CN103177551B - Data collecting card and its data acquisition device with self-calibration function - Google Patents
Data collecting card and its data acquisition device with self-calibration function Download PDFInfo
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- CN103177551B CN103177551B CN201110431600.XA CN201110431600A CN103177551B CN 103177551 B CN103177551 B CN 103177551B CN 201110431600 A CN201110431600 A CN 201110431600A CN 103177551 B CN103177551 B CN 103177551B
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Abstract
The invention provides a kind of data collecting card and its data acquisition device with self-calibration function, the data collecting card is used for data acquisition device, and the data acquisition device includes：The master control Slab element and data capture card being flexibly connected by slot, the master control Slab element are used for the measurement result for receiving the data collecting card output, and the data collecting card is the data collecting card of plug type, and it includes：Subelement is measured, for being measured to a tested electric signals, a digitized measurement signal is obtained；Subelement is calibrated, for being calibrated according to built-in calibration parameter to the measurement signal, the measurement result is generated.Calibration parameter is stored in the inside of data collecting card by the present invention, data collecting card can and depart from the master control Slab element of data acquisition device, it is convenient, effective individually to carry out factory calibration, and do not interfere with the use of master control Slab element completely.
Description
Technical field
The present invention relates to measurement, technical field of measurement and test, more particularly to a kind of data collecting card with self-calibration function
And its data acquisition device.
Background technology
Data acquisition has been widely used for every field as the basic means for obtaining information.Data acquisition device is
A kind of device of the automatic data collection from measured target and measurement data information.It can realize the collection of multi-signal, by inciting somebody to action
Data acquisition device is connected with outside sensor, sensing element or is directly connected with tested electric signals, can gather and survey
Measure such as d. c. voltage signal, ac voltage signal, DC current signal, ac current signal, frequency signal, temperature letter
Number, the various signals such as pressure signal, pressure signal.
As shown in figure 1, being a kind of structural representation of data acquisition device, the data acquisition device in the prior art
100 include：Master control Slab element 10 and data collecting card 20, the master control Slab element 10 are fixedly connected with data collecting card 20, this
Outside, one or more channel card 30 is also associated with master control Slab element 10.
The channel card 30 can be the other types of cards such as MUX card (also referred to as switch card), matrix card.Each channel card
30 inside is included is configured multiple passages by relay switch, and tested electric signals are accessed in channel card 30 by external cabling
In each passage, master control Slab element 10 to channel card 30 by sending control command, the closure state of controlling switch, so that will be right
The tested electric signals accessed on passage are answered to be introduced in data collecting card 20.Data collecting card 20 is also known as measurement card, and it can be
Various types of single cards such as voltmeter card, ammeter card, universal meter card, oscillograph card, frequency meter card；Can also include
The integrated card of various single cards is stated, a variety of measurement functions are integrated with.The data collecting card 20, which is used to measure, passes through all kinds
Channel card 30 connection come in tested electric signals, master control Slab element 10 by data collecting card 20 send control command, control
Data collecting card 20 processed receives the tested electric signals from different passages, carries out data acquisition.
Master control Slab element 10 is the unit of a control whole system job, and it is by coordinating multiple channel cards 30 and data
Capture card 20 completes switching and the data acquisition operations of input signal (i.e. tested electric signals).Pass through the mould on master control Slab element 10
Intend bus, the tested electric signals in each channel card 30 can be inputted into data collecting card 20；Pass through master control Slab element 10
On number bus, master control Slab element 10 can send control command to channel card 30 and data collecting card 20 and receive number
The tested electric signals measured according to capture card 20.In addition, the power supply that data acquisition device 100 works is also on master control Slab element 10
What power circuit was provided.
When carrying out data acquisition, master control Slab element 10 sends control command to channel card 30 first by number bus；
Channel card 30 connects a corresponding passage according to control command, and tested electric signals are input into emulation bus by the passage
On；Then master control Slab element 10 sends control command to data collecting card 20, data collecting card 20 is according to this by number bus
Control command is measured to the tested electric signals in emulation bus, obtains digitized measurement signal；Afterwards, data collecting card
Measurement signal is returned to master control Slab element 10 by 20 by number bus, now, completes tested electric signals on the passage
Data acquisition.When the upper sensor of the incoming end connection of channel card 30, data acquisition device 100 can realize a variety of physics
The measurement of amount, for example, connection thermocouple equitemperature sensor can realize temperature survey, connection pressure sensor can realize pressure
Power measurement etc..
For example, Application No. CN200810022841.7 Chinese patent《Multichannel, high-accuracy data acquisition unit》, it is open
A kind of data collecting card, the patent does not account for calibrating the signal measurement process of data collecting card in itself, measurement essence
Degree is relatively low.Application No. CN200810156589.9 Chinese patent《High-speed data acquisition and biography based on FPGA and usb bus
Transmission method》, a kind of data collecting card is also disclosed, described equipment is absorbed in the collection, storage and transmission method of data,
The calibration to signal measurement process is equally not directed to, the occasion of low accuracy data collection is only applicable to.
In view of the above-mentioned problems, in the market occurs in that a kind of data acquisition device, possesses calibration function, with certain measurement
Precision.By taking Agilent 34970 as an example, it is exactly a kind of data acquisition device, reference picture 1, and the data acquisition device 100 is in master
Be stored with calibration data in control Slab element 10, and data collecting card 20 is gathered after a tested electric signals, to the tested electric signals
Measure, after a series of processing such as the conversion of analog to digital, obtain digitized measurement signal.Due to analog-to-digital conversion
During can produce certain error, afterwards, data collecting card 20 can also obtain calibration data from master control Slab element 10, right
The measurement signal is calibrated.The device improves measurement accuracy by being calibrated to analog-digital conversion result.But, by
Be each attached to inside main frame, i.e., be fixed together with master control Slab element 10 in the data collecting card 20 of the device, when through it is long when
Between calibration data original after use can be failed with the aging of device, it is necessary to factory is re-started to data collecting card 20
Calibration, i.e., update the calibration data of the storage inside of master control Slab element 10 again.So user must just stop using, and will be whole
Individual main frame (including data collecting card 20 and master control Slab element 10) is sent to instrument calibration center and carries out factory calibration, to calibration process
Inconvenience is brought, the operating efficiency of data acquisition device 100 is reduced.
In a word, it is necessary to which the technical problem that those skilled in the art urgently solve is exactly：It is how convenient, effective
Factory calibration is carried out to data collecting card.
The content of the invention
The technical problems to be solved by the invention are to provide a kind of data collecting card with self-calibration function and its data
Harvester so that the factory calibration of data collecting card is convenient, effective.
In order to solve the above problems, the invention discloses a kind of data collecting card with self-calibration function, for data
Harvester, the data acquisition device includes：The master control Slab element and data capture card of flexible connection, the master control Slab element
Measurement result for receiving the data collecting card output, the data collecting card is the data collecting card of plug type, its
Including：
Subelement is measured, for being measured to a tested electric signals, a digitized measurement signal is obtained；
Subelement is calibrated, for being calibrated according to built-in calibration parameter to the measurement signal, the measurement is generated
As a result.
As a kind of for example, calibration subelement of the present invention includes：
Memory module, for storing the calibration parameter；
Calibration module, for being calibrated according to the calibration parameter to the measurement signal, generates the measurement result.
As a kind of example, the described memory module of this illustration is used to store each preset point with measurement signal
The corresponding multigroup calibration parameter of section span.
As further example, the memory module is used to store each preset segmentation value model with measurement signal
Enclose corresponding endpoint value and calibration factor.
As one kind for example, calibration module of the present invention includes：
Parameter acquiring submodule, for according to the segmentation span where the measurement signal, from multigroup calibration
The one group calibration parameter corresponding with the segmentation span is obtained in parameter；
Signal calibration submodule, for being calibrated according to one group of calibration parameter to the measurement signal, generation one
Individual calibration measurement result.
As a kind of example, the described signal calibration submodule of this illustration be used for according to one group of calibration parameter and
The measurement data, obtains the formulae results of a preset generic calibration formula, and the formulae results are surveyed as described
Measure result.
Accordingly, the invention also discloses a kind of data acquisition device with self-calibration function, including：It is flexibly connected
Master control Slab element and data capture card, the master control Slab element are used for the measurement result for receiving the data collecting card output, institute
The data collecting card that data collecting card is plug type is stated, it includes：
Subelement is measured, for being measured to a tested electric signals, a digitized measurement signal is obtained；
Subelement is calibrated, for being calibrated according to built-in calibration parameter to the measurement signal, the measurement is generated
As a result.
As a kind of for example, calibration subelement of the present invention includes：
Memory module, for storing the calibration parameter；
Calibration module, for being calibrated according to the calibration parameter to the measurement signal, generates the measurement result.
As a kind of example, the described memory module of this illustration is used to store each preset point with measurement signal
The corresponding multigroup calibration parameter of section span.
As further example, the memory module is used to store each preset segmentation value model with measurement signal
Enclose corresponding endpoint value and calibration factor.
As one kind for example, calibration module of the present invention includes：
Parameter acquiring submodule, for according to the segmentation span where the measurement signal, from multigroup calibration
The one group calibration parameter corresponding with the segmentation span is obtained in parameter；
Signal calibration submodule, for being calibrated according to one group of calibration parameter to the measurement signal, generation one
Individual calibration measurement result.
As a kind of example, the described signal calibration submodule of this illustration be used for according to one group of calibration parameter and
The measurement data, obtains the formulae results of a preset generic calibration formula, and the formulae results are surveyed as described
Measure result.
Compared with prior art, the present invention has advantages below：
Design of data acquisition card of the present invention is completely stored in into independent pluggable working method, calibration parameter
, therefore, can be in number when data collecting card needs to be calibrated in the inside of data collecting card, rather than master control Slab element
After being powered off according to harvester, separated with the master control Slab element of data acquisition device, be individually sent to the calibration unit or genuine of specialty,
Conveniently, factory calibration is effectively carried out, and does not interfere with the use of master control Slab element completely.Afterwards, master control Slab element again can be with
The other data collecting cards of insertion, rearming.Further, since the working condition of data collecting card is not by master control borad
The influence of unit or other module variations, it is to avoid when data collecting card is in factory calibration, other maintenance operations, master control
The binding of Slab element and data collecting card and the wasting of resources caused, improve the utilization rate of device.
Brief description of the drawings
Fig. 1 is a kind of structural representation of data acquisition device in the prior art；
Fig. 2 is a kind of structured flowchart of the embodiment of the data acquisition device with self-calibration function；
Fig. 3 is the structural representation for a kind of illustration of data collecting card in Fig. 2；
Fig. 4 is a kind of internal structure schematic diagram of data collecting card；
Fig. 5 be prover output and data collecting card measurement result graph of a relation.
Embodiment
In order to illustrate the data collecting card and its data acquisition device of the present invention, with reference to the accompanying drawings and detailed description
The present invention is further detailed explanation.
Reference picture 2, shows a kind of structured flowchart of the embodiment of the data acquisition device with self-calibration function, this reality
Applying the data acquisition device 100 of example proposition includes：The master control Slab element 10 and data collecting card 20 being flexibly connected by slot, institute
Stating master control Slab element 10 is used to receive the measurement result that the data collecting card 20 is exported, and the data collecting card 20 is pluggable
The data collecting card of formula, it includes：
Subelement 21 is measured, for being measured to a tested electric signals, a digitized measurement signal is obtained；
Subelement 22 is calibrated, for being calibrated according to built-in calibration parameter to the measurement signal, described survey is generated
Measure result.
There is slot, for inserting data collecting card 20 on master control Slab element 10 described in the present embodiment.The data are adopted
Truck 20 is the data collecting card of plug type, can arbitrarily be plugged, on the different slots of data acquisition device 100,
It can also be arranged on different data acquisition devices 100.By insertion of the data collecting card 20 on master control Slab element 10 or
Person extracts state, realizes being flexibly connected for master control Slab element 10 and data collecting card 20.It can also be inserted on data acquisition device 100
One or more channel card 30 is filled, measured signal is linked into master control Slab element 10 by the passage in channel card 30.
It is understood that the master control Slab element 10 described in the present embodiment may further include control subelement and backboard
Subelement, control subelement is communicated by backboard subelement with data collecting card 20, channel card 30.The control subelement
For switching access operation etc. to the signal measurement operation of data collecting card 20, the signal of channel card 30 by sending control command
It is controlled.It can be provided for inserting data collecting card 20 and the slot of channel card 30 on the backboard subelement；Also, the back of the body
Plank unit is internally provided with emulation bus, for the tested electric signals in channel card 30 to be inputted to data collecting card 20
In；The inside of backboard subelement is additionally provided with number bus, for the control command for controlling subelement to send to be transmitted to data
Capture card 20 or channel card 30, and the measurement result that data collecting card 20 is obtained are inputted into control subelement.The control
Subunit and backboard unit can be integrated in a part, can also be as two discrete parts, for example, control is single
Member can be on a pluggable board, the slot for being inserted into backboard subelement.
When data acquisition device 100 carries out data acquisition, the tested electric signals are inputted to channel card by external cabling
In 30, when the passage where the measured signal is connected, it is introduced in the emulation bus in master control Slab element 10, afterwards, number
The tested electric signals are obtained from the emulation bus of master control Slab element 10 according to capture card 20, the tested electric signals are believed for simulation
Number, it can be d. c. voltage signal, ac voltage signal, DC current signal, ac current signal etc..Data collecting card 20
The tested electric signals of measurement 21 pairs of simulations of subelement carry out that signal amplification, the conversion of analog to digital etc. are a series of to survey
Amount processing, obtains a digitized measurement signal.Due to simulation tested electric signals to digitized measurement signal conversion
During, it may appear that some measured deviations, the measured deviation is by the internal components of data collecting card 20 (measuring subelement 21)
Caused by itself, therefore, the measurement signal obtained can be input to calibration subelement 22 and be calibrated by measurement subelement 21.Enter
One step, calibration subelement 22 carries out calibration process, the calibration parameter according to calibration parameter to the digitized measurement signal
It is arranged on the inside of data collecting card 20, then, data collecting card 20 is when performing calibration operation, it is possible to direct basis itself
Internal calibration parameter is calibrated to measurement signal, obtains measurement result, rather than as prior art, pass through data acquisition
The information exchange of card 20 and master control Slab element 10, after getting calibration parameter from master control Slab element 10, then carries out calibration behaviour
Make.Data collecting card 20 is obtained after measurement result, is input in master control Slab element 10, measurement result is shown and protected
Deposit, so that user observes and analyzes.
In the present embodiment, data collecting card 20 is designed to independent pluggable working method, and calibration parameter is deposited completely
Storage is in the inside of data collecting card 20, without being stored in master control borad unit 10, therefore, when data collecting card 20 needs to carry out
During calibration, it can separate, individually send with the master control Slab element 10 of data acquisition device 100 after the power-off of data acquisition device 100
Calibration unit or genuine to specialty are calibrated, and do not interfere with the use of master control Slab element 10 completely.Afterwards, master control borad list
Member 10 may be inserted into other data collecting cards, rearming again.Also, the working condition of data collecting card 20 is not
Influenceed by master control Slab element 10 or other module variations, it is to avoid data collecting card 20 is in factory calibration, other dimensions
When repairing operation, the binding of master control Slab element 10 and data collecting card 20 and the wasting of resources that causes improve the utilization rate of device.
By explanation above as can be seen that described self-calibration function refers to：Data collecting card 20 can and depart from number
According to the master control Slab element 10 of harvester 100, the calibration operation of itself is realized.
Reference picture 3, is a kind of structural representation of illustration of data collecting card 20 in Fig. 2.As shown in figure 3, conduct
It is a kind of for example, the calibration subelement 22 described in the present embodiment can include：
Memory module 221, for storing the calibration parameter；
Calibration module 222, for being calibrated according to the calibration parameter to the measurement signal, generates the measurement knot
Really.
In this illustration, special in calibration subelement 22 storage for being used to store calibration parameter can be set
Module 221, the memory module 221 can be nonvolatile memory, such as flash memory (Flash Memory), then, in number
After the power down of capture card 20, the calibration parameter stored in memory module 221 will not lose, and be made during for next data acquisition
With.It is understood that the calibration parameter stored in memory module 221 is prestored into, it will not typically change.Generally
It is that in factory calibration, before such as data collecting card 20 dispatches from the factory, the calibration parameter storage is entered；In addition, data collecting card
20 cannot be applied to measured deviation caused by measurement subelement 21 using aging after a period of time, calibration parameter, now logarithm
Factory calibration is carried out according to capture card 20, refers to be updated the calibration parameter in memory module 221.
As one kind deformation, the described memory module 221 of this illustrations can be used for each of storage and measurement signal
The corresponding multigroup calibration parameter of preset segmentation span.
During tested electric signals are transformed into measurement signal, it can be produced due to measuring the device of subelement 21 itself
Certain measured deviation, common, specific a certain measurement signal can be to that should have a measured deviation, then, corresponding calibration
Parameter is also different.If for each measured signal, storing calibration parameter corresponding thereto, the accurate of calibration can be improved
Degree, but can also increase the amount of storage of data, and it is neither possible to exclusive list goes out the school corresponding with each measurement signal
Quasi- parameter.Then in this deformation, the total span of measurement signal can be segmented, obtain multiple preset segmentation value models
Enclose, one group of calibration parameter is stored for each segmentation span, this group of calibration parameter can ensure that error is can after calibration
In the range of permission.
It should be noted that data acquisition device 100 is generally configured with multiple measurement functions, different measurement functions can be surveyed
Measure different types of tested electric signals, such as DC current, DC voltage.Under each measurement function, for a type
Tested electric signals, can possess one or more measurement gear (i.e. measurement range), then, can be for different measurements grade
Position, the preset multiple segmentation spans of difference, then, under different measurement gears, the segmentation value model for being stored with preset with each
Enclose corresponding multigroup calibration parameter.
As a kind of example, the described memory module 221 of this deformation can be used for storage and measurement signal each is preset
The corresponding endpoint value and calibration factor of segmentation span.That is, corresponding with each segmentation span
One group of calibration parameter can include the endpoint value and calibration factor of the segmentation, and the endpoint value can be threshold value, can be with
It is end point values.
As one kind deformation, the described calibration module 222 of this illustration can include：
Parameter acquiring submodule, for according to the segmentation span where the measurement signal, from multigroup calibration
The one group calibration parameter corresponding with the segmentation span is obtained in parameter；
Signal calibration submodule, for being calibrated according to one group of calibration parameter to the measurement signal, generation one
Individual calibration measurement result.
When measurement signal is fallen within some segmentation span, just with corresponding with the segmentation span one
Group calibration parameter is calibrated, it is ensured that the measurement result after the calibration finally given, eliminates measurement subelement 21 measurement itself
During the deviation brought.
As a kind of example, the described signal calibration submodule b2 of this deformation can be used for according to one group of calibration parameter
With the measurement data, the formulae results of a preset generic calibration formula are obtained, and using the formulae results as described
Measurement result.That is, one group of calibration parameter and measurement data are brought into a general calibration equation, calculating is obtained
The result of the formula is exactly finally to calibrate obtained measurement result.
Below, as a kind of for example, providing a kind of internal structure schematic diagram of data collecting card, as shown in Figure 4.
Data collecting card 20 shown in Fig. 4 includes：Measure subelement 21 and calibration subelement 22；The measurement subelement 21
Including：Input selector switch 211, analog signal preprocessor 212, amplifier 213, analog-digital converter 214, the and of controller 215
First processor 216；The calibration subelement 22 includes second processor 223 and first memory 224.Second shown in Fig. 4
Processor 223 equivalent to the calibration module 222 in Fig. 3, the first memory 224 equivalent to the memory module 221 in Fig. 3,
For storing the calibration parameter, in addition, the first memory 224 can be also used for storing other non-volatile datas.
In addition, the data collecting card 20 also includes interface plug 23, for being inserted into the slot of master control Slab element 10.
Isolator 24, is arranged between controller 215 and first processor 216, for by analog signal and data signal from electrically connecting
Connect and isolated, the problem of to avoid interfering in the course of work.Second memory 25, for data cached capture card 20
The measurement configuration information of data to be saved, such as channel card 30 is not required to after data in running, power down.
Tested electric signals pass through analog signal input bus (that is, emulation bus) input at interface plug 23 to input
In selecting switch 211, input selector switch 211 is according to voltage, electric current or resistance measurement function, by the different types of quilt of input
Survey electric signal and introduce different inputs respectively, different analog signal pretreatments are carried out in analog signal preprocessor 212
Process.Common, tested electric signals are inputted to input selector switch 211, always according to the difference of electric current, voltage signal, are applied
Plus a protection circuit, carry out security protection.
The input selector switch 211 in subelement 21, analog signal preprocessor 212, amplifier 213, modulus is measured to turn
Parallel operation 214, controller 215 and first processor 216 are measured to tested electric signals, it becomes possible to obtain a digitized survey
Measure signal.Below, according to different types of measurement function, the measurement process for measuring subelement 21 is described further：
A, voltage measurement.Voltage measurement is divided into two kinds of DC voltage measurement and ac voltage measurement again.Ac voltage measurement
It is then the AC-DC conversion module that first alternating voltage is introduced into analog signal preprocessor 212, ac voltage signal is converted to
The d. c. voltage signal of real effective, is then filtered to it.Afterwards, d. c. voltage signal is inputted to entering amplifier 213
In, the different match circuit of measurement measurement range selection that amplifier 213 is set in advance according to user, different match circuit correspondences
Different multiplication factors, can be zoomed in or out by match circuit to the d. c. voltage signal.D. c. voltage signal
After amplifier 213, input to analog-digital converter 214, signal imitation is turned to numeral by analog-digital converter 214
Change, obtain the binary digital signal corresponding with the d. c. voltage signal simulated.Then, controller 215 is by binary digit
Signal is sent to first processor 216, and first processor 216 is according to the transfer characteristic of analog-digital converter (ADC) 214 by described two
Binary digits signal is scaled the floating point values relative to ADC reference voltages, is then carried out according to the multiplication factor of amplifier 213 inverse
Computing obtains virtual voltage measured value, i.e. obtain digitized measurement signal.
B, current measurement.First in analog signal preprocessor 212, according to measurement gear selection sample resistance circuit,
Current signal is flowed through sample resistance, voltage difference is just generated at sample resistance two ends.Then according to above-mentioned voltage measurement method,
Amplifier 213, analog-digital converter 214 and controller 215 are passed sequentially through, voltage measuring value, last first processor 216 is obtained
According to the voltage measuring value and current gear sample resistance value, carry out inverse operation and obtain actual current measured value, i.e. obtain numeral
The measurement signal of change.
C, resistance measurement.First in analog signal preprocessor 212, according to the measurement gear of setting, control data is adopted
Current source inside truck 20 exports a fixed current signal, flows through measured resistance, will be produced at the two ends of measured resistance
A raw voltage difference, then according to above-mentioned voltage measurement method, passes sequentially through amplifier 213, analog-digital converter 214 and controller
215, voltage measuring value is obtained, then first processor 216 obtains measured resistance with carrying out inverse operation according to the value of internal current source
Resistance, i.e. obtain digitized measurement signal.
In addition, in the measurement process of measured signal, controller 215 is additionally operable to input selector switch 211, analog signal
Preprocessor 212, amplifier 213, the operating process of analog-digital converter 214 are controlled.First processor 216 obtains measurement letter
After number, second processor 223 is input to, measurement signal is calibrated in second processor 223.
It should be noted that, it is necessary to carry out factory calibration, the factory calibration to it before the work of data collecting card 20
Its school reference of reference is exactly set, and specific is exactly to set storage calibration parameter therein.Below, as a kind of example, to one
Factory calibration method is planted to be specifically described：
In plant produced, or when being repaired to data collecting card 20, update internal data, by data collecting card 20
One standard of outside access stabilization signal source, the signal source is referred to as prover, can export DC voltage, exchange
Voltage, DC current, alternating current, resistance signal etc., then with each gear of each measurement function of data collecting card 20
Measure.During calibration, a measurement shelves under a fixed measurement function can be switched to control data capture card 20
Position (fixed range), then controls prover to export corresponding signal, the signal of prover output will be according to Current data acquisition
The ardware feature that card 20 measures function gear chooses multiple different values.The signal that prover is exported is input to data collecting card
In 20, measured using 20 pairs of different signal values of data collecting card, and record (before calibration) measurement result, with prover
The signal value of output is as abscissa, and the measurement result before the calibration of data collecting card 20 is made as ordinate in reference axis
One calibration point.After the calibration point of a measurement gear of measure function one is completed, carried out by second processor 223
Calculation process, calculates the slope between each two calibration point.
As shown in figure 5, output and the graph of a relation of the measurement result of data collecting card 20 for prover, X-axis represent calibration
The signal value of instrument output, Y-axis represents that data collecting card 20 calibrates the measurement result of preceding reality output.
By taking the measurement function of DC voltage (DCV), 1000V measurement gear as an example, factory calibration is specifically described.
The signal value Cal that prover is exported respectively is：- 1000V (- Range), -500V (- Range/2), 0V (Zero), 500V (+
Range/2), five signal values of 1000V (+Range).Meanwhile, when prover exports this five values, data collecting card is used respectively
20 above-mentioned five signal values of measurement, obtain the measurement result Y (Cal) before five calibrations, are respectively：Y (- Range), Y (-
Range/2), Y (Zero), Y (+Range/2), Y (+Range), accordingly, obtain 5 preset segmentation spans：[Y(-
Range), Y (- Range/2)], [Y (- Range/2), Y (Zero)], [Y (Zero), Y (+Range/2)], [Y (+Range/2),
Y(+Range)].Signal value and measurement result according to every a pair, can obtain 5 calibration points.Under ideal conditions, prover
The measurement result of output and data collecting card 20 should be corresponded, and meet Y=X relations, as dotted line is represented in Fig. 5
Shown in ideal line.But actual some components (including analog signal preprocessor 212, amplifier due to measuring subelement 21
213rd, analog-digital converter 214) self-characteristic introduces deviation, actually enters output relation as shown in actual line in figure.
The signal value exported in data collecting card 20 according to prover and corresponding measurement result, obtain five groups pairs
It should be related to：[- Range/2]-＞ [Y (- Range/2)], [- Range]-＞ [Y (- Range)], [Zero]-＞ [Y (Zero)],
[+Range/2]-＞ [Y (+Range/2)], [+Range]-＞ [Y (+Range)], obtain 5 calibration points.Then according to per phase
Two adjacent calibration points calculate the slope of the direct-connected line of point-to-point transmission, and five calibration points can obtain the slope of 4 sections of lines.
Reference picture 4, second processor 223 is by 4 preset segmentations with measurement signal (calibrate before measurement result)
4 groups of corresponding calibration parameters of span are inputted into non-volatile first memory 224, are preserved, such as the institute of table 1
Show, be 4 groups of preserved calibration parameters.Each group of calibration parameter includes the endpoint value corresponding with segmentation span and calibration
Coefficient.In the present embodiment, the endpoint value is threshold value, and the threshold value includes：In each segmentation, the output Cal of prover
With the measurement result Y (Cal) before calibration.The calibration factor is the slope of each section of line.
Table 1
This completes whole calibration processes of a gear under a measurement function.It is sequentially completed all measurement work(
After all gears calibration of energy, factory calibration work just terminates.
Reference picture 4 simultaneously combines table 1, and under the working condition of data collecting card 20, i.e., user is entered using data collecting card 20
During row reality measurement, measurement subelement 21 is obtained after measurement signal, and calibration subelement 22 just can be according to preservation in factory calibration
Calibration parameter the measurement signal is calibrated.First, the second processor 223 of data collecting card 20 is according to measurement signal
The segmentation span at place, obtains corresponding one group from multigroup calibration parameter.Specifically, measurement signal is segmented with each
Span threshold value (i.e. factory calibration when preserve 5 calibrations before measurement result Y (Cal)) from small to large ord according to
Secondary to compare, for example, measurement signal Y (Meas)=800V, it is more than the measurement result 500V of the 4th calibration point, and less than adjacent
The 5th calibration point measurement result 1000V, then the segmentation of the segmentation span where measurement signal Y (Meas) the 4th value
Scope [Y (+Range/2), Y (+Range)], further, obtain with the 4th segmentation span [Y (+Range/2), Y (+
Range)] corresponding calibration parameter：Cal=[+Range/2], Y (Cal)=[Y (+Range/2)], Slope 4.Afterwards, will be upper
One group of calibration parameter is stated to bring into a preset generic calibration formula, it is as follows：
Meas=[Y (Meas)-Y (Cal)]/Slope+Cal
=[800-Y (500)]/Slope 4+500
Finally, the Meas calculated is exactly the measurement result obtained after calibrating.After the completion of calibration, data collecting card 20 is direct
Using measurement result as return value, return in master control Slab element 10, reference picture 2.Master control Slab element 10 by time of measuring information,
Currently received measurement result etc. is saved in the memory of master control Slab element 10 together, and this completes a tested telecommunications
Number data acquisition.
It should be noted that in this illustration, the first processor 216 and second processor 223 can be with integrated
In a processor 26, as shown in figure 4, by a processor 26 jointly come complete first processor 216 inverse operation function,
Other functions such as the calibration function of second processor 223.
In this illustration, five calibration points are have chosen, 4 preset segmentation value models of measurement signal are obtained
Enclose, in the specific implementation, the calibration point of other any numbers can also be chosen according to the device element characteristic in measurement subelement 21,
It can be adjusted flexibly as needed in practical application.
In this illustration, calibration module 222 is according to one group of calibration parameter Slope, Cal, Y (Cal) and described
Measurement data Y (Meas), obtains the formulae results MeasX of a preset generic calibration formula, and by the formulae results Y
(MeasX) as the measurement result.The preset generic calibration formula of the present embodiment is Y (MeasX)=Slope* (MeasX-
Cal)+Y (Cal), it is to be understood that in the specific implementation, can also be according to different application scenarios from other forms
General formula, here is omitted, and the present invention is not limited this.
Above to a kind of data collecting card and its data acquisition device with self-calibration function provided by the present invention, enter
Go and be discussed in detail, specific case used herein is set forth to the principle and embodiment of the present invention, and the above is implemented
The explanation of example is only intended to the method and its core concept for helping to understand the present invention；Simultaneously for the general technology people of this area
Member, according to the thought of the present invention, will change in specific embodiments and applications, in summary, this explanation
Book content should not be construed as limiting the invention.
Claims (13)
1. a kind of data collecting card with self-calibration function, for data acquisition device, the data acquisition device includes：It is logical
The master control Slab element and data capture card of slot flexible connection are crossed, the master control Slab element is defeated for receiving the data collecting card
The measurement result gone out, it is characterised in that
Slot is provided with the master control Slab element, for inserting data collecting card, the master control Slab element to data by adopting
Truck sends control command, and control data capture card receives the tested electric signals from different passages, carries out data acquisition；
The data collecting card is the data collecting card of plug type, is internally provided with calibration parameter, it includes：
Subelement is measured, for being measured to a tested electric signals, a digitized measurement signal is obtained；
Subelement is calibrated, for being calibrated according to built-in calibration parameter to the measurement signal, the measurement result is generated.
