CN103115639A - Datum positioner - Google Patents
Datum positioner Download PDFInfo
- Publication number
- CN103115639A CN103115639A CN2013100286767A CN201310028676A CN103115639A CN 103115639 A CN103115639 A CN 103115639A CN 2013100286767 A CN2013100286767 A CN 2013100286767A CN 201310028676 A CN201310028676 A CN 201310028676A CN 103115639 A CN103115639 A CN 103115639A
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- datum
- connecting plate
- positioning
- magnet
- test
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Abstract
Disclosed is a datum positioner. The datum positioner comprises a positioning connecting plate A and a positioning connecting plate B. An angle between the positioning connecting plate A and the positioning connecting plate B equals 90 degrees. A magnet A is fixedly arranged on the bottom surface of the positioning connecting plate A, and a magnet B is fixedly arranged on the bottom surface of the positioning connecting plate B. The positioning connecting plate A and the positioning connecting plate B are connected through an arc connecting bridge. A datum edge A is arranged on the positioning connecting plate A, and a datum edge B is arranged on the positioning connecting plate B, and an angle between the datum edge A and the datum edge B equals 90 degrees. By the datum positioner, positioning of datum point and entire detecting direction can be performed, and positioning datum and connecting device can be provided for external detecting device. Rapid positioning can be performed, and working efficiency of detecting can be increased. Cost is low, structure is simple and carrying is facilitated.
Description
Technical field
The present invention relates to a kind of steady arm, especially relate to a kind of with the reference edge static fixing, can affixed peripheral test system or the reference positioner of device; It can determine this reference plane build-in test summit and test orientation according to test zone two reference edges, and can be connected and fixed space testing jig or outer testing system, and the steady arm of benchmark is provided for the peripheral test system.
Background technology
At present, the proving installation in the laboratory is substantially take tripod as brace foundation, and the proving installation of complexity or system also has the polarization of controlling or highly waits the change of part.But putting on problem of the reference point initial position of test zone, major part is all to adjust the position of testing jig or whole test platform by the mode of moved by hand, make the initialized benchmark of whole test macro be difficult to ensure, and then just there is a very important test uncertainty factor in a series of test data.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of reference positioner; This reference positioner has solved following some problem: 1) decide reference edge, 2) decide reference point, 3) location survey examination direction, 4) fix 5 with the reference field relative position) can coordinate docking with the peripheral test device; The problem of testing jig reference position precision be can solve, can this reference plane build-in test summit and test orientation be being determined according to the datum line of definite area; Can be connected and fixed space testing jig or outer testing system, system provides reference for installation for peripheral test; Improve the bearing accuracy of integrated testability device, thereby improved whole measuring accuracy.
For solving the problems of the technologies described above, the present invention adopts following technical scheme:
A kind of reference positioner comprises be located by connecting dish A and the dish B that is located by connecting;
The described dish A that is located by connecting is provided with reference edge A; The described dish B that is located by connecting is provided with reference edge B; Angle between described reference edge A and reference edge B is 90 degree;
The dish A that is located by connecting can locate by two reference edges with the dish B that is located by connecting, and can coordinate docking with external test arrangements;
The described dish A lower surface that is located by connecting is installed with magnet A; The described dish B lower surface that is located by connecting is installed with magnet B; Magnet A and magnet B play the role of positioning, and by magnet A and magnet B, steady arm and ground are pulled together, and no longer include with benchmark the relation of relatively moving;
The described dish A and being located by connecting of being located by connecting connects by the arc connecting bridge between dish B, and this arc connecting bridge forms arc space zone is the probe placement district on the peripheral test device; Be used to probe on the peripheral test device that zone and the particular location of placement are provided.
。
The present invention has following beneficial effect:
1. the invention solves test zone reference point initial position and put the problem of precision: can carry out the location in reference point and whole test orientation by reference edge, by the fixing whole steady arm of two magnet and reference field relative position; Terminal pad can be the peripheral test device positioning datum and coupling arrangement is provided;
2. can locate fast, improve the efficient of test job;
3. cost is low, and is simple in structure, easy to carry.
Description of drawings
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described in further detail
Fig. 1 is structural representation of the present invention;
Fig. 2 is the structural representation that the present invention locates a test point;
Fig. 3 be of the present invention and the peripheral test device between the design sketch that is connected.
Embodiment
Embodiment 1
Shown in Fig. 1-3, a kind of reference positioner comprises be located by connecting dish A1 and the dish B2 that is located by connecting;
The described dish A1 that is located by connecting is provided with reference edge A11; The described dish B21 that is located by connecting is provided with reference edge B21; Angle between described reference edge A11 and reference edge B21 is 90 degree; The dish A1 that is located by connecting can pass through two reference edges 11,21 location with the dish B2 that is located by connecting, and can coordinate docking with external test arrangements 4
The described dish A1 lower surface that is located by connecting is installed with magnet A 12; The described dish B2 lower surface that is located by connecting is installed with magnet B 22; Magnet A 12 and magnet B 22 play the role of positioning, and by magnet A 12 and magnet B 22, steady arm and ground are fixed together, and no longer include with benchmark the relation of relatively moving;
The described dish A1 and being located by connecting of being located by connecting connects by arc connecting bridge 3 between dish B2, and this arc connecting bridge 3 forms arc space zone is probe placement district 5 on the peripheral test device; Be used to external test arrangements 4 that zone and the particular location of placement are provided.
The reference positioner principle of work: align with the reference edge 11,21 of the dish that is located by connecting respectively in two of the arbitrary neighborhoods of test zone benchmark sideline, two reference edges 11 after alignment, 21 just definite with the relative position on summit 6 namely find one of them summit 6 of test zone in steady arm.This summit 6 is a probe test point on the interior external test arrangements 4 of test test zone.After determining the position of steady arm by two reference edges 11,21, utilize magnet A 12 and magnet B 22 that whole steady arm is fixed on the reference plane place, play the effect of location; By magnet A 12 and magnet B 22 are broken away from from reference plane, can move or dismantle steady arm again.Can make whole device stiff end stressed more even by symmetrically arranged magnet A 12 and magnet B 22, whole device is more stable; Dish 1,2 second effect that be located by connecting is with the peripheral test system or installs 4 and be connected and fixed, the dish 1,2 that is located by connecting this moment namely plays the function of origin reference location, coordinate docking by the dish 1,2 that is located by connecting with peripheral test device 4, thereby can carry out the test of other test zones of space; Fig. 3 is a kind of example of form wherein, and the design sketch that is connected between peripheral test device 4.
The word in the description orientation that adopts herein " on ", D score, " left side ", " right side " etc. be all for the convenience that illustrates based on the orientation shown in drawing in accompanying drawing, these orientation may be different due to the disposing way of device in actual device.
Obviously, the above embodiment of the present invention is only for example of the present invention clearly is described, and is not to be restriction to embodiments of the present invention.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here can't give all embodiments exhaustive.Everyly belong to the row that apparent variation that technical scheme of the present invention extends out or change still are in protection scope of the present invention.
Claims (1)
1. a reference positioner, is characterized in that: comprise the dish A(1 that is located by connecting) and the dish B(2 that is located by connecting);
The described dish A(1 that is located by connecting) lower surface is installed with magnet A (12); The described dish B(2 that is located by connecting) lower surface is installed with magnet B (22);
The described dish A(1 that is located by connecting) and the dish B(2 that is located by connecting) between by arc connecting bridge (3) connection;
The described dish A(1 that is located by connecting) be provided with reference edge A(11); The described dish B that is located by connecting is provided with reference edge B(21); Described reference edge A(11) and reference edge B(21) between angle be 90 the degree.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310028676.7A CN103115639B (en) | 2013-01-25 | 2013-01-25 | A kind of reference positioner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310028676.7A CN103115639B (en) | 2013-01-25 | 2013-01-25 | A kind of reference positioner |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103115639A true CN103115639A (en) | 2013-05-22 |
| CN103115639B CN103115639B (en) | 2015-08-12 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310028676.7A Expired - Fee Related CN103115639B (en) | 2013-01-25 | 2013-01-25 | A kind of reference positioner |
Country Status (1)
| Country | Link |
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| CN (1) | CN103115639B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108571939A (en) * | 2018-04-24 | 2018-09-25 | 宁波江丰电子材料股份有限公司 | Positioning device and three-coordinates measuring machine |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2372355Y (en) * | 1999-06-25 | 2000-04-05 | 郏保琪 | Rail displacement observator |
| EP1721783A1 (en) * | 2005-05-12 | 2006-11-15 | Silicon Pyramid Electron Ltd. | Suction fixture |
| CN1922645A (en) * | 2003-12-31 | 2007-02-28 | 塞格·乔斯·多·卡尔莫 | Advertising panel support device |
| CN201751666U (en) * | 2010-06-09 | 2011-02-23 | 蔡文峰 | Bracing arm support provided with multiple sucking disc type foot rests |
| CN201992293U (en) * | 2010-12-09 | 2011-09-28 | 武昌船舶重工有限责任公司 | Universal measurement apparatus positioning device |
| CN102829296A (en) * | 2012-08-27 | 2012-12-19 | 北京无线电计量测试研究所 | Supporting device for correcting uniformity of transient electromagnetic field |
| CN102841263A (en) * | 2012-08-27 | 2012-12-26 | 北京无线电计量测试研究所 | Device for calibrating uniformity of transient electromagnetic field |
| CN203132568U (en) * | 2013-01-25 | 2013-08-14 | 北京无线电计量测试研究所 | A reference locator |
-
2013
- 2013-01-25 CN CN201310028676.7A patent/CN103115639B/en not_active Expired - Fee Related
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2372355Y (en) * | 1999-06-25 | 2000-04-05 | 郏保琪 | Rail displacement observator |
| CN1922645A (en) * | 2003-12-31 | 2007-02-28 | 塞格·乔斯·多·卡尔莫 | Advertising panel support device |
| EP1721783A1 (en) * | 2005-05-12 | 2006-11-15 | Silicon Pyramid Electron Ltd. | Suction fixture |
| CN201751666U (en) * | 2010-06-09 | 2011-02-23 | 蔡文峰 | Bracing arm support provided with multiple sucking disc type foot rests |
| CN201992293U (en) * | 2010-12-09 | 2011-09-28 | 武昌船舶重工有限责任公司 | Universal measurement apparatus positioning device |
| CN102829296A (en) * | 2012-08-27 | 2012-12-19 | 北京无线电计量测试研究所 | Supporting device for correcting uniformity of transient electromagnetic field |
| CN102841263A (en) * | 2012-08-27 | 2012-12-26 | 北京无线电计量测试研究所 | Device for calibrating uniformity of transient electromagnetic field |
| CN203132568U (en) * | 2013-01-25 | 2013-08-14 | 北京无线电计量测试研究所 | A reference locator |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108571939A (en) * | 2018-04-24 | 2018-09-25 | 宁波江丰电子材料股份有限公司 | Positioning device and three-coordinates measuring machine |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103115639B (en) | 2015-08-12 |
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Granted publication date: 20150812 Termination date: 20160125 |
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