CN103116124A - Chip capable of self-calibration of interior crystal oscillator, calibration system and calibration method - Google Patents
Chip capable of self-calibration of interior crystal oscillator, calibration system and calibration method Download PDFInfo
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- CN103116124A CN103116124A CN2011103658921A CN201110365892A CN103116124A CN 103116124 A CN103116124 A CN 103116124A CN 2011103658921 A CN2011103658921 A CN 2011103658921A CN 201110365892 A CN201110365892 A CN 201110365892A CN 103116124 A CN103116124 A CN 103116124A
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Abstract
The invention discloses a chip capable of self-calibration of an interior crystal oscillator and a crystal oscillator calibration test system, and further discloses an oscillator calibration method based on the system. Signals output by the interior crystal oscillator 3 to be calibrated are compared with exterior reference accurate signals in a comparison module (4), the comparison result is output to a testing processing module 1 to be processed, the detecting processing module 1 generates a calibration value of the crystal oscillator according to the comparison result and outputs the calibration value to a calibration register (2) to be stored, the crystal oscillator (3) to be calibrated calibrates output clock signals according to the calibration value of the calibration register (2) and the calibration of the interior crystal oscillator is achieved.
Description
Technical field
The present invention relates to the calibration of chip internal crystal oscillator, but relate in particular to the chip of the inner crystal oscillator of a kind of self calibration and the calibration steps of this chip.
Background technology
Most chip all integrated inner crystal oscillator module provides work required clock signal, because the deviation of manufacture craft, the deviation ratio of chip internal crystal oscillator clock frequency is larger, needs inner crystal oscillator is calibrated in the application of having relatively high expectations.Please refer to Fig. 1, Fig. 1 is the calibration structure figure of existing adjustable chip, to the calibration steps of crystal oscillator be at present, chip is surveyed the test instruction that board sends in receiving by the IO mouth, control module control crystal oscillator outputs to middle survey board to clock signal, middle survey board is by relatively comparing with reference to accurate clock signal and crystal oscillator signal, need to judge whether calibration, if need calibration, send calibration command to testing control module, test controller is delivered to middle survey board by modifying of order crystal oscillator clock signal again and is compared judgement.This kind calibration steps alignment time is long, and is subject to the frequency accuracy of IO mouth output, and is larger on result's impact of calibration.
Be US7852099B1 at U.S. Patent number, applicant: Paul G.Clark, having introduced a kind of test procedure of downloading in the chip internal storer in " Frequency trimming for internal oscillator for test-time reduction " patent documentation of Redmond is come crystal oscillator is carried out detection calibration by processor operation test procedure, but, this kind calibration steps relates to the storer of chip, a lot of chip memory spaces are too small, can't download test procedure.
Summary of the invention
The main technical problem to be solved in the present invention is the calibration steps that changes the chip crystal oscillator, avoids the calibration of crystal oscillator to the dependence of chip memory, allows the little chip of storage space can carry out fast the calibration of crystal oscillator equally.
For solving the problems of the technologies described above, but the invention provides the chip of the inner crystal oscillator of a kind of self calibration, comprise that a test processes module, a comparison module, a calibration register and crystal oscillator to be calibrated form; Wherein, described comparison module is used for more described crystal oscillator signal to be calibrated and the accurate signal of external reference, send described test processes resume module comparative result; Described test processes module is used for receiving test instruction, processes the data of described comparison module output, and the calibration value that produces crystal oscillator outputs to described calibration register, and returns calibration result after calibration finishes; Described calibration register is used for receiving and preserving the crystal oscillator calibration value of described test processes module output, and calibration value is inputted described adjustable crystal oscillator; Described crystal oscillator to be calibrated is used for the crystal oscillator calibration value calibration crystal oscillator according to described calibration register output.
Further, the comparison module of described chip can be a counter, wherein, the accurate signal one in the output signal of described crystal oscillator to be calibrated and described outside is as the clock signal input of described counter, another signal is as the counting input of counter, and count results outputs to described test processes resume module.Can also increase by a frequency divider, be used for according to system requirements the accurate signal of output signal or described outside of crystal oscillator to be calibrated being carried out first frequency division and be input to again counter.
Further, the test processes module of described chip can be comprised of a test controller and a calibration process module; Described test controller is used for the end that begins of control crystal oscillator calibration, and outputs test result after calibration finishes; Described calibration process module is used for processing according to the data of described comparison module output, produces the calibration value input calibration register of crystal oscillator.Described calibration process module can also comprise a judging unit and a calibration submodule.
The present invention also provides the test macro of a kind of crystal oscillator calibration, but comprises in the chip of the inner crystal oscillator of above-mentioned self calibration and the outside and survey board.
The present invention also provides a kind of method based on the inner crystal oscillator of above-mentioned crystal oscillator calibration test system calibration chip, may further comprise the steps:
During receiving, the test processes module surveys the test command that board sends, the self calibration test of beginning crystal oscillator;
Crystal oscillator output signal to be calibrated and the accurate signal of external reference are input to described comparison module and compare, and described comparison module outputs to described test processes module to comparative result;
The comparative result of the described comparison module output of test processes resume module, the calibration value that returns test result or generation correspondence according to comparative result outputs in the described register;
Crystal oscillator to be calibrated outputs to described comparison module to the signal after the calibration and compares with the accurate signal of external reference according to the output of the size change signal of calibration value;
After calibration was finished, the test processes module was returned test result to middle survey board.
The invention has the beneficial effects as follows: increase the test processes module and pass through comparison module at chip internal, the test processes module, the cooperation of the several modules of calibration register, inside crystal oscillator to be calibrated is calibrated, be not subject to the output frequency precision of IO mouth, the storer that does not also relate to chip even storage space seldom, can be realized the quick self calibration to inner crystal oscillator equally.
Description of drawings
Fig. 1 is the calibration structure figure of existing adjustable chip;
Fig. 2 is the structural drawing of adjustable chip in the embodiment of the invention one;
Fig. 3 surveys the board workflow diagram in the embodiment of the invention one alignment test process;
Fig. 4 is the embodiment of the invention one alignment test process adjustable chip operation process flow diagram;
Fig. 5 is the structural drawing of adjustable chip in the embodiment of the invention two;
Fig. 6 is the another kind of structural drawing of adjustable chip in the embodiment of the invention two;
Embodiment
By reference to the accompanying drawings the present invention is described in further detail below by embodiment.
Main inventive concept of the present invention is: increase suitable hardware module at chip internal, be implemented in chip internal to the calibration of crystal oscillator by cooperatively interacting of hardware module.Way of the present invention is: increase the test processes module at chip internal, described test processes module changes signal output according to the signal of crystal oscillator to be calibrated and the calibration value control crystal oscillator of exporting crystal oscillator with reference to the comparative result of accurate signal, finishes the self calibration of crystal oscillator.
Embodiment one:
Please refer to Fig. 2 to Fig. 4, wherein, Fig. 2 is the structural drawing of adjustable chip in the embodiment of the invention one; Fig. 3 surveys the board workflow diagram in the embodiment of the invention one alignment test process; Fig. 4 is the embodiment of the invention one alignment test process adjustable chip operation process flow diagram.
Described chip comprises test processes module 1, calibration register 2, crystal oscillator to be calibrated 3, comparison module 4; Wherein, test processes module 1 is connected with survey board in the outside by the IO mouth, calibration register 2 is connected with test processes module 1, and crystal oscillator 3 to be calibrated is connected with calibration register 2, and comparison module 4 is connected with survey board in crystal oscillator 3 to be calibrated, test processes module 1 and the outside respectively.
At first, described chip testing processor 1 receives and surveys the test instruction that board sends in the outside, the calibration testing of beginning crystal oscillator; Then, survey the accurate signal of reference of board output in the signal that described comparison module 4 receives 3 outputs of described crystal oscillator to be calibrated simultaneously and the outside and compare, the result of comparison is outputed in the described test processes module 1; Then, the Output rusults of 1 pair of described comparison module 4 of described test processes module is processed, if the output signal of described crystal oscillator to be calibrated 3 is identical with the accurate signal of external reference, described test processes module 1 control test finishes, and returns the successful test result of calibration to middle survey board by the IO mouth; If the output signal of described crystal oscillator to be calibrated 3 is not identical with the accurate signal of external reference, described test processes module 1 outputs in the described calibration register 2 according to the calibration value that result relatively produces a correspondence, described calibration register 2 is preserved and calibration value is outputed in the crystal oscillator 3 to be calibrated, described crystal oscillator to be calibrated 3 is according to the output of described calibration value calibrating signal, output signal after the calibration is again delivered in the described comparison module 4 and is compared with the accurate clock signal in described outside, until the output signal of described crystal oscillator to be measured 3 is identical with the accurate signal of external reference, the 1 control test of test processes module finishes, and returns the successful result of calibration to middle survey board by the IO mouth; Perhaps to be calibratedly reach precisely that maximum to revise value output signal still not identical with the accurate signal of external reference, described test processes module 1 control test finishes, and returns the failed result of calibration to middle survey board by the IO mouth.
Described comparison module 4 can also include a frequency divider, according to system's needs the accurate signal of external reference or described crystal oscillator output signal to be calibrated is input to comparison module again through frequency division first and compares; The frequency that middle survey board provides is generally fixing and higher, can not satisfy the demand of test medium and low frequency crystal oscillator, before inputting described comparison module, the accurate signal of described external reference carries out frequency division in order to frequency divider, can obtain how different frequencies satisfies the demands, the crystal oscillator frequency of other chip is very high, when middle survey board also can't provide high-frequency signal, need to increase frequency divider described crystal oscillator to be calibrated is carried out sending comparison module and the accurate signal of external reference to compare after frequency division is processed again.
Further, described test processes module 1 can be comprised of test controller 11 and calibration process module 12; Wherein, described test controller 11 is connected with survey board in the outside by the IO mouth, for the test instruction that receives outside survey board, and the beginning of control calibration testing, and when testing end, return test result to middle survey board by the IO mouth; Described calibration process module 12 connects described test controller 11, comparison module 4 and calibration register 2, be used for processing comparing module 4 output data, produce calibration value and output to calibration register 2, when test is finished, test result is outputed to test controller 11; Because 11 work when test beginning and test end of test controller, in the process of test, 12 reactions of calibration process module are faster, save the used time of calibration testing like this.
Further, described calibration process module 12 can also be comprised of judging unit 121 and calibration submodule 122; Wherein, described judging unit connects described testing control module 11, described comparison module 4 and described calibration submodule 122, described calibration submodule 122 receives the judge module Output rusults and outputs in the calibration register according to the calibration value that described judgement Output rusults produces crystal oscillator, described judging unit 121 is used for receiving the Output rusults of comparison module 4 and analyzes result relatively, if the output signal of crystal oscillator 3 to be calibrated is identical with the accurate clock signal of external reference, then directly return test result in described test controller 11, calibration submodule 122 is not worked; When only having the output signal of crystal oscillator 3 to be calibrated not identical with the accurate clock signal of external reference, just judged result is outputed to calibration submodule 122 and process.Modules can more effective work like this, improves the efficient of calibration testing.Described judging unit can adopt this area subtract logic commonly used to realize, obtains the output valve of comparison module and the difference of desired value, and according to the size conversion of the difference signal for the control calibration arrangements, thereby realizes the function relatively judged.Certainly, judging unit can also adopt alternate manner to realize the function of the Output rusults of judgement comparison module.Described calibration submodule can by this area selection and decoding logic commonly used, be realized selecting corresponding calibration steps (such as the configuration of quickening or the crystal oscillator that slows down) according to the judge module Output rusults.Certainly, can also adopt alternate manner to realize above-mentioned functions.
Embodiment two:
Please refer to Fig. 5, Fig. 5 is the structural drawing of the inner crystal oscillator chip of a kind of adjustable in the embodiment of the invention two; The comparison module of described chip is a counter 5, and namely described chip is comprised of test processes module 1, calibration register 2, adjustable crystal oscillator 3, counter 5; Wherein, described test processes module 1 is connected with survey board in the outside by the IO mouth, described calibration register 2 is connected with described test processes module 1, described crystal oscillator to be calibrated 3 is connected with described calibration register 2, the clock signal of described counter 5 is the output signal of crystal oscillator 3 to be calibrated, the accurate signal of external reference is the counting input of described counter 5, and the count results of described counter 5 outputs to described test processes module 1.
