CN104597390A - Multi-model multi-interpolation lattice structure test automatic identification system - Google Patents

Multi-model multi-interpolation lattice structure test automatic identification system Download PDF

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Publication number
CN104597390A
CN104597390A CN201410851504.4A CN201410851504A CN104597390A CN 104597390 A CN104597390 A CN 104597390A CN 201410851504 A CN201410851504 A CN 201410851504A CN 104597390 A CN104597390 A CN 104597390A
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CN
China
Prior art keywords
lattice structure
structure body
group
run
dot matrix
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Pending
Application number
CN201410851504.4A
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Chinese (zh)
Inventor
陈巧云
征建高
征茂德
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Suzhou Zhengzhihun Patent Technology Service Co Ltd
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Suzhou Zhengzhihun Patent Technology Service Co Ltd
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Application filed by Suzhou Zhengzhihun Patent Technology Service Co Ltd filed Critical Suzhou Zhengzhihun Patent Technology Service Co Ltd
Priority to CN201410851504.4A priority Critical patent/CN104597390A/en
Publication of CN104597390A publication Critical patent/CN104597390A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a multi-model multi-interpolation lattice structure test automatic identification system. The system comprises a lattice structure and a lattice tester quick plug connection group lattice structure, the lattice structure is quick plug the number of connections lattice structure set up for more than one group, the lattice structure of the test machine is provided with a lattice structure group installed plug socket, plug the lattice structure of the group number set for the installation of more than one outlet, the lattice structure of the lattice structure of quick plug connector plug installed in the lattice structure of the group or peer group installed plug socket can plug in any installation position. The invention uses intelligent software to identify and determine the system can recognize that the combination of lattice structure configuration, compared to the lattice structure of the test database, automatic identification of needs lattice structure and call the appropriate test program testing, with a fool-proof , error prevention, warning and General Motors and other outstanding features.

