CN103098168A - 用于镭射剥蚀感应耦合电浆质谱仪之改良样品室 - Google Patents

用于镭射剥蚀感应耦合电浆质谱仪之改良样品室 Download PDF

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Publication number
CN103098168A
CN103098168A CN2011800175301A CN201180017530A CN103098168A CN 103098168 A CN103098168 A CN 103098168A CN 2011800175301 A CN2011800175301 A CN 2011800175301A CN 201180017530 A CN201180017530 A CN 201180017530A CN 103098168 A CN103098168 A CN 103098168A
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CN
China
Prior art keywords
sample
flow
drawer
room
fluid
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Pending
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CN2011800175301A
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English (en)
Chinese (zh)
Inventor
罗伯特·哈金森
蕾芙·萨墨菲尔德
雪恩·希利雅德
杰·威尔金斯
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Irecto Science Industry Co ltd
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Irecto Science Industry Co ltd
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Application filed by Irecto Science Industry Co ltd filed Critical Irecto Science Industry Co ltd
Publication of CN103098168A publication Critical patent/CN103098168A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Electron Tubes For Measurement (AREA)
CN2011800175301A 2010-04-01 2011-03-31 用于镭射剥蚀感应耦合电浆质谱仪之改良样品室 Pending CN103098168A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/752,788 US8319176B2 (en) 2010-04-01 2010-04-01 Sample chamber for laser ablation inductively coupled plasma mass spectroscopy
US12/752,788 2010-04-01
PCT/US2011/030757 WO2011123664A2 (en) 2010-04-01 2011-03-31 Improved sample chamber for laser ablation inductively coupled plasma mass spectroscopy

Publications (1)

Publication Number Publication Date
CN103098168A true CN103098168A (zh) 2013-05-08

Family

ID=44708516

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011800175301A Pending CN103098168A (zh) 2010-04-01 2011-03-31 用于镭射剥蚀感应耦合电浆质谱仪之改良样品室

Country Status (7)

Country Link
US (2) US8319176B2 (https=)
EP (1) EP2553709A2 (https=)
JP (1) JP2013524445A (https=)
KR (1) KR20130018710A (https=)
CN (1) CN103098168A (https=)
TW (1) TW201142270A (https=)
WO (1) WO2011123664A2 (https=)

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CN110864959A (zh) * 2019-10-28 2020-03-06 散裂中子源科学中心 一种用于低温环境设备的换样方法、系统及应用

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AU2014214888B2 (en) * 2013-02-09 2018-04-05 Elemental Scientific Lasers, Llc In-chamber fluid handling system and methods handling fluids using the same
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US9352418B2 (en) 2014-01-06 2016-05-31 Teledyne Instruments, Inc. Laser-ablation-based material analysis system with a power/energy detector
JP2015148572A (ja) * 2014-02-07 2015-08-20 株式会社ルケオ 歪検査器
WO2016042165A1 (en) * 2014-09-18 2016-03-24 Universiteit Gent Laser ablation probe
KR20250025498A (ko) 2016-01-11 2025-02-21 엘레멘탈 사이언티픽 레이저스 엘엘씨 샘플 가공 동안 동시 패턴 스캔 배치
EP3803349A4 (en) * 2018-06-05 2022-03-09 Elemental Scientific Lasers, LLC APPARATUS AND METHOD FOR BYPASSING A SAMPLE CHAMBER IN LASER-ASSISTED SPECTROSCOPY
GB201810219D0 (en) * 2018-06-21 2018-08-08 Micromass Ltd Ion source
CN109297800B (zh) * 2018-11-05 2021-02-02 中国工程物理研究院材料研究所 一种激光剥蚀吹扫池
CN113063643B (zh) * 2021-03-25 2022-02-25 中国科学院地质与地球物理研究所 用于流体包裹体la-icp-ms分析的双体积冷冻剥蚀池装置及其剥蚀方法
US20230408542A1 (en) * 2022-06-09 2023-12-21 Elemental Scientific, Inc. Automated inline nanoparticle standard material addition

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US3628213A (en) * 1969-10-13 1971-12-21 Abington Textile Mach Works Vacuum cleaning apparatus to remove industrial waste from machinery
JP2005106688A (ja) * 2003-09-30 2005-04-21 Tdk Corp レーザーアブレーション装置及びレーザーアブレーション方法
JP2006153748A (ja) * 2004-11-30 2006-06-15 Tdk Corp レーザアブレーション装置、レーザアブレーション試料分析システム及び試料導入方法
CN101356620A (zh) * 2005-10-11 2009-01-28 阿维扎技术有限公司 变容泵抽腔室

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110864959A (zh) * 2019-10-28 2020-03-06 散裂中子源科学中心 一种用于低温环境设备的换样方法、系统及应用

Also Published As

Publication number Publication date
WO2011123664A2 (en) 2011-10-06
KR20130018710A (ko) 2013-02-25
EP2553709A2 (en) 2013-02-06
US20130042703A1 (en) 2013-02-21
TW201142270A (en) 2011-12-01
JP2013524445A (ja) 2013-06-17
WO2011123664A3 (en) 2012-02-23
US20110240839A1 (en) 2011-10-06
US8319176B2 (en) 2012-11-27
US8710435B2 (en) 2014-04-29

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Application publication date: 20130508