At first, described chip testing processor 1 receives the test instruction that scaffold tower sends in the outside, the self calibration test of beginning crystal oscillator, described test processes module 1 produces a desired value M according to the corresponding relation between the frequency of the target frequency of crystal oscillator 3 to be calibrated and the accurate signal of external reference, wherein, described desired value M equals the ratio between the target frequency of outside precisely reference signal frequency and described adjustable crystal oscillator signal, described desired value M also can produce in described middle survey board and send in the described test module 1 by test instruction, perhaps produce in other module of described chip and deliver in the described test processes module 1 again, present embodiment explains in the situation that described test processes module 1 produces with desired value M;
Then, described counter 5 is counted the accurate signal of external reference as clock signal with the output signal of described crystal oscillator 3 to be calibrated, obtains count value H, and count value H is outputed to described test processes resume module;
Then, size between the output count value H of described test processes module 1 more described desired value M and described counter 5, if described desired value M equates with described count value H, finished by described test processes module 1 control calibration testing, described test processes module 1 output is calibrated successful test result to middle survey board; If the pass of count value H and desired value M is that (wherein N is the threshold value of relatively adjusting to H-M＞N, together lower), then described test processes module 1 produce a size and be-(wherein K is the integer greater than 0 to K Δ f, Δ f is the minimum adjustable value of crystal oscillator, K Δ f represents to calibrate the step-length of adjustment, calibration value down together), and output in the described calibration register 2; If the pass of count value H and desired value M be H-M＜-N, then to produce a size be that K Δ f calibration value outputs in the calibration register 2 to described test processes module 1; If the pass of count value H and desired value M is 0＜H-M＜N, then described test processes module 1 produces a size and outputs in the calibration register 2 for-Δ f calibration value; If the pass of count value H and desired value M is-N＜H-M＜0 that then size of described test processes module 1 generation is that Δ f calibration value outputs in the calibration register 2;
At last, described crystal oscillator to be calibrated 3 is according to the output of the calibration value calibration frequency signal of described calibration register 2 storages, again the output signal after the calibration is counted the accurate clock signal in outside as the clock signal of described counter 5, until described count value H equates with described desired value M, test finishes, calibrate successful test result to middle survey board by described detection calibration module 1 output, desired value M and described count value H were still unequal when perhaps crystal oscillator 3 to be calibrated reached maximum calibration limit, test finishes, and 1 output of detection calibration module is calibrated failed test result to middle survey board;
Further, please refer to Fig. 6, Fig. 6 is the another kind of structural drawing of adjustable chip in the embodiment of the invention two; Described counter 5 can also be inputted the accurate signal of external reference as clock signal, the output signal of described crystal oscillator 3 to be calibrated outputs to count results in the described test processes module 1 and processes as the counting input of counter 5; If count value H equates that with desired value then test finishes, return the successful test result of test by described test processes module; If the pass of count value H and desired value is H-M＞N, then size of described test processes module 1 generation is that K Δ f calibration value outputs in the calibration register 2; If the pass of count value H and desired value be H-M＜-N, then described test processes module 1 produces a size and outputs in the described calibration register 2 for-K Δ f calibration value; If the pass of count value H and desired value is 0＜H-M＜N, then size of described test processes module 1 generation is that Δ f calibration value outputs in the calibration register 2; If the pass of count value H and desired value is-N＜H-M＜0, then described test processes module 1 produces a size and outputs in the calibration register 2 for-Δ f calibration value; Then described crystal oscillator to be calibrated 3 is calibrated the output of crystal oscillator according to the calibration value in the described calibration register 2.
Same, can also increase frequency divider and the output signal of described crystal oscillator 3 to be calibrated or the accurate signal of external reference are carried out first frequency division process the input end of clock that is input to again described counter 5 and counting input end to satisfy the different demands of system; The test processes module 1 of described chip can be comprised of test controller 11 and calibration process module 12, and calibration process module 12 can also be comprised of judging unit 121 and calibration module 122; Concrete sets forth in embodiment one, at this not in repeat specification.Above content is the further description of the present invention being done in conjunction with concrete embodiment, can not assert that implementation of the present invention is confined to these explanations.For the general technical staff of the technical field of the invention, without departing from the inventive concept of the premise, can also make some simple deduction or replace, all should be considered as belonging to protection scope of the present invention.
Claims (10)
1. but the chip of the inner crystal oscillator of self calibration is characterized in that, comprises test processes module, comparison module, calibration register and crystal oscillator to be calibrated;
Described comparison module is used for receiving output signal and the accurate signal of external reference of crystal oscillator to be calibrated and comparing, and comparative result is input to described test processes resume module;
Described test processes module is used for receiving test instruction, processes the data that described comparison module is exported, and produces calibration value and outputs to described calibration register, and export calibration result after calibration finishes;
Described calibration register is used for receiving and preserving the calibration value of described test processes module output, and described calibration value is input to crystal oscillator to be calibrated;
Described crystal oscillator to be calibrated is according to described calibration value self calibration crystal oscillator.
2. chip as claimed in claim 1, it is characterized in that, comparison module is a counter, and wherein said counter is used for the output signal of crystal oscillator to be calibrated or the accurate signal of external reference are counted and count results is outputed to described test processes resume module.
3. chip as claimed in claim 1 is characterized in that, described comparator module also includes a frequency divider, can carry out frequency division to the frequency signal of the accurate frequency signal of external reference or described crystal oscillator output to be calibrated and process.
4. such as each described chip of claim 1 to 3, it is characterized in that described test processes module includes a test controller and a calibration process module;
Described test controller is used for the end that begins of control crystal oscillator calibration, receives the accurate signal of external reference, and outputs test result after calibration finishes;
Described calibration process module is used for processing according to the data of described comparison module output, produces calibration value and outputs to described calibration register.
5. chip as claimed in claim 4 is characterized in that, described calibration process module includes a judging unit and a calibration submodule;
Described judging unit is used for the data that the judgement comparison module is exported, and judged result is outputed to described calibration submodule process;
Described calibration submodule is used for producing corresponding calibration value and calibration value being inputted described calibration register according to the result of judging unit output.
6. the system of a crystal oscillator calibration testing is characterized in that, comprises surveying board and each described chip of claim 1-5 in one;
Wherein, described middle survey board is connected with the test processes module of described chip, is used for sending test instruction, and receives test result after test finishes;
Middle survey board also is connected with the comparison module of described chip, and being used for provides external reference accurate signal to described comparison module.
But 7. calibration steps based on the inner crystal oscillator chip of the self calibration of the described system of claim 6,
It is characterized in that, may further comprise the steps:
During receiving, the test processes module surveys the test command that board sends, the self calibration test of beginning crystal oscillator;
Crystal oscillator output signal to be calibrated is input in the comparison module with outside precisely reference signal and compares, and described comparison module outputs to described test processes module to comparative result;
The comparative result of the described comparison module output of described test processes resume module, the calibration value that returns test result or generation correspondence according to comparative result outputs in the described register;
Crystal oscillator to be calibrated outputs to described comparison module to the signal after changing and compares with the accurate signal of external reference according to the output of the size change signal of calibration value;
After calibration was finished, the test processes module was returned test result to middle survey board.
8. calibration steps as claimed in claim 7, it is characterized in that, the comparative result of the described comparison module output of test processes resume module, return test result or produce corresponding calibration value according to comparative result and output in the step in the described register, if crystal oscillator output signal to be calibrated equates with the accurate signal of external reference, test finishes, and described test processes module is returned test result to middle survey board; If crystal oscillator output signal to be calibrated and the accurate signal of external reference are unequal, described test processes module produce a K Δ f or-calibration value of K Δ f outputs to calibration register, wherein K is the integer greater than 0, and Δ f is the minimum adjustable value of crystal oscillator, and K Δ f represents to calibrate the step-length of adjustment.
9. such as claim 7 or 8 described calibration stepss, it is characterized in that, crystal oscillator output signal to be calibrated and the accurate signal of external reference are inputted in the counter, wherein, arbitrary signal is as the clock signal input of counter among described crystal oscillator output signal to be calibrated and the accurate signal of described external reference, another signal is as the counting input of counter, and count results outputs to described test processes resume module.
10. calibration steps as claimed in claim 9 is characterized in that, can also increase by a frequency divider described crystal oscillator output signal to be calibrated or the accurate signal of described external reference are carried out outputing in the counter after frequency division is processed again.
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