 400 break away from epitaxial loayers 440.In detail, can use with respect to growth substrate 400, epitaxial loayer 440 and supporting substrate 450, selectivity corrodes the etchant of sacrifice layer 420, make it via a plurality of supporting substrate openings 451 and epitaxial loayer opening 441 contact sacrifice layers 420 and it is removed, and then make growth substrate 400 break away from epitaxial loayer 440, yet sacrifice layer 420 is not necessity to be removed fully, needs only itself and the contacted volume of levels or area and cuts down to being enough to make growth substrate 400 break away from epitaxial loayers 440.Use citric acid to carry out selective wet etching as etching solution in this embodiment.Right the present invention does not get rid of other suitable wet etching or dry ecthings.
Fig. 4 E and 4E ' remove for sacrifice layer 420 and the structural representation of the substrate 400 of growing up after breaking away from.Should note having only in this structure epitaxial loayer 440 to engage up and down with supporting substrate 450.This structure contains discrete disjunct island part fully or hardly.Therefore, should understand as long as the thickness of supporting substrate 450 is enough, namely can carry out follow-up each processing step by this operation epitaxial film.
Fig. 5 A and 5A ' show profile and vertical view according to each step in embodiment of the invention light-emitting diode 590 manufacturing process to Fig. 5 E and 5E ', wherein Fig. 5 A ' is vertical view to Fig. 5 E ', and Fig. 5 A to Fig. 5 E is the profile of the line I-I ' along Fig. 5 A ' to Fig. 5 E '.Compared to previous embodiment, the main feature of present embodiment is not use temporary substrate.Present embodiment and previous embodiment title similar elements, it uses material also similar; As for its thickness, unless stated otherwise otherwise also similar with previous embodiment, repeat no more in the literary composition.
Shown in Fig. 5 A and 5A ', growth substrate 500 is provided, epitaxial growth sacrifice layer 520 and epitaxial loayer 540 are on growth substrate 500 in regular turn.On the other hand, shown in Fig. 5 B and 5B ', provide support substrate 550.Enough thickness need be arranged supporting substrate 550 so that operation.Then, patterning supporting substrate 550 make its have one or several supporting substrate openings 551 penetrate supporting substrate 550, wherein the supporting substrate part 552 around the supporting substrate opening 551 all interconnects.Patterning supporting substrate 550 can be used laser, dry ecthing or wet etching.
Then, shown in Fig. 5 C and 5C ', supporting substrate 550 is engaged with epitaxial loayer 540.Then, be mask with supporting substrate 550, etching epitaxial loayer 540 with form one or several epitaxial loayer openings 541 penetrate epitaxial loayer 540 and expose sacrifice layer 520.Epitaxial loayer 540 after the etching has the pattern identical or different with the supporting substrate 550 of patterning also can be by selecting the etched zone of mask to form the etched pattern on the epitaxial loayer 540.Structure behind the etching epitaxial loayer 540 is shown in Fig. 5 D and 5D '.
With reference to figure 5D and 5D ', selective etch sacrifice layer 520 and make growth substrate 500 break away from epitaxial loayers 540.In detail, can use with respect to growth substrate 500, epitaxial loayer 540 and supporting substrate 550, selectivity corrodes the etchant of sacrifice layer 520, make it via a plurality of supporting substrate openings 551 and epitaxial loayer opening 541 contact sacrifice layers 520 and it is removed, and then make growth substrate 500 break away from epitaxial loayer 540, yet sacrifice layer 520 is not necessity to be removed fully, needs only itself and the contacted volume of levels or area and cuts down to being enough to make growth substrate 500 break away from epitaxial loayers 540.Use citric acid to carry out selective wet etching as etching solution in this embodiment.Right the present invention does not get rid of other suitable wet etching or dry ecthings.
Fig. 5 E and 5E ' remove for sacrifice layer 520 and the structural representation of the substrate 500 of growing up after breaking away from.Should note having only in this structure epitaxial loayer 540 to engage up and down with supporting substrate 550.This structure contains discrete disjunct island part fully or hardly.Therefore, should understand as long as the thickness of supporting substrate 550 is enough, namely can carry out follow-up each processing step by this operation epitaxial film.
The above is the preferred embodiments of the present invention only, is not in order to limit claim of the present invention; All other do not break away from being equal to of finishing under the disclosed spirit and changes or modify, and all should be included in the claim.
Claims (10)
1. the formation method of a light-emitting diode comprises:
The growth substrate is provided, have one or several base openings penetrate this growth substrate;
Form sacrifice layer on this growth substrate;
Form epitaxial loayer on this sacrifice layer;
Provide and accept substrate and this epitaxial loayer joins; And
This sacrifice layer of selective etch and make this growth substrate break away from this epitaxial loayer.
2. the formation method of light-emitting diode as claimed in claim 1, wherein this one or several base openings around the growth substrate interconnect.
3. the formation method of light-emitting diode as claimed in claim 1, this step that wherein forms this sacrifice layer comprise make this sacrifice layer have one or several sacrifice layer openings penetrate this sacrifice layer and be communicated with this one or several base openings.
4. the formation method of light-emitting diode as claimed in claim 3, wherein the sacrifice layer around this sacrifice layer opening interconnects.
5. the formation method of light-emitting diode as claimed in claim 3, wherein this step of this sacrifice layer of selective etch comprise make etchant via this one or several base openings with this one or several sacrifice layer openings contact this sacrifice layer.
6. the formation method of light-emitting diode as claimed in claim 5 wherein should the growth substrate comprises in nitrogen, aluminium, gallium, arsenic, zinc, silicon, the oxygen one at least; This sacrifice layer comprises in aluminium, the arsenic one at least; This is accepted substrate and comprises in glass, metal, semi-conducting material, plastic cement, the pottery one at least; And this etchant comprises citric acid.