Description

Polytypic how slotting method lattice structure body examination test-run a machine automatic recognition system
Technical field
The present invention relates to a kind of fireworks parts testing tool, be specifically related to polytypic how slotting method lattice structure body examination test-run a machine automatic recognition system.
Background technology
Lattice structure body is the key components and parts realizing figure line fireworks, the display determining fireworks can accomplish the effect of user's request, also be that decision figure line fireworks can miniaturization, the critical component of integration, the volume of lattice structure body, dot matrix dense degree, shaping efficiency, the step of production cost and aft-loaded airfoil process all seriously constrains the holistic cost of figure line fireworks, security, reliability and production efficiency, lattice structure body needs precision die, precise forming, a large amount of accurate aftertreatment machining tool, quality testing instrument, shaping tool, tools for loading and anti-error, blast protection measure etc., the core component of figure line fireworks needs a large amount of inter-trade new and high technology supports across technical field and original daring to blaze new trails, the spirit that dare to test, existing every profession and trade lacks corresponding technical support, the data that particularly industry fireworks technical field can be for reference is so tragic that one cannot bear to look at it, need oneself to go developing everywhere.
Summary of the invention
The object of the invention is to the above problem overcoming prior art existence, polytypic how slotting method lattice structure body examination test-run a machine automatic recognition system is provided, the present invention utilizes software identification and intellectual determination system, the combination configuration identifying dot matrix structure can be known, contrast dot matrix structured data storehouse to be measured, automatic identification needs the lattice structure body of test and calls corresponding test procedure, has fool proof, mistake proofing, warning and the remarkable function such as general.
For realizing above-mentioned technical purpose, reach above-mentioned technique effect, the present invention is achieved through the following technical solutions:
Polytypic how slotting method lattice structure body examination test-run a machine automatic recognition system, comprise lattice structure body examination test-run a machine (1) and be connected dot matrix structure group (2) with lattice structure body fast insert-pull, the number that described lattice structure body fast insert-pull connection dot matrix structure group (2) is arranged is one or more, described lattice structure body examination test-run a machine (1) is provided with lattice structure body group plug mounting receptacle (3), the number that described lattice structure body group plug mounting receptacle (3) is arranged is more than one, described lattice structure body fast insert-pull connects the position that can plug arbitrarily installation that dot matrix structure group (2) plug is arranged on lattice structure body group plug mounting receptacle (3).
Further, when the number that described lattice structure body fast insert-pull connection dot matrix structure group (2) is arranged is more than 2, the specifications and models that described lattice structure body fast insert-pull connects dot matrix structure group (2) are identical.
Further, when the number that described lattice structure body fast insert-pull connection dot matrix structure group (2) is arranged is more than 2, described lattice structure body fast insert-pull connects dot matrix structure group (2) and has different specifications and models.
Further, described single lattice structure body group plug mounting receptacle (3) physical dimension is more than or equal to the physical dimension that single lattice structure body fast insert-pull connects dot matrix structure group (2).
Further, lattice structure body fast insert-pull connection dot matrix structure group (2) of described more than two can plug mounting receptacle (3) with same lattice structure body group simultaneously be connected, and is connected with each other and/or is not connected.
Further, described single lattice structure body group plug mounting receptacle (3) is provided with 1024 points, supports to test 512 loops at most simultaneously.
Further, the number that described lattice structure body group plug mounting receptacle (3) is arranged is preferably 16, can independent assortment, allotment order.
Further, smart circuit analysis module and intellectual analysis inspection software is provided with in described lattice structure body examination test-run a machine (1).
The invention has the beneficial effects as follows:
Utilize software identification and intellectual determination system, the combination configuration identifying dot matrix structure can be known, contrast dot matrix structured data storehouse to be measured, automatically identifying needs the lattice structure body of test and calls corresponding test procedure, has fool proof, mistake proofing, warning and the remarkable function such as general.
Above-mentioned explanation is only the general introduction of technical solution of the present invention, in order to better understand technological means of the present invention, and can be implemented according to the content of instructions, coordinates accompanying drawing to be described in detail as follows below with preferred embodiment of the present invention.The specific embodiment of the present invention is provided in detail by following examples and accompanying drawing thereof.
Accompanying drawing explanation
Accompanying drawing described herein is used to provide a further understanding of the present invention, and form a application's part, schematic description and description of the present invention, for explaining the present invention, does not form inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is the axis side view that rear side of the present invention connects 2 lattice structure body groups;
Fig. 2 is the axis side view that rear side of the present invention connects 3 lattice structure body groups.
Number in the figure illustrates: 1, lattice structure body examination test-run a machine, 2, lattice structure body fast insert-pull connects dot matrix structure group, 3, lattice structure body group plug mounting receptacle.
Embodiment
Below with reference to the accompanying drawings and in conjunction with the embodiments, describe the present invention in detail.
Shown in seeing figures.1.and.2, polytypic how slotting method lattice structure body examination test-run a machine automatic recognition system, comprise lattice structure body examination test-run a machine 1 and be connected dot matrix structure group 2 with lattice structure body fast insert-pull, the number that described lattice structure body fast insert-pull connects the setting of dot matrix structure group 2 is one or more, described lattice structure body examination test-run a machine 1 is provided with lattice structure body group plug mounting receptacle 3, the number that described lattice structure body group plug mounting receptacle 3 is arranged is more than one, described lattice structure body fast insert-pull connects the position that can plug arbitrarily installation that the plug of dot matrix structure group 2 is arranged on lattice structure body group plug mounting receptacle 3.
Further, when the number that described lattice structure body fast insert-pull connection dot matrix structure group 2 is arranged is more than 2, the specifications and models that described lattice structure body fast insert-pull connects dot matrix structure group 2 are identical.
Further, when the number that described lattice structure body fast insert-pull connection dot matrix structure group 2 is arranged is more than 2, described lattice structure body fast insert-pull connects dot matrix structure group 2 and has different specifications and models.
Further, described single lattice structure body group plug mounting receptacle 3 physical dimension is more than or equal to the physical dimension that single lattice structure body fast insert-pull connects dot matrix structure group 2.
Further, the lattice structure body fast insert-pull connection dot matrix structure group 2 of described more than two can plug mounting receptacle 3 with same lattice structure body group simultaneously be connected, and is connected with each other and/or is not connected.
Further, described single lattice structure body group plug mounting receptacle 3 is provided with 1024 points, supports to test 512 loops at most simultaneously.
Further, the number that described lattice structure body group plug mounting receptacle 3 is arranged is preferably 16, can independent assortment, allotment order.
Further, smart circuit analysis module and intellectual analysis inspection software is provided with in described lattice structure body examination test-run a machine 1.
The principle of work of the present embodiment is as follows:
4 lattice structure body group plug mounting receptacles 3 are provided with on rear side of lattice structure body examination test-run a machine 1, when needs test conduction lattice structure body, lattice structure body fast insert-pull is connected dot matrix structure group 2 and insert dot matrix structure group plug mounting receptacle 3, according to shape size and the number of lattice structure body group plug mounting receptacle 3, any plug, all can as long as can insert completely, no matter dot matrix structure fast insert-pull connects dot matrix structure group 2 is inserted on for which lattice structure body group plug mounting receptacle 3, also no matter several lattice structure body fast insert-pulls connect between dot matrix structure group 2 whether have space, whether be connected, the smart circuit analysis module established in lattice structure body examination test-run a machine 1 and intellectual analysis inspection software according to setting or can call dot matrix structured data storehouse, Correct Analysis goes out measured lattice structure body specifications and models, and the relevant data of Automatically invoked and program are tested automatically, save time, save trouble, cost-saving, accuracy is reliable.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.

Claims (8)

1. polytypic how slotting method lattice structure body examination test-run a machine automatic recognition system, its feature exists in, comprise lattice structure body examination test-run a machine (1) and be connected dot matrix with lattice structure body fast insert-pullstructure group (2), the number that described lattice structure body fast insert-pull connection dot matrix structure group (2) is arranged is one or more, described lattice structure body examination test-run a machine (1) is provided with lattice structure body group plug mounting receptacle (3), the number that described lattice structure body group plug mounting receptacle (3) is arranged is more than one, and described lattice structure body fast insert-pull connects the position that can plug arbitrarily installation that dot matrix structure group (2) plug is arranged on lattice structure body group plug mounting receptacle (3).
2. polytypic according to claim 1 how slotting method lattice structure body examination test-run a machine automatic recognition system, it is characterized in that: when the number that described lattice structure body fast insert-pull connection dot matrix structure group (2) is arranged is more than 2, the specifications and models that described lattice structure body fast insert-pull connects dot matrix structure group (2) are identical.
3. polytypic according to claim 1 how slotting method lattice structure body examination test-run a machine automatic recognition system, it is characterized in that: when the number that described lattice structure body fast insert-pull connection dot matrix structure group (2) is arranged is more than 2, described lattice structure body fast insert-pull connects dot matrix structure group (2) and has different specifications and models.
4. polytypic according to claim 1 how slotting method lattice structure body examination test-run a machine automatic recognition system, is characterized in that: described single lattice structure body group plug mounting receptacle (3) physical dimension is more than or equal to the physical dimension that single lattice structure body fast insert-pull connects dot matrix structure group (2).
5. polytypic according to claim 4 how slotting method lattice structure body examination test-run a machine automatic recognition system, it is characterized in that: lattice structure body fast insert-pull connection dot matrix structure group (2) of described more than two can plug mounting receptacle (3) with same lattice structure body group simultaneously be connected, and is connected with each other and/or is not connected.
6. polytypic according to claim 1 how slotting method lattice structure body examination test-run a machine automatic recognition system, is characterized in that: described single lattice structure body group plug mounting receptacle (3) is provided with 1024 points, supports to test 512 loops at most simultaneously.
7. polytypic according to claim 1 how slotting method lattice structure body examination test-run a machine automatic recognition system, is characterized in that: the number that described lattice structure body group plug mounting receptacle (3) is arranged is preferably 16, can independent assortment, allotment order.
8. polytypic according to claim 1 how slotting method lattice structure body examination test-run a machine automatic recognition system, is characterized in that: be provided with smart circuit analysis module and intellectual analysis inspection software in described lattice structure body examination test-run a machine (1).
CN201410851504.4A 2014-12-31 2014-12-31 Multi-model multi-interpolation lattice structure test automatic identification system Pending CN104597390A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104502786A (en) * 2015-01-05 2015-04-08 苏州路之遥科技股份有限公司 Multi-insertion-rod multi-insertion-method wiring harness intelligent test machine automatic recognition system
CN104569787A (en) * 2015-01-05 2015-04-29 苏州征之魂专利技术服务有限公司 Multi-model and multi-insertion-method lattice-structure-body-testing-machine automatic identifying system
CN107608887A (en) * 2017-09-14 2018-01-19 郑州云海信息技术有限公司 A kind of method for creating virtual opetrating system test server

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CN103177551A (en) * 2011-12-21 2013-06-26 北京普源精电科技有限公司 Data collection card having self calibration function and data collection apparatus
CN103281582A (en) * 2013-05-02 2013-09-04 深圳创维数字技术股份有限公司 Method and device for processing image data point matrix
CN203387009U (en) * 2013-05-23 2014-01-08 泰朴(上海)国际贸易有限公司 Electric power and data management track

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10045025A1 (en) * 1999-09-13 2001-04-26 Geneticware Co Protecting structure for package of integrated circuit
US20030210064A1 (en) * 2002-05-07 2003-11-13 Yao-Kui Huang Testing apparatus for BGA IC
CN1635388A (en) * 2003-12-26 2005-07-06 技嘉科技股份有限公司 Ball grid array substrate detecting device and constructive method thereof
CN102117588A (en) * 2009-12-31 2011-07-06 塔工程有限公司 Array test device
CN103177551A (en) * 2011-12-21 2013-06-26 北京普源精电科技有限公司 Data collection card having self calibration function and data collection apparatus
CN103281582A (en) * 2013-05-02 2013-09-04 深圳创维数字技术股份有限公司 Method and device for processing image data point matrix
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104502786A (en) * 2015-01-05 2015-04-08 苏州路之遥科技股份有限公司 Multi-insertion-rod multi-insertion-method wiring harness intelligent test machine automatic recognition system
CN104569787A (en) * 2015-01-05 2015-04-29 苏州征之魂专利技术服务有限公司 Multi-model and multi-insertion-method lattice-structure-body-testing-machine automatic identifying system
CN107608887A (en) * 2017-09-14 2018-01-19 郑州云海信息技术有限公司 A kind of method for creating virtual opetrating system test server

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