2. data collecting card as claimed in claim 1, it is characterised in that
The calibration subelement includes：
Memory module, for storing the calibration parameter；
Calibration module, for being calibrated according to the calibration parameter to the measurement signal, generates the measurement result.
3. data collecting card as claimed in claim 2, it is characterised in that
The memory module is used to store the multigroup calibration ginseng corresponding with each preset segmentation span of measurement signal
Number.
4. data collecting card as claimed in claim 3, it is characterised in that
The memory module is used for the storage endpoint value corresponding with each preset segmentation span of measurement signal and school
Quasi- coefficient.
5. data collecting card as claimed in claim 3, it is characterised in that
The calibration module includes：
Parameter acquiring submodule, for according to the segmentation span where the measurement signal, from multigroup calibration parameter
The middle acquisition one group calibration parameter corresponding with the segmentation span；
Signal calibration submodule, for being calibrated according to one group of calibration parameter to the measurement signal, generates a survey
Measure result.
6. data collecting card as claimed in claim 5, it is characterised in that
The signal calibration submodule is used for according to one group of calibration parameter and the measurement data, and acquisition one is preset to lead to
With the formulae results of calibration equation, and it regard the formulae results as the measurement result.
7. a kind of data acquisition device with self-calibration function, including：The master control Slab element sum being flexibly connected by slot
According to capture card, the master control Slab element is used for the measurement result for receiving the data collecting card output, it is characterised in that
Slot is provided with the master control Slab element, for inserting data collecting card, the master control Slab element to data by adopting
Truck sends control command, and control data capture card receives the tested electric signals from different passages, carries out data acquisition；
The data collecting card is the data collecting card of plug type, is internally provided with calibration parameter, it includes：
Subelement is measured, for being measured to a tested electric signals, a digitized measurement signal is obtained；
Subelement is calibrated, for being calibrated according to built-in calibration parameter to the measurement signal, the measurement result is generated.
8. data acquisition device as claimed in claim 7, it is characterised in that
The calibration subelement includes：
Memory module, for storing the calibration parameter；
Calibration module, for being calibrated according to the calibration parameter to the measurement signal, generates the measurement result.
9. data acquisition device as claimed in claim 8, it is characterised in that
The memory module is used to store the multigroup calibration ginseng corresponding with each preset segmentation span of measurement signal
Number.
10. data acquisition device as claimed in claim 9, it is characterised in that
The memory module is used for the storage endpoint value corresponding with each preset segmentation span of measurement signal and school
Quasi- coefficient.
11. data acquisition device as claimed in claim 9, it is characterised in that
The calibration module includes：
Parameter acquiring submodule, for according to the segmentation span where the measurement signal, from multigroup calibration parameter
The middle acquisition one group calibration parameter corresponding with the segmentation span；
Signal calibration submodule, for being calibrated according to one group of calibration parameter to the measurement signal, generates a survey
Measure result.
12. data acquisition device as claimed in claim 11, it is characterised in that
The signal calibration submodule is used for according to one group of calibration parameter and the measurement data, and acquisition one is preset to lead to
With the formulae results of calibration equation, and it regard the formulae results as the measurement result.
13. a kind of data acquisition device with self-calibration function, including：The master control Slab element sum being flexibly connected by slot
According to capture card, the master control Slab element is used for the measurement result for receiving the data collecting card output, it is characterised in that the number
It is the data collecting card as described in any one of claim 1 to 6 according to capture card.
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| CN201110431600.XA CN103177551B (en) | 2011-12-21 | 2011-12-21 | Data collecting card and its data acquisition device with self-calibration function |
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| CN201110431600.XA CN103177551B (en) | 2011-12-21 | 2011-12-21 | Data collecting card and its data acquisition device with self-calibration function |
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| CN110244252A (en) * | 2018-03-08 | 2019-09-17 | 上海原动力通信科技有限公司 | A kind of electric signal measurement result calibration system and method |
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| CN111123184A (en) * | 2019-11-07 | 2020-05-08 | 上海精密计量测试研究所 | Calibration device and method for FPGA junction temperature test |
| CN113093079A (en) * | 2019-12-23 | 2021-07-09 | 致茂电子(苏州)有限公司 | Electronic component testing device and method |
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