7. the formation method of light-emitting diode as claimed in claim 1 more comprises and removes the part epitaxial loayer.
8. the formation method of light-emitting diode as claimed in claim 7, wherein the part that is removed of this epitaxial loayer with this one or several sacrifice layer openings join.
9. the formation method of light-emitting diode as claimed in claim 7, the step that wherein removes the part epitaxial loayer makes this sacrifice layer expose.
10. the formation method of light-emitting diode as claimed in claim 7, the step that wherein removes the part epitaxial loayer comprise and form that array is arranged or the opening of random distribution.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310054892.9A CN103199160B (en) | 2010-01-13 | 2010-01-13 | The formation method of light-emitting diode |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010002188 CN102130221B (en) | 2010-01-13 | 2010-01-13 | Method for forming light emitting diode |
| CN201310054892.9A CN103199160B (en) | 2010-01-13 | 2010-01-13 | The formation method of light-emitting diode |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010002188 Division CN102130221B (en) | 2010-01-13 | 2010-01-13 | Method for forming light emitting diode |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103199160A true CN103199160A (en) | 2013-07-10 |
| CN103199160B CN103199160B (en) | 2015-12-09 |
Family
ID=44268197
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010002188 Active CN102130221B (en) | 2010-01-13 | 2010-01-13 | Method for forming light emitting diode |
| CN201310054892.9A Active CN103199160B (en) | 2010-01-13 | 2010-01-13 | The formation method of light-emitting diode |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010002188 Active CN102130221B (en) | 2010-01-13 | 2010-01-13 | Method for forming light emitting diode |
Country Status (1)
| Country | Link |
|---|---|
| CN (2) | CN102130221B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102956552B (en) * | 2012-08-21 | 2016-03-16 | 王伟明 | The preparation method of film photovoltaic cell |
| CN107799459B (en) * | 2016-09-06 | 2020-06-09 | 中芯国际集成电路制造(上海)有限公司 | Germanium-silicon substrate on insulator, manufacturing method thereof and semiconductor device |
| CN110620167B (en) * | 2019-08-26 | 2021-04-16 | 华南师范大学 | Deep ultraviolet LED based on large-area substrate stripping and preparation method thereof |
| CN114868262A (en) | 2019-11-18 | 2022-08-05 | 艾维森纳科技有限公司 | High speed and multi-contact light emitting diode for data communication |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100428504C (en) * | 2003-11-06 | 2008-10-22 | 厦门市三安光电科技有限公司 | Semiconductor device and preparation method thereof |
| JP2007081312A (en) * | 2005-09-16 | 2007-03-29 | Showa Denko Kk | Method of manufacturing nitride-based semiconductor light-emitting element |
| WO2007133044A1 (en) * | 2006-05-15 | 2007-11-22 | Epivalley Co., Ltd. | Manufacturing method of nitride semiconductor substrate and iii-nitride semiconductor light emitting device |
| JP5171016B2 (en) * | 2006-10-27 | 2013-03-27 | キヤノン株式会社 | Semiconductor member, manufacturing method of semiconductor article, and LED array using the manufacturing method |
| CN101494267B (en) * | 2008-11-24 | 2010-09-29 | 厦门市三安光电科技有限公司 | Preparation method for gallium nitride base light-emitting device based on substrate desquamation |
-
2010
- 2010-01-13 CN CN 201010002188 patent/CN102130221B/en active Active
- 2010-01-13 CN CN201310054892.9A patent/CN103199160B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN102130221A (en) | 2011-07-20 |
| CN103199160B (en) | 2015-12-09 |
| CN102130221B (en) | 2013-03-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7772587B2 (en) | Silicon-based light emitting diode for enhancing light extraction efficiency and method of fabricating the same | |
| US9166105B2 (en) | Light emitting device | |
| US9048345B2 (en) | Method of forming light-emitting diode | |
| EP1858090A2 (en) | Light emitting diode having multi-pattern structure | |
| CN103474532B (en) | The preparation method of light-emitting diode | |
| TW200408140A (en) | GaN-based Ⅲ-Ⅴ group compound semiconductor light-emitting diode and the manufacturing method thereof | |
| TW200816508A (en) | Fabrication methods of patterned sapphire substrate and light emitting diode | |
| CN102130221B (en) | Method for forming light emitting diode | |
| CN103515496B (en) | Light emitting diode and method for manufacturing light emitting diode | |
| CN102544248A (en) | Manufacturing method for light emitting diode grain | |
| CN102157669A (en) | Device including a textured substrate and method of fabricating a semiconductor device | |
| WO2011069242A1 (en) | Semiconductor dice transfer-enabling apparatus and method for manufacturing transfer-enabling apparatus | |
| CN110249435A (en) | Light-emitting component and its manufacturing method | |
| TW201308664A (en) | Method of manufacturing light emitting diode | |
| CN103035785A (en) | Method for manufacturing light-emitting diode | |
| CN108470804A (en) | A kind of production method of light-emitting diode chip for backlight unit, substrate and light-emitting diode chip for backlight unit | |
| CN101617415B (en) | Method for manufacturing thin film semiconductor structure | |
| JP2010157551A (en) | Group iii nitride semiconductor light emitting element and method of manufacturing the same | |
| CN103137816B (en) | Light-emitting diode | |
| CN103137796B (en) | The preparation method of light-emitting diode | |
| CN103137797B (en) | The preparation method of light-emitting diode | |
| CN103035798A (en) | Light emitting diode | |
| US20140054753A1 (en) | Nano-meshed structure pattern on sapphire substrate by metal self-arrangement | |
| CN102623582A (en) | Manufacturing method of light emitting diode chip | |
| CN202839729U (en) | Light emitting diode |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |